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The Kentucky softball team's bats had been held at bay for much of the weekend at the NCAA Regional, including in a 2-1 loss in the first game of Sunday's regional final.
That all changed in a win-or-go-home game two.
That all changed in a win-or-go-home game two.
The Wildcats exploded for 10 runs in the first three innings, including six in the second to down DePaul, 10-1, and advance to their third NCAA Super Regional in the last four seasons.
DePaul had already lost once in the double-elimination tournament, so the Wildcats needed just one win Sunday in two chances. The Blue Demons prevailed in game one, 2-1 in 10 innings, to force a second game, and that's when the UK bats came up bigger than ever.
"Our hitters decided to put the team on their back and go out and score runs," UK head coach Rachel Lawson said. "In the other games, I think (Kelsey) Nunley did a good job of putting the team on her back and I thought we had good defensive play but I think that the mindset of the team offensively was we need to get this done."
UK advanced to the regional final with an unblemished 2-0 record, with a 2-0 win over Ohio on Friday and a 2-1 win over James Madison on Saturday. In the two victories, Kentucky rode Nunley's stellar pitching arm while scoring just enough runs to win.
After game one's 10-inning loss, the Wildcats had their backs against the wall and knew the offense had to come through in order to earn a ticket to Super Regionals.
"Coach just basically talked to us and said it was time to get it done," sophomore Christian Stokes said. "This is make-it-or-break-it, this is your opportunity right here, just go out here and have fun and take hard cuts."
In the bottom of the first inning of game two, Sylver Samuel got things going for the UK offense with an inside the park home run. The first homer of Samuel's career was a grounder up the middle through a drawn-in outfield that rolled all the way to the center field wall.
By the time the DePaul center fielder, who was playing in shallow left center, could get to the ball, Samuel was nearing third and thinking of home. Samuel circled the bases and a throw was never made to try and get her out at home plate.
"There were a lot of holes and a lot of people had shifted so I was just trying to get something started," Samuel said. "I was thinking more about making sure my timing was right and everything and finding a hole. I saw people still running when I was going to second. I saw that they hadn't gotten to the ball yet so I saw (Kristine) Himes running and I was like, 'Well, she's waving me,' so I just went for it."
Samuel's home run was the only run of the first inning, but it sent momentum and confidence into Kentucky's dugout.
"That was huge for our team," Stokes said. "We needed something that would get our momentum going and I think that was a huge at-bat. We scored a run on one hit, so that is huge. I think that got it started and then hits were going all around."
Nunley retired the side in order in the top of the second inning, and it was time for the UK bats to get back to work in a big way.
With two outs and the bases empty, the big inning almost didn't happen, but senior Emily Jolly reached on an error. Krystal Smith followed with a single and sophomore Ansley Smith walked to set up Stokes with the bases loaded.
Stokes sent a ball deep to left field that bounced off the top of the wall for a double. Just a foot short of clearing the fence, the bases emptied and gave UK a 4-0 lead.
"I didn't feel too much pressure," Stokes said. "When I got up there and I was on deck I knew that we had to get it done right here because this was a huge opportunity for us. I came up in the first game and didn't get the job done so I knew I wanted to help out my team and get it done on the second chance."
The runs didn't stop, however, as Samuel tripled to score Stokes and, after sophomore Nikki Sagermann walked, junior Griffin Joiner doubled down the left field line to score two more.
After UK scored a total of five runs in the previous 24 innings, the offense had just rattled off seven in the span of two innings.
With the hits, five of them in the first two innings, came momentum for both the offense and Nunley in the circle.
"I think the momentum definitely shifted towards us once we started getting hits," Samuel said. "That picked us up a lot and I think it just got our offense rolling and I think it gave Kelsey (Nunley) confidence that she didn't have to put the team on her back as much."
Along with the Wildcats' ability to make adjustments at the plate in the second game, the key to their offensive success in the second game was the fact that they moved on quickly from the first game's loss.
A team with four sophomores in the starting lineup, including the first three in the order, was able to forget about game one and quickly shift its focus to getting key hits in game two.
"You just have to move on," Lawson said. "You have to bounce back if you want to keep going. The nice thing about our team is that they love softball. They are able to adapt, adjust and move on. What we lack in certain offensive numbers, I think we make up for in terms of mental toughness and sure grit."
That mental toughness and grit is what has helped UK to a school-record 47 wins in 2014, the program's first-ever trip to the SEC Tournament Championship game and now a second consecutive NCAA Super Regional appearance.
The Wildcats, seeded 14th in the 64-team NCAA Tournament field, head to Los Angeles next weekend to face third-seeded UCLA in a best-of-three series.
To advance to its first Women's College World Series in team history, Kentucky will need the hot bats that came to life in Sunday's second game. That, and more of the toughness and grit that got them there in the first place.


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Sumbu aka STR
1 Sumbu aka STR Articles
Is Simbu aka STR in love?2 years ago 0
The actor seems to be in love and he definitely isn't denying it. But who is his ladylove? Silambarasan aka Simbu, who prefers to be called as STR… Read Article ▶
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subset: commoncrawl


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Hundreds of beauty professionals from Indiana came forward last Friday, January 20, for a hearing on Indiana HB1006 (House Bill 1006), which would deregulate the cosmetology industry in that state by removing the Board and cosmetology licensing.
As of today, January 25, Indiana Representative David A Wolkins, the Bill sponsor, has officially withdrawn the Bill and will not be pursing the legislation in 2012. The withdraw follows a PBA Action Alert that resulted in more than 18,000 Indiana beauty professionals sending letters directly to Rep. Wolkins. In addition, several beauty organizations joined this effort, helping PBA pass on the importance of opposing this Bill for the professional beauty industry and the health and safety of Indiana consumers.
The Professional Beauty Association (PBA) would like to thank everyone who participated in the effort and the following organizations for helping get the word out against Indiana HB1006.
- JCPenney: Paula Phillips, Paula Malloy, Diana Kelley
- SportClips: Gordon Logan and Ray Dorulla
- AACS: John Halal (Honors Beauty College)
- PCPC, ICMAD, ISPA, ISBN, AACS, NCEA, and Intercoiffure
PBA keeps professionals informed on legislation affecting the industry and develops grassroots advocacy plans, including reaching out to legislators and governors of each state to help them understand the importance of education for the professional, health and safety for the consumer, and the impact the professional beauty industry has on the U.S and global economies. To stay informed and speak out when the time comes, visit probeauty.org/advocacy.


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Teen Mom
Gary Shirley Visiting Amber Portwood in Jail Today!
The moment we've been waiting for has finally arrived! Teen Mom's Gary Shirley is taking a road trip to visit his baby mama, Amber Portwood, at the Rockville Correctional Facility, where she's currently serving a 5-year prison sentence after opting out of her court-ordered drug rehab program.
As far as we know, Gary hasn't visited Amber once since she's been in jail, so this trip is most definitely a long time coming. "2 1/2 hour drive to and from Rockville tomr I need a passenger for company..." Gary tweeted, to which Gary'sTeen Mom co-star, Ryan Edwards responded "Come pick me up."
Of course when Gary elaborated that "We're gonna go see Amber," Ryan seemed less than interested. But wait — who is the "we" in "we're gonna go see Amber"? Is it possible that Gary is bringing his daughter, Leah, along for the ride? This gal hasn't seen her mommy in months, and it's about time that they reunited!
We can't wait for Gary to update fans about how his baby mama is doing — with any luck Amber will keep up the good work and get out of jail well before her 5-year sentence is up!


text:
Sunday, December 2, 2012
© Copyright 2015 Albany Herald
ALBANY -- Lucille Turner Bowman, 67, of Albany, died Saturday, December 1, 2012, at her residence.
Funeral services will be conducted at 11 a.m. Wednesday, December 5, 2012, at Cordray United Methodist Church. Interment will follow in Cordray Methodist Church Cemetery in Calhoun County.
The full obituary may be viewed on our website.
The family will receive friends from 6 p.m. until 8 p.m. Tuesday, December 4, 2012, at Mathews Funeral Home.
To sign our online registry or to send condolences to the family, you may visit Mathews' website at www.mathewsfuneralhome.com.
Mathews Funeral Home
Albany 229/435-5657


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Consistency the Story in Review of 2012-13 Track & Cross Country
Joe Franklin's cross country and track & field teams showed some talent as they racked up the honors and the championships in the 2012-13 season.
Lobo Track Scores 23 All-Mountain West Selections
For the men, seven individuals claimed 10 total honors, while nine women and a relay team scored 12 total selections.
