e as an EEC from G.8262, which specifies MTIE (option 1) and TDEV (option 1, 2) masks. See the section "Testing EEC and eEEC SyncE Clocks" for details. In addition, a T-TSC-P must maintain the max|TEL| LPF) at its 1PPS output no greater than 1350 ns (only where the T-TSC-P is external to the end application). This value is 250 ns because the normal 400 ns of TE (where the T-TSC is embedded in the end application) is split into two: 250 ns for the holdover in the T-TSC-P and 150 ns for the final application. Characteristics of the transfer of phase/time noise through the clock: Measures the transfer of TE from the input to output interfaces from PTP to PTP and PTP to 1PPS. This tests the characteristics and performance of the passband filter. As in the other cases, for the test to pass, the phase gain of the DUT should be smaller than 0.1 dB. The transfer of physical frequency to PTP or 1PPS is not currently specified. Transient response (response in the PTP/1PPS output during an interruption in the PTP input): This test involves a loss of the PTP time signal, and then a subsequent return of the sig- nal, all while monitoring the response at the output. The transient response needs to be less than 22 ns MTIE during the loss and again less than 22 ns MTIE following restoration. During the loss, it shall meet the holdover requirement defined in the next test case. The transient response of the PTP/1PPS outputs during a switchover of the source of physical frequency or during the switchover of both frequency and PTP signals is not currently specified. Holdover, or long-term transient: Measures the phase error under two conditions for the as- sisted clocks. One is when the PTP input has been removed and the physical frequency signal is still available, and the second is where both signals are absent, and the clock goes into holdover based on its oscillator. For the oscillator holdover case, the tester measures the phase error over 1000 S and plots it against a mask that rises to 1 us after 1000 S (the same as the assi