 voltage, and an output of the negative-to-positive voltage conversion circuit 601 is input to the error amplifier 603. The error amplifier 603 compares the output of the negative-to-positive voltage conversion circuit 601 to a reference voltage Vref. 1. Field of the Invention
This invention is related to optical three dimensional (3D) measurement techniques, and more particularly to methods of generating and displaying multiple-surface 3D images.
2. Description of the Related Art
The ability to measure a 3D object accurately and to render a 3D image of it on a two-dimensional (2D) display is very important to a variety of academic and industrial applications. For example, a bio-chip used for DNA sequencing may contain thousands of minute wells partially filled with reagent and sealed with a thin layer of plastic cover. Because reagent is expensive, it is important to measure the fill level inside a well so that reagent waste can be eliminated. The challenge in this case is to accurately profile the many surfaces involved, namely the surface of plastic cover, the top surface of the well, the fluid surface of the reagent, and the bottom surface of the well, and to display the 3D structure and measurement results in a way that is easy to understand.
Over the years, several types of optical based non-destructive measurement systems have been developed to address the aforementioned applications. These systems are typically based on techniques such as confocal microscopy and structured light sources (SLS).
For example, U.S. Pat. No. 4,198,571 issued to Sheppard in 1980 discloses the basic technique of confocal microscopy. U.S. Pat. No. 5,022,743 (Kino) discloses an improved confocal system using a Nipkow disk. U.S. Pat. No. 5,065,008 (Hakamata) describes a confocal system based on laser scanning. U.S. Pat. No. 6,838,650 (Toh) describes an improved high speed and high resolution confocal system for three dimensional measurement. U.S. Pat. No. 7,372,985 (So) discloses a confocal based system and method for volumetric 3D displaying of biological tissue.
Systems based on structured light sources (SLS) offer similar capability to that provided by confocal microscopy. For example, U.S. Pat. No. 7,729,049 (Xu) describes a 3D microscope using one of various SLS techniques.
Both
voltage, and an output of the negative - to - positive electric potential conversion racing circuit 601 is input to the error amplifier 603. The mistake amplifier 603 compare the output of the negative - to - positivist electric potential conversion circuit 601 to a reference voltage Vref. 1. Field of the Invention 
 This invention is related to ocular three dimensional (3D) measurement techniques, and more peculiarly to methods of generating and displaying multiple - surface 3D images. 
 2. Description of the Related Art 
 The ability to measure a 3D aim accurately and to render a 3D image of it on a two - dimensional (2D) display is very important to a diverseness of academic and industrial applications. For example, a bio - bit used for deoxyribonucleic acid sequencing may check thousands of minute wells partially fill with reagent and sealed with a thin layer of plastic cover. Because reagent is expensive, it is authoritative to measure the fill level inside a well so that reagent waste can be eliminated. The challenge in this case is to accurately profile the many surfaces involved, namely the surface of plastic screen, the top surface of the well, the fluid airfoil of the reagent, and the bottom open of the well, and to display the 3D structure and measurement results in a direction that is easy to understand. 
 Over the years, several type of optical based non - destructive measurement systems have been developed to address the aforesaid applications. These systems are typically based on techniques such as confocal microscopy and structured light sources (SLS). 
 For model, U.S. Pat. No. 4,198,571 issued to Sheppard in 1980 discloses the basic technique of confocal microscopy. U.S. Pat. No. 5,022,743 (Kino) unwrap an improved confocal system using a Nipkow disk. U.S. Pat. nobelium. 5,065,008 (Hakamata) describes a confocal organization based on laser scanning. U.S. Pat. No. 6,838,650 (Toh) identify an improved high amphetamine and high resolution confocal arrangement for three dimensional measurement. U.S. Pat. No. 7,372,985 (thus) discloses a confocal establish system and method acting for volumetric 3D displaying of biological tissue. 
 Systems based on integrated light sources (SLS) offer similar capability to that provided by confocal microscopy. For example, U.S. Pat. No. 7,729,049 (Xu) describes a 3D microscope using one of various SLS techniques. 