Lobos Women Finish Second, Men Third at MW Outdoor Championships
The Lobo women racked up 145.5 team points over the four-day meet, while the men combined for 149
Lobos on Title Run in Sin City as Men Eye Triple Crown
The Lobos are heading to the MW Championships with high expectations as the men aim to back up their indoor title.
Lobos Post Solid Showing at Brutus Hamilton Invitational
Out at UC Berkeley, New Mexico posted 35 top-10 finishes and multiple season bests.
2012 MW Outdoor Championships
The UNM track and field team takes on the MW at the conference championships in Colorado Springs, Colo., May 9-12.
Don Kirby Invitational
The Lobos played host to some of the premier institutions across the nation at the Don Kirby Invite, Feb. 10, 2012.
2013 Indoor: Ran at seven meets for UNM ... Opened at the Lumberjack Team Challengewith a 15th-place showing in the 200 (26.16*) and a 16th-place time in the 60 (8.03*) ... Clocked times of 25.95* and 8.02* in the 200 and 60, respectively, at the Cherry & Silver Invitational ... Ran in the 400 at the New Mexico Classic (12th place, 58.46*) and the Don Kirby Open (16th 57.82*) ... Helped the women's 4x400 team to sixth at the MW Championships.
2013 Outdoor: Participated five times, primarily in the 400 ... Kicked off the outdoor campaign in the 200, placing 10th at the Don Kirby Tailwind Invitational with a 24.98* time ... Claimed fourth in the 400 at the Air Force Triangular, clocking in a 57.84* ... Ran the quartermile at two meets in California, placing 12th at the Beach Invitational (season-best 56.46) and seventh at the Brutus Hamilton (56.65) ... Ran the first leg in the 4x400 at the Mountain West Championships, helping the squad take second at the meets and second in the UNM record books ... Also placed 15th in the 400 at the conference meet with a time of 57.44.
2012 Indoor: Competed at six meets in 400-meter dash, the 200 and the 4x400 team ... Opened with a 10th-place clocking of 59.18* in the 400 at the NAU Lumberjack Open ... Posted another 10th-place finish, this time in the 200, at the New Mexico Invitational ... Finished fifth in the 400 at the Mountain West Championships, crossing the finish line in 55.54* ... Also helped the Lobos' 4x400 relay team to All-MW honors.
2012 Outdoor: Ran solely in the 400 at five meets and the 4x400 at one ... Started the season at the Don Kirby Tailwind Invite with a ninth-place mark of 56.58* ... Registered a seventh-place mark of 58.54* at the UTEP Invitational ... Took 11th in the prelims of the 400 at the MW Championships, where she also helped UNM's 4x400 squad to a fifth-place finish.
2011 Outdoor: Part of the 4x400 meter relay team that finished9th-placeat the Arizona State Invite, 3rd at the UNM Tailwind Invitational,third at the UNM Tailwind Invitational and first at the UTEP Invitational and third at the MWC Championships ... 56.99s time in the 400-meter dash for fifth place at the 2011 UNM Tailwind Invitational ... 11th-place in the 200 meter dash at the UTEP Invitational, finishing in 25.13 seconds ... Third in the 200 meter dash at the Brutus Invitational, posting a 24.94 time ... Also ran with the 4x100 and 4x400 relay teams.
2010 Indoor: Opened with a third-place finish in the 60m dash at the Lobo Opener, finishing in 7.86s ... Clocked a 58.35s time in the 400m dash at the Lobo Challenge, earning sixth ... Posted a 25.53s time in the 200m dash at the Air Force Invitational, picking up 11th ... Ran with 4,000m medley at the MWC Championships, earning third as a team ... Also a member of the women's 4x400m relay team.
2010 Outdoor: Ran a personal best in the 200-meters with a time of 24.81 at her first outdoor meet (UTEP Springtime Invitational) ... scored at the MWC Championships in the 400-meters with a 5th place finish and a personal best time of 55.09 ... scored in both the 4x1 and 4x4 at the MWC Championships ... ran leg one in the 4x4 for a 7th place finish ... ran leg three in the 4x1 for a 6th place finish ... Also ran with the 4x100 and 4x400 relay teams.
A 2009 graduate of Bosque School in Albuquerque ... high point winner at the class 2A state championship meet as a senior ... swept the 100 (state record 12.33) and 200 (state record 25.34), leading the Bobcats to a third place finish ... team MVP ... four-year letterwinner in track & field and volleyball where she was a first team all-district pick ... Bobcat Award winner and Senior Athlete of the Year ... made the honor roll as well.
Born in Albuquerque, N.M. ... full name is Tawsha Kiah Brazley ... daughter of Courtney and Michelle Brazley.
All-Mountain West Indoor Team, 2010 (DMR) & 2012 (4x400)
* indicates a performance that has been adjusted based on the NCAA altitude conversion protocol
More Headlines
- New Mexico Track & Field Hosting Team Tryouts Aug. 25
- Peter Callahan Named First Team Academic All-America
- Callahan Named MW Mens Co-Student-Athlete of the Year
- Women's XC and Track Finishes 14th in Program of the Year Standings
- Men's XC and Track Finishes Program-Best 7th in Program of the Year...


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'Stained Glass Romance' Marriage Vow Renewal CertificateMake your marriage renewal ceremony a memory of sweetness on rich stained glass.This marriage vow renewal certificate employs all that is traditional. The Old World fonts, and background of a stained glass window. This certificate speaks volumes to the traditions and romance of this special day for husband and wife!Although the certificate above may show different wording or layout, below is the default wording and layout of this certificate, unless otherwise specified by customer.Certificate reads:This CertificateofMarriage Vow Renewal
Is _____________ (Awarded, Granted, Presented, Given) to
________________ (name of bride)&___________________ (name of groom)
On this day, ______________, 200__ (date)May the Joy of This Day Follow UsUntil time is No More____________________ & ____________________
Signatures of Husband & Wife___________________________Signature of Presiding OfficiantIF HAVING SHIPPED, CERTIFICATE IS PRINTED ON WHITE OR CREAM 80-POUND CARDSTOCK.When purchasing this certificate, please thoroughly fill out ORDER INFORMATION block below.Your Choice of Cardstock (if having shipped): White, CreamYour Choice of Presentation/Shipping Method:Personalized & emailed to you (pdf format)USPS Ground (4-6 business days) No tracking availableUSPS Priority (2-3 business days) Tracking includedUSPS Express (next day) Tracking included
This is Elegance and Romance Rolled into One!**********Optional:Add one or two Customized Pocket-Size Plastic Laminates of Your Marriage Vow Renewal Certificate! Have your certificate with you all the time as a reminder of this special day and your marriage commitment!(Make this selection in ORDER INFORMATION block below.)**********Optional:'Etiquette for Vow Renewals'This 15-page ebook will answer your questions about etiquette when planning a vow renewal ceremony and reception. A must-have to turn your renewal ceremony ideas into a sweet and perfect memory!(Add this item in the ORDER INFORMATION block below.)**********Optional:'10 Vows for Renewal Ceremonies'This ebook is exactly what its title suggests...10 vows to choose from for your marriage renewal ceremony.**********Optional:Renewal Ceremony ProgramsUsing the background from this certificate, we will customize ceremony programs according to your desires, emailing the program to you, so that you may run off as many copies as you like and give them to the attending guests at your ceremony.(Add this item in the ORDER INFORMATION block below.)***********Same-day shipping on orders placed before 3pm, Eastern Time.Discreetly packaged for your privacy.Ships USPS or UPS.PDF-formatted certificates emailed worldwide.PDF-formatted certificates usually completed and emailed within 20 minutes to one hour.
Item Number: 07-2206SH
$13.00 Reg.
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Please select the phrase you prefer on your certificate.
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Please select one of our lower signature lines or create one of your own below.
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Scientific Misconduct Prevents Gallo from being awarded Nobel Prize for discovering cause of AIDS
In 1983 and 1984, controversy erupted over the methods used in Dr. Robert Gallo's laboratory at the National Cancer Institute and Dr. Luc Montagnier's laboratory of the Pasteur Institute in France. Dr. Montagnier's lab released an article on AIDS research in May of 1983, but only after Dr. Gallo had peer-reviewed and added his own abstract. Prior to the AIDS epidemic, Dr. Gallo and his lab discovered the Human T-cell Lymphocyte Virus Type 1 (HTLV-1), a retrovirus under which HIV was also classified.
