▁extracted ▁from ▁sensitive ▁samples ▁without ▁risk ing ▁over ex pos ure ▁during ▁a ▁time - int ensive ▁orientation ▁of ▁the ▁sample . ▁ ▁Autom ated ▁diff raction ▁tom ography ▁▁ ▁Autom ated ▁diff raction ▁tom ography ▁( AD T ) ▁uses ▁software ▁to ▁collect ▁diff raction ▁patterns ▁over ▁a ▁series ▁of ▁slight ▁t ilt ▁incre ments . ▁In ▁this ▁way , ▁a ▁three - dimensional ▁( tom ographic ) ▁data ▁set ▁of ▁reci pro cal ▁lattice ▁intens ities ▁can ▁be ▁generated ▁and ▁used ▁for ▁structure ▁determ ination . ▁By ▁coupling ▁this ▁technique ▁with ▁P ED , ▁the ▁range ▁and ▁quality ▁of ▁the ▁data ▁set ▁can ▁be ▁improved . ▁The ▁combination ▁of ▁AD T - P ED ▁has ▁been ▁employed ▁effectively ▁to ▁investigate ▁complex ▁framework ▁structures ▁and ▁beam - sens itive ▁organ ic ▁cry st als ▁ ▁Ori entation ▁mapping ▁▁ ▁M apping ▁the ▁relative ▁orientation ▁of ▁cry st all ine ▁gra ins ▁and / or ▁phases ▁helps ▁understand ▁material ▁texture ▁at ▁the ▁micro ▁and ▁n ano ▁scales . ▁In ▁a ▁transmission ▁electron ▁mic ros cope , ▁this ▁is ▁accomplished ▁by ▁recording ▁a ▁diff raction ▁pattern ▁at ▁a ▁large ▁number ▁of ▁points ▁( p ix els ) ▁over ▁a ▁region ▁of ▁the ▁cry st all ine ▁spec imen . ▁By ▁comparing ▁the ▁recorded ▁patterns ▁to ▁a ▁database ▁of ▁known ▁patterns ▁( e ither ▁previously ▁indexed ▁experimental ▁patterns ▁or ▁sim ulated ▁patterns ), ▁the ▁relative ▁orientation ▁of ▁gra ins ▁in ▁the ▁field ▁of ▁view ▁can ▁be ▁determined . ▁ ▁Because ▁this ▁process ▁is ▁highly ▁autom