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<p>The goal of this project is to redesign, fabricate, and assemble a digital circuit operating near a frequency of 250 MHz to test a new experimental Gallium Arsenide (GaAs) Dynamic Random Access Memory (DRAM). This thesis presents the redesigned six-layer printed circuit test fixture and the design of the DRAM hold down clamp necessary to affix the DRAM to the test fixture. The use of commercially available Computer Aided Design (CAD) and Computer Aided Manufacturing CAM) tools were used for layout and fabrication. Finally, the assembly and testing of the test fixture, as well as problems encountered during the redesign, fabrication, and assembly processes, are discussed.
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<br>Subjects: NA</div>
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Ginter, Byron A.</div>
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