<p>NIST researcher Jabez McClelland makes adjustments on the new magneto-optical trap ion source, capable of focusing beams of ions down to nanometer spots for use as a 'nano-scalpel' in advanced electronics processing.
</p><p>Credit: Holmes, NIST
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<a rel="nofollow" class="external text" href="https://www.flickr.com/people/63059536@N06">National Institute of Standards and Technology</a>
2008-11-07 15:28
<a rel="nofollow" class="external text" href="https://www.flickr.com/photos/usnistgov/5887833284/">Cold Atoms; Hot Gallium; Focused Ion Beams</a>