Nanosensors (company)
Nanosensors Inc. is a company that manufactures probes for use in atomic force microscopes (AFM) and scanning probe microscopes (SPM). This private, for profit company was founded November 21, 2018. Nanosensors Inc. is located in Neuchatel, Switzerland.

History 
Nanosensors was founded as "Nanoprobe" in 1990, building on research conducted at IBM Sindelfingen on fundamental technologies required for the batch processing of silicon AFM probes using bulk micromachining.

In 1993, Nanosensors commercialized SPM and AFM probes worldwide. Their developments in batch processing technologies for producing AFM probes contributed to introducing Atomic Force Microscopes into the industry of the time. In recognition of this achievement, Nanosensors discerned the Dr.-Rudolf-Eberle Innovation Award of the German State of Baden-Württemberg and the Innovation Prize of the German Industry  in 1995 and the Innovation Award of the Förderkreis für die Mikroelektronik e.V. in 1999.

In 2002, Nanosensors was acquired by and integrated into Switzerland-based NanoWorld. It is still an independent business unit.

Significance 
Researchers have developed an array of operating modes and methods for Scanning probe microscopy and Atomic Force Microscopy. The use and application of such methods requires SPM or AFM instruments equipped with method-specific SPM or AFM probes. Nanosensors supplies SPM or AFM users worldwide with a range of such method-specific SPM or AFM probes.

Products

AFM Probe Series

PointProbePlus 
The PointProbePlus series is directly based on the technology originally developed and commercialized by Nanosensors in 1993. The original PointProbe technology has been upgraded to the PointProbePlus technology in 2004 yielding a reduced variation of tip shape and increased reproducibility of images. It is manufactured from highly doped mono-crystalline silicon. The tip is pointing into the <100> crystal direction.
 PointProbePlus XY-Alignment Series & Alignment Chip
 PointProbePlus Silicon MFM Probe Series
 SuperSharpSilicon
 High Aspect Ratio AFM probes

AdvancedTEC 
The tip of the AdvancedTEC AFM probe series protrudes from the end of the cantilever and is visible through the optical system of the atomic force microscope. This visibility from the top allows the operator of the microscope to position the tip of this AFM probe at the point of interest.
 Akiyama-Probe

Applications 
 Non-contact mode / tapping mode microscopy
 Force modulation microscopy
 Contact Mode
 Electrostatic force microscopy, Electrical measurement
 Magnetic force microscopy
 Lateral force microscopy
 Trench measurement
 Nanoindentation
 Self-sensing and self-actuating Akiyama probe (A-Probe) for dynamic mode atomic force microscopy (AFM)
 Tipless cantilevers for probe modification

Accessories 
 Transfer Standards
 Calibration standards
 Alignment Chip

References

External links 
 

Nanotechnology companies
Technology companies of Switzerland
Manufacturing companies of Switzerland
Companies based in Neuchâtel