1. A method of assembling memory modules, the method comprising: for each memory device of a plurality of memory devices, based on testing performed on the memory device, determining whether the memory device has any defective memory locations, and if the memory device has one or more defective memory locations, identifying the one or more defective memory locations, and generating data that identifies the one or more defective memory locations on the memory device; selecting, from the plurality of memory devices, at least one memory device having one or more defective memory locations, for assembly into a memory module; and in response to the selecting, assembling the memory module using at least the selected at least one memory device having one or more defective memory locations; wherein the assembling comprises, for each memory device having one or more defective memory locations, storing the data that identifies the one or more defective memory locations on the memory device in a persistent store on the memory module; and wherein the selecting comprises selecting the at least one memory device based on where the defective memory locations are located on each of the at least one memory device.