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|Número de publicación
|Tipo de publicación
|Número de solicitud
|Fecha de publicación
|9 Sep 2003
|Fecha de presentación
|5 Nov 1997
|Fecha de prioridad
|5 Nov 1997
|También publicado como
|Número de publicación
|Roberto Rambaldi, Marco Tartagni, Alan H. Kramer
|Cesionario original
|Stmicroelectronics, Inc.
|Exportar cita
|BiBTeX, EndNote, RefMan
|Citas de patentes (18), Otras citas (5), Citada por (82), Clasificaciones (9), Eventos legales (6)
|Enlaces externos: USPTO, Cesión de USPTO, Espacenet
The present invention relates to an integrated circuit architecture for CMOS imagers. More specifically, the present invention relates to methods and apparatus for masking or correcting faults in individual pixels of CMOS imagers.
CMOS image sensors are now becoming competitive with charge coupled device ("CCD") array image sensors. Potential applications include digital cameras, night time driving displays for automobiles, and computer peripherals for document capture and visual communications.
Since the 1970s, CCD arrays have dominated the electronic image sensor market. They have outperformed CMOS array sensors in most areas, including quantum efficiency, optical fill factor (the fraction of a pixel used for detection), charge transfer efficiency, readout rate, readout noise, and dynamic range. However, the steady improvement in CMOS technology (including increasingly small device size) has moved CMOS image sensors into a competitive posture. Further, in comparison to CCD technology, CMOS technology provides lower power consumption, increased functionality, and potentially lower cost. Researchers now envision single chip CMOS cameras having (a) integrated timing and control electronics, (b) a sensor array, (c) signal processing electronics, (d) an analog-to-digital converter, and (e) interface electronics. See Fossum, "CMOS Image Sensors: Electronic Camera On A Chip," 1995 IEDM Technical Digest, Wash. D.C., Dec. 10-13, 1995, pp. 17-25 which is incorporated herein by reference for all purposes.
CCD arrays are limited in that all image data is read by shifting analog charge packets from the CCD array interior to the periphery in a pixel-by-pixel manner. Unfortunately, the pixels of the CCD array are not randomly addressable. In addition, due to voltage, capacitance, and process constraints, CCD arrays are not well suited to integration at the level possible in CMOS integrated circuits. Hence, any supplemental processing circuitry required for CCD sensors (e.g., memory for storing information related to the sensor) must generally be provided on separate chips. This, of course, increases the system's cost.
A persistent problem of both CMOS and CCD image sensor technologies is image degradation due to faulty pixels. Such faulty pixels arise from processing variations inherent in fabrication of numerous sensor chips. A pixel's fault may be manifested by an output indicative of a radiation exposure that does not accurately reflect the actual radiation exposure to which the pixel was exposed. For example, a pixel that outputs more charge than is expected upon exposure to a particular amount of radiation appears as a bright spot in an image. Similarly, a pixel that outputs less charge than expected appears as a dark spot.
Typically, image sensors are tested after fabrication to identify the number of faulty pixels that they contain. If any sensor has more than a specified number of faulty pixels, it must be rejected. Thus, sensor yield is limited by the number of faulty pixels typically produced on a chip. Not surprisingly, wide area sensors having large numbers of pixels have relatively low yields because they tend to have higher numbers of faulty pixels (the number of faulty pixels per total number of pixels is approximately constant for a given fabrication technology).
While careful screening of image sensors after fabrication can locate defective arrays, it cannot prevent sensors from degrading during normal use. Pixels sometimes develop such faults during normal operation. Unfortunately, no effective mechanism exists for identifying and correcting such faults.
What is needed therefore is an improved image sensor that can mask or otherwise correct defective pixels soon after the sensor is fabricated and during its lifetime.
The present invention provides a fault tolerant radiation imager such as a CMOS imager. Such image sensor includes circuitry for masking and/or correcting defective pixels during image generation. Masking may involve, in one example, replacing the output of a given pixel with an average of the outputs of surrounding non-faulty pixels. Correction may involve increasing or decreasing the output level from a pixel to be corrected. Thus, while image sensors may be fabricated with some number of faulty pixels, the images produced by such sensors will be superior to those produced by sensors that do not have such masking or correcting mechanisms. Further, sensor yield.may be improved because even those sensors having more than the traditionally allotted number of defects may be used (so long as the defective pixels are appropriately masked or corrected). In one preferred embodiment, pixels that were initially good and later become defective may be identified at the time they become defective. The newly defective pixels so identified may then be masked or corrected as described to thereby increase the CMOS detector lifetime.
One aspect of the present invention provides a method of masking faulty pixels that may be characterized by the following steps: (a) exposing an imager to radiation; (b) identifying a faulty pixel in the imager; (c) determining outputs of a plurality of other pixels located about the faulty pixel; and (d) masking an output of the faulty pixel using the outputs of the plurality of other pixels. Then a masked output of the faulty pixel can be provided in an image produced by the imager. Preferably, the system identifies the faulty pixel by accessing memory associated with the imager to determine the location of the faulty pixel in the imager. Then to generate an image corrected for the faulty pixel, the method may also require conversion of the output of the pixels (including the masked output) from an analog format to a digital format prior to masking the pixel's output.
In one embodiment, masking the output of a faulty pixel involves replacing its output with an output value based exclusively on the output of multiple surrounding pixels. For example, the corrected output may be obtained by interpolating output values of at least two pixels surrounding the at least one faulty pixel. In color imagers, the pixels of the imager can discriminate between multiple colors and the faulty pixel therefore will be designated to detect radiation of a single color. Preferably, in such cases, the plurality of other pixels chosen to mask the output of the faulty pixel are only those surrounding pixels that are designated to detect radiation of the same color as the faulty pixel.
It may not be necessary to totally mask the output of each of the faulty pixels. For example, some pixels may not be completely corrupted, in which case their outputs could be corrected rather than masked. In one instance, the faulty pixel may be known to have an output that is 20% lower than appropriate. Thus, the output of that pixel may simply be increased by 25% before producing the image.
Of course, some technique for identifying faulty pixels must be conducted initially (when the imager is produced) or periodically over its lifetime. In one embodiment, the system electronically tests a selected pixel according to the following sequence: (i) electronically resetting the selected pixel to a defined charge (e.g., the charge associated with a dark value in an image); (ii) reading the selected pixel's output; and (iii) comparing the selected pixel's output to an expected value based upon the defined charge provided to the selected pixel. If the selected pixel's output significantly deviates from the expected value, the system designates the selected pixel as faulty. Alternatively, the conducted test may also be an optical test in which the imager is exposed to radiation of a known intensity for a known duration. The outputs of the pixels are then compared to expected values as described above.
In the case of an electronic test and where the selected pixel includes an n-well and a p-diffusion photodiode, electronically resetting the selected pixel requires injecting a quantity of negative charge into the p-diffusion. In photodiodes of the opposite conductivity type, negative charge is removed from an n-type diffusion during reset.
The test results may be interpreted as follows: if the selected pixel's output significantly deviates from the expected value, the system determines whether the selected pixel is partially or completely corrupted. Thereafter, masking or correcting the output of the selected pixel employs a first technique for a partially corrupted pixel and a second technique for a completely corrupted pixel. Because the second technique involves a completely corrupted pixel, little if any information from the output of the pixel may be used. Thus, the second masking technique may involve interpolation or otherwise averaging the outputs of pixels surrounding the completely corrupted pixel. The first technique may involve using the output from the pixel—simply increasing or decreasing that output by a fixed percentage or magnitude.
To automatically recall the faulty pixel identities prior to image generation, the test method may be concluded by storing the location of the one or more faulty pixels in a memory. In appropriate instances, it may also involve storing data specifying whether each of the one or more faulty pixels is partially or completely corrupted.
Another aspect of the invention provides an imager that may be characterized as including the following elements: (a) one or more pixels capable of providing outputs indicative of a quantity or a type or both the quantity and type of radiation to which each of the one or more pixels has been exposed; (b) one or more circuit elements electrically coupled to the one or more pixels and configured to mask or correct faulty pixels in the imager; and (c) a memory configured to store the locations of the faulty pixels. Preferably, these various elements are provided on a single integrated circuit chip.
The imager may also include one or more voltage sources capable of delivering a voltage to the photodiode diffusions of the one or more pixels (typically to reset the pixels' states). It may further include one or more charge integrators capable of measuring the pixel outputs. Still further it may include an analog-to-digital converter capable of receiving analog outputs from the one or more pixels, converting the analog outputs to digital signals, and providing the digital signals to the one or more circuit elements such that the one or more circuit elements can identify faulty pixels. In an especially preferred embodiment, the plurality of pixels is arranged in an array such that each of the pixels in the plurality of pixels is separately addressable.
In many CMOS imagers, the one more pixels will each include a photodiode diffusion formed in a well and a tap to power or ground also formed in the well. Such pixels may be of an active or passive design.
Another aspect of the invention provides a system for producing an image of an object. This system includes an imager of the type described above and one or more components for outputting an image resulting from the outputs of the one or more pixels. The image may be a photograph in the case of a digital camera for example.
These and other features and advantages of the invention will be described below in the Detailed Description section with reference to the appended drawings.
FIG. 1 is a block diagram illustrating high level functional blocks employed in a CMOS imager implementing the fault tolerant imager of the present invention.
FIG. 2A is a cross-sectional diagram of a passive photodiode pixel, of a type suitable for use with the CMOS imager of FIG. 1, being reset.
FIG. 2B presents the same cross-sectional diagram presented in FIG. 2A, but showing how the reset charge on the pixel is read out to determine if the pixel is faulty.
FIG. 3A is a hypothetical graph illustrating how the system may categorize pixels as partially or completely corrupted due to a leaky diode in accordance with one embodiment of this invention.
FIG. 3B is a hypothetical graph illustrating how the system may categorize pixels as partially or completely corrupted due to an obstruction or gain mismatch in accordance with one embodiment of this invention.
FIG. 4A is a process flow diagram illustrating a method by which the pixels of an array may be tested to determine whether they are corrupted.
FIG. 4B is a process flow diagram illustrating how corrupted pixels are treated during image generation in accordance with one embodiment of this invention.
FIG. 4C is a process flow diagram detailing one technique by which corrupted pixels may have their outputs masked or corrected to generate a clear image.
FIG. 5 is an illustration of the pixel arrangement in a color imager, presented to illustrate how pixel correction can be conducted in color imagers.
The invention will be described with reference to certain preferred embodiments set forth below. Specifically, the invention will be described with reference to a particular CMOS sensor employing depletion mode photodiodes. It should be understood that the invention is in no way specifically limited to these embodiments. For example, the methods and systems described herein may be profitably applied to photogate arrays, CCD arrays and virtually any other type of radiation imaging array. Further, while the CMOS photodiode array design presented herein is a "passive" design, the principles of this invention can be applied to other designs such as active pixel designs.
FIG. 1 presents one preferred system architecture for implementing a CMOS imager in accordance with this invention. Preferably, all elements of the depicted system are implemented on a single integrated circuit chip. The figure presents an imager 10 including four primary elements: a pixel array area sensor 12, an analog-to-digital converter 18, a fault analysis and correction block 24, and a memory 26 for storing fault and correction data.
Area sensor 12 includes a plurality of regularly arranged pixels each capable of responding to radiation impinging on the sensor. Often, as in the case of most digital cameras, the radiation will be visible electromagnetic radiation. Detection of other types of radiation is within the purview of this invention. Each pixel produces an output indicative of the radiation intensity over time (integral of intensity with time) striking the pixel. In one specific embodiment, area sensor 112 includes an array of 1024 (vertical direction) by 1024 (horizontal direction) pixels, but of course the actual array dimensions will depend upon the application and the scale of the IC fabrication technology. In operation, an optical image may be directed onto area sensor 12 such that spatial and/or temporal variations in light intensity (or some other radiation feature such as wavelength) may be temporarily recorded by the individual pixels making up sensor 12.
The signals from the individual pixels of sensor 12 are output over one or more lines 14 as analog signals 16. These analog signals 16 are received by analog-to-digital converter 18 which converts them to digital signals 22 and outputs such digital signals over a line 20.
Digital signals 22 are then received by the fault analysis and correction block 24 which communicates with memory 26 over a memory connection 28 (e.g., a bus) in order to appropriately mask the output of faulty pixels in area sensor 12. Fault analysis and correction block 24 thereby produces a corrected set of output pixels which it sends over a line 30 to image display circuitry.
While the individual elements of system 10 may be implemented on different physical structures, area sensor 12, analog-to-digital converter 18, and fault analysis/correction block 24 are preferably provided on a single integrated circuit chip. In addition, it may be desirable to include memory 26 on the same chip. Memory 26 should be made as small as possible yet large enough to store all necessary information for correction/masking of each faulty pixel. As most sensors can be expected to have only a few faulty pixels, memory 26 typically need not be very large. Its size will largely depend upon the size of the pixel array itself. Typically, it can be expected that no more than 0.1% of the pixels will ever be faulty in a functional imager. One might expect no more than two or three bytes need be set aside for storing the location and correction information associated with each defective pixel. Based on this logic, memory 26 may typically be between about 10 kilobits and 1 Megabit. Further, memory 26 may take many forms such as SRAM, ROM (EEPROM, flash memory, or EPROM), DRAM, etc.
One of the most significant benefits of CMOS-based image sensors is their easy integration with on-chip analog-to-digital converters. Preferably, the analog-to-digital converter will consume little power and occupy little area, yet meet the pixel processing rate at the resolution required of the system's application. It is possible to have a single analog-to-digital converter for the entire array (operating at the pixel rate), a single converter for each pixel (operating at the frame rate), a converter for each column of the array (operating at the line rate), or some other division of labor.
FIGS. 2A and 2B present side sectional views of a single passive pixel. In FIG. 2A, the pixel is being reset for testing, and in FIG. 2B, the pixel's accumulated charge is measured to determine whether the pixel has been corrupted. FIG. 2B also illustrates the state of a pixel when its output is being read for normal imaging.
As depicted in FIGS. 2A and 2B, a pixel 200 is formed on a semiconductor substrate 202. An n-well 204 is formed as a layer on the upper part of substrate 202, which may be an epitaxial layer for example. In a preferred embodiment, well 204 spans multiple pixels in a two-dimensional array. However, it is within the scope of this invention to have a separate well for each pixel. Within each pixel, a p-type photodiode diffusion 206 is provided to store charge upon exposure to radiation. In addition, each pixel 200 includes a substrate tap 208 for holding the well 204 at a fixed voltage such as Vdd. Substrate tap 208 may be a highly doped n-type region for providing a low resistance ohmic contact to well 204. Substrate tap 208 connects to an appropriate power source via an appropriate contact or interconnect.
Various optical layers/elements may be provided on pixel 200—at least on diffusion 206. To simplify the diagrams these additional elements are not shown in FIGS. 2A and 2B. These optical elements may include, for example, a lens for optical collection of photons and filters for wavelength discrimination of photons (as used in color pixels).
It should be understood that while pixel 200 is depicted as having an n-type well and a p-type photodiode diffusion, the invention is not limited to this arrangement. Thus, well 204 could be a p-type region and diffusion 206 could be an n-type region. In either case, the concentration of dopant atoms in regions 204 and 206 should be chosen to create a depletion mode photodiode. In such photodiodes, radiation impinging on photodiode diffusion 206 causes generation of holes and electrons in the depletion region. Because the depletion region does not contain free charge carriers, these newly created holes and electrons are not immediately annihilated by combination with carriers of the opposite charge. Electrons drift to well 204 and holes drift to p-diffusion 206 where they are collected as free charge on capacitor Cpw 207 defined at the p-n junction between the photodiode diffusion 206 and the well 204. The capacitance of Cpw is sometimes referred to as the photodiode's "intrinsic capacitance."
During normal operation, pixel 200 is exposed to a source of radiation for a defined period of time. The flux of radiation (intensity) integrated over the length of the exposure time define an "integrated illumination" which is related to the amount of charge that builds up on the capacitor defined by the p-n junction of diffusion 206 and well 204. To "read" pixel 200, photodiode 206 is discharged so that the amount of stored charge can be determined. This charge specifies the integrated illumination which can be converted to an average radiation intensity based upon the known exposure time. The outputs of all pixels in the array are used to create a radiation intensity distribution or image.
In the illustrated embodiment, the pixel output is coupled to a charge integrator 210 by a connection line 212 and a transistor 214. While photodiode 206 is exposed to radiation, transistor 214 is switched off so that the charge accumulates in pixel 200. When pixel 200 is to be read, transistor 214 switches on so that the charge accumulated in photodiode diffusion 206 can flow over connection line 212 to charge integrator 210 and a capacitor 222 (connected in parallel with amplifier 210). Charge integrator 210 then measures the voltage across capacitor 222 and generates an output corresponding to the quantity of charge received from photodiode 206. Note that a switch 225 provided in parallel with capacitor 222 should be switched off during the read process so that a potential difference can be established across the plates of capacitor 222.
