1. A method comprising: accessing, by a computer, information, said information comprising: multiple first sets of values for characteristics of an electronic device, each first set being associated with a different process condition; and a list of model parameters, said list designating a primary model parameter and secondary model parameters; creating, by said computer, multiple second sets of values for model parameters, each second set corresponding to one of said first sets such that said values for model parameters in a given second set reflect said values for characteristics in a corresponding first set; analyzing, by said computer, said second sets to determine functions of said primary model parameter for each of said secondary model parameters; and augmenting, by said computer, a simulator so that, during subsequent simulations of said electronic device at varying process conditions, a change in a value for said primary model parameter automatically results in corresponding changes in values for said secondary model parameters.