According to one embodiment of the present invention, a system for protecting data determines a desired duplication rate based on a level of desired anonymity for the data and generates a threshold for data records within the data based on the desired duplication rate. The system produces a data record score for each data record based on comparisons of attributes for that data record, compares the data record scores to the threshold, and controls access to the data records based on the comparison. Embodiments of the present invention further include a method and computer program product for protecting data in substantially the same manners described above.

Present invention embodiments relate to information and data management, and more specifically, to data privacy protection using a k-anonymity model with probabilistic match self-scoring.
Data privacy concerns may arise when a data holder wishes to release a version of the data for research. Tools for mining large data samples are capable of joining and searching hundreds of millions or even billions of data records. These tools may be used for applications that require trusted data about customers, clients, patients, guests, citizens, persons of interest, or other parties. When multiple sources of information are joined and intelligently processed, sensitive party information may be inferred and unintentionally disclosed.
One approach to addressing these data privacy concerns is k-anonymity. A data set released by a data holder has k-anonymity protection if the information for each person contained in the released data set cannot be distinguished from at least k−1 individuals whose information also appears in the release. Typically, a data holder anonymizes party data by a removal of explicit identifiers such as name, address and phone number while leaving other demographic information in the released data set. Such a data set can include, for example, the date of birth, gender, and zip code. In this scenario k-anonymity means that each distinct combination of date of birth, gender, and zip code will repeat at least k times in the data set. High values of the parameter k signify higher uncertainty in identification of the individual and therefore provide better privacy protection of the party data. Even if the released data is joined with the data available in the public domain (e.g., voter registration information) a potential data privacy attacker will face an uncertainty in party identification because a single record in the public domain will match at least 1 records in the data released by the data holder. However, there is a tradeoff between keeping the data complete enough to be useful and preserving data privacy.

This patent is subject to a terminal disclaimer.

Data privacy employing a k-anonymity model with probabalistic match self-scoring

INTERNATIONAL BUSINESS MACHINES CORPORATION


The present invention discloses a self-piercing rivet (10), particularly a semi-hollow self-piercing rivet, with a head (12) and a shank (14) as well as a pre-perforated flat element (30) that is arranged on the shank (14) and at least part of which extends radially relative to the head (12) beyond a head radius. A production method and a joining method for said self-piercing rivet with pre-perforated flat element are also described.

In the field of joining connections, the usage of rivets, especially of semi-hollow rivets, is widely distributed. Therein, a rivet is set or placed in at least two components which are arranged one above the other. Both components support themselves against the die arranged opposite to the joining location, wherein the die in cooperation with the components to be connected and the rivet forms a closing head of the joining connection during the setting process.
In the automotive industry, for example, more and more components consisting of different materials are connected with each other. While the structure component consists of metal, the above lying top-layer uses a soft metal, as for example aluminum, or a plastic as material. The used plastics have a widespread range similar to the underlying structure component. These plastics are not reinforced, or they have fibers or fabric layers which are incorporated into a plastic matrix for their reinforcement.
Based on the different deformation behavior of materials having different characteristics in the top-layer and in the structure component, as for example plastic in the top-layer and metal in the structure component, disadvantages result when producing or creating a rivet connection between such a top-layer and the structure component. This has especially to be ascribed to the different deformation behavior of the two materials. As the plastic is deformed during entry of the rivet such that the reinforcing fibers are released from the plastic matrix or gaps are formed in the created connection between the top-layer and the structural component, the known joining connections do not ensure the quality requirements for example in the automotive industry. The above mentioned disadvantages affect the reduction of the strength of the manufacturing and joining connection as well as the durability of the produced joining connection.
It is thus the object of the present invention to provide a rivet for producing a joining connection with improved characteristics compared to the prior art. Further, the present invention has the object to provide a production method and a joining method for such a rivet.

Self-piercing rivet with a pre-perforated flat element, production method and joining method therefor


The invention relates to a sensor for determining an output value, the sensor having: a detection unit configured to detect a sensor signal; a preprocessing unit configured to determine an intermediate signal on the basis of the sensor signal and of a predefined reference signal; and an evaluation unit that is trained in accordance with a machine learning method and that is configured to determine the output value on the basis of the intermediate signal.

Sensors are often used in harsh environments. For example, inductive proximity sensors can be used as contactless switches. An important quality feature in this respect is the maximum achievable switching distance. In addition to the obvious advantage that an object can already be detected at larger distances, a high switching distance has even further advantages. The higher the switching distance of the sensor is, the larger the potential distance from the object to be detected can be. The probability of mechanical destruction is thereby reduced. A further advantage of large switching distances is the larger installation tolerance. The technician thereby does not have to work as precisely when installing the sensor, which can save time and money and can increase the availability of the system.
A further advantage is the potential for miniaturization. If a larger switching distance can be implemented for a specific sensor diameter, there is the possibility of satisfying a detection task with a smaller sensor, if applicable, which frequently has design advantages.
In addition to the magnitude of the nominal switching distance Sn, which is defined for steel, a further important quality feature of inductive proximity sensors is also the magnitude of the real switching distance that is achieved with other materials.
These switching distances are characterized by the so-called reduction factors. It also applies here that a large switching distance (or a large reduction factor) is preferred. Ideally, the sensor has the same high switching distance for any desired metals. In this case, the reduction factors have the maximum value 1 and are therefore also called F1 (factor 1) sensors.
The highest switching distances are currently, for example, achieved by sensors having plastic caps that achieve four times the value of a standard nominal switching distance in some designs. They are sensors that work in accordance with the classic quality method, such as sensors from the IME family by SICK, for example, IME08-04BPOZT0S. The disadvantage of these sensors is that they do not have an F1 behavior. Since only the amplitude of a sinusoidal oscillation at a frequency is generally available as information in these sensors, this disadvantage also cannot be eliminated by intelligent algorithms.
Sensors that work with a pulse process (in which, for example, a coil is excited by a current pulse and the pulse response, that is the voltage induced in the coil as a voltage pulse, is measured) in contrast offer the advantage that more information is included in the pulse since a pulse can be considered as a mixture of sinusoidal signals of different frequencies, amplitudes and phase positions. Accordingly, the pulse response also includes more information. Such sensors can approximately have an F1 behavior at least for steel and aluminum, but can still have a relatively high dependence on installation.
A further important property that influences the switching distance of the sensor is its sensitivity with respect to the installation. Ideally, a sensor is completely insensitive to its installation depth and to the installation material and (in the case of inductive proximity sensors) always maintains its specified switching distance.

Sensors for determining an output value, method for evaluating a sensor signal, and method for training an output unit to evaluate a sensor signal


A computing environment in which devices interoperate with a plurality of hardware components. Inconsistencies in user experience when operating devices that may use different components are avoided by generating a signature for the components. The signature may be computed as a function of a first key and one or more parameter values obtainable from the component. The signature and parameter values may be stored in the component's memory, and may be obtainable while the component is in operation as part of the computing device. The device may validate the component by performing at least one function based on the signature, the one or more parameter values obtainable from the component, and a second key, which may or may not be identical to the first key. The device may change its interaction with the component, depending on whether the component was successfully validated.

Computing systems may be arranged in a variety of possible configurations that utilize many different types of components. Such components can originate from any number of manufacturers, resulting in unpredictable quality and reliability of the components. This, in turn, can lead to inconsistent performance of the computing devices in which the components operate. In particular, hardware components can significantly impact user experience because users frequently interact with computing devices through hardware components. The quality and reliability of hardware components are therefore important foundations of ensuring a desired quality of user experience in operating computing devices.
For example, a user operating a touch screen device relies heavily on interactions with the touch screen interface. If a hardware component, such as the touch controller, is sluggish or unreliable, then the entire device becomes less usable. Furthermore, if the hardware component is integrated within the device, such as inside an enclosure surrounding the device, then the user may unknowingly identify other hardware or software components as the cause of the problem. In particular, a user may interpret poor performance of a computing device as reflective of the particular operating system used in the device, even if the underlying performance ultimately depends on hardware components.
To help avoid the problem of inconsistent user experience due to unreliable hardware components, it is known to establish standards of quality for components that may have originated from any number of possible entities, such as independent hardware vendors and original equipment manufacturers. Such standards of quality may help ensure that devices using such components maintain consistent user experience across different applications and usage environments. For example, an approval of quality may be given to components that successfully complete one or more tests, designed to determine whether the component satisfies certain criteria. Such approval may be granted, for example, by organizations that may have authority to approve devices for interoperating with operating systems in host computing devices.
A purchaser of a computing device may thus be safeguarded from components, which possibly may yield poor performance of the computing device, that have not received such approval. For example, in corporate enterprises, a technology administrator may use such approval as an indication of trust for hardware components, and may only provision the corporation with computers using components that are approved. Personal consumers may also use the approval to protect their computer devices from unreliable components or even hardware components that have been maliciously designed to gain unauthorized access to personal data or services.


