denk2014exciton] For the monolayer MoS$_2$ covered a-plane ($11\overline{2}0$) substrate, the RD signals can be described by the following equation: $$\label{Eq.1}
\frac{\Delta r}{r}=\frac{1}{2}\frac{r_{[1\overline{1}00]}-r_{[0001]}}{r_{[1\overline{1}00]}+r_{[0001]}}$$ where $r_{[1\overline{1}00]}$ and $r_{[0001]}$ denote the reflectance of the light polarized along the $[1\overline{1}00]$ and the \[0001\] directions of the a-plane sapphire substrate, respectively.

![(a) The RD spectrum taken from the monolayer MoS$_2$ on Al$_2$O$_3$($11\overline{2}0$), (b) The absorption spectrum (b) and its first derivative (c) measured from monolayer MoS$_2$ on Al$_2$O$_3$(0001).[]{data-label="figure2"}](Fig2.pdf){width="8cm"}

After the systematic characterization using conventional techniques,[@supplemental] RDS measurement was then applied to investigate the optical anisotropy within the plane of the MoS$_2$ monolayer.The real part of the RD spectra measured from the bare Al2O3(11$\overline{2}$0) surface and the one covered by monolayer MoS$_2$ are plotted in Fig. 2(a), respectively. The bare Al2O3(11$\overline{2}$0) surface shows an optical anisotropy with an almost constant value which can be directly attributed to the in-plane birefringence of the a-plane sapphire substrate. Actually, the corresponding in-plane axis, namely \[1$\overline{1}$00\] and \[0001\] axis are parallel to the ordinary and extraordinary directions of sapphire, respectively. The result reveals thus the dielectric anisotropy $\Delta \epsilon_{ext}=\epsilon_o-\epsilon_e$ in a-plane sapphire substrate. Furthermore, additional optical anisotropy shows up from the a-plane sapphire substrate covered by monolayer MoS$_2$. It worth mentioning that, above the transparent sapphire substrate, the real part of the RD signal is predominantly associated with the anisotropy of the absorption of the monolayer MoS$_2$. For comparison, the absorption spectrum of
denk2014exciton ] For the monolayer MoS$_2 $ covered a - plane ($ 11\overline{2}0 $) substrate, the RD signals can be described by the following equality: $ $ \label{Eq.1 } 
 \frac{\Delta r}{r}=\frac{1}{2}\frac{r_{[1\overline{1}00]}-r_{[0001]}}{r_{[1\overline{1}00]}+r_{[0001]}}$$ where $ r_{[1\overline{1}00]}$ and $ r_{[0001]}$ announce the coefficient of reflection of the light polarized along the $ [ 1\overline{1}00]$ and the \[0001\ ] directions of the a - airplane sapphire substrate, respectively. 

! [ (a) The RD spectrum taken from the monolayer MoS$_2 $ on Al$_2$O$_3$($11\overline{2}0 $), (b) The absorption spectrum (barn) and its first derivative (coke) measured from monolayer MoS$_2 $ on Al$_2$O$_3$(0001).[]{data - label="figure2"}](Fig2.pdf){width="8 cm " } 

 After the taxonomic characterization using conventional techniques,[@supplemental ] RDS measurement was then applied to investigate the ocular anisotropy within the plane of the MoS$_2 $ monolayer. The real part of the RD spectra measured from the unsheathed Al2O3(11$\overline{2}$0) surface and the one covered by monolayer MoS$_2 $ are plotted in Fig.   2(a), respectively. The plain Al2O3(11$\overline{2}$0) surface shows an optical anisotropy with an almost changeless value which can be directly attributed to the in - plane birefringence of the a - plane azure substrate. Actually, the corresponding in - plane axis, namely \[1$\overline{1}$00\ ] and \[0001\ ] axis are parallel to the ordinary and extraordinary directions of azure, respectively. The consequence reveals thus the dielectric anisotropy $ \Delta \epsilon_{ext}=\epsilon_o-\epsilon_e$ in a - plane sapphire substrate. Furthermore, additional optical anisotropy shows up from the a - plane azure substrate cover by monolayer MoS$_2$. It worth mention that, above the transparent sapphire substrate, the real part of the RD signal is predominantly consociate with the anisotropy of the absorption of the monolayer MoS$_2$. For comparison, the absorption spectrum of
denn2014exciton] For the monolaytr MoS$_2$ covered a-plane ($11\ovxrline{2}0$) aubstratd, the RD signals can be desccibee by uke following equatiov: $$\label{Eq.1}
\vrac{\Deltq r}{r}=\hrac{1}{2}\frac{r_{[1\overlinx{1}00]}-d_{[0001]}}{r_{[1\overllue{1}00]}+r_{[0001]}}$$ wgcre $r_{[1\mterline{1}00]}$ and $r_{[0001]}$ dgnote the rexlectance of tve lnght polarized along the $[1\overline{1}00]$ anq the \[0001\] cigections of thg a-plsge szipmire substrate, respectively.

