text:
 Patio Pacific Hotel in Boracay Island - Room Deals, Photos & Reviews
Book Patio Pacific Hotel
Deluxe Room West - Room plan
Patio Pacific Hotel Reviews
"The employees are courteous and kind, one of them even remem..."
Things you’ll love about Patio Pacific Hotel
White Beach680 m
Bulabog Beach730 m
Willy's Rock950 m
Mount Luho1.59 km
Diniwid Beach1.72 km
Ilig Iligan Beach2.59 km
Punta Bunga Beach2.71 km
Cagban Beach3.21 km
Puka Beach3.46 km
Ariel's Point12.22 km
Rooms available at Patio Pacific Hotel
What people love about Patio Pacific Hotel
"I love this hotel because the staff are courteous and always smiling."
"Well the hotel is very clean and the staff is very nice."
"Nonetheless, very peaceful hotel, central but secluded, excellent breakfast, good meals via room service."
Ariel's Point - 12.22 km
Reviews of Patio Pacific Hotel from real guests
Agoda Reviews (484)Booking.com Reviews (45)
We will stay here again, for sure! :)”
Location, affordable, facilities
No complaints! not beach front but a short trek (about 2 to 3 mins) through a safe alleyway will take you there. The pool was small but nice and clean. i loved that they have a gym so managed to get a quick workout before bathing under the always magnificent boracay sun. Breakfast was alright (all-you-can-eat but limited to breakfast food, about 10 to 15 choices) but when you're at the beach i don't assume you'd want to really load up though :) Staff was friendly and attentive - this goes for most of the folks in the island paradise anyway.
Accommodating and Friendly Smiling Staff”
swimming pool and features of the hotel
i really like the accommodating and friendly, smiling staff of the hotel. they welcome us with the smile and accommodate us to our hotel. they even help us and advise us regarding to our flight schedule. thanks for there accommodation, we really appreciate it!
Nice & clean hotel with a smile”
1 mins walk to beach (station 2), 2 mins walk to D-mall
i got a free upgrade to superior room. the room was nice & clean. comes with complementary welcome drinks. 1 mins walk to beach (station 2), 2 mins walk to d-mall. staffs are able to speak good english but they know nothing about airport terminal fees.
thuthu from Myanmar
Enuraisa from Philippines


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Rice not planning to report - Nfl - Scout
Rice not planning to reportAaron Wilson04/02/2012Although Baltimore Ravens Pro Bowl running back Ray Rice indicated today during the unveiling of the new Nike uniforms that he looks forward to attending offseason workouts, sources close to the situation stressed that Rice won't be reporting until he has a new contract.Rice has been designated as the Ravens' franchise player, at a cost of $7.742 million.
Under NFL rules governing franchise players, Rice doesn't have to attend offseason activities, training camp or games until he signs his one-year tender.
"I look forward to being there," Rice told the Ravens' official website when asked today in New York about whether he'll attend offseason workouts.
Rice has been consistent in taking the high road when it comes to the negotiations, but sources emphasized that the versatile star runner has no plans to attend offseason workouts until a contract has been finalized.
Rice also said: "I think progress is being made, but I know things don't happen overnight," adding: "If they want to get a deal done, we'll get a deal done."
The Ravens have a history of getting contract extensions done with past franchise players, including defensive tackle Haloti Ngata, outside linebacker Terrell Suggs and cornerback Chris McAlister.
The Ravens have until July 15 to get a long-term deal done for Rice. Otherwise, he'll play under the franchise tag this season.
Rice rushed for a career-high 1,364 yards last season, setting a franchise single-season record with 15 total touchdowns.
Rice is a two-time Pro Bowl selection who finished last season with a career-high 2,068 yards from scrimmage to lead the NFL.
He also caught 76 passes for 704 yards and three touchdowns.
For his career, Rice has rushed for 4,377 yards and 24 touchdowns while catching 250 passes for 2,235 yards and five touchdowns.
Follow me on Twitter: @RavensInsider Share on Facebook Share on TwitterTrending on ScoutArmy Chinook to Get New Weapons, SensorsSpeight connects with refugees in RomeCougs top Huskies again, go for sweep SundayCal Comes Back to Beat USC AgainAbrams Tanks to Control Robotic Attack DronesShare & EmbedDoes Lynch Have It In Him To Lead A Team? Full StoryScout NFL Network Top StoriesNewly signed Murray has surgeryLatavius Murray, the Minnesota Vikings’ replacement for Adrian Peterson had surgery, the team announced Wednesday.by Tim YotterViking Update03/22/2017NFL looking to cut down commercial timeNFL commissioner Roger Goodell is looking to make the game a better viewing experience for fans.by Tim YotterScout NFL Network03/22/2017Over-under stat lines for free-agent moversSeveral playmakers moved teams in NFL free agency (or trades), but the expectations aren’t that high, according to one gambling site.by Tim YotterScout NFL Network03/22/2017Giants sign veteran RB Shaun DraughnThe journeyman running back is excited to be back in the playoff hunt.by Alex EvansThe Giants Beat03/22/2017Zimmer talks state of the VikingsMike Zimmer made an appearance on KFAN Tuesday and got hit with questions from all sides about the state of his Minnesota Vikings.by John HollerViking Update03/22/2017A Cowboys How-To Trade For CB Richard ShermanWe've Got A Dallas Cowboys How-To - And Why To - Trade For CB Richard Sherman, And We've Got Notes On Pre-Draft Visits To The Star In Frisco ...by Joey IckesCowboysHQ03/22/2017Bears sign RB Benny CunninghamThe Chicago Bears have signed former Rams RB Benny Cunningham.by Jeremy StoltzBear Report03/21/2017Packers Hosting DL Jean FrancoisRicky Jean Francois, who was released by the Redskins last week, is set to visit the Green Bay Packers.by Bill HuberPacker Report03/21/2017Does Lynch Have It In Him To Lead A Team?The Broncos have challenged Paxton Lynch to be a leader in his second year. But does he have it in him?by Adam UribesMile High Huddle03/21/2017Steelers Sign Ironman AlualuThe Steelers found quality depth for the defensive line in Tyson Alualu.by Jim WexellSteel City Insider03/21/2017Finding Broncos: Bucky Hodges, TEThe Broncos are looking to upgrade their tight end corps. Could Bucky Hodges be the answer? Senior Draft Analyst Erick Trickel scouts the big Hokie.by Erick TrickelMile High Huddle9:17 AMNFL Draft Preview: Outside LinebackerThe Packers have a big need at outside linebacker. Fortunately for them, a loaded draft class awaits. Here is the scoop on our top 31 prospects.by Bill HuberPacker Report7:04 AMLoad More

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Astrographology - The Hidden Link Between Your Horoscope and Your Handwriting book by Darrelyn Gunzburg | 1 available editions | Alibris Books
Handwriting is more than just a means of communication. Each time a person picks up a pen, he creates his own art which draws from all the light and dark areas of his natal chart. Learning how to spot the natal aspects in handwriting can open a whole new door to the hidden potential within one's horoscope. Read More
Handwriting is more than just a means of communication. Each time a person picks up a pen, he creates his own art which draws from all the light and dark areas of his natal chart. Learning how to spot the natal aspects in handwriting can open a whole new door to the hidden potential within one's horoscope. Read Less
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New in New jacket. Astrographology-The Hidden Link Between Your Horoscope and Your Handwriting (Paperback or Softback)
Starting at $11,321.20

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Words containing cobje | Words that contain cobje
http://www.thefreedictionary.com/words-containing-cobje
Dictionary, Encyclopedia and Thesaurus - The Free Dictionary 10,379,766,350 visitors served
Words containing cobje
Found 1 words containing cobje. Browse our Scrabble Word Finder, Words With Friends cheat dictionary, and WordHub word solver to find words that contain cobje. Or use our Unscramble word solver to find your best possible play!
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value: This website is an American online dictionary and encyclopedia that aggregates information from various sources.


