1. A computer-readable non-transitory program storage medium executable by a processor and having computer readable code stored therein, the computer readable code being configured as a test program and when executed executes a process for causing a computer processor to perform testing regarding whether a plasma processing chamber in a plasma processing system is ready for processing at least one wafer, the test program of the non-transitory program storage medium including at least: code for receiving at least a plurality of electric parameter values, the plurality of electric parameter values being derived from signals detected by at least one sensor, the signals being detected by the at least one sensor when no plasma is present in the plasma processing chamber; code for generating a set of electric model parameter values using at least the plurality of electric parameter values and a mathematical model; code for comparing the set of electric model parameter values with a set of baseline model parameter value information; code for determining readiness of the plasma processing system based on at least a result the comparing; and code for including at least a first capacitance a second capacitance and an inductance in the mathematical model; code for associating the first capacitance with the plasma processing chamber; code for associating the second capacitance with a transmission rod the transmission rod being coupled between the plasma processing chamber and a power generator; and code for associating the inductance with the transmission rod, wherein the set of electric model parameter values includes a value of the first capacitance a value of the second capacitance and a value of the inductance.