1. A semiconductor test data analysis system which automatically records operation information of an analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation, this system comprising: a processing means; an analysis target data storage means, for storing the test data as analysis target data; a historical data storage means, for storing as historical data at least one of operation information of the analysis operation or analysis information obtained by the analysis operation; and a display data storage means, for storing analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means, wherein when a new analysis operation is specified, the processing means processes the input test data in accordance with the analysis operation, information of at least one of the analysis target data, the historical data, and the display data being processed by the newly specified analysis operation.