1. A computer implemented method for testing a plurality of electronic devices under test (DUTs), the method comprising: generating one or more of a design test pattern, command or instruction with an electronic design automation (EDA) tool in a native format thereof; sending a generated design test pattern, command or instruction to an automated test equipment (ATE) apparatus over a communication pipeline wherein the ATE apparatus is operable for testing the plurality of electronic DUTs; upon receipt, the ATE apparatus converting the generated design test pattern, command or instruction to an executable instance of the design test pattern, command or instruction in a format that is directly executable by the ATE apparatus; inputting one or more of test signals to each of the plurality of electronic DUTs based on the executable instance of the design test pattern, command or instruction; receiving test results from each of the plurality of electronic DUTs responsive to one or more test signals; returning received test results to the EDA tool through the communication pipeline and a responsive report of an action of the ATE apparatus, wherein the communication pipeline comprises: a server program resident on a server and operable for directing one or more associated clients to the ATE apparatus; and a client program resident on a client comprising the EDA tool and operable to exchange data signals with the server.