1. A method comprising: generating, with an analog to digital converter, one or more analog to digital converter signal samples from a readback signal embedded with a repeating pattern written on a test track in media on a storage device simultaneously in both time and frequency domains; determining a wavelet type, one or more decomposition levels, and threshold by a samples analyzer based on entropy of the one or more analog to digital converter signal samples; applying a wavelet transform, with a transformer, to the one or more analog to digital converter signal samples based on the determined wavelet type, one or more decomposition levels, and threshold for each analog to digital converter signal sample; generating wavelet coefficients, with the transformer, based on the application of the wavelet transform to the one or more analog to digital converter signal samples; detecting defects in the media with a wavelet coefficients analyzer based on analysis of the wavelet coefficients; determining if the detected defects in the media are real defects or spurious noise based on analysis of the wavelet coefficients; determining a type, a location on a sector, and a duration of each defect with a wavelet coefficients analyzer; and writing data to only non-defective sectors of the media responsive to determining the type, the location on the sector, and the duration of each defect.