4. The system of claim 3 wherein the pattern matching system is further configured to: determine a second average row vector for each of the first combined class and the second combined class; interpolate the second average row vector for each of the first combined class and the second combined class to generate second corresponding interpolation vector data; determine a third correlation value between the second corresponding interpolation vector data for each of the first combined class and the second combined class; compare the third correlation value to the threshold correlation value; group the first combined class and the second combined class into a third combined class when the third correlation value is greater than the threshold correlation value; determine a third distance between binary average rows for the first combined class and the second combined class when the third correlation value is less than the threshold value; compare the third distance to the threshold distance; and group the first combined class and the second combined class into the third combined class when the distance is less than the threshold distance.
3. The system of claim 1 wherein the pattern matching system is further configured to: determine a second correlation value between the corresponding interpolation vector data for a second at least two selected classes of text rows; compare the second correlation value to the threshold correlation value; group the second at least two selected classes of text rows into a second combined class when the second correlation value is greater than the threshold correlation value; determine a second distance between the binary average rows for the second at least two selected classes of text rows when the second correlation value is less than the threshold correlation value; compare the second distance to the threshold distance; and group the second at least two selected classes into the second combined class when the second distance is less than the threshold distance.