1. An apparatus for the analysis of a process having parameter-based faults, comprising: a parameter value inputer configured for inputting values of at least one process parameter; a fault detector, configured for detecting the occurrence of a fault; a learning file creator associated with said parameter value inputer and said fault detector, configured for separating said input values into a first learning file and a second learning file, said first learning file comprising input values from a collection period preceding each of said detected faults, and said second learning file comprising input values input outside said collection periods; and a learning file analyzer associated with said learning file creator, configured for performing a separate statistical analysis of said first and second learning files, thereby to assess a process status.