1. A system, comprising: a general purpose computational resource for performing general purpose operations of the system; and a special purpose computational resource, coupled to the general purpose computational resource, for: storing test patterns, a description of an integrated circuit, and a description of hardware for testing the integrated circuit; and executing software for simulating an operation of testing of the integrated circuit in response to the test patterns, wherein the test patterns specify an expected value of the operation of testing of the integrated circuit; wherein the special purpose computational resource is for determining whether the expected value is different from a measured value of the operation of testing of the integrated circuit; and wherein the special purpose computational resource is for modifying the test patterns in response to a determination that the expected value is different from the measured value.