1. A computer-implemented method of semiconductor testing, said method comprising: defining a first semiconductor testing rule, said semiconductor testing rule relating to semiconductor testing; validating said first semiconductor testing rule as being appropriate for a semiconductor testing system; bundling said first semiconductor testing rule with other semiconductor testing rules; correlating said first semiconductor testing rule with other semiconductor testing rules; publishing said first semiconductor testing rule so that said rule is prepared for actualization; and actualizing said published first semiconductor testing rule.