1. A method of determining, by a computer, an output vector comprising at least an output variable, said output vector defining corrections to be applied to at least a feature of a second process for manufacturing a semiconductor integrated circuit, said method comprising: obtaining a first series of values of an input vector for a first process for manufacturing the same semiconductor integrated circuit at a first plurality of points of a first layout, said input vector comprising at least an input variable; obtaining a second series of values of the at least a component of the input vector for the second process at one of the same first plurality of points on the first layout and a second plurality of points on a second layout; determining values of a state vector comprising at least a state variable, said state vector representative of a state of differences between the first and the second series of values of the input vector; obtaining by a direct calculation the output vector for the series of values of the state vector.