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There's no denying the desire to hit the refresh button during this time of year—especially if you live in a part of the country where the weather is bleak. "Winter can make us feel like even our best assets are dull," says Vivian Diller, Ph.D., author of Face It: What Women Really Feel as Their Looks Change and What to Do About It. Thankfully, "little tweaks can help you look—and feel—more attractive and invigorated." To that end, we've mapped out two months' worth of quick updates that are sure to banish your beauty blues. Enjoy!
Week 1 Glow Getters
Go for gold. For an Instagram-like radiance in real life, apply a gilded liquid luminizer all over your face with a fluffy brush, says Tim Quinn, celebrity makeup artist for Giorgio Armani Beauty. Put one pump in the palm of your hand, run the brush through it, and then swirl all over your skin. Try: Stila All Over Shimmer Liquid Luminizer in Kitten Shimmer ($20, sephora.com).
Blush up. Bluebased blush shades (like berry) counteract the sallowness of winter skin, and where you apply it can make all the difference. "Blend it on the apples of your cheeks for a fresh-faced look," says Sarah Lucero, Stila celebrity makeup artist. Try: Revlon Cream Blush in Flushed ($13 at drugstores). Feeling puffy? Choose a terra-cotta shade and wear it higher on the cheekbones for a sculpting effect.


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Educational Webinar Series
Controversies in the Use of Procalcitonin to Diagnose Sepsis
Educational Podcast Series
Episode 17 - The Tools that Enable Early Sepsis Diagnosis & Risk Assessment in the ED LISTEN NOW
Educational Webinar Series
Two-Part Webinar Series on Early Recognition
and Risk Assessment of the Septic Patient
WEBINAR 1: September 19, 2013 • 11:00am
One Down, 49 to Go Presented by Dr. Carl Flatley
The Tale of Two Tests Presented by Dr. Mark Oltermann READ MORE
WEBINAR 2: October 2, 2013 • 2:30pm
The Value of Setting an Early Procalcitonin Baseline in Continuous Risk Assessment Presented by Devendra N. Amin, MBBS, FCCP & Stephen Haire, MD READ MORE
Second to heart attacks, sepsis is the leading cause of death in the intensive care unit. As many as 750,000 patients progress into severe sepsis each year in U.S. hospitals, and approximately 200,000 of these patients do not survive.*
Sepsis can be extremely difficult to diagnose because its primary symptoms mimic the symptoms of several other critical care conditions, including myocardial infarction, pneumonia, pulmonary embolism and other high-morbidity conditions. And because of the aggressive nature of sepsis, diagnosing and initiating treatment of this infection needs to happen as soon as possible. Access to specific information may increase the accuracy of sepsis diagnostics during the critical early stages.
This site was developed to increase awareness and share knowledge related to the use of Procalcitonin and other testing techniques and systems that can be used in diagnosing, treating and managing sepsis.
*Angus DC, Linde-Zwirble WT, Lidicker J, et al. Epidemiology of severe sepsis in the United States: Analysis of incidence, outcome, and associated costs of care. Crit Care Med 2001; 29: 1303-1310.
The Staunton Family Gets Landmark Senate Hearing on SepsisbioMerieux congratulates Mr. Staunton in the upcoming Senate Hearing and supports the foundation's efforts to raise awareness of sepsis Read More
Shining the Light on Sepsis: September is Sepsis Awareness MonthAnnouncing educational opportunities to implement effective, evidence-based sepsis protocols Read More

subset: commoncrawl


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Be Safe on Campus
The safety of our patrons is a top priority of the Ferst Center. Please be aware of the following safety tips and resources when visiting the Ferst Center.
- The Ferst Center recommends parking in the visitor lot in Parking Area 2 and the deck in Parking Area 3 when attending events. These areas offer ample, well-lit parking.
- Keep packages and valuables out of sight in your vehicle either under a seat, in a glove box, or in the trunk.
- When leaving your vehicle, be certain your windows are rolled completely up and your doors are locked.
- Avoid walking alone, especially at night.
- Remain aware of your surroundings at all times.
- The Ferst Center staff is available to call a taxi for any patrons needing transportation after an event.
Georgia Tech student resources:
- Request a Stingerette shuttle at www.stingerette.com or (404) 385-RIDE
- Request a Georgia Tech Police escort at (404) 894-2501


text:
October 24, 2003
ALBUQUERQUE, N.M. - The University of New Mexico women's basketball team will hold an intra-squad scrimmage on Saturday, October 25, at approximately 7 PM. The scrimmage is open to the public and will be held in The Pit following the men's Lobo Howl. The UNM will officially open the season with an exhibition game on Tuesday, November 11, against the West Coast All-Stars at 7PM.


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Originally Posted by SimpleJack
I never used the "My mom's dead" defense for Yo Mama jokes but it was appropriate here.
That's a badass quote you have now, no?
I'm still partial to the "I agree with everything RD said" quote, but I got a kick out of this one.
Originally Posted by SWIFTboy
I rode a horse. Banged in a hot spring.