Concurrently with this reading process, photodiode 206 is "reset" to a "dark" state in which it is largely depleted of excess charge. In one example, in which Vdd is 5V, photodiode diffusion 206 is reset to 1V which is the dark state (i.e., the voltage associated with no radiation being sensed by pixel 200). During reset, switch 225 is closed so that the reset voltage (the output of charge integrator 210) can be applied to line 212 and hence photodiode diffusion 206.
Fault analysis and correction block 24 may electronically determine if a given pixel is a faulty pixel. It may do this in various manners. For example, after a pixel is reset, that pixel may be sampled at a later time to determine whether its voltage has deviated from that of a dark state. Remember that on reset, a pixel photodiode is discharged such that the pixel assumes a voltage associated with the dark state (e.g., about 1V). If, upon sampling the reset pixel, it is found that the pixel voltage deviates from that associated with this dark state, the pixel may be deemed faulty by fault analysis and correction block 24. In this case, the output of that pixel is corrected or masked during subsequent images.
Returning to FIG. 2A, the reset mechanism for testing pixels is depicted. While pixel 200 is not exposed to light, charge integrator 210 discharges photodiode diffusion 206 over line 212 to the reset voltage Vr. Note that this requires switching transistor 214 on. The pixel is then disconnected from charge integrator 210 by turning off transistor 214 and photodiode 206 is allowed to remain idle for a fixed length of time. The charge on photodiode diffusion 206 is then read-out through charge integrator 210 by again closing switch 214 (FIG. 2B). The associated detection circuitry then determines whether pixel 200 is corrupted.
This technique will determine whether charge leaks between the photodiode diffusion 206 and well 204. If positive charge leaks into the diffusion (in the case of a p-type diffusion and n-type well), the pixel is found to be faulty during the above test. If uncorrected, the faulty pixel will appear as a "white pixel" (i.e., it will appear inappropriately bright).
This is not the only type of pixel defect of relevance here. Sometimes a pixel will be partially or completely blocked as by a dust particle remaining from fabrication. It is also possible that new particles will block the pixel during the CMOS imager's operating lifetime. Also, the optical elements on a pixel (lens, filter, etc.) may degrade and obstruct radiation. These types of failures result in "dark pixels" (i.e., the pixel appears inappropriately dark in an image). Unfortunately, obstruction type defects can not be tested without providing light to the array. Thus, an optical test must be employed. Various optical tests are known in the art and employed before CMOS imagers are shipped. Such tests usually involve resetting the pixels as described above, exposing pixels to known quantities of radiation and then reading their outputs. Variations of such tests may be employed to periodically test the imager over the course of its life. If any pixel so tested, outputs less charge than expected, the pixel is deemed faulty and must be corrected.
Still another type of pixel fault results from various intrinsic defects in the photodiode itself. These may result because the radiation collection region of the pixel is larger or smaller than desired (i.e., the photodiode diffusion size does not meet specifications), the dopant concentration in the photodiode deviates from a desired value, radiation reflects off metal proximate the pixel, etc. Each of these gain mismatch faults results in an erroneous pixel reading. If they cause excess charge to accumulate in the photodiode, they result in white pixels, and if they cause too little charge to accumulate in the photodiode, they result in dark pixels. Optical tests, as described above, may be employed to test for and classify such gain mismatches.
Regardless of the type of testing employed (optical or electronic), fault analysis and correction block 24 may operate in various manners. In one embodiment, block 24 merely determines whether a given pixel is faulty or not. In a more sophisticated version, block 24 not only determines whether a pixel is faulty, but what type of fault it harbors and just how faulty it actually happens to be. For example, in one embodiment, the system determines whether a given pixel is working correctly, is partially corrupted (white or dark), or is completely corrupted. It may make this determination depending upon how far the expected pixel intensity (photodiode voltage) deviates from an expected value.
This embodiment is depicted graphically in FIGS. 3A and 3B. The vertical axes represent the pixel output voltage as output by charge integrator 210. Note that, in the case of a p-type photodiode diffusions, the greater the amount of illumination striking a pixel, the lower the voltage output by charge integrator 210. Conversely, lower amounts of illumination result in higher output voltages at charge integrator 210. The opposite is true for n-type photodiode diffusions. In FIG. 3A, the classes of pixel output encountered in a "dark test" are depicted. In the test, the pixels are reset and held in the dark for a defined period of time before their outputs are read. In FIG. 3B, the classes of pixel output encountered in an optical test are depicted. In this test, the pixels are reset and then exposed to a defined quantity of illumination for a defined period of time before their outputs are read.
In either case, the test begins with pixel 200 is reset via transistor 214 to an expected value 302 indicated in FIG. 3. If the measured output at charge integrator 210 falls within a correct working zone 304, the pixel is deemed correctly working. In the case of the dark test depicted in FIG. 3A, if the measured pixel intensity (voltage) falls below working zone 304, the pixel is deemed corrupted. The only question remaining is whether the pixel is "partially corrupted," in which case its output may be used in a modified fashion, or "completely corrupted," in which case its output can not be used under any circumstances. If the test pixel's output falls within within a partially corrupt zone 308, the pixel is deemed partially corrupted and treated accordingly. A pixel voltage lying below partially corrupted lower zone 308 is in a completely corrupted lower zone 312 and that pixel is deemed to be completely corrupted and treated accordingly.
Turning now to FIG. 3B, if the optical test shows that the test pixel's output voltage is above working zone 304, the pixel is obstructed or otherwise subject to a gain mismatch. If the output voltage is only slightly elevated from working zone 304 and lies in a zone 314, the pixel is deemed partially corrupted. If the output voltage is significantly elevated and lies in a zone 316, the pixel is deemed completely corrupted. In some cases, the optical test may reveal that the output voltage is lower than expected, in which case the pixel is not obstructed but is instead subject to a gain mismatch. Such gain mismatch might result from an oversized light collection surface on the pixel. In any event, such gain mismatch results in a partially or completely corrupted pixel depending upon the magnitude of the mismatch.
As will be explained in more detail below, partially corrupted pixels may be treated differently from completely corrupted pixels. In the simpler embodiment, pixels are never treated as partially corrupted, they are either working correctly or completely corrupted.
As suggested above, the output of charge integrator 210 will be an analog signal indicating the integrated illumination of a currently analyzed pixel. In order to easily analyze this signal and make any necessary corrections, the analog signal should first be converted to a digital signal. This is accomplished with analog-to-digital converter 18 as mentioned above. Preferably, analog-to-digital converter 18 is formed on the same chip with pixel array 12.
FIG. 4A provides a process flow chart of a generic method 500 that may be employed to test pixels to determine if they are faulty. The flow chart applies to both optical and non-optical tests. The process 500 begins at 501 and in a step 502, the photodiodes in an array are charged to a reset voltage, Vr. As mentioned, this voltage corresponds to the state of the pixel when no radiation has struck it.
Next, at a step 503, a decision is made as to whether the test is an optical or non-optical test. If it is an optical test, the pixel array is exposed to a defined quantity of radiation at a step 504. Thereafter, process control is directed to a step 506 (described below). If the test to be conducted is a non-optical step, no radiation is provided. In that case, a dark current test is being conducted and the next step (step 505) delays reading the pixels for defined length of time that preferably corresponds approximately to the exposure time of the pixels while in use.
At this point, the process continues a step 506, where fault analysis and correction block 24 selects a first pixel to be evaluated. Evaluation involves assessing the output voltage of that pixel at a step 508. Thereafter, at a step 510, analog-to-digital converter 18 converts the analog value for that output voltage to a digital value. From this digital value, logic block 24 determines whether the pixel has an actual output voltage significantly deviating from an expected output voltage. See step 512. Next, logic block 24 may optionally determine if the pixel is partially or completely corrupted based upon any deviation from the expected output voltage. See step 514. Block 24 may also classify the corruption according to the classifications presented in FIGS. 3A and 3B.
Assuming that the system determines that the pixel is at least partially corrupted, it stores the location of the corrupted pixel and the type of corruption (partial or complete) in memory 26. This is accomplished at a step 516. If the pixel is partially corrupted, the system may also store some information about the type and degree of corruption. As explained in more detail below, this information is used to correct the partially corrupted pixel during readout. After the information associated with the corrupted pixel has been stored, block 24 determines whether the pixel under consideration is the last pixel in the array at a step 518. If so, the process is then completed at 526.
If decision step 518 is answered in the negative (i.e., the current pixel is not the last pixel in the array), the system moves to the next pixel in the array at a step 522. After that, process control returns to step 508 where the system accesses the output voltage of the new current pixel in the array.
Note that if decision step 514 is answered in the negative (i.e., the pixel under consideration is not corrupted), process control is directed to decision step 518 where the system determines whether the pixel under consideration is in fact the last pixel in the array.
FIG. 4B presents a process flow diagram of one method 530 for masking faulty pixels during generation of an image. The process 530 begins at 532 and in a process step 534 exposes the pixels of the array to a radiation pattern defining an image. This charges the individual photodiodes of the individual pixels and thereby temporarily records the image. Next, at a process step 536, the system specifies a current pixel for analysis and accesses memory 26 for information concerning that pixel. From the information stored in memory, fault correction block 24 determines whether the current pixel is corrupted at a decision step 538.
Assuming that the current pixel is not corrupted, the system reads the output voltage of the pixel at a step 540. Thereafter, that output voltage is converted to a display value (possibly after conversion from an analog format to a digital format) and added to a currently generated image. This is accomplished at a step 542.
The system may then determine whether the current pixel output provides information sufficient to allow correction of another pixel at a decision step 544. As will be described below, some masking and correcting techniques for defective pixels require output information from adjacent (or nearby) uncorrupted pixels. Thus, if the pixel under consideration is adjacent to (or at least nearby) a corrupted pixel, the output information of the current pixel may be employed to allow masking of the corrupted pixel. Assuming that this is the case (i.e., decision step 544 is answered in the affirmative), the system calculates a mask value for the previously corrupted pixel at a step 546. Thereafter, the system applies that mask value to the image at the location of the corrupted pixel. This is accomplished at a step 548.
Returning to decision step 538, if it is answered in the affirmative (i.e., the current pixel is corrupted), the system next determines whether there is sufficient information available to mask or correct the current pixel. This is accomplished at a decision step 550. If there is sufficient information available to mask the current pixel (e.g., the output values of enough uncorrupted surrounding pixels are already known), the system calculates the mask value for that pixel at a step 552. Thereafter, it applies the mask value to the image being generated at a step 554 (i.e., it replaces the output of the corrupted pixel with a corrected or mask value). If decision step 550 is answered in the negative (i.e., there is insufficient information to mask the current pixel), the system flags the current pixel as requiring a mask value when sufficient information is available from nearby pixels. This is accomplished at a process step 556.
After either process step 554 or 556, the system determines whether the current pixel is the last pixel to be considered in the array or an appropriate subsection of the array. This is accomplished at a decision step 558. Note that process control is also directed to decision step 558 after process step 548. Still further, process control is directed to decision step 558 if decision step 544 is answered in the negative.
In any event, assuming that the current pixel is not the last pixel in the array (i.e., decision step 558 is answered in the negative), the system moves to the next pixel in the array for evaluation at a step 560. Process control is then redirected to step 536 where memory 26 is accessed for information about the new current pixel. Thereafter, the process proceeds as described above.
Assuming that the system determines at decision step 558 that the current pixel is in fact the last pixel in the array, it then completes the image and makes that image available for output (in the case of a full image or frame buffer). Alternatively, if the system employs a line buffer or some other buffer that holds less than an entire image, decision step 558 determines whether the current pixel is the last pixel in a line. If so, the line is made available for output. Regardless of the buffer details, the appropriate pixels (line, frame, etc.) are output at a process step 562. The process is then completed at 564.
A generic process by which a pixel is corrected at step 552 (or 546) is detailed in FIG. 4C. The process begins at 570 and then in a decision step 572, the system determines whether the current pixel is completely corrupted. Such information should be available from memory 26 and obtained during step 536 (FIG. 4B).
Assuming that the current pixel is deemed to be completely corrupted, the system generates a corrected output value for that pixel at a process step 574. Note that in the embodiment depicted in FIGS. 3A and 3B, a completely corrupted pixel would lie in one of ranges 312 and 316. In the embodiment depicted in FIG. 4C, the system may generate the corrected output value by interpolating output values of surrounding pixels (assuming those output values are available). If all of the surrounding pixels have not yet been evaluated, the final interpolated correction for the pixel at hand must await output values of the adjacent uncorrupted pixels. After step 574 is complete, the process is finished at 578.
In the case of a color imager, the masking operation must be cognizant of the color of the pixel that is being corrected. FIG. 5 illustrates the layout of a conventional primary color pixel array (red, green, and blue). It should be understood that the invention may be practiced with other color pixel arrays such as those employing complementary color filters. In the embodiment of FIG. 5, green pixels are labeled "G," red pixels are labeled "R," and blue pixels are labeled "B." If the pixel deemed completely corrupted is green, then only green pixels should be chosen to provide the mask. The same holds true for red and blue pixels. Since the nearest neighbor pixels to faulty pixel will not be green, the next closest green pixels should be chosen for the mask. These may provided on the same line as the defective pixel and/or adjacent lines. In a very precise (but computationally expensive) operation, not only nearest neighbors but the next nearest neighbor pixels are employed to make the correction.
Assuming that the current pixel is deemed to be partially corrupted (i.e., decision step 572 is answered in the negative), the system next determines whether the pixel is saturated at a decision step 575. This means that the output of the pixel is now maximal and any further illumination will not increase the amount of charge stored in the diffusion. Thus, it is impossible to know how much radiation actually illuminated the pixel during exposure. Because of this, the output is unusable and the system must resort to masking the pixel with the outputs of other (surrounding) pixels. Hence, the saturated partially corrupted pixel is treated like a completely corrupted pixel. Returning to FIG. 4C, if step 575 is answered in the affirmative, process control moves to step 574 where the faulty pixel's output is masked by an interpolated output taken from surrounding pixels.
If decision step 575 is answered in the negative (i.e., the partially corrupted pixel is not saturated), the system generates a corrected output value based upon the deviation of the current pixel's test output from the expected test output. This is performed with aid of a correction model at a step 576. Note that the information for the correction model could be obtained at steps 508-514 of process 500 depicted in FIG. 4A. Note also that the output values of surrounding uncorrupted pixels may be used together with this deviation information to obtain the corrected output value at step 576. After step 576 is completed, the process is finished at 578.
Most simply, correction may involve adjusting the output of the partially corrected pixel by a fixed amount or percentage. For example, an electronic test may indicate that a pixel is 30% brighter than appropriate. The correction may simply involve decreasing the intensity of the pixel by an appropriate percentage in producing the image. Or an optical test may indicate that a pixel is 20% darker than appropriate. In this case, the correction may require increasing the intensity of the pixel by an appropriate amount in producing the image.
Generally, all necessary correction information will be stored in memory 26. The correction information will model the behavior of the partially corrupted pixel so that the appropriate correction factor or addend is provided for the current operating conditions. Thus, memory may have to store correction information for various conditions. Relevant conditions/parameters include operating temperature of the array, time of exposure to radiation, and the like.
The CMOS imagers of this invention may be deployed in various systems for military, scientific, business, and home applications. For example, they may be used in digital cameras, video recorders, night driving displays, etc. Generally, the systems will include, in addition to the CMOS imager chip, optics to capture an image and direct it onto the CMOS array. This may include one or more lenses, filters, etc. of the types conventionally employed in image capture systems. The optics and CMOS imager will be mounted in a casing such as a camera case. Further, the system may include a memory for temporarily storing captured images for later downloading to a display system. In some instances, the display system itself will form part of the overall imager system.
Although the foregoing invention has been described in some detail for purposes of clarity of understanding, it will be apparent that certain changes and modifications may be practiced within the scope of the appended claims. For example, while the specification has described certain pixel and chip architectures which accomplish the objectives of the present invention, many others which will be understood by those of skill in the art from the present disclosure to be within the spirit of the present invention may equally be used. For example, while the specification has exemplified a passive pixel, other pixel types such as active pixels (of photodiode or photogate type) containing on-pixel amplifiers also could benefit from use with the invention. In addition, the broad fault correction methods of this invention could profitably find use in non-CMOS technologies such as CCD technology, but the various system features might have to be implemented on separate chips. Therefore, the present embodiments are to be considered as illustrative and not restrictive, and the invention is not to be limited to the details given herein, but may be modified within the scope of the appended claims.
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Owner name: SGS-THOMSON MICROELECTRONICS, INC., TEXAS
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subset: commoncrawl


