1. A method for determining memory device identification comprising the steps of: invoking a serial output from n identification fuses of a plurality of devices, the output for identifying the devices; sampling the serial output every n th bit to determine a fuse state for a fuse of each device; repeating the sampling for all n fuses to acquire fuse data for all devices; and determining a pass/fail string corresponding to the sampled output, the pass/fail string being employed to identify the devices through a parallel test and burn-in system.