Originally Posted by GL Jeff
Is he bigger then WarMachine?
Originally Posted by Fedorlei Gomipierre
Hey Kevo, got any new Nelson Mandela's close to death jokes???
TJ will get his chance to shut pettis up when he comes lookin for a title shot.
Welcome to Sunnyvale.
No, wait..Fuck you!
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text: Appendix B21: Facts and Flow Chart The Falls Management Program Manual Facts1 in 3 persons > 65 years will fall each year.Of 1.7 million residents in nursing facilities, about 50% will fall each year.Of those that fall, 30-40% will fall two or more times.10% of residents have a serious injury related to a fall.About 65,000 patients suffer a hip fracture each year.Consequences of FallsReduced quality of lifeDecreased ability to functionSerious injuryIncreased risk of deathIncreased level of fearIncreased level of careIncreased paperwork for staffPoor survey resultsLawsuitsHigh insurance premiumsThe Falls Management Program (FMP)The Falls Nurse Coordinator will conduct a Falls Assessment of your residents who are found to be at high fall risk during screening and after an initial fall. You will receive a Primary Care Provider Fax Report and Orders asking you to review the results and to order referrals or participate in the assessment as indicated. A copy of the 3-page Fax Report and Orders is attached. It is important that you respond to the fax ASAP so that the nurse coordinator can use your recommendations to develop an individualized care plan. Thereafter, whenever your resident falls, you will receive a Fax Alert. A copy is attached.Flowchart Page last reviewed October 2014 Internet Citation: Appendix B21: Facts and Flow Chart: The Falls Management Program Manual. October 2014. Agency for Healthcare Research and Quality, Rockville, MD. http://www.ahrq.gov/professionals/systems/long-term-care/resources/injuries/fallspx/fallspxmanapb21.html


text:
Janet Eldred
Office Hours (Spring 2015) On sabbatical
Ph.D. University of Illinois, Urbana
Areas of Specialty:
- Essay and Creative Nonfiction
- Literacy Studies
- History of U.S. Composition and Rhetoric
- Instructional Technology
- Editing and Publishing
Selected Publications:
Essays and Creative Nonfiction:
- Heritage 101 or the Obligation to Write, Forthcoming in Revelations, Lies, Loves, and Loss; eds. Charles Schuster and Sondra Perl.
- Composition, or a Case for Experimental Critical Writing. In Labor, Writing Technologies, and the Shaping of Composition in the Academy, eds. Pamela Takayoshi and Patricia Sullivan, 2007.
- Sentimental Attachments: Essays, Creative Nonfiction, and Other Experiments in Composition. Heinemann, 2005.
- Modern Fidelity. Fourth Genre 3.2 (2001): 55-69.
- Children at All Costs. Literal Latte 4.5 (1998) [Roy T. Ames Memorial Essay Award (2nd), Judge: Phillip Lopate], 8-12.
- The Technology of Voice. College Composition and Communication 1997.
Rhetorical History and Literacy Studies
- Imagining Rhetoric: Composing Women of the Early United States (with Peter Mortensen). University of Pittsburgh Press, 2002.
- Figuring Culture and Literacy in Cather's 'Paul's Case.'" Journal of Narrative and Life History 3.2-3 (1993): 299-318.
- Reading Literacy Narratives (with Peter Mortensen). College English 1992.
- Narratives of Socialization: Literacy in the Short Story. College English 1991.
Current Projects:
Literate Zeal: Editing, Gender, and the Making of a New Yorker Ethos
Literacy and Intangible Heritage in Azorean-American Communities


text:
Houses that rattle all day
Open letter to City Councilman Don Knight:
The gravel pit at Pikeview is open again - has been for a period of time. The pit is a double-edged sword. It did a great job of saving so many houses from the wrath of the wildfire. Locals stopped calling it "the scar" and praised it. The problem comes with how we move all that material from the hill to the concrete plant. Trucks is the answer. They can start at 7 a.m., I presume, as this is when my house and my neighbors houses shake. Some of my neighbors stated that they could not tolerate the noise and put their house up for sale. None have sold. Many have put their house up for rent, at a reduced rate. They moved elsewhere. Complaints have been registered. Signs informing the truck drivers to respect the area houses with a quiet zone. "No Compression Brakes" while most of the truckers comply, there are still many that seem to not care. Some traverse down the hill and make barely a noise. Some have their compression brakes applied at the pit. Some as soon as the sign is in the rear view mirror.


text:
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wildlife borneo - kinabatangan river
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Dreamcast Games
This page contains Rainbow Six Codes for Dreamcast called "Victory conditions" and has been posted or updated on Oct 4, 2006 by zaktan112. Let us know what you think of this Code by thumbs voting.
Game Boxshot & Details
- Developer: Pipe Dream Interactive
- Publisher: Majesco Games
- Genre: Action Shooter First-Person
- Release: May 9, 2000
- ESRB: Teen
Game Codes
Victory conditions
Press Analog-stick Up + D-pad Down + B during game play to toggle the victory conditions. This will prevent the mission from being lost if you trigger an alarm or the terrorists shoot the hostages.
