text:
|Publication number
|Publication type
|Application number
|PCT number
|Publication date
|Jun 30, 2009
|Filing date
|Aug 4, 2006
|Priority date
|Aug 15, 2005
|Fee status
|Also published as
|Publication number
|Sipke Wadman
|Original Assignee
|Koninklijke Philips Electronics N.V.
|Export Citation
|BiBTeX, EndNote, RefMan
|Patent Citations (20), Non-Patent Citations (1), Referenced by (6), Classifications (13), Legal Events (2)
|External Links: USPTO, USPTO Assignment, Espacenet
This application claims the benefit of International Application Number PCT/IB2006/052702, filed Aug. 4, 2006, and U.S. Provisional Application Ser. No. 60/708,321 filed Aug. 15, 2005 which are incorporated herein whole by reference.
The present disclosure relates generally to an apparatus for characterizing optical properties of materials. More specifically, the present disclosure provides a dual beam parousiameter for performing optical measurements of materials.
In the current global economy, manufacturing of a product rarely occurs at one manufacturing plant. Components are fabricated at various plants around the world and shipped to a final fabrication site where all the components are incorporated into the final product. This global manufacturing supply chain has a host of benefits, most notably cost reduction, which can be passed on to the consumer. However, drawbacks exist in such a distributed manufacturing process.
One problem encountered, when product components are fabricated in distributed locations, is a consistency in the optical properties of a product housing (e.g., color, gloss, texture, etc.). Corporations spend millions on market research to create products that appeal to the consumer and are easily differentiated from competing products (i.e., brand recognition), whether by having a Nike 'Swoosh' on a shoe or t-shirt, or the distinctive case design of the Apple iMac line of computers. Unfortunately, a brand's appeal can suffer from manufacturing that appears inconsistent.
As an example, consider the manufacture of a television set; the internal circuitry may be fabricated in Taiwan, the CRT in South Korea, the front housing in Malaysia and the rear housing in the Philippines. Often it is quite difficult to manufacture the front and rear housings with the same optical properties, even when the same materials and dyes are used. The equipment calibration errors, mechanical wear, as well as a host of other factors contribute to the inconsistencies. The end result is a television set in which the front housing has a different appearance than the rear housing. Such non-uniformity of color, gloss, texture, etc. are readily noticed by consumer and the impression given is one of low quality.
Many surfaces of industrial products have a physical structure with certain properties as to enhance the functionality of the product or to improve its appearance. A few typical examples are the extremely smooth surfaces of high quality optical components, wear-resistant layers on cutting tools, the surface of paints, the finely textured plastic parts of surfaces of cosmetics packages and decorative personal care products, the pressing of rolling textures produced in sheet metal, and the high gloss metallic-looking lacquers for the automotive industry.
These and many other products are said to have a surface texture. Texture is recognized as the property that determines the human interface, in other words generally how a product feels and looks. The "looks-part" of the texture is called the optical appearance. The optical appearance is a result of what the surface does with light incident on the surface from the environment. Incident light comes from many directions in many cases and it can be reflected, transmitted, re-emitted, absorbed, colored, diffused and scattered by surface roughness or structures or by the presence of small particles.
The assessment of textures for optical appearance is usually made in one or more of three methods: visual comparison, gloss and color measurement, and mechanical surface geometry measurement.
Visual assessments are made by visually comparing a product surface to certain standard textured surfaces by trained personnel. Visual appearance is governed by the geometrical outline of the surface and the optical properties of the material itself. Visual texture assessment of e.g. scratches is very difficult with light-colored surfaces, because there the texture influence is overwhelmed by the strong reflection. White, moderately rough or fine surfaces do not look very different to the eye.
A gloss meter is a simple device that projects a light beam on the surface and measures the intensity ratio of the specular reflected beam and the diffused light in a halo around the specular reflection. This is done under fixed angles of incidence, often 30 or 60 degrees.
Mechanical micro-geometrical measurements with contact probes (surface-tests) generate 1-D, 2-D or 3-D maps of the surface. By mathematical evaluation many statistical variants can be obtained by this method, like the well-known roughness measure Ra, average slope or peak counts. The method tries to find a relation between the optical appearance of the surface and its geometry.
The latter two methods attempt to define certain figures of merit, derived statistically from observational data that have a relation to the optical appearance.
In general terms, the limitations of these methods originate from the indirectness of the measured parameters. As an example, condensed statistical data derived from a surface measurement comprises a few merit figures that describe the geometrical shape of the surface texture quite well. The proposition is that there exists a relation between the geometrical data and how the surface looks to the eye. The subjective and personal factor makes this relation erratic and irreproducible.
As a second problem, there is the limitation of incomplete data fields. A gloss meter measures optical properties, but does so in a very limited way: only one incidence angle and two (direct and forward scattered) directions of reflection. This does not address the wealth of variability of surfaces, angles of incidence effects, azimuthal effects, and hemispherically strayed light. The optical appearance of a product is determined by the sum of all reflected light (or re-emitted by translucent materials) in the entire hemisphere, originating from incident light from the entire hemispherical environment.
The optical appearance of a textured surface (all surfaces have a texture, natural or purposely added) is formed by light reflected off this surface and entering the eye. Assuming a parallel light beam illuminating a moderately rough surface such as an automobile dashboard, part of the light reflects specularly in a certain direction, but a part also diffuses in other directions. Such a surface is said to be not perfectly diffuse. As seen in
Any light diffused in other directions than captured by the eye is lost to the eye altogether. The same is true for the usual form of gloss meters. If a light beam is aimed at a surface, it is necessary to measure the light diffused in all directions in the upper hemisphere, not integrated but with directional resolution, to fully describe the optical behavior. To be complete, this should be done for incident light from any direction within the entire hemisphere, i.e. under all vertical (ascension) and horizontal (azimuth) angles. The full image of the directions and intensities of the diffused radiation can be obtained by measuring this hemispherical intensity distribution for multiple combinations of incident height and azimuth. The usual method for such measurements is to scan the entire hemisphere with a scatterometer with a moving detector as known from, inter alia, the German patent application no. 33 12 948. A complete measurement takes many hours in practice.
A parousiameter as disclosed in U.S. Pat. No. 6,577,397, issued to the present inventor on Jun. 10, 2003 and herein incorporated by reference, illuminates a surface in an optically controlled fashion and measures the reflections in a full hemisphere. Brightness changes and various flop effects—color or brightness shifts which occur as a viewer changes viewing angle—are exposed under various illuminations, as well as any other optical anisotropies. Software then converts these measurements into merit factors adapted to specific quality control parameters. Using a parousiameter with pre-taught characterizations, a full measurement can be performed in as little as 15 seconds.
As shown in
The light source used in a parousiameter, typically a halogen incandescent bulb, experience intensity drifts over time even when supplied by a well stabilized DC voltage source, frequently resulting in variations of a few percent. This instability is a problem for other types of optical measurement equipment, as well. The standard methodology for compensating for the light intensity variations is to bracket a series of sample measurements with a blank measurement before and a second after the sample measurements. These blank measurements are used as calibration measurements to track the intensity variation from the initiation of the sample measurements until the completion of the last sample measurement in the series. However, the elapsed time between the first blank measurement and the second blank measurement may be in excess of an hour.
An object of the present disclosure is to provide lamp measurements simultaneously with the sample measurement in each image, thus each image contains its own calibration reference for the light source output.
The present disclosure accomplishes the above-mentioned objective by providing two radiation beams, an illumination beam and a calibration beam, from a radiation source. The illumination beam is guided towards a sample surface, whereupon the illumination beam illuminates the sample surface. Illumination of the sample surface results in radiation being scattered by the sample surface. This scattered radiation, in turn, impacts a projection screen, which is imaged by an imaging device, e.g., digital camera, digital video camera, etc. A wide angle, fisheye lens, or convex mirror is used to allow the imaging device to image a maximum projection screen surface.
The calibration beam is directed to the imaging device, such that the projection screen image data and the calibration beam data are simultaneously imaged by the imaging device.
The apparatus for characterizing the optical appearance of a sample surface includes a housing formed by a hemispherical dome and a base. The hemispherical dome has a first aperture formed at an apex, a second aperture formed at a position offset from the apex, and a third aperture formed at a bottom position of the hemispherical dome and perpendicular to the apex, and at least a portion of the inside surface of the hemispherical dome is configured as a projection screen.
The base is configured and positioned to support the hemispherical dome, such that the base and dome form an enclosed hemispherical volume. An opening is formed on the base and positioned opposite the first aperture. The sample surface is positioned against the outside surface of the base so that at least a portion of the sample surface is visible through the first aperture and the opening. A secondary mirror is disposed on an inside surface of the base and positioned vertically opposite the second aperture and horizontally opposite the third aperture.
An optical imaging device, aligned with the second aperture and the secondary mirror, and a radiation source are positioned outside the enclosed hemispherical volume.
The radiation source produces a first radiation beam, which is directed along a first optical path originating at the radiation source, passing through the first aperture and the opening and terminating at the sample surface at an incident angle. A second radiation beam emitted by the radiation source simultaneous to emission of the first radiation beam, is directed along a second optical path originating at the radiation source, entering the enclosed hemispherical dome through the third aperture, redirecting through the second aperture and terminating at said optical imaging device.
These and other features, aspects, and advantages of the present invention will become better understood with regard to the following description, appended claims, and accompanying drawings wherein:
Referring to
