1. A method, comprising: determining a first operational sensitivity of a bitcell to a first component characteristic of a first component of the bitcell; determining a second operational sensitivity of the bitcell to a second component characteristic of the first component of the bitcell; determining a third operational sensitivity of the bitcell to a first component characteristic of a second component of the bitcell; determining a fourth operational sensitivity of the bitcell to a second component characteristic of the second component of the bitcell; normalizing a first plurality of sensitivities of the bitcell including the first operational sensitivity, the second operational sensitivity, the third operational sensitivity and the fourth operational sensitivity, to produce a first set of normalized sensitivity information for the bitcell; storing the first set of normalized sensitivity information; and providing the first set of normalized sensitivity information to a device simulator, the device simulator configured to simulate operation of the bitcell.