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1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6.
In 1.28 Mcps TDD option, likely scenario is that TS 0 is only used for broadcast, so no DPCH in TS 0. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5 Transmit ON/OFF power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1 Transmit OFF power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.2 Conformance requirements | The transmit OFF power shall be less than –82 dBm measured with a filter that has a Root-Raised Cosine (RRC) filter response with a roll-off = 0,22 and a bandwidth equal to the chip rate. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.4.1 Initial conditions | The conformance testing of transmit OFF power is included in the conformance testing of transmit ON/OFF time mask; therefore, see subclause 8.3.5.2.4.1 for initial conditions. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.4.2 Procedure | The conformance testing of transmit OFF power is included in the conformance testing of transmit ON/OFF time mask; therefore, see subclause 8.3.5.2.4.2 for procedure. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.5 Test requirements | The conformance testing of transmit OFF power is included in the conformance testing of transmit ON/OFF time mask; therefore, see subclause 8.3.5.2.5 for test requirements. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2 Transmit ON/OFF time mask | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.1 Definition and applicability | Common with 3.84 Mcps TDD. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.2 Conformance requirements | The transmit power level versus time should meet the mask specified in figure 8.1.
Figure 8.1: Transmit ON/OFF template for 1.28 Mcps TDD
The reference for this requirement is subclause 6.2.5.2 of this Technique Report. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.3 Test purpose | Common with 3.84 Mcps TDD |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.4.1 Initial conditions | 1) Connect the power measuring equipment to the BS antenna connector.
2) Set the parameters of the transmitted signal according to table 8.7.
Table 8.7: Parameters of the transmitted signal for transmit ON/OFF time mask test for 1.28 Mcps TDD
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, 3, 4, 5, 6:
transmit, if i is 0,4,5,6;
receive, if i is UpPCH,1,2,3.
BS output power setting
PRAT
Number of DPCH in each active TS
8
Power of each DPCH
1/8 of Base Station output power
Data content of DPCH
real life
(sufficient irregular) |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.4.2 Procedure | Measure the power of the BS output signal chipwise (i.e. averaged over time intervals of one chip duration) over the transmit off power period starting 11 chips before the start of the receive time slot TS i = UpPCH, and ending 8 chips before the next transmit time slot TS i = 4 starts, and with a measurement filter that has a RRC filter response with a roll off = 0,22 and a bandwidth equal to the chip rate. If the power measuring equipment is based on signal sampling, the sampling theorem shall be met. In this case, the power is determined by calculating the RMS value of the signal samples taken at the measurement filter output over one chip duration. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.5 Test requirements | Each value of the power measured according to subclause 8.3.5.2.4.2 shall be below the limits defined in figure 8.3.5.2.2.1 of subclause 8.3.5.2.2. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the subframe is shown in section7.2.1 of 3GPP TR 25.928, so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel for 144kbits/s need two timeslots, each consists of 8 DPCH(SF=16).So the number of DPCH in each active TS should be 8. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6 Output RF spectrum emissions | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1 Occupied bandwidth | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.2 Conformance requirements | The occupied bandwidth shall be less than 1,6 MHz based on a chip rate of 1.28 Mcps. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.8: Parameters of the transmitted signal for occupied bandwidth test for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, 3, 4, 5, 6:
transmit, if i is 0,4,5,6;
receive, if i is 1,2,3.
BS output power setting
PRAT
Number of DPCH in each active TS
8
Power of each DPCH
1/8 of Base Station output power
Data content of DPCH
real life
(sufficient irregular) |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.4.2 Procedure | 1) Measure the power of the transmitted signal with a measurement filter of bandwidth 30 kHz. The characteristic of the filter shall be approximately Gaussian (typical spectrum analyzer filter). The center frequency of the filter shall be stepped in contiguous 30 kHz steps from a minimum frequency, which shall be (2,4 – 0,015) MHz below the assigned channel frequency of the transmitted signal, up to a maximum frequency, which shall be (2,4 – 0,015) MHz above the assigned channel frequency of the transmitted signal. The time duration of each step shall be sufficiently long to capture one active time slot. The measured power shall be recorded for each step.
