2. The semiconductor test system of claim 1 in which said Dcontainer stores an indicator of the position of said named data in said ordered sequence vector.
2. The semiconductor test system of claim 1 in which said Dcontainer stores an indicator of the position of said named data in said ordered sequence vector. 8. The semiconductor test system of claim 2 including a spreadsheet workbook having one or more spreadsheets containing said named device parameter data.