▁X - ray ▁diff raction ▁contrast ▁tom ography ▁( D CT ) ▁and ▁high ▁energy ▁X - ray ▁diff raction ▁( H ED M ). ▁ ▁Comp ared ▁with ▁destruct ive ▁techniques , ▁e . g . ▁three - dimensional ▁electron ▁back sc atter ▁diff raction ▁( 3 D ▁E B SD ), ▁with ▁which ▁the ▁sample ▁is ▁serial ly ▁section ed ▁and ▁im aged , ▁▁ 3 D X R D ▁and ▁similar ▁X - ray ▁n ond est ruct ive ▁techniques ▁have ▁the ▁following ▁advantages : ▁ ▁They ▁require ▁less ▁sample ▁prepar ation , ▁thus ▁limit ing ▁the ▁introduction ▁of ▁new ▁structures ▁in ▁the ▁sample . ▁ ▁They ▁can ▁be ▁used ▁to ▁investigate ▁larger ▁samples ▁and ▁to ▁employ ▁more ▁complicated ▁sample ▁environments . ▁ ▁They ▁enable ▁to ▁study ▁how ▁ 3 D ▁gra in ▁structures ▁evol ve ▁with ▁time . ▁ ▁Since ▁measurements ▁do ▁not ▁alter ▁the ▁sample , ▁different ▁types ▁of ▁analysis ▁can ▁be ▁made ▁in ▁sequence . ▁ ▁Ex perimental ▁setup ▁▁▁ 3 D X R D ▁measurements ▁are ▁performed ▁using ▁various ▁experimental ▁geomet ries . ▁The ▁classical ▁ 3 D X R D ▁setup ▁is ▁similar ▁to ▁the ▁conventional ▁tom ography ▁setting ▁used ▁at ▁syn ch ro tr ons : ▁the ▁sample , ▁mounted ▁on ▁a ▁rotation ▁stage , ▁is ▁ill umin ated ▁using ▁quasi - parallel ▁mon och rom atic ▁X - ray ▁beam . ▁Each ▁time ▁a ▁certain ▁gra in ▁within ▁the ▁sample ▁satisfies ▁the ▁B rag g ▁condition , ▁a ▁diff ract ed ▁beam ▁is