2) Determine the transmitted power within the assigned channel bandwidth by accumulating the recorded power measurements results of all steps with center frequencies from (0,8 – 0,015) MHz below the assigned channel frequency up to (0,8 – 0,015) MHz above the assigned channel frequency.
3) Determine the total transmitted power by accumulating the recorded power measurements results of all steps.
4) Calculate the following ratio:
transmitted power within the assigned channel bandwidth acc. to (2) / total transmitted power acc. to (3). |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel for 144kbits/s need two timeslots, each consists of 8 DPCH(SF=16).So the number of DPCH in each active TS should be 8. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2 Out of band emission | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1 Spectrum emission mask | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.1 Definition and applicability | For 1.28 Mcps chip rate TDD option, the spectrum emission mask specifies the limit of the transmitter out of band emissions at frequency offsets from the assigned channel frequency of the wanted signal between 0,8 MHz and 4,0 MHz. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.2 Conformance requirements | Emissions shall not exceed the maximum level specified in tables in Section 6.2.6.2.1 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.3 Test purpose | The test purpose is to verify that the BS out of band emissions do not result in undue interference to any other system (wideband, narrowband) operating at frequencies close to the assigned channel bandwidth of the wanted signal.
This test is independent of the characteristics of possible victim systems and, therefore, complements the tests on occupied bandwidth in 8.3.6.1 of TR 25.945 (verifying the spectral concentration of the BS Tx emissions) and on ACLR in 8.3.6.2.2 of TR 25.945 (simulating the perception of other receivers). |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.9: Parameters of the transmitted signal for spectrum emission mask test for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, 3, 4, 5, 6:
transmit, if i is 0,4,5,6;
receive, if i is 1,2,3.
BS output power setting
PRAT
Number of DPCH in each active TS
8
Power of each DPCH
1/8 of Base Station output power
Data content of DPCH
real life
(sufficient irregular) |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.4.2 Procedure | Measure the power of the BS spectrum emissions by applying measurement filters with bandwidths as specified in the relevant table in subclause 8.3.6.2.1.2. The characteristic of the filters shall be approximately Gaussian (typical spectrum analyzer filters). The center frequency of the filter shall be stepped in contiguous steps over the frequency bands as given in the tables. The step width shall be equal to the respective measurement bandwidth. The time duration of each step shall be sufficiently long to capture one active time slot. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.5 Test requirements | The spectrum emissions measured according to subclause 8.3.6.2.1.4.2 shall be within the mask defined in the relevant table of subclause 8.3.6.2.1.2. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel for 144kbits/s need two timeslots, each consists of 8 DPCH(SF=16).So the number of DPCH in each active TS should be 8. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2 Adjacent Channel Leakage power Ratio (ACLR) | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.2 Conformance requirements | The ACLR shall be equal to or greater than the limits given in Tables in section 6.2.6.2.2 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.10: Parameters of the transmitted signal for ACLR test for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, 3, 4, 5, 6:
transmit, if i is 0,4,5,6;
receive, if i is 1,2,3.
BS output power setting
PRAT
Number of DPCH in each active TS
8
Power of each DPCH
1/8 of Base Station output power
Data content of DPCH
real life
(sufficient irregular) |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.4.2 Procedure | 1) Measure transmitted power over the 848 active chips of the time slots TS i=0,4,5,6 (this excludes the guard period), and with a measurement filter that has a RRC filter response with a roll off = 0,22 and a bandwidth equal to the chip rate. The power is determined by calculating the RMS value of the signal samples at the measurement filter output taken at the decision points. (The global in-channel Tx test described in Annex C may be applied.)
2) Average over TBD time slots.
3) Measure interference power at the first lower adjacent RF channel (center frequency 1,6 MHz below the assigned channel frequency of the transmitted signal) over the useful part of the burst within the time slots TS i=0,4,5,6 (this excludes the guard period), and with a measurement filter that has a RRC filter response with a roll off = 0,22 and a bandwidth equal to the chip rate. The power is determined by calculating the RMS value of the signal samples at the measurement filter output taken with adherence to the sampling theorem.
4) Average over TBD time slots.
5) Calculate the ACLR by the ratio:
CLR = transmitted power acc. to (2) / interference power acc. to (4).
