1. A method comprising: capturing, by a computing system, events performed during a simulation of a circuit design with a regression, wherein at least a portion of the circuit design is provided for subsequent design and manufacturing of electronic devices; identifying, by the computing system, that one or more combinations of the captured events correspond to one or more system level coverage points for system level functionality of the circuit design; populating, by the computing system, nodes of a matrix with indications that the identified combinations of the captured events covered the system level coverage points for the system level functionality of the circuit design, wherein each node in the matrix correspond to a different combination of the events capable of occurring during the simulation; and utilizing, by the computing system, the indications in the matrix to determine whether the system level functionality covered by the combinations of the captured events was previously uncovered for the circuit design.