1. An apparatus for enabling testing of a logic device, the apparatus comprising: a first logic device having a plurality of input terminals and a plurality of output terminals; a plurality of configurable connections coupled to the first logic device to enable configurable coupling of the first logic device to a second logic device, the second logic device having a plurality of input terminals and a plurality of output terminals corresponding to the input terminals and the output terminals of the first logic device; and a controller configured to control the plurality of switchable connections to couple the input terminals of the first logic device to corresponding input terminals of the second logic device and to decouple the output terminals of the first logic device from corresponding output terminals of the second logic device.