21. A method of semiconductor testing, comprising: a first actualization module actualizing a first rule relating to semiconductor testing; and a second actualization module actualizing a second rule relating to semiconductor testing, wherein said second rule refers to said first rule.
21. A method of semiconductor testing, comprising: a first actualization module actualizing a first rule relating to semiconductor testing; and a second actualization module actualizing a second rule relating to semiconductor testing, wherein said second rule refers to said first rule. 24. The method of claim 21 , further comprising: said first actualization module performing a corrective action if necessary based on a result of said second rule.