text:
The Latest
31 Dec 14
Roy Williams Emphatically Tries to Call Timeout, Gets Technical Instead, Angrily Takes Off Suit
He was still kinda mad about it after the game.
15 Jul 14
Roundup: Watch Bystanders Foil Carjacking, College Football Gambling Lines Out & Police Taser Drunk at Legoland
A guy on a motorcycle can hear a car skidding into him before he gets hit.
24 Apr 14
Roy Williams Dancing to 'Happy' Will Brighten Your Day
Smooth moves.
23 Mar 14
11 Jan 14
UNC Whistleblower Called Out Roy Williams Over Player Who Could Not Read
One basketball player had to be taught how to sound out polysyllabic words.


text:
To make reservations by phone, call 1-800-228-9290 in the USA and Canada (or any of our worldwide reservation telephone numbers).
It Pays to Book Direct™
It Pays to Book Direct™
Atlanta Evergreen Marriott Conference Resort
4021 Lakeview Drive
Stone Mountain, Georgia 30083 USA
4021 Lakeview Drive
Stone Mountain, Georgia 30083
Hartsfield-Jackson Atlanta International Airport - ATL
Airport Phone: +1 800 897 1910
Hotel direction: 36.7 miles NE
This hotel does not provide shuttle service.
Take I-85 South 2 miles to I-285 East. Follow I-285 East to Hwy 78 East (Exit 39B). Travel approximately 7 miles to Exit 8 for Stone Mountain Park's Main Entrance.
For more information call the general manager of the hotel


