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The Lord Is Good: Seeking the God of the Psalter: Christopher Holmes: 9780830848836 - Christianbook.com
Stock No: WW848836
ISBN-13: 9780830848836
I'm the author/artist and I want to review The Lord Is Good: Seeking the God of the Psalter.

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This website is a Christian catalog and internet retailer.
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The Mariners took two of three in this series from Houston, which entered the day five games ahead of Oakland atop the AL West ... Seattle Mariners' Robinson Cano, right, hits a RBI single as Houston Astros catcher Martin Maldonado reaches for the pitch during the first inning of a baseball game Wednesday, Sept ... Seattle Mariners relief pitcher Matt ......
HOUSTON — Given how the games had played out over the past few seasons, it didn’t seem possible for the Mariners to do this ... A four-game sweep of the Astros in early August at Minute Maid when their roster was ravaged by injuries helped change the Mariners’ success against the best team in the American League West ... Hinch, Keuchel remained in the game ... The Mariners blew the game open against the Astros bullpen....
View Full Game Coverage ... View Full Game Coverage ... The Mariners are 5-2 on their 10-game road trip and head to Texas 84-68 overall with 10 games remaining, though their Wild Card elimination number (any combination of Oakland wins or Seattle losses) is down to five, with the A's still playing on Wednesday night against the Angels ... He's hit .333 with 15 doubles, eight homers and 28 runs in 37 games since moving to the top of the order....
BC-BBA--Mariners-Astros,564. Cano has 3 RBIs as Mariners rout Astros 9-0 ... Mariners 9, Astros 0 ... The Mariners took two of three in this series from Houston, which entered the day five games ahead of Oakland atop the AL West ... The Mariners took two of three in this series from Houston, which entered the day five games ahead of Oakland atop the AL West ... Mariners ... Mariners....
Keuchel remained in the game, retiring the next two batters to end the inning, but Seattle had already jumped to the early lead with four hits in the frame ... The Mariners went 2-for-5 with runners in scoring position in the inning after going 1-for-19 in splitting the first two games of the series....
The Mariners took the rubber match of the three-game and season series by jumping to a 3-0 lead on Astros left-hander Dallas Keuchel (11-11) in the first inning and never looking back ... Instead, the Mariners won for the seventh time in nine games in Houston, stalling the Astros' postseason march ... Despite the loss, the Astros have still won 13 of 17 games in September....
The Mariners took two of three in this series from Houston, which entered the day five games ahead of Oakland atop the AL West ... Rookie Matt Festa made his first career start on a bullpen day for the Mariners and threw a perfect first inning before Casey Lawrence (1-0) took over and allowed one hit in three innings ... Hinch and the team trainer for a couple of minutes before throwing some warmup pitches and remaining in the game ... Mariners....
HOUSTON -- The Astros couldn't overcome a shaky first inning from left-hander Dallas Keuchel and were shut down by the Mariners in a 9-0 loss on Wednesday night at Minute Maid Park in the final meeting of the season between the two American League West clubs ... View Full Game Coverage ... View Full Game Coverage ... Seven Mariners pitchers held the Astros to five singles and dealt them their ninth shutout loss....
View Full Game Coverage ... View Full Game Coverage ... Some fans question why either pitcher would return at this point with the team's postseason hopes now all but over, as the Mariners entered play on Wednesday seven games behind the A's with 11 games remaining ... "It'd be great to get those starts in at home and try to win some games for our fans and show our appreciation for their support all season," he said....
Anyone who has watched a Mariners victory in 2018 has stood a good chance of also witnessing an Edwin Diaz save. Wednesday's 9-0 win at Houston was the 84th of the year for the Mariners, and a rare blowout -- just the 28th that hasn't been saved by Diaz ... Diaz has 10 games remaining -- beginning Friday at Texas -- to match K-Rod ... View Full Game Coverage ... Diaz has 10 games remaining -- beginning Friday at Texas -- to match K-Rod....
In between and after, Houston’s offense could not strike an extra-base hit or score on any of the seven pitchers the Seattle Mariners deployed. The Mariners (84-69) delivered a 9-0 trouncing inside Minute Maid Park ... Then the Mariners ran away with the game ... Nelson Cruz, who had not recorded a hit in the series, hammered the final nail in Keuchel’s dying chances to stay in the game ... It worked ideally for the Mariners....

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Book Affittacamere Da Flo in Monterosso al Mare | Hotels.com
All hotels in Monterosso al Mare, Italy
Via Fegina 108, Check In: Via Fegina 120, Monterosso al Mare, 19016, Italy
Monterosso al Mare guestrooms with comfy beds
Deluxe Double Room, Sea View - Balcony [3/52]
Junior Suite, Sea View - Guest Room [4/52]
Deluxe Room - Guest Room [8/52]
Junior Suite, Sea View - Bathroom [9/52]
Terrace/Patio [11/52]
Staircase [17/52]
Beach/Ocean View [19/52]
Balcony View [21/52]
Junior Suite, Sea View - Guest Room [22/52]
Junior Suite, Sea View - Guest Room [23/52]
Junior Suite, Sea View - Guest Room [25/52]
Deluxe Double Room, Sea View - Guest Room [26/52]
Deluxe Room - Bathroom [27/52]
Bathroom [28/52]
Staircase [29/52]
Junior Suite, Sea View - Guest Room [31/52]
Deluxe Room - Guest Room [33/52]
Deluxe Double Room, Sea View - Guest Room View [35/52]
Bathroom [36/52]
Deluxe Double Room, Sea View - Bathroom [37/52]
Deluxe Double Room, Sea View - Bathroom [43/52]
Deluxe Double Room, Sea View - Bathroom [44/52]
In-Room Amenity [45/52]
Deluxe Room - Guest Room [46/52]
Deluxe Room - Guest Room [48/52]
Deluxe Room - Guest Room [49/52]
Deluxe Double Room, Sea View - Guest Room [51/52]
In-Room Amenity [52/52]
2 - Affittacamere Da Flo, Monterosso al Mare, Beach
3 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Double Room, Sea View, Balcony
4 - Affittacamere Da Flo, Monterosso al Mare, Junior Suite, Sea View, Guest Room
5 - Affittacamere Da Flo, Monterosso al Mare, In-Room Amenity
6 - Affittacamere Da Flo, Monterosso al Mare, Guest Room
7 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Room, Guest Room
8 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Room, Guest Room
9 - Affittacamere Da Flo, Monterosso al Mare, Junior Suite, Sea View, Bathroom
10 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Room, Bathroom
11 - Affittacamere Da Flo, Monterosso al Mare, Terrace/Patio
12 - Affittacamere Da Flo, Monterosso al Mare, Exterior detail
13 - Affittacamere Da Flo, Monterosso al Mare, Lobby Sitting Area
14 - Affittacamere Da Flo, Monterosso al Mare, Reception
15 - Affittacamere Da Flo, Monterosso al Mare, Lobby
16 - Affittacamere Da Flo, Monterosso al Mare, Hotel Interior
17 - Affittacamere Da Flo, Monterosso al Mare, Staircase
18 - Affittacamere Da Flo, Monterosso al Mare, Hotel Interior
19 - Affittacamere Da Flo, Monterosso al Mare, Beach/Ocean View
20 - Affittacamere Da Flo, Monterosso al Mare, Beach/Ocean View
21 - Affittacamere Da Flo, Monterosso al Mare, Balcony View
22 - Affittacamere Da Flo, Monterosso al Mare, Junior Suite, Sea View, Guest Room
23 - Affittacamere Da Flo, Monterosso al Mare, Junior Suite, Sea View, Guest Room
24 - Affittacamere Da Flo, Monterosso al Mare, Guest Room
25 - Affittacamere Da Flo, Monterosso al Mare, Junior Suite, Sea View, Guest Room
26 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Double Room, Sea View, Guest Room
27 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Room, Bathroom
28 - Affittacamere Da Flo, Monterosso al Mare, Bathroom
29 - Affittacamere Da Flo, Monterosso al Mare, Staircase
30 - Affittacamere Da Flo, Monterosso al Mare, View from Hotel
31 - Affittacamere Da Flo, Monterosso al Mare, Junior Suite, Sea View, Guest Room
32 - Affittacamere Da Flo, Monterosso al Mare, Guest Room
33 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Room, Guest Room
34 - Affittacamere Da Flo, Monterosso al Mare, Guest Room
35 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Double Room, Sea View, Guest Room View
36 - Affittacamere Da Flo, Monterosso al Mare, Bathroom
37 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Double Room, Sea View, Bathroom
38 - Affittacamere Da Flo, Monterosso al Mare, Guest Room
39 - Affittacamere Da Flo, Monterosso al Mare, Guest Room
40 - Affittacamere Da Flo, Monterosso al Mare, Guest Room
41 - Affittacamere Da Flo, Monterosso al Mare, Guest Room
42 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Room, Guest Room
43 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Double Room, Sea View, Bathroom
44 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Double Room, Sea View, Bathroom
45 - Affittacamere Da Flo, Monterosso al Mare, In-Room Amenity
46 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Room, Guest Room
47 - Affittacamere Da Flo, Monterosso al Mare, Guest Room
48 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Room, Guest Room
49 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Room, Guest Room
50 - Affittacamere Da Flo, Monterosso al Mare, Guest Room
51 - Affittacamere Da Flo, Monterosso al Mare, Deluxe Double Room, Sea View, Guest Room
52 - Affittacamere Da Flo, Monterosso al Mare, In-Room Amenity
Monterosso Beach - 2 min walk
Fegina Beach - 13 min walk
Sanctuary of Nostra Signora di Soviore - 4.3 mi / 7 km
Levanto Beach - 7.4 mi / 12 km
Levanto Marina - 7.6 mi / 12.2 km
San Giorgio Castle - 8 mi / 12.8 km
Vernazza Beach - 9.8 mi / 15.8 km
Bonassola Beach - 9.8 mi / 15.8 km
Great hotel. We had an ocean view. This was right in the beach. Make sure to let them… Apr 29, 2018
Wonderful stay! Would stay there again on next trip! Oct 14, 2017
See all hotels in Monterosso al Mare
Affittacamere Da Flo, Monterosso al Mare’s small print
What’s around Affittacamere Da Flo, Monterosso al Mare
Monterosso Station - 10 min walk
Levanto Station - 17 min drive
Vernazza Station - 30 min drive
Location was amazing. Had to carry luggage up 2 narrow flights of stairs ( with no help from reception!). The shower was very small, too small for an average person to turn around in. No breakfast and no internet in the room.