A computerized method for scalable management optimization of pressurized water distribution networks, comprises receiving a network model representing a pressurized water distribution physical network having water flow variables. The network model is simulated by solving non-linear mathematical equations representing the behavior of the water flow variables. One or more result sets are fed to the non-linear mathematical equations. The non-linear mathematical equations are linearized. Network model optimization requirements are received from a user. The linearized mathematical equations are optimized according to the received network model optimization requirements. A local search starting from the at least one optimized solution is performed using the non-linearized mathematical equations, thereby generating a solution.

The present invention, in some embodiments thereof, relates to methods and systems for managing networks and, more specifically, but not exclusively, to methods and systems for approximating solutions for optimized management of a liquid distribution networks such as a pressurized water distribution network.
Water distribution networks are complex entities, composed of many types of components, such as pipes, valves, pumps, and tanks, making their efficient management a significant challenge. The growing worldwide demand for water as well as increasing urbanization renders a growing complexity of water distribution networks. Managing large complex water distribution networks requires coping with water distribution network matters such as: water stagnation management, demand prediction, supply to end consumers according to predefined requirements (pressure, cost, quantity and quality), reduction of Non-Revenue Water (NRW) etc.
One of the most significant matters in water distribution network management, in terms of cost and environmental impact, is reducing Non-Revenue Water (NRW). NRW is water that is input into the network but is not paid for or generating revenue. NRW includes water lost due to leaks, bursts and theft as well as water retention in tanks. According to the Environmental Protection Agency, much of the 880,000 miles of water pipes in the United States has been in service for decades—some for over 100 years—and can be significant source of water loss. The World Bank estimates that worldwide costs from leaks total 14 billion United States Dollars annually.
Reducing the water pressure in the network is a well-known recommended practice for reducing NRW. The higher the pressure in the network, the larger the amount of water lost in leaks and bursts. Consequently, lowering the pressure in the water network has the potential to significantly reduce water loss. However, there are additional, often conflicting, goals associated with pressure management: 1) Water supply pressure—A high enough pressure level must be maintained to ensure that water reaches all consumers at the required flow rates. 2) Water turnover—Water pressure has a direct influence on water turnover—the length of time during which water remains in tanks. A higher water pressure causes water to remain in tanks for longer periods, which might lead to quality issues due to water stagnation or the decay of disinfectants like chlorine. In addition to these conflicting goals, there are several other factors that contribute to the challenge of water pressure management: i) The pressure in the system is highly dependent on the demand for water. However, such demand varies both during the day and across seasons. ii) In highly connected networks, changing one valve or pump or tank setting in order to adjust pressure in one part of the system may actually have a detrimental impact on the pressure in another part of the system.
Managing a pressurized water distribution system is a challenging task. Solution approximation is often sought by engineers based on intimate familiarity and experience with a particular water distribution network. This type of intuition-based strategy is error prone and often results in sub optimal management. Often solutions achieved by formal computerized methods surplus intuition-based strategies in performance. Current computerized methods for approximating a solution aim to find feasible solutions utilizing strategies such as: Linear programming, non-linear programming, evolution based heuristics and mixed integer nonlinear programming.
Liner programming is often applied to complex networks, such as a pressurized water distribution network, in its mixed integer specimen: mixed integer linear programming (MILP). However, pressurized water distribution networks are not linear in nature. Pressurized water distribution network aspects such as head loss formulas and pumps discharge equations are not linear (Methods, H., Walski, T., Chase, D., Savic, D., Grayman, W., Beckwith, S., Koelle, E., 2003, "Advanced water distribution modeling and management", Bentley Institute Press). In order to apply MILP to pressurized water distribution network, the problem is linearized. The linearization is performed in a manner assuring a high quality solution can be found within a reasonable running time. Linearization is performed, for example by the piece-wise linearization technique (Bertsimas, D., Tsitsiklis, J. N, 1997, "Introduction to linear optimization", Athena Scientific Belmont). Piece-wise linearization covers by small enough linear pieces a non-linear curve when a solver chooses only one of them as a solution. A drawback of this technique is long running times for real scale problems (Eck, B., Mevissen M., "Valve Placement in Water Networks: Mixed-Integer Non-Linear Optimization with Quadratic Pipe Friction", IBM Research Report). Another linearization technique is based on the first order Taylor series approximation (Sherali D., Smith, E., 1997, "A Global Optimization Approach to a Water Distribution Network Design Problem, Journal of Global Optimization", 11(2), 107-132). Although first order Taylor series approximation technique by itself is faster than piece-wise linearization technique, it is unlikely to be applied to large scale problems such as real cities pressurized water distribution networks due to related long running time and inferior solution quality. Another linear programming method is a sequential linear programming (Sterling, M., Bargiela, A., 1984, "Leakage Reduction by Optimized Control of Valves in Water Networks", Transactions of the Institute of Measurement and Control, 6(6), 293-298). Sequential linear programming starts with an initial guess of the solution (decision variables). Then, it is iteratively solves the problem, updating the solution at each iteration and using the current iteration solution for developing first order Taylor series for the next one. In each iteration, a linear program which represents a whole network must be solved. As multiple iterations are required, overall running times are expected to be unfeasible for large scale problems such as pressurized water distribution networks. Moreover, the solution quality of sequential linear programming is compromised by approximation and integer variables handling.

Pressurized water distribution network management

International Business Machines Corporation


A minimal memory in-circuit digital tester with vector memory concentrated in a centralized vector processor circuit, eliminating the need for pin memory. The vector processor circuit memory is partitioned into two blocks, a pointer memory and a change list memory. Every vector clock cycle has one pointer memory entry. The pointer memory entry is an address for the change list memory. The change list memory contains lists of nodes used in the vector test sequence. Each change list entry contains a pin number and several control bits. The control bits define functions such as whether the pin will toggle its data or enable state, whether there are more pins in that particular change list, and whether the list or test has ended. When the end of each change list is reached, all pins that have been primed by that change list will be toggled. The next entry of the pointer memory is then selected which, in turn, selects another, or perhaps the same change list in the change list memory. Each vector within a test vector file corresponds to one entry in the pointer memory, however, several different pointers can address the same change list. As a result, test vector files of great length can be accommodated using minimal memory.

The invention relates to in-circuit digital testers using minimal tester memory.
In-circuit testers are capable of generating and applying digital test signals to electrical nodes of a completed logic circuit, without isolating or removing the components of the circuit from the surrounding components. Known in-circuit testers include those presented in U.S. Pat. Nos. RE 31,828 and 4,500,993, the disclosures of each of which are expressly incorporated herein by reference.
Such in-circuit testers operate by applying electrical signals, defined by a test vector which includes all tester pin states at a particular instant in time, to electrical nodes of a circuit under test. The electrical nodes are contacted by the tester pins. A vector-oriented test exercise is a table or file of such states. In printed form, vectors are typically organized as lines or rows in a file of text. Some preamble information is normally added to this file to relate elements of the vectors to pins in the tester, electrical nodes in the circuit under test, or leads of the component under test. In a file of test vectors, which together constitute a test exercise, each row of the file corresponds to the tester pin states of all participating tester pins during a particular instant in time, and each column represents the states of a single tester pin for each instant in time throughout the entire test exercise.
A file may contain thousands, even hundreds of thousands of vectors, and there may be several hundred tester pins in a tester participating. Thus, the vector file may be extremely large.
A known method of processing these vector files is to equip each tester pin with enough memory and logic to handle the corresponding column in the vector file for the entire test sequence. In operation, each tester pin is associated with a tester channel and the vector file is loaded straight into the channel memories, and then the test is run under control of a vector clock that steps the channel memories from vector to vector within the vector file. With this "RAM behind the pin" approach, memory requirements increase in direct proportion to the number of tester pins (columns) and the number of vectors (rows) in the vector file. In addition, if a channel is not active during application of a particular test vector, the channel memory is not used at all and is wasted.
One approach which has been proposed to conserve channel memory is to update the tester pin states only when the new pin state is different from the old pin state. This approach is disclosed in the above-referenced U.S. Pat No. 4,500,993 wherein the logic states of the individual tester pins are updated (toggled) under control of the vector clock only when the next logic state is different from the present logic state. Otherwise, the pin state remains unchanged. However, even though this approach reduces the amount of channel memory required for a tester (or, alternatively, allows a tester to run larger test vector files), some memory redundancy remains because the pin toggles required to change from one vector to the next within the test vector file may occur identically many times throughout the test sequence.
While this duplication is not without some advantage, in some test applications, for example, the testing of gate arrays, programmable logic devices, LSI peripheral circuits, and the like such redundancy represents inefficient use of memory.

