1. A test system configured to test a device under test, the test system comprising: a server configured to store a plurality of configuration data which allow the test system to have different functions; a tester hardware configured to test the device under test, which comprises memory, and which is configured to be capable of changing at least a part of its functions according to the configuration data stored in the memory; and an information processing apparatus connected to the server via a network, and configured such that a control program is installed, wherein the control program provides (i) a function of displaying, on a display, a plurality of configuration data candidates that can be written to the tester hardware when the test system is set up, and (ii) a function of writing the configuration data selected by the user to the memory of the tester hardware.