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Patent US20030031356 - Pattern inspection apparatus and method - Google PatentsSearch Images Maps Play YouTube News Gmail Drive More »Sign inAdvanced Patent SearchPatentsA marginal distribution feature extraction unit 20 sequentially focuses on each pixel in a reference image and the corresponding pixel in an inspection image, and computes a marginal distribution feature value indicative of the spatial variation in pixel values in the focus pixel neighborhood in both...http://www.google.com/patents/US20030031356?utm_source=gb-gplus-sharePatent US20030031356 - Pattern inspection apparatus and methodAdvanced Patent SearchPublication numberUS20030031356 A1Publication typeApplicationApplication numberUS 10/216,320Publication dateFeb 13, 2003Filing dateAug 12, 2002Priority dateAug 13, 2001Also published asUS7024041Publication number10216320, 216320, US 2003/0031356 A1, US 2003/031356 A1, US 20030031356 A1, US 20030031356A1, US 2003031356 A1, US 2003031356A1, US-A1-20030031356, US-A1-2003031356, US2003/0031356A1, US2003/031356A1, US20030031356 A1, US20030031356A1, US2003031356 A1, US2003031356A1InventorsYasushi SasaOriginal AssigneeDainippon Screen Mfg. Co., Ltd.Export CitationBiBTeX, EndNote, RefManReferenced by (6), Classifications (15), Legal Events (3) External Links: USPTO, USPTO Assignment, EspacenetPattern inspection apparatus and methodUS 20030031356 A1Abstract A marginal distribution feature extraction unit 20 sequentially focuses on each pixel in a reference image and the corresponding pixel in an inspection image, and computes a marginal distribution feature value indicative of the spatial variation in pixel values in the focus pixel neighborhood in both images. Based on this marginal distribution feature value, a tolerance image generation selection unit 26 sets a tolerance range for the reference image or inspection image focus pixel with the less spatial variation. A target image selection unit 30 selects the image comprising pixels from both images for which a tolerance range is not set as a target image. Referencing the set tolerance ranges, a comparison operator 34 compares each pixel in the target image and tolerance image, and outputs a difference Sub representing how far the pixel values of the target image are from the respective tolerance range. A defect determination circuit 38 then outputs data indicating the pixels corresponding to a defect based on a difference map containing these difference Sub values. Images(10) Claims(10)
DESCRIPTION OF PREFERRED EMBODIMENTS [0044] Preferred embodiments of the present invention are described below with reference to the accompanying figures. [0045] 1. Overall Configuration of a Pattern Inspection Apparatus [0046]FIG. 1 is a block diagram showing the configuration of a pattern inspection apparatus according to a preferred embodiment of the present invention. This pattern inspection apparatus detects defects in an inspected object by comparing each pixel in an inspected object image and a reference image. The inspected object image is a multivalued image obtained by photographing an inspected object such as a printed wiring board or semiconductor wafer with a pattern formed on the surface thereof. The reference image is a multivalued image equivalent to an image of a good object of the same type as the inspected object. The reference image is an image used as the standard for comparing the inspected object image in order to detect defects in the inspected object, and can be generated by photographing a good object of the same type as the inspected object or it can be generated from the design data describing the pattern that should be formed on the inspected object. [0047] As shown in FIG. 1 this pattern inspection apparatus has an imaging apparatus 14, first buffer memory 16, reference image generating circuit 10, and reference image memory 12. [0048] The imaging apparatus 14 has, for example, a stage on which the inspected object is placed for movement in a primary scanning direction and a secondary scanning direction by means of a drive means, a CCD or other imaging device for capturing an image of the inspected object on the stage, and an A/D converter for converting the image signal output from the imaging device to a digital signal. The imaging apparatus 14 photographs the inspected object or a good (defect-free) object of the same type (�reference object� below), and outputs a digital image signal. If an inspected object is photographed by the imaging apparatus 14, a signal indicative of the inspected object image is output as the digital image signal and stored as the inspected object image data to first buffer memory 16. If the imaging apparatus 14 captures an image of a reference object, a signal indicative of the reference image is output as the digital image signal and is stored as the reference image data to the reference image memory 12. [0049] The reference image generating circuit 10 generates reference image data from the design data for the pattern that should be formed on the inspected object, and stores the reference image data to the reference image memory 12. [0050] The reference image memory 12 thus stores either reference image data generated by the imaging apparatus 14 from captured image data, or reference image data generated by the reference image generating circuit 10 from the design data. [0051] This pattern inspection apparatus also has a marginal distribution feature extraction unit 20, selection signal generation unit 22, tolerance image generation selection unit 26, tolerance image generation unit 28, target image selection unit 30, and second buffer memory 32. [0052] The marginal distribution feature extraction unit 20 sequentially focuses on two pixels (referred to below as �focus pixels�), specifically a pixel in the inspected object image and a pixel in the reference image, at corresponding positions in each image, extracts a feature of the distribution of pixel values marginal to the focus pixel in the inspected object image and extracts a feature of the distribution of pixel values marginal to the focus pixel in the reference image, and outputs a value indicative of these features as the marginal distribution feature value. [0053] The selection signal generation unit 22 generates a selection signal Ssel based on this marginal distribution feature value. This selection signal Ssel is for selecting the reference image when spatial variation in the pixel values in the neighborhood of the focus pixel in the inspected object image is greater than spatial variation in the pixel values in the neighborhood of the focus pixel in the reference image, and selecting the inspected object image when the opposite is the case. It should be noted that either image can be selected when the spatial variation is substantially the same, and this embodiment of the invention is described as selecting the reference image by way of example. [0054] The tolerance image generation selection unit 26 outputs the focus pixel value from the inspected object image (inspection image) or reference image selected by selection signal Ssel as the source data for tolerance image generation, and the tolerance image generation unit 28 generates a tolerance image from this source data. This tolerance image comprises tolerance pixels generated from the focus pixels of the image selected on a pixel unit basis from the reference image or inspected object image selected by selection signal Ssel, and the value of each tolerance pixel is not constant but has width. This width is equivalent to the range of pixel values (�tolerance range� below) treated as the value of a tolerance pixel for allowing error when determining a match between the focus pixel in the inspected object image and the corresponding pixel in the reference image. [0055] Based on the inverse of selection signal Ssel, the target image selection unit 30 stores the target image data in the second buffer memory 32 by sequentially outputting the focus pixel values from the image (referred to below as the �target image�), i.e., the inspection image or reference image, that was not selected as the tolerance image. [0056] This pattern inspection apparatus also has a comparison operator 34, third buffer memory 36, defect determination circuit 38, inspection result storage unit 40, and inspection result display unit 42. [0057] Using a value within the tolerance range of each tolerance pixel as the value of that tolerance pixel, the comparison operator 34 compares the target image and tolerance image pixel by pixel and sequentially outputs difference Sub indicating the difference between the pixel values of each target image and tolerance image. More specifically, if the value of a pixel in the target image (�target pixel� below) is within the tolerance range of the tolerance pixel at the position corresponding to the target pixel, the output value of difference Sub is 0, and if the target pixel value is outside the tolerance range, a value indicative of how far the target pixel value is outside the tolerance range is output as the difference Sub. The difference Sub values sequentially output from the comparison operator 34 are written to the third buffer memory 36. [0058] When difference Sub is written for every pixel in the target image to third buffer memory 36, a difference map compiling the difference between each of the pixels in the tolerance image and target image will have been created in the third buffer memory 36. This difference map can be treated as a difference image representing the differences between the inspection image and reference image. [0059] The defect determination circuit 38 then determines a threshold value based on the difference map thus obtained, decides that a defect is present wherever the difference value in the difference map is greater than or equal to the threshold value, and outputs data indicating the pixel corresponding to the defect as the inspection result. [0060] The inspection result storage unit 40 could be a hard disk drive, semiconductor memory, or other such storage device, and stores the inspection results received from the defect determination circuit 38. [0061] The inspection result display unit 42 could be a CRT(Cathode-Ray Tube), LCD(Liquid Crystal Display), or other type of display device for presenting the inspection results received from the defect determination circuit 38. [0062] 2. Pixel Comparison Method Used as the Basis for the Present Embodiment [0063] Similarly