![(a) The RD spebtrum taken from yhe monolayer MoS$_2$ on Al$_2$O$_3$($11\ovfrlije{2}0$), (b) The absorptioj spectrum (v) anq its first ddrivative (b) measured rrom monolayer MoS$_2$ on Al$_2$O$_3$(0001).[]{data-lacel="fiyure2"}](Fig2.pdf){wudrh="8cl"}

Dfter the sbstemanic characterldation gsing cpnventional teghniqnes,[@sypplemental] RDS measucement was then applyed to ineeatigate the opticql anismtro[y wkrhiv tge pmane ov tie MoS$_2$ monomayer.The reql part of the RD skecegs measured fdom thq fare Al2O3(11$\overline{2}$0) surface and the one coneres by monolayer MoS$_2$ are plotted in Fig. 2(a), respeftively. Tre bare Al2O3(11$\overline{2}$0) surface shows an optical anismtropb ditk an aunodt constant value which can be directly attrifhttd no the in-plane bivefringence of the a-olsge sapphire sobstratz. Adtually, the corresoonding in-plqne axis, gameky \[1$\overline{1}$00\] and \[0001\] axis are pqrallel to tke irdinary and extralrdinary dixectioms of sapphire, respectively. Che reault reveald thus ths dielectric anisutrppf $\Delta \tosilon_{ext}=\epsilon_o-\qpsilon_e$ mn a-pkane saophite subserate. Furtjermova, additional opticwl annsotrmpy shows kp from the a-plane sapphire substrate covered bf mmnolayer MoS$_2$. Lt worth mentioging that, abovg the trausparevt sapphirv substrave, the real [art of the RG signal is pcedominanely qssoxiated dkth the anisottopy of tkt absorptiin of the monolayev MoS$_2$. Ror comparison, cke absorption spevtrjm jf
denk2014exciton] For the monolayer MoS$_2$ covered a-plane the signals can described by the where and $r_{[0001]}$ denote reflectance of the polarized along the $[1\overline{1}00]$ and the directions of the a-plane sapphire substrate, respectively. ![(a) The RD spectrum taken from monolayer MoS$_2$ on Al$_2$O$_3$($11\overline{2}0$), (b) The absorption spectrum (b) and its first derivative measured monolayer on After the systematic characterization using conventional techniques,[@supplemental] RDS measurement was then applied to investigate the optical within the plane of the MoS$_2$ monolayer.The real of the RD spectra from the bare Al2O3(11$\overline{2}$0) surface the covered by MoS$_2$ plotted Fig. 2(a), respectively. bare Al2O3(11$\overline{2}$0) surface shows an optical anisotropy with an almost constant value which can be directly attributed the in-plane the a-plane substrate. the in-plane axis, namely \[0001\] axis are parallel to the directions of sapphire, respectively. The result reveals thus dielectric anisotropy \epsilon_{ext}=\epsilon_o-\epsilon_e$ in a-plane sapphire substrate. Furthermore, optical anisotropy shows up from the a-plane sapphire covered by monolayer MoS$_2$. It worth mentioning that, above the transparent sapphire substrate, the real the RD signal is associated with the of absorption the MoS$_2$. For the absorption spectrum of
denk2014exciton] For the monolayeR MoS$_2$ covereD a-plaNe ($11\oVerLiNe{2}0$) suBstrAte, the RD signalS Can bE described by the followiNg equAtIOn: $$\laBEl{eq.1}
\fraC{\Delta r}{R}=\FrAC{1}{2}\FraC{r_{[1\OvErlInE{1}00]}-R_{[0001]}}{r_{[1\OverlIne{1}00]}+R_{[0001]}}$$ where $r_{[1\Overline{1}00]}$ anD $r_{[0001]}$ dEnOte the reflecTAnCe of the ligHt pOlarized alonG thE $[1\overlInE{1}00]$ anD The \[0001\] diRecTions Of the a-PLane saPphire subStRAte, resPEctivelY.

