Daily Papers

Physical adversarial examples for camera-based computer vision have so far been achieved through visible artifacts -- a sticker on a Stop sign, colorful borders around eyeglasses or a 3D printed object with a colorful texture. An implicit assumption here is that the perturbations must be visible so that a camera can sense them. By contrast, we contribute a procedure to generate, for the first time, physical adversarial examples that are invisible to human eyes. Rather than modifying the victim object with visible artifacts, we modify light that illuminates the object. We demonstrate how an attacker can craft a modulated light signal that adversarially illuminates a scene and causes targeted misclassifications on a state-of-the-art ImageNet deep learning model. Concretely, we exploit the radiometric rolling shutter effect in commodity cameras to create precise striping patterns that appear on images. To human eyes, it appears like the object is illuminated, but the camera creates an image with stripes that will cause ML models to output the attacker-desired classification. We conduct a range of simulation and physical experiments with LEDs, demonstrating targeted attack rates up to 84%.

Since the introduction of the Vision Transformer (ViT), researchers have sought to make ViTs more efficient by removing redundant information in the processed tokens. While different methods have been explored to achieve this goal, we still lack understanding of the resulting reduction patterns and how those patterns differ across token reduction methods and datasets. To close this gap, we set out to understand the reduction patterns of 10 different token reduction methods using four image classification datasets. By systematically comparing these methods on the different classification tasks, we find that the Top-K pruning method is a surprisingly strong baseline. Through in-depth analysis of the different methods, we determine that: the reduction patterns are generally not consistent when varying the capacity of the backbone model, the reduction patterns of pruning-based methods significantly differ from fixed radial patterns, and the reduction patterns of pruning-based methods are correlated across classification datasets. Finally we report that the similarity of reduction patterns is a moderate-to-strong proxy for model performance. Project page at https://vap.aau.dk/tokens.

Visual patterns represent the discernible regularity in the visual world. They capture the essential nature of visual objects or scenes. Understanding and modeling visual patterns is a fundamental problem in visual recognition that has wide ranging applications. In this paper, we study the problem of visual pattern mining and propose a novel deep neural network architecture called PatternNet for discovering these patterns that are both discriminative and representative. The proposed PatternNet leverages the filters in the last convolution layer of a convolutional neural network to find locally consistent visual patches, and by combining these filters we can effectively discover unique visual patterns. In addition, PatternNet can discover visual patterns efficiently without performing expensive image patch sampling, and this advantage provides an order of magnitude speedup compared to most other approaches. We evaluate the proposed PatternNet subjectively by showing randomly selected visual patterns which are discovered by our method and quantitatively by performing image classification with the identified visual patterns and comparing our performance with the current state-of-the-art. We also directly evaluate the quality of the discovered visual patterns by leveraging the identified patterns as proposed objects in an image and compare with other relevant methods. Our proposed network and procedure, PatterNet, is able to outperform competing methods for the tasks described.

Token interaction operation is one of the core modules in MLP-based models to exchange and aggregate information between different spatial locations. However, the power of token interaction on the spatial dimension is highly dependent on the spatial resolution of the feature maps, which limits the model's expressive ability, especially in deep layers where the feature are down-sampled to a small spatial size. To address this issue, we present a novel method called Strip-MLP to enrich the token interaction power in three ways. Firstly, we introduce a new MLP paradigm called Strip MLP layer that allows the token to interact with other tokens in a cross-strip manner, enabling the tokens in a row (or column) to contribute to the information aggregations in adjacent but different strips of rows (or columns). Secondly, a Cascade Group Strip Mixing Module (CGSMM) is proposed to overcome the performance degradation caused by small spatial feature size. The module allows tokens to interact more effectively in the manners of within-patch and cross-patch, which is independent to the feature spatial size. Finally, based on the Strip MLP layer, we propose a novel Local Strip Mixing Module (LSMM) to boost the token interaction power in the local region. Extensive experiments demonstrate that Strip-MLP significantly improves the performance of MLP-based models on small datasets and obtains comparable or even better results on ImageNet. In particular, Strip-MLP models achieve higher average Top-1 accuracy than existing MLP-based models by +2.44\% on Caltech-101 and +2.16\% on CIFAR-100. The source codes will be available at~https://github.com/Med-Process/Strip_MLP{https://github.com/Med-Process/Strip\_MLP.

