1. A semiconductor test system, comprising: a system controller; a site controller coupled to the system controller, wherein the system controller is configured to control the site controller; a test module corresponding to a device under test (DUT), wherein the test module is controlled by the site controller; a pattern compiler in communication with the system controller, wherein the pattern compiler includes a module-specific pattern compiler and an object file manager (OFM) directing the module-specific pattern compiler to compile both a corresponding module-specific section of a pattern source file and a common section of the pattern source file; and a module connection enabler coupling the site controller to the test module, wherein the system controller defines a connection of the site controller to a port of the module connection enabler based on a system configuration file, and a connection of the test module to a port of the module connection enabler based on a module configuration file.