1. An apparatus to predict storage device failure, the apparatus comprising: a technology descriptor module comprising a semiconductor device storing executable code executed by a processor and configured to associate a technology descriptor with a storage device; a failure threshold module comprising the semiconductor device storing executable code executed by the processor and configured to set a predictive failure threshold for the storage device in response to the technology descriptor; a workload management detection module comprising the semiconductor device storing executable code executed by the processor and configured to detect workload management of the storage device in response to a storage device duty cycle decrease and a storage device environmental characteristic exceeding a threshold; a threshold modification module comprising the semiconductor device storing executable code executed by the processor and configured to modify the predictive failure threshold in response to detecting the workload management of the storage device; and a performance detection module comprising the semiconductor device storing executable code executed by the processor and configured to detect a storage device error that exceeds the predictive failure threshold as a storage device predictive failure.