Great Spot...right in the middle of it all.
Clean, incredible views, central location , A.C. is the best one I've found in Italy. Because of its location it does get a lot of street noise during the day...but you only notice it if you are out on the balcony. Bathroom door sticks and they forgot to refill coffee...but who cares. :)
The price was high for this room. Our staying room was in another building, so we had to walk there from the reception place that was annoying in hot afternoon. The room eas ckean with a very good air conditioner, but there was smell of cleaning stuff everywhere. The location was great, next to beach with a very nice sea view.
Fatemeh, us1 night trip with friends
A pleasant option for Cinque Terre
Located facing the beach just a short walk to the right from train station. A slightly more mellow area of the new town than than the center. Short walk to the old town which has much more character. Beach area is OK, but not the reason to go to Monterrosso. Gentleman at front desk was courteous and helpful. Room was comfortable. A decent value for a stay in the Cinque Terre area.
Great value for the great location!
Check in went smooth even though we arrived late into the evening. The room was clean, comfortable and very private - we didn't see anyone in the nearby rooms during our stay. Breakfast was not included but you could choose to add on the breakfast buffet for 15 euro per person. We chose to grab breakfast at the nearby cafes. The hotel ("private rooms") was in a great location on the Main Street of the new town/right on the beach promenade right near the public and private beaches, cafes & restaurants and a 5 minute walk to the train station. Great value for the great location!

value: This website is a website for booking hotel rooms online and by telephone. The company has 85 websites in 34 languages, and lists over 325,000 hotels in approximately 19,000 locations.


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Middlesex County, Virginia Compiled GenealogiesEdit This Page	From FamilySearch Wiki	(Difference between revisions)	Jump to:	navigation	, search	Revision as of 01:55, 20 November 2012 (view source)Murphynw (Talk | contribs) (Perrott)← Older edit
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*'''[Barbee]''' Shields, Ruth Herndon, Belle Lewter West and Kathryn Crossley Stone. ''A Study of the Barbee Families of Chatham, Orange and Wake Counties in North Carolina''. Boulder, Colo.: K.C. Stone, 1971. Digital version at {{FSbook|975892}} - free; {{FHL|103545|item|disp=FHL Book 929.273 B232s}}; 1976 edition has been digitized: {{FSbook|980323}} - free; {{FHL|174196|item|disp=FHL Book 929.273 B232a 1976}}; 1976 supplement has been digitized: {{FSbook|974498}} - free; {{FHL|4261|item|disp=FHL Book 929.273 B232a 1976 supp}}. *'''[Barbee]''' Shields, Ruth Herndon, Belle Lewter West and Kathryn Crossley Stone. ''A Study of the Barbee Families of Chatham, Orange and Wake Counties in North Carolina''. Boulder, Colo.: K.C. Stone, 1971. Digital version at {{FSbook|975892}} - free; {{FHL|103545|item|disp=FHL Book 929.273 B232s}}; 1976 edition has been digitized: {{FSbook|980323}} - free; {{FHL|174196|item|disp=FHL Book 929.273 B232a 1976}}; 1976 supplement has been digitized: {{FSbook|974498}} - free; {{FHL|4261|item|disp=FHL Book 929.273 B232a 1976 supp}}. *'''[Barbee]''' Mullen, Roderic L. ''Lynn, Barbee, Miller, Mayton, Hutchins, Rhodes, Nicholls, Herndon, Blake, Clifton, Vickers, Trice, Patterson, Proctor, Dollar: and Allied Families of Durham, Orange and Wake Counties, North Carolina''. Baltimore, Md.: Gateway Press, 1998. Digital version at {{FSbook|520997}} - free; {{FHL|723051|title-id|disp=FHL Book 929.273 L993mr}}. *'''[Barbee]''' Mullen, Roderic L. ''Lynn, Barbee, Miller, Mayton, Hutchins, Rhodes, Nicholls, Herndon, Blake, Clifton, Vickers, Trice, Patterson, Proctor, Dollar: and Allied Families of Durham, Orange and Wake Counties, North Carolina''. Baltimore, Md.: Gateway Press, 1998. Digital version at {{FSbook|520997}} - free; {{FHL|723051|title-id|disp=FHL Book 929.273 L993mr}}. −*'''[Barwick]''' Howells, Henry Coggeshall. "The Wives and Family of David Barwick Jr.," ''Magazine of Virginia Genealogy'', Vol. 49, No. 2 (May 2011):119-134. +*'''[Barwick]''' Howells, Henry Coggeshall. "The Wives and Family of David Barwick Jr.," ''Magazine of Virginia Genealogy'', Vol. 49, No. 2 (May 2011):119-134. {{FHL|478773|item|disp=FHL Book 975.5 B2vs}}. *'''[Bassett]''' Keith, Charles Penrose. ''The Ancestry of Benjamin Harrison: President of the United States of America, 1889-1893, in Chart Form Showing Also the Descendants of William Henry Harrison, President of the United States of America in 1841 and Notes on Families Related.'' Philadelphia, Pa.: J.B. Lippincott Co., 1893. {{FHL|276759|item|disp=FHL Film 250250}}; digital versions at [http://search.ancestry.com/search/db.aspx?dbid=11769 Ancestry] ($); [http://archive.org/details/ancestryofbenjam00byukeit Internet Archive] - free. *'''[Bassett]''' Keith, Charles Penrose. ''The Ancestry of Benjamin Harrison: President of the United States of America, 1889-1893, in Chart Form Showing Also the Descendants of William Henry Harrison, President of the United States of America in 1841 and Notes on Families Related.'' Philadelphia, Pa.: J.B. Lippincott Co., 1893. {{FHL|276759|item|disp=FHL Film 250250}}; digital versions at [http://search.ancestry.com/search/db.aspx?dbid=11769 Ancestry] ($); [http://archive.org/details/ancestryofbenjam00byukeit Internet Archive] - free. +*'''[Batcheldor]''' Crozier, William Armstrong. ''Virginia Heraldica: Being a Registry of Virginia Gentry Entitled to Coat Armor, With Genealogical Notes of the Families.'' New York: The Genealogical Association, 1908. Digital version at [http://archive.org/details/virginiaheraldic00croz Internet Archive] - free. +*'''[Bayly]''' Roberts, Gary Boyd. ''Ancestors of American Presidents.'' Boston, Mass.: New England Historic Genealogical Society, 2009. {{FHL|1582605|item|disp=FHL Book 973 D2r 2009}}; [http://www.americanancestors.org/Product.aspx?id=14829 online bookstore]. *'''[Bennett]''' Bennett, Carmen Taylor. ''The Bennetts, Italy, France, England, Virginia, Georgia, Texas, 1501-1982''. [Lubbock, Texas]: C.T. Bennett, 1982. {{FHL|249296|title-id|disp=FHL FAM HIST Book 929.273 B441b}}. *'''[Bennett]''' Bennett, Carmen Taylor. ''The Bennetts, Italy, France, England, Virginia, Georgia, Texas, 1501-1982''. [Lubbock, Texas]: C.T. Bennett, 1982. {{FHL|249296|title-id|disp=FHL FAM HIST Book 929.273 B441b}}. +*'''[Beverley]''' Meade, William. ''Old Churches, Ministers and Families of Virginia''. 2 vols. Philadelphia: J.B. Lippincott and Co., 1861. Digital versions at Internet Archive: [http://www.archive.org/details/oldchurchesminis01meaduoft Vol. I] and [http://archive.org/details/oldchurchesminis02meaduoft Vol. II] - free. *'''[Beverley]''' Wise, John S. and John McGill. ''Family of Beverley of Beverley''. New York: R.J. Page, Jr., 1890. {{FHL|453465|title-id|disp=FHL US/CAN Film 1454560 Item 42}}; digital version at [http://search.ancestry.com/search/db.aspx?dbid=16943 Ancestry] ($). *'''[Beverley]''' Wise, John S. and John McGill. ''Family of Beverley of Beverley''. New York: R.J. Page, Jr., 1890. {{FHL|453465|title-id|disp=FHL US/CAN Film 1454560 Item 42}}; digital version at [http://search.ancestry.com/search/db.aspx?dbid=16943 Ancestry] ($). −*'''[Beverley]''' Stanard, William G. ''Major Robert Beverley and His Descendants,'' ''The Virginia Magazine of History and Biography'', [http://www.jstor.org/stable/4241849 Vol. 2, No. 4 (Apr. 1895):405-413]; [http://www.jstor.org/stable/4241879 Vol. 3, No. 2 (Oct. 1895):169-176]; [http://www.jstor.org/stable/4241889 Vol. 3, No. 3 (Jan. 1896):261-271]; [http://www.jstor.org/stable/4241920 Vol. 3, No. 4 (Apr. 1896):383-392]. Digitized by JSTOR - free. +*'''[Beverley]''' Stanard, William G. "Major Robert Beverley and His Descendants," ''The Virginia Magazine of History and Biography'', [http://www.jstor.org/stable/4241849 Vol. 2, No. 4 (Apr. 1895):405-413]; [http://www.jstor.org/stable/4241879 Vol. 3, No. 2 (Oct. 1895):169-176]; [http://www.jstor.org/stable/4241889 Vol. 3, No. 3 (Jan. 1896):261-271]; [http://www.jstor.org/stable/4241920 Vol. 3, No. 4 (Apr. 1896):383-392]. Digitized by JSTOR - free. +*'''[Beverley]''' Crozier, William Armstrong. ''Virginia Heraldica: Being a Registry of Virginia Gentry Entitled to Coat Armor, With Genealogical Notes of the Families.'' New York: The Genealogical Association, 1908. Digital version at [http://archive.org/details/virginiaheraldic00croz Internet Archive] - free. +*'''[Beverley]''' Kennedy, Mary Selden. ''Seldens of Virginia and Allied Families''. New York: Frank Allaben Genealogical Co., c1911. Digital versions of Vol. 1 at [http://books.google.com/books?id=X6xRAAAAMAAJ Google Books]; [http://www.archive.org/details/seldensofvirgini01kenn Internet Archive] | Vol. 2 at {{FSbook|96908}};[http://www.archive.org/details/seldensofvirgini00kenn Internet Archive]; {{FHL|29009|item|disp=FHL Book 929.273 Se48k}}. *'''[Beverley]''' McGill, John. ''The Beverley Family of Virginia: Descendants of Major Robert Beverley (1641-1687) and Allied Families''. Columbia, S.C.: R.L. Bryan, 1956. {{FHL|41140|title-id|disp=FHL FAM HIST Book 929.273 B467m}}. *'''[Beverley]''' McGill, John. ''The Beverley Family of Virginia: Descendants of Major Robert Beverley (1641-1687) and Allied Families''. Columbia, S.C.: R.L. Bryan, 1956. {{FHL|41140|title-id|disp=FHL