to the prior art method, this embodiment of the invention sets a pixel value range as a tolerance range for one of the two compared pixels in order to prevent detection errors resulting from image sampling error. Unlike the prior art method, however, the method of the present invention determines for each pixel whether the tolerance range is set for the reference image or inspection image. The method of this invention thus differs from the prior art method which sets the tolerance range (pixel value range) only with respect to the reference image. [0064] The specific method of the present embodiment for setting the tolerance range also differs slightly from the prior art method. [0065] The configuration of the present embodiment with respect to these differences is described later below after first describing the pixel comparison method (referred to below as the �pixel comparison method that is the basis for the present embodiment� or simply the �basis method�) whereby the present embodiment generates a difference map from the inspected object image and reference image assuming that the tolerance range is set only with respect to the reference image as in the prior art. [0066]FIG. 2 is a block diagram for describing the pixel comparison method that is the basis for the present embodiment (basis method). In this basis method the comparison processing unit 100 (corresponding to the part enclosed in a dotted line in FIG. 1) is configured as shown in FIG. 2 and has a max/min search unit 120 equivalent to the marginal distribution feature extraction unit 20, allowable value generating circuit 128 equivalent to the tolerance image generation unit 28, and error tolerance comparison circuit 134 equivalent to the comparison operator 34. [0067] As described above this embodiment of the invention sequentially targets two pixels, a pixel in the inspected object image and a pixel in the reference image, at mutually corresponding positions in the respective images, and these two focus pixels are compared with each other. The max/min search unit 120 in this basis method obtains the highest pixel value Max and the lowest pixel value Min in the nine pixel values of the neighborhood pixel group D9 (including the focus pixel) of the focus pixel in reference image REF, and outputs these Max and Min values together with the focus pixel value Cen. [0068] Using highest pixel value Max, lowest pixel value Min, focus pixel value Cen, and an externally supplied interpolation scale SCL, the allowable value generating circuit 128 calculates the maximum allowable value Rmax and the minimum allowable value Rmin from the following equations (where 0.0≦SCL≦1.0). Rmax=Cen�SCL+Max�(1−SCL) (1) Rmin=Cen�SCL+Min�(1−SCL) (2) [0069] The range Rmin to Rmax determined by the maximum allowable value Rmax and minimum allowable value Rmin thus calculated is the tolerance range set for the focus pixels of the reference image REF. Using a value in this tolerance range Rmin to Rmax as the value of the focus pixel in reference image REF, the error tolerance comparison circuit 134 compares a focus pixel in the inspection image OBJ with the focus pixel in the reference image REF, and outputs difference Sub indicating how far the focus pixel value Obj of the inspection image OBJ is outside tolerance range Rmin to Rmax. More specifically, if Rmin<Obj<Rmax, the focus pixel in the inspection image OBJ matches the focus pixel in the reference image REF and difference Sub is output set to 0; if Obj≦Rmin, Sub=Rmin−Obj is output; and if Obj ≧Rmax, Sub=Obj−Rmax is output. [0070] The tolerance range is thus set based on the values of pixels in the neighborhood of the focus pixel in the reference image and pixels in the inspection image and reference image are compared using this tolerance range in this basis method of the present invention. It is therefore possible to prevent detection errors where there is significant variation in neighborhood pixel values such as at image edges, i.e., detecting pseudodefects due to image sampling error can be prevented. [0071] Defect detection sensitivity can also be adjusted by adjusting the interpolation scale SCL used in this method. More specifically, if the interpolation scale SCL is set to 1, there is no allowable error and the potential for false defect detection in image edge areas increases but detection sensitivity also increases. On the other hand, if the interpolation scale SCL is set to 0, the range defined by the highest and lowest pixel values in the neighborhood pixel group of the focus pixel is the tolerance range, and allowable error thus increases. Detection error in the edge areas, for example, can therefore be reliably prevented but detection sensitivity drops. [0072] 3. Pixel Comparison Method According to this Embodiment [0073] While the pixel comparison method of the present embodiment is based on the basis method described above, it further determines on a pixel basis to set the tolerance range to the reference image or inspection image, and the image data that is the basis for generating the tolerance image is switched pixel by pixel between the reference image and inspection image. FIG. 3 is a block diagram for describing a pixel comparison method according to this embodiment of the invention for producing a difference map from the inspection image OBJ and reference image REF, and shows an exemplary configuration of a comparison processing unit 100 comprising the marginal distribution feature extraction unit 20, selection signal generation unit 22, tolerance image generation selection unit 26, tolerance image generation unit 28, target image selection unit 30, second buffer memory 32, and comparison operator 34 shown in FIG. 1. More specifically, the comparison processing unit 100 of this example comprises first and second max/min search units 220 a and 220 b and first and second subtracters 221 a and 221 b forming the marginal distribution feature extraction unit 20 in FIG. 1; a comparator 222 equivalent to the selection signal generation unit 22; first and second tristate gates 226 a and 226 b forming tolerance image generation selection unit 26; third and fourth tristate gates 230 a and 230 b forming target image selection unit 30; allowable value generating circuit 228 equivalent to tolerance image generation unit 28; and error allowance comparison circuit 234 equivalent to the comparison operator 34. [0074] The first and second max/min search units 220 a and 220 b in this comparison processing unit 100 are both configured identically to the max/min search unit 120 in the above-described basis method. The first max/min search unit 220 a finds the highest pixel value MAXa and lowest pixel value MINa in the nine pixel values of the pixel group surrounding and including the focus pixel in the reference image REF (this group is referred to as the �focus neighborhood pixel group� below, and consists of nine pixels including the focus pixel), and outputs MAXa and MINa together with focus pixel value CENa. The second max/min search unit 220 b finds the highest pixel value MAXb and lowest pixel value MINb in the nine pixel values of the focus neighborhood pixel group in the inspection image OBJ, and outputs these with the inspection image focus pixel value CENb. [0075] The first subtracter 221 a outputs the difference (MAXa MINa) of the highest pixel value MAXa and lowest pixel value MINa output from first max/min search unit 220 a as focus neighborhood change AR in the reference image. The second subtracter 221 b outputs the difference (MAXb−MINb) of the highest pixel value MAXb and lowest pixel value MINb output from second max/min search unit 220 b as focus neighborhood change ΔO in the inspection image. [0076] The comparator 222 then determines if focus neighborhood change ΔR in the reference image is greater than focus neighborhood change ΔO in the inspection image, and outputs affirmation signal Syes or negation signal Sno indicating the result. More specifically, if ΔR>ΔO, affirmation signal Syes outputs a logic high and negation signal Sno goes to a logic low, but if ΔR≦ΔO, affirmation signal Syes goes to a logic low and negation signal Sno goes to a logic high. [0077] The first and second tristate gates 226 a and 226 b each have three groups of data input terminals (i.e., first to third input terminal group), three groups of data output terminals (i.e., first to third output terminal group), and one control input terminal ENA. When a high level signal is applied to the control input terminal ENA, the signals input to the first to third input terminal group are output from the first to third output terminal group; when a low level signal is applied to the control input terminal ENA, the first to third output terminal group goes to a high impedance state. [0078] Signals indicative of the highest pixel value MAXa, focus pixel value CENa, and lowest pixel value MINa in the focus neighborhood pixel group of the reference image REF are input to the first, second and third input terminal groups of the first tristate gate 226 a, respectively. Signals indicative of the highest pixel value MAXb, focus pixel value CENb, and lowest pixel value MINb in the focus neighborhood pixel group of the inspection image OBJ are input to the first, second, and third input terminal groups of the second tristate gate 226 b, respectively. The negation signal Sno is input to the control input terminal of the first tristate gate 226 a, and the affirmation signal Syes is input to the control input terminal of the second tristate gate 226 b. The first, second, and third output terminal groups of the first tristate gate 226 a are connected to the first, second, and third output terminal groups of the second tristate gate 226 b respectively, and to the first, second, and third input terminal groups of the allowable value generating circuit 228 respectively. [0079] Therefore, if focus neighborhood change AR in the reference image is greater than focus neighborhood change ΔO in the inspection image, the focus pixel in the inspection image OBJ is selected as the tolerance pixel and the highest pixel value MAXb, focus pixel value CENb, and lowest pixel value MINb in the corresponding focus neighborhood pixel group are input to the allowable value generating circuit 228 as the source data, i.e., the highest pixel value Max, focus pixel value Cen, and lowest pixel value Min, used to generate the tolerance image. On the other hand, if focus neighborhood change ΔR in the reference image is less