1. A method for restricting access to scan testing of a logic device having a programmable fabric, the method comprising the logic device: (a) receiving a set of instructions for programming the programmable fabric; (b) programming the programmable fabric based on the set of instructions; (c) deriving a multi-bit fabric pattern value from the programmed fabric; (d) processing the multi-bit fabric pattern value to determine whether or not to restrict access to the scan testing of the logic device; and (e) restricting access to the scan testing of the logic device if the processing of the multi-bit fabric pattern value fails to produce a specified fabric pattern result.