1. A method for adjusting load at a device under test, the method comprising: at a testing platform: determining whether a current operations rate associated with a device under test (DUT) is near a target operations rate, wherein the current operations rate is associated with one or more simulated users being simulated by the testing platform; and in response to determining that the current operations rate associated with the DUT is not near a target operations rate, adjusting the current operations rate by increasing or decreasing the number of simulated users interacting with the DUT, wherein adjusting the current operations rate by increasing or decreasing the number of simulated users interacting with the DUT includes multiplying by a predetermined value the current number of simulated users and/or virtual threads or dividing by the predetermined value the sum of the current number of simulated users and/or virtual threads and a previous number of simulated users and/or virtual threads.