1. A method comprising: obtaining defect candidate information of a group of defect candidates, wherein the defect candidate information comprises values of attributes for each defect candidate of the group of defect candidates; selecting, by a processing device, a sub-group of defect candidates from the group of defect candidates to be analyzed in a first iteration of a semiconductor defect classification operation, the sub-group of defect candidates being selected based on the values of attributes of defect candidates that belong to the selected sub-group; receiving classification results of the selected sub-group of defect candidates from the first iteration of the semiconductor defect classification operation; selecting an additional sub-group from the group of defect candidates to be analyzed in a second iteration of the semiconductor defect classification operation, the additional sub-group of defect candidates being selected based on the values of attributes of defect candidates that belong to the additional selected sub-group and classification results of the sub-group that were previously received from the first iteration of the semiconductor defect classification operation; and receiving classification results of the selected additional sub-group of defect candidates from the second iteration of the semiconductor defect classification operation.