13. The semiconductor test system of claim 12 in which said Dcontainer stores an indicator of the position of said named data in said ordered sequence vector.
13. The semiconductor test system of claim 12 in which said Dcontainer stores an indicator of the position of said named data in said ordered sequence vector. 17. The semiconductor test system of claim 13 in which said ordered sequence is a numerically ordered sequence and said mapping indicia is the position of said named data in said numerically ordered sequence.