 manufactured using conventional interlock techniques. The herringbone skew requires that the first half of the laminas be rotated in one radial direction and that the last half of the laminas be rotated in the other radial direction. The interlocking tabs for each half of the laminas would require an opposite orientation, and would require an additional processing station in a progressive die assembly. The additional processing station entails further expense and complication. Also, rotors having straight (zero skew) conductor slots are difficult to form with interlocking tabs because the interlocking tabs inherently skew the laminas because of the shape of the tab and the aperture in the adjacent lamina which receives it.
Another type of rotor or stator structure which requires great care and expense to manufacture involves applications requiring cores with smaller diameters. For example, a rotor lamina about an inch in diameter includes very little surface area in which to form interlocking tabs.
What is needed is an improved method and apparatus for manufacturing and interlocking laminations.
Also needed is a method and apparatus for manufacturing and interlocking laminations more quickly than known in the prior art.
A further need exists for a method and apparatus for manufacturing laminations that provides an interlock for relatively small lamina stacks. This invention relates to high power (nonlinear) testing of RF transistors (DUT) in the frequency and time domain (see ref. 1) using Load Pull. Load pull is the method by which the load impedance presented to the DUT at a given frequency is changed systematically and the DUT performance is registered, with the objective to find an optimum tuning condition for certain overall design objectives. This objective may be maximum power, maximum efficiency, linearity or else or a combination thereof. The same is valid for the source side of the DUT. Passive (slide screw) tuners are used to create the various impedances presented to the DUT (see ref. 2) for frequencies above 100 MHz. A typical test setup is shown in FIG. 1: a signal source (1) injects RF power into a DUT (3) via an input tuner (2) which generates the source impedance presented to the DUT. An output tuner (4) generates the load impedance. The outcoming power from tuner (4) is detected by the power meter (5). The whole is controlled by a PC (6) via digital communication with the test instruments (9) and the tuners (7), (8). Data are collected by the PC as a function of the
manufactured using conventional interlock techniques. The herringbone skew command that the inaugural half of the laminas be rotated in one radial management and that the last half of the lamina be rotated in the other radial direction. The interlock tabs for each half of the lamina would require an opposite orientation, and would require an extra processing station in a progressive die assembly. The extra processing station fee-tail further expense and complicatedness. Also, rotors having true (zero skew) conductor slots are difficult to shape with interlocking check because the interlocking tabs inherently skew the laminas because of the shape of the tab and the aperture in the adjacent lamina which receive it. 
 Another type of rotor or stator structure which requires great care and expense to fabricate involve applications requiring cores with smaller diameters. For example, a rotor lamina about an inch in diameter includes very little open area in which to form interlock tabs. 
 What is needed is an improved method and apparatus for manufacturing and interlock laminations. 
 Also needed is a method and apparatus for manufacture and interlocking laminations more quickly than known in the prior art. 
 A further indigence exists for a method and apparatus for manufacturing laminations that provide an interlock for relatively little lamina stacks. This invention relates to high power (nonlinear) testing of RF transistor (DUT) in the frequency and time domain (see ref. 1) using Load Pull. Load pull is the method by which the load impedance present to the DUT at a given frequency is change systematically and the DUT operation is registered, with the objective to find an optimum tuning condition for sealed overall design objectives. This aim may be maximum power, maximum efficiency, linearity or else or a combination thereof. The like is valid for the source side of the DUT. Passive (slide fuck) tuners are used to create the various impedances show to the DUT (see ref. 2) for frequencies above 100 megahertz. A typical test setup is shown in FIG. 1: a signal source (1) injects RF power into a DUT (3) via an stimulation tuner (2) which generates the source impedance presented to the DUT. An output tuner (4) generate the cargo impedance. The outcoming power from tuner (4) is detected by the power meter (5). The whole is controlled by a personal computer (6) via digital communication with the test instruments (9) and the tuners (7), (8). Data are collected by the PC as a function of the
 majufactured using conventlonal interlock jexhniquxs. The gerringbune skew requires that the fmrst half of the laminas be rotxted in oje radiao dicection and that the lasb halr of chx laminas be rojated in the other radial gifeetion. The interlocking tabs for each half og hhe laminas woold rtquyre zn opposite orientation, and would dequire an additionak processing station in a oroggessive die assembpy. The addijjonwo processing station entails furthgr expense and complication. Also, rotoxs having sjxqigjj (zero skew) ronducnor slots are difficunt to fprm with interkocnint tabs because the inverlocking tabs inhetently skef che laminas because od rhe svape of gye gab aid fhe apfrtnre in the zdjacent lanina which receives ie.
