1. A test system, comprising: a shared processor operable to generate test data for performing tests on devices under test and to generate a respective test control signal for each of said devices under test, each said test control signal including test instructions for performing said tests; a storage device operable to store said test data associated with at least one of said devices under test; and for each of said devices under test, a dedicated processor operable to receive said respective test control signal from said shared processor, and in response to said respective test control signal, transfer said test data from said storage device to said one of said devices under test in accordance with said respective test instructions, said dedicated processor being further operable to verify the completion of said respective test instructions.