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Patent US5986279 - Method of recording and reading a radiation image of an elongate body - Google PatentsSearch Images Maps Play YouTube News Gmail Drive More »Sign inPatentsA radiation image is recorded on a plurality of photostimulable phosphor screens of a size that is smaller than the size of the elongate body. The screens are exposed to a radiation image of a grid of threads of attenuating material and a radiation image of the elongate body so that each of the screens...http://www.google.com/patents/US5986279?utm_source=gb-gplus-sharePatent US5986279 - Method of recording and reading a radiation image of an elongate bodyAdvanced Patent SearchPublication numberUS5986279 APublication typeGrantApplication numberUS 09/035,528Publication dateNov 16, 1999Filing dateMar 5, 1998Priority dateMar 21, 1997Fee statusPaidPublication number035528, 09035528, US 5986279 A, US 5986279A, US-A-5986279, US5986279 A, US5986279AInventorsPiet DewaeleOriginal AssigneeAgfa-GevaertExport CitationBiBTeX, EndNote, RefManPatent Citations (6), Referenced by (65), Classifications (9), Legal Events (5) External Links: USPTO, USPTO Assignment, EspacenetMethod of recording and reading a radiation image of an elongate body
US 5986279 AAbstract
A radiation image is recorded on a plurality of photostimulable phosphor screens of a size that is smaller than the size of the elongate body. The screens are exposed to a radiation image of a grid of threads of attenuating material and a radiation image of the elongate body so that each of the screens stores part of the image of the body and superimposed thereon, part of the image of the grid. The screens are read out individually. Reconstruction of the image of the elongate body is performed on the basis of the reconstructed image of the grid.
1. A method of recording and reading a radiation image of an elongate body, characterised by the steps of(a) simultaneously exposing a plurality of photostimulable phosphor screens each having a size which is smaller than the size of the elongate body, to distinct parts of a radiation image of the elongate body and of a pattern of reference marks, (b) scanning each of said screens by means of stimulating radiation, detecting light emitted upon stimulation and converting said light into signal representations of images stored in said screens, (c) extracting partial signal representations from said digital signal representations, said partial signal representations each representing a part of said pattern of reference marks that was stored in a screen, (d) determining from said partial signal representations the position of the image of the part of the pattern of reference marks stored in a screen, (e) stitching the signal representations obtained in step (b) in such a way that an image of the total pattern of reference marks is reconstructed making use of the determined positions of the parts of the pattern. 2. A method according to claim 1 wherein said pattern of reference marks consists of a grid of threads of radiation attenuating material.
3. A method according to claim 1 wherein said plurality of screens are conveyed in a cassette in a juxtaposed relationship.
4. A method according to claims 2 wherein said grid is provided in said cassette.
5. A method according to claim 2 wherein said grid is formed by mutually orthogonal horizontal and vertical threads and wherein said position is determined by determining offset of horizontal and vertical lines of the grid with respect to horizontal and vertical image borders, periodicity of said pattern in horizontal and vertical direction, inclination of grid lines relative to horizontal or vertical direction.
This application claims benefit of provisional application 60/045,868, filed May 7, 1997.
The present invention relates to the recording and reading of a radiation image of an elongate body.
In the field of digital radiography a technique has been developed wherein a radiation image, for example an image of X-rays transmitted by an object, is stored in a screen comprising a photostimulable phosphor such as one of the phosphors described in European patent publication 503 702 published on Sep. 16, 1992 and U.S. Pat. No. 5,340,661.
The technique for reading out the stored radiation image consists of scanning the screen with stimulating radiation, such as laser light of the appropriate wavelength, detecting the light emitted upon stimulation and converting the emitted light into an electric representation for example by means of a photomultiplier.
The signal is then digitized, processed and subsequently used to control the hard copy recording in image reproducing system such as a laser recorder. For diagnostic purposes the reproduction is viewed and analyzed on a lightbox.
Stimulable phosphor screens used in this technique are selected from a variety of sizes which are adapted to the body part that is examined.
The read out apparatus is designed so that it is able to accommodate and read all these sizes of screens.
However, examination types exist in which a larger part of the body is examined than can be recorded on a single, even the largest sized cassette (among commonly used cassette types).
Examples of such examination types are the diagnosis of the entire vertebral column or of the leg, so-called full leg-full spine examinations, where clinical indication requires that e.g. the full spine be examined at once to enable diagnosis or to qualify diagnosis.
In U.S. Pat. No. 5,111,045 and in U.S. Pat. No. 5,130,541 such applications have been dealt with.
U.S. Pat. No. 5,111,045 discloses a method wherein a radiation image of a large object such as a vertebral column is recorded on first and second stimulable phosphor screens that are successively positioned in the image recording unit of the apparatus with their confronting ends superimposed on each other in the recording position. The stimulable phosphor sheets are circulated in the apparatus along a circulatory path through a recording unit, a read out unit and an erasure unit. Special features are provided to hold the sheets in position at the recording unit. After having been exposed, the sheets are consecutively fed to a read out unit where a digital signal representation of the image stored in a sheet is obtained. Then, the image signals representing the images read out of the two sheets are processed so as to combine image portions corresponding to the superimposed portions of the two photostimulable phosphor sheets, with the result that a combined image signal is produced. No details are given on the way in which this image processing is performed.
U.S. Pat. No. 5,130,541 discloses another method and apparatus for recording a radiation image of an elongate body. The method is based on the use of a plurality of elongated stimulable phosphor screens that are successively fed along a circulary path in a combined and dedicated exposure and read out device. The disclosure generally relates to the handling of the sheets in such a dedicated combined exposure and read out device.
It is an object of this invention to provide a method of recording a radiation image of an elongate body on a photostimulable phosphor screen which does not require the use of a photostimulable phosphor screen of dedicated dimensions adapted to the dimensions of the elongate body and/or which does not require the use of a dedicated read out apparatus adapted to the use of such dedicated screen(s).
It is a further object of the present invention to provide a method by means of which a radiation image of an elongate body is obtained that is geometrically correct.
To achieve the above objects the present invention provides a method of recording and reading a radiation image of an elongate body, according to claim 1.
The method of the present invention is advantageous in that it does not require the use of phosphor screens of sizes that are adapted to the size of the elongate body.
The method of the present invention provides that a read out apparatus which is designed to accommodate `normal size` screens can be used for reading the image of an elongate body.
In a specific embodiment a plurality of photostimulable phosphor screens each having a size which is smaller than the size of the elongate body, are placed in a large size cassette in a partially overlapping or in a touching disposition.
The pattern of reference marks may take different forms. Preferably it is composed of a grid or a raster of parallel horizontal and vertical threads of X-ray attenuating material. This embodiment eases the reconstruction of the complete image of the pattern of reference marks.
The pattern of reference marks may be provided in the cassette wherein the plurality of photostimulable phosphor screens are mounted. The cassette is then to be positioned so that the pattern is situated between a source of radiation (X-ray source) and the screens so that, when being exposed, the radiation image of the pattern is recorded on the plurality of photostimulable phosphor screens.
Alternatively the grid may be mounted in the X-ray table or on an X-ray stand in between the X-ray source and the cassette.
In any way must be provided that an image of the pattern of reference marks will be superimposed on the X-ray image of the elongate object.
Following exposure, the individual partial images stored in the individual photostimulable phosphor screens are read out. These partial images consist of a partial image of the pattern of reference marks superimposed on a partial image of the elongate body.
Then, a complete image of the elongate body is constructed by means of the partial images. The reconstruction of the image of the elongate body from the constituent partial images is in the following referred to as `stitching`. The way in which the partial images are assembled to form a complete image of the elongate body is guided by the way in which partial images of the pattern of reference marks are to be assembled to form the complete image of the pattern of reference marks. Further details on the way in which these images are formed is described extensively hereafter.
Neither the order of input of the screens into the read out apparatus nor the sense in which these screens are scanned is important since the image of the pattern of reference marks can be used to reconstruct the image of the elongate body from the constituent partial images in a seamless, uninterrupted and correct way.
Prior to stitching the partial images read out of the screens may be viewed on a workstation to enable the operator to select the order and sense of re-assembling the images read out of the different screens. A front-end Graphical User Interface may be used. The following functionality may be supported on the workstation: (1) rotate (90, 180, 270 degrees) functionality; (2) flip horizontal/vertical functionality; (3) anatomical order indication; (4) left-right or top-down composition. These functions may correct for incorrect sense of one or more of the images due to incorrect handling for the individual image screens by the radiology operator etc.
Particular embodiments of the present invention will be explained with reference to the accompanying drawings wherein
FIG. 1 schematically illustrates the positioning of a X-ray attenuating grid and a plurality of phosphor screens in a cassette which is adapted to the dimensions of an elongate body to be irradiated.
FIG. 2 is a read out apparatus,
FIG. 3 depicts the image of a grid (solid lines) superimposed on one of the acquired sub-images.
FIG. 4 is a block diagram of the different steps of the algorithm.
FIG. 5 depicts the different dispositions of successive image screens, thereby resulting in the following cases: (a) overlap zone contains one grid line; (b) overlap zone contains two or more grid lines; (c) overlap with no common grid line; (d) touching configuration with no grid line involved; (e) touching configuration with image borders coinciding with grid line; (f) non-overlapping case with no grid line in the non-imaged portion; (g) non-overlapping case with one or more grid lines in the non-imaged portion.
FIG. 6 depicts a typical integration profile in a block of lines,
FIG. 7 depicts the Laplacian enhanced profile of FIG. 6,
FIG. 8 depicts the result of sieving the profile of FIG. 7,
FIG. 9 depicts the difference profile resulting from subtracting the profile of FIG. 8 from the profile of FIG. 7,
FIG. 10 depicts the thresholded and shrinked profile of FIG. 9.
