9. The method of claim 1 , wherein the knowledge database stores information related to process sensitivity, design information including type of hotspots and width, location of pattern in mask, pattern type or identification, and mask simulation information.
12. The method of claim 9 , wherein the knowledge database further stores information comprising one or more recommended rules and associated yield impact in design, wherein the one or more recommended rules are of categories including yield redundancy, yield marginality, yield variability, and yield critical area.