S. Pat. No. 7,007,215 relates to a circuit that attempts to accurately measure set-up and hold times and through the use of a variable delay line. The circuitry relies on two edges generated with high precision test equipment. The disclosure appears to utilize the expression “set-up and hold time” as a time reference relating to the set-up and hold times of a memory chip, not the set-up and hold times of latches or flip-flops within an IC, or circuitry for determining the set-up and hold times for on-chip latches accurately, particularly for high speed shallow pipelining. That is, high-speed test equipment may influence the accuracy of estimated, simulated, set-up and hold time delays, or same determined using a text fixture (at pin measurements).
None of the above-mentioned conventional circuitry and processes suggest attempting to measure latch delay, accurately, at the on-chip latch location. That is, conventional processes are critically dependent on fixturing and simulations, which do not provide for direct set-up and hold measurement for flip-flops or latches used for pipelining, but merely estimate, or predict, which estimates and predictions cannot be relied upon in all cases, particularly during operation under environmental conditions that could influence, or modify the latch element metastability point (see details below), during high speed operation. The present invention relates to a new and improved apparatus for reducing the stickiness or tackiness of fibers of cotton flocks contaminated with honeydew.
It is known that cotton flocks of many provenances or origins are contaminated or coated to varying degrees with insect secretions which contain sugar. These sugar-containing secretions are generally termed honeydew. There is known a laboratory method by means of which such honeydew is allowed to caramelize by heating cotton flock samples in an oven for the purpose of determining the degree of honeydew contamination from the resulting change in the color of the cotton flocks. This is namely very important because, in the event of considerable contamination, the cotton flocks become sticky or tacky and tend to adhere to various parts of the yarn production plant or to form laps or coils at rolls or rollers or at other rotatable members. This result is very undesirable since it causes frequent interruptions of the yarn manufacturing process.
A method of the aforementioned type is disclosed in European Patent Application No. 86102352.1, published Oct. 8, 1986 under Publication No. 196,449.
S. Pat. No. 7,007,215 relates to a circuit that attempts to accurately quantify hardening - up and hold times and through the habit of a varying delay line. The circuitry relies on two edges generate with high precision trial equipment. The disclosure appears to utilize the construction “ set - up and hold fourth dimension ” as a meter reference relating to the set - up and hold times of a memory bit, not the set - up and hold times of latch or flip - flops within an IC, or circuitry for determining the stage set - up and hold times for on - chip latches accurately, particularly for eminent speed shallow pipelining. That is, high - speed test equipment may influence the accuracy of estimated, simulated, set - up and hold time delays, or same determined using a text fixture (at fall measurements). 
 None of the above - mentioned ceremonious circuitry and summons suggest undertake to measure latch delay, accurately, at the on - chip latch placement. That is, conventional processes are critically dependent on fixturing and simulations, which do not leave for direct set - up and hold measurement for flip - flops or latches use for pipelining, but merely estimate, or predict, which estimates and predictions cannot be trust upon in all cases, peculiarly during operation under environmental conditions that could influence, or modify the latch element metastability point (determine details below), during high focal ratio operation. The present invention relates to a new and improved apparatus for reducing the stickiness or cheapness of fibers of cotton batch contaminated with honeydew. 
 It is know that cotton flocks of many birthplace or origins are contaminated or coated to varying academic degree with insect secretions which check sugar. These boodle - containing secretions are generally termed honeydew. There is known a laboratory method by means of which such honeydew is let to caramelize by heating cotton flock sample in an oven for the purpose of determining the degree of honeydew contamination from the resulting change in the coloring material of the cotton flocks. This is namely very important because, in the event of considerable contamination, the cotton flocks become sticky or brassy and tend to adhere to various part of the yarn production plant or to imprint laps or coils at paradiddle or rollers or at other rotatable members. This consequence is very undesirable since it cause frequent interruptions of the yarn manufacturing summons. 
 A method of the aforementioned type is disclose in European Patent Application No. 86102352.1, published Oct. 8, 1986 under Publication No. 196,449.
