ow dose rate sensitivity (ELDRS) in bipolar devices, and the potential that MOS devices often exhibit increased tolerance under low dose rate conditions. The selection of components evidencing minimal performance degradation and the development of valid derating guidelines for use in applying devices which exhibit performance degradation are also very important considerations. The underlying theme in assuring mission integrated effects tolerance is to test components as you plan to use them, and to procure components which will evidence the same characteristics as those which were tested. Information presented in several papers indicate concern over the effects which packaging techniques / materials and reliability assurance (burn- in) screening may have on total dose tolerance; most programs require that packaging and screening provisions planned for flight devices be present in total ionizing dose test devices. The procurement plan for devices must provide adequate assurance that devices utilized in flight systems do not exhibit reduced tolerance from those which were evaluated for suitability. Radiation design margin strategies require lot surveillance procedures where necessary to assure that individual production lots continue to exhibit adequate tolerance. Mitigation of Destructive Single Event Effects [LaBel961] [Layton97] In contrast to single event upset and transient mitigation, destructive single event effects may or may not be recoverable depending on the individual device's response. Hardening from the system level is difficult at best, and in most cases, not particularly effective. Non- recoverable destructive single event effects such as single event gate rupture and burn-out catastrophically damage devices in a manner which completely compromises operation of the circuit. Single event latchup occurrence may be catastrophic in a specific device, or a microlatch condition may exist in which the functionality of the device is compromised in a fashion which requires circumvention as a recovery provisi