1. A method of storing a memory defect map comprising: testing a memory component for defective memory locations; wherein the testing is conducted when manufacturing the memory component; storing memory defect information in a memory defect map, wherein the memory defect information is based, at least in part, on the defective memory locations; retrieving a first target test address; and determining whether the first target test address is included in the memory defect map corresponding to the memory component, wherein the first target test address is incremented to obtain a second target test address if it is determined that the first target test address is included in the memory defect map.