21. The system of claim 14 wherein the pattern matching system is further configured to: generate one or more modified text rows that correspond to the one or more particular text rows in each of the at least two selected classes, wherein each modified text row comprises at least one abstracted character block that corresponds to a merging of consecutive character blocks in a corresponding one of the particular text rows in one particular class when a gap between the two consecutive block is overlapped by another character block in at least one other one of the particular text rows in the one particular class; determine a corresponding one or more binary rows for the one or more modified text rows in each of the at least two selected classes; determine a projection profile for each selected class based on the corresponding one or more binary rows; and determine the corresponding binary average row for each of the one or more classes as a function of the projection profile.
21. The system of claim 14 wherein the pattern matching system is further configured to: generate one or more modified text rows that correspond to the one or more particular text rows in each of the at least two selected classes, wherein each modified text row comprises at least one abstracted character block that corresponds to a merging of consecutive character blocks in a corresponding one of the particular text rows in one particular class when a gap between the two consecutive block is overlapped by another character block in at least one other one of the particular text rows in the one particular class; determine a corresponding one or more binary rows for the one or more modified text rows in each of the at least two selected classes; determine a projection profile for each selected class based on the corresponding one or more binary rows; and determine the corresponding binary average row for each of the one or more classes as a function of the projection profile. 22. The system of claim 21 wherein each binary row comprises a second binary value at each column in a corresponding text row, wherein each second binary value specifies whether a particular column position in the corresponding average row comprises a character block or a white space, and wherein the pattern matching system determines the projection profile by summing the second binary values at each column of the corresponding one or more binary rows.