1. A semiconductor test system, comprising: a system controller; a site controller coupled to the system controller; a test module corresponding to a device under test (DUT), wherein the test module is controlled by the site controller; and a pattern compiler located on a computer acting as the system controller, wherein the pattern compiler includes a module-specific pattern compiler and an object file manager (OFM) for directing the module-specific pattern compiler to compile both a corresponding module-specific section of a pattern source file and a common section of the pattern source file.