Method and apparatus for a minimal memory in-circuit digital tester


Example embodiments described herein therefore relate to an AR guidance system to perform operations that include: detecting a client device at a location within a geo-fenced area, wherein the geo-fenced area may include within it, a destination of interest; determining a route to the destination of interest from the location of the client device within the geo-fenced area; causing display of a presentation of an environment within an AR interface at the client device; detecting a display of real-world signage within the presentation of the environment; generating a media item in response to the detecting the display of the signage within the presentation of the environment, wherein the media item is based on the route to the destination of interest; and causing display of the media item within the AR interface based on the position of the signage within the presentation of the environment.

Augmented reality (AR), is a live direct or indirect view of a physical, real-world environment whose elements are augmented by computer-generated sensory inputs.
In an unrelated field, turn-by-turn navigation is a feature of some navigation devices, where directions for a selected route are continually presented to the user in the form of spoken, or in some instances, visual instructions.


A method of reducing impurities in films to be deposited within a chemical vapor deposition (CVD) device includes steps of cleaning the process chamber of the CVD device, and depositing, prior to wafer processing, a gettering layer of, for example, phosphorous containing glass on interior surfaces of the process chamber. The gettering layer getters mobile alkali ions and substantially reduces or prevents outdiffusion of alkali ions and other impurities. The phosphorous containing glass may also be doped with boron. A blocking layer, such as undoped silicate glass, silicon nitride, silicon oxynitride or the like may be deposited on the gettering layer to trap impurities and to prevent phosphorous contamination in a applications sensitive to such contamination. Alternatively, silicon nitride or silicon oxynitride may be deposited on interior surfaces of the process chamber without a gettering layer, to thereby substantially prevent outdiffusion of underlying moisture and impurities during subsequent deposition of films onto the wafers to be processed.

1. Field of the Invention
The invention pertains to the field of semiconductor process chambers, and to methods of reducing contaminants in such chambers and in wafers processed in such chambers.
2. Description of the Related Art
As semiconductor device densities increase and line widths decrease, the control of impurities and contaminants is increasingly important. The presence of impurities during the fabrication process can cause decreased yields, non-uniform device performance characteristics and can increase leakage currents, among other ill effects.
It is thus crucial to insure the purity of semiconductor layers during their formation. One method of creating layers on semiconductor wafers is by Chemical Vapor Deposition, or CVD. CVD utilizes a controlled chemical reaction in a gas or in the vapor phase to deposit thin films on a solid surface, such as a semiconductor substrate. Insuring the purity of deposited semiconductor layers during CVD processes is becoming a major concern as process pressures and deposition temperatures decrease and as the reactant gases are energized to increasingly higher levels.
Much attention has been given of late to low temperature CVD processes. Indeed, a number of polymer and low melting point metal films require a low processing temperature to avoid defects such as dislocations, interstitial species, stacking faults and the like. For example, final passivating films (such as silicon nitride) over aluminum metallization must be formed at temperatures less than 400.degree. C. The need for ever lower temperatures has been instrumental in fueling the development of Plasma Enhanced Chemical Vapor Deposition (PECVD) devices, in which the creation of a plasma in a gas mixture produces chemically reactive species at low temperatures. In PECVD devices, RF frequency glow discharges creates high-energy electrons that dissociate and ionize gaseous molecules, to generate chemically reactive radicals and ions. Kinetic energies for the electrons in PECVD chambers generally range in the 10.sup.2 to 10.sup.4 eV range.
Plasma-Enhanced CVD, however, increase contamination problems, as the chamber walls are subject to high-energy ion bombardment. To prevent the deposited films from being contaminated with such impurities, a number of contaminant decreasing measures have been implemented. Examples of such measures include careful cleaning of the interior of the process chamber, careful handling of materials, and strict control of the purity of the chamber components. Another contaminant decreasing measure that has been adopted is a process that is alternatively referred to as chamber seasoning, conditioning or pre-coating. These terms refer to coating some portion of the interior surfaces of the process chamber with undoped silicate glass, or USG. As shown in FIG. 1, a typical wafer processing cycle may include a reactor dry clean step, followed by a USG pre-coat step and a wafer deposition step. The pre-coat step shown in FIG. 1 coats interior surfaces of the processing chamber with a USG layer that is believed to act as a barrier to underlying impurities, preventing the impurities from out-diffusing from the interior surfaces of the chamber. After pre-coating, as shown in FIG. 1, the wafers are processed and the requisite films deposited. After a predetermined interval or after the processing of a predetermined number of wafers, the process is repeated, whereupon the reactor is once again dry cleaned. Periodic Maintenance (PM) of the process chamber is also generally required. Typically, such Periodic Maintenance includes a wet cleaning step using, for example, isopropyl alcohol or de-ionized water. Other cleaning steps may include the introduction of a fluorine containing gas into the process chamber, such as NF.sub.3. Nevertheless, microcontamination levels from particles and ion contaminants, despite these precautions, have typically remained in the 1.times.10.sup.10 ions/cm.sup.2 range, even when a USG pre-coat step is carried out after the in-situ dry cleaning step.
Newer techniques for chemical vapor deposition have been developed. For example, High Density Plasma Chemical Vapor Deposition, or HDPCVD, was developed to fulfill the requirements of shrinking chip size. HDP-CVD has the ability to deposit oxides into small gaps while avoiding the formation of voids by combining low pressures, an inductive coupled plasma CVD and a plasma sputtering process. For this reason, HDP-CVD is also called a simultaneous deposition and etch technology. In HDP-CVD, a source plasma that is generated by inductive coupling RF power produces ions and contributes to deposition, while a bias RF power enhances ion sputtering at the surface of the wafers and also at the processing chamber surfaces. The high density and low pressure inherent in HDP-CVD devices, however, increases sputtering on the process chamber interior surfaces. It has been found that conventional techniques for controlling the contaminant levels have proven to be ineffective in reducing contaminants to acceptable levels in high-density plasma environments. Specifically, undoped silicate glass, while decreasing contaminant levels somewhat, has proven ineffective in bringing contaminant levels in HDPCVD reactors down to PECVD levels. Moreover, even extreme care in handling process chamber components and the use of very high purity reactor parts in combination with a long USG pre-coating step has not reduced contaminants to acceptable levels, particularly for applications that are highly sensitive to contaminants. Indeed, certain processes such as Shallow Trench Isolation or STI, while benefiting from deposition in an HDPCVD environment, are extremely sensitive to impurities that degrade their performance.
What is needed, therefore, is a method of further reducing impurity levels in thin films to be deposited in chemical vapor deposition devices. Indeed, there has been a long felt need for a method to reduce contaminant levels in high plasma density, low pressure and temperature chemical vapor deposition devices to levels that are acceptable to the most demanding applications.

Method of reducing impurity contamination in semiconductor process chambers


A display apparatus includes multiple display modules. Each of the display modules includes a display surface, a projecting device, and first, second, and third reflectors. The display surface has long and short edges perpendicular to each other. The projecting device projects a first image having a first optical axis parallel to the short edge. The first reflector reflects the first image to form a first reflected image having a first reflection optical axis perpendicular to the short edge. The second reflector reflects the first reflected image to form a second reflected image having a second reflection optical axis perpendicular to the short edge. The third reflector is parallel to the second reflector and reflects the second reflected image to form a third reflected image having a third reflection optical axis perpendicular to the long and short edges. The third reflected image is projected on the display surface.

Technical Field
The present disclosure relates to a display apparatus, and more particularly, to a video wall.
Description of Related Art
In order to meet the evolving requirements of the screen imaging, technologies of display apparatus continue to progress. In a video wall, a plurality of display modules respectively project images on different parts of the display surface, so as to form a complete image. Because the images on the display surface are formed by projection, the video wall can achieve the large screen display effect at a low cost. In addition, the number of the display modules can be increased according to the actual needs, so the size of the display surface can be increased as requested.
In the constant attempt to improve characteristics of the video wall, there is always a need in the related field to provide a novel video wall.