than or equal to focus neighborhood change ΔO in the inspection image, the focus pixel from the reference image REF is selected as the tolerance pixel and the highest pixel value MAXa, focus pixel value CENa, and lowest pixel value MINa in the corresponding focus neighborhood pixel group are input to the allowable value generating circuit 228 as the source data, i.e., the highest pixel value Max, focus pixel value Cen, and lowest pixel value Min, used to generate the tolerance image. [0080] The third and fourth tristate gates 230 a and 230 b each have a data input terminal group, data output terminal group, and control input terminal ENA. When a high level signal is applied to the control input terminal ENA, the signals input to the data input terminal group are output from the data output terminal group. When a low level signal is applied to the control input terminal ENA the data output terminal group goes to a high impedance state. A signal indicative of the focus pixel value CENa of the reference image REF is input to the data input terminal group of the third tristate gate 230 a, and a signal indicative of the focus pixel value CENb of inspection image OBJ is input to the data input terminal group of fourth tristate gate 230 b. Affirmation signal Syes is input to the control input terminal of third tristate gate 230 a, and negation signal Sno is input to the control input terminal of fourth tristate gate 230 b. The data output terminal group of the third tristate gate 230 a is connected to the data output terminal group of the fourth tristate gate 230 b and to the data input terminal group of the error allowance comparison circuit 234. [0081] Therefore, if focus neighborhood change AR of the reference image is greater than focus neighborhood change ΔO of the inspection image, the focus pixel in the reference image REF is selected as the target pixel, and the focus pixel value CENa is input to the error allowance comparison circuit 234 as target pixel value Tgt. However, if focus neighborhood change AR in the reference image REF is less than or equal to focus neighborhood change ΔO in the inspection image, the focus pixel in the inspection image OBJ is selected as the target pixel, and the focus pixel value CENb is input to the error allowance comparison circuit 234 as the target pixel value Tgt. [0082] The allowable value generating circuit 228 is configured the same as the allowable value generating circuit 128 in the above-described basis method, and calculates maximum allowable value Amax and minimum allowable value Amin from the following equations (where 0.0≦SCL≦1.0) based on the received highest pixel value Max, focus pixel value Cen, lowest pixel value Min, and interpolation scale SCL. Amax=Cen�SCL+Max�(1−SCL) (3) Amin=Cen�SCL+Min�(1−SCL) (4) [0083] The range Amin to Amax determined by maximum allowable value Amax and minimum allowable value Amin thus calculated is the tolerance range set for the focus pixel selected as a tolerance pixel from among the focus pixels of the reference image REF and inspection image OBJ. The error allowance comparison circuit 234 uses a value in this tolerance range Amin to Amax as the value of the tolerance pixel, compares the target pixel with the tolerance pixel, and outputs difference Sub indicating how far the target pixel value Tgt is separated from the tolerance range Amin to Amax. [0084] More specifically, if Amin<Tgt<Amax, the target pixel is considered to match the tolerance pixel and difference Sub is output as Sub=0. If Tgt<Amin, Sub=Amin−Tgt is output, and if Tgt>Amax, Sub=Tgt−Amax is output. The difference Sub output from the error allowance comparison circuit 234 is then stored to third buffer memory 36 as the value indicating the difference between the focus pixel in the inspection image OBJ and the corresponding focus pixel in the reference image REF. [0085]4. Operation [0086] An example of operation according to the basis method is described first below by way of comparison before describing the operation of the present embodiment. [0087]FIG. 4 shows an example of applying the above-described basis method (see FIG. 2) to generate a difference map from the inspection image OBJ and reference image REF. In this example reference image REF is assumed to contain a first small pattern 1A and a second small pattern 2A, inspection image OBJ to contain a small pattern 1B corresponding to first small pattern 1A and a pattern 3B as a minute defect, and a pattern in inspection image OBJ corresponding to second small pattern 2A in the reference image REF is missing. Now consider an image REFmax (referred to below as the �maximum allowable value image�) consisting of pixels each of which has the maximum allowable value Rmax calculated for each pixel in the reference image REF by allowable value generating circuit 128, and an image REFmin (referred to below as the �minimum allowable value image�) consisting of pixels each of which has the minimum allowable value Rmin calculated for each pixel in the reference image REF by allowable value generating circuit 128. In this case the maximum allowable value image REFmax contains small pattern 1Amax comprising pixels with a high pixel value as a pattern equivalent to first small pattern 1A, and small pattern 2Amax comprising pixels with a high pixel value as a pattern equivalent to second small pattern 2A. The minimum allowable value image REFmin contains small pattern 1Amin comprising pixels with a low pixel value as a pattern equivalent to first small pattern 1A and small pattern 2Amin comprising pixels with a low pixel value as a pattern equivalent to second small pattern 2A. [0088] Difference map Msub0 indicating the differences between reference image REF and inspection image OBJ is then generated by the comparison process applied by error allowance comparison circuit 234 to inspection image OBJ and reference image REF for which the allowance range is defined by maximum allowable value image REFmax and minimum allowable value image REFmin. This difference map Msub0 does not contain a pattern equivalent to the difference between first small pattern 1A in reference image REF and small pattern 1B in inspection image OBJ (Sub=0), but does contain a low pixel value pattern 2sub0 as a pattern indicating the absence of second small pattern 2A in inspection image OBJ, and a high pixel value pattern 3sub0 as a pattern equivalent to the small defect pattern 3B in inspection image OBJ. Small defects shown by this small defect pattern 3B correspond to the pattern 3sub0 comprising pixels with a high pixel value, and can therefore be detected using this difference map Msub0. The absence of small pattern 2A in inspection image OBJ, however, corresponds to the pattern 2sub0 comprising pixels with a low pixel value, and may be undetectable depending upon the setting of the threshold value used by the defect determination circuit 38. Furthermore, even if the loss of pattern 2A is detected from pattern 2sub0, it is possible that the defect indicated by the low pixel value pattern 2sub0 will be deemed not significant. [0089] The operation of the present embodiment with respect to the inspection image OBJ and reference image REF described above is described next below. [0090]FIG. 5 shows an exemplary operation whereby the present embodiment (shown in FIG. 1 and FIG. 3) produces a difference map from the inspection image OBJ and reference image REF. As in the above example it is here assumed that the reference image REF contains a first small pattern 1A and a second small pattern 2A, the inspection image OBJ contains a small pattern 1B corresponding to first small pattern 1A and a small defect pattern 3B, and a pattern in inspection image OBJ corresponding to second small pattern 2A in the reference image REF is missing. [0091] In this case a wide tolerance range Amin to Amax is set for first small pattern 1A in reference image REF even if the tolerance image is generated from the pixel values of either reference image REF or inspection image OBJ because the corresponding small pattern 1B is present in inspection image OBJ. [0092] However, because a pattern corresponding to second small pattern 2A in reference image REF is not present in inspection image OBJ, the tolerance image is generated from the pixel values in inspection image OBJ where there is little change in the pixel values in the focus neighborhood. More specifically, both maximum allowable value Amax and minimum allowable value Amin are generated with a value near 0 based on the values of the neighborhood pixel groups of the pixels in inspection image OBJ corresponding to the pixels of the second small pattern 2A in the reference image REF. [0093] Furthermore, because there is no pattern in the reference image REF corresponding to the small defect pattern 3B in inspection image OBJ, the tolerance image is produced from pixel values in the reference image REF with little change in the focus neighborhood. More specifically, both maximum allowable value Amax and minimum allowable value Amin are generated with a value near 0 based on the values of the neighborhood pixel groups of the pixels in reference image REF corresponding to the pixels of defect pattern 3B in inspection image OBJ. [0094] As is the case with the basis method, consider a maximum allowable value image AImax consisting of pixels each of which has the maximum allowable value Amax calculated for each tolerance pixel, and a minimum allowable value image AImin consisting of pixels each of which has the minimum allowable value Amin calculated for each tolerance pixel. In this case the maximum allowable value image AImax contains small pattern 1Cmax of pixels with a high pixel value as a pattern equivalent to first small pattern 1A, but does not contain a pattern equivalent to second small pattern 2A (or if it does, the pattern contains pixels with quite low pixel values). In addition, the minimum allowable value image AImin contains a small pattern 1Cmin of pixels with low pixel values, but does not contain a pattern equivalent to second small pattern 2A (or if it does, the pattern contains pixels with quite low pixel values). It should be noted that a pattern equivalent to small defect pattern 3B is not included in minimum allowable value image AImin or maximum allowable value image AImax. The tolerance image comprises the pixels selected as the tolerance pixels from among the focus pixels in the inspection image OBJ and reference image REF, and a tolerance range defined by maximum