1. A system for wafer analysis, including: a processing unit for receiving test data from a test unit for a wafer test; and a learning and comparing of artificial neural network unit which connects with said processing unit and receives instructions from said processing unit to compute said test data, and compares computation with data from a database for making results of systematic analysis approach to results of artificial analysis; whereby said system saves time of wafer analysis, wherein said test data is transferred by said processing unit to be an output data, and wherein the value of said output data are between 0 and 1, and the judgment is definable by 0.5.