{'fraction_non_alphanumeric': 0.023676880222841225, 'fraction_numerical': 0.016713091922005572, 'mean_word_length': 5.5963302752293576, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
In situ surface X-ray diffraction using high-energy synchrotron radiation: studies of the ADP (100) and (101) growth interfaces under aqueous solution flow conditions

Using the cell, preliminary surface diffraction data have been recorded from the (101) and (100) crystal/solution interfaces of nearly perfect crystals of ammonium dihydrogen orthophosphate during growth and dissolution experiments under aqueous solution flow conditions. The measurements of the X-ray rocking curves during the growth of these faces provide further evidence that the X-ray diffraction peak width depends on the growth conditions and that this technique is capable of assessing structural changes in the crystal surface during growth.