text:
Patent US8089205 - Wiring board with groove in which wiring can move, image display apparatus ... - Google PatentsSearch Images Maps Play YouTube News Gmail Drive More »Sign inAdvanced Patent SearchPatentsA wiring board has a substrate having a groove on its surface, a first wiring placed in the groove, a plurality of bonding members located at mutually separated positions and each of which bonds the first wiring and the substrate. A gap is located between the first wiring and the surface of the groo...http://www.google.com/patents/US8089205?utm_source=gb-gplus-sharePatent US8089205 - Wiring board with groove in which wiring can move, image display apparatus, and image reproducing apparatusAdvanced Patent SearchPublication numberUS8089205 B2Publication typeGrantApplication numberUS 12/296,016Publication dateJan 3, 2012Filing dateMay 31, 2007Priority dateJun 15, 2006Also published asUS20090161022, WO2007145123A1Publication number12296016, 296016, US 8089205 B2, US 8089205B2, US-B2-8089205, US8089205 B2, US8089205B2InventorsYoshio Suzuki, Kazuya IshiwataOriginal AssigneeCanon Kabushiki KaishaExport CitationBiBTeX, EndNote, RefManPatent Citations (28), Non-Patent Citations (3), Classifications (26), Legal Events (1) External Links: USPTO, USPTO Assignment, EspacenetWiring board with groove in which wiring can move, image display apparatus, and image reproducing apparatus
This Application is a National Stage filing under 35 U.S.C. �371 of International Application No. PCT/JP2007/061494, filed May 31, 2007, and claims priority to Japanese Patent Application No. 2006-166081, filed Jun. 15, 2006, which is incorporated by reference herein in its entirety, as if set forth fully herein.
The condition which prevents cracks is not found out clearly. In the case where a glass substrate whose thermal expansion coefficient is about 8 to 9�10−6 and a filling material in grooves whose main component Ag has a thermal expansion coefficient of 19�10−6 are used, the difference in the thermal expansion coefficients becomes large. As a result, the probability that cracks are generated becomes high. For this reason, the degree of material selecting flexibility becomes low, and thus structural design should be schemed.
The gap 4 is provided between the first wiring 3 and the surface of the groove 2. The plurality of insulating layers 5 bond (fasten) the first wiring 3 and the substrate 1 exceeding the gap 4 in a direction which crosses a direction where the first wiring extends. As a result, the first wiring 3 is fixed into the groove 2. FIGS. 1A and 1B illustrate a state that the substrate 1 and the first wiring 3 are separated in the groove 2. The present invention, however, does not exclude the mode that the glass substrate 1 comes in contact with the first wiring 3 in some places in a section which is parallel with the section b-b′ and different from the section b-b′ (for example, a place which is not covered with the insulating layers 5). For example in FIG. 1B, at least any one of the left side, right side, and the bottom portion of the first wiring 3 possibly comes in contact with the surface of the groove 2. In the present invention, however, it is preferable that the wiring 3 is separated from the surface of the groove 2 in as many places as possible. The plurality of insulating layers 5 are separated from each other, and practically their gaps are preferably set to be larger than � of the width of the groove 2. In such a mode, the surface of the groove 2 and the first wiring 3 are not firmly fastened, and the first wiring 3 and the substrate 1 are not fastened except the bonding by the insulating layers 5 provided at gaps. For this reason, even if the first wiring 3 expands or constricts in the groove 2, an adverse influence on the surface of the substrate 1 due to the expansion and constriction of the wiring 3 (generation of cracks) can be reduced. In other words, in the present invention, the first wiring 3 and the surface of the groove 2 (the inner wall of the groove 2) are not practically fastened and the substrate 1 and the first wiring 3 are fastened via the insulating layers 5. For this reason, the wiring 3 can move in the groove 2. Therefore, the most ideal constitution of the wiring board in the present invention is such that the wiring 3 does not come in contact with the surface of the groove 2 (the surface of the substrate 1 positioned in the groove 2) and is fixed to the substrate 1 by the insulating layers 5.
(Step 2) After the groove 2 formed at step 1 is filled with Ag paste (silver paste) as a material of the first wiring 3 by a screen printing method, the solvent is dried and evaporated at 80 to 120� C. Thereafter, the glass substrate 1 filled with the Ag paste is baked at 400 to 500� C. At this time, when the Ag paste whose frit component content is small is used, the wiring 3 is easily peeled from the surface of the groove 2 (the inner wall of the groove 2) at the time of baking the paste, so that the gap 4 is formed between the first wiring 3 (Ag wiring) and the surface of the groove 2 (FIG. 2B).
(Step 3) In this embodiment, the plurality of the insulating layers 5 as a glass material whose softening point is lower than a melting point of the substrate 1 (in the case of the glass substrate, a softening point) are formed discretely (separated from each other). As a result, the first wiring 3 is fixed into the groove 2 in a state that the gap 4 is maintained. Each of the insulating layers 5 can be formed by applying the insulating paste to predetermined portions and baking it. Concretely, an insulating paste material containing lead oxide or bismuth oxide (low-melting point glass paste mainly containing glass having glass transition temperature of 600� C. or less) is prepared. The insulating paste is printed in the predetermined places (a plurality of places) by a screen printing method, for example, and after the solvent is dried at 80 to 120� C., it is baked at 400 to 500� C. As a result, the plurality of the insulating layers 5 are formed discretely.
The Ag paste is dropped into the groove 2 so as to be printed by the screen printing method. Thereafter, the solvent is dried at 80 to 120� C. and is baked at peak temperature of 480� C. in the atmosphere, so that the first wiring 3 (Ag wiring (X-directional wiring)) is formed (FIG. 3C). At this time, the content of the glass frit component in the Ag paste is set to not less than 0.2 wt % to less than 1 wt % with respect to Ag in the Ag paste (in this embodiment, 0.8 wt %). As a result, the first wiring 3 is separated from the surface of the groove 2 at the time of baking and constriction of the Ag material, and the gap 4 of not less than 5 μm to not more than 20 μm is formed. The filling amount of the Ag paste is adjusted so that the thickness of the baked first wiring 3 is equivalent to the depth of the groove 2. The first wiring 3 mainly contains Ag, but the main component of the first wiring 3 is not limited to Ag and various metal materials such as Cu and Ni can be used.
The generation of cracks is not always determined only by the glass frit content. The content of glass frit, component as solid component included in the finally obtained, wiring 3 is repressed to less than 1 wt % based on another experimental results or the like. As a result, the strong bonding force of the surface of the glass substrate is not generated under most of the wiring board manufacturing conditions (cracks are not generated), and the gap 4 is formed between the wiring and the surface of the groove 2. The content of the solid component is substantially equivalent to the content in the finally obtained wiring 3. For example, the Ag paste contains a solvent or the like, and since the solvent is substantially destroyed by the baking process at the time of obtaining the wiring 3, the finally obtained wiring 3 does not substantially contain the solvent. A member which is destroyed, and does not finally remain in the wiring 3 at the process for obtaining the wiring 3 such as the baking does not correspond to �the solid component�.
In the third embodiment, the electron source manufactured in the first, embodiment and a face plate substrate are arranged in an opposing manner, and a flat panel display 108 shown in FIG. 4 (corresponding to the �image display apparatus� of the present invention) is manufactured.
A face plate substrate 106 is arranged 4 mm above the electron source manufactured in the first embodiment via a supporting frame 102, and frit glass is applied to respective joint portions of the face plate substrate 106, the supporting frame 102, and the electron source, and is sealed. The face plate substrate 106 includes a luminescent film 104 (corresponding to the �luminescent member� of the present invention) and a metal back 105 which are on an inner surface of a glass substrate 103. The luminescent film 104 emits light by emitting electrons discharged from the electron source thereto.
Patent CitationsCited PatentFiling datePublication dateApplicantTitleUS4010395Feb 9, 1976Mar 1, 1977Burroughs CorporationGas discharge display panel with cell-firing means having glow spreading electrodeUS5429670 *Feb 10, 1994Jul 4, 1995Matsushita Electric Industrial Co., Ltd.Gold paste for a ceramic circuit boardUS5977698 *Jul 16, 1998Nov 2, 1999Micron Technology, Inc.Cold-cathode emitter and method for forming the sameUS6198618 *May 19, 1999Mar 6, 2001Murata Manufacturing Co., Ltd.Conductive paste and ceramic electronic part including the sameUS6466112Dec 27, 1999Oct 15, 2002Dynamic Solutions International, Inc.Coaxial type signal line and manufacturing method thereofUS6653232Jul 31, 2002Nov 25, 2003Canon Kabushiki KaishaMethod of manufacturing member pattern and method of manufacturing wiring, circuit substrate, electron source, and image-forming apparatusUS6758712Dec 11, 2001Jul 6, 2004Canon Kabushiki KaishaMethods of manufacturing wiring substrate and electron source substrate and image forming apparatus with the sameUS6803707May 2, 2001Oct 12, 2004Canon Kabushiki KaishaElectron source having an insulating layer with metal oxide particlesUS6815884May 3, 2001Nov 9, 2004Canon Kabushiki KaishaElectron source forming substrate, and electron source and image display apparatus using the sameUS6853117Jul 31, 2002Feb 8, 2005Canon Kabushiki KaishaElectron source and producing method thereforUS6866989Sep 6, 2002Mar 15, 2005Canon Kabushiki KaishaExposing a photosensitive paste provided on the substrate through masks of a predetermined pattern, developing and firingUS6902455Sep 12, 2002Jun 7, 2005Canon Kabushiki KaishaMethod of manufacturing member pattern, electron source, and image display deviceUS6903504Jan 22, 2003Jun 7, 2005Canon Kabushiki KaishaElectron source plate, image-forming apparatus using the same, and fabricating method thereofUS7064475Dec 22, 2003Jun 20, 2006Canon Kabushiki KaishaElectron source structure covered with resistance filmUS7095168May 1, 2001Aug 22, 2006Canon Kabushiki KaishaElectron source forming substrate, and electron source and image display apparatus using the sameUS7211943May 2, 2005May 1, 2007Canon Kabushiki KaishaElectron source plate, image-forming apparatus using the same, and fabricating method thereofUS7285428Jan 21, 2005Oct 23, 2007Canon Kabushiki KaishaProduction method of electron source and image displayUS7318996Aug 9, 2004Jan 15, 2008Canon Kabushiki KaishaMethod for forming patterned insulating elements and methods for making electron source and image display deviceUS7435535May 2, 2006Oct 14, 2008Canon Kabushiki KaishaMethod for forming patterned insulating elements and methods for making electron source and image display deviceUS7442404Apr 19, 2006Oct 28, 2008Canon Kabushiki KaishaElectronic device, electron source and manufacturing method for electronic deviceUS7458872Dec 21, 2004Dec 2, 2008Canon Kabushiki KaishaMethod of manufacturing electron-emitting device, electron source, and image display deviceUS20040150310 *Jan 21, 2004Aug 5, 2004Canon Kabushiki KaishaElectrifying method and manufacturing method of electron-source substrateUS20080001516 *Jun 21, 2007Jan 3, 2008Canon Kabushiki KaishaElectron source, image display apparatus, image reproducing apparatus, wiring board, and manufacturing method of wiring boardUS20080001517 *Jun 25, 2007Jan 3, 2008Canon Kabushiki KaishaElectron source, image display apparatus, image reproducing apparatus, wiring board, and electronic deviceUS20080005899 *Jun 12, 2007Jan 10, 2008Canon Kabushiki KaishaManufacturing method of wiring board, manufacturing method of electron source, manufacturing method of image display apparatus and image reproducing apparatusJP2002203475A Title not availableJP2004342547A * Title not availableJP2006066337A Title not available* Cited by examinerNon-Patent CitationsReference1 *Machine translation of Sakamoto, JP 2004-342547A.2PCT Notification Concerning Transmittal of International Preliminary Report on Patentability (Chapter I of the Patent Cooperation Treaty) dated Dec. 31, 2008; International Preliminary Report on Patentability (Chapter I of the Patent Cooperation Treaty); Written Opinion of the International Searching Authority of International Application No. PCT/JP2007/061494.3XP-002456842, Product news 2004, "A Concrete Floor Heating Revolution", Ebeco Cable Board (1 sheet).* Cited by examinerClassifications U.S. Classification313/310, 29/846, 313/496, 29/829, 313/497, 174/250, 361/748International ClassificationH01J63/04, H01J29/04, H01J31/12, H01J1/316, H01J9/02, H05K1/00Cooperative ClassificationH05K3/1258, H05K1/092, H05K2201/09909, H05K3/4092, H05K3/107, H01J9/027, H01J29/02, H05K2201/09109European ClassificationH05K3/10E, H05K3/12D, H05K3/40T, H01J9/02B4, H01J29/02Legal EventsDateCodeEventDescriptionOct 31, 2008ASAssignmentOwner name: CANON KABUSHIKI KAISHA,JAPANFree format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:SUZUKI, YOSHIO;ISHIWATA, KAZUYA;SIGNED BETWEEN 20080910 AND 20080911;US-ASSIGNMENT DATABASE UPDATED:20100304;REEL/FRAME:21766/695Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:SUZUKI, YOSHIO;ISHIWATA, KAZUYA;SIGNING DATES FROM 20080910 TO 20080911;REEL/FRAME:021766/0695Owner name: CANON KABUSHIKI KAISHA, JAPANRotateOriginal ImageGoogle Home - Sitemap - USPTO Bulk Downloads - Privacy Policy - Terms of Service - About Google Patents - Send FeedbackData provided by IFI CLAIMS Patent Services