Illumination beam 304 impacting the sample surface results in light being reflected by the surface. Generally, this reflected light 314 forms a scatter pattern (not shown), having variations in reflection angle and intensity as well as other optical properties, on a projection screen 316. The degree to which the scatter pattern varies is dependent on the specific texture and optical properties of the sample surface. For example, a smooth, highly reflective surface will produce a correspondingly uniform scatter pattern, while a very rough, matte surface would tend to produce high variability across the entire scatter pattern.
The projection screen 316 is formed on an internal surface of the hemispherical dome enclosure 318. However, the entire internal surface of the hemispherical dome enclosure 318 need not be configured as a projection screen.
The base 320 provides a central opening 322 aligned vertically with the first aperture 310. This opening 322 allows optical access to at least a portion of the sample surface 308 placed against the outside surface of the base 320.
Alternatively, the opening may be replaced by a platform or other supporting means (not shown), wherein the sample surface 308 can be placed during optical properties measurements. However, the base 320 would need to be configured to be removable from the hemispherical dome enclosure 318 and the apparatus 300 would need to be dimensioned to accommodate the sample surface 308 internally.
External to the hemispherical dome enclosure 318, a optical imaging device 324 is positioned. The optical imaging device 324 is vertically aligned with a second aperture 326 formed on the hemispherical dome enclosure 318 and offset from the first aperture 310. Additionally, the optical imaging device 324 and second aperture 326 are vertically aligned with a convex mirror 328 positioned on the base 320, in a manner, which provides a wide-angle image of the projection screen 316 to the optical imaging device 324.
The radiation source also generates a calibration beam 330 simultaneously with the illumination beam 304. The calibration beam is directed through a third aperture 332 positioned on a lower portion of the hemispherical dome enclosure 318 and horizontally aligned with the convex mirror 328. The calibration beam 330 impacts the convex mirror 328 and is reflected to the optical imaging device 324. Alternatively, a second mirror (not shown) may be placed in proximity with the convex mirror and used instead of the convex mirror to reflect the calibration beam to the optical imaging device 324. Various optical components may be placed in the optical path of the calibration beam 330, such as filters 336 and diffusers 334, in order to configure the optical properties of the calibration beam as necessary. A baffle 338 placed above the third aperture 332 prevents the reflected light 314 as well as other ambient light from interfering with the calibration beam 330 and its optical components 334 and 336.
The optical imaging device records both the projection screen image and the calibration beam data simultaneously, where a portion of the recording contains the calibration beam data while the remaining portion of the recording contains the projection screen image. In this way, each recording contains the optical properties of the sample surface 308 as projected on the projection screen 316 as well as calibration data. The calibration data is used to characterize optical properties of the illumination beam 304, thus allowing optical variations in the output from the radiation source 302 to be compensated for during analysis of the projection screen image.
The apparatus 300 may be susceptible to producing stray light in the optical imaging device light path, since the optical imaging device 324 must look through the illumination beam 304 when the illumination beam 304 is positioned at the apex of the first aperture 310. Therefore, in another embodiment as shown in
Yet another embodiment is shown in
Referring to the flowchart of
The light source 302 used in the present disclosure is not limited to a halogen bulb but may include discharge lamps, e.g., metal halide, mercury vapor, sodium vapor, etc., and laser sources. Discharge lamps generally provide higher intensity light output then does halogen.
Discharge lamps have a much greater tendency towards non-uniform light intensity and color distribution between various emission directions over time. For example, a discharge lamp may radiate a yellowish-white light in a set of directions perpendicular to the lamp's long axis, while a more bluish-white light is emitted along the long axis. The same applies for intensity.
Additionally, as a discharge lamp heats up, the shape and location of the discharge, i.e., the actual point within the lamp that produces the illumination, changes thus further altering the lamp characteristics in a non-uniform manner.
The above-described embodiments would not be entirely effective when using a discharge lamp. Accordingly, another embodiment is provided in
However, the light source 702 in the present embodiment is a discharge lamp, which outputs an initial beam of light 704. The initial beam 704 is then split into a illumination beam 706 and a calibration beam 708 using an amplitude beam splitter 710, such as a metalized pellicle or a cube splitter. As in the previous embodiments, the illumination beam is directed to the apex of the hemispherical dome enclosure 318, while the calibration beam is directed through the third aperture 332 and onward towards the optical imaging device 324. Since both the illumination beam 706 and the calibration beam 708 originate from the same initial beam 704, both share many of the same characteristics and thus can be used to compensate for a wider range of factors
It should be noted that the present embodiment works equally well with an incandescent bulb or even a laser source. In fact when using a laser source, variations in polarization distribution can also be compensated for.
Images can be obtained with video frequency, e.g. 25 Hz using a video-imaging device is employed. There is a provision for continuous adjustment of the illumination beam ascension and sample azimuth, so that a complete set of, say, a few hundred images can be obtained in a few minutes to form the basis of further data processing.
Additionally, if a color video-imaging device is used, the same measurement also provides data about the wavelength dependent behavior of the sample. Color video uses three wavelength bands, which is not a real color measurement in the CIE sense, but it brings very useful direction-dependent color information of the sample. This is of special interest for diffractive surfaces such as holograms.
Normally, the imaging device is aimed to view the image on the screen, while the sample itself is not visible for the imaging device. In a special embodiment of the apparatus there are provisions to allow the sample itself to be imaged directly by the imaging device. The imaging device may be aimed at the sample by slightly turning the imaging device from the mirror to the sample. In this viewing mode the sample may be illuminated by diffuse light obtained through one or more additional lamps that illuminate the inside of the dome. The sample may also be illuminated by a collimated beam of light or by a bright spot projected on the screen. The specular reflection of the beam or spot off the sample may fall in the imaging device or to the side of the imaging device, depending on the desired characteristic of the sample to be observed. The viewing mode allows different characteristics of the sample texture to be retrieved, because the sample is viewed directly and not via a Fourier-like transformation.
The screen may be used in reflection or transmission and has the usual properties of a projection screen. The two-dimensional image formed on the screen represents the angular distribution of the radiation scattered by a sample arranged at the sample location. The image is therefore a Fourier-like transform of the physical properties of the sample, in which a spatial variation in physical properties of the sample is transformed to an angular variation of radiation energy. The use of an imaging device, e.g. a video camera, allows a fast capture of the image, being the full distribution of the scattered radiation.
The sample surface may be investigated in reflection or in transmission. In the latter case the illumination beam and the scattered radiation to be detected are at opposite sides of the sample, and the measurement is indicative not only for the physical properties of the entrance and/or exit surface of the sample but also of its interior. The sample may be mounted on an adjustable stage, to allow changes in the azimuth of the sample.
The described embodiments of the present invention are intended to be illustrative rather than restrictive, and are not intended to represent every embodiment of the present invention. Various modifications and variations can be made without departing from the spirit or scope of the invention as set forth in the following claims both literally and in equivalents recognized in law.
|Cited Patent
|Filing date
|Publication date
|Mar 1, 1939
|Jun 24, 1941
|Champion Paper & Fibre Co
|Jan 26, 1977
|Jun 6, 1978
|Hunter Associates Laboratory, Inc.
|Spectrophotometer-digital data processing system for appearance measurements providing fast and accurate standardization, ease of use for different appearance measurements and fast response
|Oct 14, 1983
|Mar 11, 1986
|Shimadzu Corporation
|Apparatus for measuring absolute reflectance
|Dec 4, 1986
|Sep 13, 1988
|Moshe Golberstein
|Reflective photometry instrument
|Oct 1, 1990
|Aug 31, 1993
|Mcneil John R
|Two-dimensional optical scatterometer apparatus and process
|Jul 31, 1995
|Apr 28, 1998
|The United States Of America As Represented By The Secretary Of The Navy
|Variable angle reflectometer employing an integrating sphere and a light concentrator
|Oct 10, 1997
|Jun 15, 1999
|Northrop Grumman Corporation
|Imaging scatterometer
|Apr 10, 1998
|Mar 7, 2000
|The United States Of America As Represented By The Secretary Of Commerce
|Microroughness-blind optical scattering instrument
|Dec 17, 1999
|Jun 10, 2003
|Koninklijke Philips Electronics N.V.
|Oct 19, 2000
|Oct 7, 2003
|Byk Gardner Gmbh
|Device and procedure for the quality control of in particular finished surfaces
|Feb 26, 2004
|Aug 14, 2007
|Castonguay Raymond J
|Spherical scattering-light device for simultaneous phase and intensity measurements
|Feb 18, 2004
|Mar 25, 2008
|Koninklijke Philips Electronics, N.V.
|Scatterometer and a method for observing a surface
|Sep 25, 2003
|Oct 21, 2004
|Rajeshwar Chhibber
|High dynamic range optical inspection system and method
|Apr 11, 1983
|Dec 29, 1983
|Pentacon Dresden Veb
|Vorrichtung zur schnellen messung des glanzes beliebiger oberflaechen
|Jun 25, 1999
|Dec 29, 1999
|GretagMacbeth, L.L.C.
|Method and apparatus for surface effect characterization
|Title not available
|Dec 16, 1999
|Jun 29, 2000
|Koninklijke Philips Electronics N.V.
|Feb 23, 2004
|Sep 10, 2004
|Gretagmacbeth, Llc
|Spectrophotometer and subassemblies thereof
|Feb 18, 2004
|Sep 10, 2004
|Koninklijke Philips Electronics N.V.
|A scatterometer and a method for observing a surface
|Feb 18, 2004
|Sep 10, 2004
|Koninklijke Philips Electronics N.V.
|A scatterometer and a method for inspecting a surface
|Wadman et al., "Appearance Characterisation by a Scatterometer Employing a Hemispherical Screen", Proceedings of SPIE, vol. 5189, Surface Scattering and Diffraction III., pp. 163-173, XP002360323.
|Citing Patent
|Filing date
|Publication date
|Feb 16, 2010
|Otsuka Electronics Co., Ltd.
|Integrating photometer for measuring total flux of light generated from light source to be measured, and method for measuring total flux of light through use of the same
|Nov 10, 2010
|Mar 27, 2012
|Mitutoyo Corporation
|Phosphor wheel configuration for high intensity point source
|Nov 27, 2012
|Mitutoyo Corporation
|High intensity point source system for high spectral stability
|Apr 12, 2013
|Nov 25, 2014
|Otsuka Electronics Co., Ltd.
|Optical characteristic measuring apparatus
|Oct 16, 2008
|Apr 30, 2009
|Otsuka Electronics Co., Ltd.
|Integrating Photometer for Measuring Total Flux of Light Generated from Light Source to be Measured, and Method for Measuring Total Flux of Light through Use of the Same
|Apr 21, 2010
|Aug 19, 2010
|Mitutoyo Corporation
|High intensity pulsed light source configurations
|U.S. Classification
|356/446, 356/445, 356/236
|International Classification
|Cooperative Classification
|European Classification
|Feb 7, 2008
Owner name: KONINKLIJKE PHILIPS ELECTRONICS N V, NETHERLANDS
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:WADMAN, SIPKE;REEL/FRAME:020474/0484
Effective date: 20051115
|Dec 24, 2012
|Fee payment
Year of fee payment: 4