Qnother type kf rotjr or stator structure which requires gredt dare and expense to manyfacture involves apppications requiring cores with smaller diameters. For exampne, a cogor lwounw about an inch in diameter includes very liteme slrface area in whlch to form interlpcnimd tabs.
What is needeb ia an improved methld and wpparqtus for ianugacturing and interlocking oaminations.
Ajwo needed is a metkod and appaxatus gor msnufacturing and interluckihg laminatilns more sjickly than knowv ik tve prior art.
A further need exists fir a method and apparwtus for mwnufagduring laminations that psovides an interlock for relatively small lamina stacks. Tvis inventijn rekates to high power (nonlinecr) testiug of FF transisnors (DUT) mn the frequqncy and time fomain (see rxf. 1) using Loae Puol. Load oull is the meyhod by wknch the liad impedance prescnted fo the DUT at a gicen frequency ix cfandef xyfdematically dnd ghe CUT pdrformance ls fegixtered, with the objewtivs to find an optimim tuning xonditiog for certain overall design obuectites. Thms objrctyve may be maximum power, maximhm efficifncn, linearity ow elwe or a combnnation thereof. The same is valid for thx source side of the DOT. Passive (slide screc) uuners are usxd to sreate tha various impedances presented to the DUT (see ref. 2) for fresuencias ablve 100 MHz. A typical test setup is shown in FIG. 1: a signal source (1) injects RD powec ynto a DUT (3) via an itpbt cuner (2) rhici jenerates the sougce impedance presented to the DNT. An outpgt tuner (4) generates the load ikpddance. The oujcoming power from tuner (4) js detecyed by the power meter (5). The whoke is controlled by a PC (6) via ditital communicavion with the test imstrumznts (9) qnd the tuncrs (7), (8). Data are coklccted by tje PR aa a function of the
manufactured using conventional interlock techniques. The herringbone that first half the laminas be and the last half the laminas be in the other radial direction. The tabs for each half of the laminas would require an opposite orientation, and require an additional processing station in a progressive die assembly. The additional processing entails expense complication. rotors having straight (zero skew) conductor slots are difficult to form with interlocking tabs because the tabs inherently skew the laminas because of the of the tab and aperture in the adjacent lamina receives Another type rotor stator which requires great and expense to manufacture involves applications requiring cores with smaller diameters. For example, a rotor lamina about inch in very little area which form interlocking tabs. needed is an improved method and and interlocking laminations. Also needed is a method apparatus for and interlocking laminations more quickly than in the prior art. A further need exists a method and apparatus for manufacturing laminations that provides an interlock for relatively small lamina invention relates to high (nonlinear) testing of transistors in frequency time domain ref. 1) using Load Pull. Load pull is the method by the load impedance presented to the DUT at a given changed and the DUT is registered, with the to an optimum tuning condition overall objectives. be power, efficiency, linearity or else a combination thereof. The same valid for the source (slide screw) tuners are used to create the impedances presented to the DUT (see ref. for frequencies above 100 MHz. A typical test setup is shown in 1: a (1) injects RF power into a DUT (3) an input tuner (2) generates the source impedance presented to the DUT. An tuner generates the impedance. The outcoming from tuner (4) detected by the (5). The is by via digital communication with the test (9) the tuners (7), (8). Data collected PC as a function of the
 manufactured using conventiOnal interlOck teChnIquEs. the hErriNgbone skew requIRes tHat the first half of the laMinas Be ROtatED iN one rAdial diREcTIOn aNd ThAt tHe LAsT half Of tHe laminAs be rotateD in ThE other radial DIrEction. The iNteRlocking tabs For Each haLf Of tHE lamiNas Would RequirE An oppoSite orienTaTIon, and WOuld reqUIRe An adDitional processinG StATion in a progresSive diE aSSeMBLy. THe aDditional pRoCessiNG statioN EnTAILs fURther expense aNd complicatIOn. ALso, rotOrS haVIng strAight (ZeRO skEw) conductor SlotS are diffiCult to FOrm with INterlocKing taBs bEcaUse tHE iNtErlOcKIng TAbS inHEreNtly skew ThE lAminaS becAUSE Of thE shApe oF the tAb and the apertUre In thE AdjAcent LaminA whiCh ReceiVes it.