In 2008, the Nobel Prize for Physiology or Medicine was awarded for the discovery of the virus that causes Acquired Immune Deficiency Syndrome (AIDS) and Human Immunodeficiency Virus (HIV), 25 years after the first articles described the virus and the causal link to AIDS. However, research ethics remained a major concern in the investigation of HIV and AIDS.
However, several factors placed the Nobel Prize just out of Gallo's reach. First, Gallo added the abstract, but in doing so he changed the wording to suggest that the newly discovered virus was similar to HTLV-1. Montagnier claims his lab determined the viruses were different. Second, Gallo received samples from the French and claimed that he was the one who found the virus, and that it was different from the virus the Montagnier found. Later, it was discovered that the viruses were identical.
Gallo's claims led to investigations by the National Institute of Health (NIH) ethical conduct committee, but all charges were dropped in 1993. Montagnier original paper did state, "The role of the virus in the etiology of AIDS remains to be determined." One year later Gallo was able to characterize the virus with four separate papers in Science, but the Assembly still deemed that his work was not equal to Montagnier and Barre-Sinoussi's work.
Likewise, the patent filing for the blood screening test erupted as a dispute, which led President Reagan and French Prime Minister Jacques Chirac to declare Gallo and Montagnier as "co-discoverers." In 2008, although Gallo and Montagnier shared credit for the discovery, the assembly awarded only Dr. Montagnier and Dr. Francoise Barre-Sinoussi with the Nobel Prize for Physiology or Medicine for the discovery and isolation of HIV.
Although Gallo was fundamentally involved in linking HIV to AIDS and shared the blood test patent for HIV, the Assembly did not recognize Gallo. This raises several questions. Did the Assembly take into consideration Gallo's actions and conduct during initial discovery of HIV? Why was Gallo not recognized by the assembly, even though he was officially recognized as one of the co-discoverers of HIV? In writing a piece on the almost Nobel Prize recipient, Jon Cohen describes Gallo, "…once known for his hot temper and fierce competitive streak…he has mellowed a lot, making it easier for him to accept the Nobel Assembly's decision." Gallo's arrogance and forcefulness may have garnered the title of co-discoverer of HIV and the blood test patents, but did not endear him to the Nobel Assembly.
- Barré-Sinoussi, F., J.C. Chermann, F. Rey, M.T., Nugeyre, S., Chamaret, J., Gruest, C Dauguet, C. Axler-Blin, F. Vézinet-Brun, C. Rouzioux, W. Rozenbaum, and L. Montagnier, "Isolation of a T-Lymphotropic Retrovirus from a Patient at Risk for Acquired Immune Deficiency Syndrome (AIDS)," Science 220 (1983): 868-871.
- "We Forgot to Write the Summary," Chicago Tribune, November 19, 1989.
- Cohen, J., M. Enserink, "HIV, HPV Researchers Honored, but One Scientist Is Left Out," Science 322 (October 10, 2008): 174-175.
- Gallo, R., "The Early Years of HIV/AIDS," Science 298 (November 29, 2002): 1728-1730.
- Gallo, R. and L. Montagnier, "The Discovery of HIV as the Cause of AIDS," The New England Journal of Medicine 349 (December 11, 2003): 2283-2285.


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Selecting the right software is a vital part of making sure your computer will do what you want it to.
From Microsoft Office and security software to creative and business programs, there's something to make yours and your family's computing fun, safe and productive.
Getting your software is easy - you can have it delivered, collect it from your nearest store or download it directly from our website. Getting the software you need has never been as simple.
Internet security
Internet security is a must for keeping your data personal, passwords secure and computer running correctly. While there are various brands, types and licensing options, all are designed to keep you and your family safe online.
Why should I use internet security?
Stay safe - You don't have to worry about someone accessing your online banking, social network, emails and more as internet security keeps all your data personal.
No viruses - If you accidently download an infected file, internet security removes the affected files to keep your computer running properly.
Browser protection - Any suspicious links you might come across online are highlighted to prevent you from clicking through to a fake or infected website.
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Available for all your devices - There are different packages to suit you, so if you've got a large family or a several devices, you can keep everything safe with one great-value package.
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Which version of Office?
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Why wait for delivery or leave the house when you can download your new software start using it in minutes. Look out for downloadable versions of software on the product page and click Buy for Download to get started.
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Flexible - Many new computers don't come with optical disk drive, so downloading straight to your hard drive is the easiest way to get access to the software you want.
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Software is designed to work with a specific operating system. You should always check that you're buying the right version for your device, be it Windows, OS X or a mobile operating system.
Each product clearly lists compatibility, so it's easy to find the right one.
Minimal requirements
Software features a set of requirements your computer or device must meet in order to run it correctly. We list the minimum requirements on the product page, with many being little more than an up-to-date of version of Windows or OSX. However, be careful with design and creative software, as they tend to have much higher requirements.
While most software can used by anyone with a little practice, some specialised programs require more experience or knowledge of the subject matter. You can read the product description to get a general idea of the level required, but a reliable rule is the more expensive the software, the more in-depth it goes.
Software comes with a variety of different licences, so it's important you choose the right one. Security and anti-virus software typically needs to be renewed once a year, while other software can be purchased on automatic yearly renewal or with lifetime licences.
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19 April 2011
Day two
37 comments:
Again, I am loving this, I'm wearing this stamp today, posting on it tomorrow...this is scaring meeeeee! I also need some OMG's..why must they be out of reach :(ReplyDelete
OMG (no pun intended) I love it! Great job on the stamping and IDK what you're talking about cleanup because the pics look great.ReplyDelete
This is a great idea! I love the maniReplyDelete
love this!! especially on holographic!ReplyDelete
Gosh!! I love your nails!! They look sooo hot!! :D I tried the same thing with neons but it wasn't even close to this!! I prefer such holo goodness to neon anyday :DReplyDelete
this looks awesome!ReplyDelete
Oh!! and I know what you mean about the black stamping polish.. its is such a mess!! But ur pics look so clean and great..ReplyDelete
OMG! I am totally in love with it! :)ReplyDelete
Ahhhh holo <3 how I love me some holo and animal prints!ReplyDelete
I love this!!! :) So pretty!ReplyDelete
I am LOVING this mani!!! I saw it on my Facebook newsfeed and just HAD to come over and let you know how much I love it! Great job!ReplyDelete
I need you come do my nails every morning. Pwease.ReplyDelete
I LOVE this! I love leopard and holo! its pretty awesome.ReplyDelete
Really nice! I like it very much but I'm not sure that I could do the stripes...ReplyDelete
omg im so loving this..it cuteReplyDelete
you did a good job so good
So many pretty colors!!!ReplyDelete
Omg, love this!!!!!!! :)ReplyDelete
If I ever win the lotto, I'm going to pay you to come and do my nails everyday! Lol.ReplyDelete
Amazing, I absolutely love this.
I love this! :)ReplyDelete
I love Yahoo games! So easy to spend hours playing. You should try Wet n Wild's black polish for stamping, it's only 99 cents!ReplyDelete
sooo cute. reminds me of katy perry!ReplyDelete
@Elizabeth Girl! Maybe you'll get lucky? I've gotten lucky with most of mine... except DV8 but it was worth it! We have to meet so you can play with the ones I have!ReplyDelete
@Cris at Let them have Polish! You're too sweet, my love! The clean up took ages because the black made such a mess... do you have any tips to stop it from making my hands look dirty? Lol! <3ReplyDelete
@VERMILION ART Thank you so much! I think I need to try a Wet n Wild polish instead for stamping, the clean up was terrible! You're too sweet!ReplyDelete
@Melissa Birch The stripes were easy, promise! They aren't straight at all, but stamping over it hides that! I freehanded them but if you don't want to stamp over them, try using tape! Thanks for commenting!ReplyDelete
@Melinda Stella Lol thank you so much, that's so sweet! Sadly, not even half my manis turn out well, so we'd need a lot of time for me to do your nails LOL! I'm so glad you like it! Thank you for commenting!ReplyDelete
@Lisa Mc GIRL! Polish party! I'm down for that! <3ReplyDelete
@Adrianna It's so true! I've been sleepless many a night because of them lol! Do you mean Black Creme or whatever it's called? WnW can be a bit hard for me to get my hands on but I'm willing to try anything that doesn't involve as much of a nightmare clean up as the black special polish! Thanks for the rec! And thank you for commenting!ReplyDelete
Thank you all so much for commenting and being so lovely <3 <3 Your comments brighten my day so much!ReplyDelete
Wow! That is one stunning mani. Love it!! xxReplyDelete
Oooh, I LOVE this with the combination of the holos, super pretty!ReplyDelete
I'm just in love with this mani!ReplyDelete
It's gorgeous!!
