1. A semiconductor integrated circuit device, comprising: a first large scale integrated circuit including a plurality of first logical blocks; a programmable second large scale integrated circuit connected the first large scale integrated circuit and including a second logical block; a memory storing data for achieving the purposes of the first logical blocks; and a control unit that, when a failure is detected in any of the first logical blocks during the operation of the first large scale integrated circuit, writes the data for the faulty first logical block stored in the memory to the second logical block, and uses the second logical block in place of the faulty first logical block.