1. A method of testing a memory instance, comprising: scanning test information into a test and repair wrapper integrated with said memory instance; providing a strobe control signal to said test and repair wrapper for signaling commencement of testing operations with respect to said memory instance; generating, by said test and repair wrapper, at least one of an address signal, a data signal and a command signal based on said scanned test information; and executing at least one test by said test and repair wrapper with respect to said memory instance based on said address, data and command signals.