text:
General Information: 503-823-4000
E-mail: firstname.lastname@example.com
1221 SW 4th Avenue, Room 110, Portland, OR 97204
General Information: 503-823-4000
E-mail: email@example.com
1221 SW 4th Avenue, Room 110, Portland, OR 97204
The Unidos Latinos Americanos (ULA) Affinity Group is committed to developing a Latino professional network in order to promote professional advancement and mentoring opportunities for all Latino City employees, as well as help recruit Latinos for employment. ULA will advocate for strengthening community inclusiveness through public outreach toward policies, plans, and investments and highlight contributions made by the Latino Culture. Lastly, ULA will collaborate with Latino community organizations and institutions for shared goals and accomplishments.
For more information contact: Cynthia Castro, Juan Carlos Hernandez or Cristina Nieves
Wednesday, September 28th at 2:00 p.m.
Council Chambers, Portland City Hall (1221 SW Fourth Ave., Portland, OR 97204)
Following the proclamation, a small reception will take place featuring churros courtesy of local Latino owned business Churros Locos.
Open to the community, all ages!
Opening the week of October 26th through November 2nd
Art space at Portland Building, 1120 SW 5th Ave
ULA is sponsoring a Day of the Dead altar with funds from RACC. Photos submissions of loved ones who have passed can be summited to firstname.lastname@example.com
Poster of events in Spanish
Poster of events in English

