According to routine testing performed by CNet, write operations to typical Hi-Speed (USB 2.0) hard drives can sustain rates of 25–30 MB/s, while read operations are at 30–42 MB/s; this is 70% of the total available bus bandwidth. For USB 3.0, typical write speed is 70–90 MB/s, while read speed is 90–110 MB/s. Mask Tests, also known as Eye Diagram Tests, are used to determine the quality of a signal in the time domain. They are defined in the referenced document as part of the electrical test description for the high-speed (HS) mode at 480 Mbit/s.