FAM HIST Book 929.273 B467m}}. +*'''[Beverley]''' Tarter, Brent. "Major Robert Beverley (1635-1687)," ''Magazine of Virginia Genealogy,'' Vol. 31, No. 3 (Aug. 1993):163-183. Digital version at [http://search.ancestry.com/search/db.aspx?dbid=6131 Ancestry] ($); {{FHL|478773|item|disp=FHL Book 975.5 B2vs}}. *'''[Blackburn]''' Buford, Marcus Bainbridge. ''A Genealogy of the Buford Family in America, With Records of a Number of Allied Families.'' San Francisco, Calif., 1903. Digital version at [http://archive.org/details/genealogyofbufor00bufo Internet Archive] - free. *'''[Blackburn]''' Buford, Marcus Bainbridge. ''A Genealogy of the Buford Family in America, With Records of a Number of Allied Families.'' San Francisco, Calif., 1903. Digital version at [http://archive.org/details/genealogyofbufor00bufo Internet Archive] - free. *'''[Blake]''' ''Blake Family Records, ca. 1630-1961''. MSS., Microfilmed 1997: {{FHL|769141|title-id|disp=FHL US/CAN Film 2055330 Item 1}}. *'''[Blake]''' ''Blake Family Records, ca. 1630-1961''. MSS., Microfilmed 1997: {{FHL|769141|title-id|disp=FHL US/CAN Film 2055330 Item 1}}. +*'''[Blakey]''' Perkinson, Pat. "'Ancestor' Search Covers Six States," ''Virginia Genealogical Society Quarterly'', Vol. 2, No. 4 (Oct. 1964):71. Digital version at [http://search.ancestry.com/search/db.aspx?dbid=6131 Ancestry] ($). *'''[Blakey]''' Blakey, Bernard Buckner. ''A Blakey Book: Being an Account of Those Believed to be Descended from Thomas and Susannah Blakey of Christ Church Parish, Middlesex County, Virginia''. Little Falls, Minn.: Blakey, 1977. {{FHL|163376|title-id|disp=FHL FAM HIST Book 929.273 B587a}}. *'''[Blakey]''' Blakey, Bernard Buckner. ''A Blakey Book: Being an Account of Those Believed to be Descended from Thomas and Susannah Blakey of Christ Church Parish, Middlesex County, Virginia''. Little Falls, Minn.: Blakey, 1977. {{FHL|163376|title-id|disp=FHL FAM HIST Book 929.273 B587a}}. *'''[Bond]''' Heinegg, Paul. ''Free African Americans of Virginia, North Carolina, South Carolina, Maryland and Delaware.'' 2005-present. - [http://www.freeafricanamericans.com/Virginia_NC.htm free online book]. *'''[Bond]''' Heinegg, Paul. ''Free African Americans of Virginia, North Carolina, South Carolina, Maryland and Delaware.'' 2005-present. - [http://www.freeafricanamericans.com/Virginia_NC.htm free online book]. +*'''[Brent]''' Faris, David. ''Plantagenet Ancestry of Seventeenth-century Colonists.'' Boston, Mass.: New England Historic Genealogical Society, 1999. {{FHL|988479|item|disp=FHL Book 973 D2fp 1999}}; digital version of 1996 edition at [http://search.ancestry.com/search/db.aspx?dbid=49297 Ancestry] ($). +*'''[Brewer]''' Broyhill, Marvin T. ''The Brewer Families of Colonial Virginia, 1626-1776.'' Estill Springs, Tenn.: Brewer Researcher, 1994. 1992 edition and supplements have been digitized: {{FHL|582692|item|disp=FamilySearch Books Online}} - free. *'''[Bristow]''' Bristow, Emmet Albyon (b. 1886). ''Descendants of John Bristow of Middlesex County, Virginia and William Bristow of Orange and Randolph counties, North Carolina, 1650-1919''. Donated 1971. Digital version at [[Virginia Historical Society]]. *'''[Bristow]''' Bristow, Emmet Albyon (b. 1886). ''Descendants of John Bristow of Middlesex County, Virginia and William Bristow of Orange and Randolph counties, North Carolina, 1650-1919''. Donated 1971. Digital version at [[Virginia Historical Society]]. *'''[Bristow]''' Woolley, Gordon Byron. ''John Bristow of Middlesex County, Virginia and Descendants through Ten Generations''. New York: Vantage Press, 1969. {{FHL|1411035|title-id|disp=FHL FAM HIST Book 929.273 B776w}}. *'''[Bristow]''' Woolley, Gordon Byron. ''John Bristow of Middlesex County, Virginia and Descendants through Ten Generations''. New York: Vantage Press, 1969. {{FHL|1411035|title-id|disp=FHL FAM HIST Book 929.273 B776w}}. *'''[Bristow]''' Bristow, Andrew Mercer. ''Genealogical Chart of the Bristow Family in Middlesex, King & Queen and Gloucester counties, Va.'' ca. 1980. Available at [[Virginia Historical Society]]. *'''[Bristow]''' Bristow, Andrew Mercer. ''Genealogical Chart of the Bristow Family in Middlesex, King & Queen and Gloucester counties, Va.'' ca. 1980. Available at [[Virginia Historical Society]]. *'''[Bristow]''' Mahaffey, Nola Egle. ''Bristow Gleanings''. [Palm Bay, Florida]: N. Mahaffey, 1992. {{FHL|532136|title-id|disp=FHL FAM HIST Book 929.273 B776m}}. *'''[Bristow]''' Mahaffey, Nola Egle. ''Bristow Gleanings''. [Palm Bay, Florida]: N. Mahaffey, 1992. {{FHL|532136|title-id|disp=FHL FAM HIST Book 929.273 B776m}}. +*'''[Brown]''' The Colonial Dames of America. ''Ancestral Records and Portraits,'' 2 vols. New York: The Grafton Press Publishers, 1910. Digitized by Internet Archive: [http://archive.org/details/cu31924092885304 Vol. I] and [http://archive.org/details/cu31924092885312 Vol. II] - both free. *'''[Brown]''' Lightburn, Faye Marie Brown. ''Revolutionary Soldier, Samuel Brown, and Some of His Family: From Middlesex County, Virginia to the Sacramento Valley of California''. Baltimore, Md.: Gateway Press, 1993. {{FHL|399149|title-id|disp=FHL FAM HIST Book 929.273 B815Lf}}. *'''[Brown]''' Lightburn, Faye Marie Brown. ''Revolutionary Soldier, Samuel Brown, and Some of His Family: From Middlesex County, Virginia to the Sacramento Valley of California''. Baltimore, Md.: Gateway Press, 1993. {{FHL|399149|title-id|disp=FHL FAM HIST Book 929.273 B815Lf}}. *'''[Buford]''' Buford, Marcus Bainbridge. ''A Genealogy of the Buford Family in America, With Records of a Number of Allied Families.'' San Francisco, Calif., 1903. Digital version at [http://archive.org/details/genealogyofbufor00bufo Internet Archive] - free. *'''[Buford]''' Buford, Marcus Bainbridge. ''A Genealogy of the Buford Family in America, With Records of a Number of Allied Families.'' San Francisco, Calif., 1903. Digital version at [http://archive.org/details/genealogyofbufor00bufo Internet Archive] - free. Line 68:
*'''[Burk]''' Johnson, Patricia Givens. ''Irish Burks of Colonial Virginia and New River.'' Blacksburg, Va.: Walpa Publishing, 1992. {{FHL|699771|item|disp=FHL Book 929.273 B917j}}. *'''[Burk]''' Johnson, Patricia Givens. ''Irish Burks of Colonial Virginia and New River.'' Blacksburg, Va.: Walpa Publishing, 1992. {{FHL|699771|item|disp=FHL Book 929.273 B917j}}. *'''[Burk]''' Greever, Kathryn Burke. ''Some Descendants of John Burk, 1656-1699, Middlesex County, VA.'' Athens, Ga.: Iberian Pub. Co., 1999. {{FHL|834157|title-id|disp=FHL FAM HIST Book 929.273 B917g}} *'''[Burk]''' Greever, Kathryn Burke. ''Some Descendants of John Burk, 1656-1699, Middlesex County, VA.'' Athens, Ga.: Iberian Pub. Co., 1999. {{FHL|834157|title-id|disp=FHL FAM HIST Book 929.273 B917g}} +*'''[Burnham]''' Richardson, Douglas and Kimball G. Everingham. ''Plantagenet Ancestry: A Study in Colonial and Medieval Families.'' Baltimore, Md.: Genealogical Publishing Company, 2004. {{FHL|1170369|item|disp=FHL Book 942 D5rd}}; 2011 edition (3 vols.): {{FHL|2039820|item|disp=FHL Book 942 D5rd 2011 v. 1-3}}; [http://www.royalancestry.net/index.html online bookstore]. +*'''[Burnham]''' Richardson, Douglas and Kimball G. Everingham. ''Magna Carta Ancestry: A Study in Colonial and Medieval Families.'' Baltimore, Md.: Genealogical Publishing Company, 2005. {{FHL|1234252|item|disp=FHL Book 942 D5rdm}}. *'''[Burwell]''' Heinegg, Paul. ''Free African Americans of Virginia, North Carolina, South Carolina, Maryland and Delaware.'' 2005-present. - [http://www.freeafricanamericans.com/Virginia_NC.htm free online book]. *'''[Burwell]''' Heinegg, Paul. ''Free African Americans of Virginia, North Carolina, South Carolina, Maryland and Delaware.'' 2005-present. - [http://www.freeafricanamericans.com/Virginia_NC.htm free online book]. *{{Anchor|C}}'''[Cassidy]''' Heinegg, Paul. ''Free African Americans of Virginia, North Carolina, South Carolina, Maryland and Delaware.'' 2005-present. - [http://www.freeafricanamericans.com/Virginia_NC.htm free online book]. *{{Anchor|C}}'''[Cassidy]''' Heinegg, Paul. ''Free African Americans of Virginia, North Carolina, South Carolina, Maryland and Delaware.'' 2005-present. - [http://www.freeafricanamericans.com/Virginia_NC.htm free online book]. *'''[Cary]''' Harrison, Fairfax. ''The Virginia Carys''. New York: De Vinne Press, 1919. Digital version at [http://archive.org/details/virginiacarysan01harrgoog Internet Archive] - free; {{FHL|126773|item|disp=FHL Film 1011836 Item 3}}. *'''[Cary]''' Harrison, Fairfax. ''The Virginia Carys''. New York: De Vinne Press, 1919. Digital version at [http://archive.org/details/virginiacarysan01harrgoog Internet Archive] - free; {{FHL|126773|item|disp=FHL Film 1011836 Item 3}}. +*'''[Catlett]''' Amundson, Margaret R. "Who Was the Catlett Father of Mary Haslewood's Children?" ''The Virginia Genealogist,'' Vol. 43, No. 3 (Jul.-Sep. 1999):163-172. Digital version at [http://www.americanancestors.org/search.aspx?Ca=098&Da=285 American Ancestors] ($). {{FHL|33159|item|disp=FHL Book 975.5 B2vg}}. *'''[Chancellor]''' Chancellor, Johnson Camden. ''The Chancellors''. Odessa, Texas: West Texas Office Supply, 1963. {{FHL|203550|item|disp=FHL Book 929.273 C36c}}. *'''[Chancellor]''' Chancellor, Johnson Camden. ''The Chancellors''. Odessa, Texas: West Texas Office Supply, 1963. {{FHL|203550|item|disp=FHL Book 929.273 C36c}}. *'''[Chapman]''' Heinegg, Paul. ''Free African Americans of Virginia, North Carolina, South Carolina, Maryland and Delaware.'' 2005-present. - [http://www.freeafricanamericans.com/Virginia_NC.htm free online book]. *'''[Chapman]''' Heinegg, Paul. ''Free African Americans of Virginia, North Carolina, South Carolina, Maryland and Delaware.'' 2005-present. - [http://www.freeafricanamericans.com/Virginia_NC.htm free online book]. *'''[Chavis]''' Heinegg, Paul. ''Free African Americans of Virginia, North Carolina, South Carolina, Maryland and Delaware.'' 2005-present. - [http://www.freeafricanamericans.com/Virginia_NC.htm free online book]. *'''[Chavis]''' Heinegg, Paul. ''Free African Americans of Virginia, North Carolina, South Carolina, Maryland and Delaware.'' 2005-present. - [http://www.freeafricanamericans.com/Virginia_NC.htm free online book]. +*'''[Cheney]''' Brayton, John Anderson. "The Warwick Family of Middlesex Co., Va.," ''The Virginia Genealogist,'' Vol. 47, No. 3 (Jul.-Sep. 2003):198-214. Digital version at [http://www.americanancestors.org/Search.aspx?Ca=098&Da=285 American Ancestors] ($). +*'''[Chichely]''' Meade, William. ''Old Churches, Ministers and Families of Virginia''. 2 vols. Philadelphia: J.B. Lippincott and Co.,

