1. An IC non-volatile storage element, comprising: an integrated semiconductor stable reference component, wherein said component is resistant to external radiation, e-fuse structures in said component; a sensing circuit coupled to said e-fuse structures, wherein said sensing circuit is adapted to update an external device at a specified time interval to reduce incidence of soft errors and errors due to power failure; a controller circuit adapted to facilitate programming and sensing of said e-fuse structures; an error detection and correction circuit coupled to said sensing circuit; a security system coupled to said controller circuit, wherein said security system is configured to control programming access to said e-fuse structures; and a radiation-hardened latch adapted to store an output of said e-fuse structures.