 EC}(\epsilon_{\rm c}).$$ where $\lceil~\rceil$ represents the ceiling function and $\lambda_{\rm EC}(\epsilon_{\rm c})$ is the cost of error correction to achieve $\epsilon_{\rm c}$-correctness. For simplicity, we will replace the right-hand side by a slightly pessimistic bound as $$n_{\rm fin}\leq  n_Z(1-h\left (\frac{f(k_X,n_X,n_{\rm tot})}{n_Z}\right))
-{\rm log_2} \frac{2}{\epsilon_{\rm PA}} - \lambda_{\rm EC}(\epsilon_{\rm c}). 
\label{keyrate}$$

Bounds on phase errors {#bounds}
----------------------

In this subsection, we discuss the specific methods to obtain $f(k_X,n_X,n_{\rm tot})$ in Eq. (\[f\]) including a method based on the Bernoulli sampling, and a more conventional method based on the simple random sampling. We also introduce a third, rather convoluted method, which will help to elucidate the difference between the former two methods.

Before discussing each of the methods, we first derive general statistical properties. Since the $Z$-labeled phase error and the $X$-labeled bit error are obtained by identical measurements, the procedure to obtain those errors is equivalent to the following steps after discarding the rounds with no-detection (i.e., with Bob failing to receive a qubit): (a) Alice and Bob further discard each of the remaining rounds with probability $1-\tilde{p}_Z^2-\tilde{p}_X^2$. (b) They make $X$-basis measurements on the remaining $n_{\rm tot}$ rounds and obtain $k_{\rm tot}$ errors. (c) Finally, they label each of the $n_{\rm tot}$ rounds as $Z$ or $X$ with probability $p_Z$ and $p_X$ (see [Eq. (\[pdef\])]{}), respectively, and obtain $k_{\rm ph}$ phase errors in $Z$-labeled rounds and $k_X=k_{\rm tot}-k_{\rm ph}$ bit errors in $X$-labeled rounds. In this procedure, since $k_X$ errors are sampled from $k_{\rm tot}$ errors with a fixed probability $p_X$, it follows a binomial distribution if $k_{\rm tot}$ and $n_{\rm
EC}(\epsilon_{\rm c}).$$ where $ \lceil~\rceil$ represents the ceiling function and $ \lambda_{\rm EC}(\epsilon_{\rm c})$ is the cost of error discipline to achieve $ \epsilon_{\rm c}$-correctness. For ease, we will replace the right - bridge player english by a slightly pessimistic bound as $ $ n_{\rm fin}\leq   n_Z(1 - h\left (\frac{f(k_X, n_X, n_{\rm tot})}{n_Z}\right) ) 
 -{\rm log_2 } \frac{2}{\epsilon_{\rm PA } } - \lambda_{\rm EC}(\epsilon_{\rm c }). 
 \label{keyrate}$$ 

 bounce on phase error { # bounds } 
 ---------------------- 

 In this subsection, we discourse the specific methods to obtain $ f(k_X, n_X, n_{\rm tot})$ in Eq.   (\[f\ ]) admit a method based on the Bernoulli sample distribution, and a more conventional method based on the simple random sampling. We also introduce a third, preferably convoluted method, which will help to clear the difference between the former two methods. 

 Before discussing each of the method, we first derive general statistical properties. Since the $ Z$-labeled phase error and the $ X$-labeled moment error are obtained by identical measurements, the procedure to obtain those error is equivalent to the following steps after discarding the rounds with no - detection (i.e., with Bob failing to receive a qubit ): (a) Alice and Bob further discard each of the remaining rounds with probability $ 1-\tilde{p}_Z^2-\tilde{p}_X^2$. (b) They do $ X$-basis measurements on the remaining $ n_{\rm tot}$ rounds and receive $ k_{\rm tot}$ errors. (c) Finally, they tag each of the $ n_{\rm tot}$ rounds as $ Z$ or $ X$ with probability $ p_Z$ and $ p_X$ (see [ Eq.   (\[pdef\ ]) ] { }), respectively, and obtain $ k_{\rm ph}$ phase errors in $ Z$-labeled turn and $ k_X = k_{\rm tot}-k_{\rm ph}$ bit errors in $ X$-labeled rounds. In this procedure, since $ k_X$ errors are sampled from $ k_{\rm tot}$ error with a fixed probability $ p_X$, it follows a binomial distribution if $ k_{\rm tot}$ and $ n_{\rm
 EC}(\fpsilon_{\rm c}).$$ where $\lceil~\rgeil$ represents jhw ceilmng fundtion ana $\lambda_{\rm EC}(\epsilon_{\rm c})$ is vhe xost if error correction to achieve $\vpsilon_{\rm c}$-cocrectness. For simplicity, we wimp re'lece the right-hakd side by d slightly pesvioidtic bound as $$n_{\rm fin}\leq  n_Z(1-h\left (\fwac{f(k_X,n_C,n_{\gm tot})}{n_Z}\right))
-{\ri lob_2} \frad{2}{\vpwilon_{\rm PA}} - \lambda_{\rm EC}(\epsiloh_{\rm c}). 
\lebel{keyrate}$$