allowable value image AImax and minimum allowable value image AImin is set for each pixel in the tolerance image. [0095] The target image TGT comprises the pixels selected from the focus pixels in reference image REF and inspection image OBJ with a high (or more accurately a not-low) focus neighborhood change value, and therefore contains a small pattern 1D of pixels with a high pixel value as a pattern equivalent to small pattern 1A or 1B, a small pattern 2D of pixels with a high pixel value as a pattern equivalent to second small pattern 2A, and a small pattern 3D of pixels with a high pixel value as a pattern equivalent to small defect pattern 3B. [0096] Difference map Msub indicating the differences between reference image REF and inspection image OBJ is then obtained when the error allowance comparison circuit 234 processes target image TGT and the tolerance image, which comprises tolerance pixels having a tolerance range thus defined by maximum allowable value image AImax and minimum allowable value image AImin. A pattern equivalent to the differences between first small pattern 1A in reference image REF and small pattern 1B in inspection image OBJ is not present (Sub=0) in this difference map Msub, but pattern 2sub comprising pixels with a high pixel value as a pattern indicative of the absence in inspection image OBJ of the pattern corresponding to second small pattern 2A in reference image REF, and pattern 3sub comprising pixels with a high pixel value as a pattern equivalent to small defect pattern 3B in inspection image OBJ, are present in the difference map Msub. [0097] It is therefore possible using this difference map Msub to reliably detect both the loss of second small pattern 2A and small defects represented by pattern 3B in the inspection image OBJ representing the inspected object. [0098] 5. Benefits of the Invention [0099] As will be known from the preceding description, instead of setting a tolerance range only for the reference image, this embodiment of the present invention based on the above pixel comparison method sequentially selects from among the focus pixels of the reference image and inspection image the pixel having less change (ΔR, ΔO) in the focus neighborhood as the tolerance pixel forming the tolerance image, sets a tolerance range Δmin to Δmax for the tolerance pixel, and selects from among the focus pixels in the reference image and inspection image the pixel for which a tolerance range is not set as the target pixel forming the target image. A value in the tolerance range Amin to Amax is then used as the value of that tolerance pixel for an error allowance comparison process applied to the target image and tolerance image. Because the image used to set the tolerance range is switched on a pixel unit basis according to change (ΔR, ΔO) in the focus neighborhood, it is possible to avoid detecting pseudodefects caused by image sampling error as in the basis method, and it is also possible to suppress a drop in detection sensitivity. [0100] More specifically, when a reference image containing a small pattern is compared with an inspection image in which that small pattern is missing, a tolerance range is set for each focus pixel in the inspection image corresponding to the small pattern before the small pattern parts are compared in the reference and inspection images so that the difference Sub for these small pattern parts is sufficiently high. Because this difference Sub is also stored in third buffer memory 36 as a value indicative of the difference between the reference image and inspection image in this small pattern part, defects apparent as the loss of a small pattern in the inspection object can be reliably detected. [0101] Furthermore, because the image for which a tolerance range is set for the comparison of the inspection image and reference image is switched pixel by pixel dynamically according to change in the focus neighborhood, this embodiment of the invention enables robust defect detection with detection precision and detection sensitivity minimally dependent on pattern shape. It should be noted that because a tolerance range is set for each pixel in the tolerance image, the present invention can, similarly to the prior art method, detect defects without precise registration for the image comparison. [0102] Furthermore, because the image for which the tolerance range is set for the error allowance comparison is changed by pixel unit in the present embodiment, the image comparison operation obtains the difference between both images without distinguishing between the reference image and inspection image. Therefore, when inspecting repeated patterns while changing the reference image (see FIG. 8 and FIG. 9), detection sensitivity does not change due to changing the reference image as it does with the prior art method, and the present invention is therefore able to prevent not finding a defect. [0103] 6. Alternative Embodiment [0104] The preceding embodiment determines whether to set the tolerance range for the focus pixel in the inspection image or the focus pixel in the reference image (i.e., which focus pixels to use to generate the tolerance image) based on a marginal distribution feature value, and uses focus neighborhood change AR or ΔO, which is the difference between the highest and lowest pixel values in the group of nine pixels surrounding and including the focus pixels in both images, as this marginal distribution feature value (see FIG. 3). [0105] The marginal distribution feature value used to determine the focus pixel for which the tolerance range is set is not, however, limited to this value (ΔR, ΔO) representing change in the pixel values in the focus neighborhood. Spatial variation in the pixel values near the focus pixel could, for example, be used. The variance of the nine pixel values near the focus pixel can therefore be used as the marginal distribution feature value instead of focus neighborhood change ΔR or ΔO. The number of pixels used to calculate this variance or other marginal distribution feature value is also not limited to the nine adjacent pixels. A block of 5�5=25 pixels around the focus pixel can, for example, be used to calculate the marginal distribution feature value. [0106] It will also be noted that a pattern inspection apparatus according to this embodiment of the invention is described as a dedicated hardware configuration, but all or part of the comparison processing unit 100 and defect determination circuit 38 shown in FIG. 1 and FIG. 3, for example, can be achieved as software configurations by running a specific program using a CPU (central processing unit). In this case, as shown in FIG. 6 the pattern inspection apparatus of the present invention can be achieved with a computer having connected via a bus a CPU 54 for running this specific program, memory 52 for storing the specific program, reference image data, and inspection image data, an input interface unit 51 to which an imaging apparatus 14 for photographing the inspection image, for example, is connected, an I/O interface unit 53 to which a hard disk drive is connected as the inspection result storage unit 40, and a display control unit 55 to which a CRT, LCD, or other display device is connected as the inspection result display unit 42. [0107] Although the present invention has been described in connection with the preferred embodiments thereof with reference to the accompanying drawings, it is to be noted that various changes and modifications will be apparent to those skilled in the art. Such changes and modifications are to be understood as included within the scope of the present invention as defined by the appended claims, unless they depart therefrom. [0108] It will be further noted that priority for the present invention is claimed based on Japanese Patent Application 2001-245354 titled �pattern inspection apparatus and method� and filed on Aug. 13, 2001, the entire content of which is incorporated herein by reference. Referenced byCiting PatentFiling datePublication dateApplicantTitleUS7305645 *Sep 7, 2004Dec 4, 2007Advanced Micro Technologies, Inc.Method for manufacturing place & route based on 2-D forbidden patternsUS7689026 *Aug 31, 2005Mar 30, 2010Sysmex CorporationMethod for testing image processing circuit, particle image analyzer, and storage mediumUS7689967 *Nov 3, 2006Mar 30, 2010Synopsys, Inc.Reference image generation from subject image for photolithography mask analysisUS7702159 *Jan 14, 2005Apr 20, 2010Microsoft CorporationSystem and method for detecting similar differences in imagesUS7953269 *Jul 13, 2007May 31, 2011Fujitsu Semiconductor LimitedMethod for inspecting pattern defect occured on patterns formed on a substrateWO2005013199A1 *Jul 21, 2004Feb 10, 2005Applied Materials IncColor variation compensation algorithm for bright field wafer inspection* Cited by examinerClassifications U.S. Classification382/145International ClassificationG06T1/00, G01B11/24, G06T7/00, H05K3/00, G01N21/956, G06K9/62Cooperative ClassificationG06T7/001, G06K9/6255, G06T2207/30141, G01N21/95607, G06T2207/30148European ClassificationG01N21/956A, G06K9/62B6, G06T7/00B1RLegal EventsDateCodeEventDescriptionSep 4, 2013FPAYFee paymentYear of fee payment: 8Sep 2, 2009FPAYFee paymentYear of fee payment: 4Aug 12, 2002ASAssignmentOwner name: DAINIPPON SCREEN MFG. CO., LTD., JAPANFree format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:SASA, YASUSHI;REEL/FRAME:013208/0377Effective date: 20020705RotateOriginal ImageGoogle Home - Sitemap - USPTO Bulk Downloads - Privacy Policy - Terms of Service - About Google Patents - Send FeedbackData provided by IFI CLAIMS Patent Services©2012 Google


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Meet the 20-somethings priced out of London, leaving for a new life elsewhere | Money | The Guardian
Starting over in a different part of the UK is the choice of an ever-growing number of younger people. Suzanne Bearne looks at why they moved
Mon 6 Nov 2017 02.00 EST Last modified on Fri 1 Dec 2017 21.31 EST
Many 20-somethings are bucking the tradition of enjoying big city life and moving to Margate in Kent. Photograph: Urban Images/Alamy
But like many others who move to Margate, it is not just the affordable rents that attracted them, it’s the change in lifestyle. “I like the quietness, and the air is fresh,” says Bristow. “It also feels like you can do whatever you want here - such as open a shop. It’s given me more free time to do other things. I work less – I take Wednesdays off.”
