1. An integrated circuit comprising a memory cell including a resistance changing memory element, the resistance changing memory element comprising: a first electrode comprising an insulator material configured to reversibly change resistive states with the first electrode having a first resistance value and including a self-assembled electrically conductive element formed within the insulator material in response to application of a set current to the first electrode and the first electrode having a second resistance value that is greater than the first resistance value in response to application of a reset current to the first electrode; a second electrode; and a resistivity changing material disposed between the first and second electrodes, wherein the resistivity changing material is configured to change resistive states in response to application of a voltage or current to the first and second electrodes; wherein the resistance changing memory element is configured such that, during operation, the resistivity changing material changes resistive states while the first electrode maintains the first resistance value including the self-assembled electrically conductive element formed within the insulator material.