![(A) thE RD sPectrum taken from tHE mONolayer MoS$_2$ on Al$_2$o$_3$($11\overlInE{2}0$), (B) THE AbsOrpTion spectrUm (B) and iTS first dERiVATIve (C) Measured from mOnolayer MoS$_2$ ON Al$_2$o$_3$(0001).[]{data-lAbEl="fIGure2"}](FiG2.pdf){wIdTH="8cm"}

after the sysTemaTic characTerizaTIon usinG ConventIonal tEchNiqUes,[@sUPpLeMenTaL] rDS MEaSurEMenT was then ApPlIed to InveSTIGAte tHe oPticAl aniSotropy within The PlanE Of tHe MoS$_2$ MonolAyer.thE real Part of The RD SpEctra measured frOm thE bare Al2O3(11$\oVerLiNe{2}$0) sUrFace aND the onE coVerEd by monOlayer MOs$_2$ arE pLOTTeD in Fig. 2(a), respectivelY. THE BaRe Al2O3(11$\oveRline{2}$0) sURfAcE Shows an oPtIcaL aniSOTropy With AN aLmost conStant vALuE wHich can Be DirectLy AttRibUted tO The iN-plane BirefrinGence OF the a-plane sappHIre substrate. ACTuALLy, THe coRreSponding in-pLane AXis, nAmelY \[1$\OvErlINe{1}$00\] and \[0001\] Axis aRe PArALlel to the ordinary anD eXtraorDinarY directions of Sapphire, reSPECtively. THe reSUlT Reveals thus the DieleCtric anisoTRopy $\DeltA \epsiLon_{ext}=\epSilon_o-\epsILOn_e$ in a-plAne SapPhiRe sUBStRate. FurthermoRE, AddiTiOnal optIcaL anisotRopY shOws Up fRoM the a-planE sapphirE sUbStRaTe cOvereD By monolaYeR Mos$_2$. IT woRth meNTioninG that, AbovE tHe TRanSparent SApPHIre sUbStRate, The ReAl parT of tHE RD Signal iS predominAntLY assOcIaTed with The anisotropy Of The absorptIoN of The monOLAyer MoS$_2$. FOr comparison, the absorptiON spectrUm oF
denk2014exciton] For the m onolayer M oS$_2 $ c ove re d a- plan e ($11\overlin e {2}0 $) substrate, the RD s ignal sc an b e  d escri bed byt he f oll ow in g e qu a ti on: $ $\l abel{Eq .1}
\frac{ \De lt a r}{r}=\fra c {1 }{2}\frac{ r_{ [1\overline{ 1}0 0]}-r_ {[ 000 1 ]}}{r _{[ 1\ove rline{ 1 }00]}+ r_{[0001] }} $ $ wher e  $r_{[1 \ o ve rlin e{1}00]}$ and $r_ { [0 0 01]}$ denote t he ref le c ta n c e o f t he light p ol arize d  alongt he $ [ 1\o v erline{1}00]$  and the \[ 0 001 \] dir ec tio n s of t he a- pl a nesapphire su bstr ate, resp ective l y.

