es for these applications. In the special case of specific error condition such as a unidirectional error model in which the predominance of error states are zero-to-one error transitions (or alternatively the case of one-to-zero dominance) schemes such as M-out-of-N and Berger codes may be useful. In the Berger code, the number of zeroes in the codeword is encoded as a binary number and appended to the codeword. Thus any unidirectional error which increases the number of ones, either decreases the number of zeroes, increases the check value, or both; similarly the number of ones could be counted if the predominant error model were to be one-to-zero transitions. In the case of M-out-of-N codes, the set of codewords is the set of N-bit words that contain exactly M ones. This structure could be useful to protect state machine structures which rely on the one-hot state encoding principle. An application of error detection and correction coding which has interesting implications in payload systems is that of yield enhancement in memory devices. The ability to achieve high integration density in the presence of realistic defect density in semiconductor manufacturing processes requires manufacturers to utilize fault tolerance provisions. These provisions enable devices which contain defects to be repaired or operated in a fashion which results in normal device function in the presence of the defect or fault. The most common technique for tolerance of these defects has been the utilization of spare rows and columns of memory cells which are substituted for those which are defective, or which contain individually defective memory cells. The repair action is supported through programming of individual devices by fusing of polysilicon or metal links using laser or electrical action. This provision enables the capability to tolerate from one to several defects and to enable the device to be repaired such that normal operation is achieved with no impact to read, write, or cycle time performance. The ability to recover device