1. A process for testing a planar electronic component for latent defects which will cause failure during the life of the component when the component is later used, comprising the steps of: pre-testing the planar electronic component, as a test-piece, for detectable electrical errors in circuits in the test-piece; placing the test-piece into an apparatus having chambers on opposite sides of the test-piece if the pre-testing step finds the test-piece has no detectable electrical errors; applying pressurized filtered air to one chamber while exhausting air from the opposite chamber, and alternating this process with the chambers, to bi-directionally flex the test-piece up to a predetermined mechanical distortion at a predetermined frequency for a predetermined number of cycles, said predetermined mechanical distortion, frequency, and cycle parameters for the test piece having been determined by generalized computer stress analysis programs; and post-testing the test-piece for the existence of any detectable electrical error after the bi-directional flexing of the test-piece is completed to determine if any error condition developed in the test-piece during the bi-directional flexing.