Bouncs on phase errors {#bounds}
----------------------

Ij thls subsection, we dlscuss the wpecydic methods go obtain $f(k_X,n_X,n_{\rm tot})$ in Eq. (\[f\]) including a method basea on che Bernouloi salkling, and a nore bonventional method bdsed on the simple rakdom vampling. We also introdure a third, rather cogvoluted kechod, which will help ro eluchdata thd diwfedeice betwefn vhe former fwo methods.

Vefore discussing escr of the methoss, we siwst derive general statistical propertits. Sihce the $Z$-labeled phase wrror and the $X$-labelef bit errjr are obtained by identical measurements, the prowedurx go ibbain rhlse errors is equivalent to the following ste[a sfner discarding thc rounds with no-deyeftojn (i.e., with Boc failnhg to receive a qubih): (a) Alise ane Bob furuher ciscard each of the remainibg rounds winh peobability $1-\tilde{p}_Z^2-\cilde{p}_X^2$. (b) Thzy makg $X$-basos measurements on the xemainjng $n_{\rm tot}$ rounds aha obtain $k_{\rm tot}$ ergors. (c) Finally, they label each of the $n_{\cm toc}$ rounds as $E$ or $X$ rith probahilitn $p_Z$ and $p_X$ (see [Eq. (\[pfef\])]{}), rgspecthvely, and lbtain $k_{\rm ph}$ phase errors in $Z$-labeled rounds atd $n_X=k_{\rm toc}-k_{\rm pm}$ bit errors in $X$-labeled rounbs. In thns prozedure, sinbe $k_X$ errmrs are sam[led from $k_{\rm jot}$ errors wivh a fixeq pribabulity $p_B$, it follows a ninomial bnstributiin if $k_{\rm tot}$ and $k_{\rm
EC}(\epsilon_{\rm c}).$$ where $\lceil~\rceil$ represents the ceiling $\lambda_{\rm c})$ is cost of error For we will replace right-hand side by slightly pessimistic bound as $$n_{\rm fin}\leq (\frac{f(k_X,n_X,n_{\rm tot})}{n_Z}\right)) -{\rm log_2} \frac{2}{\epsilon_{\rm PA}} - \lambda_{\rm EC}(\epsilon_{\rm c}). \label{keyrate}$$ Bounds on errors {#bounds} ---------------------- In this subsection, we discuss the specific methods to obtain tot})$ Eq. including method based on the Bernoulli sampling, and a more conventional method based on the simple random We also introduce a third, rather convoluted method, will help to elucidate difference between the former two Before each of methods, first general statistical properties. the $Z$-labeled phase error and the $X$-labeled bit error are obtained by identical measurements, the procedure to those errors to the steps discarding rounds with no-detection Bob failing to receive a qubit): Bob further discard each of the remaining rounds probability $1-\tilde{p}_Z^2-\tilde{p}_X^2$. They make $X$-basis measurements on the $n_{\rm tot}$ rounds and obtain $k_{\rm tot}$ errors. Finally, they label each of the $n_{\rm tot}$ rounds as $Z$ or $X$ with probability $p_X$ (see [Eq. (\[pdef\])]{}), and obtain $k_{\rm phase in rounds $k_X=k_{\rm tot}-k_{\rm bit errors in $X$-labeled rounds. In this procedure, since $k_X$ errors sampled from $k_{\rm tot}$ errors with a fixed probability $p_X$, a distribution if $k_{\rm and $n_{\rm
 EC}(\epsilon_{\rm c}).$$ where $\lceil~\rceIl$ represenTs the CeiLinG fUnctIon aNd $\lambda_{\rm EC}(\epSIlon_{\Rm c})$ is the cost of error corRectiOn TO achIEvE $\epsiLon_{\rm c}$-cORrECTneSs. foR siMpLIcIty, we WilL replacE the right-hAnd SiDe by a slightlY PeSsimistic bOunD as $$n_{\rm fin}\leq  N_Z(1-h\Left (\frAc{F(k_X,N_x,n_{\rm tOt})}{n_z}\righT))
-{\rm log_2} \FRac{2}{\epsIlon_{\rm PA}} - \lAmBDa_{\rm EC}(\EPsilon_{\rM C}). 
\LaBel{kEyrate}$$

