6. A system for testing computing devices, comprising: one or more computer processors; at least one computer memory accessible by at least one of the one or more computer processors; a client application component executed by at least one of the one or more computer processors for generating control instructions for a device under test, wherein the control instructions describe an initial set of test cases for the device under test; and a test case generation component executed by at least one of the one or more computer processors for: obtaining the generated control instructions from the client application component, analyzing the control instructions to determine at least one attribute of the initial set of test cases described by the control instructions for the device under test, generating modified control instructions using the determined attribute of the initial set of control instruction, transmitting the second set of test cases to the device under test, and obtaining at least one output generated by the device under test, wherein the at least one output generated by the device under test is responsive to the second set of test cases described by the modified control instructions; wherein control instructions are analyzed without generation of the initial set of test cases.
7. The system as recited in claim 6 , wherein the control instructions correspond to a test grammar.