value: This website is a nonprofit organization and website offering genealogical records, education, and software. It is operated by The Church of Jesus Christ of Latter-day Saints , and is closely connected with the church's Family History Department.


text:
Belatedly, the Riddle of an Attack on Rather Is Solved - The New York Times
Archives|Belatedly, the Riddle of an Attack on Rather Is Solved
Belatedly, the Riddle of an Attack on Rather Is Solved
By FRANK BRUNI JAN. 30, 1997
Mr. Tager's lawyer, John Esposito, did not return a phone call to his office last night, but has said he is not convinced his client attacked Mr. Rather.
When Mr. Tager was arrested for the fatal shooting, he claimed responsibility for the attack against Mr. Rather as well, but the authorities did not investigate it, because the five-year statute of limitations had expired. But Dr. Dietz wanted to determine if Mr. Tager was lying about the attack against Mr. Rather on the Upper East Side. So, last year, he contacted Mr. Rather to see if Mr. Rather's memories of the crime matched Mr. Tager's.
Dr. Dietz said there were certain details about the building in which part of the attack occurred that both Mr. Rather and Mr. Tager recalled identically. On Tuesday, Mr. Rather looked at photographs of Mr. Tager provided to him by The Daily News and identified Mr. Tager as his attacker.
After the attack in 1986, Mr. Rather's critics lumped the incident together with a subsequent episode in which Mr. Rather stomped off the set, leaving the network with dead air time, as signs that he was losing his cool.
But as time passed, Mr. Rather came to make light of the incident himself, even singing along with R.E.M. during a performance of their song ''What's the Frequency, Kenneth?'' on David Letterman's show two years ago.
A version of this article appears in print on January 30, 1997, on Page B00003 of the National edition with the headline: Belatedly, the Riddle of an Attack on Rather Is Solved. Order Reprints| Today's Paper|Subscribe

value: This website is an American daily newspaper based in New York City with a worldwide readership. Founded in 1851, the Times has since won 132 Pulitzer Prizes, the most of any newspaper, and has long been regarded within the industry as a national "newspaper of record".


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Words containing agribusi | Words that contain agribusi
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text:
5 D.C. MEN ACQUITTED IN DRUG-RELATED SLAYING - The Washington Post
5 D.C. MEN ACQUITTED IN DRUG-RELATED SLAYING
By Michael York February 27, 1988
A D.C. Superior Court jury yesterday acquitted five District men of first-degree murder in a drug-related 1986 slaying at the Mayfair apartment complex in far Northeast Washington, but convicted them of conspiracy to distribute cocaine and other charges.
Judge Reggie Walton revoked the bonds of three defendants who had been free on bail. "Maybe one day somebody will sell drugs to his child, and he'll see how it feels," Walton told a defense attorney, who had argued that his client just became a father. "There's a cancer eating up this city, and it's called drugs. And it's people like your client that is causing it."
The five men -- Ernest T. Minder, 24; James Cowan, 19; Tony Adams, 22; Gary Gordon, 21, and David Belton, 19 -- also were convicted of attempted cocaine distribution and assault with a deadly weapon. They face possible sentences of six years and eight months to 20 years. Cowan, who was convicted of an additional charge of carrying a pistol without a license, could be sentenced to an additional year.
All five men face first-degree murder charges in another 1986 slaying at the Mayfair complex -- the Nov. 20 killing of Anthony Knox, 33.
At the start of the trial four weeks ago, prosecutor Charles Cobb said the case represented a microcosm of the District's drug-related crime epidemic. He said the U.S. attorney's office had decided to attack a drug organization by charging each of the men with murder even though only one of the five could have carried out the shooting.
The apartment complex was well-known among narcotics officers as a clearing house for illegal drugs. Witnesses testified that the men -- dubbed "the Committee" by Cobb -- regularly earned more than $25,000 a day from the sale of $25 bags of crack, a powerful cocaine derivative.
The case stemmed from the Nov. 3, 1986, killing of Kevin Maxwell Dozier, 29, in the 3500 block of Hayes Street NE during what was described as a drug deal. Police said the slaying occurred near a crack house operated by the five men.
The defendants were identified by "street" names. Witnesses described Adams as "Fats," and Cobb told the jurors that Adams and Minder, known as "Erno," were the masterminds of the organization. "Erno brought the guns and the cocaine in, and Fats cooked the cocaine," said Cobb, referring to the process of preparing crack.
Cobb said that Belton, known as "Big Dave," and Gordon, identified as "Gooey," delivered the drugs and provided security. Cowan, known as "Wop," provided security and was one of two gunmen who shot Dozier, Cobb said.
Charles C. White, the jury foreman, said after the verdict that the jurors had trouble believing the testimony of Sammy Giles, a 17-year-old youth who pleaded guilty to two charges of second-degree murder and agreed to testify against his former friends. Giles testified that he was not alone in firing shots. White said there was not enough evidence to prove who fired the fatal shot.

value: This website is an American daily newspaper published in Washington, D.C. It is the most-widely circulated newspaper within the Washington metropolitan area, and has a large national audience. Daily broadsheet editions are printed for D.C., Maryland, and Virginia.


text:
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value: This website is a Dutch online travel agency for lodging reservations & other travel products, and a subsidiary of Booking Holdings. It is headquartered in Amsterdam.The website has over 28 million listings.


text:
Patent US6608385 - Contact structure and production method thereof and probe contact assembly ... - Google Patents
A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors. The contactor has an upper end oriented in a vertical direction, a straight beam portion oriented in a direction opposite to the upper...http://www.google.com/patents/US6608385?utm_source=gb-gplus-sharePatent US6608385 - Contact structure and production method thereof and probe contact assembly using same
Publication number US6608385 B2
Application number US 09/954,333
Also published as US6750136, US20020048954, US20030173661, WO2003025588A1
Publication number 09954333, 954333, US 6608385 B2, US 6608385B2, US-B2-6608385, US6608385 B2, US6608385B2
Inventors Yu Zhou, David Yu, Robert Edward Aldaz, Theodore A. Khoury
Patent Citations (8), Referenced by (6), Classifications (64), Legal Events (4)
Contact structure and production method thereof and probe contact assembly using same
US 6608385 B2
A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors. The contactor has an upper end oriented in a vertical direction, a straight beam portion oriented in a direction opposite to the upper end and having a lower end which functions as a contact point for electrical connection with a contact target, a return portion returned from the lower end and running in parallel with the straight beam portion to create a predetermined gap therebetween, a diagonal beam portion provided between the upper end and the straight beam portion to function as a spring.
a plurality of contactors made of conductive material where each of the contactors is comprised of an upper end oriented in a vertical direction, a straight beam portion oriented in a direction opposite to the upper end and having a lower end which functions as a contact point for electrical connection with a contact target, a return portion returned from the lower end and running in parallel with the straight beam portion to create a predetermined gap therebetween, a diagonal beam portion provided between the upper end and the straight beam portion to function as a spring; and
wherein said upper end of each contactor is projected from said upper surface of said contactor carrier and said lower end of each contactor is projected from said lower surface of said contactor carrier.
