1. A method for adjusting load at a device under test, the method comprising: at a testing platform: determining whether a current operations rate associated with a device under test (DUT) is near a target operations rate, wherein the current operations rate is associated with one or more simulated users being simulated by the testing platform; and in response to determining that the current operations rate associated with the DUT is not near a target operations rate, adjusting the current operations rate by increasing or decreasing the number of simulated users interacting with the DUT.