“One of the biggest annoyances was not being able to try new hobbies. Everything seems to be £15-£20 a session in London, say for yoga or pilates, so I felt even though I earned a pretty good wage, my life was forced to be a bit small. Here classes are cheaper - and less busy - so I can try some new things.”
I’m able to save money every month for the first time, which is a great feeling

type: global

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No Woman, No Cry DVD, 2011 | eBay
Tell us what you thinkNo Woman, No Cry (DVD, 2011)Christy Turlington | Rating: Not RatedBe the first to review it!15 availableBrand New14from$12.33Acceptable1from$12.99View all listings (15)Top pick This item appears here because it is the lowest priced, Buy It Now item from a highly rated seller.Start of LayerEnd of LayerNEW No Woman No CryBrand NewReturns not acceptedCovered by eBay Buyer ProtectionSee termsSold by :buy ( 2786092 ) 99.6% positive feedbackUSA$13.44PriceAdd to cartBuy It NowTop Rated PlusFrom sellers with the highest buyer ratings14+ day returns, money backShips in a business day with trackingLearn moreStart of LayerEnd of LayerTop pick This item appears here because it is the lowest priced, Buy It Now item from a highly rated seller.Start of LayerEnd of Layer .. No Woman No CryAcceptableFree shippingReturns not acceptedCovered by eBay Buyer ProtectionSee termsSold by :spike706 ( 10588 ) 100% positive feedbackUSA$12.99PriceSee detailsRefine results:Condition :Brand NewAcceptableShow only :Expedited shippingReturns acceptedFree shippingCompleted listingsLocation :US OnlyNorth AmericaWorldwideAllBuy it nowAuctionBest MatchTime: ending soonestTime: newly listedPrice + Shipping: lowest firstPrice + Shipping: highest firstPrice: highest firstDistance: nearest firstBest MatchSort .. No Woman No CryAcceptableTop Rated Plus$12.99Free shippingBuy it now or Best offer20h 39mNo Woman, No Cry (DVD New)Brand New$11.86Buy it now28d 12h 17mNO WOMAN, NO CRY - NEW DVDBrand New$12.33Buy it now20d 0h 35mNEW No Woman No CryBrand New$13.44Buy it now27d 4h 26mNo Woman No Cry DVDBrand New$13.00Buy it now5d 7h 43mArts Alliance America No Woman No Cry [dvd] (hspd670785d)Generous 30-day return policyBrand NewTop Rated Plus$16.63Buy it now7d 2h 14mNo Woman, No Cry (DVD, 2011) (DVD, 2011)Ships Within 24 Hours - Satisfaction Guaranteed! Delivery Confirmation IncludedBrand New$15.82Buy it now---No Woman, No Cry (DVD, 2011) (DVD, 2011)FREE TWO BUSINESS DAY SHIPPING UPGRADE, BRAND NEW !!!!Brand New$15.96Buy it now---No Woman, No Cry [DVD New]Brand New$17.80Free shippingBuy it now17d 3h 21mNo Woman No Cry, New DVD, Artists not provided, Christy Turlington BurnsBrand NewTop Rated Plus$21.18Free shippingBuy it now15d 1h 15mTurlington,Christy No Woman No Cry DVD NEWBrand New$17.01Free shippingBuy it now1d 23h 9mNo Woman, No Cry (DVD, 2011) (DVD, 2011)Brand NewBrand New$19.50Buy it now---No Woman No Cry DVDBrand New$17.74Free shippingBuy it now13d 18h 21mNo Woman No Cry - DVD Brand NewBrand New$22.33Free shippingBuy it now2d 7h 14mNo Woman, No Cry (DVD, 2011) (DVD, 2011)NEW/SEALED & Perfect 4 Gift Giving - ADD TO CART ~~~ and Make Someone's Day a Spec...Brand New$25.89Buy it now---Get additional coverageConfirmConfirm$pro$ Warranties on eBayHide detailsLearn moreOptional coverage offered by SquareTradeClick on the See details button to add warranty Supplements any existing manufacturer or seller warrantyCovers mechanical and electrical failures, including normal wear and tearFull item price reimbursement if it can't be fixedAvailable for new, refurbished, and used items Award-winning customer service with over 100,000 fans on Facebook Additional accidents coverage, if selected, includes drops and spills5 day service guaranteeWarranty available only to US or Canadian residentsStart of LayerEnd of LayerWhy don't we show the price?Sellers have the right to set their own prices independently, but some manufacturers place restrictions on how these prices will be displayed or communicated to others.Start of LayerEnd of LayerMovie synopsis Christy Turlington Burns directs this documentary following the plights of four pregnant women in four very different parts of the globe, from a remote area in East Africa; to a Bangladeshi slum; to a prenatal ward in the United States. The film is meant to highlight the sad story of the more than half a million women who die from preventable complications of pregnancy and childbirth each year.Product DetailsNumber of Discs: 1Rating: Not RatedFilm Country: USAUPC: 829567078525Additional DetailsGenre:Education/General InterestFormat:DVDDirector:Christy TurlingtoneBay Product ID: EPID110314866Portions of this page Copyright 1981 - 2014 Muze Inc. All rights reserved.Reviews & ResearchCustomer ReviewsBe the first to review it!Best selling DVDs & Blu-ray DiscsBeauty and the Beast (DVD, 2010, 2-Disc Set, Diamond Edition...#1$14.99Game of Thrones: Season 3 (DVD, 2014, 5-Disc Set)#2$15.85Sleeping Beauty (DVD, 2008, 2-Disc Set, Platinum Edition)#3$10.00Thor: The Dark World (DVD, 2014)#4$14.99Downton Abbey: Season 4 (DVD, 2014, 3-Disc Set)#5$13.49

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Posted Jul 18, 2016 We stayed here for seven nights. The grounds are beautiful and quiet as the buildings are fairly spread out. The beach in front of the hotel is pristine.
３泊からのコンドミニアム
Posted Jun 22, 2016 ワイレア近辺のコンドミニアムは相当良いのですが
ここはプールも充実していていう事ありません
３泊以上出来るならここがオススメです
Nice hotel close to a great beach.
Posted Jun 8, 2016 Wailea is a great area - the condo is close to shopping, great beach, top rated hotels nearby.
Highly recommend Ekahi Village.
Jun 11, 2016 by Matt, Hotel Management
Aloha... I am pleased to read that you had a wonderful visit and thank you so much for recommending Ekahi Village to other travelers. Hopefully, we will have the pleasure of welcoming you back. Mahalo.
