1. In an integrated circuit, the improvement comprising: a self-test device for carrying out a self-test of the integrated circuit, said self-test device having a control output; and a program memory connected to said self-test device for storing at least one test program supplied from outside the integrated circuit and executed while said self-test device carries out a self-test; said self-test device using said control output to control loading of a respective test program to be executed, from outside the integrated circuit into said program memory.