1. A system, comprising: a first circuit comprising memory elements of a memory array that are powered at an input supply voltage, wherein the input supply voltage changes over time; and a second circuit coupled to a state-monitoring memory element of the memory array, the state-monitoring memory element being representative of a voltage sensitivity of other memory elements of the memory array, wherein the second circuit is configured to determine when the input supply voltage drops below a threshold voltage at which the state-monitory memory element operates, and wherein the second circuit comprises a circuit to provide a degraded ground to the state-monitoring memory element.