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Film, Video, San Francisco, Theodore Roosevelt: His Life and Times on Film, Video | Library of Congress
Results: 1-2 of 2 | Refined by: Original Format: Film, Video Remove Location: San Francisco Remove Part of: Theodore Roosevelt: His Life and Times on Film Remove Online Format: Video Remove

value: This website is the research library that officially serves the United States Congress and is the de facto national library of the United States. It is the oldest federal cultural institution in the United States.


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Hair Guru719 in Colorado Springs, CO | Groupon
Shampoo, Cut, and Style with Optional Partial or Full Highlights from Darla at HairGuru719 (Up to 63% Off)
Hair Guru719 Pulpit Rock
Kerri W. · February 1, 2013
$35 for a partial-highlights package (a $95 total value)
$44 for a full-highlights package (a $115 total value)
Promotional value expires Jan 31, 2013. Amount paid never expires. Limit 1 per person, may buy 1 additional as a gift. Limit 1 per visit. Valid only for option purchased. For haircut, style, and shampoo option, 24hr cancellation notice or a $17 fee may apply. For full or partial highlight options, 24hr cancellation notice or a $25 fee may apply. New customers only. Services must be used by the same person. Must use promotional value in 1 visit. Merchant is solely responsible to purchasers for the care and quality of the advertised goods and services.
About HairGuru719
Hair stylist Darla of HairGuru719 can be found at her station inside Awesome Salon, cutting hair with the skills she’s learned over 20 years as a professional and several years as an amateur., Cutting hair "is all I remember wanting to do since I was really little," she said. "My mom told me that when I was about three, I got a hold of some clippers and shaved our Saint Bernard." It didn't stop there. She and a friend played a lot of beauty shop, during which Darla couldn't resist actually cutting her friend's hair with safety scissors. It was only a matter of time before she became a professional, and today, Darla continues to customize stylish cuts and colors for clients.
Hair Guru719

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Buffalo to Bratislava Flights: Cheap Flights from BUF to BTS | Expedia
Cheap Flights from Buffalo to Bratislava Flight onlyFlight + Hotel HotelsPlease correct the errors belowDestinationCheck-inCheck-outRooms123456789+Adults (18+)1234567891011121314Children (0-17)0123456Child 1: Age <11234567891011121314151617Child 2: Age <11234567891011121314151617Child 3: Age <11234567891011121314151617Child 4: Age <11234567891011121314151617Child 5: Age <11234567891011121314151617Child 6: Age <11234567891011121314151617Room 1Adults (18+)1234567891011121314Children (0-17)0123456Child 1: Age <11234567891011121314151617Child 2: Age <11234567891011121314151617Child 3: Age <11234567891011121314151617Child 4: Age <11234567891011121314151617Child 5: Age <11234567891011121314151617Child 6: Age <11234567891011121314151617Room 2Adults (18+)1234567891011121314Children (0-17)0123456Child 1: Age <11234567891011121314151617Child 2: Age <11234567891011121314151617Child 3: Age <11234567891011121314151617Child 4: Age <11234567891011121314151617Child 5: Age <11234567891011121314151617Child 6: Age <11234567891011121314151617Room 3Adults (18+)1234567891011121314Children (0-17)0123456Child 1: Age <11234567891011121314151617Child 2: Age <11234567891011121314151617Child 3: Age <11234567891011121314151617Child 4: Age <11234567891011121314151617Child 5: Age <11234567891011121314151617Child 6: Age <11234567891011121314151617Room 4Adults (18+)1234567891011121314Children (0-17)0123456Child 1: Age <11234567891011121314151617Child 2: Age <11234567891011121314151617Child 3: Age <11234567891011121314151617Child 4: Age <11234567891011121314151617Child 5: Age <11234567891011121314151617Child 6: Age <11234567891011121314151617Room 5Adults (18+)1234567891011121314Children (0-17)0123456Child 1: Age <11234567891011121314151617Child 2: Age <11234567891011121314151617Child 3: Age <11234567891011121314151617Child 4: Age <11234567891011121314151617Child 5: Age <11234567891011121314151617Child 6: Age <11234567891011121314151617Room 6Adults (18+)1234567891011121314Children (0-17)0123456Child 1: Age <11234567891011121314151617Child 2: Age <11234567891011121314151617Child 3: Age <11234567891011121314151617Child 4: Age <11234567891011121314151617Child 5: Age <11234567891011121314151617Child 6: Age <11234567891011121314151617Room 7Adults (18+)1234567891011121314Children (0-17)0123456Child 1: Age <11234567891011121314151617Child 2: Age <11234567891011121314151617Child 3: Age <11234567891011121314151617Child 4: Age <11234567891011121314151617Child 5: Age <11234567891011121314151617Child 6: Age <11234567891011121314151617Room 8Adults (18+)1234567891011121314Children (0-17)0123456Child 1: Age <11234567891011121314151617Child 2: Age <11234567891011121314151617Child 3: Age <11234567891011121314151617Child 4: Age <11234567891011121314151617Child 5: Age <11234567891011121314151617Child 6: Age <11234567891011121314151617Adults (18+)9101112131415161718192021222324252627282930313233343536373839404142434445464748495051525354555657585960616263646566676869707172737475767778798081828384858687888990919293949596979899Children (0-17)0123456789101112131415161718192021222324252627282930313233343536373839404142434445464748495051525354555657585960616263646566676869707172737475767778798081828384858687888990919293949596979899Search Search Flights Please correct the errors below.RoundtripOne WayMultiple DestinationsLeaving fromGoing toDepartingReturningAdults (18+) 123456Children (0-17) 0123456Flight 1Flying fromFlying to Departing Flight 2Flying fromFlying toDepartingFlight 3Flying fromFlying toDeparting Flight 4Flying fromFlying toDepartingFlight 5Flying fromFlying toDepartingAdults (18+) 123456Children (0-17) 0123456Child 1Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 2Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 3Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 4Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 5Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 6Age<1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Children under 2 must either sit in laps or in seats.In lapIn seatAdvanced optionsAdvanced optionsNonstopRefundable flight Preferred airline No preference Tigerair Australia with BagTigerair Singapore with BagTigerair TaiwanAir BurkinaAeroGalMaya Island AirAir Choice OneSilver AirwaysBoutique AirLATAM Airlines ArgentinaInterjetGermanwingsCemairSun Air ExpressEra AlaskaInsel Air InternationalPAN AM World Airways DominicanaInsel Air ArubaMyanmar Airways InternationalPacific Coastal AirlinesCape AirTropic AirAir MoldovaAvior AirlinesJet AirwaysSouthern AirwaysAegeanAmerican AirlinesairberlinAir CanadaAzulAir FranceAir IndiaAeromexicoAerolineas ArgentinasAlaska AirlinesRoyal Air MarocAviancaFinnairAlitaliaLa CompagnieJetBlue AirwaysBritish AirwaysSeaborne AirlinesFlybeRoyal Brunei AirlinesAir BotswanaEVA AirwaysAir BalticCaribbean AirlinesAir ChinaAirlines of Papua 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Leaving from Going to DepartingReturningRooms 1 2 3 Adults (18 +) 123456Children (0 - 17) 0123456Child 1:Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 2:Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 3:Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 4:Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 5:Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 6:Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Room 2Adults (18 - 64)123456Children (0 - 17)0123456Child 1-?- <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 2-?- <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 3-?- <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 4-?- <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 5-?- <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 6-?- <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Room 3Adults (18 - 64)123456Children (0 - 17)0123456Child 1Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 2Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 3Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 4Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 5Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Child 6Age <1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Children under 2 must either sit in laps or in seats.In lapIn seatI only need a hotel for part of my trip Check-inCheck-outSearch
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Black in the White House: Life Inside George W. Bush's West Wing - eBook: Ron Christie: 9781418551711 - Christianbook.com
$9.99 In Stock Stock No: WW14457EB Thomas Nelson / 2009 / ePub Add To Cart
Call Black in the White House: Life Inside George W. Bush's West Wing - eBook By: Ron Christie
In StockCBD Stock No: WW14457EB
Format: DRM Protected ePubVendor: Thomas NelsonPublication Date: 2009ISBN: 9781418551711ISBN-13: 9781418551711
Take an exclusive look inside the Oval Office?from an unlikely perspective. As a black conservative, Ron Christie has often taken the road less traveled. And now, he carries readers along with him on his unique, illuminating journey through the hallowed halls of the West Wing and into the sacred chamber of the Oval Office, as he shows the real workings inside one of the most secretive administrations ever: the White House of George W. Bush. Who really makes the big policy decisions? How do Republicans view the black community? What went on behind closed doors during the Trent Lott scandal? How did top White House officials react after the attacks of Septembe 11? Former special assistant to President Bush, Ron Christie answers these probing questions and many more as he offers the inside scoop?on everything from race issues to major political maneuvers?and provides a refreshingly candid and positive portrayal of our nation's leaders in this must-read for those who want to go inside George W. Bush's West Wing. Product Reviews▼▲
I'm the author/artist and I want to review Black in the White House: Life Inside George W. Bush's West Wing - eBook. Back×