FIG. 11 shows the peaks of FIG. 10 according to grid lines only.
FIG. 1 shows a schematic representation of the contents of a cassette used in e.g. full leg or full spine examinations. It comprises a grid of strongly X-ray attenuating (e.g. metallic) threads, arranged in a rectangular periodic pattern. The grid is positioned in alignment with the cassette's borders. The grid covers the full surface of the cassette in a continuous way. The cassette holds a plurality of photostimulable phosphor screens. The screens may be positioned in a partially overlapping or non-overlapping arrangement.
FIG. 1 shows an arrangement wherein the screens are provided in a partially overlapping position. In this figure the overlap zone is shown in gray and non-visible image screen borders are drawn in dashed lines.
When an elongate body such as a human spine or a human leg is to be irradiated with penetrating radiation such as X-rays to record an X-ray image on a plurality of photostimulable phosphor screens, the elongate body is placed between an X-ray source and the cassette comprising the phosphor screens and the grid of attenuating material so that a partial image of the elongate body and a partial image of the grid is recorded on each of the screens in the cassette.
After exposure, the photostimulable phosphor screens are taken out of the large-size cassette. Each of the screens is then put into a `normal-sized` cassette (i.e. a cassette the dimensions of which correspond to the size of the individual phosphor screens) and applied to a read out apparatus that is able to accommodate and scan the normal size cassettes.
The read out station is illustrated in FIG. 2 and comprises a laser 1 emitting light of a wavelength adapted to the stimulation spectrum of the phosphor used, galvanometric light deflection means 2 for deflecting light emitted by the laser onto the photostimulable phosphor screen, a light guide 3 directing light emitted by a stimulable phosphor screen into the light input face of a photomultiplier 4, a sample and hold circuit 5, and an analog to digital convertor 6.
The read out device also comprises a processing module (not shown) for performing online processing on the digital signal representation of the radiation image. The read out signal is applied to a workstation (not shown) for off-line image processing.
The operation of the read out station is as follows.
Stimulating rays emitted by laser 1 are directed onto the photostimulable phosphor screen to scan this screen. The stimulating rays are deflected into the main scanning direction by means of galvanometric deflection means 2. Subscanning is performed by transporting the phosphor screen in the subscanning direction indicated by arrow 7. Upon stimulation, the photostimulable phosphor emits light within a second wavelength range which is different from the wavelength range of the stimulation light. The emitted light is directed by means of a light collector 3 onto a photomultiplier 4 for conversion into an electrical image representation. Next, the signal is sampled by a sample and hold circuit 5, and converted into a digital raw image signal by means of an analog to digital convertor 6.
The signals read out from the different photostimulable phosphor screens are then applied to a workstation for performing stitching, i.e. for re-assembling the image of the elongate body and the image of the grid from the sub-images read from the plurality of screens.
When the individual screens are taken out of the large size cassette and transferred to the normal size cassettes that are read out, it may happen that (1) the order in which the images were placed in the large size cassette (this order corresponds with the order in which the images are to be re-assembled to form the elongate image) and/or (2) the direction into which individual images are to be positioned, is lost.
This problem could be solved by automatic detection of markers on the screens. Alternatively, the individual images may be displayed on a workstation that is equipped with a suitable user interface and the following functionality:
(1) a function that allows indication of the sequence of images to be re-assembled (e.g. top-down order),
(2) a rotation function that allows images to be rotated by a number of times 90 degrees,
(3) a mirroring function (left-right, top-down position),
(4) flip horizontal/vertical function.
Next, the images read out of each of the individual screens are subjected to the stitching method described hereafter.
The method applied to assemble the sub-images read out of the plurality of phosphor screens is based on: (1) the detection and modelling of the periodic grid and (2) cross-correlation of overlapping image parts.
The periodic grid aids to align and stitch the sub-images with respect to each other. Since the grid covers the cassette's surface in a continuous way, the image of the grid should also be present in the assembled image (assembled from the sub-images read out of the plurality of screens) in a continuous way.
The stitching algorithm is able to cope with the following reconstruction malfunctions:
dislocation of the grid in the transverse direction of one sub-image of the elongate body with regard to the grid of the next sub-image, said dislocation being due to dissimilar feed through of the screens,
shortening or lengthening of a period of the grid in the longitudinal direction of the elongate body, said period covering partially one sub-image and partially the other subsequent sub-image,
rotation of the grid of one sub-image with respect to the grid of the next sub-image, said rotation being due to minor differences in scanning angle in the longitudinal direction of successive sub-images and non-parallel alignment of individual imaging screens in the elongated cassette during exposure.
FIG. 3 depicts the image of a grid, represented by solid lines, superimposed on one of the acquired sub-images.
The grid is tilted with respect to the image borders either due to rotation of the screen in the elongated (large size) cassette, or due to rotation of the screen with respect to the scanning axis (due to non-perfect feeding of a screen through the image read out apparatus) or due to a combination of said misalignments. The tilt angle is shown enlarged for clarity.
The figure further depicts grid model parameters: periodicity in horizontal and vertical direction, offset of the first grid line in horizontal and vertical direction, tilt angle. The dashed lines (- - - ) denote subdivision into rectangular vertical and horizontal blocks for profile calculation, the dotted lines (. . . ) denote the centre lines of the corresponding blocks.
The hole marks (o) denote the positions of the vertical grid lines in the horizontal profiles, the cross marks (x) denote the positions of the horizontal grid lines in the vertical profiles.
Coordinates used in the process of image re-assembling are defined relative to a coordinate system. The origin of this system is situated in the upper left corner of FIG. 3, with coordinate m running inside a row from left to right along different columns (in the horizontal direction), coordinate n running from top to bottom along different rows (in the vertical direction). The solid lines represent the imprint of the attenuating grid onto the image.
The raster formed by the grid lines may be tilted with an angle αh with respect to the horizontal axis. Normally, the tilt angle αh is small and has been drawn in an oversized way for clarity.
Basic to the operations is the detection and characterization of the grid which produces a rectangular pattern of less exposed pixels in each of the sub-images Sz, z=1 . . . Z, read from individual screens.
Z is the total number of sub-images to be stitched and is typically 3 or 4. The method however applies to any number of sub-images.
The pattern formed by the grid in sub-image Sz is fully characterized by the knowledge of:
(1) the period Pz h and Pz v between the gridlines in horizontal resp. vertical direction,
(2) the angle αz h of the horizontal gridlines with respect to the image borders, further assuming that the vertical gridlines are perpendicular to the horizontal ones, and
(3) the offset Oz h and Oz v of horizontal and vertical gridlines with respect to the horizontal image border and the vertical image border respectively.
A model of the digital grid for each of the sub-images Sz, z=1 . . . Z thus consists of five parameters, (Pz h and Pz v), (Oz h and Oz v), αz h. Knowledge of the sets of these parameters is a necessary and sufficient condition for the reconstruction or prediction of the image of the grid in the sub-images and for forming a re-assembled image of the grid and consequentially also of the elongated body by image stitching.
In the sequel, (i,j) and (m,n) denote image coordinates. (M,N) denote the image dimensions. It is assumed without loss of generality that all sub-images have equal dimensions.
FIG. 4 depicts the general flow of operations, the steps of which are further commented.
Sub-image Acquisition
The first step, namely the acquisition of the sub-images has already been described higher. The sub-images are acquired by reading the individual phosphor screens.
Sub-image Standardisation
This step refers to the functions that are performed on the workstation prior to the stitching in order to provide that the partial images are processed in the right order, the right sense etc. The functions have been described higher, they include rotation, mirroring etc.
Block Profile Calculation
The grid lines appear in the gray value profile of a horizontal or vertical line of pixels through the image, in the form of a signal peak superimposed onto the original diagnostic gray value originating from the elongate body.
Fluctuations in the profile corresponding to original diagnostic gray values may however immerse the peak corresponding to a grid line and may therefore cause poor detectability of the grid lines.
In order to increase the signal to noise ratio (SNR), a block of gray value profiles is integrated. In this context of this paragraph, since it is the object to detect the image of grid lines, the noise is composed of image fluctuations due to diagnostic detail whereas the relevant signals are the signal peaks representative of the grid lines .
For example, to achieve a better signal to noise ratio for signals representing horizontal gridlines, a horizontal box smoothing filter is applied to each sub-image Sz to obtain Sz h. In a similar way, by applying a vertical box smoothing filter, the signal to noise ratio for vertical gridlines is enhanced so that an image Sz v is obtained.
Denoting by (2 Ks +1) the size of the smoothing kernel that is used, Sz h and Sz v are expressed as ##EQU1##
In the context of the present invention, Ks =150 for sub-images of size typically M�N=2496�2048.
Preferably the box filter is calculated in a recursive way, needing only one addition and one subtraction per pixel, irrespective of the kernel parameter Ks.
FIG. 3 shows an example of horizontal and vertical blocks used for integration, these blocks are represented by horizontal and vertical dashed lines (- - - ) respectively. The centre line of each of the blocks is indicated with a horizontal resp. vertical dotted line (. . . ).
From the images Sz h and Sz v, the sequences Bzq.sbsb.hh, qh =1, . . . Qh and Bzq.sbsb.vv, qv =1, . . . , Qv of integrated profiles are extracted by sub-sampling Sz h resp. Sz v along rows resp. columns, each profile representing the integration of the original image Sz row-wise in a block of columns, resp. column-wise in a block of rows: ##EQU2##
Typically, the sequences of blocks associated with the central lines with coordinate mq resp. nq can be either spaced apart from one another or overlapping. In the context of the present invention, depending on the original image dimensions (M,N), the number of blocks Qh is in the range 4 . . . M, the number of blocks Qv is in the range 4 . . . N. The cases Qh =M,Qv =N represent the situations in which all computed arrays of subsequent profiles can be viewed as images. FIG. 6 depicts a typical integration profile in a block of lines.
