1. A memory element for an information storage and retrieval system in which data is transferred by a scanning electron beam, wherein said element comprises an electrically conductive layer of an electrically conductive substance to which is laminated a layer of dielectric material, the latter having a thickness of less than 1 micrometer, a resistivity of at least 10.sup.16 ohm-cm, and a dielectric strength of at least 10.sup.5 volts/cm, means disposed essentially coplanar with the exposed surface of said insulating material layer for providing a focusing means for said electron beam, and means recognizable by said electron beam for providing spatial reference information to said system for enabling precise repeatable access to discrete locations for each bit of information in said memory element, whereby said element is capable of handling data with a resolution equal to at least 10.sup.8 bits/cm.sup.2.