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This website is a Christian catalog and internet retailer.
Christian Book Distributors was started in 1978 by Stephen Hendrickson, 19 years old and a sophomore at Central Bible College in Springfield, Missouri, out of his parents’ home in Lynn, Massachusetts.


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Stansport Red 1-watt LED Lantern/ Tent Light - Free Shipping On Orders Over $45 - Overstock.com - 13140597
Stansport 500 Lumens Led Lantern
Really helped out during electrical outage.
ITEM# 13140597
ITEM#: 13140597
This battery operated lantern from Stansport makes it easy for anyone in the family to operate. Cool to the touch, yet powerful LED bulbs produce up to 145 lumens so there's no need to change mantles every time you use your lantern.
Battery operated lantern Requires 4 AA batteries
Won't heat up like gas lanterns
Powerful LED bulbs produce up to 145 lumens
No need to change mantles
Long lasting LED bulbs will give you season after season of peak lighting performance
Includes collapsible hook to hang inside your tent
Dimensions: 5 inches in diameter x 6.5 inches high
Model Number 110-60
Stansport 800 Lumens Led Lantern
Brightest light during power outage
During our recent 4 day power outage, this light outperformed the little Coleman LED lights both in amount of light put out and how long batteries lasted. Need to buy more!
etcnj Dec 23, 2011
SDiegoTop Dec 10, 2015
stansport red 1-watt led lantern/tent light
one works perfect other one doesn,t work. the switch on one of the lanterns doesn,t work.
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This light is okay to find yourself around in the dark or do general things, but the light cannot be used to read or do detailed things.
petregille Dec 28, 2012
Should have gotten a larger one, but am still happy with this one
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Great lightweight light. Gave one to my elderly mother. Easy for her to manage. Also can ne hung on a hook or door knob
eli23 Nov 27, 2012
"Is this made in the USA"
"How many & what type of batteries does it use?"

value: This website is an American internet retailer selling primarily furniture headquartered in Midvale, Utah, near Salt Lake City.


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Pleasures In Hunt.s | eBay Please enable JavaScript Our new search experience requires JavaScript to be enabled. Please enable JavaScript on your browser, then try again.
Skip to main contenteBayShop by categoryEnter your search keywordAll CategoriesAntiquesArtBabyBooksBusiness & IndustrialCameras & PhotoCell Phones & AccessoriesClothing, Shoes & AccessoriesCoins & Paper MoneyCollectiblesComputers/Tablets & NetworkingConsumer ElectronicsCraftsDolls & BearsDVDs & MovieseBay MotorsEntertainment MemorabiliaGift Cards & CouponsHealth & BeautyHome & GardenJewelry & WatchesMusicMusical Instruments & GearPet SuppliesPottery & GlassReal EstateSpecialty ServicesSporting GoodsSports Mem, Cards & Fan ShopStampsTickets & ExperiencesToys & HobbiesTravelVideo Games & ConsolesEverything ElseAdvanced or register':' style="margin-right:3px">Hi -User-!'.replace(/-User-/,escape(a)))+"")}catch(b){document.write("")}})();Hi (Sign in to bid or buy)Daily DealsGift CardsSellHelp & ContactMy eBayExpand My eBaySummaryBids/OffersWatch listWish listAll listsPurchase historySellingMy CollectionsFollowed searchesMessagesNotification Refine your search for Pleasures In Hunt.s
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NEW Art and the Pleasures of Hare-hunting. in Six Letters to a Person of Quality
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La Quinta Inn & Suites Memphis Wolfchase: 2017 Room Prices, Deals & Reviews | Expedia
Situated in Memphis, this hotel is within 1 mi (2 km) of Wolfchase Galleria and Pump It Up. Davies Manor Plantation and Bellevue Baptist Church are also within 3 mi (5 km).


