POWER MANAGEMENT DURING SCAN BASED
SEQUENTIAL CIRCUIT TESTING
Reshma.p
M.tech Scholar, Department of Electronics and Communication Engineering, Amrita
Vishwa Vidyapeetham University, Coimbatore.
reshma_p2004@rediffmail.com

ABSTRACT
This paper shows that not every scan cell contributes equally to the power consumption during scan
based test. The transitions at some scan cells cause more toggles at the internal signal lines of a circuit
than the transitions at other scan cells. Hence the transitions at these scan cells have a larger impact on
the power consumption during test application. These scan cells are called power sensitive scan cells.A
verilog based approach is proposed to identify a set of power sensitive scan cells. Additional hardware is
added to freeze the outputs of power sensitive scan cells during scan shifting in order to reduce the shift
power consumption.when multiple scan chain is incorporated along with freezing the power sensitive
scan cell,over all power during testing can be reduced to a larger extend.

KEYWORDS
Scan ,Scan DFlip-Flop ,DFTAdvisor

1. INTRODUCTION
With current advances in very large scale integrated technology , the
sensitivity of today’s chips to deep submicrometer effects is increasing. Along with technology
scaling, the increase in the operating frequency and the increase in the functional density of
today’s digital designs has led to new challenges for designers and test engineers. Furthermore,
dynamic power consumption and IR-drop due to excessive switching activity are critical
challenges. As a result, power reduction techniques have been extensively studied by both
industry and academia with respect to both design and test. Scan-based test remains one of the
most widely accepted design-for-test techniques because it significantly improves the
controllability and the observability of the circuit’s internal nodes with an insignificant area and
performance overhead.Switching activity during scan-based test is often much higher than that
during normal operation. There are multiple reasons for this phenomenon. First, the test vectors
applied consecutively are not correlated. Second, nonfunctional states may be traversed during
scan-test. Furthermore, test compaction and testing multiple cores simultaneously contribute
toward high-switching activity. In addition, as patterns are shifted into and out of the scan
chains, multiple changes of the flip-flop values can propagate into the combinational logic and
cause massive amounts of switching.
Scan-based tests might cause excessive circuit switching activity compared
to a circuit’s normal operation . Higher switching activity causes higher peak supply currents
and higher power dissipation. High power dissipation during test can cause many problems,
which are generally addressed in terms of average power and peak power. Average power is the
total distribution of power over a time period, and is calculated using the ratio of consumed

energy to test time .Peak power is the highest power value at any given instant. When peak
power is beyond the design limit, a chip cannot be guaranteed to function properly due to
additional gate delays caused by the supply voltage drop. The power consumption within one
clock cycle may not be large enough to elevate the temperature over the chip’s thermal capacity
limit. To damage the chip, high power consumption must last for an enough number of clock
cycles.The test power consumed during scan shifting and capture cycles is referred to as shift
power and capture power, respectively. A typical scan chain in industrial designs consists of at
least hundreds of scan cells, whereas the capture window only lasts one or a few clock cycles.
Clearly, the average power consumption is determined by the shift power. Excessive shift power
accumulation may make a good chip fail during test even if the peak capture power is low.
Inserting no operation cycles between the end of scan shifting and the beginning of capture
cycles can reduce the chance of rejecting good chips during test. This experimental result
implies that test power reduction strategies should focus on reduction of the average shift power
and the peak capture power.This paper, focus on reducing the average shift power in scan-based
tests. An effective method to identify a set of power sensitive scan cells is used. By inserting
additional hardware to freeze power sensitive scan cell outputs to pre-selected values, the
average shift power consumption can be reduced dramatically.
The paper is organized as follows. In Section 2,previous work. In Section
3,proposed method. In Section 4, experimental results on S27 is presented, followed by
conclusions in Section 5.

2.The Previous work
To reduce the switching activity during scan shift, automatic test
pattern generation (ATPG)-based approach and 2) DFT-based approach were used. The
advantage of the ATPG based solutions is that they do not modify the original design and the
scan architecture,but modification is done on test vectors and there by power reduction can be
obtained. DFT-based solutions require one to either partition the conventional scan chain
architecture or insert additional hardware into the design .Different DFT approach used here are
included in this literature survey. In Minimised power consumption for scan based Bist, extra
logics are inserted to hold the outputs of all the scan cells at constant values during scan
shifting. This methods not only minimize the average scan shift power, but also avoid peak
power hazards during scan shifting. The main disadvantage of these approaches is the large area
overhead, since additional logics are added to all the scan cells. Moreover, it may degrade
circuit performance due to extra logics added between scan cell outputs and functional logics.
To reduce the area overhead due to additional gates, supply gating transistors for the first-level
gates at the outputs of scan cells are proposed in Low power scan design using first level supply
gating. An alternative implementation to hold the scan cell outputs by using dynamic logic was
proposed in Techniques for minimizing power dissipiation in scan and combinational circuit
during test application.The method proposed in Inserting test points to control peak power
during scan testing, inserts test points at selected scan cell outputs to keep the peak shift power
at every shift cycle below a specified limit. Given a set of test patterns, logic simulation is
carried out to identify the shift cycles in which peak power violations occur. Those cycles are
called violating cycles. By using integer linear programming (ILP) techniques, the optimization
problem is solved to select as few test points as possible such that all violating cycles can be
eliminated. In Partial gating optimization for power reduction during test application, random
vector simulation was used to guide partial test point selection. When simulating a random
vector, the primary inputs and the pseudo primary inputs are changed to value X with prespecified probabilities, and the number of gates becoming X after the change is used as a cost