Comfortable, clean condo. 5 min walk to the beach
Posted May 30, 2016 Adequately appointed and clean. The property is beautifully maintained and on a beach in great location. Have stayed here before and would stay here again. 5 out of 5
Posted May 25, 2016 Wir hatten ein traumhaftes Zimmer/kleine Wohnung mit Gartenblick und seitlichem Meerblick... Der Garten ist auf höchstem Niveau gepflegt. Täglich wurde unser Zimmer gereinigt/Handtücher gewechselt.... . Die Küche war mit allem Nötigen voll ausgerüstet! Leider musste man immer die Schlüssel (keine Karten!) bei sich tragen (für das Zimmer und einen für die Pooloanlagen)... Die Anlage verfügt über mehrere Pools... Der große Pool am Meer war mit genügend Schattenplätzen ausgestattet.. Kinder herzlich willkommen.... Abends sind wir meistens an den näheren Pool von unserem Zimmer aus gegangen (kleiner und nicht so schön wie der am Meer)....-> Dort durfte man nicht lauter Reden und Kinder waren überhaupt nicht willkommen.... (Dass man dort schwimmen durfte, grenzte schon an ein Wunder). Wir sind kinderlos, haben aber sofort gemerkt, was für Spielregeln hier am Pool gelten.... Am besten leise sein....
Die nächst liegende Bar war mit ca. 30min zu Fuss zu erreichen... bzw. musste man das Auto benutzen!
Aber es war ein wunderschöner Aufenthalt im Paradies... Kann es zu 100% weiterempfehlen. 5 out of 5
by ANNABELLE from Las Vegas, Nevada
I have stayed here previously and this stay was also amazing. Check in was quick and they are always great! Got an remodeled condo this time and felt so comfortable and nice. Very close to the beach and only about a five minute walk. Ten to twelve minute walk to the Wailea Mall. Location was convenient and barely used my car. Housekeeping came everyday and always offered any items we need. Would definitely stay here again and again!
We have always stayed at the Palms just across the street, but decided to try the Ekahi this vacation. Both have very nice spacious living areas. The benefit at Ekahi over the Palms is that the pool area leads directly to the beach, so we could take our snorkeling gear and boogie boards to the pool and leave them in safety and hop down to the beach when we wanted. So if some of us wanted pool time, we could do both quite easily. The pool area has a great kitchen area so those who wanted to have pupus or cold drinks could bring them down for group get-togethers. We were too busy trying all the nearby restaurants though. The beach right in front of the condos has a great little reef/snorkeling area. A huge humpback whale gave us a show right in front of the property! The only downside was picking up the key on our late arrival. It was a little awkward (we were tired from the flight), but they gave us clear instructions. It just wasn't on site. Not a big issue, but not perfectly convenient. The condo unit was very clean and spacious with amazing water views from every room. Lots of fresh towels provided daily. I wasn't expecting maid service, but we appreciated it greatly!
by aden from seattle
Lovely condo. Well maintained property
We love the Wailea area. This property had good beach access, nice pools and the condo was very comfortable.
by Bronwyn from Melbourne
Nice condos in great location. Very quiet setting with immaculate gardens
Great stay with immediate pool and beach access
Posted Feb 26, 2016 Pros: The proximity to the boardwalk and resorts in Wailea as well as having immediate beach access and being able to sit at the pool and watch the wales.
Cons: It is on a fairly steep hill, carrying beach chairs to / from the beach with a cooler was a bit tough without transportation but doable once a day
Location: It is nice to have the Shops of Wailea so close within walking distance as well as having Kihei a short drive away with the many shops and restaurants
We stayed in a studio condo halfway up the hill at this location. It was a perfect location on site, close to one of the 'quiet area' smaller pools which we loved and not too far from the main pool that is right on the beach. The room was very comfortable and made us feel like we were really home away from home. It had all the amenities, bbq, in suite laundry and fully equiped kitchen. My favorite part of the day was having a coffee on the quiet fairly private ground leve deck area that our unit had in the morning sun watching the flowers open in front of my eyes and seeing the beautiful red cardinal join me nearby on the trees. Back to Hotel Details

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Words containing chevarri | Words that contain chevarri
Words containing chevarri | Words that contain chevarri http://www.thefreedictionary.com/words-containing-chevarriPrinter Friendly
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Words containing chevarri
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value: This website is an American online dictionary and encyclopedia that aggregates information from various sources.


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rawrtwenty2 comments on This is Sunday: What were your running achievements this week?jump to contentmy subredditsannouncementsArtAskRedditaskscienceawwblogbookscreepydataisbeautifulDIYDocumentariesEarthPornexplainlikeimfiveFitnessfoodfunnyFuturologygadgetsgamingGetMotivatedgifshistoryIAmAInternetIsBeautifulJokesLifeProTipslistentothismildlyinterestingmoviesMusicnewsnosleepnottheonionOldSchoolCoolpersonalfinancephilosophyphotoshopbattlespicsscienceShowerthoughtsspacesportstelevisiontifutodayilearnedTwoXChromosomesUpliftingNewsvideosworldnewsWritingPromptsedit subscriptionsfront-all-random | Music-Showerthoughts-history-photoshopbattles-nosleep-funny-OldSchoolCool-worldnews-EarthPorn-InternetIsBeautiful-food-news-explainlikeimfive-listentothis-WritingPrompts-personalfinance-gaming-IAmA-askscience-Futurology-Fitness-Jokes-nottheonion-DIY-UpliftingNews-AskReddit-todayilearned-videos-philosophy-GetMotivated-pics-tifu-space-Documentaries-TwoXChromosomes-Art-dataisbeautiful-creepy-books-sports-television-gifs-gadgets-LifeProTips-mildlyinteresting-aww-science-moviesmore » runningcommentsrelatedwant to join? login or register in seconds|Englishlimit my search to /r/runninguse the following search parameters to narrow your results:subreddit:subredditfind submissions in "subreddit"author:usernamefind submissions by "username"site:example.comfind submissions from "example.com"url:textsearch for "text" in urlselftext:textsearch for "text" in self post contentsself:yes (or self:no)include (or exclude) self postsnsfw:yes (or nsfw:no)include (or exclude) results marked as NSFWe.g. subreddit:aww site:imgur.com dogsee the search faq for details.advanced search: by author, subreddit...this post was submitted on 01 Jul 201236 points (82% upvoted)shortlink: remember mereset passwordloginSubmit a new linkText post (Read the FAQ?)runningsubscribeunsubscribe133,667 readers206 users here nowHome hot new top
a community for 6 yearsmessage the moderatorsMODERATORStherumrunnersirnoobiusGrand Champion of LifekibitzorBoston Sports Club sucksxenonscreams85:48 half-marathon♀seydar1" inseam teamThe_SteampunkWolfpack NationAutoModerator353637This is Sunday: What were your running achievements this week? (self.running)submitted 2 years ago by laker14205 commentssharecancelsorry, this has been archived and can no longer be voted onloading...sorted by: bestbesttopnewhotcontroversialoldrandomyou are viewing a single comment's thread.view the rest of the comments →[–]rawrtwenty2 0 points1 point2 points 2 years ago (0 children)sorry, this has been archived and can no longer be voted onI have definitely thought about it, but we've had to wait to go to bed when the temperature isn't hot anymore. I can't sleep in heat at all and if I woke up early anyways I would lose sleep. Difficult situation but it looks like it will cool down next weekend. Also, I might be able to wake up early a few days this week when we have air conditioning so that might help me get to running. I have too much energy to wait!
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Don't Let China Off The Hook - Bloomberg
Bloomberg Anywhere Remote LoginDownload SoftwareService Center MENU Homepage Markets Stocks Currencies Commodities Rates + Bonds Economics Magazine Benchmark Watchlist Economic Calendar Tech U.S. Global Startups Cybersecurity Digital Media Bloomberg Technology TV Hello World Studio 1.0 Pursuits Cars & Bikes Style & Grooming Spend Watches & Gadgets Food & Drinks Travel Real Estate Art & Design Brilliant Ideas Politics Global Risk Briefing How We’ll Know if Trump Is Making America Great Again Tracking Trump’s Web of Conflicts The Inauguration of Donald J. Trump On the March in Trump’s Capital Opinion View Gadfly Businessweek Subscribe Cover Stories Opening Remarks Etc Features 85th Anniversary Issue Behind The Cover More Climate Changed Video Series: Ventures Graphics Billionaires Game Plan Small Business Personal Finance Inspire GO The David Rubenstein Show Sponsored Content Bloomberg About The Company Sign In Sign In Subscribe Don't Let China Off The Hook
First Japan, now China? After an impressive, nuanced show of force in placing $1 billion of punitive tariffs on Chinese exports to combat the flagrant piracy of U.S. products, the Clinton Administration is in danger of signing a deal that does little to shrink America's growing $30 billion deficit with China. That would be a big mistake.
