ated , ▁the ▁quality ▁of ▁the ▁recorded ▁diff raction ▁patterns ▁is ▁cru cial ▁to ▁the ▁software ' s ▁ability ▁to ▁accur ately ▁compare ▁and ▁assign ▁orient ations ▁to ▁each ▁pixel . ▁Thus , ▁the ▁advantages ▁of ▁P ED ▁are ▁well - su ited ▁for ▁use ▁with ▁this ▁sc anning ▁technique . ▁By ▁instead ▁recording ▁a ▁P ED ▁pattern ▁at ▁each ▁pixel , ▁dynam ical ▁effects ▁are ▁reduced , ▁and ▁the ▁patterns ▁are ▁more ▁easily ▁compared ▁to ▁sim ulated ▁data , ▁impro ving ▁the ▁accuracy ▁of ▁the ▁autom ated ▁phase / orientation ▁assignment . ▁ ▁Bey ond ▁diff raction ▁ ▁Although ▁the ▁P ED ▁technique ▁was ▁initially ▁developed ▁for ▁its ▁improved ▁diff raction ▁applications , ▁the ▁advantage ous ▁properties ▁of ▁the ▁technique ▁have ▁been ▁found ▁to ▁enh ance ▁many ▁other ▁investig ative ▁techniques ▁in ▁the ▁T EM . ▁These ▁include ▁bright ▁field ▁and ▁dark ▁field ▁imag ing , ▁electron ▁tom ography , ▁and ▁composition - pro bing ▁techniques ▁like ▁energy - dis pers ive ▁x - ray ▁spect ro sc opy ▁( ED S ) ▁and ▁electron ▁energy ▁loss ▁spect ro sc opy ▁( E EL S ). ▁ ▁Im aging ▁ ▁Though ▁many ▁people ▁concept ual ize ▁images ▁and ▁diff raction ▁patterns ▁separately , ▁they ▁contain ▁princip ally ▁the ▁same ▁information . ▁In ▁the ▁simplest ▁approximation , ▁the ▁two ▁are ▁simply ▁Fourier ▁transform s ▁of ▁one ▁another . ▁Thus , ▁the ▁effects ▁of ▁beam ▁pre cess ion ▁on ▁diff raction ▁patterns ▁also ▁have ▁significant ▁effects ▁on ▁the ▁corresponding ▁images ▁in ▁the ▁T EM