{'fraction_non_alphanumeric': 0.027474595408355288, 'fraction_numerical': 0.001881821603312006, 'mean_word_length': 5.283687943262412, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Book Review: Spectrum and Network Measurements

including gain and phase measurements, measurements on pulse and digital signals, frequency response measurements, and square-wave testing and curvetracing techniques. Chapter 6 (Frequency Counters) covers the usual period and frequency modes along with a brief mention of the other modes sometimes available. The all important aspect of accuracy and stability are discussed in a section on specifications. Chapter 7 (Circuits for Electronic Measurements) contains a mixed bag of topics such as input and output resistance considerations, bridge measurements, frequency responses of reactive and resonant circuits, and the behaviour of attenuators, filters, and power supplies. Chapter 8 (Frequency Domain Instruments) gives a neat, compact coverage of the wave analyser, various types of spectrum analyser, the gain/phase meter, the network analyser, and the distortion analyser (distortion-factor meter). Peculiarly, it refers to the wave analyser as a wavemeter, a term which most authorities would reserve for the resonant type of instrument used for measuring higher frequencies. Surprisingly, the author makes no reference to, or distinction between, scalar and vector network-analysers. Chapter 9 (Logic Probes and Analysers) explains how specialised instruments, such as the logic probe and logic analyser, can be used to measure and analyse logic signals more conveniently than can an ordinary oscilloscope. It then compares and contrasts the use of the oscilloscope and logic probe for the measurement of digital logic signals, and explains that the logic analyser has two main operating modes, viz: as a timing analyser, and as a state analyser. The author then proceeds to explain some examples of the use of the logic analyser, such as the testing of a 4-bit counter, and the analysis of a mythical microprocessor. The book is well presented using a clear typeface. It has many good diagrams and a number of helpful photographs of the latest electronic test-instruments and accessories, which adds reality to the topics covered. Each chapter contains a number of worked examples, and ends with a list of reference books and publications, but there are no end-of-chapter examples for the reader to try. In spite of my minor misgivings above, I would, nevertheless, recommend the book to undergraduate students and engineering lecturers, alike. As usual, I would welcome a reduced-price paperback-version which typical undergraduate students could afford to buy. This might well enhance the sales figures! BRIAN M. SHAW Division of Electrical and Electronic Engineering, University of Hertfordshire