All Game Codes
From: helloguys1234
From: zaktan112
From: JihadYoe
From: golddragon9t9
From: Local-Ip
From: feeling
From: LOuC4N
From: MMStick
From: torgeirst
From: licht44
From: JihadYoe
From: kimijames
From: jojo
Back to all Cheats
From: LOuC4N
Game Questions
Stuck on this game? Set a specific, clearly defined question and let other gamers answer your question or view answers to previously asked questions. If you think you are an Rainbow Six expert then please try to help others with their questions.
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Rainbow Six - Intro Movie
- May 24, 2014, Views: 38
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text:
Disclosed is a method of testing ultra large area integrated circuits. The circuit has a plurality of individually addressable elements. The method comprises providing a dispersed chargeable powder with the integrated circuit in proximity to and above the powder. At least one device of the integrated circuit is electrically selected. An electrical potential is applied between the integrated circuit and the dispersed powder. The potential causes the chargeable particles to adhere to substantially only functional selected devices of the integrated circuit, thereby differentiating between functional and non-functional devices.
1. A method of testing a large area active matrix liquid crystal display; said method including the steps of:
(a) providing a matrix array which includes a plurality of rows and columns of address lines; each pair of adjacent row address lines and column address lines defining a picture element; each picture element including switching means for discretely electrically interrogating said element; said switching means including a plurality of thin film layers of silicon alloy material;
(b) providing a chargeable dry powder;
(c) providing the matrix array of picture elements, including the layers of silicon alloy material of the switching means, in proximity to the chargeable powder;
(d) electrically activating the switching means of the matrix array; and
(e) applying an electrical potential between the switching means and the powder, said potential causing particles of the chargeable powder to adhere to the activated picture elements of the matrix array.
2. The method of claim 1 wherein the switching means each comprise at least one non-linear microelectronic device.
3. The method of claim 1, wherein the chargeable powder comprises an effective amount of carbon black.
4. The method of claim 1 comprising applying an electrical potential of at least about 2 volts between the large area matrix array and the chargeable powder.
5. The method of claim 2 wherein the non-linear microelectronic device is selected from the group consisting essentially of field effect transistors, bipolar junction transistors, capacitors, threshold devices, diodes, and combinations thereof.
The present invention relates broadly to detecting manufacturing defects in ultra large area, ultra large scale integrated ("ULSI") circuits, as used, for example, in displays, sensors, and memories. The ULSI circuits are formed of semiconductor materials, most commonly non-crystalline semiconductor materials, e.g., amorphous, microcrystalline, or polycrystalline semiconductor materials. The materials may be formed by various deposition techniques or by various epitaxial growth techniques. The ULSI circuits may have one million or more individual non-linear devices, i.e., active devices, each having feature sizes on the order of microns. According to the invention an electric potential is applied between the ULSI circuit and a dispersion of chargeable fine particles. The electric potential causes the fine particles to be attracted to and adhere to the selected functional elements of the ULSI circuit. The invention provides a rapid, economical, real time quality control process.
ULSI circuits include semiconductor memories as various kinds of RAMs and ROMs, optoelectronic devices as displays, e.g., active matrix liquid crystal displays, and sensors, as contact sensors and projected image sensors. These ULSI circuits can have as many as a million or more individual pixels, display cells, sensor cells, or memory cells, over an area of less than one tenth of a square meter, e.g., from about 0.6 square meter or more. Deposited or grown semiconductor ULSI's may contain 10 or more pixels, memory cells, or sensor cells per square millimeter. Each such individual cell has many resistors, diodes, and capacitors, and active devices, such as field effect transistors, and junction transistors. Thus, a ULSI may contain up to 40 million or more such individual devices, with each device having a feature size of as small as one micron.
These ultra large scale integrated circuits are fabricated by various methods including both epitaxial growth and deposition, by CVD and plasma processes. One typical method of fabricating these devices is the sequential deposition of amorphous semiconductor alloy layers to form, for example, large area diodes. These large area diodes may then be subsequently patterned, e.g., by lithographic processes, to form many individual diodes. Depositions may be accomplished by plasma assisted chemical vapor deposition, as disclosed, for example, in U.S. Pat. Nos. 4,226,898 and 4,485,389 to Stanford R. Ovshinsky and Masa Izu. As described by Ovshinsky and Izu, a plurality of semiconductor layers are successively deposited on a substrate, following which a top layer of metal is deposited. At least the top metal layer is then patterned using conventional photoresist mask and etching techniques, following which the semiconductor layer or layers may be likewise patterned, also using conventional photoresist mask and etching techniques.
An alternative method of fabricating thin film semiconductor ULSI circuits comprises depositing the semiconductor layers on a substrate, patterning the semiconductor layers with one large pattern, depositing the top layer of the metal, and then patterning the top metal layer with another pattern.
