 
   // OTV0p2Base
   testEEPROM();
+  testSleep();
   testRNG8();
   testEntropyGathering();
 

      AssertIsEqual(0, ((~eaTestPattern) & eeprom_read_byte((uint8_t*)V0P2BASE_EE_START_TEST_LOC2))); // Should have written.
    }
  AssertIsTrue(!OTV0P2BASE::eeprom_smart_clear_bits((uint8_t*)V0P2BASE_EE_START_TEST_LOC2, eaTestPattern)); // Should not need write nor attempt one.
  }

// Test for expected behaviour of RNG8 PRNG starting from a known state.



// BASE

// Self-test of EEPROM functioning (and smart/split erase/write).
// Will not usually perform any wear-inducing activity (is idempotent).
static void testEEPROM()
