1. A statistical analysis method for performing an analysis process on monitor data stored in a database, the monitor data received from a substrate processing apparatus configured to process a substrate, the method comprising: receiving monitor data from the substrate processing apparatus; producing representative value data based on the monitor data; associating the representative value data with apparatus condition information indicating a condition of the substrate processing apparatus at a time of production of the monitor data; storing the representative value data and the apparatus condition information associated with the representative value data in the database; retrieving the representative value data and the apparatus condition information associated with the representative value data from the database; comparing an exclusion parameter with the retrieved apparatus condition information, the exclusion parameter including information indicating whether the representative value data associated with the apparatus condition information should be included in statistical analysis targets; and determining whether the retrieved representative value data are included in the statistical analysis targets, based on a comparison result produced by comparing the exclusion parameter with the apparatus condition information; wherein when the information included in the exclusion parameter is changed, determining whether to include additional representative value data in the statistical analysis targets.