Title: Detecting Recycled Commodity SoCs: Exploiting Aging-Induced SRAM PUF Unreliability,
Abstract: A physical unclonable function (PUF), analogous to a human fingerprint, has
gained an enormous amount of attention from both academia and industry. SRAM
PUF is among one of the popular silicon PUF constructions that exploits random
initial power-up states from SRAM cells to extract hardware intrinsic secrets
for identification and key generation applications. The advantage of SRAM PUFs
is that they are widely embedded into commodity devices, thus such a PUF is
obtained without a custom design and virtually free of implementation costs. A
phenomenon known as `aging' alters the consistent
reproducibility---reliability---of responses that can be extracted from a
readout of a set of SRAM PUF cells. Similar to how a PUF exploits undesirable
manufacturing randomness for generating a hardware intrinsic fingerprint, SRAM
PUF unreliability induced by aging can be exploited to detect recycled
commodity devices requiring no additional cost to the device. In this context,
the SRAM PUF itself acts as an aging sensor by exploiting responses sensitive
to aging. We use SRAMs available in pervasively deployed commercial
off-the-shelf micro-controllers for experimental validations, which complements
recent work demonstrated in FPGA platforms, and we present a simplified
detection methodology along experimental results. We show that less than 1,000
SRAM responses are adequate to guarantee that both false acceptance rate and
false rejection rate are no more than 0.001.