Profile Peak Enhancement
The grid lines appear in the form of peaks in the block profiles. Because the size Ks is much smaller than the image dimension M and N, the grid lines will form peaks even when the raster is tilted with an angle α.
The effect of the rotation is a broadening of the peaks resulting in a decreased detectability. In order to cope with poor detectability, the sequence of profiles is next submitted to a peak enhancement step by means of a Laplacian filter. Executed one-dimensionally on the profiles Bzq.sbsb.hh and Bzq.sbsb.vv, it acts as a peak sharpening filter on the profiles, thereby enhancing the detectability of the peaks associated with the grid lines. Fzq.sbsb.hh and Fzq.sbsb.vv denote the peak sharpened profiles and are obtained by
Fzq.sbsb.hh (n)=2Bzq.sbsb.hh (n)-Bzq.sbsb.hh (n-KL)-Bzq.sbsb.hh (n+KL)n=0, . . . , N-1; qh =1, . . . , Qh Fzq.sbsb.vv (m)=2Bzq.sbsb.vv (m)-Bzq.sbsb.vv (m-KL)-Bzq.sbsb.vv (m+KL)m=0, . . . , M-1; qv =1, . . . , Qv The optimal Laplacian mask size, expressed in pixel units, depends on the pixel width of the peaks corresponding to grid lines, said size being a function of the thickness of the physical grid threads and the digitization resolution. The thickness of an attenuating grid line typically is in the range of 0.5 to 1 mm. This corresponds with 6 to 12 pixels when an image recorded in a photostimulable phosphor screen of 35�43 cm is digitized at a resolution of 2048�2496 pixels. In the context of the present embodiment, the halfwidth KL of the Laplacian filter equals 11. FIG. 7 depicts the Laplacian enhanced profile of FIG. 6.
Profile Peak Sieving
The peaks corresponding to grid lines are extracted using a known technique based on the sifting theory. This technique is for example described in "S. Herman, An introduction to sifting theory, SPIE Vol. 767, Medical Imaging (1987), pp. 332-337". Sifting is a nonlinear signal processing method with characteristic operation analogous to the operations in linear filter theory. In one dimension, a sifting filter is able to `sieve` peaks so as to separate them according to their width. Depending on the hole size of the sieve, peaks with smaller base will fall through, peaks with larger base will be retained. Therefore, the analog of the low-pass linear filter is the long-pass sieve filter. Similarly, a short-pass sieve favours short-duration signal components in analogy to a high pass linear filter and a band-pass sieve serves similar purposes as the band-pass linear filter. The difference however between non-linear sieve filters and linear filters is that, although long-pass sieves will clip signal components smaller than the hole size, they will not alter the shapes of any signal components larger than the hole size, they will not change the edges of such long duration signals. A further important difference is that linear filters operate on both positive and negative going signal features. Their non-linear sieve equivalent is called a bipolar sieve. However, it is also possible to have a monopolar sieve. Such a sieve will clip only the positive or negative going signals, but not both. The grid detection problem presents itself as one of sieving the peaks corresponding to grid lines only. These peaks are by their nature only directed in one sense, hence a monopolar sieve is needed to detect them and leave the peaks of other sense intact. In the context of the present invention, a negative monopolar sieve is built composed of a sequence of a maximum operator followed by a minimum operator to eliminate negative going peaks. ##EQU3##
The maximum operator performs a dilation of positive going signals and an erosion or shrinking of negative ones. The minimum operator performs an erosion of the positive going signals and a dilation or stretching of negative going signals. Naturally, when the gray-value image is inverted, such that gridlines present themselves as positive going peaks, a positive monopolar sieve (composed of a minimum operator followed by a maximum operator) is needed to eliminate the peaks.
FIG. 8 depicts the result of sieving the signal represented in FIG. 7. Analogously to the Laplacian halfwidth KL, the sieving halfwidth KM depends on the pixel width of the grid lines, hence on the physical dimensions of the grid threads, scanning resolution and processing resolution. In the context of the present invention, KM is in the range 3 . . . 9.
Automatic Difference Profile Thresholding
A signal D containing negative going peaks only is obtained by subtracting the sieved signal H from the Laplacian enhanced signal F
Dzq.sbsb.hh (n)=Fzq.sbsb.hh (n)-Hzq.sbsb.hh (n)n=0, . . , N-1; qh =1, . . . Qh Dzq.sbsb.vv (m)=Fzq.sbsb.vv (m)-Hzq.sbsb.vv (m)m=0, . . . , M-1; qv =1, . . . , Qv It can be noted that, due to the elimination of negative going peaks only in the sieved signal H and the preservation of positive going signals, the difference D contains zero or negative values only.
FIG. 9 shows the difference profile as a result of subtracting the profile of FIG. 8 from the profile of FIG. 7.
To derive a signal with background noise eliminated, the difference signal D is thresholded with an automatic threshold derived from the array of difference values, sorted e.g. in ascending order.
Alternatively, a percentile of the cumulative histogram values can be used.
Ezq.sbsb.hh (n)=sort{Dzq.sbsb.hh (n)}n=0, . . . , N-1; qh =1, . . . , Qh Ezq.sbsb.vv (m)=sort{Dzq.sbsb.vv (m)}m=0, . . . , M-1; qv -1, . . . Qv The profile dependent automatic threshold T is determined as a fixed fraction entry of the sorted array E of difference values, multiplied by a factor β.
Tzq.sbsb.hh =βEzq.sbsb.hh (αN)qh =1, . . . , Qh Tzq.sbsb.vv =βEzq.sbsb.vv (αM)qv =1, . . . , Qv in the context of the present invention α=0.05. A binary signal B is obtained by thresholding D ##EQU4##
The binary signal B is further processed to shrink the "1"-intervals to one pixel only to ease subsequent processing. FIG. 10 shows the thresholded and shrinked profile of FIG. 9.
Grid Line Extraction and Periodicity Determination
The thresholded profile shows a marked presence of peaks according to gridlines; however, spurious peaks due to diagnostic detail may still be present. The pattern of peaks corresponding to grid lines has a periodicity. Mutual pixel distances are equal to an integral number of the periodicity numbers Pz h and Pz v searched for. Peaks not corresponding to grid lines will usually have interpixel distances different from an integral number of the periodicity number.
Therefore, a histogram of interpeak distances is built in which the distance between two peaks at coordinates m1 and m2 is divided by the number I(m1, m2) of intermediate peaks to yield a normalized distance d(m1,m2). ##EQU5##
The index d of the maximum histogram entries hz h (d) and hz v (d) will equal the periodicity numbers Pz h resp. Pz v searched for.
The grid is extracted from the series of peaks by an error minimization method. Each peak in the binary profile Bzq.sbsb.hh (n) resp. Bzq.sbsb.vv (m) is subjected to the hypothesis that it corresponds to a physical grid line, and an accumulated error measure of the grid associated with said peak is computed. The peak with the least error attached to it is finally selected as the winner and the associated grid G is extracted by selecting all peaks in the profile Bzq.sbsb.h (n) resp. Bzq.sbsb.vv (m) within an small interval centered around an integral number r of periods from said winner peak.
Gzq.sbsb.hh (n)=1∀(ni,nj):|ni -nj |=rPz h qh =1, . . . , Qh Gzq.sbsb.vv (m)=1∀(mi,mj):|mi -mj |rPz v qv =1, . . . , Qv For competing peaks having equal minimum error, the peak with the highest number of associated grid line peaks is selected. The grid sequences G are thus equal to the binary profiles B except for the removed non-grid peaks. FIG. 11 is identical to FIG. 10 except that the non-grid peaks are removed by the disclosed grid detection algorithm.
Grid Model Parameter Computation
The two-dimensional grid of each of the sub-images Sz, z=1, . . . ,Z is characterized by the set of 5 parameters (Pz h,Pz hu v), (Oz h,Oz v), αz h. Parameters (Pz h,Pz v) are derived in the periodicity detection and grid lines determination section. The parameters (Oz h,Oz v), αz h are jointly derived from the sequences G as follows for a sequence of images, presented in top-down order, whereby image Sz is assumed to lay on top of image Sz-1. Two grid matrices are determined, gh for the horizontal resp. gv for the vertical direction, storing the indexes of all grid lines detected from the sequences Gh resp. Gv. Obviously, the grid matrices gh and gv have substantially smaller size than the sequences Gh and Gv. Due to the variability of the diagnostic detail in the image, it may happen that one or more grid lines are not detectable in the derived sequences Gh and Gv respectively. Therefore, whenever a gridline is missing in the sequences Gh resp. Gv, a zero is inserted at the corresponding entry in gh and gv, such that the resulting arrangement of non-zero entries in a column of gh resp. a row of gv all correspond to the row resp. column locations of the same grid line passing through successive blocks. By denoting the number of detected grid lines in the sequences Gh and Gv by Ng.spsb.h resp. Mg.spsb.v, the dimensions of gh and gv are Qh XNg.spsb.h resp. Qv XMg.spsb.v, such that there are Ng.spsb.h horizontally oriented grid lines detected and Mg.spsb.v vertically oriented grid lines detected.
Overlap Computation
The overlap between two successive images Sz-1 and Sz can be partially derived from the matrices gh from the row position of the lowest horizontal grid line in Sz-1 and the row position of the highest horizontal grid line in Sz. Depending on the physical disposition of the imaging screens (z-1) and z in the elongated cassette at exposure time, different configurations of the screen borders with respect to the grid threads are possible and depicted in FIG. 5.
