1. A nonvolatile semiconductor storage device for use in a repair judgment test for a semiconductor chip, comprising: a first storage unit for storing information indicating whether any faulty memory cell has been detected in said repair judgment test; and a second storage unit for storing word line information associated with said detected memory cell; and a third storage unit for storing bit line information associated with said detected faulty memory cell, said storage units obviating a need to employ an independent defect information storing memory for storing address information of faulty memory cells in the nonvolatile semiconductor storage device.