ULSI circuits can also be fabricated by sequentially combining several related techniques, e.g., deposition and/or epitaxial techniques in sequence with etching techniques. These techniques are especially useful in fabricating ULSI circuits with individual devices of semiconductor and semiconductor alloy materials, especially amorphous, microcrystalline, or polycrystalline semiconductor alloys of silicon or germanium. Examples of such individual devices include diodes, Schottky barrier diodes, non-linear threshold switches, field effect transistors, junction transistors, capacitors, and the like as well as linear devices as resistors.
These sequential steps have particular application to thin film semiconductor devices employing so called mesa structures, as found, for example in thin film large area distributed memories, displays, and sensors. "Mesa structure" refers to a structural or topographical feature of the device as characterized by one or more superimposed patterned semiconductor layers being elevated relative to the surrounding features of the device by the use of one or more steeply sloped or substantially vertical sidewalls. As described by Meera Vijan, John McGill, and Paul Day in U.S. Pat. No. 4,680,085 issued July 14, 1987, for A Method of Manufacturing Thin Film Semiconductor Devices, and specifically incorporated herein by reference, it is possible to fabricate large area, ULSI, active matrix liquid crystal displays having a plurality of diodes per pixel, e.g., two to four diodes per pixel. These large area, ULSI, active matrix liquid crystal displays are described in U.S. patent application Ser. Nos. 573,004, now abandoned, and 675,941, now abandoned, respectively filed on Jan. 23, 1984 and Dec. 3, 1984. The processes can also be used to produce ULSI circuits comprising non-linear threshold switch devices of the type described in U.S. patent application Ser. No. 603,852 now U.S. Pat. No. 4,667,189 issued May 1987 to Willem den Boer, J. Scott Payson, and Zvi Yaniv for Programmable Semiconductor Switch For A Display Matrix Or The Like And Method Of Making The Device and in U.S. patent application Ser. No. 679,770 filed Dec. 10, 1984 now U.S. Pat. No. 4,698,627 a continuation-in-part of said U.S. patent application Ser. No. 603,852. Similarly, ULSI circuits can contain n-pi-n and p-nu-p threshold devices using punch through technology described in U S. patent application Ser. No. 720,767 filed Apr. 8, 1985, now abandoned; and in the corresponding European Laid Open Patent Application 198346 of Subhendu Guha for Solid State Threshold Devices as well as two dimensional imaging devices of the type disclosed in U.S. patent application Ser. No. 713,928 filed Mar. 20, 1985 now U.S. Pat. No. 4,675,739 issued June 23, 1987 to Vincent Cannella, Clive Catchpole, John Keem, Louis Swartz, and Zvi Yaniv for Integrated Radiation Sensing Array. The disclosures of all of the aforementioned U.S. Patents and U.S. Patent Applications are specifically incorporated herein by reference.
As described by Meera Vijan, John McGill and Paul Day, above, the ULSI fabrication method comprises the steps of depositing one or more semiconductor layers on a substrate, forming a top contact metal mask over portion of a semiconductor layer, and thereafter removing the unwanted portions of semiconductor layers around a portion of semiconductor alloy material protected by the mask. The unwanted semiconductor alloy material is removed by an etching process in which a source of reactive ions etch away the unwanted portion of the semiconductor alloy material and the mask acts to prevent etching of those portions of the semiconductor layer which underlie the mask. As described by Vijan, et al. the etching is performed in a plasma reaction chamber in which ion bombardment is normal to the surface of the substrate. Consequently lateral etching of the semiconductor layers is eliminated and the resulting mesa structure possesses smooth sidewalls free of voids or overhangs. Moreover, the edges of the top metal contact mask are aligned with the walls of the underlying semiconductor layers. Vijan, et al. reports that the use of carbon tetrafluoride as the process gas during the etching, in the substantial absence of oxygen, provides particularly desirable results.
Following the processing of the mesa structure to repair ion damage and neutralize any contaminants on the sidewalls thereof, an insulative layer may be deposited over and around the mesa structure. This insulative layer preferably makes continuous contact with the mesa structure sidewalls, thus obviating possible voids. In a subsequent step, a via, preferably having sloped sidewalls, is formed through the insulative layer to the top metal contact mask. Thereafter, a layer of metallization is applied to the device using conventional masking and etching techniques. The remaining unetched metallization fills the via to make contact with the upper metal contact mask and forms an electrical lead which is connected to the top layer of the mesa structure. The bottom semiconductor layer of the mesa structure is connected to a bottom electrical contact lead which may be deposited on the substrate, e.g., before the mesa structure is formed.
The address lines in ULSI circuit are deposited by similar techniques. Typically, the x address lines, the y address lines, and the individual non-linear devices of the ultra large surface area ULSI's have a feature size of about 10 microns or less. As noted above, other large area, ULSI circuits as used in a display, sensor, or ROM, may have up to 40 million or more individual non-linear active devices incorporated therein. Testing of either all of the individual devices, or of at least all of the individual cells or elements containing a plurality of devices is necessary in order to avoid carrying improperly manufactured ULSI circuits through the complete manufacturing process, especially in the case of ULSI circuits having transparent conductive elements.
