1. A method of predicting a current density distribution of a power interconnect system of an integrated circuit design, the method comprising: transforming a netlist of an integrated circuit design so that gates of transistors in the netlist are configured to receive a common signal; simulating the transformed netlist using the common signal to predict currents drawn from a power interconnect system of the integrated circuit; determining a predicted current density distribution of the power interconnect system; and comparing one or more predicted current densities of the predicted current density distribution to a maximum allowable current density.