1. A method for verification of soft error resilience of devices from design data for a logic design, comprising: selecting a statistically relevant set of Soft Error Rate (SER) sensitive logic devices deemed critical to a SER robustness for a test process of the logic design by using a SER categorization tool to generate a SER sensitive device test set, and further comprising: successively filtering the design data through a series of heuristic rule-based device identifiers that group and annotate the SER sensitive logic devices by parsing a netlist representing the logic design for identification nomenclature, device type and connectivity; selecting, grouping, and associating related devices for testing according to a list of predetermined SER sensitive device types; and reducing a number of the devices in the SER sensitive device test set based on symmetry of structures joined to a common bus and further reducing flow device vectors to scalars; and inducing a logic state fault in successive ones of said reduced number of devices in said test process of the logic design for functional design verification which provides a sufficient delay after injection for the logic design to detect a logic fault for those reduced number of devices in said test process; and providing logic fault information of said detected logic fault of said reduced number of devices to facilitate corrective action.
1. A method for verification of soft error resilience of devices from design data for a logic design, comprising: selecting a statistically relevant set of Soft Error Rate (SER) sensitive logic devices deemed critical to a SER robustness for a test process of the logic design by using a SER categorization tool to generate a SER sensitive device test set, and further comprising: successively filtering the design data through a series of heuristic rule-based device identifiers that group and annotate the SER sensitive logic devices by parsing a netlist representing the logic design for identification nomenclature, device type and connectivity; selecting, grouping, and associating related devices for testing according to a list of predetermined SER sensitive device types; and reducing a number of the devices in the SER sensitive device test set based on symmetry of structures joined to a common bus and further reducing flow device vectors to scalars; and inducing a logic state fault in successive ones of said reduced number of devices in said test process of the logic design for functional design verification which provides a sufficient delay after injection for the logic design to detect a logic fault for those reduced number of devices in said test process; and providing logic fault information of said detected logic fault of said reduced number of devices to facilitate corrective action. 10. The method according to claim 1 wherein there is selection from a Soft Error Rate (SER) device list a set of statistically relevant SER sensitive devices deemed critical to SER robustness for a test process of said logic design while using said programmed SER categorization tool to extract SER sensitive devices from said SER device list according to said logic design and then generating the SER sensitive device test set organized by common structure and function.