Throughout the cold war, the U.S. accepted Japanese protectionism because of overriding geopolitical concerns. Lost exports, slower growth, and fewer American jobs were the price of Tokyo's continued political support in the fight against communism. Besides, the bulk of the global trading system was open, and the U.S. could compete successfully in Europe and other markets where the playing field was more level.
We now see that the price of solidarity was too high and that Japanese-style mercantilism is no harmless economic anomaly. That is why Washington--and Corporate America--should think twice about the specter of Chinese mercantilism. If China can create a closed economy that feeds off never-ending trade surpluses with the U.S., the free-trade system could break down. It's not only China's size--its economy is expected to rival that of the U.S. in three decades--but its role as a model for the rest of Asia that matters. The U.S. would be hard put to remain true to its free-trade principles if all of Asia goes mercantilist.
To a growing number of Americans, the benefits of free trade are already elusive. Traditional opposition from unions on the left is being joined by new opposition on the right, from freshman Republicans to European businessman Sir James Goldsmith. The bipartisan support behind the U.S. role in financing the expansion of free markets and democracy around the world that began with the Marshall Plan is eroding. Increasingly, the forces of protectionism and internationalism do battle in Congress. Neither the Democratic nor Republican leadership, for example, could deliver the votes to provide loan guarantees to help Mexico. And the North American Free Trade Agreement and the General Agreement on Tariffs & Trade passed with the slimmest of margins.
It may be that Beijing's leadership crisis makes it hard for China to accommodate the U.S. But the confusion surrounding the imminent passing of Deng Xiaoping is also an opportunity. China is not only undergoing a succession crisis, it is deciding what kind of capitalism it wants--closed or open, state-owned or private, inward-looking or internationalist. Does it enforce its laws on intellectual-property rights, or does it not?
Now is a perfect time for Washington to make it clear that the U.S. and the global trading system are open only to those who play by the rules. Running 29 factories that counterfeit American software and video disks is simply not acceptable in a trading partner. It is more than a matter of knocking off copies of The Lion King. The intellectual-property conflict revolves around Chinese piracy of U.S. technology and management knowhow on a broad scale. After Chrysler Corp. invested millions of dollars in China to build Jeeps, it discovered to its horror that the Chinese were knocking them off--with no apology.
This is a critical moment for free trade. U.S. Trade Representative Mickey Kantor should make it plain that the counterfeiting must end and the trade imbalance must begin to shrink before the U.S. allows China to join the new World Trade Organization. China and the U.S. can prosper together only if they can reap benefits from being in each other's markets. That message should be delivered to Beijing by Kantor--and all of China's trading partners, for that matter. Anything less will undermine free trade around the globe.

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Video object detection software or overlay | ActionScript | Adobe Flash | Javascript | PHP | Software Architecture
Video object detection software or overlay
Need software to detect
On a video playing, detect light bulb flashing, flashes at 4 flash per second,
In video make a square around the building whenever bulb flashes at this rate,
Bulb can flash at any location on screen
Skills: ActionScript, Adobe Flash, Javascript, PHP, Software Architecture
See more: object detection algorithms real time video code, object detection project video, object detection video, opencv object detection tutorial, real time object detection tensorflow, object detection using opencv source code, real time object detection opencv python, simple object detection python, opencv object detection python, opencv object detection and tracking, real time object detection python, overlay video object flash, video object detection, as3 object detection video, opencv object detection video, projects object detection video, object detection video using matlab code, object detection video processing opencv, object detection video using matlab, source code object detection video using
Project ID: #17606775
Hi there, This is Smithangshu. I am extremely sure about it that I can develop the Computer Vision Application to detect bulb flashing for you. I am very interested to develop your project if you kindly allow me. More
Hi, this looks interesting! I presume this is a streaming video, and you usually use a browser to view it? Please share a sample video here at Freelancer so I may know the characteristic of the flashing bulb. I th More
•	Web designer plays a significant role in creating unique and appropriate pattern and outline of web pages of the websites. •	Besides, he also plays a vital role by performing the coding work for the website More
Hello, I am Alex from Shark Software. Could you describe your project in detail? Could you provide your requirements? Regards, Alex
Write code for Arduino , wireless light control with button (₹600-1500 INR)
Arudino code for lights control ($10-30 USD)
Writ code for Arduino button and light conyrol (₹600-1500 INR)

value: This website is an Australian freelance marketplace website, which allows potential employers to post jobs that freelancers can then bid to complete. Founded in 2009, its headquarters is located in Sydney, Australia, though it also has offices in Vancouver, London, Buenos Aires, Manila, and Jakarta.


text:
#3 of 241 Restaurants in Winter Park Certificate of Excellence $$ - $$$
reviews Clear all Doglover51
49 helpful votes “Not such a big deal”
My goodness, you would have thought this place was the holy grail in our area, but we tried it twice...very crowded, have to stand in line to get your food, which we don't like....the food honestly was just average BBQ...nothing that we noted was exceptional. In fact there are smaller out of the way places locally that are far better....
More Helpful? Thank Doglover51 Report HUnrish
Level Contributor 12 reviews 3 helpful votes “Looking for a barbeque place for take out in Orlando.”
Great BBQ-- I ordered the ribs as take out and the food was great. I ordered the rack of ribs and it was enough food for my daughter and myself. I loved it but she wanted extra BBQ sauce. The staff was very friendly. I would go again!!
Helpful? Thank HUnrish Report DWil38
The food coming out of 4 Rivers Smokehouse is just simply delicious. The smell of the smoked meat cooking wafts through the neighborhood beckoning people to stop by and it does not disappoint. There is always a line of people waiting outside for the food. 4 Rivers provides self serve refreshing lemonade and water for customers as they wait. I...
More Helpful? Thank DWil38 Report TokyoAndy54
12 helpful votes “Good BBQ in Orlando? Yes!”
Good BBQ in Orlando? Establish in 2009, 4 Rivers Smokehouse has quickly made it into the national BBQ rankings. The book 100 Best BBQ Joints in America ranked them #4 overall and #1 for Brisket. So, we had to give them a try. The brisket is good - but not anywhere near as good as the versions you find in...
More Helpful? Thank TokyoAndy54 Report Bryan L
We stopped by after reading the TA reviews. It was excellent! My wife and oldest son got pulled pork which was excellent! I ordered a half rack. They were also excellent! It was great with or with out sauce. The traditional sauce was terrific. For what ever reason my 6 year old wanted pbj with apple sauce which is on...
More Helpful? Thank Bryan L Report adugan1
16 helpful votes “Favorite BBQ in Orlando”
BBQ is a highly personalized thing and everyone has their own style or preference and fortunately, Orlando has other BBQ joints that cater to specific styles (like Cecil's and Pig Floyd's), but overall 4 Rivers remains my favorite.
We've eaten there since their first days in Winter Park and queued up on many occasion to eat there (and I'm not...
More Helpful? Thank adugan1 Report JkenyonG
8 helpful votes “A Barbeque snobs Barbeque!”
Well being from the South you get to know good barbeque pretty quickly. I grew up eating Barbeque at Jacks in Clermont with my father, my grand father and my Great grand father so I guess you could say that I was well schooled in what constitutes good barbeque. It is my opinion that there is no such thing as...
More Helpful? Thank JkenyonG Report TravelZipper
51 helpful votes “Good, could be better”
If they would run two cash registers, the line wouldn't be sooo damn long!!!!
The food is good but not worth the 30 minute wait!!!
Helpful? Thank TravelZipper Report Robert F
Level Contributor 4 reviews “Good Q”
The place to go for most for Q and brisket. Usually a line, dining room plain, communal picnic tables, cheerful and a bit noisy.
