1. A method of improving manufacturing productivity of an integrated circuit, comprising: (a) generating a set of physical design rules, (b) assigning a rule scoring equation to each physical design rule of said set of physical design rules; (c) checking a physical design of said integrated circuit for deviations from each design rule; (d) computing a score for each physical design rule, using the corresponding rule scoring equation assigned to each physical design rule, for which one or more deviations were found in step (c); and (e) computing a productivity score for said integrated circuit design based on said scores computed in step (d).