1. A method for analyzing an integrated circuit (IC), the method comprising: creating a first embedded test circuit in the IC for generating a first output delay, the first embedded test circuit comprising a first ring oscillator coupled to a first test load, the first test load being formed in a first interconnect layer of the IC; creating a second embedded test circuit in the IC for generating a second output delay, the second embedded test circuit comprising a second ring oscillator, the second ring oscillator being an unloaded ring oscillator, the second ring oscillator being substantially similar to the first ring oscillator; providing a first parameter equation and a second parameter equation, the first parameter equation and the second parameter equations specifying a first Front End Of the Line (FEOL) parameter and a first Back End Of the Line (BEOL) parameter, respectively, as functions of the first output delay and the second output delay; measuring a first measured output delay and a second measured output delay from the first embedded test circuit and the second embedded test circuit, respectively; substituting the first measured output delay and the second measured output delay into the first parameter equation to generate a first FEOL parameter value; and substituting the first measured output delay and the second measured output delay into the second parameter equation to generate a first BEOL parameter value.