▁a ▁critical ▁technology ▁for ▁high ▁magn ification ▁measurements ▁for ▁advanced ▁computer ▁chip ▁material ▁systems . ▁Disc uss ions ▁with ▁Intel ▁scient ists ▁led ▁to ▁the ▁choice ▁of ▁sc anning ▁electron ▁mic ros cope ▁and ▁atomic ▁force ▁mic ros cope ▁imag ing ▁systems . ▁High ▁magn ification ▁images ▁of ▁chip ▁components ▁used ▁with ▁D IC ▁provided ▁full - field ▁de formation ▁measurements ▁in ▁regions ▁as ▁small ▁as ▁ 2 0 μ m ▁x ▁ 2 0 μ m . ▁Between ▁ 2 0 0 2 ▁and ▁ 2 0 1 0 , ▁S utton ▁applied ▁ 2 D - D IC ▁to ▁quant itative ▁measurements ▁of ▁de form ations ▁in ▁small ▁regions ▁on ▁heter ogeneous ▁chip ▁cross - sections ▁under going ▁thermal ▁loading . ▁After ▁not ing ▁high ▁noise ▁levels ▁in ▁A FM ▁systems ▁S utton , ▁N ing ▁Li ▁and ▁X ia od ong ▁Li ▁focused ▁on ▁sc anning ▁electron ▁mic ros cope ▁systems . ▁They ▁obtained ▁spatial ▁resolution ▁of ▁ 1 0 ▁nan om eters , ▁while ▁reducing ▁disp lacement ▁vari ability ▁to ▁less ▁than ▁one ▁nan ometer . ▁▁ ▁In ▁the ▁late ▁ 2 0 0 0 s , ▁Thomas ▁Borg ▁introduced ▁S utton ▁to ▁Susan ▁Less ner . ▁Less ner ▁had ▁a ▁long - term ▁interest ▁in ▁meas uring ▁the ▁response ▁of ▁soft ▁bi ological ▁t issues , ▁such ▁as ▁ar ter ies , ▁when ▁subject ed ▁to ▁mechanical ▁loading . ▁Working ▁with ▁Less ner ▁for ▁over ▁a ▁de cade , ▁S utton ▁developed ▁the ▁use ▁of ▁S tere o