ðiːz ɪfˈɛkts ænd mˈɑːdəlɪŋ ɑːɹ nˌɑːt kənsˈɪdɚd baɪ mˈoʊst dɪvˈaɪs mˈɑːdəlɪŋ pɹˈoʊɡɹæmz; ðɪ ˈɪntɹɛstᵻd ɹˈiːdɚɹ ɪz ɹᵻfˈɜːd tə sˈɛvɹəl ˈɛksələnt mˈɑːnoʊɡɹˌæfz ɪnðɪ ˈɛɹiə ʌv ˌiːˌɛsdˈiː ænd aɪ slˈæʃ ˈoʊ mˈɑːdəlɪŋ.
These effects and modeling are not considered by most device modeling programs; the interested reader is referred to several excellent monographs in the area of ESD and I/O modeling.