subset: commoncrawl


text:
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Three Piece Wedding Set GD-15911 (GD-15911)
We ordered the above mention wedding set on July 7,2011, in the 10k white gold,and had our rings on our hands by July 16, 2011. When I first inquired...
Wedding Band
The wedding band I ordered is beautiful. I love it! My future husband is so excited to wear the ring. The quality is excellent! I was very impressed with...
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At first I was skeptical about ordering from the website (because I do not like making online purchases), but I took a chance and I must say I am 100%...
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text:
Kids today with their SnapChats and their Chatroulettes, they've got it so easy when it comes to internet sex. Back in the dark ages of 1997, if you wanted to make the cyber sex with a stranger you had to find a AIM chatroom to scout fellow creeps.
Found Footage discovered this very random and real video lying around in a Minnesota thrift store that worked as a how-to guide for having hot 90s cyber sex. Behold, the internet's sleazy past!
<iframe width="640" height="360" src="//www.youtube.com/embed/PBDKEn-TeQg" frameborder="0" allowfullscreen></iframe>


text:
PORTLAND, Ore. -- The summer tourism season in Portland has been booming in recent years.
"Year over year we're looking at occupancy rates that have gone up three percent in this year compared to 2015," said Megan Conway, the Vice President of Communications and Public Relations for Travel Portland.
But there is some concern. More tourists are noticing the homeless situation and complaining about it.
If negative perceptions persist, Conway said it could mean bad things for Portland's nearly five billion dollar tourism industry.
"We really are looking at it from the standpoint of a lot of people rely on word of mouth recommendations about where they should travel next and as we've seen an uptick, our hotels have seen an uptick in some of the complaints," said Conway.
One such complaint from a visitor said the drugs, aggressive behavior, and public urination they saw were too much to handle.
They wrote: "Frankly we were unable to enjoy the great parts of Portland because we were constantly looking over our shoulders and changing to the other side of the street to make sure we were safe."
They said they will not come back and will tell their friends to avoid Portland.
Another person wrote: "I was truly disturbed at the number of homeless people sleeping on the sidewalks and panhandling. My wife and I have never seen anything like this."
Tourists we spoke with had varying opinions.
"[It's] concerning. I'm not sure why you have so many," said Jamie Schutt who is visiting from Michigan.
"They don't get in your way. They don't bother you. You can walk past them," said Amanda Leras who was in town sightseeing from Chicago.
"I've noticed it. Mainly it seems like they kind of live in luxury in comparison to Chicago. They have a lot of nice stuff, nice sleeping bags. But yeah, it's really not bad here," said Leras' husband Derek.
For now those in the tourism industry will watch, wait, and continue to share visitors' complaints with the city.