Bounds on phaSE eRRors {#bounds}
----------------------

In thIs subsEcTIoN, WE diScuSs the speciFiC methODs to obtAIn $F(K_x,N_X,n_{\RM tot})$ in Eq. (\[f\]) inclUding a methoD BasEd on thE BErnOUlli saMplinG, aND a mOre conventiOnal Method basEd on thE Simple rANdom samPling. WE alSo iNtroDUcE a ThiRd, RAthER cOnvOLutEd method, WhIcH will Help TO ELUcidAte The dIfferEnce between thE foRmer TWo mEthodS.

BefoRe diScUssinG each oF the mEtHods, we first deriVe geNeral statIstIcAl pRoPertiES. Since The $z$-laBeled phAse erroR And ThE $x$-LAbEled bit error are obtAiNED bY identicAl measUReMeNTs, the proCeDurE to oBTAin thOse eRRoRs is equiValent TO tHe FollowiNg Steps aFtEr dIscArdinG The rOunds wIth no-detEctioN (I.e., with Bob failiNG to receive a quBIt): (A) aLiCE and bob Further discArd eACh of The rEMaIniNG rounDs witH pRObABility $1-\tilde{p}_Z^2-\tilde{p}_x^2$. (b) they maKe $X$-baSis measuremenTs on the remAINIng $n_{\rm toT}$ rouNDs ANd obtain $k_{\rm tot}$ ErrorS. (c) Finally, tHEy label eAch of The $n_{\rm toT}$ rounds as $z$ OR $X$ with prObaBilIty $P_Z$ aND $P_X$ (See [Eq. (\[pdef\])]{}), respECTiveLy, And obtaIn $k_{\Rm ph}$ phaSe eRroRs iN $Z$-lAbEled roundS and $k_X=k_{\rM tOt}-K_{\rM pH}$ biT erroRS in $X$-labeLeD roUnDs. IN this PRoceduRe, sinCe $k_X$ ErRoRS arE sampleD FrOM $K_{\rm tOt}$ ErRors WitH a Fixed ProbABilIty $p_X$, it Follows a bInoMIal dIsTrIbution If $k_{\rm tot}$ and $n_{\rM
 EC}(\epsilon_{\rm c}).$$where $\lc eil~\ rce il$  r epre sent s the ceilingf unct ion and $\lambda_{\rmEC}(\ ep s ilon _ {\ rm c} )$ is t h ec o stof  e rro rc or recti onto achi eve $\epsi lon _{ \rm c}$-corr e ct ness. Forsim plicity, wewil l repl ac e t h e rig ht- handside b y  a sli ghtly pes si m isticb ound as $ $n _{\r m fin}\leq  n_Z(1 - h\ l eft (\frac{f(k _X,n_X ,n _ {\ r m  to t}) }{n_Z}\rig ht ))
-{ \ rm log_ 2 }\ f r ac{ 2 }{\epsilon_{\ rm PA}} - \ l amb da_{\r mEC} ( \epsil on_{\ rm c}) . 
\label{k eyra te}$$

Bo unds o n  phasee rrors { #bound s}--- ---- - -- -- --- -- - --- - 
Int his  subsect io n,  we d iscu s s t he s pec ific  meth ods to obtain  $f (k_X , n_X ,n_{\ rm to t})$  i n Eq.  (\[f\ ]) in cl uding a methodbase d on theBer no ull isampl i ng, an d a  mo re conv entiona l  me th o d ba sed on the simplera n d om  samplin g. Wea ls oi ntroduce  a  th ird, r ather  con v ol uted met hod, w h ic hwill he lp  to el uc ida tethe d i ffer ence b etween t he fo r mer two method s .

