1. A computer-implemented method for reducing failure-in-time (FIT) errors associated with one or more sequential devices of a circuit design for a process technology, the method comprising: receiving an input data file that includes register transfer level (RTL) data of the circuit design, wherein the RTL data includes the one or more sequential devices; identifying a preferred logic state for each sequential device of the one or more sequential devices; and adjusting the one or more sequential devices based on the preferred logic state, wherein the one or more sequential devices include one or more skewed flip-flops configured to store a value corresponding to a logic one or a logic zero.