1. An automated analytics method comprising: using a sensor system to obtain measurement data by monitoring one or more parameters at a plurality of locations on each of a plurality of replicated components of an object; providing to a computing device, the measurement data; using the measurement data to automatically generate in the computing device, a computerized representation of each of the plurality of replicated components; receiving in the computing device, a first input query comprising a first parameter of interest; and responding to the first input query by using the computerized representation of each of the plurality of replicated components to generate a first synthesized representation of the object, the first synthesized representation of the object providing information specifically directed to the first parameter of interest.