1. A method of determining operating conditions of an industrial process control system, the method comprising: receiving first sensor data generated by multiple sensors associated with a first subsystem included in an industrial process control system, the first sensor data including, from each of the multiple sensors associated with the first subsystem, a sensed value and uncertainty data associated with the sensed value; determining a first subsystem measurement based on the received first sensor data; determining first uncertainty data associated with the first subsystem measurement based on the received first sensor data; receiving second sensor data generated by multiple sensors associated with a second subsystem included in the industrial process control system, the second subsystem being different from the first subsystem and the second sensor data including, from each of the multiple sensors associated with the second subsystem, a sensed value and uncertainty data associated with the sensed value; determining a second subsystem measurement based on the received second sensor data; determining second uncertainty data associated with the second subsystem measurement based on the received second sensor data; accessing the first subsystem measurement, the first uncertainty data associated with the first subsystem measurement, the second subsystem measurement, and the second uncertainty data associated with the second subsystem measurement; and determining, using one or more processing devices, operating conditions of the industrial process control system based on the accessed first subsystem measurement, the accessed first uncertainty data associated with the first subsystem measurement, the accessed second subsystem measurement, and the accessed second uncertainty data associated with the second subsystem measurement, wherein determining, using one or more processing devices, operating conditions of the industrial process control system based on the accessed first subsystem measurement, the accessed first uncertainty data associated with the first subsystem measurement, the accessed second subsystem measurement, and the accessed second uncertainty data associated with the second subsystem measurement comprises detecting, using one or more processing devices, discrepancies between the accessed first subsystem measurement and the accessed second subsystem measurement.