1. An inspection system, comprising: a collimated light source defining a source optical path, wherein said collimated light source is operable to cause a collimated light beam to propagate along said source optical path; a sensing device defining a sensor optical path; a positioning device including a positioning device stage, said positioning device stage movably disposed relative to said sensing device and said collimated light source; a reflecting device, said reflecting device disposed on said positioning device to be within said source optical path to receive said collimated light beam, said reflecting device causing a reflected collimated light beam to propagate along said sensor optical path to said sensing device, wherein said reflected collimated light beam is incident upon an object disposed within said sensor optical path such that a silhouette of said object is generated and incident upon said sensing device, such that said sensing device generates initial data responsive to at least one of said silhouette and said reflected collimated light beam; and at least one processing device, wherein said at least one processing device is communicated with said sensing device to receive at least a portion of said initial data, wherein said processing device processes said at least a portion of said initial data responsive to a Correction Factor (CF).