1. A system for transforming a coordinate assigned in a semiconductor device, the system comprising: a layout display unit configured to obtain an arbitrary point in layout data of the semiconductor device displayed on a screen of a display device as a coordinate value of an FBM physical coordinate system indicative of a physical position on the semiconductor device; a pattern defining unit configured to define a relationship between an FBM physical address and the FBM physical coordinates using a pattern tree obtained by combining an array pattern, defining lining direction, interval, and the number of components to be disposed at equal intervals, with a random pattern, defining the relationship between the FBM physical address as a coordinate system of FBM data indicative of an electric failure position obtained by a test process of the semiconductor device and the FBM physical coordinates in a one-to-one corresponding manner; and a forward transformation program generating unit configured to generate a forward transformation program to transform the FBM physical address of the semiconductor device into the FBM physical coordinates from the pattern defined.