The present invention includes a panel on which a plurality of pixels are located, a light-source for visualizing an image displayed on the plurality of pixels, a controlling circuit for controlling the light-source, and an image-signal tone characteristic controlling circuit. Moreover, the light-source controlling circuit has a function of repeating a period. Here, the period includes a 1st time-period during which an electric current having a 1st intensity is fed to the light-source, and a 2nd time-period during which an electric current having a 2nd intensity differing from the 1st intensity is fed to the light-source. The light-source controlling circuit controls the 1st time-period and the 2nd time-period in accordance with display information. Also, in accordance with the display information as well, the tone characteristic controlling circuit is controlled so that the excellent contrast will be always available.

1. Field of the Invention
The present invention relates to a display apparatus using a liquid crystal display device, an electroluminescence device, or the like. More particularly, it relates to a display apparatus having a light-source that is suitable for enhancing the luminance of the display screen with a high-efficiency and for making the luminance uniform on the display screen.
2. Description of the Related Art
The display apparatus, which uses the liquid crystal display device (which is also referred to as "liquid crystal display panel"), the electroluminescence device (which, depending on a fluorescent material used, is classified into an organic-family and an inorganic-family and, hereinafter, is referred to as "EL device"), a field emission device (which, hereinafter, is referred to as "FE device"), or the like, performs the image display. However, unlike the case of a Braun tube (which, hereinafter, is referred to as "CRT", i.e., "cathode ray tube"), the display apparatus performs the image display under a condition that there is provided no space for 2-dimensionally scanning an electron beam on the back side of the display screen. Accordingly, as compared with the CRT, these display apparatuses have characteristics of being thinner and lighter-weighted, operating with a lower power consumption, and so on. These display apparatuses, in some cases, are referred to as "flat panel displays" from the characteristics in their outward appearance.
From the above-described advantages over the CRT, the display apparatus using the liquid crystal display device, the EL device, the FE device, or the like is becoming widely prevalent in various types of uses in substitution for a display apparatus using the CRT. In the background to this situation, there exist the technical innovations such as an enhancement in the picture-quality of the liquid crystal display device, the EL device, or the like. Meanwhile, in recent years, the prevalence of the multimedia and the Internet has been increasing a demand for the motion-frame picture display. As a result, in the display apparatus using the liquid crystal display device, improvements based on the liquid crystal material and the driving method are being made in order to implement the motion-frame picture display. Being not limited to the liquid crystal display apparatus, however, in the display apparatuses referred to as the flat panel displays, the implementation of a higher luminance for displaying an image comparable to that of the conventional CRT has also become an important problem.
In order to obtain the image comparable to that of the conventional CRT, an impulse type light-emission is of absolute necessity. In the impulse type light-emission, each pixel is scanned with an electron beam emitted from an electron gun, thereby causing a fluorescent substance in each pixel to perform the light-emission.
In contrast to this, the liquid crystal display apparatus, for example, employs a hold type light-emission where a light-source unit including a fluorescent lamp is used. On account of this, it has been regarded as difficult for the display apparatus to implement the complete motion-frame picture display.

Hitachi Video and Information System, Inc.


A porous metal sheet, for use in a battery electrode substrate, composed of a two-layer structure consisting of a first and second foamed metal layers or a structure having three or more layers consisting of the first and second foamed metal layer, a mesh metal layer and the like sandwiched between said first and second layer. The number of cells of the first foamed metal layer is smaller than that of the second foamed metal layer. The electrode plate is spirally wound with the second foamed metal layer located at a peripheral side and with the first foamed metal layer located at an inner peripheral side.

1. Field of the Invention
The present invention relates to a porous metal sheet composed of a layered structure, a battery electrode plate composed of the porous metal sheet, and a battery having the electrode plate. More particularly, the present invention relates to a porous metal sheet that is wound spirally to accommodate it in a cylindrical battery can of a secondary battery such as a nickel cadmium battery, a nickel hydrogen battery, and the like.
2. Description of the Related Art
As a positive plate and a negative plate for use in the nickel cadmium battery, the nickel hydrogen battery, and the like, porous metal sheets are hitherto used. The porous metal sheet is formed by plating a foamed three-dimensional reticulate porous material such as a polyurethane sponge; a nonwoven cloth; and a mesh net.
Of the above porous metal materials, a foamed metal sheet, which is formed by plating the polyurethane sponge and then burning the polyurethane, has a higher porosity than a punching metal and the like. Thus, the foamed metal sheet can be charged with a larger amount of an active substance than other porous metal sheets. Further, pores are three-dimensionally present in the foamed metal sheet. Thus, the foamed metal sheet holds the active substance therein in a high extent. Therefore, the porous metal sheet consisting of the foamed metal sheet is preferably used as an electrode substrate.
In the conventional electrode substrate composed of only the foamed metal sheet, needless to say, the number of cells on one side (surface) of the electrode substrate is almost equal to the number of cells on the other side thereof. In the case of the electrode substrate composed of the foamed metal sheets disposed on its both sides and a mesh metal sheet or a nonwoven metal sheet sandwiched between the foamed metal sheets, the number of cells of the foamed metal sheet disposed on its one side is almost equal to that of cells of the foamed metal sheet disposed on its other side. This is because both-side foamed metal sheets are formed by plating the urethane sponge made of the same material.
The electrode substrate composed of the foamed metal sheet is charged with the active substance to form an electrode plate. The rigidity of the electrode substrate is increased by charging it with the active substance. When the electrode plate is accommodated in a cylindrical can, which has a small inner diameter, by spirally winding it, it is wound at a very small curvature to accommodate it in the cylindrical can in a required volume or more than the required volume. Thus, normally, the electrode plate is so wound that the inner diameter of an innermost spiral circle of the electrode plate is as small as about 3 mm. Consequently, as shown by the photograph of FIG. 7A and the illustration of FIG. 7B, the rigid electrode plate is susceptible to crack. Because the electrode plate has a certain thickness, the elongation percentage of the outer periphery thereof is higher than that of the inner periphery thereof. Thus, a crack C and a breakage B are liable to occur from the outer periphery of the electrode plate. With the recent demand for the development of a miniaturized battery and for increase in its capacity, this type of crack and breakage occur more frequently than before.
With reduction of the strength of the electrode plate relative to a tensile force, the electrode plate is susceptible to small cracks but is not susceptible to a large crack or breakage when it is wound. As a method of reducing the strength of the electrode plate, it is conceivable to increase the number of cells of the foamed sheet and to increase the number of frameworks surrounding the cells (pores). Supposing that the same amount is deposited on a unit area of a foamed sheet, the amount deposited on a surface area-increased framework becomes small. Consequently, the foamed metal sheet has a narrow framework and hence a low strength. However, when a resulting foamed metal sheet is charged with the active substance while it is being successively fed, the foamed metal sheet cannot be charged with the active substance efficiently at a high feeding speed because it has a low strength relative to a tensile force. Further, when the foamed material is plated while it is being successively fed, it cannot be plated efficiently at a high feeding speed as in the case of the time when the foamed metal sheet is charged with the active substance. Further, when the number of cells is increased, it is difficult to plate the inner side of the foamed material made of the urethane sponge, because the diameters of the cells are small. In this case, the foamed material is plated non-uniformly.
On the other hand, as a method of increasing the strength of the electrode plate, it is conceivable to decrease the number of cells of the foamed material to reduce the surface area of the framework surrounding the cells. Supposing that the same amount is deposited on a unit area of a foamed material, the amount deposit on a surface area-decreased framework becomes large. Consequently, the foamed metal sheet has a thick framework and hence a high strength. Therefore, it is possible to charge the resulting foamed metal sheet with the active substance efficiently at a high feeding speed. However, because the foamed metal sheet has a high strength relative to the tensile force, it is difficult to wind the foamed metal sheet when the foamed metal sheet is wound at a small curvature. Further, the foamed metal sheet cracks occur deep into the inner peripheral side thereof and is thus susceptible to breakage. The broken portion of the foamed metal sheet may break through a separator.
The present invention has been made in view of the above-described situation. Thus, it is an object of the present invention to prevent a electrode from cracking deeply and broken when it is spirally wound, allow a winding work to be accomplished smoothly, and prevent a feeding speed from being reduced when it is charged with an active substance.
In order to achieve the object, according to the present invention, there is provided a porous metal sheet, for use in a battery electrode substrate, composed of a two-layer structure consisting of a first foamed metal layer and a second foamed metal layer or a structure having three or more layers consisting of the first foamed metal layer, the second foamed metal layer, one or more metal layer sandwiched between said first foamed metal layer and said second foamed metal layer and selected from a group consisting of a mesh metal layer, a nonwoven metal layer or/and a metal sheet layer having uniform pattern pores formed therethrough. In the porous metal sheet having the construction, the number of cells of the first foamed metal layer and that of the second foamed metal layer are different from each other.
The number of cells of the second foamed metal layer is more than that of the first foamed metal layer by specifying the number of cells of the first foamed metal layer to 30 PPI or more and less than 60 PPI and specifying the number of cells of the second foamed metal layer to 50 PPI or more and less than 80 PPI.
The number of cells of the first foamed metal layer is set to 30 PPI or more and less than 60 PPI for the following reason: if the number of cells of the first foamed metal layer is less than 30 PPI, i.e., because the number of cells thereof is too small, the first foamed metal layer has a small active substance-holding force. Further, because the diameters of cells are large, the utilization percentage of the active substance deteriorates because the active substance is not electrically conductive. If the number of cells of the first foamed metal layer is 60 PPI or more, it is difficult to allow the mechanical property of the first foamed metal layer to be different from that of the second foamed metal layer. The reason the number of cells of the second foamed metal layer is set to 50 PPI or more is because if the number of cells of the second foamed metal layer is less than 50 PPI, it is difficult to generate small cracks on the second foamed metal layer. On the other hand, if the number of cells of the second foamed metal layer is 80 PPI or more, the second foamed metal layer has a too low tensile strength.
It is preferable to set the number of cells of the first foamed metal layer to 45 PPI or more and less than 55 PPI and the number of cells of the second foamed metal layer is more than 56 PPI or more and less than 65 PPI.
PPI is a unit indicating the number of cells (pore) per inch. For example, 30 PPI means that the number of cells per inch is about 30, and 80 PPI means that the number of cells per inch is about 80. When the number of cells per inch is as small as 30, the number of frameworks surrounding pores is small, and thus the surface area of the framework per inch is small. When the number of cells per inch is as large as 80, the number of frameworks surrounding pores is large, and thus the surface area of the framework per inch is large. Supposing that the same amount is deposited on a unit area of a foamed material, the foamed material, which has a decreased number of cells to reduce the surface area of its framework, has a larger deposit amount and a larger deposit thickness on its framework. Further, because the foamed material has large-diameter cells, the foamed material made of the urethane sponge can be plated uniformly and inwardly. Therefore, the framework surrounding the cells is thick and thus has a high strength relative to a tensile force. On the other hand, the foamed material, which has a large number of cells and a surface area-large framework, has a less deposit amount on its framework and thus a deposit thickness is small. Further, because it has small-diameter cells, it is difficult to plate the foamed material inward. Therefore, the framework surrounding the cells is thin and thus has a low strength relative to the tensile force.
It is preferable to use polyurethane sponge having a thickness of 0.5 mm-3.0 mm and a pore diameter of 200 xcexcm-800 xcexcm as a base material of the both-side foamed metal layers. It is preferable to use metals Cu, Ni, Ni alloy, Zn, Sn, Pd, Pb, Co, and Fe as the metal to be used to plate them.
The above-described porous metal sheet is produced as follows: initially, foamed materials of urethane sponge or the like having different number of cells are layered on each other and layered surfaces thereof are bonded to each other with an adhesive agent or welded to each other; or they are layered on each other with a mesh, a nonwoven cloth, and/or a metal sheet having pores of uniform pattern sandwiched between the foamed materials and layered surfaces thereof are bonded to one another with the adhesive agent or welded to one another. Then, the layered structure is plated. Then, it is sintered and the resin is removed by burning it. In this manner, the porous metal sheet having the foamed metal layers having different number of cells formed at both sides thereof is produced.
The present invention provides a battery electrode plate composed of an active substance-applied porous metal sheet having foamed metal layers, formed at both sides thereof, having different number of cells, different strengths and different elongation percentages relative to a tensile strength.
The present invention provides a battery accommodating an electrode plate in a cylindrical can. The electrode plate is spirally wound with the second foamed metal layer located on the outer side thereof and with the first foamed metal layer located on the inner side thereof.
As described above, in the present invention, the electrode plate is wound, with the second foamed metal layer located on the outer side thereof. This is because the second foamed metal layer has more cells and narrower framework and thus has a lower degree of strength and a lower elongation percentage relative to a tensile force than the first foamed metal layer. Further, as described previously, the outer side of a circular plate has a higher elongation percentage than the inner side thereof. Therefore, the second foamed metal layer is very susceptible to a lot of small cracks. Owing to the generation of the many small cracks, the electrode plate can be wound smoothly. Further, because a lot of small cracks are generated on the outer side of the electrode plate, it is difficult for a crack generated on its outer side to reach its inner side. That is, the electrode plate can be prevented from being destroyed. Furthermore, in feeding the porous metal sheet to charge it with an active substance to form the electrode plate, it is possible to feed the porous metal material at a high speed by pulling it at a high degree of force because the first foamed metal layer having a higher strength relative to a tensile force is disposed at the inner side of the porous metal sheet. Thus the productivity of the electrode plate can be improved.

