1. A method, comprising: defining a hierarchy associated with a test system including a plurality of test units for testing integrated circuit devices, at least some of the test units having a plurality of sockets, the hierarchy including a first level including a first plurality of entities each associated with one of the sockets and at least a second level including a second plurality of entities each associated with a grouping of the sockets; receiving state data associated with operational states of the sockets in a computing apparatus; and generating a set of state metrics in the computing apparatus for each entity at each level of the hierarchy based on the state data, each set of state metrics identifying time spent in the operational states.