1. A self-test module for use in an electronic device, comprising: a test controller; a memory configured to receive test vectors from said test controller; a comparator configured to receive said test vectors from said memory via an output data path; a strobing buffer located in said output data path between an output from said memory and an input to said comparator, and configured to selectively enable each of said test vectors to propagate from said memory output to said comparator input, wherein said strobing buffer enables said propagation using no more than two transistors.