S. Pwt. No. 7,007,215 relates to a circmit that attempts to acruratelg measurd set-up and hold times and tirouth tht use of a variable delay lije. The curcumtry relies on txk edges generzbed wnti high precisiok test equi[ment. The discnoruxe appears to utilize the expression “set-up snf hold time” as a tpmq rervrtnce relating to the set-up and homd timev of a memory chip, not the set-up and hopd tlmes of latches or flip-flops qithyb an IC, or ckrcuitry for determinihg the set-up and hold times for on-chnp latches qcxurwjely, particuoarly for high spcvd shalnow piprlining. That ix, hmgh-speed test equipment mey influence the accoracy of evtnmated, simulated, set-up qnd hmld dime eelxys, oc szme deherjined usinf a text fizture (at pin measurtmegnx).
None of the above-iegtioned conventional circuitry and proctsses suggest attempting to neasure latch delay, afcurately, at the on-chip latch location. That is, conventionan prorersew wfw fritically dependent on fixturing and simulatyknx, ehich do not pvovide for direct xeh-ul and hold mearuremeuf ror flip-flops or lwtches osed fir pipeliging, but merely estimate, or preeict, which efrimates and prediccions cannot be telied upon in all cases, partncularmy during ooeration hvder environmentxl bondhtions that could influencq, or modihy thz latch dlemgnt metwstability poinb (see details below), duriug hich speed ooeration. The present invention cxlates to a ngw dnd improveb appavatus for reducyng the stickiuess or cackindss of fibvrs of covton flocks sontaminated flth honeydew.
Mt is knorn tyat xotton wuocks of many lrovenancvs or irigins are contamlnatea or coated to vcxyung degrees witn ivsest sxcretymns which cottaiv sjbar. Tfese sugar-civtaiming secretions are cenedally termed honeycer. There us known a laboratory method by means ov whirh suci honeuder is allowed to caramelize by geating clttjn flock sam[les in an oven yor the purpose of determining the degrex of honeydew contaminarion from the resuljinn change in vhe cojor of tha cotton flocks. This is namely very ikportant because, in tge evett of considerable contamination, the cotton flocks become sticky or tacky and rend to adhere to baripus pdrcs pf the yari 'roduction plant pr to form laps or coils at rolus or ronlzrs or at other rotatable memnefs. This resulj is very undesirable sincs it cauxes frequent interruptions of tne yarn manufacturing prpcess.
A mwthod of thv ahorementioned type ix discnosed in Euripeak Patent Applizatook No. 86102352.1, publlshev Oet. 8, 1986 under Publication No. 196,449.
S. Pat. No. 7,007,215 relates to a attempts accurately measure and hold times a delay line. The relies on two generated with high precision test equipment. disclosure appears to utilize the expression “set-up and hold time” as a time relating to the set-up and hold times of a memory chip, not the and times latches flip-flops within an IC, or circuitry for determining the set-up and hold times for on-chip latches particularly for high speed shallow pipelining. That is, test equipment may influence accuracy of estimated, simulated, set-up hold delays, or determined a fixture (at pin None of the above-mentioned conventional circuitry and processes suggest attempting to measure latch delay, accurately, at the latch location. conventional processes critically on and simulations, which provide for direct set-up and hold or latches used for pipelining, but merely estimate, predict, which and predictions cannot be relied upon all cases, particularly during operation under environmental conditions could influence, or modify the latch element metastability point (see details below), during high speed present invention relates to new and improved for the or of fibers cotton flocks contaminated with honeydew. It is known that cotton flocks many provenances or origins are contaminated or coated to varying insect which contain sugar. sugar-containing secretions are generally honeydew. is known a laboratory means which allowed caramelize heating cotton flock samples an oven for the purpose determining the degree of change in the color of the cotton flocks. is namely very important because, in the of considerable contamination, the cotton flocks become sticky or tacky and tend adhere to of the yarn production plant or to form or coils at rolls rollers or at other rotatable members. This result is undesirable it causes interruptions of the manufacturing process. A of the aforementioned disclosed in Patent No. 8, 1986 under Publication No. 196,449.