text:
How To Have A Long-Lasting, Loving Relationship
How To Have A Long-Lasting, Loving Relationship
How To Have A Long-Lasting, Loving Relationship
Everyone wants to be part of a happy and stable couple. But, with the divorce rate so high, creating emotionally intimate couplehood is a considerable challenge. Here are 6 crucial insights about how to maintain a thriving, romantic relationship:
1. Nurture each other. One overriding rule: intimate relationships are nurturing relationships. Everyone realizes that children need to be cherished and supported for healthy development. Well, your romantic partner needs you to encourage and nourish him/her everyday as well. Paying careful attention to your partner, and giving yourself in this way to him/her will create a very powerful bond of love and trust between you.
2. Actions speak louder than words. It's easy to say, "I love you." If you've got the money, it's easy to buy gifts. But the best gift of all is your focus and attention.
What's going on in your partner's day, week, or month? Is his mother sick? How did the meeting with the school go? Is she still upset with her boss? If you forget to ask about important events and feelings, your partner will assume that you're not interested in connection, and that something or someone else is more important to you than they are.
If you know that you are a forgetful person but you want to remember the details of what is important to your partner, it's kosher to write a little note to remind yourself to ask about x, y, or z. Writing the note shows your intent to be involved in their life. Should We Live Together Before We Get Married?
3. Give the ultimate gift. Loving someone is not giving them what you want to give them, it's giving them what they want to be given. Sometimes this is a very tall order. When you are trying to be caring and affectionate, be honest with yourself. Are you actually attempting to meet the person's stated needs?
If you are giving them what you would like yourself, or what you wish they would want to get, don't be disappointed at their reaction.
4. Show appreciation. Give honest thanks and acknowledgment. When you see your partner trying to nourish you, show your love and appreciation. Everyone likes to be recognized for their efforts, even if they miss the mark.
More Juicy Content From YourTango
5 Ways To Be Happy About Your Love Life Right Now!
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Are you having a lot of what sex therapists call "mercy sex"? Is having mercy sex your "go-to" solution for desire and sexual recipe differences? Many couples and sex therapists actually advise this — bad idea. Routine mercy sex actually brings you further apart, NOT closer together.What is mercy sex? Well, if you go on the internet... READ MORE
I've been a couples therapist for nearly four decades, and when I give advice, I base it on a combination of my years of experience counseling couples, my personal experience with balancing marriage, work, sex and children, combined with a healthy dose of reading the research. If you're a married man who is interested in sex, and you... READ MORE
Are you part of a couple, or a 'developing' couple? Well, with Valentine's Day coming, how do you feel about it? Are you excited? Stressed out? Worried about disappointment or jealousy? Do you get caught up in comparing what your honey got you for Valentine's Day with what your friends' sweeties got them? Or are you hoping... READ MORE


