the ones that best exploit commercial opportunities in space. The outline of the course is as follows: In Section II "BASIC MECHANISMS FOR SINGLE-EVENT EFFECTS" Paul Dodd presents an overview of the mechanisms responsible for single-event effects (SEE), with a particular eye toward the use of physics-based modeling and simulation to shed light on the fundamental processes involved. After a brief review of the space radiation environment responsible for SEE, nondestructive and destructive SEE failure modes are discussed. Techniques for mitigating SEE are reviewed, as well as newer topics such as particle energy effects and gate rupture in thin oxides. Future trends in SEE susceptibility are also addressed, including growing concerns for SEE in terrestrial microelectronics. In Section III "TOTAL-DOSE EFFECTS: MODELING FOR PRESENT AND FUTURE" Jean-Luc Leray reviews the basic mechanisms of total ionizing dose effects on semiconductor devices in the natural space environment. Time dependent effects on radiation response are discussed, as are new issues of especial interest to commercial off-the-shelf (COTS) parts. Detailed examples are presented that incorporate numerical modeling of total dose effects in several cases of interest. In Section IV "PROTON EFFECTS & TEST ISSUES FOR SATELLITE APPLICATIONS" Paul and Cheryl Marshall briefly review the proton environments, and discuss single event, total ionizing dose, and displacement damage issues specific to proton effects in space. Case studies are presented that illustrate typical applications of single event rate predictions and displacement damage analysis tools. Current issues pertaining to emerging technologies, on-orbit predictions, and test fidelity are also discussed. In Section V, "SYSTEM LEVEL MITIGATION STRATEGIES" Bill Heidergott addresses the commercial space telecommunications industry and satellite systems, space environment effects on spacecraft payloads, and design for radiation environment compatibility. The presentation includes brief discussions of th