text:
Patent US7711143 - Methods for marking images - Google PatentsSearch Images Maps Play YouTube News Gmail Drive More »Sign inAdvanced Patent SearchPatentsAn image is marked by making slight changes to pixel values. These changes are essentially imperceptible on human scrutiny, but detectable by computer analysis. Such markings have applications in identifying ownership of images (including video), and also in device control (e.g., triggering a “do not...http://www.google.com/patents/US7711143?utm_source=gb-gplus-sharePatent US7711143 - Methods for marking imagesAdvanced Patent SearchPublication numberUS7711143 B2Publication typeGrantApplication numberUS 12/001,764Publication dateMay 4, 2010Filing dateDec 11, 2007Priority dateNov 18, 1993Fee statusPaidAlso published asUS6567533, US6647128, US6700990, US7054465, US7113614, US7171016, US7308110, US7945781, US7992003, US8184851, US20030086585, US20030142847, US20030228031, US20060251291, US20080159588, US20110243375Publication number001764, 12001764, US 7711143 B2, US 7711143B2, US-B2-7711143, US7711143 B2, US7711143B2InventorsGeoffrey B. RhoadsOriginal AssigneeDigimarc CorporationExport CitationBiBTeX, EndNote, RefManPatent Citations (133), Non-Patent Citations (112), Referenced by (119), Classifications (144), Legal Events (6) External Links: USPTO, USPTO Assignment, EspacenetMethods for marking images
US 7711143 B2Abstract
1. A method for imparting a watermark onto a digital image comprising:
using a programmed computer to perform acts of:
providing said digital image comprised of a plurality of pixels, wherein each of said pixels includes brightness data that represents a brightness obtained from a color image; and
adjusting said brightness data associated with at least one of said pixels by a predetermined brightness value, wherein said brightness value has a relationship with a number taken from a random number sequence.
2. A method as recited in claim 1, wherein said relationship includes a parameter for adjusting the brightness value to a desired strength.
3. A method as recited in claim 1, wherein said strength is computed as a function of the digital image such that the watermark is imperceptible.
4. A method as recited in claim 1, wherein each of said pixels has a row and a column location in an array representing said digital image, and wherein said brightness value employs a different sequential combination of numbers from said random number sequence in sequential correspondence to said row and column location.
5. A method as recited in claim 1, wherein said random number sequence is generated employing a key based pseudorandom number generator.
6. A method as recited in claim 1, wherein said sequence is formed from a plurality of watermarking parameters.
7. A method as recited in claim 6, wherein said watermarking parameters provide the watermark with at least one property of a robust invisible watermark.
8. A method for generating a watermarked image wherein a watermark is imparted onto a digital image having a plurality of original elements having original brightnesses, said method comprising:
providing a digital watermarking signal comprising a plurality of watermarking elements, each having a watermark brightness value and having one-to-one correspondence with said original elements; and
producing a watermarked image by adjusting said original brightness of each of said original elements by said brightness values of a corresponding one of said watermark elements wherein said watermark is invisible.
9. A method as recited in claim 8, in which said brightness values are within a predetermined range.
10. A method as recited in claim 8, in which said original image forms an original signal having a first size in two or more dimensions and said watermarking image forms a watermarking block being smaller than said original signal, said method further comprising the step of extending said watermarking signal by tiling the watermarking block that said watermarking signal at least covers said original signal.
11. A method as recited in claim 10, further comprising the step of truncating said watermarking block such that said watermarking block covers said original signal, upon determining that said watermarking block extends beyond said original signal.
12. A method as recited in claim 10, wherein the watermarking signal is produced by employing filtering using an FFT method.
13. A method as recited in claim 8, wherein each of said original elements include corresponding to a red, a green and a blue color component and the brightness data of the original elements is obtained from the corresponding red, a green and a blue color component.
14. A method for imparting a watermark onto a digital image comprising:
adjusting said brightness data associated with at least one of said pixels by a predetermined brightness value in a predetermined range,
wherein said brightness value has a relationship with a number taken from a random number sequence, said relationship includes a parameter for adjusting the brightness value to provide a desired modulation strength.
15. A method for imparting a watermark onto a digital image comprising:
adjusting said brightness data associated with at least one of said pixels by a predetermined brightness value,
wherein said brightness value has a relationship with a number taken from a random number sequence, said relationship includes a parameter for adjusting the brightness value to provide a strength, said sequence is formed from a plurality of robust watermarking parameters, and said parameters comprise a cryptographic key and an initial value of said random number generator.
16. A computer readable medium on which is stored instructions, which when executed by a computer, perform the method of claim 1.
This application is a division of application Ser. No. 10/377,170, filed Feb. 26, 2003 (now U.S. Pat. No. 7,308,110) which is a continuation of application Ser. No. 09/186,962, filed Nov. 5, 1998 (now U.S. Pat. No. 7,171,016), which is a continuation of application Ser. No. 08/649,419, filed May 16, 1996 (now U.S. Pat. No. 5,862,260), which is a continuation-in-part of the following applications: PCT/US96/06618, filed May 7, 1996 (WO96/36163 published Nov. 14, 1996); application Ser. No. 08/637,531, filed Apr. 25, 1996 (now U.S. Pat. No. 5,822,436); application Ser. No. 08/534,005, filed Sep. 25, 1995 (now U.S. Pat. No. 5,832,119); application Ser. No. 08/508,083, filed Jul. 27, 1995 (now U.S. Pat. No. 5,841,978); application Ser. No. 08/436,102, filed May 8, 1995 (now U.S. Pat. No. 5,748,783); and application Ser. No. 08/327,426, filed Oct. 21, 1994 (now U.S. Pat. No. 5,768,426). Application Ser. No. 08/327,426 is a continuation in part of application Ser. No. 08/215,289, filed Mar. 17, 1994 (now abandoned), which is a continuation in part of application Ser. No. 08/154,866, filed Nov. 18, 1993 (now abandoned).
Application Ser. No. 10/377,170 is also a continuation of application Ser. No. 10/109,437, filed Mar. 26, 2002 (now abandoned) which is a continuation of application Ser. No. 09/413,117, filed Oct. 6, 1999 (now abandoned), which is a division of application Ser. No. 09/186,962, filed Nov. 5, 1998 (now U.S. Pat. No. 7,171,016), which is a continuation of application Ser. No. 08/649,419, filed May 16, 1996 (now U.S. Pat. No. 5,862,260), which is a continuation-in-part of application Ser. No. 08/637,531, filed Apr. 25, 1996 (now U.S. Pat. No. 5,822,436), and which also claims priority to PCT application PCT/US96/06618, filed May 7, 1996 (WO96/36163 published Nov. 14, 1996).
Filed electronically therewith is a computer listing in a text file named Appendix_B.txt, created on Dec. 11, 2007, and having a file size of 375,829 bytes, which is hereby incorporated by reference.
In summary, this embodiment embeds an N-bit value onto an entire signal through the addition of a very low amplitude encodation signal which has the look of pure noise. N is usually at least 8 and is capped on the higher end by ultimate signal-to-noise considerations and “bit error” in retrieving and decoding the N-bit value. As a practical matter, N is chosen based on application specific considerations, such as the number of unique different “signatures” that are desired. To illustrate, if N=128, then the number of unique digital signatures is in excess of 10^^38 (2^^128 ). This number is believed to be more than adequate to both identify the material with sufficient statistical certainty and to index exact sale and distribution information.
During the scanning process we have arbitrarily set-absolute black to correspond to digital value ‘30’. We estimate that there is a basic 2 Digital Number root mean square noise existing on the original digital image, plus a theoretical noise (known in the industry as “shot noise”) of the square root of the brightness value of any given pixel. In formula, we have:
V dist;n,m =V origin;n,m +V comp;n,m *X*sqrt(4+V origin;n,m ^Y) (3)
Alternatively, if the noise signal added during encoding does not have a zero mean value, and the length N of the code word is known to the decoder, then a universal decoding process can be implement