2. A contact structure for establishing electrical connection with contact targets as defined in claim 1, wherein the contactor carrier further includes a top carrier having said upper surface thereon, a bottom carrier having said lower surface thereon, and an intermediate carrier provided between the top carrier and the bottom carrier.
3. A contact structure for establishing electrical connection with contact targets as defined in claim 2, wherein the contactor carrier includes a system carrier for supporting the top carrier, the intermediate carrier and the bottom carrier.
4. A contact structure for establishing electrical connection with contact targets as defined in claim 2, wherein each of the top carrier, the intermediate carrier and the bottom carrier is provided with through holes for mounting the contactors therethrough.
5. A contact structure for establishing electrical connection with contact targets as defined in claim 2, wherein each of the top carrier, the intermediate carrier and the bottom carrier has a plate like shape and is provided with through holes for mounting the contactors therethrough.
6. A contact structure for establishing electrical connection with contact targets as defined in claim 1, wherein said diagonal beam portion and said straight beam portion of the contactor have a width smaller than that of the upper end or the lower end of the contactor.
7. A contact structure for establishing electrical connection with contact targets as defined in claim 1, wherein said contactor is provided with a first stopper for limiting an upward displacement of the contactor by engaging with the top carrier and a second stopper for limiting a downward displacement of the contactor by engaging with the intermediate carrier.
8. A contact structure for establishing electrical connection with contact targets as defined in claim 1, wherein the contactor carrier is made of dielectric material including silicon, polyimide, ceramic or glass.
9. A probe contact assembly for establishing electrical connection with contact targets, comprising:
a probe card for mounting the contactor carrier and establishing electrical communication between the contactors and electrodes provided on the probe card; and
a pin block having a plurality of contact pins to interface between the probe card and a semiconductor test system when the pin block is attached to the probe card;
wherein each of the contactors is comprised of an upper end oriented in a vertical direction, a straight beam portion oriented in a direction opposite to the upper end and having a lower end which functions as a contact point for electrical connection with a contact target, a return portion returned from the lower end and running in parallel with the straight beam portion to create a predetermined gap therebetween, a diagonal beam portion provided between the upper end and the straight beam portion to function as a spring.
10. A probe contact assembly for establishing electrical connection with contact targets as defined in claim 9, wherein the contactor carrier has an upper surface and a lower surface for mounting said plurality of contactors, and wherein said upper end of each contactor is projected from said upper surface of said contactor carrier and said lower end of each contactor is projected from said lower surface of said contactor carrier.
11. A probe contact assembly for establishing electrical connection with contact targets as defined in claim 9, wherein the contactor carrier includes a top carrier having said upper surface thereon, a bottom carrier having said lower surface thereon, and an intermediate carrier provided between the top carrier and the bottom carrier.
12. A probe contact assembly for establishing electrical connection with contact targets as defined in claim 11, wherein the contactor carrier further includes a system carrier for supporting the top carrier, the intermediate carrier and the bottom carrier.
13. A probe contact assembly for establishing electrical connection with contact targets as defined in claim 11, wherein each of the top carrier, the intermediate carrier and the bottom carrier is provided with through holes for mounting the contactors therethrough.
14. A probe contact assembly for establishing electrical connection with contact targets as defined in claim 9, wherein said diagonal beam portion and said straight beam portion of the contactor have a width smaller than that of the upper end or the lower end of the contactor.
15. A probe contact assembly for establishing electrical connection with contact targets as defined in claim 9, wherein said contactor is provided with a first stopper for limiting an upward displacement of the contactor by engaging with the top carrier and a second stopper for limiting a downward displacement of the contactor by engaging with the intermediate carrier.
This is a continuation-in-part of patent application Ser. No. 09/201,299 filed Nov. 30, 1998 now U.S. Pat. No. 6,297,164, patent application Ser. No. 09/503,903 filed Feb. 14, 2000, and patent application Ser. No. 09/733,508 filed Dec. 9, 2000 now U.S. Pat. No. 6,471,538.
FIG. 3 is a bottom view of the probe card 170 of FIG. 2. In this example, the probe card 170 has an epoxy ring on which a plurality of probe contactors 190 called needles or cantilevers are mounted. When the chuck 180 mounting the semiconductor wafer 300 moves upward in FIG. 2, the tips of the needles 190 contact the pads or bumps (contact targets) on the wafer 300. The ends of the needles 190 are connected to wires 194 which are further connected to transmission lines (not shown) formed on the probe card 170. The transmission lines are connected to a plurality of electrodes (contact pads) 197 which are in communication with the pogo pins 141 of FIG. 2.
Typically, the probe card 170 is structured by a multilayer of polyimide substrates having ground planes, power planes, signal transmission lines on many layers. As is well known in the art, each of the signal transmission lines is designed to have a characteristic impedance such as 50 ohms by balancing the distributed parameters, i.e., dielectric constant and magnetic permeability of the polyimide, inductances and capacitances of the signal paths within the probe card 170. Thus, the signal lines are impedance matched establishing a high frequency transmission bandwidth to the wafer 300 for supplying currents in a steady state as well as high current peaks generated by the device's outputs switching in a transient state. For removing noise, capacitors 193 and 195 are provided on the probe card between the power and ground planes.
It is another object of the present invention to provide a contact structure such as a probe card for use in testing semiconductor devices and the like which has a very high frequency bandwidth to meet the test requirements in the next generation semiconductor test technology.
In the present invention, a contact structure is formed of a large number of contactors produced on a planar surface of a dielectric substrate such as a silicon substrate by a photolithography technology. The contact structure of the present invention is advantageously applied to testing and burning-in semiconductor devices, such as LSI and VLSI chips, semiconductor wafers and dice, packaged ICs, printed circuit boards and the like. The contact structure of the present invention can also be used as components of electronics devices such as IC leads and pins.
The first aspect of the present invention is a contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors. The contactor has an upper end oriented in a vertical direction, a straight beam portion oriented in a direction opposite to the upper end and having a lower end which functions as a contact point for electrical connection with a contact target, a return portion returned from the lower end and running in parallel with the straight beam portion to create a predetermined gap therebetween, a diagonal beam portion provided between the upper end and the straight beam portion to function as a spring.
(e) forming the contactors made of conductive material in the patterns on the photoresist layer by depositing the conductive material; each of the contactors having an upper end, a straight beam portion oriented with a lower end as a contact point, a return portion to create a predetermined gap with the straight beam portion, and a diagonal beam portion provided between the upper end and the straight beam portion to function as a spring;
(h) mounting the contactors on a contactor carrier having through holes to receive the contactors therein.
A further aspect of the second present invention is a probe contact assembly including the contact structure of the present invention. The probe contact assembly is formed of a contactor carrier having a plurality of contactors mounted on a surface thereof, a probe card for mounting the contactor carrier and establishing electrical communication between the contactors and electrodes provided on the probe card, and a pin block having a plurality of contact pins to interface between the probe card and a semiconductor test system when the pin block is attached to the probe card. Each contactor has a structure as described above with respect to the first aspect of the present invention.
FIG. 3 is a bottom view showing an example of the probe card having an epoxy ring for mounting a plurality of probe contactors in the conventional technology.
FIGS. 7A and 7B are diagrams showing details of the contactor of the present invention wherein FIG. 7A is a front view of the contactor when no pressure is applied thereto and FIG. 7B is a front view of the contactor when it is pressed against the contact target.
FIGS. 10A-10N are schematic diagrams showing an example of process for producing the contactors of the present invention on the surface of a substrate and transferring the contactors to an intermediate plate.
FIGS. 11A and 11B are schematic diagrams showing an example of pick and place mechanism and its process for picking the contactors and placing the same on a contactor carrier to produce the contact structure of the present invention.
FIG. 12 is a cross sectional view showing an example of probe contact assembly using the contact structure of the present invention for use between a semiconductor device under test and a test head of a semiconductor test system.
FIG. 13 is a cross sectional view showing another example of probe contact assembly using the contact structure of the present invention for use as an interface between the semiconductor device under test and a test head of the semiconductor test system.
The present invention will now be explained in detail with reference to FIGS. 5-13. It should be noted that the description of the present invention includes such terms as “horizontal” and “vertical”. The inventors use these terms to describe relative positional relationship of the components associated with the present invention. Therefore, the interpretation of the terms “horizontal” and “vertical” should not be limited to absolute meanings such as an earth horizontal or gravity vertical.
FIG. 5 shows an example of contact structure of the present invention. The contact structure is configured by a contactor carrier 20 and contactors 30. In an application of semiconductor test, the contact structure is positioned, for example, over a semiconductor device such as a silicon wafer 300 to be tested. When the silicon wafer 300 is moved upward, the lower ends of the contactors 30 contact with contact pads 320 on the semiconductor wafer 300 to establish electrical communication therebetween.
In this example, the contactor carrier 20 is comprised of a system carrier 22, a top plate carrier 24, an intermediate plate carrier 26, and a bottom plate carrier 28. The contactor carrier 20 is made of dielectric material such as silicon, polyimide, ceramic or glass. The system carrier 22 supports the top, intermediate, and bottom plate carriers with predetermined space therebetween. The top plate carrier 24, the intermediate plate carrier 26 and the bottom plate carrier 28 respectively have through holes for mounting the contactors 30.
In FIG. 5, each contactor 30 has a cantilever like shape as a whole which is composed of an upper end (base portion) 33, a diagonal beam (spring) portion 32, a straight beam portion 36, a lower end (contact portion) 35 and a return portion 37. Preferably, stoppers 34 and 38 are provided to each contactor 30 to securely mount the contactor 30 on the contactor carrier 20. Namely, the stopper 38 limits the upward movement of the contactor 30 by engaging with the upper plate carrier 24 and the stopper 34 limits the downward movement of the contactor 30 by engaging with the intermediate plate carrier 26.
