1. An integrated circuit chip test apparatus comprising: a module test fixture having contact pads, wherein said contact pads are adapted to make contact with signal input/output pins on an integrated circuit chip being tested; an intermediate banking box connected to said module text fixture; and a tester connected to said intermediate banking box, wherein said tester includes at least one bank of channels, wherein there are more of said pins on said integrated circuit chip than there are said channels in said tester, wherein said intermediate banking box includes switches connected between said contact pads and said channels, and wherein said switches are adapted to selectively connect a subset of said contact pads to said channels to connect said tester to a subset of said pins, thereby allowing said tester to test a portion of said integrated circuit that corresponds to said subset of pins.