A diagnostic system and method for enabling multistage decision optimization in aircraft preflight dispatch. The diagnostic system includes an interface for receiving one or more inputs relating to one or more observed symptoms indicative of a failed component in an aircraft. The diagnostic system extends an entropy-based value of information (VOI) diagnostic model by adding an explicit value function into the VOI diagnostic model to accommodate various variables associated with the aircraft preflight dispatch problem. The construction of the entropy-based VOI diagnostic model and thus the extended VOI diagnostic model are both based upon at least one of systemic information relating to aircraft components and input-output relationships of the aircraft components, experience-based information relating to direct relationships between aircraft component failures and observed symptoms, and factual information relating to aircraft component reliability.

Aircraft maintenance, including reliable troubleshooting, is of paramount importance to ensure the continued safe and efficient operation of aircraft. Aircraft maintenance can occur in several different manners. For example, scheduled maintenance generally includes a number of specific tasks, inspections and repairs that are performed at predetermined intervals. These events are scheduled in advance and rarely result in aircraft schedule interruption. In contrast, unscheduled maintenance is performed as required to maintain the aircraft's allowable minimum airworthiness during intervals between scheduled maintenance. Unscheduled maintenance is usually performed while the aircraft is on the ground between flights. However, unscheduled maintenance may be performed during a scheduled maintenance check if a mechanic identifies a problem that was not anticipated. Minimum ground time between flights is desirable to maximize aircraft utilization and to meet the established flight schedules. Therefore, the time allocated to unscheduled maintenance is often limited to the relatively short time that the aircraft is required to be at the gate in order to permit passengers to unload and load, to refuel and to otherwise service the aircraft.
Although modern datalink communications facilitate preflight troubleshooting by allowing pilots or maintenance operators to note a problem (e.g., component failure) during the last flight leg or while the aircraft is on the ground, it is oftentimes difficult to troubleshoot the aircraft and complete unscheduled maintenance before the departure time of the next scheduled flight for the aircraft, thereby leading to flight delays and/or cancellations. These flight delays and/or cancellations are extremely costly to an airline, both in terms of actual dollars and in terms of passenger perception. In this regard, an airline typically begins accruing costs related to a flight delay following the first five minutes of a delay, with substantial costs accruing if the flight must be cancelled. Moreover, and as all air passengers are aware, airline dispatch reliability is a sensitive parameter that airlines often use to distinguish themselves from their competitors.
Notwithstanding the critical importance of properly performing unscheduled maintenance in both an accurate and timely manner, mechanics who perform the troubleshooting and unscheduled maintenance on the flight line face a daunting challenge. Aircraft are extremely large and complex systems comprised of many interconnected subsystems. Each subsystem is typically comprised of many LRUs (line replaceable units) that are designed to be individually replaced. An LRU may be mechanical, such as a valve or a pump; electrical, such as a switch or relay; or electronic, such as an autopilot or a flight management computer. Many LRUs are, in turn, interconnected. As such, the symptoms described by flight deck effects or other observations may indicate that more than one LRU can explain the presence of the observed symptoms. At that point, there is ambiguity about which LRU(s) have actually failed. Additional information will be needed to disambiguate between the possibilities. The above notwithstanding, ambiguous fault indications discovered during the troubleshooting process must nevertheless be resolved before the aircraft can be dispatched. Although such is not always the case, the ambiguous faults are ideally resolved within the cost functions, cost limits, airline schedule time constraints, airworthiness guidelines (e.g., "minimum equipment list" (MEL)), maintenance crew expertise at current location and at future destinations, part replacement costs, labor availability, repair equipment availability, part availability, size of next destination airport and its type of runway surface, etc.
Aircraft personnel must decide what tests and remedial actions to make when operational problems arise that threaten to delay an aircraft flight. These decisions must consider alternatives available and potential outcomes. Moreover, some maintenance actions cannot be deferred (e.g., actions in the airline's MEL guidelines), while other maintenance actions can be deferred (e.g., repair of components on the MEL list such as a coffee maker, a flight attendant call button, etc.). In short, aircraft preflight dispatch decision-making is a diagnostic process constrained by available alternatives and outcome values.
In an effort at least in part to assist aircraft personnel with troubleshooting and unscheduled maintenance, improved diagnostic systems and methods have been provided as is thoroughly described in the copending application titled "DIAGNOSTIC SYSTEM AND METHOD" of Kipersztok, et al., U.S. Pat. No. 6,574,537, filed Feb. 5, 2001, issued Jun. 3, 2003, which is commonly assigned with the present application. The entire contents of U.S. Pat. No. 6,574,537 is incorporated herein by reference in its entirety. The diagnostic systems and methods of U.S. Pat. No. 6,574,537 allow for reliable, time-efficient identification of failed components and provide information to enable aircraft personnel to make informed and efficient decisions regarding repair of suspect components or deferral of maintenance actions.
Although the diagnostic systems and methods of U.S. Pat. No. 6,574,537 have been successful for their intended purposes, it would also be highly desirable to provide a diagnostic system and method that determines the optimal maintenance action to take instead of aircraft personnel whose decisions might result in cost functions, cost limits, and time deadlines being exceeded during the aircraft preflight dispatch diagnostic process.

Diagnostic system and method for enabling multistage decision optimization for aircraft preflight dispatch


A method and system for mirror storage element resynchronization in a storage virtualization device is disclosed. According to one embodiment of the present invention, a read operation on a region of a data volume is received at a first module of a first storage virtualization device where the data volume is associated with at least a first mirror storage element and a second mirror storage element, a state indicated by a bit corresponding to the region of the data volume within a first synchronization map is determined in response to receiving the read operation, the read operation is processed using the first module if the bit is determined to indicate a first state and using a second module of the first storage virtualization device if the bit is determined to indicate a second state.

