1. A method for configuring an image analysis device to inspect objects comprising: continuously moving a sequence of objects being manufactured in a production environment relative to a field of view of the image analysis device; capturing a sequence of images of the field of view, such that the sequence of images includes a plurality of images of each of a plurality of objects from the sequence of objects being manufactured in the production environment; displaying a portion of the sequence of images on a graphical user interface, the portion displayed chosen responsive to scrolling commands, the scrolling commands advancing the portion forward and backward in the sequence of images; choosing, during a training phase, a first training image from the displayed portion of the sequence of images of a training object, the first training image being selected depending upon particular features recognized on the training object during the training phase; configuring the image analysis device by creating, using the first training image chosen during the training phase, at least one vision tool to inspect objects similar in appearance to the training object of the first training image, the at least one vision tool being represented by a graphical image on the graphical user interface; and performing an image analysis operation on the first training image to detect a feature on the training object of the training image, by computing a logic value to determine whether the feature is located in the field of view for each of the plurality of images such that the feature is determined to be located in the field of view for at least one image of the plurality of images when the logic value for the feature located in the field of view for the at least one image is greater than a threshold value.