roton Induced Latch-up," IEEE Trans. Nucl. Sci., Vol. 39, No. 6, pp. 1654-1657, 1992. [Nich-96] D.K. Nichols, James R. Coss, Tetsuo F. Miyahira, and Harvey R. Schwartz, "Heavy Ion and Proton Induced Single Event Transients in Comparitors," IEEE Trans. Nucl. Sci., NS-43, No. 6., pp. 2960-2967, 1996. [Norm-98] Eugene Normand, "Extensions of the Burst Generation Rate Method for Wider Applications to Proton/Neutron Induced Single Event Effects," IEEE Trans. Nucl. Sci., NS-45, No. 6, pp. 2904-2914, 1998. [Ober-96] D.L. Oberg, J.L. Wert, E. Normand, P.P. Majewski, and S.A. Wender, "First Observations of Power MOSFET Burnout with High Energy Neutrons," IEEE Trans. Nucl. Sci., NS-43, No. 6, pp. 2913-2920, 1996. [Oldh-83] T.R. Oldham and F.B. McLean, "Charge Collection Measurements for Heavy Ions Incident on n- and p-Type Silicon," IEEE Trans. Nucl. Sci., NS-30, No. 6, pp. 4493- 4500, 1983. [Oldh-84] T.R. Oldham, "Analysis of Damage in MOS Devices in Several Radiation Environments," IEEE Trans. Nucl. Sci., NS-31, No. 6, pp. 1236-1241, 1984. [Oldh-93] T.R. Oldham, K.W. Bennett, J. Beaucour, T. Carriere, C. Poivey, and P Garnier, "Total Dose Failure in Advanced Electronics from Single Ions," IEEE Trans. Nucl. Sci., NS- 41, No. 6, pp. 1820-1830, 1993. [O'Ne-98] P.M. O'Neill, G.D. Badhwar, and W.X. Culpepper, "Internuclear Cascade-Evaporation Model for LET Spectra of 200 MeV Protons Used for Parts Testing," IEEE Trans. Nucl. Sci., NS-45, No. 6, pp. 2467-2474, 1998. [Peas-99] Ronald L. Pease, private communication. [Pete-96] E.L. Petersen, "Approaches to Proton Single Event Rate Calculations," IEEE Trans. Nucl. Sci., NS-43, No. 2, pp. 496-505, 1996. [Pete-97] E.L. Petersen, "Single Event Analysis and Prediction," Section III, 1997 NSREC Short Course Notes. IV-47 (All references are unclassified.) [Pete-98] E.L. Petersen, "The SEU Figure of Merit and Proton Upset Rate Calculations," IEEE Trans. Nucl. Sci., NS-45, No. 6, pp. 2550-2562, 1998. [Poiv-94] C. Poivey, T. Carriere, J. Beaucour, and T.R. Oldham, "Characterization of Sin