text:
Have a question? Call us @ 505.727.8000
Dennis Domrzalski, Reporter- Albuquerque Business First
Through the end of December, Lovelace Health System will match donations to Roadrunner Food Bank in Albuquerque and hopes to donate a total of $33,000 to the nonprofit.
Dr. John Iacuone, Chief Medical Officer for Lovelace hospitals, was interviewed on KASA This Morning on Lovelace matching holiday donations to Road Runner Food Bank and a new cancer study.
Road Runner Food Bank Drive
New Cancer Study
Albuquerque, NM – Sharing a gift with Roadrunner Food Bank this month has twice the impact. Throughout the month of December, Lovelace Health System will double gifts made to the Food Bank through December 31, 2013 up to $33,000.
Lovelace Medical Group Women's Health Center opened in October at the Medical Pavilion at Lovelace Women's Hospital, 4705 Montgomery Blvd NE, Suite 301-302. A second Women's Health Center will be opening in December on the Westside at the Westside Professional Office, 4801 McMahon Blvd, Suite 110. Appointments can be made at both locations by calling 727-4500.
Saturday, Dec. 14, 2013, the community was invited to a ribbon cutting event to celebrate the opening of the second NextCare/Lovelace Urgent Care Center located at 9551 Paseo del Norte Blvd. N.E.
The first NextCare/Lovelace urgent care clinic opened in October at 8201 Golf Course Road N.W., Suite A3, in Albuquerque.
The UNM Anderson School of Management Foundation Board will celebrate and honor its 2014 Hall of Fame Inductees March 13 during a banquet at Hotel Albuquerque with a theme of "Lift Off," featuring the New Mexico Spaceport.
Spaceport Director Christine Anderson is the keynote speaker, and astronaut Mike Mullane is also on the agenda. Other elements include the loan of a space capsule and space suit from the Alamogordo Space Museum.
This is the 25th year for the event that celebrates the best and brightest of Anderson alumni, faculty and community leaders.
On Friday, Dec. 13, Lovelace Westside Hospital and Lovelace Regional Hospital - Roswell celebrated their recent recognition as a Best Place to Work by Albuquerque Business First. Lovelace Westside Hospital ranked 4th and Lovelace Regional Hospital - Roswell ranked 8th in the medium-size company category. Congratulations!
To see this story in print, click here.
Donations of up to $33,000 to Roadrunner Food Bank through Dec. 31 will be doubled thanks to a matching pledge from Lovelace Health System.
"With your help and Lovelace's we are able to feed nearly 40,000 hungry New Mexicans each week. And your gift today will help us feed hungry children, families, individuals and seniors well into the New Year," the food bank said in a news release.
"Your gift this month will go a long way to help achieve our mission and provide hungry people hope in the New Year," the organization said.
November was Prostate Awareness Month. Dr. Mario Leyba from Lovelace Medical Group did an interview with Univision about how early detection can save lives.
KLUZ Piece
Lovelace Medical Medical Center CEO Troy Greer, city of Albuquerque Chief Administrative Office Rob Perry, Sister Nancy Kazik, Lovelace Medical Center Chief of Staff Dr. Diego Gonzales and Lovelace Health System President and CEO Ron Stern turned on the lights to the holiday tree atop the Lovelace Medical Center near downtown on Thursday night. This is the 43rd year in a row that a tree has decorated the top of the hospital.


