1. A method of storing repair data of a first memory array in a one-time programming memory (OTPM), the method comprising: performing a first test and repair of the first memory array using a built-in self-test-and-repair (BISTR) module to determine first repair data for the first memory array; loading the first repair data for the first memory array in a repair memory and in a duplicated repair memory of the BISTR module; performing a second test and repair of the first memory array to determine second repair data for the first memory array of failed bits not included in the first repair data; storing the second repair data in the repair memory of the BISTR module and in the repair memory of the first memory array; processing the repair data in the repair memory and the duplicated repair memory of the BISTR module using a logic gate; storing the output of the logic gate in the repair memory of the first memory array; and storing content of the repair memory of the first memory array in the OTPM.