1. A method for capacitance coupling parameter estimation, comprising the steps of: (A) determining a plurality of voltages in a plurality of memory cells of a nonvolatile memory in response to a plurality of writes to said memory cells, wherein said voltages are determined in each of a plurality of cases related to inter-cell interference; (B) generating a system of equations of a capacitance coupling model in response to said voltages from all of said cases; and (C) generating one or more parameters in response to said system of equations, wherein said parameters comprise one or more couplings between a perturbed memory cell and a plurality of neighboring memory cells adjacent to said perturbed memory cell.