1. An apparatus, comprising: an RFID tag comprising a receive signal path that flows from one or more primary inputs, said receive signal path to process an electrical receive signal originating from said inputs as a consequence of said inputs having received a wireless signal, said RFID tag also comprising a non-volatile memory, said non-volatile memory to store said RFID tag's identification, said RFID tag including built-in-self-test (BIST) logic circuitry to test said non-volatile memory while said RFID tag is being tested on wafer.