1. A method for evaluating a parameter of a feature having nano-metric dimensions, the method comprising: obtaining, by an image obtaining module, an image of a measurement site, that includes the feature, the image of the measurement site comprising an image of the feature; processing, by an image processor, the image of the measurement site to provide an artificial image of an artificial feature that differs from the feature; measuring a parameter of the artificial feature to provide a measurement result by applying a measurement algorithm that is inadequate for measuring the parameter of the feature; and determining a value of the parameter of the feature in response to the measurement result.