1. A system for testing a design under test, comprising: an integrated circuit, including a logic analyzer having an input receiving a plurality of signals from the design under test and an output for providing one or more output signals; and a computing device coupled to the logic analyzer for receiving the one or more output signals, and including a user interface for facilitating assigning an attribute to at least one signal associated with the logic analyzer, determining a new signal or value not appearing in the design under test and the logic analyzer, the new signal or value being based upon the at least one signal as received from the logic analyzer and upon a predetermined definition, and presenting the new signal or value to a system user.