feat(kscan_mock): Increase max number of events
This is necessary for testing a large number of events (e.g. every key code) within a single build/pass.
The u8_t limitation became apparent during end-to-end testing of
@@ -18,7 +18,7 @@ LOG_MODULE_DECLARE(zmk, CONFIG_ZMK_LOG_LEVEL);
struct kscan_mock_data {
kscan_callback_t callback;
- u8_t event_index;
+ u32_t event_index;
struct k_delayed_work work;
struct device *dev;
};