ANotheR tYpe of rotor or staTor sTructure wHicH rEquIrEs greAT care aNd eXpeNse to maNufactuRE inVoLVES aPplications requiriNg COReS with smaLler diAMeTeRS. For examPlE, a rOtor LAMina aBout AN iNch in diaMeter iNClUdEs very lItTle surFaCe aRea In whiCH to fOrm intErlockinG tabs.
wHat is needed is aN Improved methoD AnD APpARatuS foR manufacturIng aND intErloCKiNg lAMinatIons.
ALsO NeEDed is a method and appaRaTus for ManufActuring and inTerlocking LAMInations More QUiCKly than known in The prIor art.
A furTHer need eXists For a methOd and appaRATus for maNufActUriNg lAMInAtions that proVIDes aN iNterlocK foR relatiVelY smAll LamInA stacks. ThIs inventIoN rElAtEs tO high POwer (nonlInEar) TeStiNg of Rf TransiStors (dUT) iN tHe FReqUency anD TiME DomaIn (SeE ref. 1) UsiNg load PUll. LOAd pUll is thE method by WhiCH the LoAd ImpedanCe presented to ThE DUT at a givEn FreQuency IS Changed sYstematically and the DUT pERformanCe iS regiSterEd, with the ObjEctive To fINd an opTimum tUning CoNdiTIOn for CERtAin OvErall desigN OBjeCtiveS. THis oBjectivE may be maximum power, MAxiMum efficiency, LinEariTY Or ElsE Or A ComBiNAtiON Thereof. The same iS valid for tHe SOuRce side of tHE DUt. PAssive (sLide scrEw) tunERs are usEd to creatE the varioUs ImpeDANceS presented To the DUT (See ref. 2) for FRequeNCiEs aboVe 100 Mhz. A typIcAl tEst seTup is sHOwn In FIG. 1: A signaL sOurce (1) iNjectS Rf power inTo a DUT (3) via an input tuner (2) whIch genErateS thE source imPedANce Presented To thE DUT. An outpUt tUneR (4) geneRatES the lOad iMPeDanCE. The oUtcoMIng power fROm TunER (4) Is Detected by tHE POweR meteR (5). ThE Whole iS conTrolled by a PC (6) via diGItal communicatIon wITH thE teST insTrUments (9) and the tuNerS (7), (8). DATA are collEcTed by the PC aS a functiOn OF the
 manufactured using conven tional int erloc k t ech ni ques . Th e herringbones kewrequires that the firs t hal fo f th e  l amina s be ro t at e d  in  o ne  ra di a ldirec tio n and t hat the la stha lf of the la m in as be rota ted  in the othe r r adialdi rec t ion.The  inte rlocki n g tabs  for each  h a lf oft he lami n a swoul d require an oppo s it e  orientation,and wo ul d  r e q uir e a n addition al  proc e ssing s t at i o n  in a progressive  die assemb l y.The ad di tio n al pro cessi ng sta tion entail s fu rther exp ense a n d compl i cation.  Also,  ro tor s ha v in gstr ai g ht( ze ros kew ) conduc to rslots  are d i f ficu ltto f orm w ith interlock ing  tab s  be cause  theinte rl ockin g tabs  inhe re ntly skew the l amin as becaus e o fthe  s hapeo f thetab  an d the a perture inth e a dj acent lamina which  r e c ei ves it.Anothe r  t yp e  of roto rorstat o r  stru ctur e  w hich req uiresg re at  care a nd  expen se  to  ma nufac t ureinvolv es appli catio n s requiring co r es with small e rd i am e ters . F or example,  a r o torlami n aabo u t aninchin di a meter includes very  l ittlesurfa ce area in wh ich to for m i nterlock ingt ab s .
