1. A method for processing semi-conductor manufacturing data comprising: capturing files from a plurality of manufacturing data sites having semi-conductor manufacturing data; the semi-conductor manufacturing data including test data; the test data indicating electrical characteristics; converting the files into a standard format for storage in a database; building a query from a client device using a plurality of sets of selections, wherein when a first selection is made by the client device in a first set of the sets of selections, a second set of the sets of selections is dynamically changed to only display a displayed set of selections on the client device limited to selections associated with the first selection; checking limits of the test data of the semi-conductor manufacturing data by accessing the database and comparing the test data of the semi-conductor manufacturing data stored in the database with limits therefor; a portion of the limits being user defined limits including a parameter limit associated with the electrical characteristics, the parameter limit being for threshold voltage; alerting the client device, when any stored semi-conductor manufacturing data exceeds one or more limit of the portion of the limits; and generating a report for the client device based on the built query and the converted files stored in the database.