3. The method according to claim 1 wherein design data for a device to be tested with an induced logic state fault is assigned a value weighting attribute for the specific device characteristics of the device to determine when to test the device and how to include the test result in the SER rate.
3. The method according to claim 1 wherein design data for a device to be tested with an induced logic state fault is assigned a value weighting attribute for the specific device characteristics of the device to determine when to test the device and how to include the test result in the SER rate. 4. The method according to claim 3 , wherein the assigned value weighting attribute is used to organize devices by common structure and function for device test data used in said test process according to said value weighting.