The X-ray crystal density method is primarily a method for determining the Avogadro constant NA but as the Avogadro constant is related to the Planck constant it also determines a value for h. The principle behind the method is to determine NA as the ratio between the volume of the unit cell of a crystal, measured by X-ray crystallography, and the molar volume of the substance. Crystals of silicon are used, as they are available in high quality and purity by the technology developed for the semiconductor industry. The unit cell volume is calculated from the spacing between two crystal planes referred to as d220. The molar volume Vm(Si) requires a knowledge of the density of the crystal and the atomic weight of the silicon used. The Planck constant is given by