1. A method for capturing and analyzing test data, comprising: using at least one computing device for: capturing multi-bit integer values of test data; writing each multi-bit integer value to a one-bit wide, multi-bit vertical field in an image file; obtaining location criteria identifying locations in the image file of the multi-bit vertical fields from which the multi-bit integer values are to be extracted; extracting the multi-bit integer values from the multi-bit vertical fields in the image file based on the location criteria; and analyzing the extracted multi-bit integer values.