1. A method of operating a monolayer deposition (MLD) processing system comprising: positioning a plurality of wafers in a processing chamber; determining surface saturation zones on the surface of at least one of the plurality of wafers; creating a first virtual sensor to estimate a surface saturation state value for one or more of the surface saturation zones; establishing a desired surface saturation state value for the at least one of the surface saturation zones; and performing a first deposition process during a first process time, including exposing the plurality of wafers to a first precursor-containing gas comprising first precursor molecules until the estimated surface saturation state value from the first virtual sensor is approximately equal to the desired surface saturation state value, and thereby depositing a substantially uniform film of first precursor molecules onto the surfaces of the plurality of wafers.