1. An apparatus for diagnosing a fault of a plurality of faults in an electronic system having a plurality of components based on one or more system inputs and system outputs of the electronic system, comprising: memory storing a model of the electronic system, the model configured to capture functional dependencies of the plurality of components, a causal flow in time of data transmitted between the plurality of components, or both; a processor coupled to the memory and configured to pass the one or more system inputs through the model to generate one or more simulated outputs; and a fault determination/isolation (FDI) module coupled to the processor and configured to be coupled to the electronic system, the FDI module configured to determine the fault based on a comparison of the one or more system outputs and the one or more simulated outputs.