Porous metal sheet, battery electrode plate composed of porous metal sheet and battery having electrode plate


An example method includes capturing, by a camera of a computing device, an image including at least a face of a user, calculating a face template of the face of the user in the image, and analyzing the face template to determine whether the face includes at least one of a removable facial feature that decreases a level of distinctiveness between two faces and a non-removable facial feature that decreases a level of distinctiveness between two faces. When the face includes the removable facial feature, the method further includes outputting a notification for the user to remove the removable facial feature. When the face includes the non-removable facial feature, the method further includes adjusting a first similarity score threshold to a second similarity score threshold.

A user may activate or otherwise gain access to functionalities of a computing device by "unlocking" the device. In some instances, a computing device may be configured to permit unlocking based on authentication information provided by the user. Authentication information may take various forms, including alphanumeric passcodes, gestures, and biometric information. Examples of biometric information include fingerprints, retina scans, speech, and facial images. A computing device may authenticate a facial image input using facial recognition technology.

This patent is subject to a terminal disclaimer.


A product includes a closure having a radially inner portion, and being removably securable to a container, and a pendant releasably coupled to the radially inner portion of the closure, and being releasable from the closure into the container upon removal of the closure from the container. A package may include the product and a container, wherein the closure is removably secured to a neck of the container to removably close the container, and the pendant is suspended from the closure in an interior of the container neck, such that when the closure is removed from the container, the pendant releases from the closure and drops into the container and is non-removably carried therein to provide an indication that the package has been opened from its original factory sealed condition.

Many containers are provided with tamper-resistant devices to resist refilling of contents in the containers. For example, a beverage container can include a fitment that renders the container non-refillable, so as to impede efforts to refill the container with inferior products. U.S. Pat. No. 3,399,811 illustrates a container of this type.
A general object of the present disclosure, in accordance with one aspect of the disclosure, is to provide a product including a closure and a package opening indicator carried by the closure and adapted for use with a container to indicate whether the container has been opened and, thus, provide evidence of efforts to repackage the container with counterfeit product.
The present disclosure embodies a number of aspects that can be implemented separately from or in combination with each other.
A product in accordance with one aspect of the disclosure includes a closure having a radially inner portion, and being removably securable to a container, and a pendant releasably coupled to the radially inner portion of the closure, and being releasable from the closure into the container upon removal of the closure from the container.
In accordance with another aspect of the disclosure, there is provided a package that includes the aforementioned product and a container having a body and a neck with an interior, wherein the closure is removably secured to the container neck to removably close the container. The pendant is suspended from the closure in the interior of the container neck, such that when the closure is removed from the container, the pendant releases from the closure and drops into the container and is non-removably carried therein to provide an indication that the package has been opened from its original factory sealed condition.
In accordance with an additional aspect of the disclosure, there is provided a package that includes a container having a body and a neck with an interior, and a closure removably secured to the container neck to removably close the container, and a pendant in the interior of the container neck. The package also includes a means for releasably coupling the pendant to the closure, and a means for releasing the pendant from the closure upon removal of the closure from the container so that the pendant drops into the container and is non-removably carried therein to provide an indication that the package has been opened from its original factory sealed condition.
In accordance with a further aspect of the disclosure, there is provided a method of producing a package that includes coupling a package opening indicator to a closure in a manner such that the pendant is releasable from the closure, filling a container with a flowable product, and applying the closure to the container to suspend the pendant within the container.

Closure pendant to indicate package opening


A roofing panel, a roof, an array of roofing panels, and a method of manufacturing a roofing panel by transporting a capstock layer of the roofing panel through a moving belt mold, and forming a polymeric material in situ against the outer layer while in a mold cavity of the moving belt mold. The capstock layer is vacuum formed to shape and form a plurality of roofing shingles and to impress the shingles with surface topography features simulating natural materials.

