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Near Field Optical Imaging Of An Atomic Sapphire Step And Nanometric Lithium Niobate Crystals Under The Absence Of Shear Force Feedback

Near-field microscopy (NOM) has been getting a lot of attention for its application over a variety of fields such as biological imaging, spectroscopic diagnostics of novel semiconductor devices, etc.' In such applications, the resolution capability of the NOM has to be improved to the nanometer level. In this study, we use collection mode NOM in which the sample is illuminated under total internal reflection and the evanescent field generated on the sample surface is scattered by a nanometric probe. For characterizing the vertical resolution, a sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step as measured by atomic force microscope (AFM) is 1 to 4 nm and width of step is 250 nm. In order to characterize lateral resolution, nanocrystals of LiNbO, grown on the sapphire staircase have been used. The average size of a LiNbO, nanocrystal based on AFM is 80 X 40 nm2. Figure 1 shows the experimental system of a c-mode NOM and a micrograph of the nanometric probe used. Light from LD (685 nm) is made to incident the prism at the angle of total internal reflection. Sapphire sample is mounted on the prism surface with a sandwich of index