text:
Patent US5943134 - Method of measuring thickness and refractive indices of component layers of ... - Google PatentsSearch Images Maps Play YouTube News Gmail Drive More »Sign inAdvanced Patent SearchPatentsA light beam emitted by a light source is projected through a collimator lens, a beam splitter and an objective on a sample having a laminated structure. The light beam reflected from the sample travels through the beam splitter to a detector and the detector provides a confocal signal. The detector...http://www.google.com/patents/US5943134?utm_source=gb-gplus-sharePatent US5943134 - Method of measuring thickness and refractive indices of component layers of laminated structure and measuring apparatus for carrying out the sameAdvanced Patent SearchPublication numberUS5943134 APublication typeGrantApplication numberUS 08/877,502Publication dateAug 24, 1999Filing dateJun 17, 1997Priority dateJun 17, 1996Fee statusLapsedAlso published asDE69714915D1, EP0814318A2, EP0814318A3, EP0814318B1Publication number08877502, 877502, US 5943134 A, US 5943134A, US-A-5943134, US5943134 A, US5943134AInventorsIchirou Yamaguchi, Takashi FukanoOriginal AssigneeThe Institute Of Physical And Chemical ResearchExport CitationBiBTeX, EndNote, RefManPatent Citations (1), Referenced by (29), Classifications (7), Legal Events (5) External Links: USPTO, USPTO Assignment, EspacenetMethod of measuring thickness and refractive indices of component layers of laminated structure and measuring apparatus for carrying out the same
US 5943134 AAbstract
A light beam emitted by a light source is projected through a collimator lens, a beam splitter and an objective on a sample having a laminated structure. The light beam reflected from the sample travels through the beam splitter to a detector and the detector provides a confocal signal. The detector provides an interference signal upon the reception of the reflected light beam and a reference light beam reflected by a reference mirror. The sample and the reference mirror are moved on the basis of the confocal signal and the interference signal, and the thickness and the refractive index of layer of the sample are determined on the basis of the respective displacements of the sample and the reference mirror.
1. A measuring apparatus for measuring thicknesses and refractive indices of component layers of a laminated structure, said measuring apparatus comprising:a light source which projects a light beam on the laminated structure; a beam splitter disposed between the light source and the laminated structure; an objective disposed between the beam splitter and the laminated structure; a reference mirror disposed on a straight line intersecting a straight line connecting the light source and the laminated structure and passing the beam splitter, on one side of the beam splitter; a detector disposed on the straight line on the other side of the beam splitter; a first stage for moving the laminated structure along the optical axis of the objective, and, a second stage for moving the reference mirror along an optical axis perpendicular to the mirror, and wherein a data processing means calculates the thickness and the refractive index of an mth layer of the laminated structure on the basis of a displacement of the laminated structure and the reference mirror to respective positions corresponding to a first condition where a first surface of the mth layer is at a focal point of the objective and an interference signal provided by the detector reaches a maximum, and a second condition where a second surface of the mth layer is at the focal point of the objective and an interference signal provided by the detector reaches a maximum. 2. The measuring apparatus according to claim 1, whereinthe data processing means calculates the thickness dm and the refractive index nm of the mth layer by using expressions: ##EQU3## where N.A. is the numerical aperture of the objective, Δlm is the displacement of the reference mirror, and ΔZm is the displacement of the laminated structure. 3. The measuring apparatus according to claim 1, whereinthe opposite surfaces of at least one of the plurality of layers of the laminated structure are not parallel to each other, and the thickness of the same layer varies over the entire region of the laminated structure. 4. A method of measuring thicknesses and refractive indices of component layers of a laminated structure by using a measuring apparatus comprising: a light source which projects a light beam on the laminated structure, a beam splitter disposed between the light source and the laminated structure, an objective disposed between the beam splitter and the laminated structure, a reference mirror disposed on a straight line intersecting a straight line connecting the light source and the laminated structure and passing the beam splitter, on one side of the beam splitter, and a detector disposed on the straight line on the other side of the beam splitter, wherein the laminated structure is movable along the optical axis of the objective, the reference mirror is movable along its optical axis; said method comprising the steps of:projecting a light beam by the light source through the beam splitter and the objective on the laminated structure; moving the laminated structure and the reference mirror on the basis of a confocal signal provided by the detector upon the reception of the reflected light beam traveled from the laminated structure to the detector through the beam splitter and an interference signal provided by the detector upon the reception of the reflected light beam and a reference light beam traveling through the beam splitter and reference mirror to the detector so that one of the surfaces of the mth layer of the laminated structure is positioned at a focal point of the objective and the reference mirror is positioned at a first reference mirror position where the reference mirror reflects the interference signal reaches a maximum; moving the laminated structure and the reference mirror on the basis of the confocal signal and the interference signal provided by the detector so that the other surface of the mth layer of the laminated structure is positioned at the focal point of the objective and the reference mirror is positioned at a second reference mirror position where the interference signal reaches a maximum; and determining the thickness and the refractive index of the mth layer of the laminated structure on the basis of a displacement of the laminated structure from a first position where one surface of the mth layer is at the focal point of the objective to a second position where the other surface of the mth layer is at the focal point of the objective, and a displacement of the reference mirror from the first reference mirror position to the second reference mirror position. 5. The method according to claim 4, whereinthe process of determining the thickness and the refractive index of the mth layer determines the same by using expressions: ##EQU4## where N.A. is the numerical aperture of the objective, Δlm is the displacement of the reference mirror, and ΔZm is the displacement of the laminated structure. 6. The method according to claim 4, whereinthe laminated structure has a plurality of layers, the opposite surfaces of at least one of the plurality of layers of the laminated structure are not parallel to each other, and the thickness of the same layer varies over the entire region of the laminated structure. Description
The present invention relates to a method measuring the thicknesses and the refractive indices of component layers of a sample laminated structure, and a measuring apparatus for carrying out the same.
A low-coherence interferometry is used for measuring the optical thickness of a transparent sample, such as a thin film or an optical glass. The low-coherence interferometry is carried out by an interferometer using white light or light emitted by a low-coherence light source, such as a light emitting diode. The low-coherence interferometry finds out the absolute position of a sample from the position of a reference mirror by using a fact that interference fringes appear only near a position where the difference between the two optical path lengths is zero. The low-coherence interferometry is applied to the absolute measurement of a block gage, the calibration of a base line and surface protilometry. Recently, active studies on a measuring method developed by extending the low-coherence interferometry have been reported in the fields of ophthalmology and biological science.
A known confocal laser microscope projects a laser beam on a sample in a spot, and forms an image of reflected light reflected by the sample or fluorescent light emitted by the sample on a point detector. The confocal laser microscope, as compared with conventional optical microscopes, is capable of forming an image of a high contrast and of forming a three-dimensional image with a high axial resolution, i.e., resolution along the optical axis. Therefore, the confocal laser microscope is used prevalently for measuring the morphology of a surface and observing biological specimens. The high axial resolution of the confocal laser microscope is effectively applicable to the measurement of optical thicknesses of component layers of a transparent laminated structure.
However, a value directly determined on the basis of the principle of the confocal laser microscope is an optical thickness and hence the refractive index of the corresponding layer must be determined by another method to convert the optical thickness into a corresponding geometrical thickness. Such a problem arises also in thickness measurement by the foregoing low-coherence interferometry. However, there has not been proposed any refractive index measuring method capable of measuring the respective indices of the component layers of a sample laminated structure without destroying the sample laminated structure.
The present invention has been made in view of the problem in the prior art and it is therefore an object of the present invention to provide a method of measuring the thicknesses and the refractive indices of component layer of a laminated structure and a measuring apparatus for carrying out the same.
According to a first aspect of the present invention, a measuring apparatus for measuring thicknesses and refractive indices of component layers of a laminated structure comprises a light source which projects a light beam on the laminated structure, a beam splitter disposed between the light source and the laminated structure, an objective disposed between the point light source and the laminated structure, a reference mirror disposed on a straight line intersecting a straight line connecting the point light source and the laminated structure and passing the beam splitter on one side of the beam splitter, and a detector disposed on the straight line on the other side of the beam splitter. The laminated structure and the reference mirror are movable, and a data processing means calculates the thickness and the refractive index of the mth layer of the laminated structure on the basis of a displacement of the laminated structure and that of the reference mirror between a condition where an interference signal reaches a maximum when one of the surfaces of the mth layer is at the first focal point of the objective, and a condition where an interference signal reaches a maximum when the other surface of the mth layer is at the second focal point of the objective indicated by confocal signals and interference signals provided by the detector.
According to a second aspect of the present invention, a method of measuring thicknesses and refractive indexes of component layers of a laminated structure by using a measuring apparatus comprising a light source which projects a light beam on the laminated structure, a beam splitter disposed between the light source and the laminated structure, an objective disposed between the light source and the laminated structure, a movable reference mirror disposed on a straight line intersecting a straight line connecting the light source and the laminated structure and passing the beam splitter on one side of the beam splitter, and a detector disposed on the straight line on the other side of the beam splitter comprises: projecting a light beam by the light source through the beam splitter and the objective on the laminated structure; moving the laminated structure and the reference mirror on the basis of a confocal signal provided by the detector upon the reception of a reflected light beam traveling from the laminated structure to the detector through the beam splitter and an interference signal provided by the detector upon the reception of the reflected light beam and a reference light beam traveling through the beam splitter and the reference mirror to the detector so that one of the surfaces of the mth layer of the laminated structure is positioned at a first focal point of the objective and the reference mirror is positioned at a first reference mirror position where the interference signal reaches a maximum; moving the laminated structure and the reference mirror on the basis of the confocal signal and the interference signal provided by the detector so that the other surface of the mth layer of the laminated structure is positioned at the focal point of the objective and the reference mirror is positioned at a second reference mirror position where the interference signal reaches a maximum; and determining the thickness and the refractive index of the mth layer of the laminated structure on the basis of the displacement of the laminated structure from the first focal point where one surface of the mth layer is at the focal point of the objective to the second focal point where the other surface of the mth layer is at the focal point of the objective, and the displacement of the reference mirror from the first reference mirror position to the second reference mirror position.