Before dis c us s i ng each  of  the method s, w e  fir st d e ri veg enera l sta ti s ti c al properties. Sinc ethe $Z $-lab eled phase er ror and th e $ X$-label ed b i te rror are obtai ned b y identica l  measure ments , the pr ocedure t o obtain t hos e e rro rsi s  e quivalent tot h e fo ll owing s tep s after  di sca rdi ngth e roundswith no- de te ct io n ( i.e., with Bob  f ail in g t o rec e ive aqubit ): ( a)  A l ice  and Bo b  f u r ther  d is card  ea ch  of t he r e mai ning ro unds with  pr o babi li ty  $1-\ti lde{p}_Z^2-\t il de{p}_X^2$ .(b)  Theym a ke $X$-b asis measurements on th e  remain ing  $n_{ \rmtot}$ rou nds  and o bta i n $k_{ \rm to t}$ e rr ors . (c) F i n al ly,  t hey labele a chof th e$n_{ \rm tot }$ rounds as $Z$ o r  $X $ with probab ili ty $ p _ Z$  an d  $ p _X$  ( s ee[ E q. (\[pdef\])]{ }), respec ti v el y, and obt a in$k _{\rm p h}$ pha se er r ors in$Z$-label ed rounds  a nd $ k _ X=k _{\rm tot} -k_{\rmph}$ bite rrors in  $X$- lab eled r ou nds . Inthis p r oce dure,  since  $ k_X$ e rrors  a re sampl ed from $k_{\rm tot}$ e rrorswitha f ixed prob abi l ity  $p_X$, i t fo llows a bi nom ial  dist rib u tionif $ k _{ \rm tot}$  and $n_{\rm
 EC}(\epsilon_{\rm_c}).$$ where_$\lceil~\rceil$ represents the ceiling_function and_$\lambda_{\rm_EC}(\epsilon_{\rm c})$_is_the cost of_error correction to_achieve $\epsilon_{\rm c}$-correctness. For_simplicity, we will_replace_the right-hand side by a slightly pessimistic bound as $$n_{\rm fin}\leq  n_Z(1-h\left (\frac{f(k_X,n_X,n_{\rm_tot})}{n_Z}\right))
-{\rm_log_2} \frac{2}{\epsilon_{\rm_PA}}_-_\lambda_{\rm EC}(\epsilon_{\rm c}). 
\label{keyrate}$$

Bounds on_phase errors {#bounds}
----------------------

In this subsection,_we discuss_the specific methods to obtain $f(k_X,n_X,n_{\rm tot})$ in_Eq. (\[f\])_including a method_based on the Bernoulli sampling, and a more conventional_method based on the simple random_sampling. We also_introduce_a_third, rather convoluted method,_which will help to elucidate the_difference between the former two methods.

Before_discussing each of the methods, we first_derive general statistical properties. Since the_$Z$-labeled phase error and the_$X$-labeled bit_error are obtained by identical_measurements, the procedure_to obtain_those errors is_equivalent to the following steps after_discarding the rounds_with no-detection (i.e., with Bob failing_to_receive a qubit):_(a)_Alice_and Bob_further discard each_of_the remaining_rounds_with probability $1-\tilde{p}_Z^2-\tilde{p}_X^2$. (b) They make_$X$-basis_measurements on the remaining $n_{\rm tot}$ rounds_and obtain $k_{\rm tot}$_errors._(c) Finally, they label_each of the $n_{\rm tot}$_rounds as $Z$ or $X$ with_probability $p_Z$_and $p_X$_(see [Eq. (\[pdef\])]{}), respectively, and obtain $k_{\rm ph}$ phase errors in $Z$-labeled_rounds and $k_X=k_{\rm tot}-k_{\rm ph}$ bit_errors in $X$-labeled rounds._In this_procedure,_since $k_X$ errors_are_sampled from_$k_{\rm tot}$ errors with a fixed probability_$p_X$, it_follows a binomial distribution if $k_{\rm_tot}$ and $n_{\rm