{'fraction_non_alphanumeric': 0.02903225806451613, 'fraction_numerical': 0.014516129032258065, 'mean_word_length': 4.8584905660377355, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
A Structural Study of Co-Sb Multilayered Film by X-Ray Diffraction

The structure of a multilayered film, [Co(30 Å)-Sb(25 Å)]70, prepared by vacuum deposition is investigated by using mainly X-ray diffraction. It is revealed that the Co layer has a hcp structure with [110] texture while the Sb layer does not show any distinct texture. The relative intensities and the line width of Bragg reflections are interpreted on the assumption of a very thin compound layer at each interface and also a small distribution of Sb layer thickness. Preliminary results from electron microscopic analyses are also briefly introduced.