US 2006/0029775 A1 discloses a single roofing shingle made by coextruding a capstock layer with a filler material, and then cutting the same into one or more individual shingles. U.S. Pat. No. 3,897,667 discloses casting a foam onto a sheet formed into a panel of shingles in a closed mold wherein closing and opening the mold is performed in a step and repeat process.
It would be advantageous to manufacture a plurality of roofing shingles continuously joined together to form a panel, which is faster to manufacture than a step and repeat process. Further it would be advantageous to manufacture the panel of roofing shingles with a polymeric foam layer which lightens the weight thereof for ease in handling, while having substantial stiffness and beam thickness to resist beam deflection. Further, it would be advantageous for the foam thickness to provide thermal insulation.
U.S. Pat. No. 5,167,781 discloses a foamed plastic material injected into a mold cavity while at an early stage of its foaming action. Foaming is completed in the mold to control finished product density. A separate assembly operation is required to join the foamed plastic material with an outer layer to form a panel. It would be advantageous to eliminate the separate assembly operation by an apparatus capable of bonding the foamed plastic layer with the outer layer while the inner layer is foamed and molded to a desired shape.
U.S. Pat. No. 6,641,384 discloses a belt mold apparatus for continuously molding a polymeric material between a pair of continuous belts, each of which continuously rotates in a loop that circumscribes spaced apart rollers. The pair of belts continuously rotate into positions adjacent each other to form a moving mold between the belts. The polymeric material in a melt state is introduced into a front end of the moving mold. The moving mold shapes the polymeric material therein to form a continuous manufactured article. The moving mold travels from front to rear, accompanying the moving belts. While the belts move rearward and then rotate away from each other, the mold opens, which releases the continuous manufactured article, such that the article withdraws from the moving mold in a rearward direction. The mold includes a vacuum manifold that draws a vacuum on the polymeric material in the mold interior, such that air in the mold interior is evacuated and the polymeric material fills the mold interior and is shaped by a vacuum molding process. Each belt is supported against a flat support belt having apertures through which the vacuum is drawn, such that the vacuum draws the belt against the support belt. A suitable support belt and vacuum manifold are disclosed in U.S. Pat. No. 5,906,840.
Each of U.S. Pat. Nos. 6,319,456 and 6,737,008 discloses a two-layer polymeric building product of continuous length that is formed with visibly aesthetic surface features on a surface of the two-layer building product by using a moving mold formed between a pair of moving belts. The belts loop around rotating rollers and travel continuously in respective loops to continuously rotate into position beside each other and form the moving mold therebetween. The building product is continuously molded lengthwise with lateral edge portions extending continuously lengthwise. Subsequent to completion of the mold, such lateral edge portions are plastically deformed while still hot, by using a mechanical means to shape a butt edge and a nailing edge, respectively. Further, a punch press is used to mechanically punch a series of apertures laterally through the nailing edge of the building product. Insulation is disclosed as being applied by spraying a foamed polyurethane emulsion.


An apparatus for manipulating and testing molecules includes a surface to which the molecule is anchored at multiple points at one end, a paramagnetic bead on which said molecule is anchored at multiple points at its other end, and a magnetic means for applying a force to the bead, said magnetic means being used to control the stretching and rotation of said bead and said molecule. The apparatus also includes an optical magnification means and a camera for the visualization of said bead. The apparatus further includes a computer means to which images from the camera are transmitted. The computer means includes means for analyzing the motions of the bead. The apparatus also includes a rotating means for spinning the magnetic means about an optical axis of the magnification means. The magnetic means is positioned at a distance from the molecule in the direction of the optical axis of the magnification means, perpendicular to the optical axis, so that the force applied to the bead is substantially directed parallel to said optical axis and the field produced by the magnetic means is perpendicular to the optical axis. Rotation and translation of the magnetic means causes rotation and translation of the bead, which allows to control stretching and torsion of the molecule.

The twisting and bending of DNA is an extensively studied aspect of its structure. It affects both structural transitions and interactions between DNA and other molecular complexes. For example, a locally underwound DNA is necessary for transcriptional activation and recombinational repair. Supercoiled DNA is also a key structural factor in chromosomal organization in which the winding of the molecule around histone proteins is necessary for DNA compaction. More specifically, the entropic tension generated in supercoiled DNA in anaphase during chromosomal condensation is released by the action of a specific enzyme, topoisomerase II, thus allowing the disentanglement and segregation of the chromosomes necessary before cell division.
In the last decade new tools (atomic-force-microscopy, optical tweezers, small glass fibers, . . . ) have been developed to manipulate small objects and also to investigate the forces involved in the systems studied.
[1] S. B. Smith, Y. Cui, C. Bustamante Science 271, 795 (1996)
[2] P. Cluzel, A. Lebrun, C. Heller, R. Lavery, J. -L. Viovy, D. Chatenay, F. Caron Science 271, 795 (1996).
Spectacular results were obtained on molecules such as DNA and various motor proteins : RNA polymerase, F1-ATP synthase and myosin, for example.
However, sophisticated instrumentation is required in most of these systems.
The glass fibers have the advantage of giving very quick results. However, they require one to calibrate their elasticity before any measurements are made and although they are able to measure forces stronger than Brownian ones, they are not sensitive enough to be used in the entropic regime (<1 pN).
The AFM may be used in the same way and has the same drawbacks.
Optical tweezers have also been used, for example to measure the force (—˜ 6 pN) produced by a single myosin on an actin filament (the two basic components of muscles). They also require a force calibration. One needs to know the relation between the intensity of the laser beam and the force applied to the system, and one has to determine it every time one changes the trapped object.
Further drawbacks of optical tweezers are the lack of total torsionnal control on DNA and the local heating of the solution by the focussed laser which increases the noise.
Another technique which has been proposed in
[3] Smith S. B., Finzi L., Bustamante C.—Science, vol. 258, Nov. 13 1992, consists in chemically attaching the DNA molecules by one end to a glass surface and by the other end to a magnetic bead. The beads were manipulated by using magnetic and hydrodynamic forces and observed under an optical microscope. Extension versus force curves were obtained.
However, the apparatus and methods proposed in this article did not allow for twisting the molecules.
Also, sophisticated means were needed to infer the forces applied to the beads.

Apparatus and method for the manipulation and testing of molecules, and in particular of DNA

Centre National de la Recherche Scientifique (CNRS)


In an X-ray CT apparatus, the X-ray tube generates an X-ray beam during a line-orbit scan, and the collimator plate shields a part of the X-ray beam other than the part that contributes to image reconstruction. The part of the X-ray beam which contributes to the image reconstruction is applied to a subject along the body axis of the subject. The two-dimensional detector system detects the X rays in the same conditions during a circular-orbit scan, while the X-ray tube and the subject are rotating relative to each other. The reconstruction device performs back projection, thereby reconstructing an image.

1. Field of the Invention
The present invention relates to an X-ray CT apparatus that performs cone-beam reconstruction and a method of controlling the X-ray CT apparatus. More particularly, the invention relates to an X-ray CT apparatus that applies X rays to a living subject, providing information about the interior of the subject in the form of an image.
2. Description of the Related Art
In recent years, a system has been defined as a third-generation CT apparatus. This system comprises an X-ray tube and an X-ray detector. The X-ray tube generates an X-ray beam. The X-ray detector is located, opposing the X-ray tube, with the subject lying in between. As the X-ray tube and X-ray detector rotate around the subject, projection data items are acquired from various angles. Hitherto, the X-ray beam is a fan-shaped beam and the detector is a one-dimensional array detector.
Scanning systems are available in two types, i.e., conventional scan system and helical scan system. The conventional scan system is defined as a circular-orbit scan system in which the X-ray tube moves in one circular orbit. The helical scan system is defined as scan system in which the X-ray source and the X-ray detector keeps rotating around the subject and the bed supporting the subject moves along the body axis of the subject. The helical scan system is so named, because the X-ray tube is considered to move in a helical orbit in view of the coordinates system that moves as the subject is moved. Note that the distance the subject is moved along the body axis, i.e., Z axis, every time the X-ray tube rotates around the subject is defined as helical pitch.
Among the third- and fourth-generation CT apparatuses recently developed are a CT apparatus having a new-type X-ray tube and a two-dimensional array detector. The new-type X-ray tube generates not a fan-shaped X-ray beam, but a cone-shaped X-ray beam that diverges, like a cone, in the body axis of the subject. This CT apparatus is called a cone-beam CT apparatus. The two-dimensional array detector has a plurality of one-dimensional array detectors, each consisting of detector elements. These detectors, for example, N detectors, are laid one on another in the Z-axis direction. Thus, the detector elements are arranged in rows and columns, forming a matrix.
Known as a method of providing tomograms, using the conventional scan system, is the circular-orbit, cone-beam reconstruction method proposed by Feldkamp et al. (See, for example, Jon. Pat. Apply. KOKAI Publication No. 2002-360562.) However, cone-beam artifacts develop in the circular-orbit, cone-beam reconstruction method. Consequently, this method cannot provide perfect data. The method has been proved to degrade the image in quality.
In order to solve this problem, a new cone-beam reconstruction method has been proposed. This new method is known as a line+cicle reconstruction method (hereinafter called line-circle reconstruction method). In recent years, Katsevich et al. have proposed a line-circle reconstruction method, which is known as the "filter+back projection" system.
To implement the line-circle reconstruction method successfully, the following requirements should be satisfied.
Since line data is regarded as an additional scan, or an excessive exposure, an additional exposure, if any, must be reduced as much as possible. Further, only a part of line data contributes to the reconstruction and the remaining part is, therefore, a wasteful exposure, though the line data should be large cone-angle data.

X-ray CT apparatus and method of controlling a collimator and an angle to acquire X-ray data


The invention is provides a composition for sustained delivery of a biologically active agent comprising a biologically active mixture and a controlled release formulation. The composition protects the biologically active agent from being destroyed by the controlled release composition. The biologically active mixture includes the biologically active agent and a pharmaceutically acceptable protective carrier. The controlled release formulation includes a pharmaceutically acceptable, biodegradable, matrix forming material that is substantially insoluble in aqueous or body fluids and a pharmaceutically acceptable organic solvent. The biologically active mixture is combined with the controlled release formulation to form an emulsion, the delivery composition, which is then administered to a patient. The protective carrier can be an aqueous substance, a non-aqueous substance or a combination of both. The matrix forming material can be a polymeric material, a non-polymeric material or a combination of both. The organic solvent can have a solubility ranging from a high water solubility to a low water solubility.

