▁on ▁the ▁acceler ating ▁voltage . ▁ ▁Once ▁inserted ▁into ▁a ▁T EM , ▁the ▁sample ▁has ▁to ▁be ▁manip ulated ▁to ▁locate ▁the ▁region ▁of ▁interest ▁to ▁the ▁beam , ▁such ▁as ▁in ▁single ▁gra in ▁diff raction , ▁in ▁a ▁specific ▁orientation . ▁To ▁accommod ate ▁this , ▁the ▁T EM ▁stage ▁allows ▁movement ▁of ▁the ▁sample ▁in ▁the ▁X Y ▁plane , ▁Z ▁height ▁adjust ment , ▁and ▁commonly ▁a ▁single ▁t ilt ▁direction ▁parallel ▁to ▁the ▁axis ▁of ▁side ▁entry ▁hold ers . ▁Sample ▁rotation ▁may ▁be ▁available ▁on ▁special ized ▁diff raction ▁hold ers ▁and ▁stages . ▁Some ▁modern ▁T EM s ▁provide ▁the ▁ability ▁for ▁two ▁orthogonal ▁t ilt ▁angles ▁of ▁movement ▁with ▁special ized ▁holder ▁designs ▁called ▁double - til t ▁sample ▁hold ers . ▁Some ▁stage ▁designs , ▁such ▁as ▁top - entry ▁or ▁vertical ▁insert ion ▁stages ▁once ▁common ▁for ▁high ▁resolution ▁T EM ▁studies , ▁may ▁simply ▁only ▁have ▁X - Y ▁translation ▁available . ▁The ▁design ▁criteria ▁of ▁T EM ▁stages ▁are ▁complex , ▁ow ing ▁to ▁the ▁simultane ous ▁requirements ▁of ▁mechanical ▁and ▁electron - opt ical ▁constraints ▁and ▁special ized ▁models ▁are ▁available ▁for ▁different ▁methods . ▁ ▁A ▁T EM ▁stage ▁is ▁required ▁to ▁have ▁the ▁ability ▁to ▁hold ▁a ▁spec imen ▁and ▁be ▁manip ulated ▁to ▁bring ▁the ▁region ▁of ▁interest ▁into ▁the ▁path ▁of ▁the ▁electron ▁beam . ▁As ▁the ▁T EM ▁can ▁operate ▁over ▁a ▁wide ▁range ▁of ▁magn ifications , ▁the ▁stage ▁must ▁simultaneously ▁be