1. An integrated circuit, comprising: a memory block having at least one input and at least one output, at least one input associated with a block of input logic and the at least one output associated with a block of output logic, the memory block also having a write-enable input; and a test circuit coupled to the memory block and operable to verify the block of input logic and the block of output logic wherein the amount of time that it takes a signal to pass through a path that includes the block of input logic, the block of output logic, the memory block, and the test circuit is substantially the same as the amount of time that it takes a signal to pass through a path that includes the block of input logic, the block of output logic, and the memory block, but not the test circuit.