1. A method for an electronic circuit design, the design comprising one or more scan chains with a plurality of scan cells, the method comprising: receiving one or more coverage scores for one or more of the scan cells, the coverage scores being associated with one or more scan patterns; determining, according to the one or more coverage scores, a diagnosis coverage figure for at least one scan chain of the one or more scan chains in relation to the one or more scan patterns, wherein the diagnosis coverage figure indicates a likelihood of detecting scan chain defects in the at least one scan chain using the one or more scan patterns; and storing the diagnosis coverage figure.