Denoting by dg1 the average distance between the lowest horizontal grid line and the lower border of the image Sz-1, and by dg2 the average distance between the upper border and the highest horizontal grid line of the image Sz, the following equations hold, recalling with reference to FIG. 4 that Oz h signifies the offset of the first horizontal grid line with respect to the horizontal sub-image border ##EQU6##
Alternative computations of dg1 and dg2 could be thought of. Since the physical grid is periodic with the same period over all sub-images, it is further assumed that Pz.sbsb.1h =Pz.sbsb.2h =Ph, ∀z1, z2, without departing from generality.
It is further assumed that dg1 <Ph, dg2 <Ph, the former assumption meaning that all grid lines are visible and detected in the attenuated portion of each sub-image Sz, and both assumptions meaning that dg1 and dg2 represent integer fractions of the period. Should the latter assumption not be met, the integer number of pixels of the incomplete period at either the upper or lower side of the sub-image is easily derived by taking the remainder of the division by Ph (dg1 ←dg1 %Ph,dg2 ←dg2 %Ph).
Table I summarizes the different cases. When no initial conditions are indicated for the case, dg1 and dg2 can each vary between O and Ph, and no value is imposed as to their sum. Invariably for all cases, a value referred to as the `first overlap guess` is computed and is equal to (dg1 +dg2)%Ph. The value of the actual overlap O.sub.(z-1,z)h is computed or verified by means of correlation and edge detection, discussed in the sections `Overlap region image correlation` and `Overlap region edge detection`. For the non-overlapping case, no strong correlation value is obtained, and a negative overlap is computed by subtracting an integral number of periods.
TABLE I__________________________________________________________________________                 initialFIG. 5    configuration       grid line inclusion                 condition(s)                        overlap 0h.sub.(z-1,z)__________________________________________________________________________a   overlapping       one grid line, same                 none   dg1 + dg2b   overlapping       more grid lines, same                 none   dg1 + dg2 + rPh, r > 0c   overlapping       no common grid line                 dg1 + dg2 > Ph                        (dg1 + dg2) % Phd   touching       no grid line involved                 dg1 + dg2 = Ph                        0e   touching       touching with grid line                 dg1 = dg2 = Ph                        0f   non-overlapping       no grid lines missing                 dg1 + dg2 < Ph                        dg1 + dg2 - Phg   non-overlapping       one/more grid lines                 none   dg1 + dg2 - rPh, r > 1       missing__________________________________________________________________________
Shift Computation
The shift between two successive images Sz-1 and Sz can be derived from the matrices gv by computing the average difference in the vertical grid line column coordinates m as follows ##EQU7## Alternative embodiments such as line fitting and Hough transform grid line modelling are possible.
The sequences G naturally lend themselves to a Hough transform, commonly known in the prior art such as e.g. W. K. Pratt, Digital Image Processing, Wiley, 1991, p. 613-622, Hough Transform Edge Linking.
It is a basic property of the Hough Transform that each point in the image plane lying on a parameterizable curve, will transform into Hough space such that the Hough array point with coordinates equal to the parameters of the curve searched for will accumulate to a high value. The problem of extracting the grid lines is therefore reduced to a peak or maximum detection problem in Hough space, each peak representing a grid line. The peaks furthermore show the property that they will line up and will be spaced with an integral number of periods from one another, both properties being due to the fact that the corresponding lines are parallel and periodically arranged. The coordinates of each peak correspond to offset and slope (or angle) model parameters of the line.
A second embodiment consists of subjecting each row resp. column of grid coordinates of the grid matrices gh and gv to a linear regression, commonly known in the prior art such as T. Pavlidis, Algorithms for Graphics and Image processing, Computer Science Press, 1982, pp. 281-292, Polygonal Approximations. Each linear regression results in the offset and slope of the fit line corresponding to a grid line.
Sub-image Rotation
Each sub-image Sz of which the grid shows an angle αz h with the horizontal axis can be brought into alignment with the image borders by rotation over an angel -αz h. Prior art is used to rotate a digita image artefact-free over a given angle, such as described in "G. Wolberg, Digital Imaging Warpint, IEEE Computer Society Press Monograph, 1990, Chapter 7.3. Rotation" and extended in "M. Unser, P. Thevenaz, L. Yaroslavsky, Convolution-Baser Interpolation for Fast, High-Quality Rotation of Images, IEEE. Trans. on Image Processing, Vol. 4, No. 10, October 1995, pp. 1371-1381". Since the rotation angle is very small (e.g. 4 pixels per 1024, representing an angle of 0.2 degrees), the rotation is restricted in an alternative embodiment to a one-dimensional deskew or translation operation only, leading to a time-effective implementation. The offset parameters (Oz h, Oz v) are adjusted accordingly after rotation.
Overlap Region Image Correlation
According to table I, the appropriate overlap formula depends on the overlap configuration and hence cannot be determined unambiguously on the basis of the quantities dg1 and dg2 alone. The overlap formula in each of the cases enumerated are completed and verified by a correlation computation. Therefore, the algorithm is refined as follows:
compute the quantities
O.sub.(z-1,z)0h =(dg1 +dg2)%Ph associated mean values μ.sub.(z-1)0h, μ.sub.(z)0h and correlation value C.sub.(z-1,z)0h for the sub-regions of Sz-1 and Sz defined by the overlap zone. These values are referred to as the intial overlap value, initial mean values and initial correlation value respectively, since they correspond to the minimum possible overlap situation (ignoring the zero overlap situation), smaller than the grid period Ph.
augment the value O.sub.(z-1,z)0h with an integral number of periods Ph O.sub.(z-1,z)0h =O.sub.(z-1,z)0h +rPh r=1, . . . R
and compute the sequence of corresponding mean values μ.sub.(z-1)rh, μ.sub.(z)rh and correlation values C.sub.(z-1,z)rh between the overlapping sub-regions of images Sz-1 and Sz.
the final amount of overlap is determined as the value O.sub.(z-1,z)rh for which the corresponding correlation measure C.sub.(z-1,z)rh is maximal and above some threshold and for which the mean value μ.sub.(z-1)rh of the overlap sub-region of image Sz-1 corresponds to the less exposed situation with respect to the mean value μ.sub.(z)rh of the overlap sub-region of image Sz, in the assumption that screen z is laid on top of screen (z-1) and hence screen z is attenuating the x-rays impinging on screen (z-1).
when none of the correlation measure C.sub.(z-1,z)rh,r=0, . . . R exceeds the threshold, it is concluded that no overlap is present and the images Sz-1 and Sz are separated by a negative overlap (a gap) of at least -(dg1 +dg2 -Ph).
The correlation measure used is based on prior art and is modified as follows to accommodate the situation of attenuation created by overlapping imaging plates ##EQU8## The second term represents the sub-image correlation in the form of the average sum of absolute differences between Ar (z-1,z) denoting the area of the hypothesized overlap region between sub-images Sz-1 and Sz at iteration r and with the domain of the indices i, j in the sums confined to said overlap region. Alternatives can be substituted for the correlation term by formulas commonly known in the prior art such as "W. K. Pratt, Digital Imaging Processing, 2nd ed., Wiley Interscience, 1991, pp. 662-671, Image Registration", "L. G. Brown, A Survey of Image Registration Techniques, ACM Computing Surveys, Vol. 24, No. 4, December 1992, pp. 325-376. In an alternative embodiment, a mutual information measure is computed such as disclosed in the prior art in e.g. "P. A. Viola, Alignment by Maximization of Mutual Information, Massachusetts Institute of Technology, A.I. Technical Report No. 1548, June 1995". Obviously, the measure C.sub.(z-1,z)r is maximal for overlapping image parts in register with one another.
Overlap Region Edge Detection
The overlap region is further characterized by the property that since the mean value μ.sub.(z-1)rh of the image Sz-1 is less exposed with respect to the mean value μ.sub.(z)rh of the image Sz, the screen corresponding to image Sz will cause a gray value gradient to exist in image Sz-1. Said gray value gradient will extend over the full image width of image Sz-1 and is slightly displaced in the upper direction with respect to the overlap value Oz-1,z)rh due to a non-scanned portion of the overlaying screen corresponding to image Sz. The detection of the presence of the boundary of the overlap zone is therefore used as a verification means of the overlap determination. Prior art is used to calculate the edge gradient and perform the edge thresholding such as "W. K. Pratt, Digital Image Processing, 2nd ed., Wiley Interscience, 1991, Chapter 16, Edge Detection", "A. K. Jain, Fundamentals of Digital Image Processing, Prentice Hall, 1989, Chapter 9.4, Edge Detection", "J. S. Lim, Two-Dimensional Signal and Image Processing, Prentice Hall, 1990, Chapter 8.3, Edge Detection". In the context of the present invention, a threshold of 40 gray value increments on a 12 bit scale is used on the gradient magnitude between gray values of the attenuated overlap sub-region and the unattenuated sub-region of image Sz-1 respectively, and a persistence of at least 95% of the image width is required in order to attribute the edge to the overlap border.
Knowledge of the sequences of overlap values O.sub.(z-1,z)rh and shift values O.sub.(z-1,z)rv between successive sub-images Sz, Z=1 . . . Z enables to stitch the sequence of images into one composed image.
a positive overlap value O.sub.(z-1)rh determines the number of rows to drop from the bottom part of image Sz-1,
a negative overlap value O.sub.(z-1, z)rh determines the number of rows to add in at the bottom part of image Sz-1,
a positive shift value O.sub.(z-1,z)rv determines the number of columns the image Sz-1 has to be moved to the left with respect to image Sz,
a negative shift value O.sub.(z-1,z)rv determines the number of columns the image Sz-1 has to be moved to the right with respect to image Sz in the composed image.
