1. A method for modeling a circuit comprising: storing a plurality of design variable ranges for a circuit component in a non-transient electronic data memory; performing transistor-level simulations at a plurality of sample points for the circuit component using a processor to generate a plurality of design variable samples for the circuit component; storing a neural network architecture in the non-transient electronic data memory that models the plurality of design variable samples for the circuit component; and generating a performance metric metamodel and a circuit parameter metamodel using a processor operating Verilog-AMS.