(a) Schematic illustration of FIB processing. (b) Bright-field TEM image and corresponding ED pattern of #05 sample. (c) Magnified image of (b). (d) TEM image and corresponding ED pattern of #06. (e) Magnified image of (d) showing distinct moiré fringes (indicated by arrows). (f) High-resolution TEM image of the grain showing moiré fringes, characteristic of nanoscale rotational deformation feature
Hiroaki Ohfuji et al.
CC BY 4.0
<a rel="nofollow" class="external free" href="http://www.nature.com/articles/srep14702">http://www.nature.com/articles/srep14702</a>