In the study of solids, the study of the dispersion relation of electrons is of paramount importance.
With high energy (e.g., 200 keV) electrons in a transmission electron microscope, the energy dependence of higher order Laue zone (HOLZ) lines in convergent beam electron diffraction (CBED) patterns allows one, in effect, to directly image cross-sections of a crystal's three-dimensional dispersion surface [REF].