X R D , ▁it ▁is ▁possible ▁to ▁study ▁in ▁situ ▁the ▁time ▁evolution ▁of ▁materials ▁under ▁different ▁conditions . ▁Among ▁others , ▁the ▁technique ▁has ▁been ▁used ▁to ▁map ▁the ▁el astic ▁stra ins ▁and ▁str esses ▁in ▁a ▁pre - stra ined ▁nick el - t itan ium ▁wire . ▁ ▁Rel ated ▁techniques ▁▁ ▁The ▁scient ists ▁involved ▁in ▁developing ▁ 3 D X R D ▁contributed ▁to ▁the ▁development ▁of ▁two ▁other ▁three - dimensional ▁non - dest ruct ive ▁techniques ▁for ▁the ▁material ▁sciences , ▁respectively ▁using ▁electrons ▁and ▁time - of - fl ight ▁neut rons ▁as ▁a ▁pro be : ▁three - dimensional ▁orientation ▁mapping ▁in ▁the ▁transmission ▁electron ▁mic ros cope ▁( 3 D - OM i TE M ) ▁and ▁time - of - fl ight ▁ 3 D ▁neut ron ▁diff raction ▁for ▁mult ig rain ▁cry stal log raph y ▁( To F ▁ 3 D ND ). ▁ ▁Using ▁a ▁system ▁of ▁l enses , ▁the ▁syn ch ro tr on ▁technique ▁dark - field ▁X - ray ▁micro sc opy ▁( DF X R M ) ▁extends ▁the ▁capabilities ▁of ▁ 3 D X R D , ▁allowing ▁to ▁focus ▁on ▁a ▁deeply ▁embedded ▁single ▁gra in ▁and ▁to ▁re construct ▁its ▁ 3 D ▁structure ▁and ▁its ▁cry st all ine ▁properties . ▁D FX R M ▁is ▁under ▁development ▁at ▁the ▁European ▁Syn ch ro tr on ▁Research ▁Fac ility ▁( ES R F ), ▁beam line ▁ID