1. A method, comprising: defining a hierarchy associated with a test system including a plurality of test units for testing integrated circuit devices, at least some of the test units having a plurality of sockets, the hierarchy including a first level including a first plurality of entities each associated with one of the sockets and at least a second level including a second plurality of entities each associated with a grouping of the sockets; receiving state data associated with operational states of the sockets; and generating a set of state metrics for each entity at each level of the hierarchy based on the state data, each set of state metrics identifying time spent in the operational states.