Efficiently sampling specific surfaces using MIS in path tracing
I will not answer your questions directly, but will try to change your mindset a bit. I hope got your intentions reasonably well... 

The usual way the path tracing is implemented is that the reflection integral is split into direct and indirect illumination and they are estimated separately.

The direct illumination can be estimated using more sampling strategies which are combined together using the multi-sample multiple importance sampling method by Veach. Typically, there is just BSDF sampling and light sampling used, but you can also add things like light portals sampling and other more sophisticated stuff. I guess this is where you are headed.

The indirect illumination is usually estimated by just one sampling strategy (typically BSDF sampling) because you want to avoid exponential growth of recursive paths count. That's the reason why path tracing has poor performance for indirect illumination reflected/refracted through glossy/specular materials.

A nice thing about the split integral is that you can share samples between the direct and indirect integral. If you have two integrals over the same domain and have a sampling strategy that can be used for both, then you can generate a sample to estimate the first integral and then use the same sample for the second integral as well. There is no problem with correlated samples here because we have two separate computations. In practice you generate a BSDF sample with some PDF, shoot a ray in that direction and use the intersection point to estimate both direct and indirect integral separately.



PS: I guess that for indirect illumination estimator you could possibly use the one-sample multiple importance sampling method by Veach to incorporate the light portals and other sampling strategies, but I have some doubts about the efficiency of the resulting estimator, especially when reusing the samples for the direct illumination integral.