1. A method for identifying outlier semiconductor devices from a plurality of semiconductor devices, comprising: performing at least one electrical test to obtain electrical test data comprising at least one test parameter; applying at least a first data transform processing method to said electrical test data to generate processed test data, and applying a second data transform processing method that is different from said first data transform processing method to said processed test data, said second data transform processing method applying at least one outlier test limit to identify non-outlier devices that comprise semiconductor devices from said plurality of semiconductor devices that conform to said outlier test limit and outlier devices that do not conform to said outlier test limit.