text:
Check out possible Presidential contender Rick Perry and his recent stem cell therapy....
Perry desperately needs stem cell treatments to grow his peanut sized brain, but even that won't help, unless he gets them from Abe Lincoln.
He used adult Stem Cells and he is still against embryonic stem cells. I'd rather vote for Obama then Perry.
Read the biography of blues pioneer Robert Johnson. It's pretty fascinating.
Why not tell us or give us the link?
Just what we need-another ultra conservative candidate whose views on matters like stem cells would fit in very well with that of the Stone Age.


text:
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Low vision is an important public health problem; however, very few low vision clinics are available to address the needs of low vision patients in most developing countries. The purpose of this study was to describe the characteristics of patients attending the low vision clinic of a Nigerian tertiary hospital.
This was a prospective cross sectional study of all new patients seen at the low vision clinic over a 36month period. Patients were administered with a structured questionnaire, and were examined and tested with low vision devices by the attending low vision specialist. Information on the demographic and clinical characteristics of the patients was recorded.
A total of 193 new patients seen during the period were studied. The mean age was 41.4years, and their ages ranged between 6 and 90years with a male to female ratio of 1.9:1. Majority (58%) were aged below 50years, 23.3% were children (≤15years), while 21.8% were elderly patients (≥65years). The commonest cause of low vision was retinitis pigmentosa (16.6%); 14.5% had age related macular degeneration (ARMD); 9.8% had albinism; while only 1% had diabetic retinopathy. ARMD (45.2%) was the commonest cause in the elderly patients, while albinism (24.4%) and optic atrophy (24.4%) were the commonest in children.
The demographic and clinical characteristics of low vision patients seen in this clinic are similar to that of patients in other developing countries, but different from those in developed countries. Elderly patients and females may be under-utilising low vision services. There is a need for further research into the determinants of low vision service utilisation in developing countries. This would further aid the planning and delivery of services to low vision patients in these countries.
PubMed Central Canada is a service of the Canadian Institutes of Health Research (CIHR) working in partnership with the National Research Council's national science library in cooperation with the National Center for Biotechnology Information at the U.S. National Library of Medicine(NCBI/NLM). It includes content provided to the PubMed Central International archive by participating publishers.


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The Florida High School Mock Trial Competition is an academic competition in which a team of 6-8 students simulate the roles of both attorneys and witnesses in a fictional trial situation. Students have approximately five months to prepare for their roles.
2017 Competition
The 2017 Mock Trial State Finals Competition will be held March 23rd - March 25th, 2017.
Register for the 2016-2017 Florida High School Mock Trial Competition
Broward County Registration Forms (due October 14th):
- Broward (Circuit 17) Mock Trial Registration Form A
- Broward (Circuit 17) Mock Trial Registration Form B
The 2017 case is coming soon! In the meantime, schools can begin preparing by reviewing the rules of competition and last year's competition video.
The Florida Law Related Education Association, Inc. offers a wide variety of law related and civic education training opportunities.
National level training programs are available as well.
Archived Cases
Below you will find previous years' cases for your use. These resources may be put to good use as practice tools or educational materials.
State of Florida v. Logan Bartram (2016)
Harper Sanders v. Everglade Computers, Inc. & Chartech Tech Services, Inc. (2015)
State of Florida v. Jesse Davis (2014)
State of Florida v. Regan Buschell (2013)
State of Florida v. Jesse Woodson (2012)
Young v. Gardner (2011)
State of Florida v. Chris Byrd (2010)
Cameron Duncan v. Robin Hightower (2009)
State of Florida v. Marla Manning (2008)
Sal Lantro v. Gates County School Board (2007)
State of Florida v. Jamie Olsen (2006)
State of Florida v. Toni Menendez (2005)
Mock Trial Videos
2016 Mock Trial Competition
2013 Mock Trial Competition
2012 Mock Trial Competition
2011 Mock Trial Competition
2010 Mock Trial Competition


