<div class="description">
<p>Extensive tables of the geometrical correction factors for four-point probe resistivity measurements on thin, circular semiconductor samples with all surfaces insulating are given, (1) for an in-line probe array displaced radially with points along a diam
</p>
<br>Subjects: Semiconductors.; Electric resistance.</div>
<div class="fn value">
Swartzendruber, Lydon J.</div>
Internet Archive identifier