Patent CitationsCited PatentFiling datePublication dateApplicantTitleUS4590517 *Mar 21, 1983May 20, 1986Fuji Photo Film Co., Ltd.Subtraction processing method for radiation imagesUS4613983 *Apr 19, 1985Sep 23, 1986Thomson CsfMethod for processing X-ray imagesUS4683377 *Jul 5, 1983Jul 28, 1987Fuji Photo Film Co., Ltd.Subtraction processing method and apparatus for radiation imagesUS4710875 *Mar 21, 1983Dec 1, 1987Fuji Photo Film Co., Ltd.Alignment procedure for radiation images undergoing subtraction processingUS5111045 *Apr 2, 1991May 5, 1992Fuji Photo Film Co., Ltd.Apparatus for recording and reading radiation image informationUS5130541 *May 16, 1991Jul 14, 1992Fuji Photo Film Co., Ltd.Method of and apparatus for recording and reading radiation image* Cited by examinerReferenced byCiting PatentFiling datePublication dateApplicantTitleUS6459094Feb 13, 2001Oct 1, 2002Eastman Kodak CompanyMethod for stitching partial radiation images to reconstruct a full imageUS6563943 *Mar 21, 2000May 13, 2003Fuji Photo Film Co., Ltd.Connection processing method for radiation imagesUS6600831 *Mar 21, 2000Jul 29, 2003Fuji Photo Film Co., Ltd.Connection processing method for radiation imagesUS6628749Sep 26, 2002Sep 30, 2003Siemens Corporate Research, Inc.Systems and methods for intensity correction in CR (computed radiography) mosaic image compositionUS6696691Dec 21, 2000Feb 24, 2004Eastman Kodak CompanyElongated computed radiography cassette having image alignment aidUS6714622 *Jul 19, 2002Mar 30, 2004Siemens AktiengesellschaftMethod and apparatus for producing an overall image from a number of partial imagesUS6714680 *Jun 2, 2000Mar 30, 2004Fuji Photo Film Co., Ltd.Method and apparatus for image positioning processingUS6744062Sep 11, 2001Jun 1, 2004Eastman Kodak CompanyApparatus for radiographically imaging elongated objectsUS6793390Oct 10, 2002Sep 21, 2004Eastman Kodak CompanyMethod for automatic arrangement determination of partial radiation images for reconstructing a stitched full imageUS6852987Dec 20, 2000Feb 8, 2005Eastman Kodak CompanyElongated computed radiography cassetteUS6895076Jun 3, 2003May 17, 2005Ge Medical Systems Global Technology Company, LlcMethods and apparatus for multiple image acquisition on a digital detectorUS6895106Sep 11, 2001May 17, 2005Eastman Kodak CompanyMethod for stitching partial radiation images to reconstruct a full imageUS6944265Nov 25, 2002Sep 13, 2005Ge Medical Systems Global Technology Company, LlcImage pasting using geometry measurement and a flat-panel detectorUS7026621 *Sep 24, 2003Apr 11, 2006Ge Medical Systems Global Technology Co., LlcSystem and method for producing a detector position mapUS7110496 *Jul 21, 2004Sep 19, 2006Science Applications International CorporationPortable system and method for non-intrusive radioscopic imagingUS7110497Mar 29, 2005Sep 19, 2006Ge Medical Systems Global Technology Company, LlcMethods and apparatus for multiple image acquisition on a digital detectorUS7127090Nov 6, 2001Oct 24, 2006Accuimage Diagnostics CorpMethods and systems for combining a plurality of radiographic imagesUS7142638Jun 2, 2005Nov 28, 2006Science Applications International CorporationPortable, digital X-ray apparatus for producing, storing, and displaying electronic radioscopic imagesUS7161166 *Sep 5, 2001Jan 9, 2007Fuji Photo Film Co., Ltd.Signal correcting method for radiation image read-out apparatusesUS7177455Jan 25, 2005Feb 13, 2007General Electric CompanyImage pasting system using a digital detectorUS7186996 *Aug 6, 2004Mar 6, 2007Agfa-GevaertSystem for reading out storage phosphor screensUS7265355Nov 12, 2004Sep 4, 2007Carestream Health, Inc.Method and system for acquiring full spine and full leg images using flat panel digital radiographyUS7289602Oct 26, 2006Oct 30, 2007Science Applications International CorporationPortable, digital X-ray apparatus for producing, storing, and displaying electronic radioscopic imagesUS7336765Aug 10, 2006Feb 26, 2008Science Applications International CorporationPortable system and method for non-intrusive radioscopic imagingUS7400779 *Jan 21, 2004Jul 15, 2008Sharp Laboratories Of America, Inc.Enhancing the quality of decoded quantized imagesUS7522762Apr 16, 2003Apr 21, 2009Inverness Medical-Biostar, Inc.Detection, resolution, and identification of arrayed elementsUS7650022Feb 1, 2005Jan 19, 2010Cedara Software (Usa) LimitedMethods and systems for combining a plurality of radiographic imagesUS7650044Feb 25, 2005Jan 19, 2010Cedara Software (Usa) LimitedMethods and systems for intensity matching of a plurality of radiographic imagesUS7787704Jun 9, 2008Aug 31, 2010Sharp Laboratories Of America, Inc.Enhancing the quality of decoded quantized imagesUS7801351 *Apr 20, 2006Sep 21, 2010General Electric CompanyMethod and system to manage digital medical imagesUS7876926 *Nov 3, 2006Jan 25, 2011Delphi Technologies, Inc.Lane marker detection and fitting methodsUS8213572Aug 11, 2009Jul 3, 2012Minnigh Todd RRetrofitable long-length digital radiography imaging apparatus and methodUS8351568Sep 11, 2009Jan 8, 2013Carestream Health, Inc.Long length multiple detector imaging apparatus and methodUS9155507 *Jun 14, 2012Oct 13, 2015Agfa Healthcare NvMethod to detect and indicate inaccuracies in long length imagingUS20020028011 *Sep 5, 2001Mar 7, 2002Fuji Photo Film Co., Ltd.Signal correcting method for radiation image read-out apparatusesUS20020081010 *Dec 21, 2000Jun 27, 2002Chang Yun C.Method and system for acquiring full spine and full leg images using flat panel digital radiographyUS20020169639 *Aug 2, 2001Nov 14, 2002Jeffrey YuSystems for generating radiology reportsUS20030016787 *Jul 19, 2002Jan 23, 2003Heinz HorbaschekMethod and apparatus for producing an overall image from a number of partial imagesUS20030026469 *Nov 6, 2001Feb 6, 2003Accuimage Diagnostics Corp.Methods and systems for combining a plurality of radiographic imagesUS20030048938 *Sep 11, 2001Mar 13, 2003Xiaohui WangMethod for stitching partial radiation images to reconstruct a full imageUS20040071269 *Oct 10, 2002Apr 15, 2004Eastman Kodak CompanyMethod for automatic arrangement determination of partial radiation images for reconstructing a stitched full imageUS20040101103 *Nov 25, 2002May 27, 2004Warp Richard J.Image pasting using geometry measurement and a flat-panel detectorUS20040208350 *Apr 16, 2003Oct 21, 2004Larry ReaDetection, resolution, and identification of arrayed elementsUS20050061983 *Sep 24, 2003Mar 24, 2005Ge Medical Systems Global Technology Co., LlcSystem and method for producing a detector position mapUS20050104018 *Nov 12, 2004May 19, 2005Chang Yun C.Method and system for acquiring full spine and full leg images using flat panel digital radiographyUS20050129298 *Jan 25, 2005Jun 16, 2005Ge Medical Systems Global Technology Company, LlcImage pasting system using a digital detectorUS20050152614 *Jan 21, 2004Jul 14, 2005Daly Scott J.Enhancing the quality of decoded quantized imagesUS20050169427 *Mar 29, 2005Aug 4, 2005Ge Medical Systems Global Technology Company, LlcMethods and apparatus for multiple image acquisition on a digital detectorUS20050213849 *Feb 25, 2005Sep 29, 2005Accuimage Diagnostics Corp.Methods and systems for intensity matching of a plurality of radiographic imagesUS20050276379 *Jun 2, 2005Dec 15, 2005Science Applications International CorporationPortable, digital X-ray apparatus for producing, storing, and displaying electronic radioscopic imagesUS20060027770 *Aug 6, 2004Feb 9, 2006Luc StruyeSystem for reading out storage phosphor screensUS20070165141 *Apr 20, 2006Jul 19, 2007Yogesh SrinivasMethod and system to manage digital medical imagesUS20080109118 *Nov 3, 2006May 8, 2008Schwartz David ALane marker detection and fittingUS20080279473 *Jun 9, 2008Nov 13, 2008Sharp Laboratories Of America, Inc.Enhancing the quality of decoded quantizes imagesUS20090092602 *Jul 31, 2008Apr 9, 2009Jin-An JiaoUse of anti-tissue factor antibodies for treating thrombosesUS20110038454 *Feb 17, 2011Minnigh Todd RRetrofitable long-length digital radiography imaging apparatus and methodUS20110064193 *Mar 17, 2011Carestream Health, Inc.Long length multiple detector imaging apparatus and methodUS20110216959 *Sep 8, 2011Fujifilm CorporationShading correction device, method and programUS20120106787 *Dec 8, 2009May 3, 2012Azimuth Intellectual Products Pte LtdApparatus and methods for analysing goods packagesUS20140093044 *Jun 14, 2012Apr 3, 2014Agfa Healthcare NvMethod to Detect and Indicate Inaccuracies in Long Length ImagingUS20140264078 *Mar 12, 2013Sep 18, 2014Agfa Healthcare NvRadiation Image Read-Out and Cropping SystemCN100392667CApr 14, 2004Jun 4, 2008热生物之星公司Detection, resolution, and identification of arrayed elementsEP1231484A2Feb 1, 2002Aug 14, 2002Eastman Kodak CompanyMethod for combining partial radiation images to reconstruct a full imageWO2003030104A1 *Sep 30, 2002Apr 10, 2003Siemens Corp Res IncIntensity correction in cr (computed radiography) mosaic image compositionWO2004094977A2 *Apr 14, 2004Nov 4, 2004David D ClarkDetection, resolution, and identification of arrayed elements* Cited by examinerClassifications U.S. Classification250/582, 250/363.08, 250/363.01, 250/363.07, 250/363.02, 378/98.12International ClassificationG01T1/29Cooperative ClassificationG01T1/2012European ClassificationG01T1/29D9Legal EventsDateCodeEventDescriptionMar 5, 1998ASAssignmentOwner name: AGFA-GEVAERT, BELGIUMFree format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:DEWAELE, PIET;REEL/FRAME:009033/0025Effective date: 19980216Apr 25, 2003FPAYFee paymentYear of fee payment: 4Apr 25, 2007FPAYFee paymentYear of fee payment: 8Dec 17, 2007ASAssignmentOwner name: AGFA HEALTHCARE N.V., BELGIUMFree format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:AGFA-GEVAERT N.V.;REEL/FRAME:020254/0713Effective date: 20071108Apr 12, 2011FPAYFee paymentYear of fee payment: 12RotateOriginal ImageGoogle Home - Sitemap - USPTO Bulk Downloads - Privacy Policy - Terms of Service - 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Service Consultant Jobs, Employment in Kansas City, MO
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Customer service orientation. Providing superior customer service. One year of experience in a service industry is preferred....
