A Fast Image Simulation Algorithm for Scanning Transmission Electron Microscopy
  Image simulation for scanning transmission electron microscopy at atomic
resolution for samples with realistic dimensions can require very large
computation times using existing simulation algorithms. We present a new
algorithm named PRISM that combines features of the two most commonly used
algorithms, the Bloch wave and multislice methods. PRISM uses a Fourier
interpolation factor $f$ that has typical values of 4-20 for atomic resolution
simulations. We show that in many cases PRISM can provide a speedup that scales
with $f^4$ compared to multislice simulations, with a negligible loss of
accuracy. We demonstrate the usefulness of this method with large-scale
scanning transmission electron microscopy image simulations of a crystalline
nanoparticle on an amorphous carbon substrate.
