While traditional PALM and STORM measurements are used to determine the physical structure of a sample, with the intensities of fluorescent events determining the certainty of the localization, these intensities can also be used to map fluorophore interactions with nanophotonic structures.
These studies have found that, in addition to the standard uncertainty of localization due to the point spread function fitting, self-interference with light scattered by nanoparticles can lead to distortions or displacements of the imaged point spread functions,[REF][REF] complicating the analysis of such measurements.