1. A prediction method for a substrate processing apparatus, the prediction method predicting processing results from operation data on the substrate processing apparatus during a procedure for processing a target processing substrate in a processing chamber of the substrate processing apparatus, the prediction method comprising: a data collection step of collecting operation data obtained whenever the target processing substrate is processed, and processing result data obtained by measuring status of the target processing substrate; a moving average processing step of obtaining a moving average of a preset number of sets of data using the processing result data collected at the data collection step, thus obtaining moving average processing result data; an analysis step of performing multivariate analysis using the operation data collected at the data collection step and the moving average processing result data obtained at the moving average processing step, thus obtaining a correlation between the operation data and the moving average processing result data; and a prediction step of predicting processing results using operation data obtained when a target processing substrate, other than the target processing substrate used to obtain the correlation at the analysis step, is processed on a basis of the correlation.