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Strategic Account Manager - Missouri
Travel within the designated service area is required and some overnight travel will be required. Renovate America is looking for a Strategic Accounts Manager...
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Has external contact with insurance carriers, brokers, vendors, consultants, and law enforcement personnel. Routinely inspects and trains others on DOT hours of...
Help Desk Technician, Technical Consultant
Prepare service delivery tickets, resolve issues using remote support methodologies, document resolution, and close service delivery tickets as part of help...
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Working with our consultants to troubleshoot implementation issues. Becoming an expert in our parent company’s Transaction Services and how it integrates into...
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Rose Gold Graduation Invitation 2018 High School Graduation
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Celebrate your high school or college graduate with this lovely announcement template! Features a handwritten text for a modern and trendy design along with multiple sections for you to show off your graduates photos! The template can also be used for photography marketing for upcoming Promotions, Mini Sessions and Photo Announcements.
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World Cup friendlies - Switzerland draw with Spain, Brazil win, NI beaten - Live - BBC Sport
Odriozola (29' minutes)
Rodríguez (62' minutes)
World Cup friendlies - Switzerland draw with Spain, Brazil win, NI beaten
Odriozola volleys Spain in front against Switzerland
De Gea error allows Rodriguez to earn Swiss a draw
Venegas, Campbell & Calvo with goals for Costa Rica v NI
Neymar and Firmino score for Brazil in win over Croatia
Posted at 21:01 3 Jun21:01 3 Jun
We bid you all farewell. Thanks as ever for your company, we'll be back on Monday for more...
Posted at 20:59 3 Jun20:59 3 Jun
Another defeat for Scotland
Video caption: Highlights - Mexico 1-0 ScotlandHighlights - Mexico 1-0 Scotland
Giovani dos Santos' early goal was enough to ensure a victory for World Cup-bound Mexico as Scotland ended their Americas tour with two defeats.
Dos Santos' side-footed finish off the inside of a post came after only 13 minutes in the Estadio Azteca.
Miguel Layun and Hirving Lozano both hit the woodwork for Mexico.
Scotland's Oli McBurnie did the same, but it was the hosts who dominated and Oribe Peralta also had the ball in the net but was flagged offside.
Posted at 20:58 3 Jun20:58 3 Jun
NI well beaten
Video caption: Highlights: Northern Ireland fall to Costa Rica defeatHighlights: Northern Ireland fall to Costa Rica defeat
Posted at 20:56 3 Jun20:56 3 Jun
Navneet: So England beat Nigeria, Germany lose to Austria, Belgium draw with Portugal and Spain draw with Switzerland. Positive result for England so you know what that means?!?! England won't go far in the world cup again
Posted at 20:55 3 Jun20:55 3 Jun
If you're just tuning in here's what you may have missed...
Posted at 20:52 3 Jun20:52 3 Jun
Not convinced by Rodrigo at international level. He's the weak link in the Spain squad for me. Hopefully they won't need him.
Posted at 20:50 3 Jun20:50 3 Jun
19 unbeaten
Longest unbeaten streaks (running):
Posted at 20:49 3 Jun20:49 3 Jun
Another half chance! Rodrigo can't get his head on to the ball as it is flicked across goal, he just didn't time his jump.
Unlucky! Marco Asensio's free-kick is poor but it comes back to him, it is passed along the 18-yard line with nobody wanting to take it on, and defender Nacho eventually clips a lovely curler around his marker but against the angle of post and bar!
Nacho then heads wide from a corner. Two great chances!
Spain win a free-kick on the edge of the area, wide right. Chance.
Posted at 20:44 3 Jun20:44 3 Jun
Mark: Having watched England impress yesterday and now watching the Spaniards pass it about, I'm afraid to say they are on a different planet
It wasn't Nacho, it was Rodrigo, who had that chance. My mistake. Seconds later Thiago dives in to meet a cross from Nacho Monreal but he heads wide.
Goodness me that was good! Lucas Vazquez plays in Nacho with a ridiculous bit of skill but his Real Madrid team-mate is denied by a fine block from Yann Sommer!
Spain pushing hard for the second goal they deserve.
Into the last 10 minutes. Spain should be annoyed if they don't win this, I know it's only a friendly but they should have put it to bed. Thiago plays a lovely pass with the outside of hs boot for the 17th time this evening.
More changes as Francois Moubandje comes on for Switzerland and Nacho Monreal gets on for Spain. Both sides swap their left-backs.
Posted at 20:32 3 Jun20:32 3 Jun
Aleksander: Haven't seen that from De Gea since his first two games for Man United
Nes: De Gea with a howler, good to get it out of his system whilst with Spain
Anon: With all the recent howlers, I swear Karius has opened a Pandora's Box of goalkeeping blunders!
Spain now fully on top again, Nacho's fine cross from the right is right through the penalty area. Diego Costa would have loved that, but he went off a while back.
Posted at 20:30 3 Jun20:30 3 Jun
A bit of transfer news for you
Brazilian midfielder Fred is expected to finalise his move to Manchester United early this week.
The Shakhtar Donetsk man came on as a second-half substitute in Brazil's 2-0 win against Croatia at Anfield earlier on.
After the match, Brazil coach Tite said he wanted his players' domestic futures sorted out as quickly as possible so they could concentrate their efforts on helping Brazil in Russia.
It is now anticipated Fred will have a medical at United before completing his switch to Old Trafford for a reported £52million.
Provided the deal goes through as anticpated, it would make Fred United manager Jose Mourinho's first signing of the summer, although he is also closing in on the transfer of 19-year-old Porto full-back Diogo Dalot.
Fred, 25, joined Shakhtar in 2013 and was part of the Brazil squad for the 2015 Copa America.
