1. A method implemented in a single integrated circuit (IC), comprising: generating a process dependent current associated with a transistor in the single IC, wherein the process dependent current corresponds to a process utilized for manufacturing the single IC; generating a bandgap current associated with the transistor; generating a current based on a current temperature of the transistor; generating an output current based on each of: the process dependent current, the bandgap current, and the current based on the current temperature; and compensating for an amount of process variation associated with the single IC based on a voltage generated across a variable resistor implemented within the single IC based on the output current, wherein the variable resistor is adjusted according to a calibration signal output by a finite state machine (FSM).