1. A method for characterization of patterns, comprising the steps of: obtaining, in a computer system, a pattern; performing, in the computer system, a fractal analysis on the pattern; and generating, in the computer system, a global quantitative characterization of the pattern based at least in part upon a fractal, where the global quantitative characterization of the pattern comprises at least one scaling parameter associated with a gradation of the fractal, the at least one scaling parameter expressing a ratio of a number of points in a portion of the fractal that is approximately similar to the entire fractal relative to a total number of points in the fractal.