1. A method for selecting a victim memory block in a storage device for garbage collection comprising: identifying, by a block selection system, a memory block having a minimum valid unit count among a plurality of memory blocks in the storage device; determining, by the block selection system, a wear count bit of the identified memory block to be one of a null wear count and a non-null wear count, wherein the wear count bit of the identified memory block is null when the identified memory block is never used for garbage collection; performing, by the block selection system, in response to the determination of the identified memory block having the null wear count bit: selecting the identified memory block as the victim memory block for garbage collection; modifying the wear count bit of the identified memory block from null wear count to non-null wear count; modifying a wear count associated with the identified memory block; and modifying a victim memory block count associated with the identified memory block; and performing by the block selection system, in response to the determination of the identified memory block having the non-null wear count bit: masking the identified memory block having the non-null wear count bit; and selecting one or more target memory blocks for garbage collection.