15. A computer system, comprising: at least one computing device configured to create a built-in-self-test (BIST) organizational file for an integrated circuit (IC) chip by: receiving a design file including a hierarchy of memory modules, each module including a plurality of memory wrappers; scanning each memory wrapper in each hierarchical level of memory modules for a BIST type; creating, based on the hierarchical level and the BIST type, an ordered list of memory wrappers; adding, based on the BIST type, a BIST engine for each memory wrapper listed in the ordered list; and adding a plurality of additional statements to the ordered list to create the BIST organizational file.
16. The computer system of claim 15 , further comprising: receiving a module reference file (MRF) including a BIST organizational file for a plurality of memory wrappers in at least one module, wherein only the plurality of memory wrappers in the modules not listed in the MRF are scanned and at least one reference statement corresponding to a specified view of each occurrence of the modules listed in the MRF is added to the BIST organizational file.