Excellent imaging properties combined with analytical  capabilities makes this high end FE-SEM suitable for a  wide range of applications in materials science, life science  and semiconductor technology. The large specimen  chamber for the integration of optional detectors and  accessories enables the user to configure the SUPRA for  specific applications without sacrificing productivity or  efficiency.
www.zeiss.com/sem
ZEISS Microscopy
CC BY 2.0
<a rel="nofollow" class="external free" href="https://www.flickr.com/photos/zeissmicro/6908581499/">https://www.flickr.com/photos/zeissmicro/6908581499/</a>