1. A method of processing a substrate using a Direct Current (DC)/Radio Frequency (RF) Hybrid (DC/RFH) processing system, the method comprising: receiving a first set of substrates by a transfer subsystem coupled to the DC/RFH processing system; determining at least one first Electron Energy Distribution Function (EEDƒ) 1 data for a first substrate; determining a first DC/RFH process recipe for the first substrate using the at least one (EEDƒ) 1 data; processing the first substrate using the first DC/RFH process recipe; obtaining process data for the first substrate; determining risk data for the first set of substrates using process data for the first processed substrate; comparing the risk data to processing limits; processing additional substrates in the first set of substrates when the risk data does not exceed at least one of the processing limits; and performing a corrective action when the risk data exceeds one or more of the processing limits.