1. An apparatus for testing including measuring electromagnetic emissions and determining defective components comprising: a sensor array comprising a plurality of sensors adapted to be moveable; a signal analysis section comprising a section comprising a time domain and signal domain signal analysis signal section; a device under test (DUT) holder adapted to hold and position a first and second DUT relative to the sensor array; a DUT stress application section adapted to generate one or more DUT stress conditions to said first DUT which correlate with life cycle age or a life cycle reduction event associated with said DUT, where said DUT stress condition associated with life cycle age is applied by an escalating series of burn-in or heating conditions applied to said first DUT, said DUT life cycle reduction event comprises electrostatic discharge application to at least one section of said first DUT; a control mechanism adapted to independently position elements of said sensor array relative to areas of interest on said first and second DUT based on a first position input; a DUT control section comprising a machine readable storage medium adapted to receive and store a plurality of machine readable instructions operable to control said apparatus and said first and second DUTs, said machine readable storage medium further comprises a first plurality of machine readable instructions adapted to operate said control mechanism in order to acquire and store a plurality of first sensor array signature data associated with said sensor array outputs from said first DUT based on a first plurality of test signal control inputs to said first DUT and said first position input while one or more said DUT stress conditions are applied to said first DUT, wherein each of said plurality of said first sensor array signature data is respectively associated with said one or more DUT stress conditions; wherein said DUT control section further comprises a second plurality of machine readable instructions stored on said machine readable storage medium adapted to stimulate said second DUT when said second DUT is placed in said DUT holder with said first plurality of test signal control inputs, said DUT control section further comprises a third plurality of machine readable instructions stored on said machine readable storage medium adapted to acquire a plurality of second sensor array signature data associated with said sensor array outputs from said second DUT based on said first plurality of test signal control inputs to said second DUT and said first position input; wherein said DUT control section further comprises a fourth plurality of machine readable instructions stored on said machine readable storage medium adapted to match said first and second sensor array signature data associated respectively with said first and second DUT, wherein a substantial match of said signature data indicates a first condition associated with said second DUT and a non-match indicates a second condition associated with said second DUT; an input and output section adapted to interact with said DUT control section, said input and output section comprising a user interface including a graphical user interface adapted to display an indication of said first or second condition associated with said second DUT.