A variety of approaches have been developed for administering a biologically active agent to a patient in a continuous or sustained manner. However, currently available approaches suffer from one or more disadvantages or limitations.
In many conventional controlled release systems, the active agents are incorporated into solid, monolithic polymeric matrices. The matrices are surgically implanted into patients' bodies and control the release of active agents into the patients' systems. Often, however, the sizes and shapes of the matrices and the surgical implantation lead to patient discomfort and complications. In recent years, microstructures, such as lipospheres, liposomes, microcapsules, microparticles, and nanoparticles have been developed to overcome these problems. The microstructures contain the active agents and are introduced into a patients' bodies as dispersions. However, when inserted into a body cavity where there is considerable fluid flow, such as the mouth or eye, microstructures may be poorly retained due to their small size and discontinuous nature. Microstructure systems also lack reversibility. If complications arise after introduction, it is difficult to remove the microstructures without extensive and complex surgical intervention.
Other controlled release delivery systems are flowable composition that can be administered using a syringe. Upon contact with body fluids, the delivery system is transformed in situ to form a solid implant. Exemplary flowable polymeric compositions are described in U.S. Pat. Nos. 4,938,763; 5,278,201; and 5,278,202. As the delivery system forms a solid matrix, the active agent is trapped or encapsulated within the matrix. The release of the active agent then follows the general rules for the dissolution or diffusion of a drug from within a polymeric matrix.
Irrespective of their physical character as monolithic matrices, microstructures or flowable compositions, these delivery systems can not be effectively used with all biologically active agents. Some biologically active agents may be destroyed or dissolved by the polymeric formulations and carriers used in these systems. For example, peptides or proteins may be denatured by the solvents used to dissolve the polymers. RNA or DNA compounds and antigens may be affected. Cellular treatments are also difficult to administer using known sustained release systems. The sustained release formulations often provide an environment that is too harsh for cellular survival and therefore causes destruction or death of the cells. Therefore, an improved method for sustained release of a biologically active agent in which the active agent is protected from the sustained release formulation would be desirable.


A Duty Cycle Correction (DCC) circuit is provide in which pairs of field effect transistors (FETs) in known DCC circuit topologies are replaced with linear resistors coupled to switches of the DCC circuit such that when the switch is open, the input signal is routed through the linear resistors. The linear resistors are more tolerant of process, voltage and temperature (PVT) fluctuations than FETs and thus, the resulting DCC circuit provides a relatively smaller change in DCC correction range with PVT fluctuations than the known DCC circuit topology that employs FETs. The linear resistors may be provided in parallel with the switches and in series with a pair of FETs having relatively large resistance values. The linear resistors provide resistance that pulls-up or pulls-down the pulse width of the input signal so as to provide correction to the duty cycle of the input signal.

1. Technical Field
The present application relates generally to an improved duty cycle correction circuit. More specifically, the present application is directed to a duty cycle correction circuit whose operation is largely independent of operating voltage and process.
2. Description of Related Art
Many modern electronic systems require a precise clock circuit for proper operation. For example, digital information processing equipment such as a computer must have an accurate and reliable clock source to control the various signals that are sent between the functional components of the computer. In such systems, it is very important that all of the components are properly synchronized to a common clock.
Synchronous electronic equipment utilizes an oscillator circuit to produce a basic source frequency signal. This signal is in turn utilized to drive other circuitry (such as a phase-lock loop, or PLL) for developing desired rise and fall times of square-wave signals, and desired signal levels. The clock rate requirements for timing digital information processing systems are generally proportional to the switching speeds of the circuitry employed. As clock circuits improve and clock rates increase, tolerances are necessarily diminished, and clock skew becomes an ever-increasing problem.
Different problems can arise in the accuracy of the clock signal. Variations in timing between successive rising edges (or falling edges), i.e., the overall cycle variation (often referred to as "jitter") typically relates to the oscillator. Variations in the duty cycle (the portion of the overall cycle in which the signal is "on"), i.e., between a rising edge and the next falling edge, typically relate to the clock distribution network, although variations in the duty cycle can also be caused by the oscillator. Clock distribution networks use various elements such as buffers and inverters, often cascaded. These networks can introduce duty cycle distortion due to circuit and interconnect modeling inaccuracies, process variations, and the environment.
For systems which use both the rising and falling edges for timing, a non-optimal clock duty cycle may require a lower clock frequency, reducing performance. A duty cycle error of just 5% for instance (from 50% to 45%) may require a system clock to run at a maximum speed that is 10% lower, causing a significant impact on system performance.
Many circuits require a specific duty cycle for clocking signals to provide optimal performance. For example, multi-phase clocking systems often require a symmetrical wave shape that is characteristically desired to operate at a 50% duty cycle. Some applications require a duty cycle other than 50%. One use of non-50% duty cycles is in digital clocking where pulse-mode latching is used rather than edge-latching in order to reduce the setup-hold overhead associated with the latches.
Actual duty cycles typically do not have precisely the desired value. Even if a clock signal has the required duty cycle at some point in the system (e.g., at the output of an on-chip voltage-controlled oscillator), the duty cycle will deviate from the required percentage as the clock signal is buffered and distributed throughout the chip.
Different approaches have been devised to actively control the duty cycle. Most of these approaches involve measurement of the error in the duty cycle, and provision of a correction signal to reduce that error. The generation of the correction signal is performed by a duty cycle correction circuit. Various types of duty cycle correction circuits have been devised. One such duty cycle correction circuit is shown in FIG. 1A.
As shown in FIG. 1A, the duty cycle correction circuit 100 is comprised of a plurality of pairs of P-type and N-type field effect transistors (FETs). The first pair of FETs comprises a first P-type FET (PFET) 110 and a first N-type FET (NFET) 120. The FETs of the first pair of FETs have relatively large resistance values compared to the FETs in the second pair of FETs. A second pair of FETs comprises a second P-type FET (PFET) 130 and a second N-type FET (NFET) 140. The FETs of the second pair of FETs have a relatively small resistance value when compared to the FETs of the first or third pair of FETs. By the term "small" in the present description what is meant is that the smaller item is less than approximately 10% of the larger item. Thus, for example, the resistance value of the second pair of FETs is less than approximately 10% of the resistance values of the first or third pair of FETs.
The first and second pairs of FETs are coupled to a third pair of FETs that comprises a third PFET 150 and a third NFET 160. The first pair of FETs are part of the inverter circuit that provides the duty cycle correction. The second pair of FETs are used to increase or decrease the pulse width of the input signal. The third pair of FETs operate as buffers between each successive duty cycle correction stage.
The second pair of FETs are used to selectively pull-up or pull-down the pulse width of the input signal IN, e.g., an input clock signal. The selective pull-up and pull-down operation of the duty cycle correction circuit 100 is made possible by the controlled opening and closing of switches 170 and 180. The opening and closing of switches 170 and 180 may be controlled by a duty cycle control unit 190 based on a detected duty cycle as detected by duty cycle detection unit 195, for example. An example of such a duty cycle control unit 190 and detection unit 195 is provided in U.S. Pat. No. 6,501,313.
As shown in FIG. 1A, the pull-up of the pulse width, i.e. the increase of the pulse width and thus, the decrease in the duty cycle, is affected by the selective closing of switch 170. As shown in FIG. 1B, the duty cycle correction due to the closing of switch 170 is equivalent to the driving of the input signal toward a capacitance of the node Out′ through parallel resistors. The parallel resistors have resistance values equivalent to the on-resistances of the PFET 110 and PFET 130.
Similarly, the pull-down of the pulse width, i.e. the decrease in the pulse width and thus, the increase in the duty cycle, is affected by the selective closing of switch 180. As shown in FIG. 1C, the duty cycle correction due to the closing of switch 180 is equivalent to the driving of the input signal away from a capacitance of the node Out′ through parallel resistors. The parallel resistors have resistance values equivalent to the on-resistances of the NFET 120 and NFET 140.
With the circuitry of FIG. 1A, if no duty cycle correction is required, as determined by the duty cycle detection unit 195, for example, then the switches 170 and 180 are open, i.e. the duty cycle control unit 190 does not assert control signals to the switches 170 and 180. In that case, assuming that the strengths of the first PFET 110 and the first NFET 120 are identical, the rise/fall time constant (Trise/fall) to charge the node Out′ to a voltage equal to e*VDD will be:Trise/fall˜CRP1,N1  (1)where C is the effective capacitance at node Out′ and RP1,N1 are the effective on-resistances of PFET 110 and NFET 120.
To decrease the pulse width, and thereby increase the duty cycle, the switch 170 is closed and, as a result the time constant for charging the node Out′ to a voltage equal to e*VDD is approximately the product of the effective capacitance at node Out′ and the parallel combination of resistances of NFET 120 and NFET 140:Trise˜C(RN1//RN2)  (2)
A first order approximation of the incremental duty cycle correction of the duty cycle correction circuit 100 may be found by subtracting equation 2 from equation 1:Correction˜C[RN1−(RN1//RN2)] orCorrection˜C[RN12/(RN1+RN2)]  (3)
For an increase in pulse width, the incremental correction is given byCorrection˜C[RP12/(RP1+RP2)]  (4)
In order to provide more granularity with regard to the correction performed using the mechanism of FIG. 1A, a series of pairs of FETs 130 and 140, as well as switches 170 and 180, may be provided that are individually controllable to provide various levels of duty cycle correction. FIG. 2A shows such a circuit arrangement in which a plurality of pairs of FETs 210-240 and switches 250-280 are provided in series. The switches 250-280 may be individually controlled by the duty cycle control unit 290 which has logic for determining a set of control signals for applying a desired duty cycle correction based on the measured duty cycle from the duty cycle detection unit 295 and a desired duty cycle, e.g., a 50% duty cycle.
FIGS. 2B and 2C illustrate the pull-up and pull-down behavior of the series of pairs of FETs 210-240 with regard to the duty cycle correction, similar to FIGS. 1B and 1C. As shown in FIGS. 2B and 2C, the affect is basically to add additional resistances in parallel between the capacitance of node Out′ and input signal source.
For a series of n duty cycle correction chains, i.e. pairs of correction FETs 210-240, as shown in FIG. 2A, equations 3 and 4 above may be modified to be the following:
                    Correction        =                              C            [                                          R                N1                2                            (                                                ∑                                      i                    ≠                    1                                                                                R                  Ni                                            )                        ]                    /                      [                                                                                (                                      R                    N1                                    )                                                                  (                                                            ∑                                              i                        ≠                        1                                                                                R                      Ni                                                        )                                            +                                                (                                      R                    N2                                    )                                                                  (                                                            ∑                                              i                        ≠                        2                                                                                R                      Ni                                                        )                                            +                              …                                                                                (                                      R                    Nn                                    )                                                                  (                                                            ∑                                              i                        ≠                        n                                                                                R                      Ni                                                        )                                                      ]                                              (        5        )                                Correction        =                              C            [                                          R                P1                2                            (                                                ∑                                      i                    ≠                    1                                                                                R                  Pi                                            )                        ]                    /                      [                                                                                (                                      R                    P1                                    )                                                                  (                                                            ∑                                              i                        ≠                        1                                                                                R                      Pi                                                        )                                            +                                                (                                      R                    P2                                    )                                                                  (                                                            ∑                                              i                        ≠                        2                                                                                R                      Pi                                                        )                                            +                              …                                                                                (                                      R                    Pn                                    )                                                                  (                                                            ∑                                              i                        ≠                        n                                                                                R                      Pi                                                        )                                                      ]                                              (        6        )            Again, it should be noted that the resistors RN/P are the on-resistances of the FETs in the pairs of FETs 210-240.
In the above arrangements, the resistance values of the FETs are strongly dependent upon process (i.e., manufacturing tolerance due to errors in the manufacturing process), voltage and temperature (PVT). The sensitivity to voltage and temperature is a result of various FET parameters that show strong dependence on voltage and temperature. The sensitivity to process is due to the many parameters that are involved in the formation of FETs, including doping parameters, gate oxide parameters, silicide parameters, and the like, which may all have errors tolerances associated with them.
The capacitance value C of the node Out′ is generally considered to have weak dependence on temperature and voltage, but has more dependence on process variations for similar reasons as set forth above with regard to the FETS. However, this dependence on process variation is still smaller than that of the FET on-resistances.
Referring again to equations 5 and 6 above, it is apparent that the variability due to PVT in the second term of these equations does not cancel out. This is because the numerator of the second term is squared while the denominator consists of linear sums. Thus, the duty cycle correction varies substantially with process, voltage and temperature in the circuitry arrangements illustrated above in FIGS. 1A and 2A.
While a duty cycle correction (DCC) circuit using the topology arrangement shown in FIG. 1A or FIG. 2A may display excellent granularity and linearity, it also displays very strong undesirable dependence on process and operating voltage conditions. For example, FIGS. 3A and 3B provide exemplary plots illustrating variances in duty cycle correction range, i.e. the maximum possible duty cycle correction possible with the circuit, due to changes in operating voltage and process for the DCC circuit topologies illustrated in FIGS. 1A and 2A. In the depicted examples, the duty cycle correction is provided in terms of pico seconds (ps) such that, for example, if an original pulse width is 100 ps, then the pulse may be expanded to 105 ps or reduced to 95 ps with a 5 ps duty cycle correction.
As shown in FIGS. 3A and 3B, between 0.8V and 1.2V operating voltage, there is approximately a 40% change in DCC correction range. Moreover, between a process parameter value (nrn) of 0.03 (i.e. a fastest manufacturing process) and a process parameter value (nrn) of 0.95 (slowest manufacturing process), there is approximately an 85% change in DCC correction range. Thus, there is a large variance in DCC correction range based on operating voltage and manufacturing process, which illustrates the dependence of DCC correction on the particular operating voltage and manufacturing process used with a particular circuit.

