1. A method of generating a featured scan pattern for scan test, comprising: providing a plurality of predetermined scan patterns to perform scan test on a plurality of devices under test (DUT) under stress conditions to generate a plurality of test responses of each DUT; grouping a plurality of specific test responses of each DUT from the test responses of each DUT to determine feature values corresponding to a plurality failure features for each DUT; and generating at least one featured scan pattern according to the feature values of each DUT.