1. A test system for facilitating determining whether a plasma processing system is ready for processing wafers, the plasma processing system including a plasma processing chamber, the test system comprising: a computer-readable medium storing at least a test program, the test program including at least: code for receiving at least a plurality of electric parameter values, the plurality of electric parameter values being derived from signals detected by at least one sensor, the signals being detected by the at least one sensor when no plasma is present in the plasma processing chamber, code for generating a set of electric model parameter values using at least the plurality of electric parameter values and a mathematical model, code for comparing the set of electric model parameter values with a set of baseline model parameter value information, and code for determining readiness of the plasma processing system based on at least a result the comparing; and a set of circuit hardware for performing one or more tasks associated with the test program.