Duty cycle correction circuit whose operation is largely independent of operating voltage and process

International Business Machines Corporation


The new variety of nectarine tree named ‘Sunect30’ is characterized by early ripening, circular fruit with a sweet, subacid flavor. The fruit is very large-sized, with firm flesh that is adherent to the stone.

This application relates to the discovery and asexual propagation of a new and distinct variety of nectarine tree, Prunus persica var. nucipersica cv. 'Sunect30'. The new variety was first originated by hybridization and identified in September 2018 by Terry A. Bacon and Terrence J. Frett as breeder number 'NE2211W'. The new variety was first evaluated by Terry A. Bacon and Terrence J. Frett near Wasco, Calif. in Kern County.
The seed parent is 'NE1362W' (unpatented breeding selection) and the pollen parent is bulk pollen of seven unpatented breeding program selections: 'NE1463W', 'NE1563W', 'NE1568W', 'NE1574W', 'NE1599W', 'NE1642W' and 'NE1661W'. The parent varieties were first crossed in March 2015, the date of first sowing being March 2016 and the date of first flowering being March 2018. The new nectarine variety 'Sunect30' was first asexually propagated by Terry A. Bacon and Terrence J. Frett near Wasco, Kern County, Calif. in February 2019 by dormant grafting.
The new variety 'Sunect30' is characterized by early ripening, circular fruit with a sweet subacid flavor. The fruit is very large-sized, with firm white flesh that is adherent to the stone.
The new variety 'Sunect30' resembles its seed parent 'NE1362W' in that both have fruit with white flesh and showy flowers. However, the new variety 'Sunect30' is distinguished from its seed parent 'NE1362W' in that the fruit of the new variety ripens about 9 days later than that of 'NE1362W'. Further, flowering time for the new variety 'Sunect30' starts 12 days earlier than 'NE1362W', and the new variety 'Sunect30' has a smaller fruit size at 160 g compared to 230 g for 'NE1362W'.
The new variety 'Sunect30' can be distinguished from each of the seven unpatented nectarine varieties of the bulk pollen parent: 'NE1463W', 'NE1563W', 'NE1568W', 'NE1574W', 'NE1599W', 'NE1642W' and 'NE1661W'. The fruit of the new variety 'Sunect30' ripens later than the fruit of each of 'NE1463W', 'NE1563W', 'NE1568W', 'NE1574W', 'NE1642W' and 'NE1661W' and ripens earlier than 'NE1599W'. Further, the new variety 'Sunect30' has a fruit weight of 160 g, compared to a fruit weight of 120 g for 'NE1563W', a fruit weight of 132 g for 'NE1568W', a fruit weight of 140 g for 'NE1574', a fruit weight of 117 g for 'NE1642W', a fruit weight of 170 g for 'NE1463W', a fruit weight of 168 g for 'NE1599W'.
The new variety 'Sunect30' has a Brix:acid of 28 compared to a Brix:acid of 14 for 'NE1463W', 12 for 'NE1563W', 14 for 'NE1568W', 15 for 'NE1574W' 15 for 'NE1599W', 37 for 'NEW1642W', and 16 for 'NE1661W'. The new variety 'Sunect30' has a lower fruit acidity at 0.54 compared to 0.88 for 'NE1463W', 1.1 for 'NE1563W', 0.85 for 'NE1568W', 0.82 for 'NE1574W', 0.91 for 'NE1642W' and 0.87 for 'NE1642'.
Additionally, the flowers of the new variety 'Sunect30' are showy similar to the flowers of 'NE1643W', 'NE1568W' and 'NE1599W'. However, they differ from the non-showy flowers of 'NE1563W', 'NE1574W', 'NE1642W', and 'NE1661W'. Lastly, flowering time for the new variety 'Sunect30' starts later than the flowering time of 'NE1563W', 'NE1568', 'NE1574W' and earlier than 'NE1463W', 'NE1599W', 'NE1642W' and 'NE1661W'.
The new variety 'Sunect30' resembles 'Spring Bright' (U.S. Plant Pat. No. 7,507), 'Sunectwentyone' (U.S. Plant Pat. No. 18,114), and 'Zee Fire' (U.S. Plant Pat. No. 13,501) in that the fruit of all four varieties ripens in the early season. However, the fruit of the new variety 'Sunect30' has white flesh compared to yellow flesh for the fruit of 'Spring Bright', 'Sunectwentyone' and 'Zee Fire'. The new variety 'Sunect30' resembles that of Candy Pearl (U.S. Plant Pat. No. 14,249) in that the fruit of both varieties has white flesh and both varieties have showy flowers, but the new variety 'Sunect30' blooms 22 days earlier than 'Candy Pearl' and the fruit ripens 33 days earlier than that of 'Candy Pearl'.
The new variety 'Sunect30' has been shown to maintain its distinguishing characteristics through successive asexual propagations by, for example, cuttings and grafting.


