1. A method for testing a physical region in a solid-state storage device, the method comprising: defining a physical storage region on solid-state storage media of a solid-state storage device, the physical storage region comprising a subset of storage capacity of the solid-state storage media; implementing the physical storage region definition on a storage controller such that memory operations are bounded to the physical storage region; and testing wear of solid-state storage media associated with the physical storage region using memory operations bounded to the physical storage region.