, ▁T EM s ▁may ▁still ▁be ▁equ ipped ▁with ▁film ▁cart rid ges ▁for ▁the ▁purpose ▁of ▁obtain ing ▁these ▁images , ▁as ▁the ▁film ▁is ▁a ▁single ▁use ▁det ector . ▁ ▁Analysis ▁of ▁diff raction ▁patterns ▁beyond ▁point - position ▁can ▁be ▁complex , ▁as ▁the ▁image ▁is ▁sensitive ▁to ▁a ▁number ▁of ▁factors ▁such ▁as ▁spec imen ▁thick ness ▁and ▁orientation , ▁objective ▁l ens ▁def ocus , ▁and ▁spher ical ▁and ▁chrom atic ▁aber r ation . ▁Although ▁quant itative ▁interpretation ▁of ▁the ▁contrast ▁shown ▁in ▁lattice ▁images ▁is ▁possible , ▁it ▁is ▁inher ently ▁complicated ▁and ▁can ▁require ▁extensive ▁computer ▁simulation ▁and ▁analysis , ▁such ▁as ▁electron ▁mult is lice ▁analysis . ▁ ▁More ▁complex ▁behaviour ▁in ▁the ▁diff raction ▁plane ▁is ▁also ▁possible , ▁with ▁phen omena ▁such ▁as ▁K ik uch i ▁lines ▁ar ising ▁from ▁multiple ▁diff raction ▁within ▁the ▁cry st all ine ▁lattice . ▁In ▁conver gent ▁beam ▁electron ▁diff raction ▁( CB ED ) ▁where ▁a ▁non - parallel , ▁i . e . ▁conver ging , ▁electron ▁wave front ▁is ▁produced ▁by ▁concentr ating ▁the ▁electron ▁beam ▁into ▁a ▁fine ▁pro be ▁at ▁the ▁sample ▁surface , ▁the ▁interaction ▁of ▁the ▁conver gent ▁beam ▁can ▁provide ▁information ▁beyond ▁struct ural ▁data ▁such ▁as ▁sample ▁thick ness . ▁ ▁Electron ▁energy ▁loss ▁spect ro sc opy ▁( E EL S ) ▁ ▁Using ▁the ▁advanced ▁technique ▁of ▁electron ▁energy ▁loss ▁spect ro sc opy ▁( E EL S ), ▁for ▁T