1. A method, comprising: generating a finite state machine based on one or more mission profiles associated with one or more semiconductor devices or a system of interacting semiconductor devices, wherein the mission profiles comprise information associated with one or more parameters to be applied to the respective semiconductor device or system of interacting semiconductor devices, wherein generating the finite state machine comprises generating states based on the mission profiles, and wherein each state comprises one or more parameter values of the one or more parameters to be applied to the respective semiconductor device or system of interacting semiconductor devices; generating test stimuli for the semiconductor devices or interacting semiconductor devices based on running the finite state machine, wherein the test stimuli correspond to the parameter values included in the states; outputting the test stimuli; and applying the output test stimuli as one or more signals to the one or more semiconductor devices or system of interacting semiconductor devices.