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The strong unstructured linen/jute structure to this bag ensures that it is light in weight whilst providing the space and durability for all your beach needs. Internal zip closure pockets with magnetic top closure for added security.
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Google Docs is a great tool for helping teachers thoughtfully incorporate digital writing into the curriculum.
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Skip to comments.Brokeback Mountin Bombs at Box Office; Holiday BO smells
Posted on 12/17/2005 11:10:22 AM PST by dangus
click here to read article
Guess the sheep wouldn't have them.
I'm not interested in sissy cowboys.
I don't really know, but they are over paid, and under performing.
You cannot make fun of these people. Any reducito ab absurdum becomes a plan of action. Consider that in the current King Kong, Kong is made into a sympathetic character.
Narnia was great.
Sheepherder is the term used in Idaho sheep country where I grew up.
Nobody knows. That's the problem.
Look, I have several gay friends. All of them plan to see Brokeback Mountain, but aren't all that anxious about it. Do you know the most popular movies I've seen on DVD in their homes? Chicago and the Austin Powers movies.
I am turned off of the movie because of the game.
One way Jackson tried to get young guys interested in the movie was the game.
But, the game sucks.
It is scripted to the hilt. I HATE games like that. I want to be able to do whatever I want almost in a game, not be forced to take one or two choices.
That turned me off of the film. I am sure a lot of other young people are feeling the same.
Tell them to save their money. It will be on disc in feb.
The lion obviously represents Christ. Heck, even the altar breaks in two and he comes out shining in light for crying out loud.
The lion is Christ.
I loved Narnia, and I never read the book.
About the only other movie coming out I might see is Fun with Dick and Jane since it has Jim Carrey.
I have to agree and disagree with you. Allegory has a definite meaning. It doesn't depend upon individual whim or taste. Allegory is a literary device in which characters and events stand for abstract ideas, principles or forces, so that the literal sense suggests a deeper, symbolic sense.
Individual interpretation of a piece of writing is, however, a personal judgment. Is the lion symbolic? Yes, a symbol of Christ. Is the lion symbolic of an abstract principle like justice? It could be interpreted that way. But from the letter you quoted, Lewis wasn't trying to create a work to convey abstract concepts. The lion is Christ. That would be metaphor, not allegory. If the story is interpreted as the triumph of good over evil, that is allegory.
...they'll keep it in theaters through the academy awards nominations, etc. then release it in the summer.
...they'll keep it in theaters through the academy awards nominations, etc. then release it in the summer.
..maybe it would have done better if they had made a 2 hr. version of the Brokeback Kong parody...
Looks like it won't be showing where I live. A pity, I would have loved to read a review of it in the local rag. I can just see them sweating over it -- how do we push the homosexual agenda without disgusting our readership?
No, NO, it's called "Barebutt Mountain".
That leaves out somewhere around
90% 97 of the population.
There. that fixed it.
"FudgePack Mountain . . . "
That's BAD! It's SO bad, in fact, that I'm falling off my chair laughing! (I LOVE bad stuff like that.)
I thought the best line was when one fag asked the other, "Do these jeans make my ass look fat?"
Another blow for Blue-State America.
We're in a agreement then. I understand the difference between allegory and metaphor, but some people understand those terms are being interchangeable, even though they aren't. You are 100% correct.
I knew this was going to happen, but it makes me feel really good to see it in print.
Actually, they are two actors who have probably ruined their careers.
Heath Ledger already has another movie -- Casanova -- coming out.
The elitists have embraced this movie as a kind of Passion of the Christ of their own, and it's being (so to speak) forced down our throats in a number of ways; in spite of being (from most accounts) an overlong, boring, unpleasant film, it's going to win all the awards just to show the "fundies" who's in charge of the culture.
That's why it's not going to be popular here.
He better hope it comes out soon and that he looks very very believable in it.
I want to see Narnia but I was waiting until after the Christmas rush to go. Maybe I'll go sometime this week if it's not that crowded.
-Snip- Personally, I think millions of men are just itching to see Bareback Mountain -snip-
Personally, I think the ones who want to see this movie are just dripping... and burning too. They really should see a doctor, and a counselor, and a priest, or a rabbi, etc...
"I suggest another crappy remake of a TV show that no one watched."
I'm telling you, the last truly original movie that was made was "The Sixth Sense", I loved that movie. Completely clean, good story, a wee bit scary, but I stood it so most wouldn't find it scary at all. No bad language, romance but clean, good story, good acting. An excellent flick, like the old days.
There certainly aren't many good movies.
I think maybe the best American movie I've seen in the past few years is "The Incredibles."
I also recommend just about any anime film directed by Hayao Miyazaki, which are fun for the whole family. Spirited Away, Kiki's Delivery Service, Nausicaa of the Valley of the Wind, Princess Mononoke, Castle in the Sky, My Neighbor Totoro, The Cat Returns, and especially Porco Rosso, which reminds me of Casablanca (except that the Bogart role is played by a World War I biplane pilot who has been turned into a pig because he flew too high). It even has a woman singing chansons in an Aegean nightclub.
Miyazaki has what some might consider too strong a concern for "the environment," but he's much too good for it to bother me, and I don't think the left should have a monopoly on nature. The films are made by a company which seems to be half Japanese and half Italian, although Disney has picked up and distributed the last few of them.
no....Buttpoke mountain....nooo....Humpback mountain....I fergit....Fudgepack mountain...nope...Brokebutt mountain...dang it...
"Did they really think a movie that appeals to such a small proportion of the population would do well?"
That's their whole problem, in a nutshell. Liberals are completely koolaid convinced that they are the majority and we are the minority.
The only reason Bush won FL in 2000 was he disenfranchised voters; the only reason he won OH in 2004 was Diebold stole the election.
The are convinced that most of America is more "tolerant" and liberal, and it is the evil uberconservative capitalists corporations that keep this from coming out. It's a giant conspiracy, that VRW one.
Most of America has gay tendencies and will view this as a tender love story. Listen to anyone from DU and they are firmly convinced of this garbage.
That might explain the famous Sheep-Cattle Wars. The Cattlemen didn't want the shepherds fowling their water holes, and spreading their scabies (no joke, I think that's pretty much what the shooting was about).
One problem with the movie may be that they weren't entirely honest about what sort of a relationship this could have been forty years ago. If that sort of thing happened it all it would have been more casual or more pathological. But they had to make the relationship look at once "normal" and monumental. Romanticizing it introduces a false note. Another problem is that once you get the "gay cowboy" concept something of significance has to happen in the film. Apparently, not much does.
When it's your turn in the barrel.
I took the whole family to see it yesterday. It's wonderful, wonderful, wonderful. I enjoyed it as much as LOTR. Just be sure to go in as a little kid, ready to be enchanted. The lady who plays the White Witch is marvelous, as are all four of the children.
They herd sheep and they are gay! Poor sheep, I bet they all run for their lives when they see a shepard approaching!
It's an impossible story to tell accurately in the movies. They're hyping it to be like Shakespeare in Love.
Yeah, and most film reviewers didn't like Star Wars much either when it first came out.
Whatever ...
It's funny to read reviews on when SW first came out and then read a review by the same reviewer 20 years later on how incredible the flim was.
Speaking of film reviewers:
(warning: bad language in video, but still damn funny.)
I have to agree with you on this one to a point, I loved the Incredibles. I also enjoyed the Harry Potter movies, I am not a Christian and so the witchcraft thing doesn't bother me, plus I see Harry Potter as fantasy with no relation to reality at all, just fun to watch. I do however have some complaints on how they stray from the books but this is true of most movies made from book stories.
Hello, Hollywood...anyone there with a calculator...?
Oh, no, is some poor blonde headed guy going to be kidnapped by Kong? Imagine the terror when Kong wants to have sex with him!
That is the line that deserves an OSCAR.
Open Range 2 would blow them all out of the water.
Robert Duvall is the best living American actor.
Disclaimer: Opinions posted on Free Republic are those of the individual posters and do not necessarily represent the opinion of Free Republic or its management. All materials posted herein are protected by copyright law and the exemption for fair use of copyrighted works.


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Indoor/Outdoor Black & White Rugby Stripe Teepee
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In Search of a Lost African ChildhoodJournalist Helene Cooper examines the violent past of her home country Liberia and the effects of its 1980 military coup in this deeply personal memoir and finalist for the 2008 National Book Critics Circle Award.Helene Cooper is "Congo," a descendant of two Liberian dynasties—traced back to the first ship of freemen that set sail from New York in 1820 to found Monrovia. Helene grew up at Sugar
$12.99The harrowing, but triumphant story of Ellen Johnson Sirleaf, leader of the Liberian women's movement, winner of the Nobel Peace Prize, and the first democratically elected female president in African history.When Ellen Johnson Sirleaf won the 2005 Liberian presidential election, she demolished a barrier few thought possible, obliterating centuries of patriarchal rule to become the first female
Don't Let's Go to the Dogs TonightNEW YORK TIMES BESTSELLER • ENTERTAINMENT WEEKLY'S #1 NONFICTION BOOK OF THE YEAR • A NEW YORK TIMES NOTABLE BOOK • FINALIST, GUARDIAN FIRST BOOK PRIZE "This is not a book you read just once, but a tale of terrible beauty to get lost in over and over."—Newsweek "By turns mischievous and openhearted, earthy and soaring . . . hair-raising, horrific, and thrilling."—The New Yorker In Don't Let's
Cocktail Hour Under the Tree of ForgetfulnessA story of survival and war, love and madness, loyalty and forgiveness, Cocktail Hour Under the Tree of Forgetfulness is an intimate exploration of Fuller's parents and of the price of being possessed by Africa's uncompromising, fertile, death-dealing land. We follow Tim and Nicola Fuller hopscotching the continent, restlessly trying to establish a home. War, hardship, and tragedy follow the
$11.99Winner of Canada's 2012 Governor General's Award for Fiction In this provocative and starkly beautiful historical novel, a Quaker family moves from Pennsylvania to the Virginia frontier, where slaves are the only available workers and where the family's values and beliefs are sorely tested. In 1798, Daniel Dickinson, recently widowed and shunned by his fellow Quakers when he marries his young
In the Garden of Beasts: Love, Terror, and an American Family in Hitler's Berlin
Love, Terror, and an American Family in Hitler's Berlin"Larson is a marvelous writer...superb at creating characters with a few short strokes."—New York Times Book Review Erik Larson has been widely acclaimed as a master of narrative non-fiction, and in his new book, the bestselling author of Devil in the White City turns his hand to a remarkable story set during Hitler's rise to power. The time is 1933, the place, Berlin, when William E. Dodd
$9.99I'm always hearing about how my brain doesn't work right. . . . But it doesn't feel broken to me. Olivia Donatelli's dream of a "normal" life shattered when her son, Anthony, was diagnosed with autism at age three. Understanding the world from his perspective felt bewildering, nearly impossible. He didn't speak. He hated to be touched. He almost never made eye contact. And just as Olivia was
$11.99In this hugely acclaimed author's new novel, history comes alive before us when, in the seventeenth century, a Jesuit missionary ventures into the wilderness in search of converts—the defining moment of first contact between radically different worlds, each at once old and new in its own ways. What unfolds over the next few years is truly epic, constantly illuminating and surprising, sometimes
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A Novel of Catherine the GreatFrom award-winning author Eva Stachniak comes this passionate novel that tells the epic story of Catherine the Great's improbable rise to power—as seen through the ever-watchful eyes of an all-but-invisible servant close to the throne. Her name is Barbara—in Russian, Varvara. Nimble-witted and attentive, she's allowed into the employ of the Empress Elizabeth, amid the glitter and cruelty of the
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Sales Coordinator Salaries in Atlanta, GA
The average salary for Sales Coordinator jobs near Atlanta, GA is $26,175*.
Top 10 Related Jobs and Salaries
Similar Locations
Popular Companies
* Please note that all salary figures are approximations based upon third party submissions to Simply Hired. These figures are given to Simply Hired users for the purpose of generalized comparison only. Minimum wage may differ by jurisdiction and you should consult the employer for actual salary figures.
Top Sales Coordinator jobs near Atlanta, GA
Immediate Need for: Catering Coordinator
Panera Bread - Duluth, GA
Some food service or retail sales experience preferred. Our catering coordinators know our menu thoroughly and provide detailed attention to ensure our great...
Commercial Real Estate Paralegal
McGuireWoods LLP - Atlanta, GA
Preparation of basic real estate documents for purchase sale and lending transactions. The Paralegal is relied upon as a subject matter expert in the drafting,...
Operations Specialist - National Sales
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The Operations Specialist, Sales Enablement will report directly to the Manager, Sales Operations but support the entire Cox Automotive Sales organization to...
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84 Lumber Company - Cartersville, GA
The Coordinator is responsible for assisting salespeople in their customer service activities. Creating estimates from quotations provided by the salesperson....
Home Depot - Atlanta, GA
Coordinators are primarily responsible for managing incoming and outgoing phone call volume related to Pro sales....


