1. A method of accepting semiconductor chips using on-chip parametric measurements, the method comprising: determining an on-chip parametric measurement structure for each parameter in a set of parametric acceptance criteria; including an on-chip parametric measurement macro in a design of each semiconductor chip for each identified on-chip parametric measurement structure; testing each on-chip parametric measurement macro to determine compliance of the semiconductor chip to the set of parametric acceptance criteria; and validating the compliance to the set of parametric acceptance criteria.