1. A system for probing a circuit comprising: a gas source for supplying at least a first gas into said system; a first temperature control device for modifying the temperature in an area of said circuit having at least a conductive contact portion and oxide, said oxide disposed on said conductive contact portion wherein when said first gas is present in said system and when said area is heated, the thickness of said oxide is reduced; and a first probing device for probing said conductive contact portion of said circuit.