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City officials say Pete Helein told them this week of his plans to retire.
In a letter to Mayor Tim Hanna, Helein wrote, "My decision was prompted by a medical condition that has recently been confirmed. After consultation with my family, I have decided that it would be best if I retire."
Helein's last day on the job is Sept. 5. The city's Police and Fire Commission will then appoint an interim chief and will begin the search for a new chief in the coming weeks, Appleton officials say.
Helein has been police chief since 2012 and has worked for the department for 31 years.


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To the Membership of the Dance Educators of America, Inc.
I, along with the entire Board of Directors, would like to thank all of the members that voted concerning the new Bylaws.
The new Bylaws were approved and effective immediately they are now the governing body for DEA. Thank you for your vote and support.
Dance Educators of America Inc. has many new things happening. We now offer video submission before the Nationals for those members that live 300 miles from the nearest regional event. Video submission also works for a studio that attended a regional but they have new numbers to qualify for the Nationals.
Dance Educators of America Inc. will become a New Member of the International Dance Organization which DEA will have the ability to qualify dancers to audition for Dance Team USA. The IDO holds the World Championship Titles to most of the Performing Arts, Street Dance, and Special Couple Dances. This will allow members to submit entries to become a World Champion in all IDO disciplines. It will also give them the opportunity to compete at the Arts Games, where auditions will be held in 2017. Auditions will take place during the regional and national events. More details to come.
Dance Educators of America Inc. looks forward to seeing you at a regional event.
-Fran Peters, President


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I love Alison Mosshart's new pink hair! and ditto for Michelle's turquoise.
P.S. I am not sure what I'll do next with my hair, definitely low lights. Maybe this, this or this (below).
P.P.S. I never posted the set from The Kills show September 5, 2011 at The Commodore (whoops!).
This was my fourth time seeing them perform.
The Kills Setlist
No Wow
Future Starts Slow
Heart Is a Beating Drum
Kissy Kissy
U.R.A. Fever
Tape Song
Baby Says
One Silver Dollar (Marilyn Monroe cover)
Sour Cherry
The Last Goodbye
You Don't Love Me
Pots and Pans
Fried My Little Brains


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Accepting new patients
Video profile
Sansum Clinic
317 W Pueblo St
Santa Barbara, CA 93105 Phone number & directions
A medical license is required for a doctor to practice medicine in a particular state. Requirements vary by state but most require, at a minimum, post-graduate training in the doctor's specific specialty. An NPI number is a national identifier unique to an individual health care provider and is managed by the Center for Medicare & Medicaid Services (CMS).
Learn more about Dr. Alan Sugar:
View the full profile to get information on:
- Qualifications
- What's important to you
View full profile
Patient Reviews
Write a Review
Prepare before visiting Dr. Sugar
Shingles Patient Education Patient education guide to shingles or herpes zoster, more commonly known as chickenpox which is a painful rash condition.Before Visiting Dr. Sugar Learn More
|More Patient Guides & Topics
Hepatitis C
Specialties & Research
Dr. Alan Sugar, MD is board certified in Infectious Disease.
- He has special expertise in 3 areas:
- AIDS/HIV (Acquired Immunodeficiency Syndrome)
- HIV Infections
- Hepatitis C
Education & Awards
Dr. Sugar graduated from Thomas Jefferson University College of Medicine.
Dr. Sugar has 8 hospital affiliations:
- Santa Barbara Cottage Hospital
- Cape Cod Hospital
- English
Similar doctors nearby
Dr. Mary-Louise Scully
Dr. David Fisk
Dr. Stephen Hosea
Dr. Heather Hindo
Dr. Seth Anderson
Dr. Simon Jameson
- Additional Information
- Dr. Alan M Sugar MD is a male Infectious Disease Specialist and practices in Infectious Disease.
- Where does Dr. Alan M. Sugar practice?
- Dr. Alan Sugar has 1 office location.
Dr. Alan Sugar practices Infectious Disease near Santa Barbara, CA.
See Santa Barbara Infectious Disease Doctors.


text:
Music Lyrics
Bass and Guitar Tabs
and More...
The following are different places I've gone to on vacation. After clicking on the following places, you can see some cool photos. These pictures are copyrighted by the webmaster of this site. Do not use any of these pics for anything except your viewing pleasure without Contacting Me and asking for my permission first. They are for viewing purposes only.
This page has been visited times!
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Website © 2000-2014 mattsmusicpage.com. All rights reserved.
Legal & DMCA: Matt's Music Page has been providing lyrics and tabs in a legal way, paying royalties each year to a few organizations. Then, all lyrics and tabs were removed from the site. Now, there's a new owner to the site, which purchased it August 26, 2014, and he is in negotiation to obtain licensing from BMI at the moment. If you have a specific DMCA request -- please do not hesitate to contact me via the contact button on top. I will do my very best to keep this site fully legal.
Vintage Springfield Barometer/Temp/Humidity Weather Radio Banjo Style Model 2204
Barometer Thermometer Hygrometer Wood Weather Station - Regency Style - Banjo
MUSICAL HALLMARK ORNAMENT plays COUNTRY VERSION of JINGLE BELLS SANTA on BANJO w
Mixed Lot of 4 CHRISTMAS Holiday Penguins 1 Big Plush 2 Singing Banjo Players


