title: Focused Beam Methods: Measuring Microwave Materials in Free Space
author: John W Schultz
description: John Schultz received his B.S. Physics from the University of Maryland in 1987, his M.A. Physics from the University of Texas in 1990, and his Ph.D. Materials Engineering from the University of Dayton in 1997. He currently is a Research Engineer at the Compass Technology Group where he conducts research and development on the interaction of electromagnetic energy with complex materials and structures.
zlib_text: MODELING AND INVERSION IN 
  NEAR-FIELD MICROWAVE 
  MICROSCOPY AND ELECTRICAL 
  IM PEDANCE TOMOGRAPHY
  WEI ZHUN
  B. Sc., University of Electronic Science and Technology
  of China, China
  A THESIS SUBM ITTED
  FOR THE DEGREE OF DOCTOR OF 
  PHILOSOPHY OF ENGINEERING
  DEPARTMENT OF ELECTRICAL AND 
  COM PUTER ENGINEERING
  NATIONAL UNIVERSITY OF SINGAPORE
  2016
  
  ProQuest Number: 10310844
  All rights reserved
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  uest
  ProQuest 10310844
  Published by ProQuest LLO (2017). Copyright of the Dissertation is held by the Author.
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