Home TeamSpainAway TeamSwitzerland
12OdriozolaSubstituted forNachoat 70'minutes
18AlbaSubstituted forMonrealat 78'minutes
17Iago AspasSubstituted forVázquezat 45'minutes
6IniestaSubstituted forSaúlat 55'minutesBooked at 57mins
21SilvaSubstituted forAsensioat 60'minutes
19Diego CostaSubstituted forRodrigoat 60'minutes
24Vallejo
26Álvarez
2LichtsteinerSubstituted forLangat 63'minutes
22SchärSubstituted forDjourouat 45'minutes
11BehramiSubstituted forFernandesat 63'minutes
15DzemailiSubstituted forEmboloat 45'minutes
14ZuberBooked at 89mins
9SeferovicSubstituted forDrmicat 45'minutes

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Patent US5528508 - System and method for verifying a hierarchical circuit design - Google PatentsSearch Images Maps Play YouTube News Gmail Drive More »Sign inPatentsA computer-based system and method is provided for building a representation of a hierarchical circuit design and component intrusions for the components making up the circuit design, as well as for verifying a design so-represented. For a subject hierarchical circuit design, a VLSI circuit design component...http://www.google.com/patents/US5528508?utm_source=gb-gplus-sharePatent US5528508 - System and method for verifying a hierarchical circuit designAdvanced Patent SearchTry the new Google Patents, with machine-classified Google Scholar results, and Japanese and South Korean patents.Publication numberUS5528508 APublication typeGrantApplication numberUS 08/019,971Publication dateJun 18, 1996Filing dateFeb 19, 1993Priority dateFeb 19, 1993Fee statusLapsedPublication number019971, 08019971, US 5528508 A, US 5528508A, US-A-5528508, US5528508 A, US5528508AInventorsPhilip J. Russell, Glenwood S. WeinertOriginal AssigneeInternational Business Machines CorporationExport CitationBiBTeX, EndNote, RefManPatent Citations (7), Non-Patent Citations (12), Referenced by (95), Classifications (5), Legal Events (6) External Links: USPTO, USPTO Assignment, EspacenetSystem and method for verifying a hierarchical circuit design
Patent CitationsCited PatentFiling datePublication dateApplicantTitleUS4554625 *Jun 14, 1983Nov 19, 1985International Business Machines CorporationMethod for generating an optimized nested arrangement of constrained rectanglesUS4815003 *Jun 19, 1987Mar 21, 1989General Electric CompanyStructured design method for high density standard cell and macrocell layout of VLSI chipsUS4831543 *Feb 21, 1986May 16, 1989Harris Semiconductor (Patents) Inc.Hierarchical net list derivation systemUS5146583 *Jul 24, 1991Sep 8, 1992Matsushita Electric Industrial Co., Ltd.Logic design system for creating circuit configuration by generating parse tree from hardware description language and optimizing text level redundancy thereofUS5249133 *Apr 10, 1991Sep 28, 1993Sun Microsystems, Inc.Method for the hierarchical comparison of schematics and layouts of electronic componentsUS5262959 *Dec 7, 1990Nov 16, 1993Hewlett-Packard Co.Representation and processing of hierarchical block designsUS5267175 *Apr 5, 1993Nov 30, 1993Digital Equipment CorporationData base access mechanism for rules utilized by a synthesis procedure for logic circuit design* Cited by examinerNon-Patent CitationsReference1C. K. Nandy et al., "Linear Time Geometrical Design Rule Checker Based On Quadtree Representation Of VLSI Mask Layouts", Computer-Aided Design, vol. 18, No. 7, Sep. 1986, pp. 380-388.2 *C. K. Nandy et al., Linear Time Geometrical Design Rule Checker Based On Quadtree Representation Of VLSI Mask Layouts , Computer Aided Design, vol. 18, No. 7, Sep. 1986, pp. 380 388.3C. Niessen, "Hierarchical Design Methodologies And Tools For VLSI Chips", Proceedings Of The IEEE, vol. 71, No. 1, Jan. 1983, pp. 66-75.4 *C. Niessen, Hierarchical Design Methodologies And Tools For VLSI Chips , Proceedings Of The IEEE, vol. 71, No. 1, Jan. 1983, pp. 66 75.5 *IEEE, 1988 The use of inverse layout trees for hierarchical design verification.6 *IEEE, 1992 A Parallel Hierarchical Design Rule Checker.7 *IEEE, 1993 The Halo Algorithm An Algorithm for Hierarchical Design of Rule Checking of VLSI Circuits.8IEEE, 1993 The Halo Algorithm--An Algorithm for Hierarchical Design of Rule Checking of VLSI Circuits.9N. Hedenstierna et al., "The Use Of Inverse Layout Trees For Hierarchical Design Rule Checking", Design Automation Conference, 1989, Paper 32.2, pp. 508-512.10 *N. Hedenstierna et al., The Use Of Inverse Layout Trees For Hierarchical Design Rule Checking , Design Automation Conference, 1989, Paper 32.2, pp. 508 512.11T. Whitney, "A Hierarchical Design-Rule Checking Algorithm", Lambda, First Quarter 1981, pp. 40-43.12 *T. Whitney, A Hierarchical Design Rule Checking Algorithm , Lambda, First Quarter 1981, pp. 40 43.* Cited by examinerReferenced byCiting PatentFiling datePublication dateApplicantTitleUS5636133 *May 19, 1995Jun 3, 1997International Business Machines CorporationEfficient generation of fill shapes for chips and packagesUS5649165 *Mar 3, 1995Jul 15, 1997Fujitsu LimitedTopology-based computer-aided design system for digital circuits and method thereofUS5734798 *Dec 1, 1995Mar 31, 1998Hewlett-Packard Co.Method and apparatus for extracting a gate modeled circuit from a fet modeled circuitUS5787006 *Apr 30, 1996Jul 28, 1998Micron Technology, Inc.Apparatus and method for management of integrated circuit layout verification processesUS5805860 *Jul 5, 1995Sep 8, 1998Sun Microsystems, Inc.Methods, data structures and apparatus for traversing a hierarchical netlistUS5883813 *Mar 4, 1997Mar 16, 1999International Business Machines CorporationAutomatic generation of phase shift masks using net coloringUS5987240 *Jun 30, 1997Nov 16, 1999International Business Machines CorporationDesign rules checker for an integrated circuit designUS6009250 *Sep 30, 1997Dec 28, 1999Synopsys, Inc.Selective flattening in layout areas in computer implemented integrated circuit designUS6009251 *Sep 30, 1997Dec 28, 1999Synopsys, Inc.Method and system for layout verification of an integrated circuit design with reusable subdesignsUS6009252 *Mar 5, 1998Dec 28, 1999Avant! CorporationMethods, apparatus and computer program products for determining equivalencies between integrated circuit schematics and layouts using color symmetrizing matricesUS6011911 *Sep 30, 1997Jan 4, 2000Synopsys, Inc.Layout overlap detection with selective flattening in computer implemented integrated circuit designUS6068663 *Apr 25, 1997May 30, 2000Nec CorporationDesign support system with circuit designing data editing functionUS6083269 *Aug 19, 1997Jul 4, 2000Lsi Logic CorporationDigital integrated circuit design system and methodology with hardwareUS6083276 *Jun 11, 1998Jul 4, 2000Corel, Inc.Creating and configuring component-based applications using a text-based descriptive attribute grammarUS6115546 *Jul 22, 1998Sep 5, 2000Micron Technology, Inc.Apparatus and method for management of integrated circuit layout verification processesUS6117179 *Feb 23, 1998Sep 12, 2000Advanced Micro Devices, Inc.High voltage electrical rule check programUS6189130Apr 30, 1998Feb 13, 2001International Business Machines CorporationSystem and method for determining density maps in hierarchical designsUS6212669Nov 5, 1997Apr 3, 2001Fujitsu LimitedMethod for verifying and representing hardware by decomposition and partitioningUS6363503Nov 24, 1998Mar 26, 2002Autodesk, Inc.Error handling and representation in a computer-aided design environmentUS6487706 *Aug 30, 2000Nov 26, 2002International Business Machines CorporationContract methodology for concurrent hierarchical designUS6560571 *Jun 30, 1999May 6, 2003Hewlett-Packard Development Company, L.P.Method and apparatus for prioritizing the order in which checks are performed on a node in an integrated circuitUS6560758Nov 9, 2000May 6, 2003Fujitsu LimitedMethod for verifying and representing hardware by decomposition and partitioningUS6574788 *Nov 13, 2000Jun 3, 2003Reshape, Inc.Method and system for automatically generating low level program commands as dependency graphs from high level physical design stagesUS6577992May 7, 1999Jun 10, 2003Nassda CorporationTransistor level circuit simulator using hierarchical dataUS6594804 *Nov 22, 1999Jul 15, 2003Averant, Inc.Determining verification coverage using circuit propertiesUS6684376 *Jan 27, 1997Jan 27, 2004Unisys CorporationMethod and apparatus for selecting components within a circuit design databaseUS6735749Mar 21, 2002May 11, 2004Sun Microsystems, Inc.(Design rule check)/(electrical rule check) algorithms using a system resolutionUS6832364Oct 3, 2002Dec 14, 2004International Business Machines CorporationIntegrated lithographic layout optimizationUS6871332Sep 30, 2002Mar 22, 2005Sun Microsystems, Inc.Structure and method for separating geometries in a design layout into multi-wide object classesUS6886140Jan 17, 2002Apr 26, 2005Micron Technology, Inc.Fast algorithm to extract flat information from hierarchical netlistsUS7001693Feb 28, 2003Feb 21, 2006International Business Machines CorporationBinary OPC for assist feature layout optimizationUS7028278May 5, 2003Apr 11, 2006Fujitsu LimitedMethod of verifying and representing hardware by decomposition and partitioningUS7107559 *Oct 29, 2003Sep 12, 2006Lsi Logic CorporationMethod of partitioning an integrated circuit design for physical design verificationUS7111270 *Feb 26, 2003Sep 19, 2006Intel CorporationMethod and apparatus to adaptively validate a physical net routing topology of a substrate designUS7147976Oct 17, 2005Dec 12, 2006International Business Machines CorporationBinary OPC for assist feature layout optimizationUS7168012Feb 20, 2002Jan 23, 2007Autodesk, Inc.Error handling and representation in a computer-aided design environmentUS7240313 *Jun 27, 2003Jul 3, 2007Ttm Technologies, Inc.Method for analyzing material density variations on a multi-layer printed circuit boardUS7266795 *Mar 17, 2005Sep 4, 2007International Business Machines CorporationSystem and method for engine-controlled case splitting within multiple-engine based verification frameworkUS7266800Jun 4, 2004Sep 4, 2007Invarium, Inc.Method