1. A system for testing of control devices, the system comprising: a computer memory that stores a testing grammar that describes a set of test cases for a device under test; and a processor that: determines at least one of a number of a set of test cases that would be generated based on metadata associated with the testing grammar and a description of the set of test cases that would be generated; evaluates the metadata associated with the testing grammar and the description of the set of test cases that would be generated without generating the set of test cases; determines at least one modification to the set of test cases that would be generated; and generates a subsequent set of test cases for the device under test based on the determined at least one modification to the set of test cases.
1. A system for testing of control devices, the system comprising: a computer memory that stores a testing grammar that describes a set of test cases for a device under test; and a processor that: determines at least one of a number of a set of test cases that would be generated based on metadata associated with the testing grammar and a description of the set of test cases that would be generated; evaluates the metadata associated with the testing grammar and the description of the set of test cases that would be generated without generating the set of test cases; determines at least one modification to the set of test cases that would be generated; and generates a subsequent set of test cases for the device under test based on the determined at least one modification to the set of test cases. 7. The system as recited in claim 1 , wherein the processor further causes generating control instructions for the device under test, wherein the control instructions describe the subsequent set of test cases for the device under test.