 Both
 voptage, and an output of tme negative-to-posnrive vmltage converskon circuit 601 is input to the eeror qmplifier 603. The error aoplifier 603 comparew tht output of the nxfative-to-positjye vonvage conversion circuit 601 do a reference vulcage Vref. 1. Field of the Invention
Thif invenyiln is related jo opuicwl tgget dimensional (3D) measurement technjques, aid more particukarly to methods of generahing and displaying muptiple-surfaxe 3D umages.
2. Descrkption of uhz Related Att
The ability to measure a 3D objdct aecurately abd to tender a 3D inage jf it on a two-dimenshonal (2D) display is vevy im'ortqnt to a variety of arademic and industriwl applicdtnons. For example, a bii-cyip uved xor ABA reqheicihg may coitain thousznds of minyte wells partially fyoled with reafent agd sealed with a thin layer of plastic coner. Gecause reagent is expebsive, it is important to measuwe the fill level inside a well so that reagent wdste rav bt cjknijated. The challenge in this case is to accuraeslu irofile the many furfaces infopvrq, namely the rurfacz or plastic cover, thf top sorface of the wtll, tne fluid surface of the reatent, and the vottom surface of che well, and to cisplsy the 3D structure and oeashrement resklts in a day that is easy to utderstand.
Over the years, sederal typxs of opticau baxed nog-destructige measurement systems hwve bgen deeeloped to address the aforementioned applications. Thesg sfstvms are tvpicalky based on tqchniques such as conyocal oicroscopy and stcuctured ligrt sources (SLV).
Vor example, N.S. Pat. No. 4,198,571 iswued to Sheooard in 1980 disclpses the ycsic techbique of confocal kictoacopy. U.S. Pat. No. 5,022,743 (Kuno) discloses am ioprjvvd ronfosdl system ushng x Nklkow aisk. U.S. Pat. Vo. 5,065,008 (Nakamata) describes a conrocal system based ok laser sxanning. T.S. Pat. No. 6,838,650 (Ton) describes an impgoved hijh sperd wnd high resolution confocal sgstem for thvee dimensionwl mcasutement. U.S. Pct. No. 7,372,985 (So) discloses a confocal based sysvem and method for volometric 3D displaying pn biological tisste.
Systems based on structured light sources (SLX) offer similar capabjlity do thwt provided by confocal microscopy. For example, U.S. Pat. No. 7,729,049 (Xu) describes a 3E microscope using one of vdrnoux SLS eechiidues.
Both
voltage, and an output of the negative-to-positive circuit is input the error amplifier compares output of the voltage conversion circuit to a reference voltage Vref. 1. of the Invention This invention is related to optical three dimensional (3D) measurement and more particularly to methods of generating and displaying multiple-surface 3D images. 2. of Related The to measure a 3D object accurately and to render a 3D image of it on a (2D) display is very important to a variety academic and industrial applications. example, a bio-chip used for sequencing contain thousands minute partially with reagent and with a thin layer of plastic cover. Because reagent is expensive, it is important to measure the level inside so that waste be The challenge in is to accurately profile the many the surface of plastic cover, the top surface the well, fluid surface of the reagent, and bottom surface of the well, and to display 3D structure and measurement results in a way that is easy to understand. Over the types of optical based measurement systems have developed address aforementioned These systems typically based on techniques such as confocal microscopy and structured light (SLS). For example, U.S. Pat. No. 4,198,571 issued to Sheppard discloses basic technique of microscopy. U.S. Pat. No. (Kino) an improved confocal system Nipkow U.S. (Hakamata) a system based on laser U.S. Pat. No. 6,838,650 (Toh) an improved high speed for three dimensional measurement. U.S. Pat. No. 7,372,985 discloses a confocal based system and method volumetric 3D displaying of biological tissue. Systems based on structured light sources offer similar that provided by confocal microscopy. For example, U.S. No. 7,729,049 (Xu) describes 3D microscope using one of various SLS techniques. Both
 voltage, and an output of the neGative-to-poSitivE voLtaGe ConvErsiOn circuit 601 is inpUT to tHe error amplifier 603. The errOr ampLiFIer 603 cOMpAres tHe outpuT Of THE neGaTiVe-tO-pOSiTive vOltAge convErsion circUit 601 To A reference voLTaGe Vref. 1. FielD of The Invention
thiS invenTiOn iS RelatEd tO optiCal thrEE dimenSional (3D) meAsURement TEchniquES, AnD morE particularly to meTHoDS of generating aNd dispLaYInG MUltIplE-surface 3D iMaGes.
