1. A method of analyzing diffraction patterns, comprising: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a first similarity between the first and the second diffraction patterns; determining a second similarity between the first and the third diffraction patterns; determining a third similarity between the second and the third diffraction patterns; and performing hierarchical cluster analysis on the first, the second, and the third diffraction pattern based on the determined first similarity, the second similarity, and the third similarity.