1. A test bench for performing a test case on an integrated circuit, the test bench comprising: a simulation environment representing an environment for implementing the integrated circuit; a reference model of the integrated circuit that is based on an original reference model provided for a formal verification and that is prepared for running within the simulation environment by replacing at least one un-clocked storage element extracted from the original reference model with an equivalent clocked storage element; and a device for running a simulation on the reference model within the simulation environment, the device including one or more processors.