1. Technical Field
The present invention relates to data storage and retrieval generally and more particularly to a method and system for mirror storage element resynchronization in a storage virtualization device.
2. Description of the Related Art
Information drives business. Companies today rely to an unprecedented extent on online, frequently accessed, constantly changing data to run their businesses. Unplanned events that inhibit the availability of this data can seriously damage business operations. Additionally, any permanent data loss, from natural disaster or any other source, will likely have serious negative consequences for the continued viability of a business. Therefore, when disaster strikes, companies must be prepared to eliminate or minimize data loss, and recover quickly with useable data.
Storage virtualization is one technique used to minimize data loss and to improve the flexibility, accessibility, and availability of data storage. Storage virtualization is the pooling of physical storage from multiple storage devices into what appears from a user or user application perspective to be a single storage device. Storage virtualization is often used as part of a storage area network (SAN). A virtual storage device appears as one storage device, regardless of the types of storage devices (e.g., hard disk drives, tape drives, or the like) pooled to create the virtualized storage device. Storage virtualization may be performed in a host data processing system, a SAN fabric, or in storage devices directly.
Mirrored storage or "mirroring" is another commonly used storage technique. In a mirrored storage environment, a user is presented with a data volume made up of or associated with a number of mirror storage elements. Each write operation or "update" to the data volume is converted (e.g., by a volume manager or the like) into a write operation to each of the mirror storage elements such that all the data of the data volume is replicated onto each of the mirror storage elements. Mirrored storage provides decreased latency for "read" input/output (I/O) operations as a number of read operations can be distributed evenly over all available mirror storage elements, thus increasing available bandwidth and I/O rate in proportion to the number of mirror storage elements. Mirrored storage further provides increase reliability by providing redundant storage of data. Since there are one or more duplicate copies of every block of data, the failure of a disk associated with only one mirror storage element will not cause the data of the data volume to become unavailable.
Mirrored storage does suffer from a number of drawbacks. While read I/O operation latency is decreased by using mirrored storage, "write" I/O operation or "update" latency is actually increased. As each write operation must be translated into "n" physical write operations where "n" is the number of mirror storage elements associated with a volume, write operation latency will be slightly greater than that experienced with a write to an un-mirrored data volume even where all write operations can be initiated concurrently. Mirrored storage also requires "n" times the physical storage of an un-mirrored data volume without providing any increase in storage capacity.
Another significant problem associated with mirrored storage is that mirror storage elements may become inconsistent, for example, following a power failure of underlying physical storage devices, or the failure of hardware or software associated with an element responsible for generating and performing the additional write operations to mirror storage elements of a data volume (e.g., a volume manager or its underlying hardware system). Consider for example a data volume associated with two mirror storage elements. A write operation is issued to a volume manager, which converts it into two concurrent write operations, one for each mirror storage element. If at least one of the concurrent write operations fail while at least one succeeds for any reason (e.g., due to intervening read operations coupled with a failure of a volume manager or its underlying hardware) synchronization between the different mirror storage elements will be lost.
When synchronization between two mirror storage elements is lost, i.e., the mirror storage elements are "out of synch" with respect to one another, each mirror storage element contains different data for at least one region impacted by a failed write. Consequently, a read operation to the region could return either "old" or "new" data (i.e., data with or without the failed write operation applied) depending on which mirror storage element is used to service or process the read. Moreover, repeated read operations may return different data without an intervening write operations depending on what algorithm is used to select the mirror storage element from which a read is serviced. In this case the mirror storage elements are said to be out of sync with respect to one another and their associated data volume(s) must be recovered by "resynchronizing" all mirror storage elements before being used effectively again.
One technique for resynchronizing mirror storage elements during mirrored data volume recovery is to prevent any access, or at least any read access, to a data volume associated with mirror storage elements until all data from one mirror storage element is copied into all others. While guaranteeing that consistent data is returned upon its completion, this technique may take an unacceptably long period of time depending on the size of the data volume, the number of mirror storage elements, and the type of data stored. Another technique for resynchronizing mirror storage elements is to put an associated data volume in so-called "resync" or "read/writeback" mode. Once a read/writeback mode is entered, any read operation to a data volume will be serviced from one of the data volume's mirror storage elements, with the data of the read operation being copied to each of the other associated mirror storage elements. Accordingly, read operation performance is at least somewhat degraded due to the additional copying operations. Data of the selected mirror storage element may additionally be copied to each of the remaining mirror storage elements using a background or opportunistic process. Once all mirror storage elements are synchronized, the read/writeback mode may be exited and read operations handled normally.
Another technique utilized in the resynchronization of mirror storage elements independent of or in conjunction with read/writeback mode is so-called "dirty region logging" (DRL). Using DRL, when a write operation is received for a region of a data volume being mirrored, a "dirty" indicator is associated with the region. After the write operation's data is applied to each mirror storage element of the data volume, the dirty indicator is removed (e.g., using a least-recent algorithm or the like). Consequently, only those regions which are potentially out of synch with respect to one another and so identified as "dirty" need be resynchronized and the amount of downtime (where the data volume is made unavailable until all mirror storage elements are resynched) or the duration of time subject to degraded performance associated with read/writeback mode is reduced.
In host-based storage virtualization systems, read/writeback mode and DRL may be implemented relatively easily. In other storage virtualization environments however, a number of difficulties have arisen with the attempted use of such techniques. In switch-based storage virtualization systems for example, virtualization operations may be partitioned between an input/output module including specialized hardware (e.g., an application specific integrated circuit or "ASIC" or a proprietary architecture processor, or the like) and a control module including generalized hardware in combination with software (e.g., a general purpose processor). In operation, such bifurcated storage virtualization devices typically service the majority of input/output (e.g., read and write operation) requests and perform any associated translation between virtual and physical addresses, using only an I/O module. More complex tasks, (e.g., configuring the I/O module to perform address translation, performing dirty region logging, or the like) are then usually performed by a control module. Consequently, read operations can be typically performed to an unmirrored data volume very quickly by the specialized hardware of an I/O module without the intervention of a slower, more general-purpose control module.
When data volume recovery is implemented in such bifurcated storage virtualization environments however, all I/O operations including read operations necessitate a transition between I/O and control modules (e.g., to perform DRL for writes and additional processing such as copying data to multiple mirror storage elements in read/writeback mode or an examination of a control module-maintained DRL for reads) through a "fault" mechanism which causes an interrupt and context switch and consequently a delay of the ordinary processing of I/O operations. As the processing of I/O operations in such bifurcated virtualization systems, including read operations, always requires a fault or other delay or alternatively the inaccessibility of a data volume until recovery/resynchronization can be completed, substantial latency may be added.

Method and system for mirror storage element resynchronization in a storage virtualization device


A semiconductor device includes: a plurality of power MOS cells on a semiconductor substrate; a plurality of lead wires connecting to a source and a drain of each power MOS cell through a contact hole; a plurality of collecting electrodes connecting in parallel with the lead wires through a via hole; an interlayer protection film on the collecting electrode; a thick film electrode connecting to the collecting electrode through the opening; and a terminal protection film having an opening for bonding connection. The openings are formed in the interlayer protection film such that a portion between the openings becomes a beam shape

Conventionally, deformation or breakdown of a pad electrode or breakdown and the like of a region under the pad electrode becomes a problem. They are caused by bonding impact such as pressurization or supersonic vibration of a bonding connection, when an aluminum wire or a gold wire is bonded and connected to the pad electrode as an external output electrode of the semiconductor device.
To improve failure of the pad electrode attributed to the bonding impact, as shown in FIG. 15, a first prior art (i.e., Japanese Laid-Open Patent Publication No. S63-161634) discloses a construction for absorbing the bonding impact by forming a planar shape of a pad electrode 71 to be a network construction in such a manner that a through hole 74k is formed in the pad electrode 71 made of aluminum or aluminum alloy.
However, when a size of the pad electrode is the same, a problem occurs that connection strength of a bonding portion becomes smaller. This is because a wire is not mechanically connected to a field oxide film exposed on a bottom of the through hole in this construction. The wire is embedded in the through hole 74k when the bonding connection is performed.
Further, in the manufacturing process of the semiconductor device, there is a problem that the network construction of the pad electrode 71 formed by the through hole 74k is broken down when a needle is placed (i.e., a probe operation is performed) in a test process performed before the bonding connection.
Furthermore, a second prior art (i.e., Japanese Laid-Open Patent Publication No. 2001-156070, which corresponds to US Patent Application Publication No. 2005/0014356-A1) shown in FIG. 16 is proposed as another prior art for improving failure of the pad electrode attributed to the bonding impact. According to the second prior art, a support construction 83s is formed by opening a part of a terminal insulation protection film 83. The film 83 is formed of dielectric material on a pad electrode 82, which is made of electric conductive material such as aluminum. The bonding impact is absorbed by bonding the pad electrode 82 through the support construction 83s.
However, in this construction, the pad electrode 82 is bonded and connected through the support construction 83s. Therefore, there is a problem that connection strength of a bonding portion is reduced, similar to the first prior art. Further, since a needle is placed on the pad electrode 82 through the support construction 83s in case of the probe operation, a problem occurs that failure of electric connection between the pad electrode 82 and the needle is caused.
As described above, in addition to the problem that failure of the pad electrode is caused by the bonding impact, in the prior art for absorbing and reducing the bonding impact, there are other problems such as reduction of the connection strength of the bonding portion, breakdown of the pad electrode construction in case of the probe operation, and failure of electric connection.

Integration type semiconductor device and method for manufacturing the same


An evaporator of an air conditioner has front and rear sections, and heat-exchanging pipes comprised of first, second, and third independent refrigerant passages. In the first passage, refrigerant enters a first row of a front line of the rear section, circulates completely through the rear section, and then exits from a second row of the front line of the rear section. In the second passage, refrigerant enters a first row of the front line of the front section, circulates through an upper portion of the front section, and then exits from a first row of the rear line of the front section. In the third passage refrigerant enters a fifth row of the front line of the front section, circulates through a lower portion of the front section, and then exits from a seventh row of the rear line of the front section.

