wɪð ðiːz ˈɜːli dʒˌɛnɚɹˈeɪʃənz ʌv ˌaɪsˈiː, pɹˈɑːsɛs vˌɛɹɪəbˈɪlᵻɾi ænd pˌæɹəmˈɛtɹɪk jˈiːld wɜːɹ ɐn ˈɪʃuː—ɐ θˈiːm ðæt wɪl ɹiːɪmˈɜːdʒ æz ɐ kəntɹˈoʊlɪŋ fˈæktɚɹ ɪn fjˈuːtʃɚɹ ˌaɪsˈiː tɛknˈɑːlədʒi æz wˈɛl.
With these early generations of IC, process variability and parametric yield were an issue—a theme that will reemerge as a controlling factor in future IC technology as well.