1. A method of characterizing a Solid State Light (SSL) source, comprising: obtaining an SSL source; energizing the SSL source to emit light; acquiring a Spectral Power Distribution (SPD) of light emitted by the SSL source with an SPD acquisition apparatus; selecting at least a portion of the SPD; outputting the selected SPD to a computing device; detecting a node in the SPD, wherein the node is a continuous spectrum of light having a predetermined minimum and maximum wavelength defining a boundary limit within the SPD, the node corresponds to a specific light generating mechanism, and the node is detected based on a saturation threshold within the boundary limit; determining an order for a curve fitting function for the node; wherein the curve fitting function is determined based on the specific light generating mechanism of the node; solving function coefficients of the curve fitting function for fitting the node, wherein the function coefficients are expressed as a set of C-Parameters; obtaining a set of noise parameters and a set of confidence values for the curve fitting function; and outputting the set of C-Parameters, the set of noise parameters, and the set of confidence values.