The diagonal beam portion 32 diagonally extends between the upper end 33 and the straight beam portion 36. The straight beam portion 36 extends downwardly between the diagonal beam portion 32 and the lower end 35. The upper end 33 and the lower end 35 function as contact points to establish electrical communication with other components. In the semiconductor test application, the upper end 33 functions to contact with a probe card of the test system and the lower end 35 functions to contact with a contact target such as the contact pad 320 on the semiconductor wafer 300.
The return portion 37 runs upwardly from the lower end 35 in parallel with the straight beam portion 36. In other words, the return portion 37 and the straight beam portion 36 constitute a space (gap) S therebetween at about a position inserted in the through hole of the bottom plate carrier 28. This structure ensures a sufficient width with respect to the through holes on the bottom plate carrier 28 and allows flexibility when deforming the contactor 30. This is effective when the contactor is pressed against the contact target, which will be further explained later with reference to FIGS. 7A and 7B.
The contactors 30 are mounted on the contactor carrier 20 via the through holes provided therein. In this example, the top plate carrier 24, the intermediate plate carrier 26 and the bottom plate carrier 28 respectively include through holes to receive the contactors 30 therein. The upper end 33 is projected from the upper surface of the top plate carrier 24 and the lower end 35 is projected from the lower surface of the bottom plate carrier 28. The middle portion of the contactor 30 may be loosely coupled to the intermediate plate carrier 26 so that the contactor 30 is movable when the contact structure is pressed against a contact target, such as the contact pad 320 on the semiconductor wafer 300.
The diagonal beam (spring) portion 32 of the contactor 30 functions as a spring to produce a resilient force when the upper end 33 contact the probe card and the lower end 35 is pressed against the contact target. The lower end (contact point) 35 of the contactor 30 is preferably sharpened to be able to scrub the surface of the contact pad 320. The resilient force promotes such a scrubbing effect at the lower end 35 against the surface of contact pad 320. The scrubbing effect promotes an improved contact performance when the contact point scrubs the metal oxide surface layer of the contact pad 320 to electrically contact the conductive material of the contact pad 320 under the metal oxide surface layer.
FIGS. 6A-6B show basic concepts of the present invention for producing such contactors. In the present invention, as shown in FIG. 6A, the contactors 30 are produced on a planar surface of a substrate 40 in a horizontal direction, i.e., in parallel with a planar surface of the substrate 40. In other words, the contactors 30 are built in a two dimensional manner on the substrate 40. Then, the contactors 30 are removed from the substrate 40 to be mounted on the contactor carrier 20 shown in FIG. 5 in a vertical direction, i.e., in a three dimensional manner. Typically, the substrate 40 is a silicon substrate although other dielectric substrates are also feasible.
In the example of FIGS. 6A and 6B, as noted above, the contactors 30 are produced on the planar surface of the substrate 40 in the horizontal direction. Then, in FIG. 6B, the contactors 30 are transferred from the substrate 40 to an adhesive member 90, such as an adhesive tape, adhesive film or adhesive plate (collectively “adhesive tape”). In the further process, the contactors 30 on the adhesive tape 90 are removed therefrom to be mounted on the contactor carrier 20 of FIG. 5 in a vertical direction, i.e., in a three dimensional manner with use, for example, of a pick and place mechanism.
FIGS. 7A and 7B show more details of the contactor 30 of the present invention. FIG. 7A is a front view of the contactor 30 when no pressure is provided thereto, and FIG. 7B is a front view of the contactor 30 when the pressure is applied to the contact structure by being pressed against the contact target. FIG. 7A also shows an example of dimensions at each portion of the contactor 30. As noted above with reference to FIG. 5, the contactor 30 of FIGS. 7A and 7B has the upper end (base portion) 33, the diagonal beam (spring) portion 32, the straight beam portion 36, the lower end (contact portion) 35 and the return portion 37. The stopper 38 is provided to the upper end 33 and the stopper 34 is provided to the intermediate portion of the contactor 30.
In the semiconductor test application, the upper end 33 contacts with a probe card of the test system such as shown in FIG. 12 and the lower end 35 contacts with the contact target such as a semiconductor wafer under test. When mounted on the contactor carrier 20 of FIG. 5, the upper end 33 is projected from the upper surface of top plate carrier 24 of the contactor carrier 20 and the lower end 35 is projected from the lower surface of bottom plate carrier 28 of the contactor carrier 20.
In the front view of FIG. 7A, the diagonal beam portion 32 and the straight beam portion 36 preferably have a width which smaller than that of the upper end 33 or the lower end 35 to promote the spring actions. The space (gap) S between the return portion 37 and the straight beam portion 36 further promotes the spring actions as shown in FIG. 7B. Namely, the space S allows the horizontal movements of the straight beam portion 36 and the diagonal beam portion 32 in the manner shown in FIG. 7B. Because of the reduced width and of the beams portions 32 and 36 and the space S formed at the lower end 35, the diagonal beam portion 32 and the straight beam portion 36 easily deform when the contactor 30 is pressed between the probe card and the contact target. An example of sizes in the contactor 30 of FIG. 7 is: a=400 μm, b=1100 μm, c=50 μm, d=50 μm, e=140 μm, f=900 μm, and g=1600 μm.
In the next process, a photoresist layer 48 is formed on the conductive layer 46 over which a photo mask 50 is precisely aligned to be exposed with ultraviolet (UV) light as shown in FIG. 8D. The photo mask 50 shows a two dimensional image of the contactor 30 which will be developed on the photoresist layer 48. As is well known in the art, positive as well as negative photoresist can be used for this purpose. If a positive acting resist is used, the photoresist covered by the opaque portions of the mask 50 hardens (cure) after the exposure. Examples of photoresist material include Novolak (M-Cresolformaldehyde), PMMA (Poly Methyl Methacrylate), SU-8 and photo sensitive polyimide. In the development process, the exposed part of the resist can be dissolved and washed away, leaving a photoresist layer 48 of FIG. 8E having an opening or pattern “A”. Thus, the top view of FIG. 8F shows the pattern or opening “A” on the photoresist layer 48 having the image (shape) of the contactor 30.
The above noted process may be repeated for producing contactors having different thickness by forming two or more conductive layers. For example, a certain portion of the contactor 30 may be designed to have a thickness larger than that of the other portions. In such a case, after forming a first layer of the contactors (conductive material), if necessary, the processes of FIGS. 8D-8H will be repeated to form a second layer or further layers on the first layer of the contactors.
In the next process, the photoresist layer 48 is removed in a resist stripping process as shown in FIG. 8I. Typically, the photoresist layer 48 is removed by wet chemical processing. Other examples of stripping are acetone-based stripping and plasma O2 stripping. In FIG. 8J, the sacrificial layer 42 is etched away so that the contactor 30 is separated from the silicon substrate 40. Another etching process is conducted so that the adhesion promoter layer 44 and the conductive layer 46 are removed from the contactor 30 as shown in FIG. 8K.
FIGS. 9A-9D are schematic diagrams showing an example of production process for producing the contactors of the present invention. In the this example, an adhesive tape 90 is incorporated in the production process to transfer the contactors 30 from the silicon substrate 40 to the adhesive tape. FIGS. 9A-9D only show the latter part of the production process in which the adhesive tape 90 is involved.
FIG. 9A shows a process which is equivalent to the process shown in FIG. 8I where the photoresist layer 48 is removed in the resist stripping process. Then, also in the process of FIG. 9A, an adhesive tape 90 is placed on an upper surface of the contactor 30 so that the contactor 30 adheres to the adhesive tape 90. As noted above with reference to FIG. 6B, within the context of the present invention, the adhesive tape 90 includes other types of adhesive member, such as an adhesive film and adhesive plate, and the like. The adhesive tape 90 also includes any member which attracts the contactor 30 such as a magnetic plate or tape, an electrically charged plate or tape, and the like.
FIGS. 10A-10N are schematic diagrams showing a further example of production process for producing the contactor 30 where the contactors are transferred to the adhesive tape. In FIG. 10A, an electroplate seed (conductive) layer 342 is formed on a substrate 340 which is typically a silicon or glass substrate. The seed layer 342 is made, for example, of copper (Cu) or nickel (Ni), with a thickness of about 1,000-5,000 angstrom, for example. A chrome-inconel layer 344 is formed on the seed layer 342 as shown in FIG. 10B through, for example, a sputtering process.
FIG. 10K shows a process in which an adhesive tape 90 is placed on an upper surface of the contactors 30. The adhesive strength between the adhesive tape 90 and the contactors 30 is greater than that between the contactors 30 and the conductive substrate 346. Thus, when the adhesive tape 90 is removed from the conductive substrate 346, the contactors 30 are transferred from the conductive substrate 346 to the adhesive tape 90 as shown in FIG. 10L. FIG. 10M shows a top view of the adhesive tape 90 having the contactors 30 thereon and FIG. 10N is a cross sectional view of the adhesive tape 90 having the contactors 30 thereon.
FIGS. 11A and 11B are schematic diagrams showing an example of process for picking the contactors 30 from the adhesive tape 90 and placing the contactors on the contactor carrier 20. The pick and place mechanism of FIGS. 11A and 11B is advantageously applied to the contactors produced by the production process of the present invention described with reference to FIGS. 9A-9D and FIGS. 10A-10N involving the adhesive tape. FIG. 11A is a front view of the pick and place mechanism 80 showing the first half process of the pick and place operation. FIG. 11B is a front view of the pick and place mechanism 80 showing the second half process of the pick and place operation.
In operation, the adhesive tape 90 having the contactors 30 and the contactor carrier 20 having the bonding locations 32 (or through holes) are positioned on the respective tables 81 and 82 on the pick and place mechanism 80. As shown in FIG. 11A, the transfer mechanism 80 picks the contactor 30 from the adhesive tape 90 by suction force of the suction arm 85. After picking the contactor 30, the suction arm 85 rotates by 90 degrees, for example, as shown in FIG. 11B. Thus, the orientation of the contactor 30 is changed from the horizontal direction to the vertical direction. This orientation change mechanism is just an example, and a person skilled in the art knows that there are many other ways to change the orientation of the contactors. The transfer mechanism 80 then places the contactor 30 on the contactor carrier 20. The contactor 30 is attached to the contactor carrier 20 when inserted in the through holes.