Amazing!! So good!
OMG I freaking love this mani!!! You rock it girl :D I need to try something like this too.ReplyDelete
Yay this is super fun!!ReplyDelete
this looks awesome! did you do the stripes freehand or with tape?ReplyDelete
Absolutely ♥ this! Saw this pic originally on Tumblr and was like, whoa. I have no Konad supplies but would totally rock this look... Thanks for the creativity, girlie. :)ReplyDelete
Thank you so much for reading! I read every comment and love hearing feedback! However, I do ask that you do not link spam the comment section. *I will delete any and all link spam.* If you'd like me to check your blog out, please email me at glittagloves(at)gmail(dot)com and I'd be more than happy to check you out! I don't bite... honest!


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Schedule: Saturday, Jan. 5 at Crowell Open, West Point, N.Y., 9:00 a.m.
Saturday, Jan. 5 at Tiger Invitational, Boston, Mass., 5:00 p.m.
- The Holy Cross men's track and field team is set to begin the 2013 portion of its schedule on Saturday, Jan. 5, with the team splitting up to compete in two different meets. Members of the team will travel to Army to take part in the Crowell Open at 9:00 a.m. while other student-athletes will travel to the Reggie Lewis Center for the Tiger Invitational.
- At last season's Crowell Open, sophomore Nick Athanasidy (Cortlandt Manor, N.Y.) led the Crusaders with a fifth place finish in the 1,000 meter run.
- Sophomore Sean Carey (Newburyport, Mass.) was the top Holy Cross finisher at the 2012 Tiger Invitational, finishing in sixth place in the weight throw. Sophomore Nolan Kiernan (Wakefield, R.I.) and junior Kyle Carr (Westerly, R.I.) added top-10 finishes in the shot put.
- Junior Tim Moczula (Edison, N.J.) leads the team this season with team-best results in the 60 meter hurdles and high jump. Freshman Rob Cacace (Yonkers, N.Y.) and Tim Dunn (Fords, N.J.) each lead the team in two events. Cacace holds the top distances in the long jump and shot put while Dunn leads the team in the 55 meter dash and pole vault.
- Get all the latest news and results on the Holy Cross men's track and field team sent directly to your e-mail. To sign up for e-mail alerts go here: http://www.goholycross.com/list-signup.


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Community Calendar: April 14, 2014
To add an event, meeting or item to the Community Calendar, email information to email@example.com.
Monday, April 14
Freedom from Smoking Class: Every Monday, 4 to 5 p.m., Rutherford Regional's Cancer Resource Center; for more information, call 828-245-4596 or e-mail firstname.lastname@example.com.
Al-a-non meets at First United Methodist Church, 264 N. Main Street, Rutherfordton; Mondays at 7 p.m.; Newcomers Meeting at 6:30 p.m. prior to the regularly scheduled meeting; call 288-2767 for more information.
Clerk of Court/County Commissioner Candidates Forum: Public meeting for Clerk of Court candidates at 7 p.m. and for County Commissioner at 8 p.m.; Sunshine Elementary School gym, 231 Toney Road in Bostic; contact Ron Gurley at 248-3782 for more information.
Tuesday, April 15
Professional Women of Rutherford County: Meeting at noon at Gregory's Original in Rutherfordton; Dutch treat, call 828-287-2171 to pre-order; Debra Kuykendall from the North Carolina Baptist Aging Ministry (NCBAM) will be speaking; open to all professional women in the county.
Lake Lure Classical Academy Open House: School tours and classroom observations from 1-7 p.m.; prospective families invited for tours and observations between 1 p.m. and 3 p.m.; special presentations 4-6 p.m. for all grades; light refreshments provided.
Stroke Support Group: Third Tuesday of every month, 3:30-5 p.m., Crawford Building (Auxiliary Room) at Rutherford Regional Medical Center; for more information, call 828-286-5509.
Alzheimer's Association Support Group: Meeting at Crestview Baptist Church at 6 p.m.; resources, education and support available to those dealing with Alzheimers/Dementia; for more information call Amy Hamilton at 828-305-2278.
Free Small Business Center Seminar: Three-hour course on eBay Store led by Nick Hawks; a step-by-step approach for individuals ready to become eBay Store owners; seminar is 6-9 p.m. at Isothermal Community College, Communication Technology Building, Room 108; to register or for more information contact Dee Spurlin at 828-395-1416 or firstname.lastname@example.com.
Breastfeeding Class: Class begins at 6:30 p.m. and ends at 8:30 p.m. at Rutherford Regional Medical Center; call 828-286-5065 to register or for more information.
Thursday, April 17
Free Small Business Center Seminar: Three-hour course on Financing Your Small Business from start to success, led by Nick Hawks; helping business owners determine financing needs to start and make a business successful; seminar is 6-9 p.m. at Isothermal Community College, Communication Technology Building, Room 108; to register or for more information contact Dee Spurlin at 828-395-1416 or firstname.lastname@example.com.
Friday, April 18
East Egg Drop: All children are invited to Gilkey Community Center for an Easter egg drop; the fun begins at 12:30 p.m.
Ice Cream Night at KidSenses: Come enjoy homemade ice cream and design ice cream crafts in the Creation Station; the fun begins at 5 p.m. and ends at 7 p.m.; event is free with paid admission to the museum.


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A contactor assembly interconnects a surface mount integrated circuit device under test (DUT) with a test circuit. The assembly includes a main contact block with a central opening, a plug that mounts in the opening, and contact assemblies carried on the plug that each have contacts, a ground plane, and an insulating layer therebetween. Alignment pins locate the contact assemblies on the plug and other pins locate the plug within the contact block opening. The upper end of the contacts, cooperating with the plug, project freely toward a contact plane where they connect with associated pins of the DUT. The lower end of the plug simulates the DUT for insertion into a socket on the test circuit. Laterally adjustable conductive clips connect each ground plane to a ground member connected to the test circuit and located around the socket. In the preferred form, a rectangular frame of an insulating material surrounds the DUT-simulating portion of the plug and clamps pairs of these adjustable clips, one of which resiliently abuts the lower end of the ground plane of the associated contact assembly, and the other of which resiliently bears against the ground member.
1. A contactor assembly for electrically connecting pins of an electronic device under test (DUT) at a contact plane to a test circuit separated from the contact plane along a first direction perpendicular to the contact plane when the DUT is positioned over the contactor assembly at the contact plane generally orthogonal to the first direction, the DUT moving under automatic control and at a high rate along said first direction to said contact plane comprising:
a block formed of an insulating material that has a central opening and extends in a lateral plane generally orthogonal to the first direction,
a plug formed of an insulating material having a first end spaced closely from said DUT, a second end projecting from said block adjacent said circuit, said plug positioned in said central opening of said block, and
at least one contact assembly mounted generally in said central opening and comprising a plurality of generally parallel conductive contacts and at least one layer of insulating material, said contacts having (i) a first end projecting above said plug and angled to project toward an associated pin of said DUT and positioned to deflect resiliently generally along said first direction when in connection with an associated pin of said DUT at the contact plane and (ii) a second end in electrical connection with said test circuit at said plug second end, said block and plug being dimensioned and positioned to avoid mechanical interaction with said pins.
2. The contactor assembly of claim 1 wherein said contact assembly includes a ground plane extending in a parallel spaced relationship with said contacts over a substantial portion of their length to produce a characteristic impedance in said contacts to fast rising signals carried by said contacts between said first and second ends.
3. The contactor assembly of claim 1 or 2 further comprising alignment means that mount and locate said contact assembly with respect to said plug.
4. The contactor assembly of claim 1 or 2 wherein said plug second end has a recess, said contact second ends extend into said recess and further comprising a retainer matingly received in said recess overlying at least a portion of said second contact ends and means for replaceably securing said retainer in said recess.
5. The contactor assembly of claims 1 or 2 wherein said second plug end is configured to simulate the DUT.
6. The contactor assembly of claim 1 or 2 further comprising means for aligning said plug with respect to said block when said plug is inserted into said central opening.
7. The contactor assembly of claims 1 or 2 further comprising means for resiliently mounting an electronic device in electrical connection with said DUT at one or more selected pins where said electronic device is in close physical proximity to said DUT during testing.
8. The contactor assembly of claim 7 wherein said resilient mounting means comprises at least two arms formed of a conductive material, each arm having a first portion in electrical connection with a selected one of said pins and a second portion in electrical connection with said electronic device.
9. The contactor assembly of claim 8 wherein said second arm portion has a width greater than said first arm portion to reduce the inductive reactance of said arm to high frequency components of an electrical signal carried by said arm.