1. Field of the Invention
The present invention relates to a separate type air conditioner which has an evaporator as an indoor heat exchanger and a condenser as an outdoor heat exchanger.
2. Description of the Prior Art
Generally, an air conditioner is an appliance for maintaining optimum temperature conditions in a room. Particularly, temperature is adjusted to a proper degree by exhausting heat out of the room by means of a refrigerant cycle.
As shown in FIG. 1, a refrigerant cycle comprises a compressor 2 for compressing refrigerant into a high temperature and high pressure, a condenser 3 serving as an outside heat exchanger for liquefying the high temperature and high pressure refrigerant into a normal temperature and high pressure, a capillary tube 4 for depressurizing refrigerant, and an evaporator 1 for lowering the temperature in the room by exchanging heat of the air in the room with the refrigerant received from the capillary tube 4. Additionally, blowing fans 5 and 6 for enhancing the efficiency of the heat exchange are installed on the condenser 3, and the compressor 1, respectively.
Particulary, the evaporator 1 consists of a plurality of fins A arranged close to each other and a plurality of U-shaped heat-exchanging pipes B passing through the fins A.
These heat-exchanging pipes B constitute a refrigerant circulating passage. The heat exchanging pipes B are interconnected by connecting pipes C which connect the ends of respective heat-exchanging pipes B with each other.
The manner of aligning these heat-exchanging pipes B seriously affects the quality of the evaporator 1. Therefore, there have been many experiments and studies about how to make a good arrangement of heat-exchanging pipes B so as to improve quality of the evaporator 1.
A prior art arrangement of the heat-exchanging pipes B of the evaporator 1 is shown in FIG. 2 in greater detail. What is shown in FIG. 2 is the pipe arrangement of the evaporator 1 of a separate air conditioner having the evaporator 1 and the condenser 3, each of which being installed as a separate unit.
As shown, the evaporator 1 is divided into a front section 10 and a rear section 20. The heat-exchanging pipes B installed on the front section 10 and the rear section 20 are respectively aligned in two lines, i.e., a front line (11-1, 11-2, . . . , 11-10 in the front section 10, and a front line 21-1, 21-2 . . . , 22-5 of the rear section 20) and a rear line (12-1, 12-2, . . . , 12-10 of the front section 10, and a rear line 22-1, 22-2, . . . , 22-5 of the rear section 20). Shown in solid lines are connecting pipes C for connecting the ends of respective heat-exchanging pipes B with each other, and shown in dotted lines are connecting portions of respective heat-exchanging pipes B. The connecting portions are positioned at a side of the fins A opposite to the connecting pipes C.
Thus, the refrigerant which has passed through the capillary tube 4 is introduced into a 4-gate distributor 7' and divided into four passages, that is a first passage, a second passage, a third passage, and a fourth passage. In the first passage, refrigerant enters into 22-2, passes through 22-3, 22-4, 22-5, 21-5, 21-4, 21-3, and exits from 21-2. In the second passage, refrigerant enters into 22-1, and passes through 21-1, 11-1, 11-2, 11-3, 12-3, 12-2, then exits from 12-1. Refrigerant enters into 11-8 and passes through 11-7, 11-6, 11-5, 11-4, 12-4, and 12-5, then exits from 12-6 in the third passage. Lastly, in the fourth passage, refrigerant enters into 11-9, passes through 11-10, 12-10, 12-9, 12-8, and exits from 12-7. While the refrigerant flows through the four passages, it is evaporated to cool the air around the evaporator 1, and then it is converged in a 4-gate connecter 8' to flow to the compressor (not shown).
The above described arrangement of the heat-exchanging pipes B of the evaporator 1 makes the evaporation process successful without a pressure loss of refrigerant passing through the heat-exchanging pipes B.
According to the conventional manner in which the heat-exchanging pipes B of the evaporator 1 are arranged, however, there are great differences in the temperature of refrigerant from one refrigerant passages to the other. Moreover, temperature differences also occur between the parts of each passage, i.e, inlet part, middle part, and outlet part thereof. Specifically, it has turned out that the temperature ranges from 4.9.degree. C. to 16.8.degree. C., of which a maximum difference is 11.9.degree. C.
As the temperature difference of refrigerant is great between the passages and the parts of a passage, there is a serious drawback in the performance of the evaporator 1. Also, some of the refrigerant passing through the evaporator 1 does not evaporate and remains in a liquid state, or turns to a frozen state.

Pipe arrangement in an evaporator of an air conditioner


The present invention relates to a kerf structure for a snow tire, including a wave-shaped straight portion and an expansion portion formed expanding from the straight portion, wherein the expansion portion includes unit structures, on each of which central semi-sphere holes and polygonal forms around the semi-sphere holes form protrusions in opposite directions are formed continuously. According to the present invention, the kerf structure for a snow tire provides a symmetric shape, thereby securing uniform block rigidity regardless of the direction of the kerf, and the interlocking effect can be maximized through the combination of the protrusion shape of the polygonal shape and the embossing of the semi-sphere hole. In addition, according to the present invention, the tire performance on dry roads can be ensured by optimizing the collapse of the tire tread portion and the uniform performance of the traction can be maintained until the last stages of tread wear since the polygonal shape is maintained until the last stage of the wear even though the tire is worn.

Technical Field
The present invention relates to a kerf structure for a snow tire, and more particularly, to a kerf structure for a snow tire, wherein unit structures having central semi-sphere holes and protrusions formed in opposite directions by polygonal shapes around the semi-sphere holes are continuously formed, thereby more efficiently exhibiting an edge effect of the kerf during rotation on snow-covered roads, as well as accomplishing a friction force from a collapse of small blocks of a tread portion partitioned by the kerfs at an optimum level.
Description of the Related Art
Typically, pluralities of horizontal and longitudinal grooves are formed on the tread portion of a tire and kerfs of small grooves are formed on the block partitioned by the grooves so as to adjust the rigidity of the block.
In the case of a conventional snow tire, driving and braking performances on snow-covered roads are secured by the edge effect of the kerfs during rotation on snow-covered roads. However, the kerf adapted for this edge effect reduces the rigidity of the rubber tread block and degrades the performance of a snow tire on dry roads. FIG. 1 shows the general shape of such a conventional 2D kerf for a snow tire.
Hence, although a 3D kerf has been developed to maintain the rigidity of a tread block due to the constraints of a kerf in a vertical direction on the tire surface, in actuality, it has been difficult to maintain the optimal level of rigidity. FIG. 2 is a photograph showing that in such a snow tire having a conventional kerf, small blocks of a tread portion partitioned by the kerf are collapsed when the tire is in motion. As can be seen in FIG. 2, in a conventional kerf for a snow tire, either an excessively collapsed state A of a block occurs, or a phenomenon where the leading portion of the tire is entangled occurs, thereby decreasing a friction force caused from road surface.
The description provided above as a related art of the present invention is just for helping in understanding the background of the present invention and should not be construed as being included in the related art known by those skilled in the art.


Some embodiments relate to a first electronic network node is provided (110) configured for a cryptographic operation. The first network node is configured to receive as input a difficulty parameter (d), and a structure parameter (n), and to obtain a shared matrix (A), the shared matrix being shared a second network node through a communication interface, entries in the shared matrix (A) being selected modulo a first modulus (q), the shared matrix (A) being a square matrix (k×k) of dimension (k) equal to the difficulty parameter (d) divided by the structure parameter (n), the entries in the shared matrix (A) being polynomials modulo a reduction polynomial (ƒ) of degree equal to the structure parameter (n), said cryptographic operation using the shared matrix.

