1. A computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing at least one domain, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in accordance with a hardware device to be tested and the at least one domain to be tested with respect to the hardware device; and indexing the subset of the collection of test data to obtain an indexed collection, wherein the indexed collection is separate from an exerciser program that is configured to be executed by the hardware device, wherein the exerciser program is configured to generate a test case and execute the test case, wherein the exerciser program is further configured to access the indexed collection in order to perform the generation of the test case.