Double cemented carbide composites comprise a plurality of first regions and a second ductile phase that separate the first regions from each other. Each first region comprises a composite of grains and a first ductile phase bonding the grains. The grains are selected from the group of carbides consisting of W, Ti, Mo, Nb, V, Hf, Ta, and Cr carbides. The first ductile phase is selected from the group consisting of Co, Ni, Fe, alloys thereof, and alloys with materials selected from the group consisting of C, B, Cr, Si, and Mn. A preferred first region comprises tungsten carbide grains that are cemented with a cobalt first binder phase and which are in the form of substantially spherical pellets. The second ductile phase is selected from the group consisting of Co, Ni, Fe, W, Mo, Ti, Ta, V, Nb, alloys thereof, and alloys with materials selected from the group consisting of C, B, Cr, and Mn. A preferred second ductile phase is cobalt. Additionally, additives such as those selected from the group consisting of carbides, nitrides, and borides can be added to the second ductile phase to provide improved properties of wear resistance. The composites are prepared by combining hard phase particles formed from the grains and first ductile phase, with the second ductile phase material under conditions of pressure and heat, and have improved properties of fracture toughness and equal or better wear resistance when compared to conventional cemented tungsten carbide materials.

Cemented tungsten carbide, such as WC--Co is well known for its mechanical properties of hardness, toughness and wear resistance, making it a popular material of choice for use in such industrial applications as mining and drilling where its mechanical properties are highly desired. Because of its desired properties, cemented tungsten carbide has been the dominant material used as cutting tools for machining, hard facing, wear inserts, and cutting inserts in rotary cone rock bits, and substrate bodies for drag bit shear cutters. The mechanical properties associated with cemented tungsten carbide and other cermets, especially the unique combination of hardness toughness and wear resistance, make these materials more desirable than either metals or ceramics alone.
For conventional cemented tungsten carbide, fracture toughness is inversely proportional to hardness, and wear resistance is proportional to hardness. Although the fracture toughness of cemented tungsten carbide has been somewhat improved over the years, it is still a limiting factor in demanding industrial applications such as high penetration drilling, where cemented tungsten carbide inserts often exhibit gross brittle fracture that leads to catastrophic failure. Traditional metallurgical methods for enhancing fracture toughness, such as grain size refinement, cobalt content optimization, and strengthening agents, have been substantially exhausted with respect to conventional cemented tungsten carbide. The mechanical properties of commercial grade cemented tungsten carbide can be varied within a particular envelope by adjusting cobalt metal content and grain sizes. For example, the Rockwell A hardness of cemented tungsten carbide can be varied from about 85 to 94, and the fracture toughness can be varied from about 8 to 19 ksi.in.sup.-1/2. Applications of cemented tungsten carbide are limited to this envelope.
Another class of materials for cutting and wear applications is tool steel. In general, the wear resistance of steels, including tool steel, is much lower than that of cemented tungsten carbide. U.S. Pat. No. 5,290,507 describes a material that is formed by incorporating a certain percentage of cemented tungsten carbide granules into a matrix of tool steel binder to increase the wear resistance of the tool steel. Such tool steel/cemented tungsten carbide composite materials belong to the category of metal matrix composites, where the brittle phase, i.e., cemented tungsten carbide granules, is the minority phase.
A problem known to exist with tool steel/cemented tungsten carbide composites is that iron (Fe) present in the tool steel binder tends to react with the cemented tungsten carbide to form Fe.sub.3 C, which can be detrimental to the ductility and toughness of the composite. For this reason, such tool steel/cemented tungsten carbide composites are not desired for use in applications, such as those discussed above, where improved toughness is needed. Additionally, the limited ductility of the tool steel that is used to form the cemented tungsten carbide composite also acts to limit the overall toughness of the composite, thereby limiting its use.
It is, therefore, desirable that a cemented tungsten carbide composite be developed that has improved properties of fracture toughness when compared to conventional cemented tungsten carbide materials. It is desirable that such cemented tungsten carbide composite have such improved fracture toughness without sacrificing wear resistance, i.e., having equal or better wear resistance than that of conventional cemented tungsten carbide materials. It is desired that such cemented tungsten carbide composites be adapted for use in such applications as roller cone bits, percussion or hammer bits and drag bits, and other applications such as mining and construction tools where properties of improved fracture toughness is desired.


According to one embodiment, a surgical system includes an imaging system, a determination unit, and a control unit. The imaging system is configured to acquire image information. The determination unit is configured to determine, based on the image information, whether an abnormal state has occurred in the surgical system. The control unit is configured to switch to an abnormality time control mode of executing abnormality-handling processing, when the determination unit determines that an abnormal state has occurred.

1. Field of the Invention
The present invention relates to a surgical system such as a medical manipulator system.
2. Description of the Related Art
Recently, there have been proposed various types of techniques associated with medical treatments using robots. In the field of surgery, in particular, various types of medical manipulator systems have been proposed, which treat patients by using multi-degree-of-freedom manipulators having multi-degree-of-freedom arms.
For example, Japanese Patent No. 3717552 discloses a medical manipulator system excellent in safety and operability, which can quickly handle operation errors in a plurality of medical manipulators in surgeries using the manipulators.
More specifically, in the medical manipulator system disclosed in Japanese Patent No. 3717552, when an infrared sensor detects a predetermined amount of infrared light, a sensor processing circuit recognizes it, and the operation of a slave manipulator for treatment is stopped.
If, for example, the sensor processing circuit determines that the detection data value from the infrared sensor is equal to or more than a preset threshold, the sensor processing circuit sends a stop instruction to a servo processing circuit which actually controls the slave manipulator for treatment, thereby stopping the operation of the slave manipulator for treatment. This can prevent the distal end of the treatment tool from unintentionally coming into contact with an organ.


Known network-units like Base Stations or Node B's receive signals including first packet fields which are directly analyzable (layer 2) and second packet fields which are not analyzable (layer 3) until they have been processed (defragmentation, decompression, demultiplexing, routing table consultation). To deal with these signals, the network-units analyze first information originating from the first fields, process second information originating from the second fields and analyze the processed second information. In case this processed second information indicates that the signal is destined for a next network-unit, possibly after a further processing, the signal is sent to the next network-unit. Although the first field is a non-address field (quality field), by introducing a kind of routing info into the first information, and making the processing of the second information dependent upon an analysis of the first (now kind of routing) information, the network-unit becomes more efficient by avoiding unnecessary processing.

The invention relates to a network-unit for use in a telecommunication network and comprising                at least one input for receiving a signal comprising a first field which is directly analysable and a second field which is analysable after a processing,        a first analyser coupled to said at least one input for analysing first information originating from said first field,        a processor for performing said processing of second information originating from said second field, and        a second analyser coupled to said processor for analysing processed second information,        at least one output for sending a further signal to a further network-unit and comprising a third field which is directly analysable and a fourth field which is analysable after a processing in said further network-unit
Such a network-unit is known in the form of a Base Station or Node B in a mobile telecommunication network. The first field is for example a so-called layer 2 header which can be analysed directly. The second field is for example a so-called layer 3 header which cannot be analysed until some processing has taken place (like for example defragmentation, decompression, demultiplexing and/or routing table consultation). To deal with this kind of signals, the network-unit analyses the first information originating from the first field, then processes the second information originating from the second field, and then analyses the processed second information. In case this processed second information (for example comprising routing information) indicates that the signal is destined for a next network-unit, possibly after further processing (like for example multiplexing and/or compression and/or fragmentation), the signal is sent to the next network-unit.
Such a network-unit is disadvantageous, inter alia, due to sometimes unnecessarily performing said processing.

Network-unit, and telecommunication network, and method


In an element forming region isolated from other regions by a field oxide, one select transistor and a plurality of MOS transistors are connected in series so that a source/drain diffusion region is commonly owned by two neighboring transistors. The gate electrodes of the MOS transistors are connected to the lower electrodes of ferroelectric capacitors, respectively. The gate electrode of the select transistor, and the lower electrodes and upper electrodes of the ferroelectric capacitors are led out as word lines. A metal wiring which serves as a bit line is connected to a drain diffusion region.

