Oscillation test methodology (OTM) has been very effective in detecting physical defects such as open, shorts and bridging defects in low-voltage CMOS VLSI analog and mixed signal circuits. This paper discusses the OTM for low voltage two-stage operational amplifier using N-well 1 mu m CMOS technology with high fault coverage and minimum area overhead. Five bridging faults and one open fault have been detected. Discrete practical realizations and extensive simulations based on CMOS 1 mu m technology parameters using PSPICE affirm that the test technique presented for MOSFET circuits ensures high fault coverage and requires a negligible area overhead.