10. The contactor assembly of claim 2 further comprising an electronic device mounted between said first angled end of one of said contacts and said ground plane to de-couple said pin.
11. The contactor assembly of claim 2 further comprising solderless means for adjustably connecting said ground plane to a ground member on said test circuit.
12. The contactor assembly of claim 11 wherein said adjustable connecting means comprises conductive clip means moveable generally parallel to said block and providing a conductive path between said ground plane and said ground member.
13. The contactor assembly of claim 12 wherein said clip means comprises a first clip that has a first edge resiliently biased by said first clip into electrical connection with said ground plane and a second clip in a generally parallel mating relationship with said first clip and having a first edge resiliently biased into electrical connection with said ground member.
14. The contactor assembly of claim 11 or 13 wherein said ground member is a conductive strip mounted on said test circuit about said socket and in electrical connection with ground for said circuit.
15. The contactor assembly of claim 12 or 13 further comprising an insulating frame that surrounds said second plug end and overlies a central portion of said clip means.
16. The contactor assembly of claim 15 further comprising means for securing said frame to said block to clamp said clip means in a preselected position with respect to said ground plane and said ground member.
17. In a contactor assembly for electrically connecting pins of an electronic device under test (DUT) to a test circuit separated from a contact plane along a first direction, the contactor assembly having a plurality of conductive contacts that flex resiliently between a first position where said contacts are clear of said pins and a second position where said contacts are in electrical connection with an associated one of said pins at a free end of said contact, the improvement comprising means for mounting an electronic circuit device in a closely spaced relationship to the DUT when it is at the contact plane during test and in electrical connection with at least a pair of selected pins of the DUT, comprising:
at least two arms formed of conductive, resilient sheet material each having (i) a relatively narrow arm portion secured continuously at a point adjacent said free contact end to one of the contacts when the contact is in both said first and said second positions and (ii) a broad arm portion extending away from the contact, said broad arm portions being continuously electrically connected to said electronic device, the resilience of said arms accommodating the flexural movement of said contacts between said first and second positions.
18. The mounting means of claim 17 wherein said broad arm portion widens rapidly from said narrow arm portion.
19. The mounting means of claim 17 wherein said narrow arm portion is angled with respect to said broad arm portion to position the electronic device close to the DUT throughout a flexure of the contacts along the first direction.
This application is a continuation-in-part of applicant's U.S. patent application Ser. No. 864,293 filed May 16, 1986, now U.S. Pat. No. 4,747,784, issued May 31, 1988, and applicant's U.S. patent application Ser. No. 660,475 filed Oct. 12, 1984, now U.S. Pat. No. 4,689,556, issued Aug 25, 1987.
This invention relates in general to testing apparatus for electronic devices such as integrated circuits ("IC's"). More specifically, it relates to an electrical contactor assembly that is generally frequency insensitive to allow broadband testing with fast rising signals and is readily assembled and disassembled to facilitate field servicing and provide significant advantages in cost of manufacture.
In the manufacture and use of IC's packaged as surface mounted devices ("SMD's"), it is important to test the devices accurately, reliably, and at a high rate. Automatic testing and handling machines that can perform this task are available. Such apparatus suitable for testing SMD ICs are sold by the Daymarc Corporation, Waltham, Mass., under the trade designation Model 757. In one common type of SMD device, a PLCC packaged IC, the circuit is contained in a molded plastic body having a generally square or rectangular, box-like configuration. SMDs typically include either two rows of contacting leads along opposite and parallel sides of the body, or four rows of contacting leads, one along each side of the body. The most common configurations of SMDs include four rows of connecting leads. In any event, the leads lie generally in a common connecting plane.
An SMD is designed to be mounted directly on the surface of a circuit board or within a suitable receiving socket. The SMD can be distinguished from dual-in-line packaged (DIP) integrated circuits in that DIP devices are intended for mounting with leads passing through the circuit board (or within a suitable socket) rather than for surface mounting. Additionally, DIP's typically include only two rows of parallel connecting leads, in contrast to the usual four-row SMD.
Prior art SMD testing apparatus can generally be described as either manual or automatic. In a manual apparatus, an operator manually places each SMD into a socket, conducts the test, then removes the SMD. In addition to being an obviously slow and time-consuming procedure, the sockets tend to wear out rapidly. A typical life is only a few thousand devices. Replacing a socket requires de-soldering the old one and installing a new socket.
A manual testing apparatus, however, using a socket mounted directly the test circuit board is advantageous in that testing is done in the electro-magnetic environment of actual use. While automatic apparatus have proven to be fast, they test the SMD at a remote location from the test circuit, and thus in an inappropriate environment. As an example of the importance of proximity to the test circuit, it is known that merely changing the lead length in the test situation from the actual use situation by a quarter of an inch can lead to substantial changes in electrical response.
Another design consideration for contactors is that SMD leads tend to be very soft or delicate. A force component as small as a few grams in a direction parallel to the plane of the SMD can damage the leads. A single lead damaged in testing can render the entire SMD unsuitable for use. In several known automatic testing apparatus, the testing contacts exert a side-acting force which permanently displaces the lead causing lateral or longitudinal row misalignment. Other prior art devices use sloped surfaces to guide the SMD into test position. Depending on factors such as the extent of misalignment, such guidance mechanisms can also misalign the leads.
Still another design consideration, as described in U.S. Pat. No. 4,473,798 to Cedrone et al, is that the testing of integrated circuits frequently requires that the test signal be "fast-rising", i.e., a signal which is a very steep, step-like increase in potential. A typical fast-rising signal may be characterized by a voltage change of 1 volt per nanosecond. Such a signal can be represented through Fourier Series analysis as being composed of a multitude of superimposed sine waves having a very high frequency, typically on the order of 300 MHz. The fast-rising signal launched by the test circuitry and carried by the contacts to the device therefore behave in the manner of a high frequency signal.
With such high frequency "components" in the signal, the inherent inductance of the contacts themselves becomes a problem. Inductive reactance XL produces distortions and reflections which degrade the quality and accuracy of the test. The inductance L of the contact is a function of the cross-sectional configuration of the conductor and its length. Inductance increases directly with the length and inversely as a function of cross-sectional width. Since the inductive reactance XL =2πfL, for the very high frequencies f associated with a fast-rising signal, the inductive reactance associated with even the relatively short contacts in normal use becomes a significant source of distortion and limits the accuracy of measurements.
One possible solution would be to increase the width of the contacts. However, the physical constraints of the test environment limit the available dimensions of the contacts. For example, the contacts must be separated laterally from adjacent contacts while each still maintaining a unique association with one lead on the SMD. Another possible solution is to make the contacts shorter. This is difficult to execute in testing DIP ICs, and in testing SMDs while the contacts can be made short compared to those in DIP contactors, the signal path from the contacts to the test circuit is long enough to affect signal integrity adversely.
Still another possible solution is simply to test each device more slowly to wait for distortions and reflections to die out. With many modern SMDs such as large gate arrays, however, the speed of operation of the device itself is so fast that if the testing operation were to extend over a sufficient period of time to allow distortions and echoes induced y the fast-rising testing signal to subside, then the speed rating of the devices could not be determined. In short, the testing operation must have a speed on the order of the device function being tested.
Another consideration is minimizing "ground noise", that is, changes in the reference voltage due to current surges during the test procedure simulating operation of the device. A typical situation is a test where a change in the device state causes a current surge in the range of 20 milliamperes per nanosecond. Such a surge can cause the ground reference to move one volt or more thereby distorting measurements referenced to ground by 20% or more. The end result is that good devices may not pass the test and are downgraded. The use of "surge" capacitors to provide power de-coupling is known, but there is no system which meets this problem while also meeting all of the other design problems noted herein.
Yet another problem with prior contactors is that in general the contacts are individually soldered to signal transmitting wires which in turn are soldered to contacts that connect to the test circuit. This mode of assembly involves a comparatively high cost of manufacture and it is not conducive to field repair or modification to accommodate devices with varying numbers of pins. Also, prior devices for testing SMD IC's have not offered a simple arrangement to connect a ground plane (or other arrangement for producing a distributed capacitance) to the ground of the test circuit, or one where the connecting arrangement can accommodate variations in the lateral spacing between the contactor assembly and the site of connection to the circuit board ground.
It is therefore a principal object of the invention to provide a contactor assembly that maintains signal integrity when testing SMD devices, even when the testing involves fast-rising signals, where the contactor is formed of a few readily aligned and assembled components to facilitate field servicing and modification of the contactor to accommodate different devices and different test circuits.