text:
Photos: Get to know your favorite Rangers and their superhero alter egos
Photo: John F. Rhodes / Staff Photographer
C.J. Wilson -- Aquaman: Super strength: Left arm made of enchanted waters. ... Weakness: Known to occasionally lose control of himself.
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text:
Q&A with Robert Samuelson
Robert Samuelson spoke about the business of journalism and his experiences as a columnist for Newsweek magazine and the Washington Post. His… read more
Robert Samuelson spoke about the business of journalism and his experiences as a columnist for Newsweek magazine and the Washington Post. His columns concentrate on economics, politics, and socio-economic issues.
He was hired in 1969 as a metro reporter. When he arrived to work, executive editor Ben Bradlee asked him to take an opening on the business desk. In 1976, while working for the National Journal, he started a column that was picked up by the Washington Post the following year. He became a columnist for [Newsweek in 1984. He has authored several books. The latest was released in paperback in 2010 and is titled, The Great Inflation and its Aftermath. close
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- Brian Lamb Host C-SPAN
- Robert J. Samuelson Columnist Washington Post
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Law Offices of Freedman & Freedman, PLC
Whether you face traffic or felony charges, or an injury due to the negligence of another, call us. At our firm, you work directly with a partner. We will never pass you off to a paralegal or secretary who can't effectively handle your case.
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(248) 851-5520


text:
The Barrel-Aged Wreck Alley Series is our brewer's grand experiment in exploring the depths of our award-winning Imperial Stout. Given free rein to indulge their creativity with different types of barrels and unique ingredients, they've crafted exciting variations on the classic style. Each limited release batch is numbered and produced only once--hoard accordingly.
There's extremely limited quantities of this rare beer this year. Given small amount we had to work with, all of the beer is only on draft this year. Look for it at fine bars & restaurants throughout California…..including all of our Brewery Restaurants and at our Tasting Room & Beer Garden.
Batch #1
Barrel Aged Wreck AlleyLimited Release
Batch #2
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Vanilla Bean Wreck Alley


text:
BMX Rider Nails World's First Quadruple Backflip
Riders Jed Mildon and James Foster have spent most of the last year competing to become the first to land a quad flip—just four years after Mildon hit the first triple flip. This weekend, Mildon won the race to four, helped in no small part by Foster's separated shoulder and 10 broken ribs suffered in failed attempts. »


text:
Articles tagged "NFL penalties"
A Tale of Two Penalties: NFL Officials Had Week 11 Ass Backward
NFL officials in the space of two days quite possibly altered the outcome of two games featuring four legit Super Bowl contenders with a pair of calls that clearly contradicted each other, not to mention the spirit and even the letter of long-held laws of professional football.
Pussified NFL Hits New Low: San Francisco 49ers Penalized For Hitting Drew Brees Shoulder Pads
The evermore emasculated and pussified NFL hit a new low in Week 11. Officials penalized San Francisco for hitting New Orleans Saints QB Drew Brees in the, you know, shoulder pads. Good luck, America, with the rapidly approaching National Flag Football League.
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- Quality Stats Super Bowl Breakdown: Patriots vs Seahawks
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- NFL 2014 Playoff Seeds and Schedule
- Cold Hard Football Facts Quality Stats: Perfect 4-0 In Wild Card Weekend
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SHERRODSVILLE Calvary United Methodist Church, with assistance from the community will present the 14th annual Skunk Hollow Christian Music Festival today through Sunday.
SHERRODSVILLE Calvary United Methodist Church, with assistance from the community will present the 14th annual Skunk Hollow Christian Music Festival today through Sunday.
Music and fellowship will be the theme for the event beginning at 5:30 p.m. today at Sherrodsville Community Park, at the state Route 39 and 212.
There is free admission to the festival, which will feature a number of bands today and Saturday and wrap up with a Sunday service at 9:30 a.m. featuring The Gospel H.I.M.S.
People are invited to bring their own lawn chairs, blankets, or sleeping bags to spend the day and enjoy the music and Christian fellowship.
In case of rain, concerts will be held at Calvary United Methodist Church, 1.4 mile west on state Route 39.
The schedule will be a busy one. Here is what's on tap:
5:30 p.m. — Jim McConnell
6 p.m. — County 79
6:30 p.m. — Doug Barrick
7 p.m. — Michael Moore
7:30 p.m. — Sisters in Christ
8 p.m. — Jerome James
Noon — George Imes
12:30 p.m. — Gospel Strings
1 p.m. — The Gospel H.I.M.S.
2 p.m. — Just Betty
2:30 p.m. — Bill Ripley
3 p.m. — Sue Cooper
3:30 p.m. — The Faithful Four
4 p.m. — Darla Wheeler
5 p.m. — 4 in 1 Quartet by Clair Besse
6. p.m. — The Murphy Sisters
7 p.m. — Sounds of Grace
9:30 a.m. Service featuring The Gospel H.I.M.S.
Many of the artists are from the area and are graciously giving of their time and talent to bless those who attend the festival.
Of course, no festival is complete without food and drink, both available at a reasonable cost.
Proceeds go toward festival costs, and love offerings at the festival will benefit locally based charities. A chicken barbecue also will be held Saturday and carryout is available. Dinners are $8 and include half chicken, potato salad, baked beans, dessert, roll and butter.
Some performers also have CDs and merchandise available for purchase.
Comments are currently unavailable on this article
Location, ST | website.com


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Yasaka V Stage
Ratings (rated 12 times)
There are 2 users using the Yasaka V Stage.From community:
Description of Yasaka V Stage
Every shot aimed at Glory, Super Performance rubber - Yasaka V Stage
For players searching for powerful spin and speed, V-Stage takes the lead. V-Stage is produced by simultaneously vulcanising high friction coefficient rubber to improve spring and high elasticity. This product stretches the natural rubber to their very limits. Compared to existing rubber sheets it demonstrates a 13% improvement in spin and 18% in speed.
Singapow on 3/18/2014
it's a nice offensive rubber,spinny,great quality.lighter than most tensors,no catapult effect needs very good technique , low throw angle.harder feel than mark v
hops4080 on 12/26/2013
Una muy buena esponja, para fh es muy confiable realizar el topspin con un movimiento muy bien controlado es totalmente recomendado, una buena esponja de yasaka.
guybrush123 on 6/18/2013
Good rubber from Yasaka, feels like an upgrade as MarkV. Same charasteristics, but slightly better in every aspects.
Table tennis trickster on 11/4/2010
A great all around rubber, incredibly light. Amazing topspin and backspin. But may suffer from speed against the likes of fast bats, such as coppa gold. I would reccomend this rubber to everybody, its the best rubber i have ever had!
Anonymous on 8/18/2010
Very fast rubber with low throw angle. If you got used to the spring sponges or tensors, u might find it difficult as this does not have the catapult effect. But that does not mean its slow. Faster than most tensors and power sponge rubbers. great for loop drive, loop or chop. very hard for the opponent to block it and the smashes are the best. though only very slightly grippy, i fu can work through the sponge u can generate enormous amounts of spin like tacky rubbers. One of the best out there, but needs an experienced person to control.
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Article | October 11, 2010
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60k - Success! We raised an additional 10k for The Trevor Project, which works to provide crisis intervention and suicide prevention for LGBT youth.
70k - Success! We raised an additional 10k for purchasing bus ads in Topeka, Kansas.
80k - Success! We raised an additional 10k for the National Alliance to End Homelessness. A large proportion of homeless people are either veterans or LGBT youth.
100k - An additional 20k to put another billboard up in Salt Lake City, Utah!
GOD Has Spoken!
The Westboro Baptist Church is a hate group based in Topeka, Kansas. This group protests at the funerals of soldiers, murdered children, and more. They carry around with them hate-speech signs that say that God hates gay people.
This evil lie has been put into the world by bigots like them for thousands of years. The time has come to right this wrong.
God LOVES gay, lesbian, bisexual and transgender people!
BEHOLD! God is tired of having hate-speech put into his mouth by bigots. Therefore, the LORD shall put up a billboard in Topeka, Kansas that declares to all that "God Loves Gays"!
The Impact
This project is extremely valuable to the world.
When people see villains such as Westboro existing in the world, and no one doing anything about it, it disheartens them greatly. They lose faith in humanity and in the world. This has all kinds of negative consequences across all life. The message we are sending transcends this particular issue.
Some people will argue that it is better to ignore the bigots, that all that Westboro wants is more attention. That it's better for good people to do nothing, to ignore the evil and just wait for it to go away.
While I respect this opinion, I contend that evil is only allowed to exist because good people do nothing.
The time has come for good people to fight back. With love!
It's time to send a message to these bigots. You want to come to other people's funerals to promote hate?
We'll come to where you live to promote love!
What You Get
I've created some awesome rewards for helping out:
THE DISCIPLE: One buck gets you subscribed to the campaign updates! Plus you get the honor of knowing you helped fight bigotry.
THE SAVIOR: 25 bucks gets you subscribed to the campaign updates plus you get the campaign bumper sticker!
THE SAINT: 50 bucks gets you subscribed to the campaign updates, the bumper sticker and the limited edition campaign t-shirt!
THE DIVINE PACKAGE: 75 bucks gets you subscribed to the campaign updates, the bumper sticker, the limited edition campaign t-shirt and you'll the God Loves Gays poster SIGNED BY GOD HIMSELF!
Of course, if you don't care about the rewards, and would rather your donation go entirely towards funding the billboard, you can do that!
After clicking on donate, just choose the option of inputting any amount and donate what you like.
Remember, the more money we raise, the longer we can have this billboard up in Topeka, Kansas. Who knows? If we raise enough we could put up billboards in other states as well! Perhaps this will go GLOBAL!
Other Ways You Can HelpIf you just can't afford to contribute, but really want to help, you can!
- Please share this campaign with as many people as you can, all over social media, and any media connections you may have. I need your help! Use the hashtag: #GodLovesGays
- Make sure to use the Indiegogo share tools and spread this project EVERYWHERE on social media for all 60 days of the campaign!
Thanks for your time, mortal!
If you support this idea, please donate NOW.