According to the present invention, the laminated structure and the reference mirror are moved from the first focal point and the first reference mirror position to the second focal point and the second reference mirror position, respectively, on the basis of the confocal signal provided by the detector upon the reception of the reflected light beam and the interference signal provided by the detector upon the reception of the reflected light beam and the reference light beam, and the thickness and the refractive index of the mth layer of the laminated structure are determined on the basis of the respective displacements of the laminated structure and the reference mirror.
FIG. 1A is a diagrammatic view of a measuring apparatus in accordance with the present invention for measuring the thicknesses and the refractive indices of component layers of a laminated structure;
FIGS. 1B and 1C are diagrammatic views of assistance in explaining the position of a laminated structure relative to an objective included in the measuring apparatus of FIG. 1A;
FIG. 2 is a diagrammatic view of assistance in explaining a method of measuring the thicknesses and the refractive indices of a component layers of a laminated structure;
FIG. 3 is a diagrammatic view of assistance in explaining the change of a marginal ray governing position with the displacement of a sample relative to an objective;
FIG. 4 is diagram showing the spectrum of light emitted by a point light source;
FIG. 5 is a graph showing the respective variations of the center wavelength and the spectral line width of light emitted by a laser diode with current supplied to it;
FIG. 6 is a diagrammatic view of a Michelson interferometer;
FIG. 7A is a graph showing the output of the detector in the Michelson interferometer of FIG. 6;
FIG. 7B is a graph showing the coherence length of the laser output in Michelson interferometer of FIG. 6;
FIG. 8 is a diagrammatic view of a measuring apparatus in a preferred embodiment according to the present invention for measuring the thicknesses and the refractive indices of component layers of a laminated structure;
FIG. 9A is a graph showing the variation of the output of a detector with the position of a sample;
FIG. 9B is a graph showing the variation of the output of a detector with the position of a reference mirror;
FIG. 10 is a typical view of a sample;
FIGS. 11A to 11D are output signals of a detector when measuring the sample shown in FIG. 10;
FIG. 12A is a typical view of another sample; and
FIGS. 12B and 12C are graphs showing the variation of the output signals of a detector when measuring the sample shown in FIG. 12A.
A basic principle of the present invention will be described with reference to FIGS. 1 to 3 prior to the description of the preferred embodiments of the present invention.
Referring to FIGS. 1A to 1C, a measuring apparatus 10 for measuring thicknesses and refractive indices of component layers of a laminated structure comprises a point light source 11 (low-coherence light source) which projects a light beam through a pinhole 11a on a sample 15, i.e., a laminated structure, and collimator lens 12, a beam splitter 13 and an objective 14 arranged in that order between the point light source 11 and the sample 15. A reference mirror 16 is disposed on a straight line L2 intersecting a straight line L1 interconnecting the point light source 11 and the sample 15 on one side of the beam splitter 13. A condenser lens 17, and a detector 18 provided with a pinhole 18a are disposed on the straight line L2 on the other side of the beam splitter 13. The optical system of the measuring apparatus 10 shown in FIG. 1A is a combination of a Michelson interferometer and a confocal system. The light beam emitted by the point light source 11 is focused on the sample 15 by the objective 14 disposed near the sample 15. The light beam reflected by the sample 15 is gathered by the condenser lens 17 on the pinhole 18a, and the light beam transmitted through the pinhole 18a is detected by the detector 18. The point light source 11, the objective 14 and the detector 18 constitute the confocal system. The measuring apparatus 10 using the point light source 11 which emits a light beam of a wide wavelength spectral width serves as a low-coherence interferometer.
Suppose that the sample 15 shown in FIG. 1A is a transparent laminated structure. The optical system functions as a confocal system when the reference mirror 16 is screened to block a reference optical path. In this state, the light beam emitted by the point light source 11 travels through the collimator lens 12, the beam splitter 13 and the objective 14 to the sample 15. The reflected light beam reflected by the sample 15 travels through the objective 14, the beam splitter 13 and the condenser lens 17 to the detector 18. Upon the reception of the reflected light beam, the detector provides a confocal signal. As the sample 15 is moved toward the objective 14, a peak appears in the output of the detector 18 upon the arrival of an interface between the adjacent component layers of the sample 15 at a focal point of the objective 14. As the sample 15 is moved further toward the objective 14, peaks appear successively in the output of the detector 18 as the interfaces between the adjacent component layers of the sample 15 arrive at a focal point of the objective 14 successively, as indicated by peaks on the Z-axis of the graph of FIG. 2. Thus, the arrival of each interface at the focal point of the objective 14 can be known from the peak in the output signal of the detector.
When the sample 15 is fixedly disposed with the mth interface, i.e., an interface between layers of (m-1)th and mth from the surface of the sample 15 facing the objective 14, positioned at the focal point of the objective 14 as shown in FIG. 1B and the reference mirror 16 is unscreened, the reflected light beam reflected by the sample 15 travels through the objective 14, the beam splitter 13 and the condenser lens 17 to the detector 18, and part of the light beam emitted by the point light source 11 travels, as a reference light beam, through the collimator lens 12, the beam splitter 13, the reference mirror 16 and the condenser lens 17 to the detector 18. Then, the detector 18 provides an interference signal on the basis of the reflected light beam and the reference light beam. In this state, the sample 15 is positioned at a first position.
The reference mirror 16 is then moved to a first reference mirror position where the reference light beam makes the amplitude of the interference signal increase to a maximum. In this state, the optical path difference between the two optical paths of the interferometer is zero.
Then, the sample 15 is advanced toward the objective 14 by a distance ΔZm to focus the light beam on the (m+1)th interface as shown in FIG. 1C. In this state, the (m+1)th interface is at the focal point of the objective 14. In this state, the sample 15 is positioned at a second position but the condition for equal optical path length is not met because the position of the reference mirror 16 is not changed. Therefore, the reference mirror 16 is moved by a distance Δlm to a second reference mirror position to reduce the optical path difference to zero.
A series of such operations enables the measurement of the optical thickness of the mth layer on two different principles; that is, the optical thickness of the mth layer is measured by both a method using a confocal system and a low-coherence interference method. Therefore, an optical path length, i.e., (refractive index)�(thickness), can be expressed by two expressions, and the refractive index and the thickness of the layer can be determined by solving the two expressions. A procedure for making those expressions will be described hereinafter.
Suppose that the focal point is moved from the mth interface to the (m+1)th interface by the confocal optical system as shown in FIG. 3, in which the objective 14 is shifted to simplify the procedure for making the expressions. When the (m+1)th interface is positioned at the focal point, all the intersection points of marginal rays and each interface are translated evenly away from the optical axis. From FIG. 3, ##EQU1## where p is the displacement of the intersection point of the marginal rays and the interface, θ0 is the incident angle of the peripheral rays on the first layer, θm is the refractive angle at the mth interface, and dm is the geometrical thickness of the mth layer. The following expression is obtained by eliminating p from Expressions (1) and (2).
dm tan θm =ΔZm tan θ0(3)
Since the marginal rays are refracted at each interface according to Snell's law,
nm sin θm =n0 sin θ0 =N.A.(m=1,2, . . . m, . . . )                                                   (4)
where N.A. is the numerical aperture of the objective 14.
Conditions for establishing an equal optical path length state, i.e., a state in which the optical path length of two optical paths are equal to each other, by the low-coherence interference method will be considered. The conditions for the equal optical path length state become unsatisfied when the sample 15 is shifted. A displacement Δlm by which the reference mirror 16 needs to be shifted to satisfy the conditions for the equal optical path length state is the sum of a decrement ΔZm in the optical path in air resulting from the movement of the sample 15 toward the objective 14, and an increment nm �dm in the optical path length resulting from the passage of the light beam through the mth layer. Therefore,
Δlm =nm dm -ΔZm            (5)
The geometrical thickness dm and the refractive index nm of the mth layer are determined by solving simultaneous equations (3) to (5). ##EQU2##
This procedure is repeated for the successive layers to determine the respective geometrical thicknesses and the respective refractive indices of the layers.
A preferred example of the present invention will be described hereinafter.
Characteristics of Laser Diode
A laser diode (TOLD-9150, threshold current: 52 mA, available from Toshiba) was employed as the point light source 11 and the laser diode was driven by a current below the threshold current to use the laser diode as a light emitting diode. A light beam emitted by the point light source 11 has a wide spectrum and hence the point light source 11 functions as a low-coherence light source Since the point light source 11 has a minute light emitting region the point light source 11 need not be provided With the pinhole 11a. The characteristics of the point light source 11 will be explained in terms of measured spectrum and measured coherence length.
Measurement of Spectrum
The dependence of the spectrum of the light beam emitted by the point light source 11 on current supplied to the point light source 11 was examined by using an optical spectrum analyzer (Advantest Q8344A). FIG. 4 shows the spectrum of the light beam emitted by the point light source when a current of 30 mA was supplied to the point light source 11, in which center wavelength is 690.5 nm and the full width at half maximum of the spectrum is 15.3 nm. The emission power was 50 μW. FIG. 5 shows the current dependence of the center wavelength and the full width at half maximum of the spectrum. It is known from FIG. 5 that the center wavelength decreases with the increase of the current, laser oscillation occurs when the current exceeds the threshold current, and the center wavelength resume to increase stepwise (mode hop) with the increase of the current. It is also known from FIG. 5 that the width of the spectrum decreases gradually with the increase of the current, decreases sharply with the variation of the current around the threshold current, and remains substantially constant after the start of laser oscillation.
Measurement of Coherence Length
Coherence length was measured by a Michelson interferometer shown in FIG. 6, in which a plane mirror 16a was moved along an optical axis. A point light source 11 is driven by a driving unit 20, the plane mirror 16a is mounted on a linear stage 28 driven by a stepping motor. The operation of the driving unit 20 and the linear stage 28 is controlled by a controller 21. A detector 18 is connected to a personal computer 22 controlling the controller 21.
FIG. 7A shows an interferogram when a current of 30 mA was supplied to the point light source 11. The plane mirror 16a was moved stepwise in steps of 0.1 pm. The full width at a half maximum, i.e., the coherence length, was 6.9 μm. The current was varied in a current range below the threshold current for the same measurement to examine the current dependence of the coherence length. The results are shown in FIG. 7B. It is known from FIG. 7B that the coherence length varies scarcely when the current is below 35 mA, and increases sharply with the current after the current in creases beyond the threshold current. In the following experiments, a driving current of 30 mA was used taking into consideration the output power of the laser diode, i.e., the point light source, and the coherence length.
