Integrated Circuit design: Comparing the results given by corner analysis and Monte Carlo analysis
I'm not an expert in variability analysis, but Monte Carlo and corner are looking at two different things.
Corner analysis is looking at worst case (from a digital perspective mostly): All your N/P devices are at the 'slowest' point possible, or are at the 'fastest' point possible. I'm mostly familiar with corner analysis for digital designs to verify that, in the worst cases, all timing is still met (because if it is met under those situations, it will also be met on any intermediate situation).
Monte-Carlo looks at variability of devices within the IC (and depending on how it is run, also looks at resistor/capacitor matching, wheras corner-study only looks at the active switches). Things like how much offset you can expect from OTAs, how much differential-to-common mode conversion, how well matched are your gains of different amplifiers, etc etc.
So yes, they can give you different numbers (and probably should, really), because corner analysis looks at one specific, wafer-level device 'variability point'. Monte-carlo studies inter-wafer mismatch and so on.