nd the mitigation of these effects. The problem was mitigated by localized point solutions for single event upset and transients in the few device types which required the use of these techniques. Scaling of device technology and the accompanying reduction in operating voltage have reduced critical charge, and the increased circuit bandwidth enabled by these advances in technology has changed the situation to one in which one must search instead for the few components which do not exhibit some susceptibility to single event effects. 6.6.1 Mitigation Requirements Based on Fault Criticality [LaBel962] One technique for assessing the requirements for fault tolerance provisions is to examine the effects that faults would present to the operation of the system, and to adopt fault tolerance provisions based upon these impacts. The NASA developed approach to a methodology which assesses the single event effects related risks, examines SEE induced failure modes, and addresses the incorporation of mitigation provisions, is termed Single Event Effects Criticality Analysis (SEECA). Whether done according to this methodology or through some other similar provision, the idea is to examine the propagation of the consequences of a fault (an error) through a system to determine its impact, assigning a level of criticality to this outcome, and to adopt mitigation provisions based upon the severity of this impact. This procedure has similarity to the procedures utilized in traditional Failure Modes and Effects Analysis (FMEA) typically performed in support of system reliability analysis and prediction. Unfortunately, the tools and methodology utilized in reliability analysis are not directly applicable to single event effects analysis due to the nature of the non-uniform environment, transient effects mechanisms and system response, and differences in mitigation provisions. The analysis and determination of fault criticality based upon impact to system operations emerged as an informal method when one or two devices exhibiting sin