Title: System calibration method for Fourier ptychographic microscopy,
Abstract: Fourier ptychographic microscopy (FPM) is a recently proposed quantitative
phase imaging technique with high resolution and wide field-of-view (FOV). In
current FPM imaging platforms, systematic error sources come from the
aberrations, LED intensity fluctuation, parameter imperfections and noise,
which will severely corrupt the reconstruction results with artifacts. Although
these problems have been researched and some special methods have been proposed
respectively, there is no method to solve all of them. However, the systematic
error is a mixture of various sources in the real situation. It is difficult to
distinguish a kind of error source from another due to the similar artifacts.
To this end, we report a system calibration procedure, termed SC-FPM, based on
the simulated annealing (SA) algorithm, LED intensity correction and adaptive
step-size strategy, which involves the evaluation of an error matric at each
iteration step, followed by the re-estimation of accurate parameters. The great
performance has been achieved both in simulation and experiments. The reported
system calibration scheme improves the robustness of FPM and relaxes the
experiment conditions, which makes the FPM more pragmatic.