Materials The deviation from parallelism between two surfaces, for instance in optical engineering, is usually measured in arcminutes or arcseconds. In addition, arcseconds are sometimes used in rocking curve (ω-scan) x ray diffraction measurements of high-quality epitaxial thin films.
Materials The deviation from parallelism between two surfaces for instance in optical engineering is usually measured in arcminutes or arcseconds In addition arcseconds are sometimes used in rocking curve (ω-scan) x ray diffraction measurements of high-quality epitaxial thin films