6) repeat steps (3), (4) and (5) for the second lower adjacent RF channel (center frequency 3,2 MHz below the assigned channel frequency of the transmitted signal) and also for the first and second upper adjacent RF channel (center frequency 1,6 MHz and 3,2 MHz above the assigned channel frequency of the transmitted signal, respectively). |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.5 Test requirements | The ACLR calculated in step (5) of subclause 8.3.6.2.2.4.2 shall be equal or greater than the limits given in table 6.5 in section 6.2.6.2.2. In case of operation in proximity to or co-siting with TDD BS or FDD BS operating on an adjacent frequency, the interference power calculated in (4) shall be equal or less than the limits given in table 6.6 and 6.7 respectively, and the center frequency as well as the measurement bandwidth shall be equal to those listed in the corresponding tables. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel for 144kbits/s need two timeslots, each consists of 8 DPCH(SF=16).So the number of DPCH in each active TS should be 8.
For the 1.28 Mcps chip rate TDD option, each TS consists of 864 chips, but 16 chips is for Guard Period, so the measuring thermal power should be over 848 active chips. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3 Spurious emissions | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.1 Definition and applicability | Spurious emissions are emissions which are caused by unwanted transmitter effects such as harmonics emission, parasitic emission, intermodulation products and frequency conversion products, but exclude out of band emissions. This is measured at the base station RF output port.
The requirements in this subclause shall apply to base stations intended for general-purpose applications. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.2 Conformance requirements | The requirements of either subclause 6.2.6.3.1 or subclause 6.2.6.3.2 shall apply whatever the type of transmitter considered (single carrier or multi-carrier). It applies for all transmission modes foreseen by the manufacturer.
Either requirement applies at frequencies within the specified frequency ranges which are more than 4 MHz under the first carrier frequency used or more than 4 MHz above the last carrier frequency used.
The power of any spurious emission shall not exceed the maximum level given in Tables in subclause 6.2.6.3. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.3 Test purpose | The test purpose is to verify the ability of the BS to limit the interference caused by unwanted transmitter effects to other systems operating at frequencies which are more than 4 MHz away from of the UTRA band used. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.11: Parameters of the transmitted signal for spurious emissions for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, 3, 4, 5, 6:
transmit, if i is 0,4,5,6;
receive, if i is 1,2,3.
BS output power setting
PRAT
Number of DPCH in each active TS
8
Power of each DPCH
1/8 of Base Station output power
Data content of DPCH
real life
(sufficient irregular) |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.4.2 Procedure | Measure the power of the spurious emissions by applying measurement filters with bandwidths as specified in the relevant tables of 8.3.6.3.2. The characteristic of the filters shall be approximately Gaussian (typical spectrum analyzer filters). The center frequency of the filter shall be stepped in contiguous steps over the frequency bands as given in the tables. The step width shall be equal to the respective measurement bandwidth. The time duration of each step shall be sufficiently long to capture one active time slot. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.5 Test requirements | The spurious emissions measured according to subclause 8.3.6.3.4.2 shall not exceed the limits specified in the relevant tables of 8.3.6.3.2. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel for 144kbits/s need two timeslots, each consists of 8 DPCH(SF=16).So the number of DPCH in each active TS should be 8. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7 Transmit intermodulation | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.1 Definition and applicability | The transmit intermodulation performance is a measure of the capability of the transmitter to inhibit the generation of signals in its non linear elements caused by presence of the wanted signal and an interfering signal reaching the transmitter via the antenna.
The transmit intermodulation level is the power of the intermodulation products when a CDMA modulated interference signal is injected into the antenna connector at a level of 30 dB lower than that of the subject signal. The frequency of the interference signal shall be 1,6 MHz, 3,2 MHz and 4,8 MHz offset from the subject signal.
The requirements in this subclause shall apply to base stations intended for general-purpose applications. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.2 Conformance requirements | The transmit intermodulation level shall not exceed the out of band or the spurious emission requirements of subclause 8.3.6.2 and 8.3.6.3, respectively. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.3 Test purpose | The test purpose is to verify the ability of the BS transmitter to restrict the generation of intermodulation products in its non linear elements caused by presence of the wanted signal and an interfering signal reaching the transmitter via the antenna to below specified levels. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.12: Parameters of the transmitted signal for transmit intermodulation for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, 3, 4, 5, 6:
transmit, if i is 0,4,5,6;
receive, if i is 1,2,3.