function to identify the logic value assigned at the primary inputs and the pseudo primary
inputs, as well as to select scan cells to be held during scan shifting. To explore several hundred
thousands of scan cells in an industrial circuit, a significant number of random vectors need to
be simulated in order to choose good test points.
Motivated by the test point insertion approach along with
multiple scan chain, scan shift power can be reduced to a larger extend. Some scan cells have a
much larger impact on toggle rates at the internal signal lines than other scan cells. These scan
cells are called power sensitive scan cells. Objective is to quickly identify power sensitive scan
cells and their preferred frozen values during scan shifting. By freezing a small percentage of
scan cells that are the most power sensitive, reduction in scan shift power can be achieved
,while minimizing the additional area overhead. Compared with the previous approaches , this
approach has less area overhead and can avoid modifying scan cells at critical paths by not
selecting them to freeze. This approach also provides a practical way to handle large industrial
designs and since both freezing power sensitive scan cells and multiple scan chain approach is
used, power can be reduced to a larger extend.

3.The Proposed Method
A mentorgraphics tool called DFTAdvisor is used for Scan
insertion.An S27 ISCAS benchmark circuit is taken and scan is inserted in that circuit using
DFTAdvisor.By using Fastscan all the testvectors for stuck at faults are identified.By simulating
the testbench obtained from Fastscan,along with the verilog code obtained from the
DFTAdvisor,number of toggling are calculated.By using a counter toggling are counted and
identify the point where the logic gate has to be inserted.In S27 circuit it is find that the toggling
in between the first and zeroth ScanD-FF is higher.By introducing logic gates at the output of
first ScanD-FF we can block the complete toggling occurring at the combinational part,when
only the Flip-Flops are selected. An additional AND gate with the second input inverted is
inserted between the scan cell output and the function logics it drives. During scan shifting, the
scan enable signal se is asserted to be 1. It makes additional gate output become constant.
During normal operations, se is de-asserted to be 0 and the additional gates do not impact
normal operations.

4. Experimental Results

For testing a sequential circuit, both combinational cloud testing as well as memory
element testing is needed. The approach used here converts all D-flip-flop to scanDflipflop.DFTAdvisor is a synthesis tool capable of doing scan insertion. It accepts gate level net
list format and generates a new net list with scan cells inserted.The circuit in Fig.1 shows
ISCAS S27 benchmark circuit.when the synthesisable netlist code for it is given to
DFTAdvisor,it will generate a code with scan inserted as shown in Fig.2. When the code
obtained from DFTAdvisor is given to Fastscan,corresponding test vectors obtained are as
shown in Fig.3.By simulating the testbench obtained from Fastscan,along with the code from
DFTAdvisor, the result is as shown in Fig.4

Fig.1 ISCAS S27 Benchmark Ckt

Fig.2a. Invocation of DFTAdvisor

Fig.2b. Scan inserted ckt obtained from DFTVisualiser

Fig.2c.Scan inserted code generated by DFTAdvisor

Fig.3.Test vectors obtained from Fastscan

Fig.4.Simulated result

From the simulated result, it is clear that when scan enable is high there will be toggling at
combinational part.But it is not desired.when scan enable is high ther will not be any toggling at
combinational part,only flip-flop is involved.By using a counter,the toggligs when scan enable
is high are calculated and found that toggling between Dff_1 and Dff_0 , and Dff_2 and Dff_0
are higher.By introducing logic gates at these points it is seen that overall toggling can be
reduced to a larger extend.It is shown in Fig.5.

Fig.5.a.Toggling after scan insertion

Fig.5.b.Logic insertion between Dff_1 and Dff_0

Fig.5.c.Simulation result after gate insertion

Fig.5.d.Toggling after logical insertion

Area will be a trade-off for power.By simulating S27 in XILINX, it is observed that will not be
that much increase in area overhead.It is shown in Fig.6.By using multiple scan chains ,it is
verified that time required drastically decreases.corresponding simulation results are shown in
Fig .7.

Fig.6.a.Utilization of area in S27

Fig.6.b.Utilization of area in S27 after scan insertion

Fig .6.c.Utilization of area in S27 after logical insertion
between Dff_1 and Dff_0

Fig .7.a. 1_scan chain

Fig .7.b. 2_scan chain

Fig .7.c. 3_scan chain

Fig .7.d. Simulation result_1 scan chain

Fig .7.e. Simulation result-3 Scan chain

1 Scan chain
Number of Clock
required
Time required

3 Scan
chain

24

20

1600ns
1400ns

Fig .7.f. Comparison result

5. CONCLUSION
This paper presented and analyzed a method for reducing switching activity during
scan shift by freezing a small subset of all flip-flops at the RTL. Large reductions in switching
activity can be achieved with very low-area overhead. The amount of scan flip-flops that are
going to be frozen can be decreased/increased depending on the design’s overhead budget. In
comparison with previous methods, which freeze these flip-flops at the gate level, timing
closure can be more easily met. When flip-flops are frozen at the gate level, individual timing
analysis have to be implemented to determine whether or not each flipflop could be frozen
without violating timing. By freezing all flip-flops simultaneously at the RTL,this approach
allow the synthesis tool to automatically optimize for timing closure.
In addition, this paper has presented a detailed analysis of the switching activity
reduction that can be obtained with very few frozen flip-flops. In fact, in one case, a 79%
reduction in switching activity was achieved with an area overhead of only 0.02%. This
switching activity analysis considered both hazards and final circuit values.when multiple scan
chain is applied along with freezing powersensitive scan cells, the test power is seen to reduced
to a larger extend along with that time required for testing also get reduced.

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