1. A method comprising: receiving a description of an electronic circuit; performing a DC operating point analysis of the electronic circuit for a plurality of input vectors to produce a solution corresponding to each input vector; and iteratively performing a plurality of transient analysis phases until a predetermined amount of simulated time has elapsed, each phase comprising: grouping the input vectors into a plurality of groups based on a predetermined criteria applied to the solutions; and performing a transient analysis on each group for a predetermined increment of simulated time to update the solution corresponding to each input vector in the group; wherein grouping the input vectors comprises: splitting each group of input vectors having dissimilar members into separate groups based on the predetermined criteria applied to the solutions; merging separate groups of input vectors having similar members into a single group based on the predetermined criteria applied to the solutions; and wherein performing a transient analysis on a group comprises: performing calculations to solve a system of nonlinear equations corresponding to a first input vector in the group; and using results of performed calculations to solve the system of nonlinear equations corresponding to a second input vector in the group.