1. A system for measuring capacitance comprising: a current source coupled to a first node of a first capacitor and to a first node of a second capacitor, the current source configured to supply charge to the first and second capacitors, wherein the charge supplied to the first and second capacitors generates a voltage potential across the first and second capacitors; a first switch configured to couple the current source and the first node of the first capacitor to the first node of the second capacitor; a second switch configured to couple the first node of the first capacitor to a second node of the second capacitor; and a circuit configured to measure the voltage potential across the first and second capacitors, wherein, the second capacitor is coupled to the measurement circuit after the current source is configured and coupled to the first node of the first capacitor and after a voltage potential across the first capacitor has reached a settling voltage, and the current source is configured to provide a charge on the first capacitor according to a predetermined charge rate.