12. A system for isolating one or more causes of semiconductor misprocessing comprising: a. a wafer tracking database for storing a plurality of process parameters and a plurality of identifying information associated with a plurality of processed wafers; b. a query generator connected to said wafer tracking database and operable to generate a first plurality of queries and apply said first plurality of queries to said wafer tracking database to generate a set of observations for each query; and c. an outlier detector connected to the query generator operable to determine whether the set of observations for each of said first plurality of queries contains outliers as determined by the set of observations.
12. A system for isolating one or more causes of semiconductor misprocessing comprising: a. a wafer tracking database for storing a plurality of process parameters and a plurality of identifying information associated with a plurality of processed wafers; b. a query generator connected to said wafer tracking database and operable to generate a first plurality of queries and apply said first plurality of queries to said wafer tracking database to generate a set of observations for each query; and c. an outlier detector connected to the query generator operable to determine whether the set of observations for each of said first plurality of queries contains outliers as determined by the set of observations. 14. The system of claim 12, wherein said outlier detector is operable to create a second plurality of queries, said second plurality of queries containing queries from said first plurality of queries containing outliers.