10. The semiconductor test system of claim 9 including one or more test templates cooperating with said data-manager, said flow control controlling the flow of said test template information to said data-manager.
10. The semiconductor test system of claim 9 including one or more test templates cooperating with said data-manager, said flow control controlling the flow of said test template information to said data-manager. 11. The semiconductor test system of claim 10 including instrument drivers cooperating with said data-manager, said data-manager providing information from said spreadsheets to said instrument drivers.