text: /*********************************************************//**
  ** @file FindHighLights.h
  ** Static methods for thresholding eyelash and reflection detection.
  **
  ** @date 12/2010
  ** @author Yooyoung Lee 
  **
  ** Note: Please send BUG reports to yooyoung@<NOSPAM>nist.gov. 
  ** For more information, refer to: http://www.nist.gov/itl/iad/ig/vasir.cfm
  **
  ** @par Disclaimer 
  ** This software was developed at the National Institute of Standards 
  ** and Technology (NIST) by employees of the Federal Government in the
  ** course of their official duties. Pursuant to Title 17 Section 105 
  ** of the United States Code, this software is not subject to copyright 
  ** protection and is in the public domain. NIST assumes no responsibility 
  ** whatsoever for use by other parties of its source code or open source 
  ** server, and makes no guarantees, expressed or implied, about its quality, 
  ** reliability, or any other characteristic.
  **************************************************************/
  
  #ifndef FIND_HIGHLIGHTS_H
  #define FIND_HIGHLIGHTS_H
  
  #include <opencv2/core/core.hpp>
  #include "Masek.h"
  
  /**
   * Eyelash and reflection detection class.
   */
  class FindHighLights
  {
  public:
  
  	/**
  	* Remove eyelashes and reflections within the iris region.
  	*
  	* @param noiseImage		Input Image
      * @param eyelashThres	Threshold value for eyelashes
  	* @param reflectThres	Threshold value for reflections
  	* @return Image 			Resulting image after removing both eyelashes and reflections
  	*/
  	static void removeHighLights2(Masek::IMAGE* noiseImage, int eyelashThres, int reflectThres);
  
  };
  
  #endif // !FIND_HIGHLIGHTS_H 
  
  