FIG. 12 is a cross sectional view showing an example of total stack-up structure for forming a probe contact assembly using the contact structure of the present invention. The probe contact assembly is used as an interface between the device under test (DUT) and the test head of the semiconductor test system such as shown in FIG. 2. In this example, the probe contact assembly includes a routing board (probe card) 260, and a pogo-pin block (frog ring) 130 provided over the contact structure in the order shown in FIG. 12.
The contact structure is configured by a plurality of contactors 30 mounted on the contactor carrier 20. The upper end (base portion) 33 of each of the contactors 30 is projected at the upper surface of the contactor carrier 20. The lower end (contact portion) 35 is projected from the lower surface of the contactor carrier 20. In the present invention, the diagonal beam (spring) portion 32 between the upper end 33 and the intermediate portion has a cantilever shape which is inclined upwardly from the intermediate plate carrier 26. The contactors 30 may be slightly loosely inserted in the through holes on the contactor carrier 20 in a manner allowing small movements in the vertical and horizontal directions when pressed against the semiconductor wafer 300 and the probe card 260.
The pogo-pin block (frog ring) 130 is equivalent to the one shown in FIG. 2 having a large number of pogo-pins to interface between the probe card 260 and the performance board 120. At upper ends of the pogo-pins, cables 124 such as coaxial cables are connected to transmit signals to printed circuit boards (pin electronics cards) 150 in the test head 100 in FIG. 2 through the performance board 120. The probe card 260 has a large number of electrodes 262 and 265 on the upper and lower surfaces thereof.
When assembled, the base portions 33 of the contactors 30 contact the electrodes 262. The electrodes 262 and 265 are connected through interconnect traces 263 to fan-out the pitch of the contact structure to meet the pitch of the pogo-pins in the pogo-pin block 130. Because the contactors 30 are loosely inserted in the through holes of the contactor carrier 20, the diagonal beam portions 32 of the contactors 30 deform easily and produce resilient contact forces toward the electrodes 262 and the contact pads 320 when pressed against the semiconductor wafer 300.
FIG. 13 is a cross sectional view showing another example of probe contact assembly using the contact structure of the present invention. The probe contact assembly is used as an interface between the device under test (DUT) and the test head such as shown in FIG. 2. In this example, the probe contact assembly includes a conductive elastomer 250, a probe card 260, and a pogo-pin block (frog ring) 130 provided over the contact structure. Since the contactor 30 has the diagonal beam (spring) portion as mentioned above, such a conductive elastomer is usually unnecessary. However, the conductive elastomer may be still useful for compensating the unevenness of the gaps (planarity) between the probe card 260 and the contact structure.
The conductive elastomer 250 is provided between the contact structure and the probe card 260. When assembled, the upper ends 33 of the contactors 30 contact the conductive elastomer 250. The conductive elastomer 250 is an elastic sheet having a large number of conductive wires in a vertical direction. For example, the conductive elastomer 250 is comprised of a silicon rubber sheet and a multiple rows of metal filaments. The metal filaments (wires) are provided in the vertical direction of FIG. 13, i.e., orthogonal to the horizontal sheet of the conductive elastomer 250. An example of pitch between the metal filaments is 0.05 mm or less and thickness of the silicon rubber sheet is about 0.2 mm. Such a conductive elastomer is produced by Shin-Etsu Polymer Co. Ltd, Japan, and available in the market.
US6836024 * May 7, 2003 Dec 28, 2004 Nihon Denshizairyo Kabushiki Kaisha Apparatus for connecting between substrates
US7405144 * Oct 19, 2006 Jul 29, 2008 Chipmos Technologies Inc. Method for manufacturing probe card
US20040222535 * May 7, 2003 Nov 11, 2004 Chikaomi Mori Apparatus for connecting between substrates
US20080009085 * Oct 19, 2006 Jan 10, 2008 Chipmos Technologies Inc. Method for manufacturing probe card
U.S. Classification 257/773, 257/781, 257/E23.021, 257/780, 257/784
International Classification G01R1/073, H05K3/20, H01L23/485, G01R3/00, H01L21/302, H01R13/24, G01R1/067, H01L23/48, H05K1/00, G01R31/28, H05K3/40
Cooperative Classification G01R1/073, H01L2924/00014, H01L2224/05573, H01L2224/05568, H01L2924/12042, H01L2924/15787, H01L2924/01039, G01R1/07371, H01L2924/01022, G01R3/00, H01R12/57, H01L2924/19042, H01L2924/01045, H01R13/2435, H01L2924/01005, H01L2924/09701, H01L2924/01024, H01L2924/30105, H01L2924/3011, H01L2924/01046, G01R1/07307, G01R1/07314, H01L2924/30107, H01L2924/19041, H01L2924/01027, H01L2924/01078, H01R12/52, H01R13/2464, H01R13/2414, H01L2924/14, H01L2924/01033, H01L2924/01074, H01L2924/01029, G01R1/06711, G01R1/07378, H01L2924/01013, H01L2924/01006, H05K3/20, H05K3/4015, H01R13/2407
European Classification H01L24/10, H01R12/57, H01R13/24A, G01R1/073B9B, H01R13/24P, G01R1/067C, H01R9/09F, H01R13/24D
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:ZHOU, YU;YU, DAVID;ALDAZ, ROBERT EDWARD;AND OTHERS;REEL/FRAME:012466/0834;SIGNING DATES FROM 20011119 TO 20011120

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Amazon.co.uk: A. Duncan "ali_d"'s review of Edimax EW-7811UN 150Mbps Wireless Nano USB...
Pretty good but need to download win 8 drivers, 19 Jun. 2014
By A. Duncan "ali_d"
Pretty good but need to download win 8 drivers
A. Duncan "ali_d"

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Post Y.M.C.A. and trophy circle, Fort Monroe, Va. | Library of Congress
Photo, Print, Drawing Post Y.M.C.A. and trophy circle, Fort Monroe, Va.
JPEG (4.6 KB) GIF (10.6 KB) JPEG (67.4 KB) JPEG (175.8 KB) TIFF (19.5 MB) TIFF (155.4 MB)
- Young Men's Christian associations.
- Detroit Publishing Co. no. 072494.
LC-D4-72494 [P&P;]
det 4a24181 //hdl.loc.gov/loc.pnp/det.4a24181
det1994024641/PP
LC-DIG-det-4a24181 (digital file from original)
Detroit Publishing Co., Copyright Claimant, and Publisher Detroit Publishing Co. Post Y.M.C.A. and trophy circle, Fort Monroe, Va . Fort Monroe Virginia, None. [Cbetween 1910 and 1920] Photograph. Retrieved from the Library of Congress, https://www.loc.gov/item/det1994024641/PP/. (Accessed February 22, 2018.)
Detroit Publishing Co, C. C. & Detroit Publishing Co, P. Post Y.M.C.A. and trophy circle, Fort Monroe, Va . Fort Monroe Virginia, None. [Cbetween 1910 and 1920] [Photograph] Retrieved from the Library of Congress, https://www.loc.gov/item/det1994024641/PP/.
Detroit Publishing Co., Copyright Claimant, and Publisher Detroit Publishing Co. Post Y.M.C.A. and trophy circle, Fort Monroe, Va . [Cbetween 1910 and 1920] Photograph. Retrieved from the Library of Congress, <www.loc.gov/item/det1994024641/PP/>.
The Parade ground and barracks, Fort Monroe, Va. 1 negative : glass ; 8 x 10 in.
Army Y.M.C.A., Fort Monroe, Old Point Comfort, Va. 1 negative : glass ; 8 x 10 in.
Coolidge Speech: Address . . . before the Forty-Second International Convention of the Young Men's Christian ... Everett Sanders, one of President Coolidge's private secretaries, preserved a bound set of fifty-nine formal addresses given by the president and subsequently printed by the Government Printing Office. The speeches were given between June 22, 1925, and February 22, 1929, in Coolidge's second term of office. The fifty-nine addresses are available in this digital collection as separate items. The index to the bound set...

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A-Maze-Ing!!! - Review of Ports O' Call, Denarau Island, Fiji - TripAdvisor
A-Maze-Ing!!! - Ports O' Call
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Such a lovely atmosphere here and away from the noise of the resort.
Meals and service at a very high quality and very good value for money when spending Aussie dollars
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Patent US6508697 - Polishing pad conditioning system - Google PatentsSearch Images Maps Play YouTube News Gmail Drive More »Sign inAdvanced Patent SearchPatentsA system for conditioning rotatable polishing pads used to planarize and polish surfaces of thin film integrated circuits deposited on semiconductor wafer substrates, microelectronic, and optical system. The system has a pad conditioning apparatus, process fluids, a vacuum capability to pull waste material...http://www.google.com/patents/US6508697?utm_source=gb-gplus-sharePatent US6508697 - Polishing pad conditioning systemAdvanced Patent SearchPublication numberUS6508697 B1Publication typeGrantApplication numberUS 09/906,446Publication dateJan 21, 2003Filing dateJul 16, 2001Priority dateJul 16, 2001Fee statusPaidAlso published asUS20030013381Publication number09906446, 906446, US 6508697 B1, US 6508697B1, US-B1-6508697, US6508697 B1, US6508697B1InventorsRobert Lyle Benner, Stephen J. Benner, Robert L. BennerOriginal AssigneeRobert Lyle Benner, Stephen J. Benner, Robert L. BennerExport CitationBiBTeX, EndNote, RefManPatent Citations (7), Non-Patent Citations (2), Referenced by (38), Classifications (12), Legal Events (3) External Links: USPTO, USPTO Assignment, EspacenetPolishing pad conditioning system
US 6508697 B1Abstract
A system for conditioning rotatable polishing pads used to planarize and polish surfaces of thin film integrated circuits deposited on semiconductor wafer substrates, microelectronic, and optical system. The system has a pad conditioning apparatus, process fluids, a vacuum capability to pull waste material out of the conditioning pad, self-contained flushing means, and a piezo-electric device for vibrating the pad conditioning apparatus.