text:
Join OkCupid
Find better matches with our advanced
Find better matches with our advanced
matching system
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29 • Chapel Hill, NC • Woman
I'm looking for
- Everyone
- Ages 23-29
- Near me
- Who are single
- For new friends, long-term dating, short-term dating
My details
- Last online
- Jun 4, 2014
- Orientation
- Bisexual
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- Seeing Someone
- Height
- 5' 7" (1.71m)
- Body Type
- Fit
- Smoking
- No
- Drinking
- Socially
- Drugs
- Never
- Religion
- Atheism and laughing about it
- Sign
- Pisces
- Education
- Working on Post grad
- Offspring
- Doesn't have kids but might want them
- Pets
- Has dogs
- Speaks
- English (Fluently), Spanish (Somewhat)
My self-summary
Write a little about yourself. Just a paragraph will do.
Recovering good girl from the deep south
What I'm doing with my life
Don't overthink this one; tell us what you're doing day-to-day.
Pain research...
and really deep, metaphysical self-conversations :-p
and really deep, metaphysical self-conversations :-p
I'm really good at
Go on, brag a little (or a lot). We won't judge.
Panicking, care taking, waking up while it's still dark out and arguably still night
The first things people usually notice about me
I'm an empty essay… fill me out!
They all say "cute". I have no idea what the actual translation of that obvious code word is.
Favorite books, movies, shows, music, and food
Help your potential matches find common interests.
Bailey's Cafe, Eminem, Turtle, Swan, In America, Grey's Anatomy, veggies any way, Blue Valentine, A Wrinkle in Time, Ani Difranco, Islay scotch, The Believer, ice cream, Bonobo, A Southerly Course, Sugarbaby
The six things I could never do without
Think outside the box. Sometimes the little things can say a lot.
My dogs
Things to fawn over
Riding breeches
My dogs
Things to fawn over
Riding breeches
I spend a lot of time thinking about
Global warming, lunch, or your next vacation… it's all fair game.
On a typical Friday night I am
Netflix and takeout, or getting your party on — how do you let loose?
Trying actively to change this answer. Whoa, meta.
The most private thing I'm willing to admit
I'm an empty essay… fill me out!
Sorta don't buy into the whole confessionalism-as-virtue thing.
You should message me if
Offer a few tips to help matches win you over.
that's a thing you want to do. Really. Not being flippant.
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Updated 10/11/2013
This spectacular cavern, hollowed out of the limestone by rushing water, can be reached via a steep cliff path. Also worth exploring are the number of wonderful sandy beaches found as you head east to Tongue, especially the one at Sango Bay. Boat tours around the Kyle of Durness run daily from April through September.
Website: www.smoocave.org
Updated 10/11/2013
No Thanks


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The green lobby has tried this tack before. The Brookings Institution also employed a generous definition and still had to report that between 2003 and 2010, green jobs grew at a slower rate (3.4 percent annually) than the national economy (4.2 percent).
Grassley rightly argues, "Instead of focusing more money on this failed program, we need to focus on job creation in all sectors of the economy."
Unfortunately, the White House thought that it could stimulate the economy by rewarding favored donors and pet green causes, only to find that you can't build an economic recovery on a bubble of phantom jobs.


text:
Like what you see? Join Insider on Nov. 30 for our best deal on an annual membership ever: $19.99 and we give you a $20 Amazon.com Gift Card (while supplies last).
WCPO Insider is a membership bringing you closer to the city you love. As an Insider you receive rewards, stories and access to new experiences across your community.
Frisch's confirms it is in the process of changing its beverages from Coke to Pepsi products. (File images)
CINCINNATI - Say what? If comments on the Frisch's Facebook page are any indication, many fans of the Big Boy chain are not sold on the switch from Coke to Pepsi products.
There's more to the story when you become an Insider. WCPO Insider's membership is an additional benefit on top of everything you can get for free on WCPO.com. We created an entire digital organization dedicated to bringing you exclusive access to in-depth stories that you can't get anywhere else, handpicked events, and incredible savings on things you love to do. To find out more click here.
CINCINNATI - There's nothing quite like a Frisch's Big Boy burger when there's a craving, unless what you really desire is a Vanilla Coke.
If you want one, you won't find the beverage at Frisch's much longer. The restaurant chain plans to switch to Pepsi products by the end of January.
"It started when we opened our new restaurant in Lexington on December," explained Karen Maier, vice president of marketing. Since that first switch, Frisch's has been changing over to Pepsi, location by location.
Frisch's is ending the Coca-Cola era for two reasons, Maier said.
"Pepsi gave us a better deal than Coke," she explained. And now, she added, the restaurants will be able to serve Mountain Dew and Dr Pepper.
Many fans of Frisch's Facebook page aren't happy with the change, with users like Melinda McGibony Jarman posting: "Half the point of going to Frisch's is to get a good Coke. How could you switch to Pepsi? Is the tarter sauce next? This is not good for your business."
Other posters, like David L. Schwier, have commented that "Cherry Coke was practically invented by Big Boy," and write that abandoning Coke products is giving up on the restaurant's tradition.
Maier's message to those who say they'll stop going to Frisch's due to the change is a reminder: "We're a restaurant, we serve food."
"We are sorry for those people who say 'We aren't coming back,'" Maier said. "We're sorry if that's all you think of us."
Frisch's restaurants in the Toledo market have been serving Pepsi products for a number of years, she said, including the popular cherry-flavored Pepsi.
Taste was taken into major consideration before the change.
"One of the things that we did before we made our decision, was we bought Pepsi products from another restaurant and we added our vanilla and our cherry to them," Maier explained. "And we thought 'This will work, in addition to our ice and our flavorings.' We urge people to try it out."
As of Dec. 30, the Frisch's online beverage menu still listed Coke products.


text:
- Jessa Duggar shares a rare photo of her brother Josh Duggar's daughter Meredith - US Weekly
- Michael Lohan's estranged wife Kate Major is detained by cops at an airport - TMZ
- Is there something between Ben Affleck and Halle Berry? - Gossip Cop
- The Hunger Games author Suzanne Collins says goodbye to the popular series after the final movie is released - Just Jared Jr
- What happened backstage with Kylie Jenner at The Ellen Show? - Radar
- Bryan Cranston tears up over a Breaking Bad memory - Huffington Post
- Leonardo DiCaprio's Oscar race heats up - Lainey Gossip
- The Captain America: Civil War movie may be better than the comic book - The Hollywood Reporter
14 May 2014 at 1:15 PM
Hugh Jackman Premieres 'X-Men' in Beijing with Fan Bingbing & Peter Dinklage!
About this photo set: Hugh Jackman suits up as he arrives at the premiere of his new movie X-Men: Days of Future Past held at Indigo Shopping Mall on Tuesday (May 13) in Beijing, China.… Read More Here
Photo #: 3113089
Posted to Fan Bingbing, Hugh Jackman, Peter Dinklage, X-Men


