ete-97] pointed out that the total dose sensitivity of a technology can place practical limitations on the accurate determination of proton SEE cross sections. This can be true for TID hardened parts where assurances of very low cross sections are needed, but it may be much more important for COTS or other unhardened devices for which the TID failure levels may be only a few krad(Si). If the TID failure level of a candidate component is on the order of ~10 krad(Si), then testing on an individual DUT will be limited to that dose. If protons of ~60 MeV are used, this corresponds IV-26 a device cross section of ~10-11 cm². Smaller cross sections cannot be measured with a single device, although they may be important, especially for hard failures and disruptive soft error modes. The accurate determination of SEE cross sections for important events can require testing of many devices to TID failure levels to get even poor SEE statistics. Such measures may be required when the SEE may lead to catastrophic failure, when many copies of the same device are present on the same satellite, or when many copies of the same device are used in a constellation of identical satellites. The NASA Hubble Space Telescope offers one such example with its 12 Gbit Solid State Recorder (SSR). The SSR is based on DRAM technology and uses 1440 die with each containing 16 Mbits. Details of the proton SEE response of the individual die are provided in [LaBe-98], along with a description of in-flight anomalies that indicated proton sensitivity. Prior to flight, testing had been performed with both heavy ions and protons and on flight lot die. In these tests, block errors were identified through heavy ion testing, and the LET threshold was measured at about 5 MeVcm2/mg. With such a low threshold, protons might be also be expected to cause block errors, but after 3 flight lot die were tested to proton fluences of ~ 3 X 1011 (~30 krad(Si)), the devices failed from TID without exhibiting the single event induced block error. However, after launch,