The ER-C presently houses 13 electron microscopes manufactured by FEI Company and JEOL Ltd. ranging from standard scanning electron microscopes to highly specialised Titan series transmission electron microscopes equipped with aberration correction units and offering an information limit well below 100 picometres.
On 12 December 2008 the ER-C and FEI Company announced that a next generation electron microscope with a record resolution of 50 picometres will be made available to a broad user community from 2010 [REF].