1. A device for performing a matrix-vector multiplication of a matrix with a vector, the device comprising: a memory crossbar array comprising a plurality of row lines; a plurality of columns lines; a plurality of junctions arranged between the plurality of row lines and the plurality of column lines, wherein each junction comprises a programmable resistive memory element; a signal generator configured to apply programming signals to the resistive memory elements to program conductance values for the matrix-vector multiplication; a readout circuit configured to apply read voltages to the row lines of the memory crossbar array; read out current values of column lines of the memory crossbar array; wherein the device is configured to perform a calibration procedure to compensate for conductance variations of the resistive memory elements, the calibration procedure being configured to: program a calibration subset of the plurality of resistive memory elements to initial conductance values; apply a constant calibration voltage to the row lines of the calibration subset; read calibration current values of the column lines of the calibration subset; and derive an estimation of a conductance variation parameter from the calibration current values.