and system for designing manufacturable patterns that account for the pattern- and position-dependent nature of patterning processesUS7318214May 7, 2004Jan 8, 2008Invarium, Inc.System and method for reducing patterning variability in integrated circuit manufacturing through mask layout correctionsUS7328195Nov 20, 2002Feb 5, 2008Ftl Systems, Inc.Semi-automatic generation of behavior models continuous value using iterative probing of a device or existing component modelUS7401319Dec 23, 2004Jul 15, 2008Invarium, Inc.Method and system for reticle-wide hierarchy management for representational and computational reuse in integrated circuit layout designUS7444603 *Dec 15, 2006Oct 28, 2008Xilinx, Inc.Transformation of graphs representing an electronic design in a high modeling systemUS7475376Jun 6, 2006Jan 6, 2009Qimonda AgMethod and system for performing non-local geometric operations for the layout design of a semiconductor deviceUS7588868Oct 22, 2004Sep 15, 2009Cadence Design Systems, Inc.Method and system for reducing the impact of across-wafer variations on critical dimension measurementsUS7617464 *May 20, 2005Nov 10, 2009Synopsys, Inc.Verifying an IC layout in individual regions and combining resultsUS7667821Feb 23, 2005Feb 23, 2010Taiwan Semiconductor Manufacturing Co., Ltd.Multi-focus scanning with a tilted mask or waferUS7673263Feb 13, 2006Mar 2, 2010Fujitsu LimitedMethod for verifying and representing hardware by decomposition and partitioningUS7840930 *Apr 14, 2008Nov 23, 2010Fujitsu LimitedSignal connection program, method, and device of hierarchical logic circuitUS7908437 *Jun 2, 2008Mar 15, 2011International Busines Machines CorporationMethod and system for efficient fragment cachingUS7945872Sep 14, 2009May 17, 2011Synopsys, Inc.Verifying an IC layout in individual regions and combining resultsUS7984392 *Jan 5, 2009Jul 19, 2011Nanya Technology Corp.Matching method for designing layout patterns on a photomask from inverse lithographyUS8006207Aug 26, 2008Aug 23, 2011International Business Machines CorporationParallel intrusion search in hierarchical VLSI designs with substituting scan lineUS8055610 *Sep 30, 2008Nov 8, 2011International Business Machines CorporationApparatus, system, and method for processing MDX post-order hierarchize expressionsUS8063787Dec 16, 2009Nov 22, 2011Parker Kevin LPoint-of-use status indicatorUS8192902May 4, 2011Jun 5, 2012Nanya Technology Corp.Replaced photomaskUS8407228Mar 26, 2010Mar 26, 2013Cadence Design Systems, IncMethod and mechanism for maintaining existence information for electronic layout dataUS8413087Mar 26, 2010Apr 2, 2013Cadence Design Systems, Inc.Method and mechanism for implementing region query using hierarchical gridsUS8413093 *Dec 23, 2010Apr 2, 2013Cadence Design Systems, Inc.Method and mechanism for performing region query using hierarchical gridsUS8453091Dec 23, 2010May 28, 2013Cadence Design Systems, Inc.Method and mechanism for managing hierarchical data for implementing region queryUS9176760 *Sep 24, 2013Nov 3, 2015Qualcomm IncorporatedFast, combined forwards-backwards pass global optimization framework for dynamic compilersUS9292643 *May 10, 2010Mar 22, 2016Mentor Graphics CorporationMask creation with hierarchy management using cover cellsUS20020083377 *Feb 20, 2002Jun 27, 2002Clauss James M.Error handling and representation in a computer-aided design environmentUS20030139842 *Jan 17, 2002Jul 24, 2003Micron Technology, Inc.Fast algorithm to extract flat information from hierarchical netlistsUS20030154061 *Nov 20, 2002Aug 14, 2003Willis John ChristopherMethod for semi-automatic generation and behavioral comparison of modelsUS20040015799 *May 5, 2003Jan 22, 2004Fujitsu LimitedMethod of verifying and representing hardware by decomposition and partitioningUS20040019862 *Sep 30, 2002Jan 29, 2004Sun Microsystems, Inc.Structure and method for separating geometries in a design layout into multi-wide object classesUS20040068712 *Oct 3, 2002Apr 8, 2004International Business Machines CorporationIntegrated lithographic layout optimizationUS20040168138 *Feb 26, 2003Aug 26, 2004Neal Brett A.Method and apparatus to adaptively validate a physical net routing topology of a substrate designUS20040170905 *Feb 28, 2003Sep 2, 2004International Business Machines CorporationBinary OPC for assist feature layout optimizationUS20050008319 *Jun 27, 2003Jan 13, 2005Cameron Andrew JamesMethod for analyzing material density variations on a multi-layer printed circuit boardUS20050097488 *Oct 29, 2003May 5, 2005Viswanathan LakshmananMethod of partitioning an integrated circuit design for physical design verificationUS20050273753 *Jun 4, 2004Dec 8, 2005Invarium, Inc.Method and system for designing manufacturable patterns that account for the pattern- and position-dependent nature of patterning processesUS20060057475 *Oct 17, 2005Mar 16, 2006Liebmann Lars WBinary OPC for assist feature layout optimizationUS20060073686 *Oct 22, 2004Apr 6, 2006Zach Franz XMethod and system for reducing the impact of across-wafer variations on critical dimension measurementsUS20060117279 *Jan 5, 2006Jun 1, 2006Van Ginneken Lukas PMethod for storing multiple levels of design data in a common databaseUS20060143589 *Dec 23, 2004Jun 29, 2006Invarium, Inc.Method and system for reticle-wide hierarchy management for representational and computational reuse in integrated circuit layout designUS20060230370 *Mar 17, 2005Oct 12, 2006International Business Machines CorporationSystem and method for engine-controlled case splitting within a multiple-engine based verification frameworkUS20060265675 *May 20, 2005Nov 23, 2006Synopsys, Inc.Verifying an IC layout in individual regions and combining resultsUS20070011636 *Jun 6, 2006Jan 11, 2007Alexander SeidlMethod and system for performing non-local geometric operations for the layout design of a semiconductor deviceUS20070011637 *Jun 6, 2006Jan 11, 2007Alexander SeidlMethod and system for performing local geometrical operation on a hierarchical layout of a semiconductor deviceUS20070245419 *Apr 29, 2005Oct 18, 2007Padraig OmahonyIntrusion detection during program execution in a computerUS20080209364 *May 1, 2008Aug 28, 2008Van Ginneken Lukas P P PMethod for storing multiple levels of design data in a common databaseUS20080222591 *Apr 14, 2008Sep 11, 2008Fujitsu LimitedSignal connection program, method, and device of hierarchical logic circuitUS20080229019 *Jun 2, 2008Sep 18, 2008James Robert Harold ChallengerMethod and system for efficient fragment cachingUS20100005434 *Sep 14, 2009Jan 7, 2010Yulan WangVerifying an ic layout in individual regions and combining resultsUS20100058265 *Aug 26, 2008Mar 4, 2010International Business Machines CorporationParallel Intrusion Search in Hierarchical VLSI Designs with Substituting Scan LineUS20100082525 *Sep 30, 2008Apr 1, 2010International Business Machines CorporationApparatus, system, and method for processing mdx post-order hierarchize expressionsUS20100104954 *Jan 5, 2009Apr 29, 2010Nanya Technology Corp.Matching method of pattern layouts from inverse lithographyUS20100287521 *May 10, 2010Nov 11, 2010Sahouria Emile YMask creation with hierarchy management using cover cellsUS20110140901 *Dec 16, 2009Jun 16, 2011Schneider Electric USA, Inc.Point-of-use status indicatorUS20110207034 *May 4, 2011Aug 25, 2011Nanya Technology Corp.Matching method of pattern layouts from inverse lithographyUS20150089484 *Sep 24, 2013Mar 26, 2015Qualcomm IncorporatedFast, Combined Forwards-Backwards Pass Global Optimization Framework for Dynamic CompilersUS20160019039 *Sep 28, 2015Jan 21, 2016Qualcomm IncorporatedFast, Combined Forwards-Backwards Pass Global Optimization Framework for Dynamic CompilersWO2003046775A1 *Nov 21, 2002Jun 5, 2003Ftl Systems, Inc.Method for semi-automatic generation and behavioral comparison of models* Cited by examinerClassifications U.S. Classification716/52, 716/55International ClassificationG06F17/50Cooperative ClassificationG06F17/5081European ClassificationG06F17/50L3Legal EventsDateCodeEventDescriptionFeb 19, 1993ASAssignmentOwner name: INTERNATIONAL BUSINESS MACHINES, INC., NEW YORKFree format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNORS:RUSSELL, PHILIP J.;WEINERT, GLENWOOD S.;REEL/FRAME:006446/0383Effective date: 19930219Sep 8, 1999FPAYFee paymentYear of fee payment: 4Sep 25, 2003FPAYFee paymentYear of fee payment: 8Dec 24, 2007REMIMaintenance fee reminder mailedJun 18, 2008LAPSLapse for failure to pay maintenance feesAug 5, 2008FPExpired due to failure to pay maintenance feeEffective date: 20080618RotateOriginal ImageGoogle Home - Sitemap - USPTO Bulk Downloads - Privacy Policy - Terms of Service - About Google Patents - Send FeedbackData provided by IFI CLAIMS Patent Services

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Talk:Atkins (company) - Wikipedia
Talk:Atkins (company)
Thomaswalkerstowell (talk · contribs) This user has contributed to the article.
1 File:Bahrain WTC day.JPG Nominated for Deletion
2 Architectural importance
File:Bahrain WTC day.JPG Nominated for Deletion[edit]
An image used in this article, File:Bahrain WTC day.JPG, has been nominated for deletion at Wikimedia Commons for the following reason: Deletion requests June 2011
This notification is provided by a Bot --CommonsNotificationBot (talk) 12:50, 3 June 2011 (UTC)
Architectural importance[edit]
Thought the article barely mentions Atkins' large architecture wing, they are named (in other articles) as the architects to some very notable international buildings - 'high importance' seems a fair assessment. Sionk (talk) 23:59, 1 December 2011 (UTC)
Unlike other articles on major corporates operating in the UK construction industry (Balfour Beatty etc) the vast majority of the notable projects in this article are unsourced. Some of these look completely non-notable to me e.g. "Highways management services for Cambridgeshire County Council". I would suggest that all unsourced material is deleted from this section per WP:SOURCE. Dormskirk (talk) 10:00, 27 May 2013 (UTC)
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