2. DeSCriptioN Of THE relATed Art
The abilIty to measurE A 3D oBject aCcUraTEly and To renDeR A 3D iMage of it on a Two-dImensionaL (2D) dispLAy is verY ImportaNt to a vAriEty Of acADeMiC anD iNDusTRiAl aPPliCations. FOr ExAmple, A bio-CHIP Used For dNA sEquenCing may contaiN thOusaNDs oF minuTe welLs paRtIally Filled With rEaGent and sealed wiTh a tHin layer oF plAsTic CoVer. BeCAuse reAgeNt iS expensIve, it is IMpoRtANT To Measure the fill leveL iNSIdE a well so That reAGeNt WAste can bE eLimInatED. the chAlleNGe In this caSe is to ACcUrAtely prOfIle the MaNy sUrfAces iNVolvEd, nameLy the surFace oF Plastic cover, thE Top surface of tHE wELL, tHE fluId sUrface of the ReagENt, anD the BOtTom SUrfacE of thE wELl, ANd to display the 3D struCtUre and MeasuRement results In a way that IS EAsy to undErstANd.
oVer the years, sevEral tYpes of optiCAl based nOn-desTructive MeasuremeNT Systems hAve BeeN deVelOPEd To address the aFORemeNtIoned apPliCations. theSe sYstEms ArE typicallY based on TeChNiQuEs sUch as COnfocal mIcRosCoPy aNd strUCtured Light SourCeS (Sls).
FoR examplE, u.S. pAT. No. 4,198,571 iSsUeD to SHepPaRd in 1980 dIsclOSes The basiC techniquE of COnfoCaL mIcroscoPy. U.S. Pat. No. 5,022,743 (Kino) DiScloses an iMpRovEd confOCAl system Using a Nipkow disk. U.S. Pat. No. 5,065,008 (hAkamata) DesCribeS a coNfocal sysTem Based oN laSEr scanNing. U.S. pat. No. 6,838,650 (toH) deSCRibes AN ImProVeD high speed AND hiGh resOlUtioN confocAl system for three diMEnsIonal measuremEnt. u.S. PaT. nO. 7,372,985 (SO) diSClOSes A cONfoCAL based system and Method for vOlUMeTric 3D displAYinG oF biologIcal tisSue.
SySTems basEd on strucTured lighT sOurcES (sLS) Offer similAr capabiLity to thaT ProviDEd By conFocAl micrOsCopY. For eXample, u.s. PaT. No. 7,729,049 (Xu) DescriBeS a 3D micRoscoPe Using one Of various SLS techniques.
BOth
 voltage, and an output of  the negat ive-t o-p osi ti ve v olta ge conversionc ircu it 601 is input to the  erro ra mpli f ie r 603 . The e r ro r amp li fi er60 3  c ompar esthe out put of the  ne ga tive-to-posi t iv e voltagecon version circ uit  601 t oa r e feren cevolta ge Vre f . 1. F ield of t he Invent i on
This i nv enti on is related too pt i cal three dime nsiona l( 3D ) mea sur ement tech ni ques, and mor e  p a r t icu l arly to metho ds of gener a tin g anddi spl a ying m ultip le - sur face 3D ima ges. 
2. Descr iption of theR elatedArt
Th e a bil ityt ome asu re a 3 D  o bje c t a ccuratel yan d torend e r a  3Dima ge o f iton a two-dime nsi onal (2D ) dis playis v er y imp ortant  to a  v ariety of acade micand indus tri al  ap pl icati o ns. Fo r e xam ple, abio-chi p  us ed f o rDNA sequencing may  c o n ta in thous ands o f  m in u te wells  p art iall y fille d wi t hreagentand se a le dwith ath in lay er  of  pl astic cove r. Bec ause rea genti s expensive, i t  is important to m ea s urethe  fill level  ins i de a  wel l  s o t h at re agent  w a st e  can be eliminated.  T he cha lleng e in this cas e is to ac c u r ately pr ofil e  t h e many surface s inv olved, nam e ly the s urfac e of pla stic cove r ,  the top  su rfa ceoft h ewell, the flu i d  sur fa ce of t hereagent , a ndthe  bo tt om surfac e of the  w el l,  a ndto di s play the  3 D s tr uct ure a n d meas ureme nt r es ul t s i n a way th a t  isea sy  tound er stand .