BS output power setting
PRAT
Number of DPCH in each active TS
8
Power of each DPCH
1/8 of Base Station output power
Data content of DPCH
real life
(sufficient irregular)
3) Configure the CDMA signal generator to produce an interference signal with a level of 30 dB lower than that of the BS transmitted signal. The interference signal shall be like-modulated as the BS transmitted signal, and the active time slots of both signals shall be synchronized. The frequency of the interference signal shall be 1,6 MHz, 3,2 MHz and 4,8 MHz offset from the BS transmitted signal. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.4.2 Procedure | Apply the test procedures for out of band and spurious emissions as described in 8.3.6.2 and 8.3.6.3, respectively. The frequency band occupied by the interference signal are excluded from the measurements. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.5 Test requirements | The conformance requirements for out of band and spurious emissions as specified in 8.3.6.2 and 8.3.6.3 shall be met. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of the subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel for 144kbits/s need two timeslots, each consists of 8 DPCH(SF=16).So the number of DPCH in each active TS should be 8.
Because the bandwidth of 1.28 Mcps TDD option is 1,6MHz, the frequency offset of interference signal shall be 1,6 MHz, 3,2 MHz and 4,8 MHz. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8 Transmit Modulation | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1 Modulation accuracy | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.1 Definition and applicability | The modulation accuracy is a measure of the difference between the measured waveform and the theoretical modulated waveform (the error vector). A quantitative measure of the modulation accuracy is the error vector magnitude (EVM) which is defined as the square root of the ratio of the mean error vector power to the mean reference signal power expressed as %. The measurement interval is one timeslot.
The requirements in this subclause shall apply to base stations intended for general-purpose applications.
NOTE: The theoretical modulated waveform shall be calculated on the basis that the transmit pulse shaping filter is a root-raised cosine (RRC) with roll-off =0,22 in the frequency domain. The impulse response of the chip impulse filter RC0(t) is:
Where the roll-off factor = 0,22 and for 1.28 Mcps chip rate option the chip duration: |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.13: Parameters of the transmitted signal for modulation accuracy for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, ..., 6:
Transmit, if i is 0,4,5,6;
receive, if i is 1,2,3.
Number of DPCH in each active TS
1
Base station power
maximum, according to manufacturer's declaration
Data content of DPCH
real life
(sufficient irregular) |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.4.2 Procedure | Common with 3.84 Mcps Chip rate TDD option |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, so the number of timeslot i should be 0, 1,…,6. The structure of subframe is shown in section 7.2.1 of TR 25.928. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2 Peak code domain error | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.14: Parameters of the transmitted signal for Peak code domain error for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, ..., 6:
transmit, if i is 0,4,5,6;
receive, if i is 1,2,3.
BS output power setting
PRAT
Number of DPCH in each active TS
8
Power of each DPCH
1/8 of Base Station output power
Data content of DPCH
real life
(sufficient irregular)
Spreading factor
16 |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.4.2 Procedure | Common with 3.84 Mcps Chip rate TDD option |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel for 144kbits/s need two timeslots, each consists of 8 DPCH(SF=16).So the number of DPCH in each active TS should be 8. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4 Receiver characteristics | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.1 General | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2 Reference sensitivity level | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.2 Conformance requirements | For the measurement channel specified in Annex 8.A.2.1, the reference sensitivity level and performance of the BS shall be as specified in table section 6.3.2.1 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) Common with the 3.84 Mcps chip rate
3) Common with the 3.84 Mcps chip rate.
4) The level of BS tester output signal measured at the BS antenna connector shall be adjusted to -110 dBm. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.4.2 Procedure | Common with 3.84 Mcps chip rate TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.6 Explanation difference | There is no difference in the test method and test procedure between high chip rate TDD and low chip rate TDD, however the requirement is changed according to section 6.3.2.1 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3 Dynamic range | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.2 Conformance requirements | The BER shall not exceed 0,001 for the parameters specified in table in section 6.3.3 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.3 Test purpose | Common with 3.84 Mcps TDD option. |
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