1. A method for automatically diagnosing new faults in a device, said method comprising: generating a measure of membership with respect to each feature vector belonging to at least one known class among a plurality of known classes utilizing a classifier; clustering a plurality of members associated with said at least one known class into two clusters including core class members and at least one outlier cluster in order to detect a presence of a new defect in a device; and employing a statistical measure to determine if a probabilistic distribution of said plurality members of said outlier cluster associated with said class is sufficiently different from a corresponding distribution of said core class members to thereafter diagnose said new faults in said device.