Another principal object is to provide a contactor assembly with the foregoing advantages which also includes a simple and highly effective arrangement for ground de-coupling the DUT or, more generally, linking selected pins through an electronic device situated in extremely close physical proximity to the DUT.
Another principal object of the invention is to provide a simple, adjustable connection between a ground plane associated with the contacts and the ground of the test circuit.
Another object is to provide the foregoing advantages while also providing a short signal path between the DUT and the test circuit.
Another object is to provide the foregoing advantages while also providing an electro-magnetic testing environment that closely simulates that of the intended use.
Yet another object of the invention is to avoid harm to the delicate SMD leads.
Still another object of the invention is to provide a virtual ground for selected leads close to the SMD.
A further object is to provide a contactor with the foregoing advantages that has a favorable cost of manufacture as compared to prior devices with comparable performance characteristics.
A contactor assembly for testing IC's, particularly SMD's, includes a block with a central opening, a plug received in the opening and extending in a first direction from a contact plane with the DUT at one face of the block to a plug portion simulating the DUT at the opposite face of the block, and contact assemblies mounted on the plug between the block and the plug. The contact assemblies also each extend in the first direction from cantilevered first contact ends that project over the central opening to second contact ends that overlie the DUT-simulating plug portion. The contact assemblies each include parallel rows of conductive strip which form the contacts and at least one layer of insulating material bonded to the contacts. In the preferred form, the contact assembly also includes a conductive ground plane spaced from the contacts by an insulating layer or layers in a fixed parallel relationship.
The first contact ends are preferably angled upwardly from the contact plane and deflect downwardly toward the horizontal, and toward a first end face of the plug, when the pins on the DUT land on these contact ends. The contacts are resilient to develop a spring force that enhances the quality of the electrical connection and the deflection wipes the contact ends at the point of connection. The cantilevered first contact ends, when deflected to the contact plane, exert comparatively little lateral deforming force on the DUT pins. The ground plane provides a distributed capacitance that matches the inductance of the contacts to produce a purely resistive or "characteristic" impedance along the contacts to the frequency component of the signal.
The second plug end, with the second contact ends arrayed on its outer surface, simulates the DUT and is plugged into a conventional socket on a test circuit. Because the width of the contactor assembly in the first direction is small, typically about 0.75 inch from contact plane to the test circuit, the DUT is in an electromagnetic environment which closely simulate its actual end use environment.
The contactor assembly includes arrangements to connect the ground planes of the contact assemblies to a ground of the test circuit, typically a ground plane in a printed circuit board. In a preferred form, a metallic ground member surrounds the socket and is electrically connected to a ground plane in the test circuit, typically a printed circuit board. A pair of adjacent, laterally adjustable clips clamped between the block and a frame continue the ground plane to the test circuit ground. One clip has a flexible edge that bears resiliently against the ground plane of each contact assembly and the other clip has a flexible edge that bears resiliently against the ground member.
To assemble the contactor assembly, in the preferred form locating pins align each contactor assembly (a total of four assemblies will be used for a typical square packaged SMD with pins on all four sides) with respect to the sides of the plug, which preferably has a generally square cross-sectional configuration reflecting the geometry of the SMD DUT. Other pins locate the plug with respect to the block. Screws secure the assembly of the plug to the block. Spring clips mounted on the block urge each contact assembly onto the plug to stabilize its location. The ground frame is secured to the opposite side of the block, adjacent the test circuit, using screws. The second contact ends are preferably angled onto a recess in the second end of the plug. A retainer fills the recess and is secured by a screw or screws to fit the second free ends of the contacts.
The contactor assembly also includes resilient mounting arrangements suspended from selected contacts to electrically connect electronic devices, typically chip capacitors, to de-couple the selected pins. The mounting arrangement preferably uses flexible metallic sheet arms which rapidly widen from the point of connection to the pin. The chip device is thus mounted in extremely close physical proximity to the DUT even during flexure of the contact.
These and other features and objects of the present invention will be best understood from the following detailed description which should be read in light of the accompanying drawings.
FIG. 1 is a view in perspective of a contactor assembly according to the present invention;
FIG. 2 is an exploded perspective view of the contactor assembly shown in FIG. 1;
FIG. 3 is a view in vertical section taken along the line A--A in FIG. 1 with an SMD DUT at the contact plane and with a socket of a test circuit connected to the assembly.
FIG. 4 is a perspective view of an SMD electronic device of the type tested using the contactor assembly of FIGS. 1-3; and
FIG. 5 is a broken away view in perspective of an IC test handler that uses the contactor assembly shown in FIGS. 1-3.
With reference to FIGS. 1-5, a contactor assembly 20 for testing SMDs 22 is particularly adapted for use in combination with a model 757 test handler/sorter 24 manufactured and sold by Daymarc Corporation. This is a high-speed machine with an initial storage unit 26 that receives SMDs at the input 28, stores them for an interval of time in a heat-soak region 30 to allow them to reach a desired temperature, and then tests them. The contactor assembly is located at a test site indicated generally by A. The transporter assembly carries the SMDs from the storage unit 30 to the test site A.
The contactor assembly 20 includes parallel strips of highly conductive, resilient contacts 32, having a first end 32a that connects with the SMD device under test ("DUT") at a contact plane 34 and a second end 32b that connects at a socket 36 to a test circuit 38. The first contact ends 32a are shown in their normal unflexed position in FIG. 1. They are generally angled "upwardly", a typical angle being 20� measured from the contact plane 34, toward an "incoming" SMD 22 that approaches the contactor 20 along the direction indicated by arrow 31 in FIG. 1. In the testing position, the contact ends 32a are deflected downwardly toward the contact plane 34 as shown in FIG. 3. Each contact conducts a signal along its length from an SMD pin 22a to an associated contact 36a within the socket 36 and then to the test circuit. The magnitude of the contact deflection, the spring force developed by the deflection, and the lateral component of force exerted by the contacts on the DUT pins at full deflection are sufficiently small that there is little or no lateral force component, and certainly not a component with a magnitude sufficient to deform a pin or pins to a degree that would significantly degrade the reliability of the test.
Typically the SMDs 22 are tested in systems where the characteristic impedance of the system is in the range of 50-100 ohms. The contactor assembly 20 of the present invention therefore preferably has components that are structured and located with respect to the contacts 32 to produce a characteristic impedance with a matching value along substantially the entire signal path from the contact plane to connections in the socket 36. The only portion of the contacts 32 where there is a potential for self-inductance and an associated inductive impedance is in the very short (typically 3.0 mm) contact ends 32a. However, the ends 32a are sufficiently short and wide that they in fact do not introduce any significant deterioration in the signal, even with very fast rising signals.
The contactor assembly 20 has three principal components: a contact block 42, a plug 44 and, as shown, four contact assemblies 46. The block 42 is formed of an insulating material such as an epoxy glass. It has a generally square configuration (viewed in a "lateral" plane 47 orthogonal to the direction 31) with a central opening 42a which has a configuration and dimension in the plane 47 that will usually reflect those of the DUT 22. Surrounding the opening 42a is a recess 42b which has recesses 42c at its corners. Two recesses 42c mount alignment pins 48, 48. The recesses 42b also contain threaded holes 42d which receive screws to mount contact assembly clips 50.
In sharp contrast to prior art constructions known to applicant, the contacts 32, an associated ground plane 52, and an intervening layer or layers of an insulating material are bonded together as a unit. The insulating layer 54 can be formed by multiple plies of a plastic tape or by a single thickness of an insulating material which is cemented to the contacts and the ground plane. As shown, the contacts are formed on a sheet 56 of an insulating material. The sheet 56 provides structural support for the relatively thin contacts which could otherwise be readily deformed. The contacts are bonded to the sheet 56. The sheet 56 includes holes 56a, 56a which engage alignment pins 45, 45 fixed in the plug 44. The entire set of contacts, together with the associated ground plane 52, are therefore mounted and aligned on the contactor assembly by simply hooking the contact ends 32b on the plug end 44b adjacent the test circuit 38, and then "hanging" the sheet holes 56a, 56a on the pins 45, 45. The contacts are thus readily changed as a unit for repair. It is also significant that this construction avoids the need to solder individual contacts or interleaved ground wires to signal transmission elements, a task which is tedious, time-consuming, and requires a high degree of skill. While the contact assemblies are described as mounted to the outer surface of the plug, other variations are possible. For example, the contact assemblies can be aligned on pins mounted on the inner walls of the block window 42a, can be simply sandwiched between the physical block, or can be held in recesses formed on side surfaces of either the plug or block.