The inter-related problems of low yield, combined with expensive testing for defective cells are obviated by the method of this invention. According to the invention there is provided a method of testing a very large area, ULSI circuit, disclosed herein, having a plurality of individually addressable circuits early in the production process without expensive, time consuming, and labor intensive microprocessor driven testing. The method of the invention is an electrostatic method that immediately visually locates and identifies defective cells and address lines. The method comprises providing a chargeable powder in proximity to and below the integrated circuit with some means of agitation, i.e., to disperse the chargeable powder in order to allow it to be electrostatically attracted to the ULSI circuit. Agitation can be by flowing gas or by vibration. By a chargeable powder is meant a powder that will accept an electrostatic charge and adhere to a surface of opposite polarity. At least one of the individual devices of the ultra large scale integrated circuit is electrically selected. The selection and testing of the circuit is accomplished by applying electrical potential between the integrated circuit and the powder. The potential causes the powder particles to adhere substantially to only functional selected devices of the integrated circuit. At this point the circuit can be inspected for non-functioning devices, shorted or open transmission lines, and the like, and then the particles removed. The voltages used are typically in the range of device operation of the ULSI circuit, or lower, and generally less than 20 volts.
The ultra large area, ULSI multi-element integrated circuit may be an optoelectronic circuit as a display circuit where the individual addressable elements are picture elements, i.e., pixels. Alternatively, the ULSI circuit can be a sensor circuit where the individual addressable elements are sensor elements. Alternatively, the very large scale integrated circuit may be a memory as a random excess memory or a read only memory, and as a programmable read only memory.
The ULSI circuit has addressing means for individually addressing individual elements, e.g., row address lines and column address lines. The individual address lines generally have a feature size of less than about 100 microns.
The individual elements, as memory cells, picture elements, or sensor elements, each comprise at least one and may comprise 40 or more microelectronic devices as diodes, junction transistors, field effect transistors, threshold switches, memory switches, capacitors, inductors, and resistors.
The powder used to detect faults is a chargeable powder, and preferably a submicron powder, for example, carbon black. One satisfactory source of carbon black is electrophotographic toner. The concentration of powder in the electrophotographic toner and the total amount of electrophotographic toner is an amount sufficient to adhere to the functioning devices or elements thereof, and to address lines, but not adhere to the non-functional elements and address lines.
One source of the chargeable powder is electrophotographic toner. The concentration of chargeable powder in typical electrophotographic toners is at least about five weight percent, and generally from about five to 20 weight percent. Alternatively, carbon black alone may be utilized as the chargeable powder. The preferred carbon black has a mean particle size of less than about one micron, and an electrical resistivity of from about 104 to 1011 ohm centimeters.
In carrying out the method of the invention, an electrical potential of up to about 20 volts, and generally from about 3 to about 10 volts is applied between the large area, ultra large scale integrated circuit and the powder.
The invention may be understood by reference to the drawings shown below.
FIG. 1 is a perspective view of a generalized ULSI circuit with 64 individual general cells, and address lines, with the chargeable powder adherent to operational lines and elements.
FIG. 2 shows a perspective view of a ULSI circuit with testing drive means to apply a field, a conductive powder in proximity thereto, and agitation means.
FIG. 3 is a ULSI circuit display.
FIG. 4 shows a perspective view of an ultra large surface area, ultra large scale integrated circuit sensor.
FIG. 5 shows a perspective view of an ultra large surface area, ultra large scale integrated memory device.
The method of our invention is generally shown by the sequence of FIGS. 1, and 2. These Figures show a ULSI circuit 1 after the deposition of the microelectronic devices 20 thereon and the address lines 21, 23 thereon, defining individual circuit elements thereof. To be noted are the individual cells, with binary addresses "000000" through "111111" addressed by addressing and driving circuits 50 and 51. The microelectronic devices, that is the individual circuit elements, as diodes, bipolar junction transistors, field effect transistors, capacitors, threshold switches, memory switches, and the like are indicated generally by 20 while the address lines are indicated by 21 and 23. These individual devices and address lines have feature sizes from about 1.0 micron to about 50 microns. The method of the invention inexpensively and quickly, in real time, detects manufacturing defects in both the microelectronic devices 20 and the address lines 21 and 23.
According to the invention described herein, there is provided a method of testing a large area integrated circuit 1 having a plurality of individually addressable elements 11 early in the production process, without expensive, time consuming, and labor intensive microprocessor driven testing. The method of the invention is an electrostatic method that immediately visually locates and identifies defective cells and address lines.
As illustrated in FIG. 2, the method comprises providing a dispersed or agitated powder 75, with the integrated circuit 1 in proximity to and above the powder 75. At least one device 20 of the ULSI circuit 1 is electrically selected. Testing of the ULSI circuit 1 is accomplished by applying an electrical potential, V, between selected address lines of the integrated circuit 1 and the conductive powder 75'. The potential causes individual conductive particles 75 to adhere to substantially only functional selected devices 20 and address lines 21 and 23 of the integrated circuit as shown with particularity in FIG. 1.
