1. A method for identifying a suspect layout feature from a plurality of layout features contained in an integrated circuit (IC) layout, comprising: generating a plurality of snippet images depicting suspect polygons, each of the snippet images depicting at least a portion of a suspect polygon which is different from a portion of the suspect polygon depicted in others of the plurality of snippet images, the suspect polygons being determined based on the diagnosis of a plurality of defective ICs manufactured according to the IC layout; and assigning each of the plurality of snippet images to a particular cluster of a plurality of clusters based on similarities between snippet images in each respective cluster.