1. A system comprising: a state machine that controls operation of a semiconductor manufacturing system to schedule processing of one or more workpieces, the state machine including a plurality of states associated by a plurality of transitions, each one of the plurality of transitions having a weight assigned thereto, wherein when the state machine is operating within one of the plurality of states, a selection of a transition from the one of the plurality of states to another one of the plurality of states is determined by evaluating the weight assigned to each one of a number of possible transitions from the one of the plurality of states; and a plurality of sensors for sensing aspects of the semiconductor manufacturing system; a neural network that receives as inputs data from the plurality of sensors and provides as outputs the weights for one or more of the plurality of transitions; a graphical user interface that displays a three-dimensional model of the semiconductor manufacturing system, wherein the three-dimensional model includes one or more objects that are correlated to an inventory containing data about a physical inventory of system components, the graphical user interface being configured to graphically present the one or more of the plurality of transitions in the three-dimensional model based on the weights from the neural network output in response to the data from the plurality of sensors.