Vision Transformers have achieved great success in computer visions, delivering exceptional performance across various tasks. However, their inherent reliance on sequential input enforces the manual partitioning of images into patch sequences, which disrupts the image's inherent structural and semantic continuity. To handle this, we propose a novel Pattern Transformer (Patternformer) to adaptively convert images to pattern sequences for Transformer input. Specifically, we employ the Convolutional Neural Network to extract various patterns from the input image, with each channel representing a unique pattern that is fed into the succeeding Transformer as a visual token. By enabling the network to optimize these patterns, each pattern concentrates on its local region of interest, thereby preserving its intrinsic structural and semantic information. Only employing the vanilla ResNet and Transformer, we have accomplished state-of-the-art performance on CIFAR-10 and CIFAR-100, and have achieved competitive results on ImageNet.

Shape abstraction is an important task for simplifying complex geometric structures while retaining essential features. Sweep surfaces, commonly found in human-made objects, aid in this process by effectively capturing and representing object geometry, thereby facilitating abstraction. In this paper, we introduce \papername, a novel approach to shape abstraction through sweep surfaces. We propose an effective parameterization for sweep surfaces, utilizing superellipses for profile representation and B-spline curves for the axis. This compact representation, requiring as few as 14 float numbers, facilitates intuitive and interactive editing while preserving shape details effectively. Additionally, by introducing a differentiable neural sweeper and an encoder-decoder architecture, we demonstrate the ability to predict sweep surface representations without supervision. We show the superiority of our model through several quantitative and qualitative experiments throughout the paper. Our code is available at https://mingrui-zhao.github.io/SweepNet/

This paper explores in-context learning for image copy detection (ICD), i.e., prompting an ICD model to identify replicated images with new tampering patterns without the need for additional training. The prompts (or the contexts) are from a small set of image-replica pairs that reflect the new patterns and are used at inference time. Such in-context ICD has good realistic value, because it requires no fine-tuning and thus facilitates fast reaction against the emergence of unseen patterns. To accommodate the "seen rightarrow unseen" generalization scenario, we construct the first large-scale pattern dataset named AnyPattern, which has the largest number of tamper patterns (90 for training and 10 for testing) among all the existing ones. We benchmark AnyPattern with popular ICD methods and reveal that existing methods barely generalize to novel tamper patterns. We further propose a simple in-context ICD method named ImageStacker. ImageStacker learns to select the most representative image-replica pairs and employs them as the pattern prompts in a stacking manner (rather than the popular concatenation manner). Experimental results show (1) training with our large-scale dataset substantially benefits pattern generalization (+26.66 % mu AP), (2) the proposed ImageStacker facilitates effective in-context ICD (another round of +16.75 % mu AP), and (3) AnyPattern enables in-context ICD, i.e. without such a large-scale dataset, in-context learning does not emerge even with our ImageStacker. The project (including the proposed dataset AnyPattern and the code for ImageStacker) is publicly available at https://anypattern.github.io under the MIT Licence.

We characterize the cut patterns that can be produced by "orthogonal fold & cut": folding an axis-aligned rectangular sheet of paper along horizontal and vertical creases, and then making a single straight cut (at any angle). Along the way, we solve a handful of related problems: orthogonal fold & punch, 1D fold & cut, signed 1D fold & cut, and 1D interval fold & cut.

Seam carving is an image editing method that enable content-aware resizing, including operations like removing objects. However, the seam-finding strategy based on dynamic programming or graph-cut limits its applications to broader visual data formats and degrees of freedom for editing. Our observation is that describing the editing and retargeting of images more generally by a displacement field yields a generalisation of content-aware deformations. We propose to learn a deformation with a neural network that keeps the output plausible while trying to deform it only in places with low information content. This technique applies to different kinds of visual data, including images, 3D scenes given as neural radiance fields, or even polygon meshes. Experiments conducted on different visual data show that our method achieves better content-aware retargeting compared to previous methods.