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Tami Hennigh, SecretaryTilford Group218A Russ HallPittsburg State University1701 South BroadwayPittsburg KS 66762
Phone: 620-235-6584E-mail: email@example.com
First Meeting to establish the Tilford Group at PSU on April 27, 2007
September 16, 2015Activity: BaFa BaFa cross cultural simulation will be held on September 16, 2015. The activity will be held in the Governor's Room and Heritage Room, of the Overman Student Center from 3:30 to 5:30pm, hosted by Grant Moss and Harriet Bachner. This will be an excellent opportunity to learn how to conduct this fun cross cultural learning experience and to help your students extend their understanding about the complexity of integrating into a different culture.
October 19-20, 2015Michael Tilford Conference at Pittsburg State University
Fall 2015 - Spring 2016Fall 2014 - Spring 2015Fall 2013 - Spring 2014Fall 2012 - Spring 2013Fall 2011 - Spring 2012Fall 2010 - Spring 2011Fall 2009 - Spring 2010Fall 2008 - Spring 2009Fall 2007 - Spring 2008Complete Listing
Multicultural Cinderella Archives


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US Soybean Oil
Marcello Cultrera Nov 17, 2015 2:08AM GMT
Sunil 29/32 by Q4 2016, Soya Oil shows quite remarkable promise and winning market share from all other edible oils as rapeseed Oil and Crude Palm Oil - this thanks as well to USD strength on South American markets and with India and China buying aggressively. . On the demand side, soya oil is gaining demand from sun oil consumers who are price conscious. ***oil is also at a premium to soya oil. . Soya oil has been gaining market share from palm in the crucially important Indian market. . India's imports have soared by almost 50% in the last 5 years. Crude Palm Oil tonnages have increased by only 25% since 2011/2012 - while soya oil has recorded an increase of over 370%. . Soya oil imports will take market share from every other oil as its very attractively priced. . Soya Oil is the Must Own oil of 2016 with Crude Palm Oil. . Get in touch if you're interested on research and arbitrage/correlation trading opportunities to Crude Palm Oil and rapeseed oil and Biodiesel/ Biofuels markets.


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The following is a guest post from our friends at POPSUGAR Fashion.
Weddings are way up there on the momentous-occasion scale—so being a guest at one means you've got to look your best. Yes, all ceremonies are different, but there's a basic code of conduct and dress that applies to any kind of event. Follow the four tips below and you can't go wrong:
- First things first: the invite will usually spell out the dress code for you, so follow the clues and dress according to time and location. This is how you decipher the dress code: "casual"—a day dress, sundress or pretty skirt and blouse is a safe bet; "cocktail" or "semiformal" attire—a cocktail dress; "formal"—a floor-length dress or formal cocktail dress; "black tie"—opt for an evening gown or luxe cocktail dress.
- To put an end to the age-old debate, we're taking a firm stance on this one: no, you can't wear white to a wedding unless you are the bride. Call us traditional, but we'd rather err on the side of caution than commit a major fashion faux paux. Even if the bride is easy-going, or your dress is ecru, eggshell or cream, there's really no gray area here. Bottom line: just don't do it—at the wedding, the rehearsal dinner…even the bachelorette! To be the best-dressed guest you can be, just keep reading.
- You don't want to be overexposed (even if it's a hot and sticky summer wedding). Remember, weddings usually mean family is present—grandma and grandpa, the bride's nieces or nephews, the list goes on and on. You don't want to be remembered as the friend who forgot her slip, wore the dress with crazy cutouts or flashed the groomsmen with her way-too-short hemline. Do yourself a favor and look for chic dresses that won't show too much skin in front of the family circle or cause a wardrobe malfunction on the dance floor.
- Don't test-drive your new heels at a wedding. If you're breaking in your gorgeous new heels, it's safe to say you'll be missing out on any dancing. Break in your new footwear before the wedding; also, always be prepared with a few bandages in your clutch in case of blisters.
- Do go for bold jewels and pretty details. While we suggest steering clear of any over-the-top dresses, feel free to pile on the accessories. Not only is it a great way to dress up your look, but extra necklaces, bangles and earrings help make the most of the dresses you already own.
More from POPSUGAR Fashion:
- Get the Look: Three Ways to Channel Taylor Swift's Music Video Style
- The Ultimate White Dress Guide—Every Style, Every Budget
- Get Inspired by Nature For Your Summer Wardrobe—Here's How!
- Olivia Palermo Never, Ever Gets an Outfit Wrong (Here's the Proof)—Updated!
- No Filter Required: Black and White Styles We're Loving
More on Luckymag.com:
- 50 White Dresses Under $50
- Keira Knightley Got Married in a Five-Year-Old Dress
- White Dresses in Every Style, Ever
- 21 Lace Dresses We Love
- 30 Great Graduation Dresses For Budgets Big and Small
Keep up with the Lucky team on Twitter: Follow @LuckyMagazine


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Peter Mamara
Comments about Peter Mamara
Lyn Paul
Welcome back Peter. Where are your poems?
The First Letter
by M. Eminescu (1850-1889)
When at night, with a sleepy eye I blow the candle,
The length of time's flow, only the clock can handle.
And as I pull the drapes in my room to the right,
The moon engulfs everything with its warm light.
It retrieves from my memory, endless thoughts.
I feel the whole lot like in dreams that come in lots.
You move on Earth's dome, Moon you, mistress of the sea.


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Welcome, skip to the content.
Official site for Melbourne, Victoria, Australia
Address: 252 Swanston Street, Melbourne, Victoria 3000
Phone: 03 9663 7660
Web: cookie.net.au
The original bar in Curtin House, Cookie deserves the accolades regularly laid at its feet. A multiple 'Bar of the Year' winner, Cookie is a beer hall with a hidden cocktail lounge and palazzo balconies. It's also an excellent Thai restaurant with a fabulous menu of regional dishes that'll see you sated for beer snacks, banquets or in-between grazing.
Content: Tourism Victoria
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text:
Below are links to forms and websites to help you answer your benefits questions. For additional assistance please contact Human Resources at 994-3651!
CHOICES Forms
CHOICES Retiree FY16 Workbook
CHOICES Retiree Enrollment Form
2015/2016 CHOICES Mid-Year Change Form
Adult Dependent
CHOICES Informational LinksAllegiance Card Instructions (How to Read)
Allegiance Website Guide for Employees
Healthy Montana Kids
Frontier MEDEX Travel Assist brochure/card
MSU Benefits Committee
Standard Additional Life Insurance Information
Standard Life & Disability Information
Standard Travel Benefit Brochure
Standard Travel Benefit Brochure (Ex pat-over 90 days)
Standard Travel Benefit Form (Ex pat-over 90 days)
Summary Plan Description
Flexible Spending Accounts - Allegiance
Adoption Assistance Program
Day Care Reimbursement contract
Debit Card Enrollment Form
Direct Deposit Form
Dependent Care Reimbursement Form
FSA and TAA Eligible and Ineligible Expenses
FSA and TAA Medical Reimbursement Form
Informational WebsitesAllegiance
Allegiance Flex Advantage
Blue Cross Blue Shield
CHOICES Website
Delta Dental
Frontier MEDEX
Military Family Leave
Inter Unit Benefits Committee Members (IUBC)
New West Health Services - Retirees Only
Ridgeway Pharmacy
Standard Life Insurance
UNUM Long Term Care Insurance
MSU Wellness
URx - Prescription Drug PlanURx Website
Montana State University
P.O. Box 172520
Bozeman, MT 59717-2520
Tel: (406) 994-3651
Fax: (406) 994-5974
E-mail: email@example.com
920 Technology Blvd. Suite A Bozeman, MT 59718-4001
Dennis Defa


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Rumour has it though that the thumb operated winder designed for the 645e may work with some of the older models.
Printable View
Rumour has it though that the thumb operated winder designed for the 645e may work with some of the older models.
Ah ok. It's pretty nice on my Pro.
I have an M series from the early production. I can't say how many rolls I've shot but it's in the hundreds. I have nearly all the accessories and extra inserts, I even have the original case. It's a fine camera. I'm partial to it despite having to tilt it for vertical shots. It's never failed in me. I've replaced the seals once and that's it. Have fun with yours. I did but a Pro model a couple years ago. I have a nicely equipped RB67 Pro S too and the revolving back is a delight.
My preference these days is large format though.
Hello Nathan;
My 1000s has the AE prism, which is great for quick shots. This is an aperature priority system with the shutter speeds being selected. If you really like the camera this might be worth a look. For indoor shots a Sunpak 555 is used with 6 x 6 mount, letting the flash to be used in automatic mode. I like the fact of getting 15 exposures out of a roll of film, Steven.