Title: Advances in Atomic Resolution In Situ Environmental Transmission Electron Microscopy and 1 Angstrom Aberration Corrected In Situ Electron Microscopy,
Abstract: Advances in atomic resolution in situ environmental transmission electron
microscopy for direct probing of gas-solid reactions, including at very high
temperatures are described. In addition, recent developments of dynamic real
time in situ studies at the Angstrom level using a hot stage in an aberration
corrected environment are presented. In situ data from Pt and Pd nanoparticles
on carbon with the corresponding FFT (optical diffractogram) illustrate an
achieved resolution of 0.11 nm at 500 C and higher in a double aberration
corrected TEM and STEM instrument employing a wider gap objective pole piece.
The new results open up opportunities for dynamic studies of materials in an
aberration corrected environment.