1. A semiconductor test data analysis system for identifying outliers in semiconductor test data, comprising: a memory configured to store the test data; and a processor connected to the memory, wherein the processor is configured to: retrieve the test data from memory; compare the test data to an upper outlier threshold and a lower outlier threshold, wherein the upper outlier threshold and the lower outlier threshold are derived from a median of a frequency distribution of the test data; and determine whether the test data include outliers according to the comparison of the test data to the upper outlier threshold and the lower outlier threshold.