1. A method for de-embedding a device under test, the method comprising: representing electrical characteristics of a test structure including a device under test using a set of test structure ABCD parameters; representing electrical characteristics of a thru test structure using a set of thru S parameters; partitioning the set of thru S parameters into a first set of partitioned S parameters and a second set of partitioned S parameters; converting the first set of partitioned S parameters into a first set of partitioned ABCD parameters; converting the second set of partitioned S parameters into a second set of partitioned ABCD parameters; and using the first set of partitioned ABCD parameters, the second set of partitioned ABCD parameters, and the set of test structure ABCD parameters to produce a set of device ABCD parameters representative of intrinsic electrical characteristics of the device under test.