To deliver the artistic expression of the target style, recent studies exploit the attention mechanism owing to its ability to map the local patches of the style image to the corresponding patches of the content image. However, because of the low semantic correspondence between arbitrary content and artworks, the attention module repeatedly abuses specific local patches from the style image, resulting in disharmonious and evident repetitive artifacts. To overcome this limitation and accomplish impeccable artistic style transfer, we focus on enhancing the attention mechanism and capturing the rhythm of patterns that organize the style. In this paper, we introduce a novel metric, namely pattern repeatability, that quantifies the repetition of patterns in the style image. Based on the pattern repeatability, we propose Aesthetic Pattern-Aware style transfer Networks (AesPA-Net) that discover the sweet spot of local and global style expressions. In addition, we propose a novel self-supervisory task to encourage the attention mechanism to learn precise and meaningful semantic correspondence. Lastly, we introduce the patch-wise style loss to transfer the elaborate rhythm of local patterns. Through qualitative and quantitative evaluations, we verify the reliability of the proposed pattern repeatability that aligns with human perception, and demonstrate the superiority of the proposed framework.

Unsupervised texture anomaly detection has been a concerning topic in a vast amount of industrial processes. Patterned textures inspection, particularly in the context of fabric defect detection, is indeed a widely encountered use case. This task involves handling a diverse spectrum of colors and textile types, encompassing a wide range of fabrics. Given the extensive variability in colors, textures, and defect types, fabric defect detection poses a complex and challenging problem in the field of patterned textures inspection. In this article, we propose a knowledge distillation-based approach tailored specifically for addressing the challenge of unsupervised anomaly detection in textures resembling fabrics. Our method aims to redefine the recently introduced reverse distillation approach, which advocates for an encoder-decoder design to mitigate classifier bias and to prevent the student from reconstructing anomalies. In this study, we present a new reverse distillation technique for the specific task of fabric defect detection. Our approach involves a meticulous design selection that strategically highlights high-level features. To demonstrate the capabilities of our approach both in terms of performance and inference speed, we conducted a series of experiments on multiple texture datasets, including MVTEC AD, AITEX, and TILDA, alongside conducting experiments on a dataset acquired from a textile manufacturing facility. The main contributions of this paper are the following: a robust texture anomaly detector utilizing a reverse knowledge-distillation technique suitable for both anomaly detection and domain generalization and a novel dataset encompassing a diverse range of fabrics and defects.

We study the classic Text-to-Pattern Hamming Distances problem: given a pattern P of length m and a text T of length n, both over a polynomial-size alphabet, compute the Hamming distance between P and T[i, ., . , i+m-1] for every shift i, under the standard Word-RAM model with Theta(log n)-bit words. - We provide an O(nm) time Las Vegas randomized algorithm for this problem, beating the decades-old O(n m log m) running time [Abrahamson, SICOMP 1987]. We also obtain a deterministic algorithm, with a slightly higher O(nm(log mloglog m)^{1/4}) running time. Our randomized algorithm extends to the k-bounded setting, with running time Obig(n+nk{m}big), removing all the extra logarithmic factors from earlier algorithms [Gawrychowski and Uzna\'{n}ski, ICALP 2018; Chan, Golan, Kociumaka, Kopelowitz and Porat, STOC 2020]. - For the (1+epsilon)-approximate version of Text-to-Pattern Hamming Distances, we give an O(epsilon^{-0.93}n) time Monte Carlo randomized algorithm, beating the previous O(epsilon^{-1}n) running time [Kopelowitz and Porat, FOCS 2015; Kopelowitz and Porat, SOSA 2018]. Our approximation algorithm exploits a connection with 3SUM, and uses a combination of Fredman's trick, equality matrix product, and random sampling; in particular, we obtain new results on approximate counting versions of 3SUM and Exact Triangle, which may be of independent interest. Our exact algorithms use a novel combination of hashing, bit-packed FFT, and recursion; in particular, we obtain a faster algorithm for computing the sumset of two integer sets, in the regime when the universe size is close to quadratic in the number of elements. We also prove a fine-grained equivalence between the exact Text-to-Pattern Hamming Distances problem and a range-restricted, counting version of 3SUM.