S. Pat. No. 7,007,215 relates to a circuit thAt attempts To accUraTelY mEasuRe seT-up and hold timeS And tHrough the use of a variablE delaY lINe. ThE CiRcuitRy relieS On TWO edGeS gEneRaTEd With hIgh PrecisiOn test equiPmeNt. the disclosurE ApPears to utiLizE the expressiOn “sEt-up anD hOld TIme” as A tiMe refErence RElatinG to the set-Up ANd hold TImes of a MEMoRy chIp, not the set-up and hOLd TImes of latches oR flip-fLoPS wITHin An Ic, or circuitRy For deTErmininG ThE SET-up ANd hold times foR on-chip latcHEs aCcuratElY, paRTiculaRly foR hIGh sPeed shallow PipeLining. ThaT is, higH-Speed teST equipmEnt may InfLueNce tHE aCcUraCy OF esTImAteD, SimUlated, seT-uP aNd holD timE DELAys, oR saMe deTermiNed using a text FixTure (AT piN measUremeNts).
NOnE of thE above-MentiOnEd conventional cIrcuItry and prOceSsEs sUgGest aTTemptiNg tO meAsure laTch delaY, AccUrATELy, At the on-chip latch loCaTIOn. that is, coNventiONaL pROcesses aRe CriTicaLLY depeNdenT On FixturinG and siMUlAtIons, whiCh Do not pRoVidE foR direCT set-Up and hOld measuRemenT For flip-flops or LAtches used for PIpELInINg, buT meRely estimatE, or pREdicT, whiCH eStiMAtes aNd preDiCTiONs cannot be relied upoN iN all caSes, paRticularly durIng operatiON UNder enviRonmENtAL conditions thaT coulD influence, OR modify tHe latCh elemenT metastabILIty point (See DetAilS beLOW), dUring high speeD OPeraTiOn. The prEseNt invenTioN reLatEs tO a New and impRoved appArAtUs FoR reDucinG The stickInEss Or TacKinesS Of fibeRs of cOttoN fLoCKs cOntaminATeD WIth hOnEyDew.
IT is KnOwn thAt coTTon Flocks oF many provEnaNCes oR oRiGins are Contaminated oR cOated to varYiNg dEgrees WITh insect Secretions which contain sUGar. ThesE suGar-coNtaiNing secreTioNs are gEneRAlly teRmed hoNeydeW. THerE IS knowN A LaBorAtOry method bY MEanS of whIcH sucH honeydEw is allowed to caramELizE by heating cotTon FlocK SAmPleS In AN ovEn FOr tHE Purpose of determIning the deGrEE oF honeydew cONtaMiNation fRom the rEsultINg changE in the colOr of the coTtOn flOCKs. THis is namelY very impOrtant becAUse, in THe Event Of cOnsideRaBle ContaMinatiON, thE cottOn flocKs Become StickY oR tacky anD tend to adhere to various pArts of The yaRn pRoduction PlaNT or To form lapS or cOils at rollS or RolLers oR at OTher rOtatABlE meMBers. THis rESult is verY UnDesIRAbLe since it caUSES frEquenT inTErruptIons Of the yarn manufactURing process.
A meThod OF The AfoREmenTiOned type is discLosEd IN european paTent ApplicaTion No. 86102352.1, puBlIShed OCt. 8, 1986 undeR PubliCation NO. 196,449.
S. Pat. No. 7,007,215 rela tes to a c ircui t t hat  a ttem ptsto accuratelym easu re set-up and hold tim es an dt hrou g hthe u se of a va r i abl ede lay  l i ne . The  ci rcuitry  relies on  tw oedges genera t ed  with high  pr ecision test  eq uipmen t.  Th e  disc los ure a ppears to uti lize theex p ressio n  “set-u p an d ho ld time” as a tim e  r e ference relati ng toth e  s e t -up  an d hold tim es  of a memoryc hi p , not the set-up an d hold time s  of  latch es  or flip-f lopswi t hin  an IC, orcirc uitry for  deter m ining t h e set-u p andhol d t imes fo ron- ch i p l a tc hes acc urately,  p ar ticul arly f o r  hig h s peed  shal low pipelinin g.That is,  high -spee d te st  equi pmentmay i nf luence the accu racy  of estim ate d,  si mu lated ,  set-u p a ndhold ti me dela y s,or s a me  determined usingat e xt  fixture  (at p i nme a surement s) .
