1. A method comprising: by using a computer: identifying points of interest by searching for disruptions and/or discontinuities of features in a layout design, the points of interest representing locations of potential critical features; determining at least one region of interest for one or more of the points of interest; extracting one or more properties from the at least one region of interest, the one or more properties representing at least one pattern characteristic of the at least one region of interest; generating diagnosis reports by testing one or more devices comprising an integrated circuit fabricated according to the layout design, the testing indicating one or more of the devices as being failing devices; and analyzing the diagnosis reports of the failing devices fabricated according to the layout design based at least on the one or more properties to identify probable root causes.