The layer 56 has a substantially constant thickness to produce a fixed spacing between the contacts and the ground plane. As described in applicants' aforementioned U.S. Pat. No. 4,473,798, the disclosure of which is incorporated herein by reference, this arrangement, with a proper selection of the thickness and dielectric constant of the layer 56, produces a distributed capacitance with respect to each contact 32 such that the capacitive impedance offsets the inductive impedance of each contact. As a result, a signal transmitted by the contacts 37, particularly a fast rising signal, meets an impedance which is substantially resistive. The contact 32, as noted above, are relatively short, typically with an overall length of less than 1 inch, which further enhances the signal transmission characteristics of the contact assembly.
The contact assembly construction of the present invention is also advantageous in several other ways. First, it provides short, cantilevered contact ends 32a which are integral with the rest of the contact. This construction avoids mounting and alignment problems associated with conventional short contacts, enhances the resiliency of the contacts when deflected, and provides a construction that is highly resistant to material fatigue. Second, the sheet 56 and the use of preformed ground plane allows the signal transmission elements to be shaped to conform to the structural constraints imposed by the geometry of the plug and block, particularly an end 44b of the plug which in combination with the contact ends 32a arrayed about its periphery, simulates the DUT for connection in the socket 36. Third, the contact ends 32a are supported, configured and aligned so that in combination with the plug end 44b they each reliably make electrical connection with a preselected contact 36a within the socket.
The contact block 42 is dimensioned to mount into a suitable test handler such as the test handler 24 described and illustrated herein. One face 42d of the block is generally co-planar with a flow path of SMD DUT's 22 as they move to a test site at the contact plane 34, are transported in the direction 31 until the pins 22a of the DUT contact and deflect the contact ends 32a at the contact plane 34, and then are withdrawn back to a product flow path where they are binned in response to the results of the test. A significant difference between the contactor assembly 20 of the present invention and prior art contactors is that the present contactor does not steer or otherwise direct the movement of the DUT. Movement and positioning of the DUT with respect to the contact ends 32a is controlled by the test handler. The opposite face 42e of the block 42 is in a closely spaced generally parallel relationship with respect to the test circuit 38, typically a printed circuit board with the socket 36 mounted at the point where the DUT would be connected to the circuit in actual use. This arrangement allows the testing to occur in an electro-magnetic environment which closely simulates that of actual use conditions, provided that the separation between the socket 31 and and the contact 34 measured along the direction 31 is comparatively short, typically less than 1 inch, as is the case with the present invention. Raised wall portions 42f allow a flush mounting of the contactor assembly 20 to the test handler at the test site while providing a clearance for the "upwardly" cantilevered contacts 32a and the contacting movement of the DUT.
The plug 44 is received in the window 42a of the block. Like the window, it has a cross-sectional configuration and dimensions which generally correspond to those of the DUT. The plug 44 has four mounting ears 44c formed integrally at each corner that are received in the block recesses 42c. Holes 44d, 44d in the ears mount on the pins 48 to position the plug with respect to the block with a high degree of accuracy. The plug 44 has a first or "upper" end 44a adjacent the DUT which has a peripheral wall 44c that supports the contact ends 32a while allowing their downward deflecting movement. The four sides of the plug slope inwardly at 44f into a face-abutting, seating arrangement with the contact assembly 46. Inwardly facing surfaces 42f within the central block opening 42a together with the outer plug walls sandwich and clamp the four contact assemblies 46 in the position set by the pins 45,45. The "lower" end 44b of the plug has a generally rectilinear geometry with straight side walls that simulate the DUT. The extreme bottom face 44g of the plug is recessed to provide inwardly sloping surfaces 44h that receive the angled over extreme end portions 32a of the contact eds 32b. A retainer 58 is screwed or otherwise replaceably secured to the plug in the recess 44g to secure the contact ends 32b in a given location and to protect them from damage.
Another novel aspect of the contactor assembly 20 of the present invention is a system 60 that adjustably connects the ground planes of the contact assemblies 46 with the ground, typically an internal ground plane, of the test circuit. The principal features of the preferred form of the system 60 include a pair of clips 62,64 that are laterally adjustable in the plane 47, an insulating frame 66 secured by screws 68 to clamp the clips 62,64 in a preselected location, and a ground member 70 that surrounds the socket 36 and is soldered or otherwise electrically connected to the ground of the test circuit. The ground member 70 in the preferred form shown has an L-shaped cross-section with one wall 70a resting on and connected to the circuit and the other wall 70b extending generally in the direction 31. It may be a single piece that encircles the socket, or two or more discrete members, provided that each piece is grounded to the test circuits ground. The frame 66 is insulating and spaced laterally from the ground member 70. Each "upper" clip 62 plus a plate-like body 62a and a free edge 62b angled to allow it to bear resiliently against the ground plane 52 when the clip is clamped in the operating position, as shown. Similarly each "lower" clip 64 has a plate like body 64a and a free edge 64b angled to allow it to bear resiliently against the wall 70b of the ground member when it is clamped in the operating position, as shown. The clip positions 62a and 64a are in face-abutting electrical connection. The free edge 64b is angled upwardly, as shown, to allow the clip 64 to deflect resiliently and slide over the ground member 70 in a telescoping manner through a simple sliding motion along the direction 31. The system 60 continues the ground plane at the contacts to the circuit bond without solder connections and by simply loosening the screws 68 allows a lateral sliding adjustment of one or both clips 62,64 to accommodate variations in the relative positions of the ground planes of the contact assemblies 46 and the ground member or members 70.
The present invention also allows the use of one or more pin de-coupling capacitors 72 which are connected between one or more selected contact tips 32a and the ground plane. The decoupling capacitor 72 provides an almost immediate grounding of a selected pin or pins with the decoupling capacitor "buffering" the pin electrically.
The contactor 20 also has a resilient, "sling-mount" 80 (FIG. 3) for one or more electronic devices 82 such as a surge or power de-coupling chip capacitor. The mount 80 has a pair of mounting arms 84 formed of a thin, flexible metallic sheet material. A portion 84a of each arm has a width comparable to that of one of the contacts 32a and is electrically connected to a selected contact as by soldering. The arms, however, rapidly widens over a main portion 84b which is angled sharply with respect to the portion 84a to place the device or devices 82 in a closely spaced physical relationship to the DUT when it is positioned for testing at the contact plane 34. Because the portion 84b is wide, it has a low self-inductance (which is inversely proportional to a function of the width of the portion 84b). Because the arms are resilient, the device 82 remains in close proximity to the DUT throughout the flexing movement of the contact ends 32a as the DUT deflects them. This arrangement not only places the device 82 in extremely close physical proximity to the DUT, but also the DUT to device 82 spacing along the direction 31 can be set to simulate the typical spacing of these components in actual end use conditions where they are typically mounted on opposite sides of a PC board.
As shown in FIG. 2, it is also possible to connect two or more adjacent pins using relatively short contact straps 90 each having a generally L-shaped configuration in plan view and having a narrow, angled over mounting portion 90a in side elevation. The portion 90a is soldered or otherwise connected to the selected pin. A wider portion 90b is connected to a chip device 82. The strap quickly widens to the full width of the portion 90b to reduce the inductance of the strap to the transmitted signal. As with the sling mount 80, this arrangement also places the device 82 in extremely close physical proximity to the DUT 22. Also, because each pin is connected separately through resilient arms to resilient contact ends, the chip device 82 moves in unison with the contact ends 32a as they deflect and also allow for variations in the degree of deflection of adjacent contacts.
There has been described a contactor assembly particularly adapted for the high speed testing of SMD IC's with fast rising signals where the contactor assembly is assembled from a small number of components that are readily aligned with one another and readily assembled or disassembled to allow field servicing by normal maintenance personnel. The contactor assembly also provides a convenient system for extending a ground plane associated with the the contacts to a ground plane of the test circuit. This ground connection system is solderless, adjustable, and allows a simple "slide on" connection of the contactor assembly to the test circuit. Other advantages are that the entire assembly is assembled by a small number of screws, the contactor simulates the DUT at the circuit and places the DUT in a electro-magnetic environment which closely simulates the actual end use environment. The contactor assembly of this invention also (1) avoids mechanical interaction with the DUT pins such as a "steering" of the DUT to the contact plane by inclined walls which can lead to testing errors and/or mechanical damage, and (2) provides both power-decoupling and pin de-coupling characterized by extremely short signal paths, low self-inductance and good simulation of actual end use conditions.