This invention relates to a nonvolatile semiconductor storage device such as an EEPROM (Electrically Erasable and Programmable ROM), and more particularly to a device for storing information using a residual dielectric polarization of a ferroelectric substance.
As a conventional nonvolatile semiconductor storage device of this kind, known are devices such as shown in FIGS. 5 and 6.
The nonvolatile semiconductor storage device shown in FIG. 5 comprises memory cells each of which consists of one memory transistor MTr and two select transistors STr1 and STr2. The memory transistor MTr is a field-effect transistor having a gate structure in which a metal film, a ferroelectric substance film and a semiconductor film are laminated from the top in this sequence.
Hereinafter, the operations of writing, erasing and reading data for a memory cell C1 will be briefly described.
When a data is to be written into the cell, word lines WL1.sub.1 and WL1.sub.2 are grounded and a positive voltage (e.g., 5 V) is applied to a word line WL1.sub.3. Under this state, a positive high voltage (e.g., 10 V) is applied to a bit line BL1, so that the ferroelectric substance film of the memory transistor MTr is affected by an electric field through the select transistor STr2 of the memory cell C1, whereby the ferroelectric substance film is polarized. This causes the memory transistor MTr which is an N-channel transistor, to become a nonconductive state. This state is defined as the write state in which data "1" is written in the memory cell.
When the written data is to be erased, the word lines WL1.sub.1 and WL1.sub.3 and the bit line BL1 are grounded and a positive high voltage is applied to the word line WL1.sub.2. This causes the ferroelectric substance film of the memory transistor MTr of the memory cell C1 to be affected by an electric field which is opposite in direction to that in the writing process, so that the ferroelectric substance film is polarized to the reverse polarity. As a result, the N-channel memory transistor MTr becomes a conductive state (namely, the state in which data "0" is stored).
When a data is to be read, a positive voltage is applied to the word lines WL1.sub.1 and WL1.sub.3 and the word line WL1.sub.2 is grounded. A sense amplifier SA connected to the bit line BL1 detects the flow of a current. When no current flow is detected, it means the reading of data "1", and, when a current flow is detected, it means the reading of data "0".
In contrast, the nonvolatile semiconductor storage device shown in FIG. 6 comprises memory cells each of which consists of one select transistor STr and one ferroelectric capacitor FC.
The process of writing a data into a memory cell C1 is performed by applying a positive voltage to a word line WL1 and a positive high voltage to a bit line BL1, thereby making the ferroelectric capacitor FC a certain polarization state.
The data erasing process is performed by applying a positive voltage to the word line WL1 and a negative high voltage to the bit line BL1, thereby polarizing the ferroelectric capacitor FC to the reverse polarity.
In the data reading process, a positive voltage is applied to the word line WL1 and a positive voltage is applied to the bit line BL1, and the contents of the written data, i.e., "1" or "0" is judged depending on the level of a current detected by a sense amplifier SA which is connected to the bit line BL1.
The thus configured prior art examples have the following problems.
The nonvolatile semiconductor storage device shown in FIG. 5 has a problem in that the configuration where one memory cell consists of one memory transistor and two select transistors causes the cell size to become large, and therefore this configuration is not adequate for a high integration.
The nonvolatile semiconductor storage device shown in FIG. 6 has a configuration which may be subjected to an integration of a certain degree. In such a storage device, however, a so-called destructive readout in which the polarization state of the ferroelectric capacitor is changed by a current flowing into the capacitor during the data reading process is conducted, so that the refresh operation is required to be performed for retaining the written data. As a result, there arises a problem in that the periphery circuitry has a complex configuration.

Nonvolatile semiconductor storage device with ferroelectric capacitors


An apparatus and method are disclosed for attaching a deck to a building. The apparatus and method disclose a deck bracket with an L shaped bracket, a solid bar, preferably threaded at both ends, and a sheath which would surround a support member of the building. The solid bar could be of various lengths, depending upon the structure to which it will be attached. The L shaped bracket has a support piece fixedly attached to the back side of its long, vertical side, and has a threaded bore through the support piece and L shaped bracket, with which to accept one of the threaded ends of the solid bar. The short, horizontal side of the L shaped bracket would hold one or more of the deck rim joists or deck supporting beams. The solid bar would thus extend into holes drilled into a various support members of the house or like structure, around one of those support members would be the sheath, thus allowing a portion of the load of the deck to be transferred to the building structure, and also allowing for a space to exist between the deck and the building so as to prevent the accumulation of moisture and thereby preventing the decay of either the building or deck structures at the point of attachment.

The most significant concerns in attaching a deck to a building are the use of improper or inadequate fasteners and that there is a risk that moisture may be trapped and accumulate at the point of attachment, thus creating conditions for decay and weakening of the materials at the point of attachment.
Improperly fastening the deck to the building can cause the deck to become unattached, thereby creating a danger for those persons on or around the deck. Some deck and balcony ledgers are only nailed to the house band joist, and this approach may not be adequate depending upon the span of the deck joists. As people gather on a deck, their weight and movement translate not just into a downward force but also into an outward force that acts as a lever prying the deck away from the house. Nails work well to resist the downward force but are inadequate for the outward force. Held in place only by the friction of bent wood fibers, nails tend to loosen when wood alternately shrinks and swells with changes in moisture content and temperature. Once nails loosen, they offer even less resistance to the prying forces of a crowd of people standing on the deck floor.
A screwed-in connector behaves differently. It gains increased frictional strength from the wedging action of wood fibers along the entire length of the shaft. A lag bolt, which looks like a giant screw, has as much as nine times the pullout resistance of a nail for every inch of penetration. Better still is the metal-to-metal connection of a true bolt, inserted in a drilled hole and fitted with a nut on the other side. Placing a washer on both sides spreads the pulling force over a larger portion of the beam. Both of these connectors offer an extra benefit over nails in that they don't suddenly pull out as wood shrinks and swells. But they may loosen over time, requiring periodic inspection and maintenance.
Also, if proper flashing is not installed, the wall sheathing and band joist can rot, destroying the original capacity of the nail connection. This could set up a situation where wood members of both the structure and deck are susceptible to rot. Accordingly, a number of prior art systems and methods have been developed to minimize the probability of trapping moisture at the point of attachment of a deck to a structure.
A common method of attaching a deck to a building is by installing roll flashing to the exterior of the structure. In new construction, the roll flashing is likely attached prior to the siding being attached. However, where a deck is to be attached to an existing structure, with attached siding, the siding should first be removed to expose the sheathing. After the roll flashing is attached, then a rim joist is attached over the roll flashing to the structure, preferably using lag bolts. The lag bolts will penetrate through the rim joist, flashing and sheathing and into a rim joist of the structure. Next, a window flashing is attached to the top of the attached rim joist to direct any moisture over the rim joist and away from the structure. Siding is then attached on top of the window flashing to complete the installation.
Although this is a common form of deck installation that has been used for many years, it is not without problems. Water can drip along or condense on the lag bolts, following the lag bolts to the inside of the house. This is especially problematic in climates that experience severe temperature swings between the summer and winter months. During the winter months, water can find its way behind the siding and alternatively thaw and freeze in response to temperature fluctuations, thus weakening the joint between the deck and the building.
In a typical home construction scenario, the house is built and sided before a deck or other accessory devices are attached to the house. Thus, in order to properly attach a deck to the house using methods described in prior art, the siding contractor will either need to leave part of the house without siding to allow the deck to be fastened thereto or already attached siding must be removed in order to properly attach the deck to the house. Both installation types add complexity and coordination problems to a construction project.
A number of prior patents disclose alternative methods of attaching a deck to a house. In U.S. Pat. No. 6,397,552 to Bourque, a deck attachment bracket and method of attaching a deck to a building is disclosed by use of an attachment bracket being mounted to the concrete foundation of an existing structure, preferably having a space between the structure and the deck. While Bourque's bracket and method may solve the problem of deteriorating and rotting wood joists, water may still find its way along the bolts into the concrete, allowing for its expansion and contraction in freezing and thawing weather, thereby weakening the hold of the bolts to the concrete. Thus, additional modification must be performed, such as caulking or otherwise sealing around the bolt holes, to prevent water from infiltrating the bolt holes.
In U.S. Pat. No. 6,311,449 to Morse, et al. discloses an "L" shaped bracket, the longer leg through which bolts are used to attach the bracket to the band board and joist of the house, the shorter leg through which bolts are used to attach to the band board of the house and ledger boards of the deck. As can be appreciated, this bracket and method does not solve the problem of water deteriorating the wood, thereby weakening the place of attachment.
Another example, U.S. Pat. No. 4,811,542 to Jewell discloses a deck bracket, which includes a wide flange and a narrow flange spaced apart from each other by a web. The deck bracket is then joined to the building, preferably by screws and the deck bolted to the deck bracket. The deck is thus spaced away from the building to reduce moisture accumulation. Jewell's method of construction however, includes placing the deck bracket adjacent to sheathing, caulking it and then protecting the area with siding, thus covering it. While the Jewell bracket does separate the deck structure from a building structure and thus reduces the possibility that moisture will be trapped between the two structures, it still requires siding modifications and caulking to prevent moisture draining down the siding of the structure thus accumulating and penetrating through the screw holes attaching the bracket to the structure.
Further, U.S. Pat. No. 5,201,156 to Newman also discloses a mounting bracket, which spaces a deck or the like away from the siding of a house or other like structure in order to prevent the accumulation of water at the joint. However, like the Bourque and Jewell brackets, Newman's bracket requires modifications to the exterior of a structure and/or caulking or the like in order to effectively waterproof the joint between the bracket and the house structure.
What is needed, therefore, is a deck attachment bracket and method that eliminates the joint between a deck and/or deck bracket and the exterior of a house or other structure, thereby eliminating any possibility that moisture could penetrate into the wooden house or other structure. What is further needed is an attaching means that will diminish or eliminate the reliance of the structural integrity solely upon the wooden members of the deck or attached structure. Preferably, such a bracket and attachment method should be adjustable to allow a single bracket design to be compatible with a variety of deck configurations and orientations.

Deck bracket and method of attaching a deck to a building


A method of increasing the terminal coupling loss in a digital half-duplex handsfree terminal is provided. When the terminal receive channel is active an idle code which is effectively zero is transmitted by an idle code generator. When the terminal transmit channel is active a normal speech signal is transmitted. To determine which channel is active, a receive speech signal level is measured at the receive channel input, and a "virtual" transmit speech signal is computed from a signal in the transmit channel before the idle code generator.