Data profiling is an essential process in modern data-driven industries. One of its critical components is the discovery and validation of complex statistics, including functional dependencies, data constraints, association rules, and others. However, most existing data profiling systems that focus on complex statistics do not provide proper integration with the tools used by contemporary data scientists. This creates a significant barrier to the adoption of these tools in the industry. Moreover, existing systems were not created with industrial-grade workloads in mind. Finally, they do not aim to provide descriptive explanations, i.e. why a given pattern is not found. It is a significant issue as it is essential to understand the underlying reasons for a specific pattern's absence to make informed decisions based on the data. Because of that, these patterns are effectively rest in thin air: their application scope is rather limited, they are rarely used by the broader public. At the same time, as we are going to demonstrate in this presentation, complex statistics can be efficiently used to solve many classic data quality problems. Desbordante is an open-source data profiler that aims to close this gap. It is built with emphasis on industrial application: it is efficient, scalable, resilient to crashes, and provides explanations. Furthermore, it provides seamless Python integration by offloading various costly operations to the C++ core, not only mining. In this demonstration, we show several scenarios that allow end users to solve different data quality problems. Namely, we showcase typo detection, data deduplication, and data anomaly detection scenarios.

We present a new way to merge any two point distribution approaches using distance fields. Our new process allows us to produce digital stippling that fills areas with stipple dots without visual artifacts as well as includes clear linear features without fussiness. Our merging thus benefits from past work that can optimize for either goal individually, yet typically by sacrificing the other. The new possibility of combining any two distributions using different distance field functions and their parameters also allows us to produce a vast range of stippling styles, which we demonstrate as well.

Recent research interest in the learning-based processing of garments, from virtual fitting to generation and reconstruction, stumbles on a scarcity of high-quality public data in the domain. We contribute to resolving this need by presenting the first large-scale synthetic dataset of 3D made-to-measure garments with sewing patterns, as well as its generation pipeline. GarmentCodeData contains 115,000 data points that cover a variety of designs in many common garment categories: tops, shirts, dresses, jumpsuits, skirts, pants, etc., fitted to a variety of body shapes sampled from a custom statistical body model based on CAESAR, as well as a standard reference body shape, applying three different textile materials. To enable the creation of datasets of such complexity, we introduce a set of algorithms for automatically taking tailor's measures on sampled body shapes, sampling strategies for sewing pattern design, and propose an automatic, open-source 3D garment draping pipeline based on a fast XPBD simulator, while contributing several solutions for collision resolution and drape correctness to enable scalability. Project Page: https://igl.ethz.ch/projects/GarmentCodeData/

Seminal research in the field of graph neural networks (GNNs) has revealed a direct correspondence between the expressive capabilities of GNNs and the k-dimensional Weisfeiler-Leman (kWL) test, a widely-recognized method for verifying graph isomorphism. This connection has reignited interest in comprehending the specific graph properties effectively distinguishable by the kWL test. A central focus of research in this field revolves around determining the least dimensionality k, for which kWL can discern graphs with different number of occurrences of a pattern graph P. We refer to such a least k as the WL-dimension of this pattern counting problem. This inquiry traditionally delves into two distinct counting problems related to patterns: subgraph counting and induced subgraph counting. Intriguingly, despite their initial appearance as separate challenges with seemingly divergent approaches, both of these problems are interconnected components of a more comprehensive problem: "graph motif parameters". In this paper, we provide a precise characterization of the WL-dimension of labeled graph motif parameters. As specific instances of this result, we obtain characterizations of the WL-dimension of the subgraph counting and induced subgraph counting problem for every labeled pattern P. We additionally demonstrate that in cases where the kWL test distinguishes between graphs with varying occurrences of a pattern P, the exact number of occurrences of P can be computed uniformly using only local information of the last layer of a corresponding GNN. We finally delve into the challenge of recognizing the WL-dimension of various graph parameters. We give a polynomial time algorithm for determining the WL-dimension of the subgraph counting problem for given pattern P, answering an open question from previous work.