<p>AURIGA, the CrossBeam System combines the 3D imaging and analysis performance of the GEMINI e-Beam column with the ability of a FIB for material processing and sample preparation on a nanoscopic scale. Available as AURIGA 40 and AURIGA 60 with different chamber designs you profit from maximum flexibility in industrial quality control and material science. 
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Images donated as part of a GLAM collaboration with Carl Zeiss Microscopy - please contact <a href="//commons.wikimedia.org/wiki/User:Pigsonthewing" title="User:Pigsonthewing">Andy Mabbett</a> for details.
<a rel="nofollow" class="external text" href="https://www.flickr.com/people/75834543@N06">ZEISS Microscopy</a> from Germany
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<a rel="nofollow" class="external text" href="https://www.flickr.com/photos/zeissmicro/6908574865/">AURIGA 60 FIB-SEM</a>