1. A radiation scanning system to examine an object, the system comprising: a source of charged particles; a radio frequency accelerator to accelerate charged particles provided by the source of charged particles, by the accelerator having an input to receive the charged particles and an output for exit of accelerated charged particles from the accelerator; a first electromagnet; a first pipe at the output of the accelerator to guide accelerated charged particles along a path to the first electromagnet; second and third pipes coupled to the first electromagnet, wherein the first electromagnet is configured to selectively allow passage of the accelerated charged particles to the third pipe and to selectively direct accelerated charged particles to the second pipe; at least one second electromagnet along the third pipe; a fourth pipe coupled to the second electromagnet, wherein the second electromagnet is configured to deflect accelerated charged particles to the fourth pipe; at least one target proximate each of the second, third, and fourth pipes, wherein impact of a respective target by accelerated charged particles causes generation of radiation to scan the object at different viewing angles; for each of the at least one targets, a respective third electromagnet coupled to the second, third, and fourth pipes, respectively, to selectively direct accelerated electrons to a respective target; at least one detector to detect radiation generated by the at least one respective targets, after interacting with the object; and at least one processing device to control operation of the first, second, and third electromagnets, and reconstruct images from data collected from the detector.