1. A defect inspection method of inspecting a presence of a defect on an object, the defect inspection method comprising the steps of: inputting a wavelength characteristic of each of a plurality of samples with wavelength variation of an illumination light for inspection; inputting an inspection condition which an inspector voluntary sets for each sample as a teaching signal; learning and storing a relationship between the inputted wavelength characteristic of each sample and the inputted inspection condition for each sample as a learning; inputting a wavelength characteristic of the object with the wavelength variation of the illumination light; determining an inspection condition for the object based on the inputted wavelength characteristic of the object and the learning; and detecting a defect of the object based on the determined inspection condition for the object.