1. A device, comprising: a test circuit having a plurality of switchable components and including a plurality of LBIST partitions; a clock circuit coupled to the test circuit and configured to switch the plurality of switchable components; and a voltage-drop reduction circuit coupled to the test circuit and coupled to the clock circuit and configured to adjust the switching of the plurality of switchable components, the voltage-drop reduction circuit including a respective LBIST controller coupled to each of the plurality of LBIST partitions each LBIST controller configured to respectively asynchronously switch each of the plurality of LBIST partitions.