1. A method of generating a system test library at a testing apparatus operably linked to a device under test, for a test scenario, comprising: retrieving a list of parameters from a first electronic storage, said list of parameters corresponding to said device under test; retrieving parameter values in correspondence to said parameters in said list; providing a network topology library to identify a network topology relative to said test scenario and said device under test; retrieving trigger points for said identified network topology; retrieving trigger point implementations for said trigger points retrieving a command set for an identified network topology from a second electronic storage, said command set including command objects; and initializing said command objects with said parameter values.