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|Publication number
|Publication type
|Application number
|Publication date
|Jun 20, 2000
|Filing date
|Nov 25, 1996
|Priority date
|Nov 25, 1996
|Fee status
|Also published as
|Publication number
|Daniel J. Friedman
|Original Assignee
|Schlumberger Technologies, Inc.
|Export Citation
|BiBTeX, EndNote, RefMan
|Patent Citations (6), Non-Patent Citations (2), Referenced by (67), Classifications (23), Legal Events (8)
|External Links: USPTO, USPTO Assignment, Espacenet
This invention describes a system, methods and apparatus for storing information such as the lot number, wafer number and individual device identification as well as process information and other unit-specific data within the carriers used to transport semiconductor devices through their manufacturing process or within the IC package itself.
The feedback of test and inspection results data is of critical importance for process diagnostics and increasing yield in a semiconductor manufacturing line. To be most effective, data relating to a particular semiconductor device must always be traceable to that devices lot, wafer within the lot and location on the specific wafer. However, once wafers are tested and the good die removed, the ability to maintain traceability of each of the individual die, throughout the remainder of the process, is an extremely difficult task that has, in the past, required manual intervention.
Previous approaches for associating data with devices during the semiconductor manufacturing process have included the following two methods:
1) Paper travelers are attached to device carriers, which are then hand carried through the process and the paper traveler manually updated at each step; and
2) Individual device lead frames and packages are marked with a unique serial number as soon as the chip is installed, the serial number may be read at each processing step and the results manually, or automatically, recorded after which the device is re-marked before shipment. Such a mark might be a two-dimensional array similar to a bar code.
The first method is inherently unreliable, relying as it does on manual recording of information, and is prone to error or improper use. The paper travelers are easily detached from the carriers or lost in the manufacturing process. The second method requires additional steps in the manufacturing process and does not provide a solution for devices that are sold as bare die.
The use of electronic memory devices is well known in many applications. In particular, the use of such devices in the form of semiconductor integrated circuits (ICs) embedded in cards for carrying financial or other information has increased in recent years. Such cards, being of the same size and shape as magnetic stripe cards such as those used for credit cards or the like, have an integrated circuit embedded within the body of the card and some means for the IC to communicate with a reader so as to exchange data. In their simplest form, IC cards or "smart cards" as they are known, include a simple memory device which provides information to a reader on demand. More sophisticated devices also allow data to be written to the memory and can even perform basic data processing in the card itself. The card reader and or read/write device contacts the IC via electrical contacts on the surface of the card ("contact") or via an r.f. inductive link, there being an inductive loop formed inside the card which can provide power to the IC and send and receive data passed between the IC and read/write device ("contactless"). The technology required to perform these activities is well known and a summary of this can be found in the article "Smart Cards" by Carol H. Fancher published in Scientific American, August 1996, Vol. 275, No. 2, pp 40-45.
The present invention resides in the realization that the integration of "smart card" technology into the semiconductor manufacturing process can not only overcome the problems described above, but can also provide information in sufficient quantity and at appropriate times to allow better management of the manufacturing process.
It is an object of the present invention to provide a system in which such integration can be realized.
This invention pertains to the embedding of an information storage device within, or attached to, the carriers used to transport work in progress from step to step in the semiconductor manufacturing process. The carrier can be a tray having sites for several semiconductor dice/devices, tubes for carrying several devices together, lead frames, wafer cassettes or individual die sockets. The information storage device can be formed integrally with the carrier or formed separately and attached or secured to the carrier. An alternative embodiment of the invention includes the information storage device embedded in or attached to the IC package.
This information storage device includes a data memory and may be any form of semiconductor component capable of being written to, and read from by apparatus located in manufacturing equipment, or along manufacturing lines. The information storage means also includes means for allowing communication between the data memory and read/write apparatus. This can be contact or non-contact as desired, and techniques commonly used in smart card systems are preferred.
The data that may be stored in the data memory device may include, but is not limited to: lot identification, wafer identification for each device in the carrier, the original location on the wafer for each device in the carrier, identification of specific process equipment used to manufacture each device, date and time stamps, operator identification for each process step, process step test or inspection results for each device, process steps completed, remaining life of the carrier and other data pertinent to each individual wafer, die, or device, in the carrier. Where there are several discrete sites in the carrier, each of which can hold one device, the data is stored so as to be specific to each site and hence each individual device.
A system according to the invention comprises a read/write terminal at individual pieces of manufacturing or testing equipment which contacts the information storage device and provides data to the data memory. The reader can also read the data in the memory and transmit it to a central data processor together with its own data to allow control and evaluation of the manufacturing process. The provision of a data memory for each carrier allows the carrier to be moved between physically remote pieces of processing equipment while still retaining the information concerning the manufacturing processes applied to each of the devices. This is particularly useful when the processes are conducted in different buildings which may even be in different countries.
A system according to the present invention provides a method and apparatus for automatically storing the identification and process data within the carriers used to transport semiconductor devices through the manufacturing process. By enabling the automatic traceability of individual device inspection and test results to the specific lot, wafer and die location, this will provide semiconductor manufacturers with a method to decrease the time necessary to bring a new device, or process, up to volume manufacturing standards while increasing process yield. Additional benefits will be derived through the enhanced ability to maintain tight process control and through the ability to trace field failure returns to the process step that may have introduced a defect.
FIG. 1 shows a flow diagram summarizing the front-end of the semiconductor manufacturing process;
FIG. 2 shows a flow diagram summarizing the back-end of the semiconductor manufacturing process;
FIG. 3 shows a tray according to an embodiment of the invention;
FIG. 4 shows a tube for carrying large devices according to an embodiment of the invention;
FIG. 5 shows a tube for carrying small devices according to an embodiment of the invention;
FIG. 6 shows a partial view of a tray according to an embodiment of the invention;
FIG. 7 shows a lead frame according to an embodiment of the invention;
FIG. 8 shows a wafer cassette according to an embodiment of the invention;
FIG. 9 shows a socket for a bare die according to an embodiment of the invention;
FIG. 10 shows a flow diagram of the operation of a system according to the invention; and
FIG. 11 shows a diagram of a processing equipment for use in the system of FIG. 10.
Semiconductor devices are manufactured through the use of a photo-chemical process comprising up to several hundred discrete steps. These devices are fabricated on wafers that may be up to 300 mm in diameter. Each wafer may contain hundreds, or thousands, of units, called die. During the photo-chemical phase of the process, referred to as the "front end", groups of wafers, called "lots", are manufactured together in batches. Each wafer, within a lot, is processed at the same time and under the same conditions as all other wafers within the lot Each lot is assigned a unique serial number, called "Lot Number", or, "Lot ID". Within each lot, each wafer also contains a unique serial number and, within each wafer, each die has a serial number or x-y coordinate, indicative of its location on the wafer. A flow diagram summarizing the steps in the front-end processing of semiconductor devices is shown in FIG. 1. During this process, tests can be applied between steps to determine their effectiveness and to monitor the process.
After completion of the photo-chemical steps, each wafer is tested to determine which die are good and which are bad. The individual die are tested and the good ones are individually installed into plastic or ceramic packages or temporary carriers. The good die, installed into packages if appropriate, are then subjected to further tests to determine quality and insure reliability and then shipped to the end user. In the case where the die will be shipped bare (unpackaged), they are inserted into temporary carriers, that act as packages for the remainder of the process and then removed from these carriers prior to shipment.
The series of tests and processes to which the good die are subjected are designed to insure quality, performance and, finally, mark and finish the unit before it is shipped to a customer. This is typically called the "back end" of the semiconductor process. In addition to testing and validating the quality of the individual units, the back-end steps provide information to the front end, where the die are fabricated, that is used to measure, control and improve the performance of the front-end process steps. FIG. 2 shows a flow diagram summarizing the back-end manufacturing process including the following steps (not all of which are necessarily present in every fab.):
(1) Front-End Output--untested wafers;
(2) Wafer Sort Test--identify good and bad die;
(3) Dice--saw or scribe the wafer into individual die attached to a sticky backing;
(4) Inspect (2nd Optical)--inspect for saw or scribe damage and probe and ink marks;
(5) Die Attach--separate good die from backing and attached to package, includes pad bond for flip-chip;
(6) Wire Bond--attach die pads to package pins, wire or TAB only;
(7) Inspect (3rd Optical)--inspect wire bond quality (height, spacing);
(8) Mold or Seal--encapsulate plastic package or attach lid on ceramic package;
(9) Trim, Form, Tin--trim shorting bars and form leads to desired shape;
(10) Pre-Burn-in Test--optional pre-screen test to screen bad die and monitor assembly defects;
(11) BIB Load--load devices into burn-in-board;
(12) Burn-in--powered, monitored, or test during burn-in;
(13) BIB Unload--load devices into trays;
(14) Final Test--final performance test;
(15) Mark--mark logo, part number, serial number etc. on package;
(16) Finish and Pack--attach heat sink and fan, if appropriate and pack for shipping.
When the wafers are tested, the percentage of good die out of the total number of die is called the "yield". Maximizing yield is of critical importance because it has a direct bearing on the manufacturer's profit. At each step in the process it is possible to introduce defects that lower yield. Therefore, manufacturers track the performance of their process by inspecting and testing after critical production process steps. It is desirable to correlate front-end inspection and test results to the lot, individual wafer and specific die on the wafer. This enables the manufacturer to identify process variation patterns that are indicative of faulty, or non-uniform, performance of the processing equipment or methods. However, after the die are separated from the wafer, in the back end, it is of extreme difficulty to maintain correlation to the lot, wafer and die location, because there is typically no marking on the individual die, or its package or carrier, that identifies the lot, wafer and location on the wafer, of the die. Since the marking of a device is reflective of the results of later test steps, the devices are not marked until the end of the manufacturing process and, therefore, there is no physical identification on the packaged device and no reliable method to maintain traceability of an individual unit. Without traceability throughout the entire process, much of the data that could be used to more rapidly bring a new process on line and/or fine tune a process for maximum yield, is lost.
This invention provides a means for the semiconductor manufacturer to write individual device specific information directly onto the carrier used to transport their products from step to step during the manufacturing process. These carriers may be wafer cassettes, device trays, tubes, reels, individual die carriers, or any other type of material carrier. The data storage device may be a semiconductor device such as a flash memory, eeprom, or any other type of non-volatile data-storage device. For greater simplicity and security in writing and reading from the device, it may be a simple controller with embedded user memory.
The manufacturing equipment used at each process step includes the apparatus for writing to the carrier's storage device and reading the data contained within that storage device. At the beginning of a process step, the data in the carrier's storage device will be read by the equipment to verify that the devices are at the correct location in the process and update the work-in-process data. The data that may be stored in the embedded, or attached, data storage device may include, but is not limited to: lot identification, wafer identification for each device in the carrier, the original location on the wafer for each device in the carrier, identification of specific process equipment used to manufacture each device, date and time stamps, operator identification for each process step, process step test or inspection results for each device, process steps completed, remaining life of the carrier and other data pertinent to each individual wafer, die, device and the carrier itself.
At the end of each step, the processing equipment updates the data contained in the storage device to reflect the results of that step on a device-by-device basis. In this manner, all process step and results data travel with the semiconductor devices being manufactured and provide the manufacturer with the ability to correlate all results with the specific product lot, wafer and location on the wafer.
FIG. 3 shows one embodiment of the invention in the form of a tray used in the back-end semiconductor manufacturing process. The tray comprises a molded plastic body 10 having a number of compartments 12, each of which receives a packaged die 14 (only two are shown). The tray is used to transport the dies 14 between processing or testing steps, the dies being withdrawn from the compartment and processed or tested. The dies are then placed in the compartments of another, similar carrier. An electronic memory device 16 is encapsulated within the sidewall 18 of the tray and electrical contacts 20 are present at the surface of the sidewall 18 to allow power and data communication between the device 16 and a reader (not shown). The device 16 and contacts 20 are essentially the same as those used in "smart card"-type devices. The device includes a memory which holds data and a controller for communicating data with a reader and providing power to the device via the contacts. The data stored in the memory are correlated with the positions of the compartments. Therefore, when a die is placed in one compartment of the tray, the data relating to that die are read into the memory for that compartment location. When a die is removed from a compartment, the data in the memory relating to that compartment are read into the processing or testing equipment or the computer used to control such equipment to provide the appropriate data for that die.
FIG. 4 shows a tube for large packaged parts in accordance with another embodiment of the invention. In this case, the packaged dies are located one on top of the other in a single molded tube 30 rather than in individual compartments. An electronic memory device 32 is formed with contacts 34 the wall of the tube 30 in the same manner as shown in the tray of FIG. 3.
FIG. 5 shows a tube for carrying smaller devices than that of FIG. 4. In this case, the tube comprises an elongate, flattened, plastic tube 40 with a slot 42 extending along one side. The dies (not shown) are placed in a side-by-side relationship in this tube.
FIG. 6 shows a part view of a tray 50 similar to that shown in FIG. 3. In this tray, the memory device 52 is not formed integrally with the tray but is formed in a strip 54 together with the contacts 56. The strip 54 may be located in a recess 58 formed in the wall of the tray and can be secured therein by adhesive, plastics welding, snap fit or any other suitable means which will retain the strip 54 in the recess 58 during the semiconductor manufacturing process. Alternatively the strip 54 can be mounted on the surface of the tray wall (not shown).
FIG. 7 shows a series of dies connected in a side-by-side relationship in a lead frame 60. A memory device with contacts 62 is provided in a tab 64 attached to one end of the lead frame. The tab is essentially similar to the strip 54 described above in relation to FIG. 6.
While the invention has been described above in relation to FIGS. 3 to 7 for carriers used in the back-end manufacturing process, it also has application in the front-end. FIG. 8 shows a wafer cassette 70 which is used to carry wafers 72 between the various processing stages in manufacture. The memory device 74 is formed in or attached to the side of the cassette in the same manner as described above in relation to trays.
It is sometimes desirable to ship bare, unpackaged dies individually between manufacturing processes or to the end user. In such cases, each die is located in its own socket. A socket in accordance with the invention is shown in FIG. 9 and comprises a plastic two-part container 80 having a base with a locating recess 82 for the die (not shown) and a hinged lid 84 with a catch 86. A memory device 88 is embedded in the base. No contacts are present here as communication is via an r.f. link using an inductive loop in the device 88 (a "contactless" device). This type of communication can be used for the embodiments described in place of the contact devices described. Likewise, the socket can be provided with contacts if desired.
The operation of a system according to the invention is shown in FIGS. 10 and 11 and comprises the following steps:
(i) Carriers (trays tubes etc. as shown in FIGS. 3-9) containing the IC devices are loaded into the system;
(ii) The data in the information storage device on each carrier is read by a reader 90;
(iii) The data is checked to ensure that the lot from which the devices originate are at the correct step in the manufacturing process, if not the carrier is removed from the system;
(iv) If at the correct stage, the devices (parts) are removed from the carrier by means of a robot 92 and carrier data is transferred to the processing equipment 94;
(v) The processing step is executed in the processing equipment 94;
(vi) After processing is finished, the parts are loaded back into the carrier by a robot 92 and process data is written into the information storage device by a writer 96;
(vii) The carrier is transferred to the next process step.
At any stage during or after processing or transfer between processing steps, the carrier data can be read into a central processing unit and analyzed to monitor progress of the parts through the manufacturing process and to identify potential problems in the process which can be corrected before the next lot of devices is processed.
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|U.S. Classification
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|International Classification
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|Nov 25, 1996
Owner name: SCHLUMBERGER TECHNOLOGIES, INC., CALIFORNIA
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:FRIEDMAN, DANIEL J.;REEL/FRAME:008517/0849
Effective date: 19961122
|Jun 23, 2003
Owner name: NPTEST, LLC, CALIFORNIA
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:SCHLUMBERGER TECHNOLOGIES, INC.;REEL/FRAME:014268/0115
Effective date: 20020510
|Sep 26, 2003
|Fee payment
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|Oct 13, 2004
Owner name: CREDENCE SYSTEMS CORPORATION, CALIFORNIA
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:NPTEST, LLC;REEL/FRAME:015242/0574
Effective date: 20040713
|Sep 14, 2007
|Fee payment
Year of fee payment: 8
|Jan 30, 2012
|Maintenance fee reminder mailed
|Jun 20, 2012
|Lapse for failure to pay maintenance fees
|Aug 7, 2012
|Expired due to failure to pay maintenance fee
Effective date: 20120620


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