title: Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience
author: Jian Min Zuo
description: This book is more about imaging and diffraction; although the knowledge covered makes it easier to understand energy-dispersive spectroscopy and electron energy-loss spectroscopy  . This book would be a good choice for students or researchers who have some knowledge and experience and are seeking a better understanding of TEM or are planning in-depth microstructural analysis work. (Wanfeng Li, MRS Bulletin, Vol. 43, April, 2018)
zlib_text: nanomaterials
  Article
  In Situ Study of the Impact of Aberration-Corrected
  Electron-Beam Lithography on the Electronic
  Transport of Suspended Graphene Devices
  Naomi Mizuno 1,*, Fernando Camino 2,* and Xu Du 1,*
  1
  Department of Physics and Astronomy, Stony Brook University, Stony Brook, NY 11794-3800, USA
  2
  Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11973, USA
  *
  Correspondence: nmbibai@gmail.com (N.M.); fcamino@bnl.gov (F.C.); xu.du@stonybrook.edu (X.D.)
  Received: 3 March 2020; Accepted: 30 March 2020; Published: 2 April 2020
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  Abstract: The implementation of aberration-corrected electron beam lithography (AC-EBL) in a 200
  keV scanning transmission electron microscope (STEM) is a novel technique that could be used for the
  fabrication of quantum devices based on 2D atomic crystals with single nanometer critical dimensions,
  allowing to observe more robust quantum eﬀects. In this work we study electron beam sculpturing of
  nanostructures o