1. A computer method for generating parameters for a manufacturing apparatus to produce wafers, the method comprising: identifying one or more input parameters that cause a change in output characteristics of the wafers produced by the manufacturing apparatus; receiving at least one empirical data point having one or more empirical values for the input parameters and an empirical output value; predicting an output value for the at least one empirical data point; generating a first mathematical function based on the empirical output value and the predicted output value; solving the first mathematical function as potential energy of a virtual multidimensional mechanical system to yield optimized output values; and generating a recipe for controlling the manufacturing apparatus for producing the wafers based on the optimized output values.