1. A defect-amelioration system comprising: a test-out connect for applying signals to a device; a test-in connect for receiving signals output by the device; and testing logic that outputs test signals to the test-out connect and receives signals output by the device in response to the test signals through the test-in connect to test the device in order to identify defects, computes a new configuration for the device from an original configuration and the identified defects so that, when the device is configured according to the new configuration, the device operates correctly despite the identified defects, and stores the new configuration in memory for subsequent configuration of the device.