1. A method, in a data processing system, for modeling metastability in an integrated circuit device simulation, comprising: identifying an asynchronous boundary in an integrated circuit device model; inserting at least one metastability decay latch element into the integrated circuit model within a range of elements of the asynchronous boundary, wherein the metastability decay latch models a decay of a metastable value of the latch when an indeterminate value is latched into the metastability decay latch; and simulating an operation of the integrated circuit device using the integrated circuit device model with the inserted at least one metastability decay latch.