1. A method of fault testing in a storage device, the method comprising: testing, in accordance with a storage device testing protocol, operability of a plurality of distinct portions on the storage device; the testing including, for each of the plurality of distinct portions on the storage device: performing one or more operations on a respective portion of the storage device; recording data corresponding to electrical current drawn during performance of the one or more operations on the respective portion of the storage device; analyzing the recorded data, including determining whether one or more predefined characteristics of the recorded data meets predetermined failure criteria; and in accordance with a determination that the recorded data meets the predetermined failure criteria, performing one or more remedial actions including updating a mapping of the storage device to mark the respective portion as a known-bad portion.