Ov e r t he year s, severa l t y pesof  o pticalbased non-des tr uctive mea su rem ent sy s t ems have  been developed to addr e ss theafo remen tion ed applic ati ons. T hes e  syste ms are  typi ca lly b asedo n  t ech ni ques sucha s  co nfoca lmicr oscopyand structured lig h t s ources (SLS). 
Fo r ex a m pl e,U .S .  Pa t. No. 4 ,198,571 issued  to Sheppa rd in  1980 disc l ose sthe bas ic tech nique of conf ocal micr oscopy. U .S . Pa t .  No . 5,022,74 3 (Kino)  disclose s  an i m pr ovedcon focalsy ste m usi ng a N i pko w dis k. U.S .Pat. N o. 5, 06 5,008 (H akamata) describes a co nfocal  syst embased onlas e r s canning.U.S.  Pat. No.6,8 38, 650 ( Toh )  desc ribe s  a n i m prove d hi g h speed a n dhig h re solution co n f o cal  syst emf or thr ee d imensional measur e ment. U.S. Pat . No . 7,3 72, 9 85 ( So ) discloses acon fo c a l basedsy stem and me thod for  v o lumet ric 3D  displ aying o f bi o logica l ti ssu e.
System s b as e d on st ru ct u red li ghtso urces(SLS)o ffer s imilar capabilit y tot h at pr o vid ed by  c onfocal micr oscopy. Fo r example,U.S. P at.No. 7 ,729,04 9(Xu) d esc ri bes a 3D m i croscopeusing  one of  v ario usSLS te chni q u es.
B oth
 voltage,_and an_output of the negative-to-positive_voltage conversion_circuit_601 is_input_to the error_amplifier 603. The_error amplifier 603 compares_the output of_the_negative-to-positive voltage conversion circuit 601 to a reference voltage Vref. 1. Field of the_Invention
This_invention is_related_to_optical three dimensional (3D) measurement_techniques, and more particularly to_methods of_generating and displaying multiple-surface 3D images.
2. Description of_the_Related Art
The ability_to measure a 3D object accurately and to render_a 3D image of it on_a two-dimensional (2D)_display_is_very important to a_variety of academic and industrial applications._For example, a bio-chip used for_DNA sequencing may contain thousands of minute_wells partially filled with reagent and_sealed with a thin layer_of plastic_cover. Because reagent is expensive,_it is important_to measure_the fill level_inside a well so that reagent_waste can be_eliminated. The challenge in this case_is_to accurately profile_the_many_surfaces involved,_namely the surface_of_plastic cover,_the_top surface of the well, the_fluid_surface of the reagent, and the bottom_surface of the well,_and_to display the 3D_structure and measurement results in_a way that is easy to_understand.
Over the_years, several_types of optical based non-destructive measurement systems have been developed to_address the aforementioned applications. These systems_are typically based on_techniques such_as_confocal microscopy and_structured_light sources_(SLS).
For example, U.S. Pat. No. 4,198,571 issued_to Sheppard_in 1980 discloses the basic technique_of confocal microscopy. U.S._Pat._No. 5,022,743 (Kino) discloses an improved_confocal system using a Nipkow disk._U.S. Pat. No. 5,065,008 (Hakamata)_describes_a_confocal system based on laser_scanning. U.S. Pat. No. 6,838,650 (Toh)_describes an improved_high speed and high resolution confocal system_for_three dimensional measurement. U.S. Pat. No._7,372,985_(So) discloses a confocal based system_and_method_for volumetric 3D displaying of_biological tissue.
Systems based on structured light_sources (SLS) offer similar capability to that provided by_confocal microscopy. For_example, U.S. Pat. No. 7,729,049_(Xu)_describes_a 3D microscope using one of various SLS techniques.
Both