1. A method for assigning thin-oxide and thick-oxide capacitors on an integrated circuit, the integrated circuit having a capacitance requirement and a leakage power constraint, the method comprising: formulating a linear optimization problem, wherein formulating the linear optimization problem comprises: defining a first value as a value of capacitance that is obtained by replacing the thick-oxide capacitors with the thin-oxide capacitors subject to the leakage power constraint; solving the linear optimization problem to determine a maximum value for the first value; and determining an optimal percentage of thin-oxide capacitance using the maximum value.