IC product lifetime as function of junction temperature
There are two rules of thumb when it comes to premature aging of electronics and temperature:


Every 10°C above 25°C halves its life
Every 15°C above 25°C halves its life.


The 10°C is derived from a certain application of Arrhenius' equation  

\$ AF = e^{ \frac{E_a}{k}}(\frac{1}{T_{use}}- \frac{1}{T_{test}}) \$

The issue with this is the 10°C result was a very broad interpretation of the empirical results (no consideration was given to other failure modes).

MIL-HDBK-217 took into account field data and concluded that 15°C is a figure more applicable to practical usage

https://www.electronics-cooling.com/2017/08/10c-increase-temperature-really-reduce-life-electronics-half/