As noted above, the method of the invention can be used with various kinds of large area integrated circuits. One such ULSI circuit is a display circuit, e.g., a light influencing display circuit 100, shown in FIG. 3, with individually addressable elements. Light influencing displays 100 are well-known in the art. Examples are liquid crystal displays, electro illuminescense displays, and electro chromic displays. The invention is applicable to all types of large area displays. The ULSI circuit displays 100 have plurality of individual addressable picture elements 111 called pixels. Each pixel 111 has a separate pair of opposing pixel electrodes, with light influencing material between them. Voltages are selectively applied to the electrode pairs. This causes the light influencing material between the electrodes to influence light, to emit, i.e., light, or to change optical density, or to change configuration, or to otherwise change polarization coefficient, extinction coefficient, or other optical parameters. These opposing pixel electrodes may be located on opposing substrates, such as opposing glass plates, with the light influencing material, such as liquid crystal material, located between the substrates. Alternatively, they may be on the same sheet of glass.
In relatively small arrays of pixels, such as those found in many digital watches, it is common to have all the pixel electrodes on one substrate connected in common and to have a separate address line for selectively applying voltages to each of the pixel electrodes on the second substrate. However, in large area arrays 100, such as large x-y arrays, it is impractical to have a separate address line connected to each pixel because too much room would be required by so many lines. Thus, in displays with many pixels 111 it is common to use x-y matrix addressing, e.g., with address lines 101 and 103 in which all the bottom pixel electrodes in a given row are connected to an address line 101 associated therewith, and all of the pixel electrodes of a given column are connected to an address line 103 associated with that column. This enables each pixel to be addressed by selecting its associated x and y address lines 101 and 103.
In relatively small x-y arrays each of the x and y lines are usually directly connected, without intervening electronic devices, to the top and bottom pixel electrodes in their associated rows or columns. Usually the pixels of such an array are driven sequentially in a scanning process in which each row is selected successively, and, during the selection of each row, each column is selected successively, causing each of the pixels of each row to be scanned in sequential order. During the time allotted for the selection of each pixel, the circuitry decides whether that pixel is to be turned on or off by controlling the amplitude of the voltage applied across the pixel.
In parallel scanned arrays each of the rows is selected in succession. During the selection of a row all of the column lines are driven in parallel with individually selected voltages, turning each pixel in the row to a desired state, either "on" or "off". Such multiplexing scanning schemes in which the pixels are driven directly by their x and y address lines without intervening non-linear electronic devices can work for relatively small arrays, and the method of this invention with these multiplexed arrays. However, as array size grows, the amount of time available for the application of a voltage to a given pixel or row of pixels decreases. As a result, the percentage of time during each scanning cycle that an individual pixel has a voltage applied across it decreases, thereby decreasing the average contrast between its "on" state and its "off" state. For this reason, large individually multiplexed displays tend to produce images with poor contrast, making such displays difficult to read.
One method of overcoming this limitation has been to use active display matrices instead of individually multiplexed matrices. In active display matrices, each of the pixels has associated therewith non-linear electronic devices which act as switches. The switch enables current to flow to or from the pixel during the brief period when the pixel is selected, enabling it to rapidly change state from "off" to "on" or vice versa. The switch also prevents current from flowing to the pixel when the pixel is not selected. By this expedient the charge placed on the pixel during its brief selection period is substantially maintained during the rest of the scanning cycle. As a result, the pixel tends to maintain its state, i.e., its "on" or its "off" state, during the entire scanning cycle, and not just when "selected", greatly increasing the contrast of the display.
One type of electronic device commonly used with pixels 111 of active display matrices 100 is the three terminal control device, i.e., a transistor such as a bipolar junction transistor or a field effect transistor. A three terminal control device is one that has two current path electrodes and a control electrode, i.e., emitter and collector current path electrodes, and a base control electrode in the case of bipolar junction transistor, and source and drain electrodes, and a gate control electrode in the case of field effect transistor. For example, in thin film field effect transistors, which are used in active matrix displays 100, the voltage applied to the gate electrode controls the amount of current which flows between the source electrode and the drain electrode, while in a bipolar junction transistor the base-emitter voltage controls the base current. The base current controls the emitter current and either saturates or controls the collector current.
The three terminal devices are usually arranged on one substrate of a display 100 with one of the current path electrodes connected to an electrode of the associated pixel. X and y lines 101 and 103 are on the substrate addressing each three terminal device and its associated pixel 111. One of the sets of address lines, for example, an x line 101 is connected to the control electrodes (base or gate electrode) of all of the three terminal devices in a row. Correspondingly, the other set of address lines, i.e., the y address lines 103, are connected to one of the current path electrodes of the control devices. For example, a y address line 103 is connected to a current path electrode of each pixel in its column. All of the pixel electrodes on the opposite substrate are typically connected to a common voltage, such as ground.
