1. A method for testing a multi-port memory device to detect amulti-port memory fault, wherein the multi-port memory fault affects the memory device when the memory device is accessed simultaneously via a first port and a second port, the method comprising: receiving a sequence of instructions which implement a memory test for exposing the multi-port memory fault in the multi-port memory device; generating a first set of test operations for the first port of the memory device and a second set of test operations for the second port of the memory device based in part on the sequence of instructions, wherein the first set of test operations is configured to access a first memory cell of the multi-port memory device via the first port, wherein the second set of test operations is configured to access the first memory cell or a second memory cell of the multi-port memory device via the second port, wherein the second memory cell is adjacent to the first memory cell; applying the first set of test operations to the first port of the multi-port memory device; applying the second set of test operations to the second port of the multi-port memory device; and determining whether the multi-port memory fault occurs in the multi-port memory device by determining whether an accessed binary value that is read from the first port or the second port matches an expected binary value.