Helpful? Thank Robert F Report jlm456
Amex Traveler Level Contributor 212 reviews 170 restaurant reviews
46 helpful votes “Picked Up To Go - amazing”
I love the burnt end's meal- they are tasty and addictive. The meal comes with two sides and I enjoyed the fries and baked beans. We also ordered the brisket, and it was very good. The meat seemed high quality and cooked very well. There are dessert options; however, we did not order any. Highly recommend this restaurant.
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Description 4 Rivers is a family-owned smokehouse specializing in 30-day aged brisket, homemade southern sides and fresh bakery items.
Posting guidelines Get notified about new answers to your questions. Ask Typical questions asked: Do you have gluten-free options? Is there a dress code? Do you allow dogs on the outdoor patio? Near 4 Rivers Smokehouse Top-rated Attractions Nearby 19 Reviews Hannibal Square Heritage Center
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McNair's 66 Station and Oil Company - Plymouth, NC | Groupon
McNair's 66 Station and Oil Company
34 US Highway 64 W, Plymouth, NC 27962 34 US Highway 64 W, Plymouth Directions
+12527932180
34 US Highway 64 W,
Is your car in need of a check-up? Head on over to McNair Service Center in Plymouth for great automotive service and maintenance. This bar offers reliable tire changes and rotations for your vehicle.
For all of your automotive needs, head to McNair Service Center in Plymouth and your car will be as good as new. Ensure the safety of your passengers as well as your own with a quality tire change or rotation from this spot.
Your car is important to you, so make sure it gets the great service it deserves from the experts at McNair Service Center.
Groupon has verified that the customer actually visited McNair's 66 Station and Oil Company.

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Need Your Love So Bad (Album Version) [Clean]: Fleetwood Mac: Amazon.co.uk: MP3 Downloads
See larger image Need Your Love So Bad (Album Version) [Clean]
From the Album Black Magic Woman - The Best Of [Clean]
Need Your Love So Bad (Album Version) [Clean]
B0063LTXUI,B002DMM7SQ,B002K3G2S4,B00AFED846,B004ATXN7O,B0049V7JBO,B001IQLLFI,B001F618ZY,B001HZN7LQ,B003075RXU,B003O7EJMG,B002ABCKL4,B004ZHF8DI,B002TTKSTS,B001F3UCTU,B001I8B9B2,B002LQF7H2,B003TTQJ7C,B002U2E6FQ,B001IYLIAS,B009M90JVA,B001KSRJC8,B0083GVKMU,B0070WE6GA,B004BZXDKY,B001KENDYU,B00860FD9O,B00B1OBLFM,B00FJ0Z71S,B001JTN1HK,B003U7UZ1O,B0027CDIEE
Signed, Sealed, Delivered (I'm Yours) › Stevie Wonder
B0063LU1B8,B00JLKOCDG,B001HF2848,B00864ARE6,B001KUF2IO,B00DX616LK,B009CXQ82U,B001LZ9D56,B001IDGWJQ,B001LZ7HY0,B001KVQXEA,B003YXRJ68,B001GUGD2M,B001POD5HA,B009D1ENIM,B001GSEGWS,B001GS6G80,B00C28ZBWA,B004V7DK50,B001KV2SIU,B0070QENAU,B001KSM6Z8,B001UNWK2C,B004NZ58ZU,B001GTOHFS,B00DI8NNAU,B0026ENYYM,B003W5MBP2,B001J05RIU,B001EZ9AHY,B001J6VASU,B004X17G5Y,B003VDZ52G,B005NO2KB0,B005NNYL54,B0063LTXUI,B001GTPICE,B001KU4EI8,B001KG3ROE,B001J74FX6,B00G8435MC,B001HC0KF0,B001F1CNJY,B001EYY8PO,B008YAODLU,B005XLQLIG,B00DS0S2RM,B001GSDFRK,B00JBWFWRE,B00EGEICN8,B009KKDT8Q,B00ATZVWWQ
Duration: 3:52 minutesGenres: Pop ASIN: B001UHEHO2
Amazon Bestsellers Rank: 9,831 in MP3 Songs (See Top 100 in MP3 Songs)
gave this a rating of 5 because it holds a lot of memories also will be a part of a collection
Just had to buy this track after hearing it at a friends! I love to listen to it on my playlist!
a classic from the great peter green why wouldn't anyone rate this as a solid gold 5 star classic ?I've loved this song since I first heard it over 40 years ago and its influence on me has inspired me to try and become a blues player for as long as I can remember
There's a better version.........
......Possibly my favourite track of all time.....but so irritated by it also, for the fact that some half-assed engineer/producer arbitrarily faded it out in 3 seconds flat 3:52 seconds in!!!!.Now, if you want to hear how it REALLY ended....Get yourself over to The Best of Peter Green's Fleetwood Mac, and on there you will find the USA version, which goes on for another three minutes from where the UK version finished off!!Awesome!!...I can die happy!!Paul
This track is brilliant. Moody, full of soul and will take you back to a moment in your life for sure.
Need Your Love So Bad (USA Version) Fleetwood Mac | Format: MP3 Download MP3 Download

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Castleford 22 Wigan 28 - Super League: Match report | Daily Mail Online
Wigan Warriors survived an almighty scare before maintaining their excellent recent record against Castleford Tigers with a tense victory at the Wish Communications Stadium.The Cherry and Whites came into this match having won seven of their last eight meetings with Castleford, the exception a 22-22 draw in June 2011.On that occasion Wigan relinquished a 22-4 lead and they did likewise this time around as a wonderful score from Jamie Ellis and two from Justin Carney revived the hosts.After Rangi Chase had struck the post for Castleford with a late drop-goal attempt, it was Chris Tuson who had the final say when taking Sean O’Loughlin’s excellent offload to cross for his second try.The Tigers therefore suffered a first home defeat of the campaign - but can take plenty of heart from their rousing second-half fightback. Saviour: Wigan celebrate Chris Tuson's decisive try at Castleford
Wigan were penalised three times early on, yet it was Castleford’s first transgression that proved costly.Sam Tomkins was lifted above the horizontal during a tackle and, from the resulting penalty, Ben Flower took Blake Green’s short pass to cross, with Pat Richards adding a simple conversion.Jordan Tansey burst clear for Castleford moments later, only to be called back with referee Thierry Alibert having spotted a forward pass.Another scare for Wigan followed when Tomkins lost the ball inside his own 10-metre line, but some solid defence kept the Tigers at bay.The visitors gradually upped their game and were rewarded for a period of pressure when Richards rounded off a flowing cross-field move before adding a second successful kick.Cas saw an excellent try-scoring opportunity go begging when Carney got away down the left yet failed to release Lee Gilmour on his inside. Challenge: Wigan's Josh Charnley is tackled by Craig Huby and Oliver Holmes of Castleford
They were immediately punished as Josh Charnley rose to parry a high kick backwards, leaving Tuson with a simple close-range finish.Wigan’s lead was reduced prior to the interval when Carney atoned for his earlier error by laying on a score for Jake Webster, who exhibited pace and strength to go over in the corner.Yet Michael McIlorum was allowed to worm his way over from dummy half at the start of the second period and Richards added the extras to make it 22-4.After Green had been held up over the line, Castleford hit back in sensational fashion.Ellis went in under the posts following excellent work from Webster, who made the initial break from inside his own half, Tansey and Daryl Clark.Ellis duly converted and was soon adding another two points after Carney had capitalised on a surging run from Gilmour by powering through tackles from Charnley and Tomkins on his way to the line.A 40-20 from Ellis kept Wigan on the back foot and the influential Carney stepped in off his wing to grab another try, with the resulting conversion levelling the scores.Chase then hit the upright and Matty Smith had a pop at goal charged down at the other end before regathering to start the attack that led to Tuson’s crucial score.
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All posts on "Chris Bevan" by Tennis
Following in Federer's footsteps - 10:17 UK time, Monday, 20 December 2010 Watson ready for next step - 10:12 UK time, Wednesday, 21 October 2009 Jump to more content from this blog About this blog

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1 Bedroom Student Houses To Let in The Park, Nottingham, Nottinghamshire
Reduced on 11/09/2017 by Bairstow Eves Lettings, Nottingham Lettings

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