1. A computer-aided design system comprising: means for generating two or more parameterized cell (P-cell) data structures representing two or more semiconductor film elements, each film element of a material type and thickness having desired properties in association therewith; and, means for combining said two or more P-cells to automatically generate a higher order p-cell data structure representing a semiconductor resistor device having desired one or more properties tailored according to inherited properties of the semiconductor film element p-cells utilized in said combination, said semiconductor resistor device comprising a composite film of alternating layers of insulative and conductive material films designed to have a desired resistance value and optimized Temperature Coefficient of Resistance (TCR) value.