1. A method for testing a set of circuitry in an integrated circuit (IC) comprising a plurality of configurable logic circuits for configurably performing a plurality of logic operations, a plurality of configurable routing circuits for configurably passing signals among the circuits of the IC, and a plurality of configurable storage elements for controllably storing signals as the signals transit between the configurable circuits, the method comprising: configuring the IC to operate in a user mode with a set of test paths that satisfies a set of evaluation criteria, each test path comprising a set of configurable logic circuits, a set of configurable routing circuits, and at least one configurable storage element; operating the IC in the user mode; and reading values stored in the storage elements along the set of test paths to determine whether the set of circuitry is operating within specified performance limits.