1. A defect reviewing apparatus comprising: a scanning electron microscope; classifier means made by connecting a rule-based classifier to an example-based classifier, said rule-based classifier classifying arbitrary image of the defect based upon a preset rule, and said example-based classifier classifying the image of the defect based upon exemplified classification information; exemplifying means for exemplifying said classification information with respect to said example-based classifier of said classifier means; connecting status correcting means for correcting a status of connection of said rule-based classifier and said example-based classifier based upon the classified result of the rule-based classifier and attribute information calculated by the exemplifying means.