What is need ed is  an improv e d method  andapparatu s for man u f acturing  an d i nte rlo c k in g laminations . Also  n eeded i s a  method  an d a ppa rat us  for manu facturin gan din ter locki n g lamina ti ons  m ore  quic k ly tha n kno wn i nth e  pr ior art . 
A f urth er  n eedexi st s for  a m e tho d and a pparatusfor manu fa ct uring l aminations th at  providesan  in terloc k for rela tively small lamina sta c ks. Thi s i nvent ionrelates t o h igh po wer (nonli near)testi ng  of R F tra n s is tor s(DUT) in t h e  fr equen cy  and  time d omain (see ref. 1) usi ng Load Pull.  Lo ad p u l list he met ho d  by w hich the load i mpedance p re s en ted to the DUT  a t a giv en freq uency is chan ged syste matically  a nd t h e  DU T performa nce is r egistered ,  with th e obj ect ive to  f ind  an o ptimum tun ing c onditi on  for c ertai noveralldesign objectives. This  objec tivemay  be maxim ump owe r, maximu m ef ficiency,lin ear ity o r e l se or  a c o mb ina t ion t here o f. The sa m eisv a li d for the s o u r cesideoft he DUT . Pa ssive (slide scre w ) tuners are u sedt o  cr eat e  the  v arious impedan ces  p r e sented t othe DUT (se e ref. 2 )f or fr equenc ies ab ove 100 M Hz .  A typ ical  te st setupissh o wn in F IG .1 : a si gnal  s ource(1) in j ects R F power into a D UT (3 ) via a n  in put t un er (2)w hich  generates  the source  imped ance  pres ented t othe DU T.An  output tu n er (4) ge nerat es thelo ad i mpe dance.  The o utcom ingpo wer  from tun e r  ( 4 )is det ecte d byth e po wer meter (5). The  wh o le is c on tro l l ed bya  P C (6) via di git al co m m unicationw itht he testinstru ments(9) and the  t uners ( 7), ( 8). Dataare colle c ted  b y th e PC asafunc ti onof  the
 manufactured_using conventional_interlock techniques. The herringbone_skew requires_that_the first_half_of the laminas_be rotated in_one radial direction and_that the last_half_of the laminas be rotated in the other radial direction. The interlocking tabs for_each_half of_the_laminas_would require an opposite orientation,_and would require an additional_processing station_in a progressive die assembly. The additional processing_station_entails further expense_and complication. Also, rotors having straight (zero skew) conductor_slots are difficult to form with_interlocking tabs because_the_interlocking_tabs inherently skew the_laminas because of the shape of_the tab and the aperture in_the adjacent lamina which receives it.
Another type_of rotor or stator structure which_requires great care and expense_to manufacture_involves applications requiring cores with_smaller diameters. For_example, a_rotor lamina about_an inch in diameter includes very_little surface area_in which to form interlocking tabs.
What_is_needed is an_improved_method_and apparatus_for manufacturing and_interlocking_laminations.
Also needed_is_a method and apparatus for manufacturing_and_interlocking laminations more quickly than known in_the prior art.
A further_need_exists for a method_and apparatus for manufacturing laminations_that provides an interlock for relatively_small lamina_stacks. This_invention relates to high power (nonlinear) testing of RF transistors (DUT)_in the frequency and time domain_(see ref. 1) using_Load Pull._Load_pull is the_method_by which_the load impedance presented to the DUT_at a_given frequency is changed systematically and_the DUT performance is_registered,_with the objective to find an_optimum tuning condition for certain overall_design objectives. This objective may_be_maximum_power, maximum efficiency, linearity or_else or a combination thereof. The_same is valid_for the source side of the DUT._Passive_(slide screw) tuners are used to_create_the various impedances presented to the_DUT_(see_ref. 2) for frequencies above_100 MHz. A typical test setup_is shown in FIG. 1: a signal source (1)_injects RF power_into a DUT (3) via_an_input_tuner (2) which generates the source impedance presented to the_DUT. An_output tuner (4)_generates the load impedance. The outcoming power from tuner (4)_is detected by the power meter (5)._The whole is controlled by a PC (6) via digital communication_with the test instruments (9) and the tuners_(7), (8). Data are collected by the_PC as a function_of_the