Testing Maturity Model
Introduction The '''Testing Maturity Model''' ('''TMM''') was based on the Capability Maturity Model, and first produced by the Illinois Institute of Technology.Its aim to be used in a similar way to CMM, that is to provide a framework for assessing the maturity of the test processes in an organisation, and so providing targets on improving maturity. + The five Levels in the Testing Maturity Model Level  Description Level 1 – Initial  At this level an organisation is using ''ad hoc'' methods for testing, so results are not repeatable and there is no quality standard. Level 2 – Definition  At this level testing is defined as a process, so there might be test strategies, test plans, test cases, based on requirements. Testing does not start until products are completed, so the aim of testing is to compare products against requirements. Level 3 – Integration  At this level testing is integrated into a software life cycle, e.g. the V-model. The need for testing is based on risk management, and the testing is carried out with some independence from the development area. Level 4 – Management and measurement  At this level testing activities take place at all stages of the life cycle, including reviews of requirements and designs. Quality criteria are agreed for all products of an organisation (internal and external). Level 5 – Optimization  At this level the testing process itself is tested and improved at each iteration. This is typically achieved with tool support, and also introduces aims such as defect prevention through the life cycle, rather than defect detection (zero defects).Each level from 2 upwards has a defined set of processes and goals, which lead to practices and sub-practices.The TMM has been since replaced by the Test Maturity Model integration and is now managed by the TMMI Foundation.
See also * Enterprise Architecture Assessment Framework
References The article describing this concept was first published in: Crosstalk, August and September 1996"Developing a Testing Maturity Model: Parts I and II", Ilene Burnstein, Taratip Suwannasart, and C.R. Carlson,Illinois Institute of Technology (article not in online archives at  Crosstalk online anymore)