1. A correcting method for lithography hotspots of the post-routing layout comprising: accepting lithographic inspection of the post-routing layout of a chip to obtain the data of a number of hotspots; selecting at least one two-dimensional pattern of changeable geometric size or position within the local area where the number of hotspots is located, and defining the mode to change the geometric size or position as a number of change modes; based on the change amount of each one of the number of change modes within the allowable range, selecting in sequence a number of model cells from a set of optical simulation model cells of aerial image intensity to synthesize the corresponding aerial image intensity; determining the optimal change amount of each one of the number of change modes corresponding to the hotspot in accordance with a number of aerial image intensity values mentioned above of the aerial image intensity; and obtaining respectively a set of optimal change modes and the optimal change amount of the optimal change mode for the two-dimensional pattern of the local area where each one of the number of hotspots is located.