1. A semiconductor integrated circuit device, comprising: a fuse to be electrically programmed; a data latch circuit configured to hold fuse data programmed into the fuse after the fuse is programmed; a data preset circuit configured to preset data to be programmed into the fuse in the data latch circuit before the fuse is programmed; and a programming selecting circuit configured to monitor a state of data in the data latch circuit and select whether to perform or not to perform a programming operation for the fuse.