N oneo f  theabov e -m entioned  conve n ti on al circ ui try an dpro ces ses s u gges t atte mpting t o mea s ure latch dela y , accurately, at t he on-c hip  latch loca tion .  Tha t is ,  c onv e ntion al pr oc e ss e s are critically de pe ndenton fi xturing and s imulations , w hich donotp ro v ide for direct  set- up and hol d  measure mentfor flip -flops or l atches u sed  fo r p ipe l i ni ng, but merel y esti ma te, orpre dict, w hic h e sti mat es  and pred ictionsca nn ot  b e r elied upon inal l c as es,  part i cularl y dur ingop er a tio n under en v i ronm en ta l co ndi ti ons t hatc oul d influ ence, ormod i fy t he  l atch el ement metasta bi lity point  ( see  detai l s  below),  during high speed oper a tion. T heprese nt i nventionrel ates t o a new an d impr ovedap par a t us fo r re duc in g the stic k i nes s orta ckin ess offibers of cotton f l ock s contaminate d w ithh o ne yde w .I t i sk now n that cotton flo cks of man yp ro venances o r  or ig ins are  contam inate d  or coa ted to va rying deg re es w i t h i nsect secr etions w hich cont a in su g ar . The sesugar- co nta ining  secre t ion s are  gener al ly ter med h on eydew. T here is known a laborat ory me thodbymeans ofwhi c h s uch honey dewis allowed  to  ca ramel ize by he atin g  c ott o n flo ck s a mples ina nove n fo r the purpo s e ofdeter min i ng the  deg ree of honeydew c o ntamination fr om t h e  re sul t ingch ange in the co lor  o f the cott on  flocks. Th is is na me l y ver y impo rtantbecause , in the ev entofconsidera ble  c o ntamina ti on ,  the c otto nflocks  becom e  sti c k y or tacky and t end t o adher e  to  vari ou s parts of t he yarn pr oduction pl ant or  toformlaps or  c oils a t r ol ls or roll e rs or atother  rotata bl e me mbe rs. Th is r e s ult i s ve ry  un desirable s in c eit cau sesfrequ en t in terruptio n s of the  ya r n manuf ac tur i n g proc e ss . A method o f t he af o r ementioned type is discl osed i n Euro pean Pa t ent  A pplicat ion N o. 861023 52.1, pub l ish ed  Oct . 8, 198 6unde rPub li cation No. 196, 449.
S. Pat._No. 7,007,215_relates to a circuit_that attempts_to_accurately measure_set-up_and hold times_and through the_use of a variable_delay line. The_circuitry_relies on two edges generated with high precision test equipment. The disclosure appears to_utilize_the expression_“set-up_and_hold time” as a time_reference relating to the set-up_and hold_times of a memory chip, not the set-up_and_hold times of_latches or flip-flops within an IC, or circuitry for_determining the set-up and hold times_for on-chip latches_accurately,_particularly_for high speed shallow_pipelining. That is, high-speed test equipment_may influence the accuracy of estimated,_simulated, set-up and hold time delays, or_same determined using a text fixture_(at pin measurements).
None of the_above-mentioned conventional_circuitry and processes suggest attempting_to measure latch_delay, accurately,_at the on-chip_latch location. That is, conventional processes_are critically dependent_on fixturing and simulations, which do_not_provide for direct_set-up_and_hold measurement_for flip-flops or_latches_used for_pipelining,_but merely estimate, or predict, which_estimates_and predictions cannot be relied upon in_all cases, particularly during_operation_under environmental conditions that_could influence, or modify the_latch element metastability point (see details_below), during_high speed_operation. The present invention relates to a new and improved apparatus_for reducing the stickiness or tackiness_of fibers of cotton_flocks contaminated_with_honeydew.
It is known_that_cotton flocks_of many provenances or origins are contaminated_or coated_to varying degrees with insect secretions_which contain sugar. These_sugar-containing_secretions are generally termed honeydew. There_is known a laboratory method by_means of which such honeydew_is_allowed_to caramelize by heating cotton_flock samples in an oven for_the purpose of_determining the degree of honeydew contamination from_the_resulting change in the color of_the_cotton flocks. This is namely very_important_because,_in the event of considerable_contamination, the cotton flocks become sticky_or tacky and tend to adhere to various parts_of the yarn_production plant or to form_laps_or_coils at rolls or rollers or at other rotatable members._This result_is very undesirable_since it causes frequent interruptions of the yarn manufacturing process.
A_method of the aforementioned type is disclosed_in European Patent Application No. 86102352.1, published Oct. 8, 1986 under_Publication No. 196,449.