In cryptography, a key-agreement protocol is a protocol whereby two or more parties that may not yet share a common key can agree on such a key. Preferably, both parties can influence the outcome so that neither party can force the choice of key. An attacker who eavesdrops on all communication between the two parties should learn nothing about the key. Yet, while the attacker who sees the same communication learns nothing or little, the parties themselves can derive a shared key. Key agreement protocols are useful, e.g., to secure communication, e.g., to encrypt and/or authenticate messages between the parties.
In order to facilitate secure communication among parties, key agreement protocols are sometimes further subdivided into cryptographic key-exchange (KEX) and cryptographic key-encapsulation (KEM) schemes.
KEX schemes may involve the exchange of public-keys by each party, that are then independently used by the other party along with their own secret-key to calculate the common shared secret. A well-known example of such a KEX scheme is the Diffie-Hellman key-exchange, whose security is based on solving the discrete logarithm problem. An interesting feature of some KEX schemes is that the actual final, shared secret is never exchanged between the parties, not even in encrypted form, but is calculated independently by the two parties at each end. This results in a desirable feature known as forward-secrecy, which ensures that even the compromise of a party's long-term secret-key by an attacker in the future would not compromise the secrecy of encrypted message exchanged in the past.
KEM schemes may establish a shared secret between two entities or parties using asymmetric cryptography by one party, usually the initiator of the communication, to encrypt or encapsulate (using the other party's public-key) and transmit a shared secret to the other party, known as the responder, who can then decrypt or decapsulate it (using her secret-key) and then use it for securely communicating with the initiator party. Such KEM schemes may only achieve forward-secrecy if it is ephemeral. Otherwise, any attacker that compromises a party's secret-key for a past session and has recorded all messages exchanged between the parties in that session can recover the shared secret for that particular session.
Due to increasing security needs in the Internet of Things, key-exchange schemes need to also achieve high efficiency (i.e., minimal amount of communication or bandwidth requirements) while also remaining secure, against classical as well as quantum-capable adversaries.
Recent advances indicate that quantum-computers may be feasible in a few years. Perhaps as soon as within some 5-10 years. As soon as a quantum-computer is available, most existing public-key cryptographic schemes will become unsecure since the underlying problems, on which they are based, can efficiently be solved with a quantum computer. Therefore, it is very important to design quantum-resistant public-key algorithms, i.e., public-key algorithms that cannot be broken by means of a quantum-computer.
There are several classes of quantum-resistant algorithms: lattice-based, code-based, isogeny-based, etc. In this document, we deal with quantum-resistant algorithms based on lattices. Lattice based cryptographic systems are an active area of research in which many different types of systems have been proposed. For example, the lattice may be defined in terms of a matrix of numbers, e.g., elements of some finite field, or using a polynomial, etc. The type of cryptographic operation can also vary. For example, lattice based cryptography is available for: Key encapsulation (KEM), Key exchange (KEX), Public key encryption (PKE), digital signatures, etc. Examples of those schemes are:                LWE-based KEX such as Frodo        RLWE-based KEX and CPA-KEM Newhope and NewHopeSimple.        Module-lattice-based CPA-PKE, CPA-KEM and CCA-KEM as Kyber        LWR-based KEX as spKEX        Each of the above schemes implements a cryptographic protocol (e.g., a KEX, a KEM, or PKE) relying on a single underlying problem, e.g., either Learning-with-errors (LWE), or Learning-with-rounding (LWR), or module-lattices with modules, e.g., RLWE for a fixed ring, or LWR. For example: NewHope only relies on RLWE, Kyber only relies on combining k=3 modules, each module being a polynomial in Zq[x]/x{circumflex over ( )}256+1, spKEX only relies on LWR, Frodo only relies on LWE. The R in schemes such as RLWE refers to 'ring', or polynomial type implementations.
This poses several problems. First of all, implementing each of these systems would be a large investment. Not only would each of the schemes have to be coded, they would also each have to be debugged, to ensure that they do not contain critical bugs that could impair their security. On the other hand, not implementing all schemes, or at least the majority also implies certain risks. If one of the above problems is broken, e.g., RLWE or Module lattice, then the corresponding schemes are fully broken. It is desirable that there is some upgrade path, so that in case of a break, one can change from one type of scheme to another.

Configurable device for lattice-based cryptography


The invention relates to an apparatus for displacing a person from a lateral incumbent position to a sitting position and vice versa, comprising: engaging means for engaging on the person. The invention relates to a bed provided with such an apparatus. The invention further relates to a method for displacing a person from a lateral recumbent position to a sitting position using such an apparatus.

1) Field of the Invention
The invention relates to an apparatus for displacing a person from a lateral recumbent position to a sitting position and vice versa, comprising: engaging means for engaging on the person, the engaging means being rotatable about a substantially horizontal axis such that, during rotation of the engaging means in a situation engaging on the person, the person undergoes a rotation about a substantially sagittal axis of the person from the lateral recumbent position to a sitting position and vice versa. The invention also relates to a bed provided with such an apparatus. The invention further relates to a method for displacing a person from a lateral recumbent position to a sitting position, and vice versa, using such an apparatus.
2) Description of the Prior Art
For many older people and semi-invalids it is generally difficult to move unassisted from a recumbent position in bed to a sitting position. Displacing a person between a lateral recumbent position and a sitting position can be facilitated by means of an electromechanical device disclosed in the U.S. Pat. No. 5,916,085. The known electromechanical device comprises a plank-like person support member rotatably mounted on a frame positioned beside a bed. A patient, sitting or lying on the bed, uses a controller to rotate himself on the person support member about his sagittal axis, wherein said patient is fully and permanently supported by the plank-like person support member. Although the known device facilitates rotation of a patient, the known devise also has several drawbacks. A first drawback of the known device is that the known electromechanical device is relatively robust, and hence hardly transportable. Moreover, the known device is relatively expensive due to an assembly of electromechanical components to be able to displace the person. Another major drawback of the known device is that the patient is forced to undergo a stiff (plank-like) rotation, and hence to undergo an unnatural curve. No active attitude of the patient is expected and required during sagittal rotation. It has been found that this stiff (plank-like) movement will easily cause pain complaints, in particular near the lower ribs. Moreover, this stiff movement will passivate the patient even further, and will counteract recovery of the patient which could even lead to regression of the state of health of the patient.
The invention has for its object to provide a relatively user-friendly apparatus for displacing a person from a recumbent position to a sitting position and vice versa.

Apparatus, bed and method for displacing a recumbent person to a sitting position


A versatile and efficient technique for classifying packets in an intermediate node. According to the technique, criteria and rules associated with the packet are applied to one or more classification stages containing content-addressable memories (CAMs). Each stage examines specific criteria associated with the packet, e.g., a packet field, and generates a rule and additional criteria. The additional rule and criteria are provided to the next classification stage. This process continues until a final rule is provided to a final classification stage. At the final classification stage, the final rule is used to generate an identifier, e.g., queue identifier (ID), associated with the classified packet.

1. Field of the Invention
This invention relates to computer networks and more specifically to classifying packets transferred over a computer network.
2. Background Information
A computer network is a geographically distributed collection of interconnected network links and segments for transporting data between nodes, such as computers. Many types of network segments are available, with the types ranging from local area networks (LANs) to wide area networks (WANs). End nodes, such as personal computers or workstations, typically communicate over the network by exchanging discrete frames or packets of data according to predefined protocols. In this context, a protocol consists of a set of rules defining how the nodes interact with each other.
Computer networks may be further interconnected by an intermediate node, such as a switch or router, having a plurality of ports, which may be coupled to the networks. For example, a switch may be utilized to provide a "switching" function for transferring information between a plurality of LANs at high speed. The switching function includes receiving a data packet that originated from a source node at a source port and transferring that packet to at least one destination port for forwarding to a destination node.
A router may also be used to interconnect LANs executing different LAN standards and/or to provide higher level functionality than a switch. If the LAN standards associated with the source and destination nodes are dissimilar (e.g., Ethernet and token ring), the router may also alter the format of the packet so that it may be received by the destination node. Routers typically operate at the network layer of a communications protocol stack used by the network, such as the internetwork layer of the Transmission Control Protocol/Internet Protocol (TCP/IP) communications architecture.
To interconnect dispersed computer networks and/or provide Internet connectivity, many organizations rely on the infrastructure and facilities of Internet Service Providers (ISPs). ISPs typically own one or more backbone networks that are configured to provide high-speed connection to the Internet. To interconnect private networks that are geographically diverse, an organization may subscribe to one or more ISPs and couple each of its private networks to the ISPs equipment. Here, a router may be utilized to interconnect a plurality of private networks to an IP backbone network.
Typically, high-speed input links of the private networks couple to input ports of the router that feed to a single output buffer connected to a shared output link coupled to the IP backbone network. The router may function to aggregate different kinds of packet traffic (e.g., high-priority packet traffic versus lower-priority packet traffic) over the shared output link and different qualities of service (QoS) may also be required for packets transferred over the shared link. For example, packets containing voice information (voice packets) may require a higher quality of service than packets that simply contain data information, such as data contained in a file.
One way to implement QoS is to enable packets to be classified such that certain packets, e.g., voice packets, are guaranteed an established level of service. One prior technique for classifying packets in this manner involves classification rules and content-addressable memory (CAM) hardware. According to this technique a set of classification rules are defined and the CAMs are configured to implement the rules. A packet is classified by applying various content contained in a packet to the CAM. The output of the CAM, e.g., an address, is then used to make a QoS decision, which might include placing the packet on a particular calendar queue for transfer at a specific time.
One problem with the above-described technique, however, is that it tends not to scale well as the CAM typically must contain at least 2n entries of n size where n is the size in bits of the packet's content that is applied to the CAM. Thus for example, if classification is based on a single 8-bit field within the packet, the CAM must contain at least 256 8-bit entries. Likewise, if the classification is based on three 8-bit fields contained within the packet, the CAM must contain at least 16,777,216 24-bit entries; thus forcing the CAM to have a capacity that is capable of holding at least 50,331,648 bytes of information. Conventional CAMs with such capacity are either not readily available or prohibitively expensive.