The pad conditioning system of the present invention is comprised of a pad conditioning apparatus, process fluids, and a vacuum capability to pull waste material out of the conditioning pad, self-contained flushing means, and a piezo-electric device for vibrating the pad conditioning abrasive. All of these elements combine in operation to provide a unique and effective system for conditioning polishing pads. The pad conditioning apparatus is comprised of an outer chamber in a generally circular configuration with an inlet port for introducing process fluids and/or ultra-pure water and an outlet port for attaching negative pressure. The outer chamber houses a rotating impeller assembly with impeller blades radiating outward from the impeller shaft. The shaft of the impeller assembly protrudes through an opening in the top surface of the outer chamber and is attached to the equipment's end effector assembly. A support disk, a magnetic disk or mechanical fastening means and an abrasive conditioning disk are attached to the impeller in a stacked configuration. As described in U.S. Pat. No. 4,222,204, the abrasive disk is held in place magnetically or mechanically offering full support of the disk because it pulls the disk flat to the support disk. The assembly is constructed with aligned holes that allow debris on the polishing pad to be vacuumed up through these holes. In operation, the outside chamber is held stationary with an attached hose connected to a vacuum facility. The water or slurry is introduced either from an inlet port on the outer chamber or from the center of the impeller through a water collar. A series of water holes radiating out from the center of the impeller disk allows full coverage of the abrasive disk and aids in the break up of the static layers in the pores of the polishing pad. The vacuum action pulls the water and debris immediately up through the aligned holes in the support, magnetic, and abrasive disks and the rotating impeller blades sweep the water and debris to the vacuum pickup outlet and into the disposal system. The aligned holes or �open structure� in the stacked disks allows collection of debris or swarf, as it is being dislodged from the surface of the pad allowing continuous conditioning without interference of the debris between the abrasive disk and the surface of the wafer. The magnetic fastening structure adds driving force to the abrasive by gripping the edge of the holes. It also tends to cushion the abrasive process. A mechanical method can also be used which would be gimbaled for alignment and cushioning. Vacuum pulls the wastes from the process, lifts the polishing pad asperities into an uncompressed position. Select holes also introduce process fluids (slurry/UPW) or cleaning gasses to the pad in a much more controlled (pressure, location, sequence, pad/wafer surface conditions, etc.) fashion.
FIG. 1 illustrates a prior art, diamond tipped, manually adjustable threaded rods in a block holder.
The present invention is an improved apparatus and method for conditioning polishing pads such as those used in Chemical Mechanical Polishing or Planarizing (CMP) Systems for removing irregularities on semiconductor wafer substrates. The specific details of the preferred embodiment provide a thorough understanding of the invention, however, some CMP system elements which operate in conjunction with the present invention have not been elaborated on because they are well known and may tend to obscure other aspects that are unique to this invention. It will be obvious to one skilled in the art that the present invention may be practiced without these other system elements.
Patent CitationsCited PatentFiling datePublication dateApplicantTitleUS5531635 *Mar 20, 1995Jul 2, 1996Mitsubishi Materials CorporationTruing apparatus for wafer polishing padUS5885137 *Jun 27, 1997Mar 23, 1999Siemens AktiengesellschaftChemical mechanical polishing pad conditionerUS5904615 *Jul 18, 1997May 18, 1999Hankook Machine Tools Co., Ltd.Pad conditioner for chemical mechanical polishing apparatusUS6099393 *May 21, 1998Aug 8, 2000Hitachi, Ltd.Polishing method for semiconductors and apparatus thereforUS6179693 *Oct 6, 1998Jan 30, 2001International Business Machines CorporationIn-situ/self-propelled polishing pad conditioner and cleanerUS6263605 *Dec 21, 1998Jul 24, 2001Motorola, Inc.Pad conditioner coupling and end effector for a chemical mechanical planarization system and method thereforUS6302771 *Apr 1, 1999Oct 16, 2001Philips Semiconductor, Inc.CMP pad conditioner arrangement and method therefor* Cited by examinerNon-Patent CitationsReference1 *US 20020127957A1--United State Patent Publication, Shipley et al., CMP Polishing Pad Conditioner Device, filed on Sep. 20, 2000.2US 20020127957A1�-United State Patent Publication, Shipley et al., CMP Polishing Pad Conditioner Device, filed on Sep. 20, 2000.* Cited by examinerReferenced byCiting PatentFiling datePublication dateApplicantTitleUS6773337 *Nov 6, 2001Aug 10, 2004Planar Labs CorporationMethod and apparatus to recondition an ion exchange polish padUS6783445 *Sep 26, 2001Aug 31, 2004Ebara CorporationPolishing apparatusUS6852004 *May 21, 2002Feb 8, 2005Nanya Technology CorporationCMP machine dresser and method for detecting the dislodgement of diamonds from the sameUS6951509 *Mar 9, 2004Oct 4, 20053M Innovative Properties CompanyUndulated pad conditioner and method of using sameUS7004825 *Sep 29, 2003Feb 28, 2006Lam Research CorporationApparatus and associated method for conditioning in chemical mechanical planarizationUS7040967Jan 25, 2005May 9, 2006Tbw Industries Inc.Multi-step, in-situ pad conditioning system and method for chemical mechanical planarizationUS7052371May 29, 2003May 30, 2006Tbw Industries Inc.Vacuum-assisted pad conditioning system and method utilizing an apertured conditioning diskUS7083506Jul 21, 2004Aug 1, 2006Ebara CorporationPolishing apparatusUS7160178Aug 7, 2003Jan 9, 20073M Innovative Properties CompanyIn situ activation of a three-dimensional fixed abrasive articleUS7166014Jan 25, 2005Jan 23, 2007Tbw Industries Inc.Chemical mechanical planarization process control utilizing in-situ conditioning processUS7210988 *Aug 22, 2005May 1, 2007Applied Materials, Inc.Method and apparatus for reduced wear polishing pad conditioningUS7300521 *Dec 8, 2004Nov 27, 2007U.S. Greenfiber, LlcWall scrubber for blown insulationUS7540799Feb 26, 2007Jun 2, 2009Trojan Daniel RSystem for adjusting an end effector relative to a workpieceUS7544113 *Nov 18, 2005Jun 9, 2009Tbw Industries, Inc.Apparatus for controlling the forces applied to a vacuum-assisted pad conditioning systemUS7575503 *Aug 13, 2007Aug 18, 2009Tbw Industries, Inc.Vacuum-assisted pad conditioning systemUS7597608 *Oct 30, 2007Oct 6, 2009Applied Materials, Inc.Pad conditioning device with flexible media mountUS7674156 *Oct 8, 2007Mar 9, 2010K.C. Tech Co., LtdCleaning device for chemical mechanical polishing equipmentUS7708622 *Mar 28, 2005May 4, 2010Micron Technology, Inc.Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpiecesUS7901267 *May 7, 2009Mar 8, 2011Tbw Industries, Inc.Method for controlling the forces applied to a vacuum-assisted pad conditioning systemUS7985122 *Jun 13, 2006Jul 26, 2011Freescale Semiconductor, IncMethod of polishing a layer using a polishing padUS8025555 *Jan 31, 2011Sep 27, 2011Tbw Industries Inc.System for measuring and controlling the level of vacuum applied to a conditioning holder within a CMP systemUS8142261Nov 27, 2006Mar 27, 2012Chien-Min SungMethods for enhancing chemical mechanical polishing pad processesUS8298043Jul 6, 2010Oct 30, 2012Chien-Min SungPad conditioner dresserUS8342910 *Dec 31, 2009Jan 1, 2013Saint-Gobain Abrasives, Inc.Abrasive tool for use as a chemical mechanical planarization pad conditionerUS8758091 *Apr 6, 2010Jun 24, 2014Massachusetts Institute Of TechnologyChemical-mechanical polishing pad conditioning systemUS8905823 *Jun 1, 2010Dec 9, 2014Saint-Gobain Abrasives, Inc.Corrosion-resistant CMP conditioning tools and methods for making and using sameUS8951099Aug 31, 2010Feb 10, 2015Saint-Gobain Abrasives, Inc.Chemical mechanical polishing conditionerUS20110244764 *Apr 6, 2010Oct 6, 2011Massachusetts Institute Of TechnologyChemical-mechanical polishing pad conditioning systemCN1910011BJan 25, 2005Dec 15, 2010Tbw工业有限公司Chemical mechanical planarization process control utilizing in-situ conditioning processCN1914004BJan 25, 2005Jun 2, 2010Tbw工业有限公司Multi-step pad conditioning method for chemical planarizationCN100469528CMay 25, 2004Mar 18, 2009Tbw 工业有限公司Vacuum-assisted pad conditioning system and method utilizing an apertured conditioning diskDE10308064A1 *Feb 26, 2003Sep 16, 2004Infineon Technologies AgMechanism for chemo-mechanical polishing (CMP) of semiconductor wafers with polishing medium specified supply, polishing plate and polishing head, which presses wafer onto plate, with supply appliance for polishing mediumDE10308064B4 *Feb 26, 2003Mar 9, 2006Infineon Technologies AgPoliermittelzuf�hrung bei CMP-ProzessenEP1940587A2 *Oct 19, 2006Jul 9, 2008TBW Industries Inc.Apertured conditioning brush for chemical mechanical planarization systemsWO2004112091A2 *May 25, 2004Dec 23, 2004Stephen J BennerVacuum-assisted pad conditioning system and method utilizing an apertured conditioning diskWO2005072332A2 *Jan 25, 2005Aug 11, 2005Stephen J BennerChemical mechanical planarization process control utilizing in-situ conditioning processWO2007047996A2 *Oct 19, 2006Apr 26, 2007Stephen J BennerApertured conditioning brush for chemical mechanical planarization systemsWO2008076366A2 *Dec 14, 2007Jun 26, 2008Stephen J BennerAbrasive configuration for fluid dynamic removal of abraded material and the like* Cited by examinerClassifications U.S. Classification451/443, 451/444, 451/456, 451/285, 451/56International ClassificationB24B53/007, B24B53/095, B24B37/04Cooperative ClassificationB24B53/017, B24B53/095European ClassificationB24B53/017, B24B53/095Legal EventsDateCodeEventDescriptionJul 16, 2014FPAYFee paymentYear of fee payment: 12Jul 19, 2010FPAYFee paymentYear of fee payment: 8Jul 12, 2006FPAYFee paymentYear of fee payment: 4RotateOriginal ImageGoogle Home - Sitemap - USPTO Bulk Downloads - Privacy Policy - Terms of Service - About Google Patents - Send FeedbackData provided by IFI CLAIMS Patent Services