Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm). The AFM used was the Veeco di CP-II, scanned in contact mode.  Constructed at the Nanorobotics Laboratory at Carnegie Mellon University (<a rel="nofollow" class="external free" href="http://nanolab.me.cmu.edu">http://nanolab.me.cmu.edu</a>).
<ul><li><a href="//commons.wikimedia.org/wiki/File:AFMimageRoughGlass20x20.png" title="File:AFMimageRoughGlass20x20.png">AFMimageRoughGlass20x20.png</a>: Chych</li>
<li>derivative work: <a href="//commons.wikimedia.org/wiki/User:Materialscientist" title="User:Materialscientist">Materialscientist</a> (<a href="//commons.wikimedia.org/wiki/User_talk:Materialscientist" title="User talk:Materialscientist"><span class="signature-talk">talk</span></a>)</li></ul>
2009-07-14 23:32
<ul><li><a href="//commons.wikimedia.org/wiki/File:AFMimageRoughGlass20x20.png" title="File:AFMimageRoughGlass20x20.png">AFMimageRoughGlass20x20.png</a></li></ul>