1. An integrated circuit tester for testing a plurality of integrated circuits at the same time, wherein the plurality of integrated circuits is capable of including a plurality of types of integrated circuits, the tester comprising: a plurality of processors, wherein each of the plurality of processors executes one of a plurality of test programs designed to test one of the plurality of integrated circuits, such that a plurality of test programs are executed; a plurality of resources coupled to the plurality of processors, wherein each of the plurality of processors uses the plurality of resources when executing test programs to complete execution of at least one of the plurality of test programs, wherein each of the plurality of resources is initially allocated to the plurality of processors, such that a separate portion of the plurality of resources is initially mapped to each of the plurality of resources: and at least one controller to reallocate at least one of the plurality of resources, wherein said at least one of the plurality of resources is reallocated among processors as necessary to execute the plurality of test programs, such that at least one of the plurality of processors gains control of said at least one of the plurality of resources initially allocated to another of said plurality processors to test the integrated circuits.