ADC/DAC radiation failures are mainly due to radiation-induced degradation of precision parameters of the transfer characteristic such as gain, zero offset, full-scale voltage, integral and differential non-linearity, conversion error. ADC/DAC radiation failure specifics is that even a slight deviation of electrical parameter of internal elements (comparator threshold, internal reference voltage, switch leakage, operational amplifier gain, etc.) often leads to significant degradation of ADC/DAC accuracy. ADC/DAC radiation test procedure and facilities are developed and test results are introduced.