1. A method for generating a design-for-test (DFT) library for an automatic test pattern generator (ATPG) tool, the ATPG tool generating test vectors for an integrated circuit (IC) design including cells, and a source design library of the IC design including modules corresponding to the cells, said method comprising: creating a synthesis library including primitives to be used to create the modules, the primitives being the same as primitives used by the ATPG tool; creating a register transfer level (RTL) description for each module; performing synthesis using the synthesis library and the RTL description of each module, so as to create a gate level description for each module; and generating the DFT library by converting a hardware description language (HDL) of the gate level description into a script language for the ATPG tool so as to create a DFT file for each module.