1. A method for analyzing and determining electrical parameters of a liquid metal-based pseudo-FET made on a silicon-on-insulator substrate comprising: creating an ohmic gate contact to a substrate side of a test sample of the silicon-on-insulator substrate; treating a Si film surface of said test sample to remove native oxide and reduce surface states; contacting said Si film surface with two liquid metallic electrodes which act as source and drain electrodes; placing a low bias drain voltage in the range of 50 to 300 millivolts between said source and drain electrodes; placing a varying voltage bias on said gate contact, varying from a negative value greater than an FET flat band voltage to a positive value greater than an inversion threshold voltage; recording values of the drain current at each said gate voltage; and performing an analysis of said drain voltage versus gate voltage measurements to determine electrical parameters of the liquid metal based pseudo-FET made on a silicon-on-insulator substrate.