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Multi Voltage High Performance Bidirectional Buffer in a Low Voltage CMOS process

The fundamental challenge in designing high performance input/output circuits stems from interface voltages not scaling at the same rate as the microprocessor core voltages. This typically translates to designing multi-voltage interface circuits with single lower voltage gate oxide components to reduce mask cost. While numerous topologies exist to overcome the associated gate oxide reliability challenges, they invariably run into bottlenecks when targeted for high performance. In this paper, a multi-voltage bidirectional buffer built using just 1.8V transistors in a 65nm process is presented. Proposed solution includes two novel schemes consisting of (1) a replica driver based pre-driver compensation scheme for output buffer, and (2) a new reduced crowbar contention based low skew input buffer. These circuits in conjunction not only help achieve 200MHz operational frequency, but also do so with competitive area while eliminating gate oxide and channel hot carrier associated reliability constraints.