1. An apparatus for extracting the parameters of a circuit element model, the circuit element model representing a semiconductor element used for a circuit simulation, comprising: a specifying unit configured to specify element structures and physical models in the semiconductor element; a simulation unit configured to carry out local process and device simulations for parameters related to the specified element structures and physical models and calculate separately electric characteristics of the specified element structures, respectively; and a classification unit configured to classify the calculated electric characteristics according to bias conditions and element dimensions used in the local process and device simulations.