1. A test system configured to test a semiconductor device under test, the test system comprising: a server configured to store a plurality of configuration data which allow the test system to have different functions, wherein the server is managed by a service provider; a tester hardware configured to test the semiconductor device under test, wherein the tester hardware comprises memory that stores the configuration data and a programmable device that changes its configuration according to the configuration data stored in the memory such that at least a part of functions of the tester hardware changes, and wherein the tester hardware is provided to a user by the service provider and is used by the user; and an information processing apparatus connected to the server via a network and configured to access the server, wherein the information processing apparatus is used by the user and a control program provided by the service provider is installed on the information processing apparatus, wherein the information processing apparatus is further configured to transmit/receive data to/from the tester hardware, and wherein the control program provides (i) a function of displaying, on a display, a plurality of configuration data candidates, and (ii) a function of writing the configuration data selected by the user to the memory of the tester hardware.