1. A method of generating an RC profile, comprising: generating a graphical representation of an integrated chip layout having a plurality of integrated chip components; determining a plurality of pattern based graphical features, wherein respective pattern based graphical features define a structural aspect of one of the plurality of integrated chip components; and defining the one of the plurality of integrated chip components as a pattern oriented function that is a function of the plurality of pattern based graphical features, wherein the pattern oriented function is configured to determine a cross-sectional shape of the one of the plurality of integrated chip components based upon relations between the plurality of pattern based graphical features; wherein a computing device is configured to generate the graphical representation of the integrated chip layout, to determine the plurality of pattern based graphical features, or to define one of the plurality of integrated chip components as the pattern oriented function.