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Title: Not a good book for ATE
Review: It seems to me it is just a summary of work done by others inthe ATE field over the years. The explanations of how a devicefault is detected are not clear in most of the cases presentedin the book. The book emphasizes too much on faultmodeling but not enough on test applications and techniques.Certainly not a good text book for students nor itis a good book for ATE engineers. However, if you are lookingfor some quick reference, this book is a good place to startbecause it contains brief summaries of other people's work.