Echo returned to a user of a telephone causes the user to hear his or her own voice when speaking on the telephone. In high delay connections, such as those found in satellite or digital cellular applications for example, this echo can make conversation very difficult. To avoid this, it is necessary to ensure that digital telephone terminals provide a significant amount of inherent echo suppression. The amount of echo suppression in decibels that a telephone set provides is referred to as the "terminal coupling loss", or TCL.
As an example, GSM 03.50, an existing specification for digital cellular systems requires a minimum TCL of 46 dB to eliminate the effects of echo. Typically, handset terminals meet this requirement. However, because of the higher electronic gain needed to obtain comfortable listening levels, conventional handsfree terminals fall well short of this requirement. For two-wire analog handsfree terminals, this is normally not a problem because the PSTN (public switched telephone network) provides echo-suppression for long-delay connections. However, in all digital networks, echo suppression is not provided, and hence the task of providing the 46 dB of TCL falls to the telephone terminal itself. The problem is more severe in handsfree digital terminals verses handset terminals because a more significant acoustic echo path exists between the speaker and microphone. In addition, delays are larger in all digital networks and particularly in digital wireless networks. Four-wire analog terminals may also fail to provide sufficient TCL.

System and method for providing high terminal coupling loss in a handsfree terminal


A fuser for an image-forming apparatus includes a fusing roller which is replaceable in a cartridge. The fusing roller cartridge includes a cover for covering an access opening providing access to the fusing roller. The cover is openable, either directly by an operator to a latched condition, by the apparatus in response to insertion of the cartridge, by the operator before insertion but held in an uncovering position by the receiving apparatus or by suitable mechanism in the apparatus after insertion of the cartridge. Preferably, the cover closes early in the removal motion so that the fingers of the removing operator cannot touch a hot fusing roller. A metallic heat shield between the fusing roller and the cartridge housing helps prevent the housing from becoming too hot to touch.

One of the most expensive single items that is commonly replaced in copiers and printers is a fusing roller. It is a costly item which wears out rapidly and is generally replaced by a serviceman who must connect the roller to a suitable drive, locate temperature sensors and a fusing oil applicator in contact with it without damaging its surface. Any irregularities from handling that appear in the surface of the fusing roller are likely to show up as image artifacts in the fixed image.
Japanese Patent Application 63-107319 (1988), laid-open Nov. 7, 1989 (1-277271), shows a fuser in which a large portion of the entire fuser is replaceable in a single unit. This has the advantage of protecting the parts in the fuser when the unit is outside of the apparatus, but the disadvantage of replacing the more durable pressure roller assembly with the fusing roller.
A serviceman will often replace a fusing roller as part of a service call in which he operates the apparatus to check its performance. Replacement of the fusing roller requires that he wait until the roller cools down, wasting valuable service time.

Toner image fuser and cartridge for image-forming apparatus


A recording apparatus includes a carriage that is movable in a reciprocating manner with a recording head being mounted on the carriage, a tube that is capable of supplying ink to the recording head in a curved state and is capable of being deformed in curvature in response to a reciprocating motion of the carriage, an arm that is swingably movable about a swing shaft which extends in a direction perpendicular to a plane formed by the curved tube and is capable of supporting the tube, and a connecting section that has a holding section which holds the tube and is configured to support the tube by the arm, wherein the connecting section is movable relative to the arm in response to the reciprocating motion of the carriage.

1. Technical Field
The present invention relates to a recording apparatus which includes an ink supply tube whose curvature can be deformed in response to a reciprocating motion of a carriage.
2. Related Art
A recording apparatus which includes an ink supply tube whose curvature can be deformed in response to a reciprocating motion of a carriage has been disclosed. In such a recording apparatus, the curvature of the ink supply tube is discontinuously deformed in response to the reciprocating motion of the carriage, which leads to a large curvature change. This may have an effect, for example, that the carriage is subject to vibration, or an excessive load is applied to the carriage. Accordingly, various techniques to suppress the effect on the carriage due to the deformation in curvature of the ink supply tube are disclosed.
For example, JP-A-2007-144776 discloses a recording apparatus which includes an arm having a regulating section that regulates the movement of the ink supply tube in the vertical direction and a regulating section that regulates the movement of the ink supply tube in the horizontal direction. The arm is swingably movable about a pivot shaft.
Further, JP-A-2007-136785 discloses a recording apparatus in which an ink supply tube is supported by a magnetic material member and the position of the ink supply tube is regulated by the magnetic material member. Magnets are arranged on the main body of the recording apparatus and, as the carriage moves, the magnets sequentially attract the magnetic material member.
In the recording apparatus disclosed in JP-A-2007-144776, the regulating sections are integrally formed with the arm. That is, the regulating sections are fixed to the distal end of the swingably movable arm. Further, the ink supply tube is nipped between the regulating sections. Accordingly, a portion of the ink supply tube which is nipped by the regulating sections is supported by the arm at the distal end of the arm in the nipped state. When the ink supply tube is deformed in curvature in response to the reciprocating motion of the carriage, the arm swings about the pivot shaft while supporting the ink supply tube. In so doing, as the ink supply tube is deformed in curvature, an excessive force may be applied to the portion of the ink supply tube which is nipped by the regulating sections, since the regulating sections are fixed to the arm. As a result, the ink supply tube cannot be smoothly deformed in curvature, which may cause a reaction force to disturb a behavior of the carriage. Further, when the arm swings, an excessive force is repeatedly applied to the same position or the same area of the ink supply tube. This may lead to abrasion or deterioration of the nipped portion of the ink supply tube.
In the recording apparatus disclosed in JP-A-2007-136785, when the magnets and the magnetic material member have weak magnetic force, the magnets may fail to attract the magnetic material member. On the other hand, when the magnets and the magnetic material member have strong magnetic force, an excessive load may be applied to the carriage. Accordingly, in the recording apparatus which includes the ink supply tube whose curvature can be deformed in response to a reciprocating motion of the carriage, it has been difficult to suppress the effect on the carriage due to the deformation in curvature of the ink supply tube.


In a sensing instrument using a quartz sensor on whose front surface an adsorption layer for adsorbing a substance to be sensed is formed and which changes in natural frequency by the adsorption of the substance to be sensed, the present invention has an object to quickly detect a trouble of the quartz sensor to prevent an operator from recognizing an incorrect measurement result. In the present invention, a level detecting circuit detecting a signal level of an oscillation output of an oscillator circuit is provided, and after the time for stabilization passes after the power-on time, a computer takes a level detection value therein to compare the signal level and a threshold value. Then, when the signal level is lower than the threshold value, the signal level is determined as abnormal and, for example, the abnormality notification is displayed on a display unit, whereby an operator is notified of the occurrence of the abnormality.

As a method for sensing a trace substance, a sensing instrument using a quartz resonator has been known. This sensing instrument has a quartz sensor in which an adsorption layer for adsorbing a substance to be sensed is formed on a front surface of the quartz resonator, and measures the presence/absence or concentration of the substance to be sensed by utilizing the fact that when the substance to be sensed is adsorbed by the quartz resonator, more particularly, the adsorption layer, its natural frequency changes according to an adsorption amount of the substance to be sensed, and this sensing instrument is advantageous in that it is applicable to a wide range and has a simple structure as an instrument, and moreover, is capable of measuring even an extremely minute amount of substance because of its high sensitivity. For example, a patent document 1 describes that the use of a quartz sensor in the analysis of a disease marker substance contained in blood, urine, and the like is an effective method alternative to an immuno-latex kit which requires an expensive, large autoanalyzer.
The present inventor has been studying the possibility of applying a quartz sensor to, for example, dioxin and PCB which are environmental pollutants, a disease marker in blood, or the like, and this method, if achieving high-precision measurement of a target substance, would be innovative. The reason is because a method using a gas-chromatography mass spectrometer and an ELISA method (enzyme-linked immunosorbent assay method), which are currently known as methods of measuring, for example, dioxin, have the following problems. The former requires an extremely high instrument cost and thus a considerably high analysis cost and takes a long period of time for analysis, and the latter is low in analysis precision, though requiring less instrument cost and analysis cost and taking a shorter period of time for analysis compared with the gas-chromatography mass spectrometer.
A major part of a sensing instrument using a quartz resonator is structured such that an adsorption layer for adsorbing a substance to be sensed, which has, for example, an antibody causing an antibody-antigen reaction, is formed on the quartz resonator, an oscillator circuit is connected to the quartz resonator, and a frequency measuring unit measuring an oscillation frequency of the oscillator circuit is provided
When a CI value (crystal impedance value) of the quartz resonator is close to a negative resistance value of the oscillator circuit, signal level (amplitude) of an oscillation output becomes unstable. Further, due to some trouble, the signal level of the oscillation output sometimes becomes considerably lower than a design value. Further, the signal level sometimes becomes lower than the design value also when viscosity of a sample solution in contact with the quartz sensor is higher than a usage range. If such things happen, a correspondence relation between the concentration of a substance to be sensed in a sample solution or the like and a variation in frequency does not hold, leading to a failure in high-precision measurement of the concentration of the substance to be sensed.
However, once the measurement result is displayed, an operator recognizes the measurement result as correct, which might cause some problem. For example, if the determination result is "equal to lower than tolerable concentration" even though a toxic substance whose concentration is over a tolerable range is contained in a river, or if the determination result is "present" even though a cancer marker is not present in blood, the incorrect recognition causes a crucial situation. Since the quartz sensor is capable of measuring a substance to be sensed with extremely high precision, erroneous signal processing greatly affects subsequent operations, and therefore, if some circumstance not allowing the correct signal processing occurs, it is important to make the operator recognize this.
Patent Document 1
Japanese Patent Application Laid-open No. 2001-83154: paragraphs 0002, 0004