1. An apparatus for testing a device, the apparatus comprising: a test channel circuit operable to communicate with an input/output pin of the device using a hardware resource; and a resource controller coupled to the test channel circuit and configured to receive a logical control command describing a requested operation of the hardware resource, wherein the resource controller is configured to convert the logical control command into a dedicated control command for the hardware resource, and wherein further the dedicated control command is configured to be received by a physical implementation of the hardware resource.