Simultaneous Measurement of Thickness and Refractive Index
Experimental Optical System
Referring to FIG. 8, a collimator lens 12 collimates rays of a light beam emitted by a point light source, i.e., a laser diode. The collimated light beam travels through a beam splitter 13 is focused on a sample 15 by a objective 14 (MD Plan, magnification: �10, Effective N.A.: 0.21, W.D.: 7 mm, Olympus). The light beam reflected by the beam splitter 13 is used as a reference light beam. In a detection system, the reflected light beam is gathered on a pinhole 18a of 10 μm in diameter by a condenser lens 17, and the light beam traveled through the pinhole 18a is detected by a detector 18, i.e., a photomultiplier tube (Optical Sensor Module H5783-01, Hamamatsu Photonics). The output signal of the detector 18 is monitored by an oscilloscope 27 and is given through an AD board, not shown, to a personal computer 22. The sample 15 and a reference mirror 16 are mounted on linear stages 27 and 28 driven by stepping motors, respectively. The linear stages 27 and 28 can be moved in steps of 1 μm and 0.1 μm, respectively, by giving pulse signal through a PIO board, not shown, by the personal computer to a controller 21. A shutter 25 and a variable aperture 26 are disposed on the optical path of the reference light beam. The intensity of the reference light beam is regulated by regulating the diameter of the reference light beam by the variable aperture 26.
The laser diode serving as the point light source 11 is made to perform laser oscillation when adjusting the optical system, and a current not higher than the threshold current is supplied to the laser diode to use the laser diode as a light emitting diode for measurement
First, the sample 15 is disposed close to the objective 14, and then the sample 15 is moved away from the objective 14 to prevent the sample 15 from coming into contact with the objective 14. In this state, the reference light beam is intercepted by the closed shutter 25. The position of a peak is determined by subjecting a confocal signal to smoothing differentiation. The position of the sample 15 is adjusted on the basis of the data representing the position of the peak so that a surface thereof nearest to the objective 14 is positioned at the focal point of the objective 14. Subsequently, the shutter 25 is opened the gain of the photomultiplier of the detector 18 and the reference mirror 16 is moved away from the beam splitter 13 for a scanning operation. After the completion of the scanning operation, the sample 15 and the reference mirror 16 are returned to their initial positions, respectively, the sample 15 is moved again on the basis of the data representing the position of the peak so that the next interface is positioned at the focal point, and then the reference mirror 16 is moved again for a scanning operation. The foregoing procedure is repeated for all the interfaces of the sample 15. Although the return of the sample 15 and the reference mirror 16 to their initial positions takes an additional time, the influence of backlashes in the linear stages 27 and 28 can be reduced. The detection of the position of the peak of the confocal signal for the analysis of signals was carried out in an on-line mode, and the interferogram was analyzed after transferring the data to a work station.
Axial Response of the Confocal System and Interferogram
The optical plane mirror 16a (FIG. 6) was used for measurement to confirm if the optical system is functioning as both the confocal system and the low-coherence interferometer. FIG. 9A shows the axial response of the confocal system when the optical plane mirror 16a, i.e., the sample, was moved. An interferogram as shown in FIG. 9B was obtained by fixedly holding the optical plane mirror 16a at a position corresponding to the peak in the output signal of the detector 18, and moving the reference mirror 16. Full widths at half maximum determined from those results were 20 μm and 46 μm. It is known from FIG. 9B that the interferogram, as compared with the interferogram shown in FIG. 7A obtained by measurement in a free space, is asymmetrical, and the full width at half maximum is about seven times. Formation of such an asymmetrical interferogram and such increase in the full width at half maximum are considered to be attributable to (a) the spherical aberration caused by the objective 14, and (b) dispersion caused by the objective lens 14. Substantially the same results as those shown in FIG. 9B were obtained through measurement using a diaphragm disposed just behind the objective 14 to narrow the light beam. Therefore, it is considered that the effect of dispersion caused by the objective 14 is more dominant than that of the spherical aberration caused by the objective 14. The effect of dispersion could be canceled by replacing the reference mirror 16 with a cat's eye consisting of a lens identical with the objective disposed near the sample 15 and a plane mirror.
Results of Experiments and Examination of the Results Samples including a parallel plane base plate, a three-layer liquid crystal evaluation glass cell (hereinafter, referred to as "liquid crystal cell") and a thirteen-layer sample fabricated by stacking cover glasses were subjected to measurement. Measurements of the three-layer liquid crystal cell and the thirteen-layer sample are given below by way of example.
Referring to FIG. 10 a sample liquid crystal cell 15 (EHC K.K.) was fabricated by combining two glass plates 30 and 31 of 0.7 μm in thickness and 1.51 in refractive index so that a 50 μm thick space 32 was formed between the glass plates 30 and 31. The space 32 was kept void for a condition A, and the space 32 was filled up with pure water for a condition B. FIGS. 11A to 11D show measured results. FIGS. 11A and 11B show the results of measurement under the condition A, and FIGS. 11C and 11D show the results of measurement under the condition B. FIGS. 11A and 11C show data representing the response of the confocal system, in which peaks 1, 2, 3 and 4 are the output signals of the detector when the light beam was focused on the interfaces indicated by the same numerals, respectively. FIGS. 11B and 11D show interferograms, in which numerals indicating the interferograms corresponds to positions of the sample liquid crystal at which the peaks indicated by the same numerals shown in FIGS. 11A and 11C appear, respectively. FIGS. 11A and 11B shows the signals after adjusting the bias properly to facilitate understanding. The values of the peaks 2 and 3 in FIG. 11C are small as compared with those of the corresponding peaks 2 and 3 in FIG. 11A because the refractive index of pure water is closer to that of glass than that of air and hence the reflectivity of the interface is low. Whereas the localized positions of the interferograms for the condition A are not changed, those of the interferograms for the condition B are displaced, which can be reasoned from a fact that the distance between the objective and the sample is reduced by the thickness of the space 32 and the optical path length does not change when the sample is moved to change the focal position from the interface in front of the space 32 to the interface behind the space 32, if the space 32 is filled with air.
FIG. 12A shows a thirteen-layer sample 15 fabricated for the experiment by alternately stacking cover glasses 33 and 34 (thickness: 0.145�0.015 mm, refractive index: 1.523 (λ=588 nm), Matsunami Garasu Kogyo) and air space in a thirteen-layer structure. FIGS. 12B and 12C shown measured confocal signals and interferograms, respectively. In FIG. 12B, numerals indicating peaks corresponds to those indicating interfaces in FIG. 12A. The interferograms shown in FIG. 12C are produced after adjusting the bias. In FIG. 12B, the peaks indicated by greater numerals have smaller values because the quantity of light absorbed by the layers and the quantity of light reflected by the interfaces increases with depth from the surface of the sample 15 facing the objective 14 and hence the quantity of light reflected by the interface and falling on the detector 18 decreases with the depth of the interface from the surface of the sample 15 facing the objective 14. The interferograms relating to the deeper layers are distorted by color dispersion caused by the forward layers. The localization of the interferogram relating to the interfaces of the air layers do not change for the same reasons as those for the liquid crystal cell.
Table 1 shows the geometrical thicknesses and the refractive indices of the samples 15 calculated by using the data about the intervals between the peaks and the intervals between the localized interference fringes, and Expressions (6) and (7). Shown also in Table 1 are data about the other samples 15, thicknesses measured by a micrometer and nominal values shown in catalogs. With the samples 15 of 1 mm or above in thickness, those data coincide with each other with an error of 1% or below. Relative accuracy deteriorates when the thickness of the sample 15 decreases, which is supposed to occur because errors in the estimation of the position for equal optical path length are most effective in introducing errors into the final thickness and the refractive index.
TABLE 1______________________________________Samples       Thickness (μm)                     Refractive index______________________________________Parallel plane plate         1084(1093)b)                     1.513(1.514)c)(BK7)Parallel plane plate         1028(1020)b)                     1.457(1.455)c)(Fused Silica)LC cell 1-2 (Glass)a)         701(717)b)                     1.516(1.510 � 0.015)c)2-3 (Air)a)         54(50)c)                     1.002(1.000)c)3-4 (Glass)a)         728(717)b)                     1.511(1.510 � 0.015)c)LC cell 1-2 (Glass)a)         701(717)b)                     1.517(1.510 � 0.015)c)2-3 (Water)a)         58(50)c)                     1.345(1.510 � 0.015)c)3-4 (Glass)a)         724(717)b)                     1.514(1.510 � 0.015)c)Thirteen-layer sampleGlass 1-2, 3-4, 5-6         148, 149, 148,                     1.537, 1.505, 1.5027-8, 9-10, 11-12         150, 151, 151                     1.537, 1.548, 1.52513-14                     1.506(1.523)c)d)Air 2-3, 4-5, 6-7, 8-9         160, 149, 156                     0.997, 1.009, 1.009,10-11, 11-12  153, 162, 150                     0.987, 0.997, 1.007                     (1.000)c)______________________________________ a) LC cell 12 corresponds to the peaks 1 and 2 in FIG. 2. b) Values measured by a micrometer c) Nominal values provided in catalogs d) λ = 588 nm
The present invention could measure accurately the thicknesses and refractive indices of the component layers of the samples 15 of laminated structures in which the opposite surfaces of each component layer are not exactly parallel to each other and each component layer has nonuniform thickness, such as an onion.
The component layers of the sample 15 may be of a material other than glass, such as a synthetic resin or the like, provided that the component layers are transparent to light of wavelength in the wavelength range of the light emitted by the point light source 11. If a laser diode which emits light of a wavelength in the near-infrared wavelength range is employed as the point light source 11, the present invention is applicable to the measurement of the thicknesses and the refractive indices of the component layers of semiconductor structures.
As is apparent from the foregoing description, according to the present invention, the sample and the reference mirror are moved from a first confocal position and a first reference mirror position for a first surface of the mth layer of the sample to a second confocal position and a second reference mirror position for a second surface of the mth layer, respectively. The thickness and the refractive index of the mth layer are determined on the basis of the respective displacements of the sample and the reference mirror. Thus, the thickness and the refractive index of the mth layer of a laminated structure can surely and easily be determined.
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Slaves & Breeders Box Set by J.D. Grayson | NOOK Book (eBook) | Barnes & Noble®
Slaves & Breeders Box Set
by J.D. GraysonJ.D. Grayson
Agreeing to a photo shoot, she's chosen for the position. Unfortunately, its less of a dream, more of a nightmare. Abducted to a remote island, she becomes a value commodity in a powerful empire. Her rebellious spirt will be broken, changing her forever. Though she'll soon discover she's not the only one with regrets.
Spared a dreadful life in Paraíso, Haley White enters a new position of importance. Chosen to conceive Victor's heir, she finds a better life awaiting her. Though along with the perks, comes greater responsibility.
Six months into pregnancy, Haley & Bruce await the heir's impending birth. Still tasked to guard the prize female, their caution fades within the shadow of safety. However, a grave secret burns brightly. Within hours, their world turns from Victor's favor to his vengeance.
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You can contact J.D. Grayson at

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