1. An integrated circuit device, comprising: functional logic; an anti-noise machine; and state monitoring points providing the anti-noise machine with an interface to the functional logic for monitoring states of the functional logic, wherein the anti-noise machine includes: i) indicia defining noise precursor states for the functional logic, and ii) recognition logic coupled to the state monitor points, the anti-noise machine being operable to generate anti-noise responsive to the recognition logic detecting noise precursor states in the functional logic via the state monitor points, wherein the noise precursor states match the indicia.