{'fraction_non_alphanumeric': 0.029565217391304348, 'fraction_numerical': 0.020869565217391306, 'mean_word_length': 5.394444444444445, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Morphological, electrical and dielectric properties of La0.6Ga0.4Fe1-xMnxO3 ceramics

ABSTRACT Morphological, electrical and dielectric properties of manganese-doped lanthanide orthoferrites La0.6Ga0.4Fe1-xMnxO3 (x = 0; 0.1; 0.2 and 0.3) are investigated. Scanning electron microscopy characterization shows that the increase of Mn content increases the rate of the agglomeration and leads to grains with irregular shape. The grain size is estimated and compared with those obtained from X-ray diffraction result. Electrical measurements show that the resistivity decreases with Mn concentration over more than three decades. Also, it is found that dielectric properties are strongly temperature and frequency dependent. The dielectric constant reaches a high value at low frequency. Then, it decreases due to the polarization reduction. The dielectric transition peak appears at the same temperature for different frequencies for the undoped sample La0.6Ga0.4FeO3, while for the doped ones, the peak shifts to the higher temperatures as the frequency increases. Also, dielectric loss decreases with the frequency and a dispersion phenomenon appears.