1. A flaw scan system for detecting a location of first and second types of location specific anomalies on a storage medium, comprising: a write system for writing a set of bits to the storage medium, the set of bits comprising a first data pattern and a second data pattern, wherein the first data pattern is written to a first set of tracks on the storage medium and the second data pattern is written to a second set of tracks on the storage medium, wherein the first set of tracks alternate with the second set of tracks; a read system for reading the set of bits from the storage medium; a first anomaly location system for determining locations of the first type of location specific anomaly based on the first data pattern; and a second anomaly location system for determining locations of the second type of location specific anomaly based on the second data pattern.