 
 
 // BASE
+
 // Self-test of EEPROM functioning (and smart/split erase/write).
 // Will not usually perform any wear-inducing activity (is idempotent).
 static void testEEPROM()


  // OTV0p2Base
  testEEPROM();
  testRNG8();
  testEntropyGathering();


      AssertIsEqual(0, ((~eaTestPattern) & eeprom_read_byte((uint8_t*)V0P2BASE_EE_START_TEST_LOC2))); // Should have written.
    }
  AssertIsTrue(!OTV0P2BASE::eeprom_smart_clear_bits((uint8_t*)V0P2BASE_EE_START_TEST_LOC2, eaTestPattern)); // Should not need write nor attempt one.
  }

// Check that the various forms of sleep don't break anything or hang.
static void testSleep()
  {
  Serial.println("Sleep");
  for(uint8_t i = 0; i < 100; ++i)
    {
    OTV0P2BASE::nap(WDTO_15MS);
    OTV0P2BASE::nap(WDTO_15MS, OTV0P2BASE::randRNG8NextBoolean());
    OTV0P2BASE::idleCPU(WDTO_15MS, OTV0P2BASE::randRNG8NextBoolean());
    }
  }

// Test for expected behaviour of RNG8 PRNG starting from a known state.
