1. An eddy current flaw detection system, comprising: an eddy current array probe for inducing eddy currents in a test object and for obtaining eddy current data from the test object; a processing system for processing the eddy current data; and a display system for displaying test results for the test object; wherein the processing system comprises a bounded iterative offset correction (BIOC) facility which is structured to reduce baseline drift by iteratively adjusting impedance readings from various measurements toward a null point in an impedance plane.