Programmable packet classification system using an array of uniform content-addressable memories


An authentication process for an endpoint device uses a pair of tokens. Tokens are generated at an authentication server that maintains a data store of token states, where the states are defined to include a “normal” state sequence along which a token is expected to advance. The endpoint device can store a token pair in non-volatile local storage. To authenticate, the endpoint device can provide its stored token pair to the authentication server, which can determine whether authentication succeeds based on the states of the tokens in the token pair. After successful authentication, the authentication server can provide a new token pair to the endpoint device and advance the token states along the normal sequence. When the endpoint device confirms receipt of the new token pair, which replaces the previous token pair, the authentication server can advance the state of the tokens again.

The present disclosure relates generally to authentication of electronic devices and in particular to dual-token authentication for electronic devices.
Authentication, in the context of electronic devices, is a process by which one electronic device (referred to herein as the endpoint) provides "proof" to another electronic device (referred to herein as the grantor) that it is what it purports to be. The proof can take various forms. One common form is public-key authentication, which generally relies on a digital certificate that contains a public key for which the endpoint device holds the corresponding private key. The grantor device obtains the digital certificate for an endpoint device (e.g., from a trusted certificate authority) and send a challenge, e.g., a random bit sequence, to the endpoint. The endpoint signs the challenge using its private key, and the grantor verifies the signature using the public key extracted from the digital certificate. This process relies on the grantor trusting that the digital certificate is valid.
Providing endpoint devices with individual digital certificates in a secure manner (such that the certificates can be trusted) can be a challenge in some contexts. For instance, where the number of endpoint devices is very large, a correspondingly large-scale operation is required to generate a certificate for each device. As another example, some types of endpoint devices may be simple devices with limited computing capability and limited power consumption, such as lamps or switches or the like that may be designed for inclusion in a "smart" environment where they would be remotely controlled by a grantor device. In such devices, it may not be desirable to build in the capability to perform cryptographic operations (e.g., digitally signing a challenge). Accordingly, alternative authentication schemes would be desirable.

Dual-token authentication for electronic devices


Methods for use in a measurement system. Some embodiments comprise at least one sensor unit and a control unit, wherein the at least one sensor unit is configured to detect a physical quantity and to form a sensor data signal. The method comprises, at the control unit, receiving a data receive signal from the sensor unit, and interpreting the data receive signal to be one of at least the sensor data signal and another data signal, wherein the interpreting is based on an attribute information intrinsic to the data receive signal. Furthermore, there is a sensor unit for use in measurement data acquisition, an apparatus configured to control a measurement data acquisition, a measurement system for use in measurement data acquisition, and a medium incorporating a sequence of operation steps that, when executed, perform a method for use in a measurement system for data acquisition.

The concepts and embodiments disclosed herein relate to the technical field of measurement data acquisition. Typically, measurement data are obtained by using a sensor unit. The sensor unit comprises a transducer coupled to the probe that is sensitive to a physical quantity to be detected. The transducer is configured to output an analog measurement signal (herein also referred to as analog sensor signal) that is commensurate with an amount of the physical quantity as 'seen' by the probe.
In many applications it is impossible to place processing device in the immediate vicinity of the transducer. Consequently, the analog measurement signal needs to travel a certain distance before being processed. The longer the distance that the analog measurement signal needs to travel, for example on a transmission line, the more the analog measurement signal distorted or otherwise deteriorated, for example due to damping or due to noise on the transmission line, and the less the analog measurement signal eventually seen may still be a true representation of the measured quantity. Therefore, the sensor unit may comprise an analog to digital converter that is located in proximity to the transducer and coupled to the transducer in order to receive the analog sensor signal and configured to output a digital sense signal that represents essentially the information acquired by a transducer. In a typical application the sensor unit is coupled to the processing unit and configured to transmit the digital sense signal to the processing unit for processing. Since the transmission of digital signals is typically more robust against adverse effects of damping and noise, the digital sense signal received at the processing unit provides a representation of the measured quantity that is closer to the truth than a direct transmission of the analog signal from the transducer to the processing unit could provide.
Sometimes measurement of a given physical quantity requires the corresponding sensor unit to operate in harsh electrical conditions. In particular, a reference voltage, for example provided by ground, many vary wildly. Therefore, a barrier can be provided that electrically separates the sensor unit from the control unit. At the barrier, a sensor reference voltage, herein also referred to as sensor ground potential, used in the measurement data acquisition, and a controller reference voltage, herein also referred to as control unit ground potential, used in the processing of acquired data, are separated from one another.
Interfaces to communicate across barriers that effectively separate electrical conditions on the side of the control unit from the harsh electrical conditions on the side of the sensor unit require significant effort in engineering and quality.

Method and apparatus for use in measurement data acquisition


A clamping device is furnished, in particular for peeling machines for metallic bars (21) and tubes. The clamping device clamps the workpieces in a defined way at a preselected position (99) and independent of the diameter of the workpieces. The clamping device includes means for synchronization (64-69) of the motion of the clamping rollers (31, 32). The clamping position of the bar to be clamped can be varied by an adjustment device. The means for synchronization (64-69) of the clamping motion transfer a preselectable part of the clamping force, which is furnished such that the means for synchronization are held free from play via preclamping, during in all clamping phases. This eliminates vibrations of the bar (21) together with the clamping means (31, 62; 32, 63) or any undesired shifting of the clamping position.

1. Field of the Invention
The invention relates to a clamping device for a defined clamping of differently sized workpieces including two movable clamping elements, which clamp the workpiece on two oppositely disposed sides, and a device for moving the clamping elements together with means for synchronizing the motion of the clamping elements.
2. Brief Description of the Background of the Invention Including Prior Art
In the context of the present invention, the term "defined tightening or defined clamping" concerns a clamping, where workpieces of different sizes are to be positioned, for example, with their center always at the same position in the course of clamping. This requirement exists in particular with tool machines which process rod links and semi finished products such as bars, tubes, or profiles. The requirement is further and in particular present in the case of centerless peeling machines. Peeling machines of this kind serve, in particular, to produce a so-called bright steel from hot-rolled metallic round stock. The bar-shaped round stock is peeled in this case at its cylindrical periphery by a rotary cutter head. The bar itself is secured axially, against undesired rotation and is led through the center borehole in the cutter head by the peeling machine. The rotating cutter head carries three or more inwardly directed cutters which peel the rod on a helical path. Such peeling machines are employed for wire, bars, and tubes. The peeling machines used at the present time operate with a feed-in apparatus on the feed-in side ahead of the cutter head. This feed-in apparatus includes two roller pairs and a clamping carriage is disposed on the discharge side of the cutter head. This clamping carriage secures the bar against twisting and transfers the bar when the rear end of the bar is being peeled. In addition, such peeling machines include guides immediately ahead of and after the cutter head. These guides center the workpiece and damp the vibrations generated by the peeling process.
Modern peeling machines and rough-turning machines can change the feed-in of the round stock during operation, the rotation speed of the cutter head, and the final dimension.
A peeling machine of the above recited kind is known from the German Patent DE-PS 2,055,888, which operates with an infeed roll apparatus, which is formed as a clamping device, and where its two roller pairs form possibly together with their supports the clamping elements and clamp the bar to be peeled centrically relative to the machine center. In other words, the two rollers of one pair are movable relative to the frame of the clamping device in a radial direction relative to the peeling machine center. A cylinder presses the two rollers against the workpiece. One roller is mechanically connected with the cylinder in this case, and the second roller is connected to the piston of the cylinder. The rollers of one pair are synchronized in their clamping motion. Each roller of a pair is hingedly connected via its roller to the ends of a rocker, pivotably supported at the frame of the clamping device. The two rollers are led and guided with their supports at the frame of the clamping device and they are moved apart and then led together for clamping purposes by a hydraulic cylinder. The rocker transfers no clamping forces in a standard situation. The rocker assures only that the clamping rollers are synchronously moved by the hydraulic cylinder.
It is a disadvantage of this clamping device that the center guiding of the bar to be peeled exhibits a play within the range of the tolerances of the synchronization means and, further, allows vibrations of the bars together with the clamping elements. The play of the unit, comprising the rollers with the clamped bar, can lead to an interference and disturbations of peeling and rough turning efficiency, in particular, after an extensive use of the clamping device.

Clamping device for a defined clamping of workpieces

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