1. A method for creating an array model for analog device modeling, comprising: creating a mean array, wherein: a first axis of the mean array represents mean values, a second axis of the mean array represents a first dimension within a circuit layout containing an analog device, a third axis of the mean array represents a second dimension within the circuit layout containing the analog device, the mean array describes how a mean of an analog device characteristic of the analog device varies across the circuit layout as a function of a physical location of the analog device within the circuit layout, and the mean array comprises two or more mean elements, wherein: a first mean element of the two or more mean elements is associated with a first array set of coordinates mapped to a first physical location within the circuit layout, the first physical location having a first coordinate value for the first dimension and a second coordinate value for the second dimension; the first mean element comprises a first mean value of the analog device characteristic, the first mean value calculated based upon at least one of a simulated or a measured analog device characteristic for one or more analog devices disposed at the first physical location; a second mean element of the two or more mean elements is associated with a second array set of coordinates mapped to a second physical location within the circuit layout, the second physical location having a third coordinate value for the first dimension and a fourth coordinate value for the second dimension; and the second mean element comprises a second mean value of the analog device characteristic, the second mean value calculated based upon at least one of the simulated or the measured analog device characteristic for one or more analog devices disposed at the second physical location; creating a standard deviation array comprising one or more standard deviation elements, a standard deviation element of the one or more standard deviation elements associated with the first array set of coordinates, the standard deviation element comprising a standard deviation value indicative of a standard deviation of at least one of the simulated or the measured analog device characteristic for the one or more analog devices disposed at the first physical location; creating, via a processing unit, the array model based on the mean array and the standard deviation array; and creating a netlist for a test circuit layout corresponding to the circuit layout based upon at least one of a mean value for a circuit element of the test circuit layout derived from the array model or a standard deviation value for the circuit element of the test circuit layout derived from the array model.