1. A switching topology for automatic test equipment, comprising: a plurality of switching circuits each having first through fourth nodes, wherein the first and second nodes are connectable to the third and fourth nodes, respectively, to form a THROUGH connection, or to the fourth and third nodes, respectively, to form a CROSSED connection, wherein each of the first through fourth nodes of any of the plurality of switching circuits is connected to at most one of the first through fourth nodes of all the others of the plurality of switching circuits.