1. A method for strain mapping a material comprising the steps of: scanning a sample of a material with a transmission electron microscope (TEM), wherein the scanning of the material occurs over multiple steps having a step size and at a beam precession angle; comparing each scan at each step and beam precession angle to a template to produce data, wherein the template is generated from parameters of the material and information from the scanning step; analyzing the data using local mis-orientation mapping analysis or Nye tensor analysis; and producing a local strain map of the sample.