In operation, a given pixel is selected by applying voltage between the x line 101 connected to the control electrode of the three terminal device and the y line 103 connected to current path electrode of the three terminal device. For example, when the three terminal devices are thin film field effect transistors, the source electrodes of the transistor are connected to y lines 103 and the gates of the transistors are connected to x lines 101. A selected transistor is switched by applying the desired voltage between x line 101 connected to a current path and the y line 103 connected to the gate electrode.
Alternatively, the ultra large area, multi device, Ultra Large Scale Integrated (ULSI) circuit may be a sensor circuit, as shown in FIG. 5. A sensor circuit 200 includes an array of photosensor pixels 211. Each photosensor pixel 211 is capable of providing a detectible output signal. The individual pixels 211 sense the amount of light incident thereon. The addressing and drive circuitry, e.g., address lines 201, and 203, and peripheral circuitry 150, 151 identify the amount of incident light to a location on the surface of the sensor 200. Sensor matrix arrays may be linear or two dimensional arrays. The array 200 shown in FIG. 5 is a two dimensional array.
Each photosensitive pixel includes a photogenerative element as a phototransistor, a photoresistor, or a photodiode for providing a detectible signal in response to the absorption of incident light. Each pixel also includes a blocking element for selectively blocking current flow through the selected or non-selection pixels.
Each pixel has a capacitance device which stores electric charge. This capacitance and the charge stored therein are what is read. Two types of photosensors are in use, and the method of the invention is useful with both of them. In one type of photosensor pixel, a predetermined amount of charge is stored across the pixel capacitance. The charge is discharged by a photo current produced by the light incident thereupon. The charge remaining on the pixel after a predetermined length of time has elapsed is a measure of the time integrated light intensity, i.e., the total amount of light sensed thereby.
In the alternative type of pixel, the photosensor element is a photovoltaic device. Exemplary is a p-i-n diode. A photovoltaic device may be operated forward biased in the fourth quadrant of its I-V (current-voltage) characteristic curve or reverse biased in the third quadrant of its J-V (current-voltage) characteristic curve. The photovoltaic effect is used to allow the pixel to generate charge in response to the light incident thereon. The total amount of charge generated is a measure of the time integrated incident light.
Either mode of photosensor may be utilized to generate a data stream. The data stream represents the illumination sensed by the pixels. In this manner, an array of pixels may be utilized to scan a pattern of information, such as alpha numeric information on a printed or written page, or a pattern on a surface of a work piece, or the like. Scanners are available in a multitude of embodiments, including arrays made using single crystal silicon or gallium arsenide technologies, thin film technologies, and hybrid technologies which combine thin film and single crystal devices.
Exemplary scanners made using thin film fabrication methods are described in U.S. Pat. No. 4,660,995 issued Apr. 2, 1987, to Vincent D. Cannella, Zvi Yaniv, and Robert R. Johnson for Contact Type Document Scanner and Method and in U.S. Pat. No. 4,675,739 issued June 23, 1987, to Clive Catchpole, Zvi Yaniv, Vincent D. Cannella, John Keem, and Louis Swartz for Integrated Radiation Sensing Array, the disclosures which are incorporated herein by reference.
Typically, the pixels are deployed in a two dimensional array. A two dimensional array of pixels may be utilized to scan an information bearing surface in contact therewith or projected thereon. In order to address an array of pixels, various multiplexed schemes are utilized. Alternative multiplexing schemes are described in U.S. patent application Ser. No. 885,897 filed July 15, 1986, now U.S. Pat. No. 4,728,803 issued Mar. 1, 1988 to Clive Catchpole, Jepson, Louis Swartz, and Olivier F. Prache for Signal Processing Apparatus and Method for Photosensitive Imaging System, the disclosure of which is specifically incorporated herein by reference.
The method of this invention is particularly applicable to very large area scanners, e.g., scanners having an area generally greater than about 8 inches by 10 inches. These scanners, typically fabricated by deposition techniques, have features, as address lines 201 and 203, and non-linear devices, that are formed by thin film deposition techniques with transparent features and/or small feature sizes.
In a typical array 200 each pixel 211 includes a blocking element, i.e., on isolation switch, for example, a diode, a transistor, or a threshold switch, disposed electrically in series with the photosensitive element. The blocking element assures that the only electrical signals that are read are those of the preselected or address pixels. When a photoresistor type pixel is illuminated, i.e., sensing information, the photosensitive element acts to dissipate the charge initially stored thereon. The voltage is periodically read, and is a measure of the time integrated illumination since the last reading. In arrays using photovoltaic elements, i.e., photodiodes operated in the fourth quadrant of the I-V characteristic curve, charge is cumulatively stored. In both cases the blocking element prevents leakage dissipation of the stored charge on the pixel. When the charge remaining or cumulatively stored in the pixel is to be read, the blocking element is rendered conductive, as, for example by forward biasing a diode, and the charge read.
