Title: 40 Bender Datablad.pdf.pdf
100 mA…125 A (16 A overcurrent)* 10…100 % x IΔn2 min. 5 mA (50 %)* 1: < 100 Ω 0: > 250 Ω IΔ x factor 1…99 (3)* Offset 0…20 A (30 mA)* 0/1 (1)* 0…-20 %** +10…-20 %** 2…40% (20 %)* /1…10; x 1…250 (x 1)* 12/1080Rated residual operating current IΔn1 (prewarning)Digital inputPreset for alarmPreset for digital input Relative uncertainty RCMS…-D/-L Relative uncertainty RCMS…-D4/-L4 (channels 9…12 only) Hysteresis Factor for additional CT Number of measuring channels (per device/system)Time responseStart-up delay t (start-up) per device Response delay ton per channel Delay on release toff per channel Operating time tae at IΔn = 1 x IΔn1/2 Operating time tae at IΔn = 5 x IΔn1/2 Response time tan for residual current measurement Operating time tae digital inputs Scanning time for all measuring channels (residual current measurement) Recovery time tb0…99 s (0 ms)* 0…999 s (200 ms)* 0…999 s (200 ms)* ≤ 180 ms ≤ 30 ms tan = tae + ton1/2 ≤ 3.5 s ≤ 180 ms 500…600 msDisplays, memory