While the invention has been described with respect to its preferred embodiment, it will be understood that various alterations and modifications will occur to those skilled in the art. For example, while the contact assemblies 46 have been described as mounted between the block and plug, they could be secured on or in one of these members. Within the contact assemblies, the ground plane could be spaced from the contacts by intermittent spacers rather than a continuous insulating layer. The contact assemblies could omit the ground plane where a characteristic impedance signal path is not an important test condition. Also, if a ground plane is provided, it can be mounted and supported as a separate element which is in the proper spaced relationship to the contacts when all of the contactor components are assembled. Further, various alternative arrangements can be used to carry the ground planes associated with the contacts to the test circuit ground. The clips 62,64 could be formed as a single clip with two connecting free edges, although with some loss of flexibility in making adjustments. These and other modifications and variations are intended to fall within the scope of the appended claims.
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Here comes the sun.
Upon seeing the outdoors for the first time in 30 years, a group of chimpanzees in Austria broke out into wide grins and leapt into the grass. The chimps, who had been used for medical research by a pharmaceutical company, had been kept in cages for most of their lives.
Testing on the chimps ended in 1997, when the pharmaceutical company was bought by American organization Baxter, but it took until now to get the animals back outdoors. The apes' keepers had to help them get readjusted to the idea of a world beyond their enclosure, and it seems all the hard work has paid off.
When the door to the facility opened, the chimps hugged each other and stared in amazement at their new world. They will now continue to enjoy a freer universe at an animal sanctuary outside Salzburg.
Overjoyed Chimps See Daylight for the First Time in Decades


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ATRIO Wine Bar | Restaurant
The Pinnacle of Downtown NYC Restaurants
Poised in the center of the Conrad New York's stunning 15-story atrium lobby, ATRIO crafts Mediterranean-inspired cuisine in the most sophisticated fashion while presenting a dramatic open kitchen design and sleek, contemporary restaurant décor.
The restaurant is open 7 days a week serving Breakfast, Lunch, Dinner and Brunch on Saturdays and Sundays. ATRIO also offers a full wine bar featuring an Enomatic System, allowing guests to enjoy fine wines by the glass, and a signature cocktail menu that utilizes local and house-made ingredients and changes seasonally.
As the epicenter of power and prestige continues to shift to Lower Manhattan, ATRIO remains the premier destination for a New York City dining staple – the Power Breakfast. Guests are invited to conduct meetings while enjoying local and seasonal cuisine, complimentary WiFi, personalized, intuitive service, and the world of style that Conrad Hotels & Resorts is known for.
With its sleek, contemporary style and inviting ambiance in the center of the Conrad New York's atrium lobby, ATRIO is the destination of choice for dining in Lower Manhattan.
ATRIO Wine Bar | Restaurant
102 North End Avenue, New York, NY 10282 | Reservations (646) 769-4250
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Cooking and Baking
Cooking with Sesame Oil
I've got a bottle of sesame oil and I've been trying to figure out how to use it. I kind of just add it to noodles for a quick snack but I'd love to find more uses for it.
Any suggestions?
Talk is closed, but that doesn't mean the conversations have to stop!
Check out this post for a more thorough explanation, and jump onto our Facebook page or our Twitter feed to keep the conversations going!


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Bryan Adams' Hit-Heavy Fox Show
By Jeremy Essig
Lightning Bolt's Sharp New Sound
By Jason Robinson
Fleetwood Mac Back with Classic Lineup
By Hans Morgenstern
Here's Who's Making STL Noisy This Spring
By Joseph Hess
Beatles Sister Louise Harrison Departs the Midwest
By Peter Gilstrap
By Julia Burch
Working Class Dogs to Honor Rick Springfield
By Jeremy Essig
Torche Gets Back Into Its Heavy Groove With Restarter
By Nathan Smith
Best Jazz Artist
Willie Akins
When famous jazz musicians passing through St. Louis have time to go out and hear a local performer, more often than not, it's Willie Akins they go to see. The veteran tenor and soprano saxophonist has been wowing out-of-towners, entertaining local listeners and mentoring young musicians since the '60s — and though woefully under-recorded by today's standards, Akins continues to impress with his technical mastery, emotional engagement, encyclopedic knowledge and musical integrity. (DM)
Hamiet Bluiett
Known internationally as one of the top baritone saxophonists in jazz, Hamiet Bluiett has made his mark as a bandleader and composer, a sideman to legends such as Charles Mingus, and as a member of both the original Black Artists Group and the World Saxophone Quartet. With the range to caress a beautiful ballad one minute and launch a free-jazz skronkfest the next, Bluiett brings both raw power and a canny intellect to every musical situation. (DM)
Erin Bode
Erin Bode and bandmate Adam Maness were burning the candle at both ends last year: In addition to handling most of Bode's songwriting, the pair released two albums and continued to perform locally, nationally and overseas. Despite contending with a full schedule, Bode hasn't let the quality of her music — or the phenomenal clarity and angelic tone of her voice — slip. Perhaps that's why her soothing blend of jazz and folk continues to win over new fans with each passing year. (CC)
Dave Stone
The sidewalks of South Grand don't have a star-studded "walk of fame" like they do in the Delmar Loop, but if they did, you can guarantee that saxophonist Dave Stone would be among the musicians, bartenders and scene-makers lionized. A regular performer at Mangia Italiano, Stone and his revolving cast of collaborators can go from hard bop to a laid-back groove at the drop of a beer bottle. His hard-edged tenor sax solos can be thorny or fluid, but either way Stone and company make sure that jazz music isn't pushed to the background. (CS)
Jeanne Trevor
Always a versatile performer, Jeanne Trevor has done musical theater for the Muny and other local companies in addition to fronting her own small group in clubs and concerts. Though Trevor can sing pop, cabaret and Broadway very well, she shines brightest as a jazz singer in the classic mode. The veteran shapes meter and melody to her own ends and improvises alongside her musicians in the tradition of Ella Fitzgerald, Sarah Vaughan and Betty Carter. (DM)
Best Metal/Thrash
Dude Nukem
Dude Nukem, winner of Best Band Name in RFT's 2008 Best of St. Louis issue, is an unabashed party band, one that molds the influences of Rich Kids on LSD and the Cro-Mags with Metallica. After essentially being the house band at the now-shuttered Building R, a punk warehouse on South Broadway, Dude Nukem carried that momentum into gigs around St. Louis, building a small but dedicated following of heshers. Since forming, it's released "Till Death Do Us Party" in limited quantities and hopes to release the Dude EP, a four-song seven-inch, this summer. — Nick Lucchesi
Blueberry Hill's Elvis Room, 11 p.m.
Cross Examination
It's been a hectic past year for Cross Examination, what with the release of its debut LP, Menace II Sobriety, and a West Coast tour. Still, the city's "Awesome Party Squad" doesn't appear to be slowing down anytime soon, even as its five-year anniversary approaches in August. The band's live performances are as raging as they've ever been, and with the release of Sobriety, the blogging heshers have put Cross Exam in the same company of thrash icons that influenced the band itself. (NL)
Head On Collision
"Don't refer to Head On Collision as 'party thrash.'" That's the message put out by bassist John Hancock, who also proclaims, "Fuck the party, this is thrash." The metal band, formed in 2003 is well schooled in heavy-metal history. That is to say, HoC sticks to fast-forward thrash, but isn't afraid to roll its riffs back to a punishing, marching pace. After a listen, heshers realize this stuff is much too pissed off to be considered party music. This year HoC will be recording new material, while singer Pat McCauley will be writing a music column for Thrasher. (NL)
Mongolian Clusterfuck's lineup consists of eighteen- and nineteen-year-old thrash rippers fond of donning jean jackets and Anthrax T-shirts. So what else is new? This type of band is plentiful in a city the size of St. Louis. However, newcomer MCF sets itself apart with youthful energy and a gnarly live show, perfected on the plywood stage at Building R, the long-gone south-side warehouse. "That place was insanely epic," says guitarist Joe Genens. The St. Charles-area band recorded twelve songs last summer for a full-length record, which is set for a DIY release soon. (NL)
Sine Nomine
Sine Nomine ceased making noise in 2006, but the act was apparently just hibernating: The band woke from its slumber a more ferocious beast than it was when it stopped. Its distorted, horror-film dissonance is more gory and its crap-your-pants lows more solid — impressive from a bass-less trio — while abrupt blast-beats burst forth like they expect an afterlife greeting from 72 virgins. Sine Nomine defies genre classification — but that's representative of its refusal to paint by anybody else's numbers, not a sign of confusion. (RW)
Blueberry Hill's Elvis Room, 10 p.m.
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