1. A method for determining leakage current in a CMOS circuit having a plurality of devices comprising the steps of: reading netlist data containing information on each of the plurality of devices and their respective connections within the circuit; reading a plurality of input state data, each input state specifying input signals provided to the circuit; determining which devices in the circuit are in an OFF state for each of the plurality of input states; computing leakage current for each device in the OFF state according to the device position in the circuit for each of the plurality of input states; and providing resulting leakage information for each input state.