1. A method comprising: accessing, by a computer, information, said information comprising: multiple first sets of values for characteristics of an electronic device, said multiple first sets being associated with multiple different process conditions that occur in fabrication of said electronic device, each first set being associated with a different one of said multiple different process conditions; and a list of model parameters associated with a specific model for said electronic device, said list designating a primary model parameter and multiple secondary model parameters; creating, by said computer, multiple second sets of values for said model parameters, each second set corresponding to and being based on one of said first sets such that said values for said model parameters associated with said specific model for said electronic device in a given second set reflect said values for said characteristics of said electronic device in a corresponding first set; analyzing, by said computer, said second sets to determine functions of said primary model parameter for each of said secondary model parameters; and augmenting, by said computer based on said functions, a simulator so that, during subsequent simulations of said electronic device at varying process conditions, a change in a value for said primary model parameter automatically results in corresponding changes in values for said secondary model parameters.