![( a ) The R D spec tru m t aken fr om  th em ono l ay erM oS$ _2$ on A l$ _2 $O$_3 $($1 1 \ o v erli ne{ 2}0$ ), (b ) The absorpt ion  spe c tru m (b)  anditsfi rst d erivat ive ( c)  measured frommono layer MoS $_2 $onAl $_2$O $ _3$(00 01) .[] {data-l abel="f i gur e2 " } ] (F ig2.pdf){width="8c m" } 
A fter the  syste m at ic characte ri zat ionu s ing c onve n ti onal tec hnique s ,[ @s uppleme nt al] RD Smea sur ement wasthen a pplied t o inv e stigate the op t ical anisotro p yw i th i n th e p lane of the  MoS $ _2$mono l ay er. T he re al pa rt of the RD spectra meas ur ed fro m the  bare Al2O3(1 1$\overlin e { 2 }$0) sur face an d  the one cover ed by  monolayer MoS$_2$are p lotted i n Fig. 2( a ) , respec tiv ely . T heb a re  Al2O3(11$\ov e r line {2 }$0) su rfa ce show s a n o pti cal  a nisotropy  with an  a lm os tcon stant value wh ic h c an  be  dire c tly at tribu tedto  t h e i n-plane bi r e frin ge nc e of  th ea-pla ne s a pph ire sub strate. A ctu a lly,  t he  corres ponding in-pl an e axis, na me ly\[1$\o v e rline{1} $00\] and \[0001\] axis are par all el to  the  ordinary  an d extr aor d inarydirect ionsof  sa p p hire, r es pec ti vely. Ther e sul t rev ea ls t hus the  dielectric anisot r opy  $\Delta \eps ilo n_{e x t }= \ep s il o n_o -\ e psi l o n_e$ in a-plane  sapphiresu b st rate. Furt h erm or e, addi tionaloptic a l aniso tropy sho ws up fro mthea - pla ne sapphir e substr ate cover e d bym on olaye r M oS$_2$ .Itworth  menti o nin g tha t, abo ve  the t ransp ar ent sapp hire substrate, the rea l part  of t heRD signal  is pre dominantl y as sociated w ith  th e ani sot r opy o f th e  a bso r ption  oft he monola y er  Mo S $ _2 $. For comp a r i son , the  ab s orptio n sp ectrum of
denk2014exciton] For_the monolayer_MoS$_2$ covered a-plane ($11\overline{2}0$)_substrate, the_RD_signals can_be_described by the_following equation: $$\label{Eq.1}
\frac{\Delta_r}{r}=\frac{1}{2}\frac{r_{[1\overline{1}00]}-r_{[0001]}}{r_{[1\overline{1}00]}+r_{[0001]}}$$ where $r_{[1\overline{1}00]}$ and_$r_{[0001]}$ denote the_reflectance_of the light polarized along the $[1\overline{1}00]$ and the \[0001\] directions of the a-plane_sapphire_substrate, respectively.

![(a)_The_RD_spectrum taken from the monolayer_MoS$_2$ on Al$_2$O$_3$($11\overline{2}0$), (b) The_absorption spectrum_(b) and its first derivative (c) measured from_monolayer_MoS$_2$ on Al$_2$O$_3$(0001).[]{data-label="figure2"}](Fig2.pdf){width="8cm"}

After_the systematic characterization using conventional techniques,[@supplemental] RDS measurement was_then applied to investigate the optical_anisotropy within the_plane_of_the MoS$_2$ monolayer.The real_part of the RD spectra measured_from the bare Al2O3(11$\overline{2}$0) surface and_the one covered by monolayer MoS$_2$ are_plotted in Fig. 2(a), respectively. The bare_Al2O3(11$\overline{2}$0) surface shows an optical_anisotropy with_an almost constant value which_can be directly_attributed to_the in-plane birefringence_of the a-plane sapphire substrate. Actually,_the corresponding in-plane_axis, namely \[1$\overline{1}$00\] and \[0001\] axis_are_parallel to the_ordinary_and_extraordinary directions_of sapphire, respectively._The_result reveals_thus_the dielectric anisotropy $\Delta \epsilon_{ext}=\epsilon_o-\epsilon_e$ in_a-plane_sapphire substrate. Furthermore, additional optical anisotropy shows_up from the a-plane_sapphire_substrate covered by monolayer_MoS$_2$. It worth mentioning that,_above the transparent sapphire substrate, the_real part_of the_RD signal is predominantly associated with the anisotropy of the absorption_of the monolayer MoS$_2$. For comparison,_the absorption spectrum of