1. A method comprising: using a computer for receiving design data related to layout of an integrated circuit (IC); extracting information from the design data; performing analysis on the extracted information; enabling design-for-manufacturing (DFM) and design-enabled-manufacturing (DEM) aware manufacturing (collectively DFM-DEM) applications using information stored in a knowledge database, wherein the knowledge database stores information related to DFM and DEM for facilitating DFM-DEM aware manufacturing; and updating the knowledge database with new information learned from at least the extracted information and the analysis.