1. Testing apparatus for testing electronic devices including a program control device and a test data memory, said testing apparatus comprising: (1.1) An input device for entering test data and test instructions in symbolic form, hereafter referred to as symbolic test data, said symbolic test data describing a value test, as well as a pass/fail test, (1.2) a transformation processor for transforming said symbolic test data into executable test data, (1.3) a test execution processor for performing tests using executable test data stored in said test data memory, and (1.3) a hardware driver, wherein (1.4) said transformation processor transforms the part of said symbolic test data which relates to the pass/fail test into executable pass/fail test data before a test is started, and further pre-compiles said part of the symbolic test data which relates to the pass/fail test from a high level description into precompiled machine instructions, and said hardware driver, prior to a test, reformats said precompiled machine instructions into executable pass/fail test data, (1.5) said testing apparatus retains the executable pass/fail test data generated by the transformation processor according to feature (1.4), as well as the original symbolic test data, (1.6) said test execution processor causes, in response to user instructions, either: (1.6.1) execution of the executable pass/fail test data generated by the transformation processor according to feature (1.4), or (1.6.2) transformation and execution of said original symbolic test data.