Each pixel of the array may include a pair of blocking elements coupled together in series relationship at a common node, and in electrical communication with at least one of the address lines associated with the pixel. The pixel further includes a photosensitive element in electrical communication with the common node and with at least one other of the address lines of the pixel. As shown in FIG. 5, the pixels may be arrayed in a two dimensional array. Alternatively, the image sensor may be a linear image scanner, i.e., a linear scanner.
Alternatively, the ultra large surface area, ultra large scale multi device integrated circuit may be a memory as a RAM, shown with particularity in FIG. 6. The RAM there shown includes a plurality of individual memory cells 311. Each memory cell includes a memory write line 3.5, a memory read line 309, a data line, two and gates for supplying data to a flip flop, and a flip flop.
The address lines, interconnects, leads, bus bars, and non-linear electronic devices can have feature sizes of less than about 100 microns, typically less than 1.0 micron, e.g., from about 0.05 micron to about 50 micron.
It is particularly critical to economical manufacturing of these ULSI circuits that defective circuits be identified as early as possible in the manufacturing process in order to avoid carrying out further expensive, time consuming, manufacturing steps on circuits which are incapable of being utilized as fully operative, functional circuits. Thus, early identification of defective integrated circuits and of systematic manufacturing errors is essential to the economical manufacture and sale of ULSI circuits.
In this regard it has been found that if an ULSI circuit is maintained in proximity to a source of finely powdered chargeable particulate material, it becomes possible to cause the finely powdered material to adhere to substantially only functional circuit elements, pixels, and devices and to fail to adhere to inoperative segments thereof. This allows a quick visual examination of the ULSI circuit to quickly identify defective circuits. Key variables are the size of the chargeable particulate material, the electrical parameters thereof as the dielectric constant or the electrical conductivity thereof, the field applied between the powder and ultra large scale integrated circuit, and the agitation.
One desirable particulate chargeable material is carbon black. When carbon black is used as the chargeable particulate material, one preferred carbon black is approximately 1 micron in size, and generally from 0.8 micron to about 10 microns in size. Carbon black of this size is commercially available as a component of electrophotographic toner materials. More particularly, electrophotographic toner materials, including both the carbon black, as described hereinabove, and 1 micron to 10 micron thermoplastic polymer particles may be utilized, with both the polymer and the carbon black adhering to functional circuit elements and address lines.
We have obtained satisfactory results with commercially available electrophotographic toners containing at least about 5 weight percent carbon black and generally from about 5 to about 20 weight percent carbon black. Electrophotographic toners containing higher or lower amounts of carbon black may also be useful in the method of this invention. The preferred carbon black is carbon black having an electrical resistivity from about 10-4 to about 10-11 (ohm-centimeter).
The potential applied is generally from about 2 to about 20 volts with the device being from about 1 to about 10 centimeters from a bed of chargeable particulate. The chargeable particulate is agitated, e.g., by a flowing and/or circulating gas stream, or by ultrasonic vibration.
While the invention has been described with respect to certain preferred exemplifications and embodiments thereof, it is not intended to limit the scope of the invention thereby but solely by the claims appended hereto.
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Louis Brouckaert is now riding for BSD through Grondedbmx and this is his welcome-edit.
Music: Wu-Tang Clan Vs. The Beatles - C.R.E.A.M. (Tom Caruana)
Editing: Robbe De Blanger and Bart Cautaerts
Filming: Birre Kareman, Charles Brouckaert, Robbe De Blanger and Bart Cautaerts
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A love of the horse and understanding the needs of the rider are two of the variables in the equation that set Aiken Saddle Pros Hal Hargrave and Jana Mallow apart from their competition. The Aiken-based couple use a 10-point evaluation when fitting a saddle for a horse and three points for the person who will be in the saddle, said Mallow. The assessment process includes observing the rider on the horse.
When we evaluate the horse, we look at the condition, the age, the weight, the type of breed, which is very important because a Warmblood is different from a Thoroughbred, said Mallow.
The evaluation process is extremely in-depth and also includes looking at the position of the saddle and the tree design of the saddle. They also take into consideration the angle of the tree points, the gullet width, the panel contact and pressure and whether the panel is sitting evenly.
The next component is bridging, said Mallow. Bridging is where the panel sits at the front and back, but in the middle theres no pressure. You need a level seat with the saddle and withers clearance. We then watch our clients ride; we can evaluate the rider, the seat size and the flap size.
Aiken Saddle Pros also reflocks, adjusts and repairs saddles, said Mallow. The company also picks up and delivers.
When we reflock a saddle, we do an evaluation to make sure the saddle is fitting properly, taking the horse into consideration, said Mallow.
The artisan crafted saddles take four to six weeks to complete, said Mallow. The saddles are built up from the metal trees. Its Aiken Saddle Pros customized and personalized approach that helps distinguish them from the competition, she said.
We build these for fit, balance and movement because only when the saddle fits properly do you get the correct movement in the horse, said Mallow. We do dressage, jump, polo and monoflap saddles, which are just one flap, and they bring the horse and rider closer together. Eventers particularly like those saddles.
Aiken Saddle Pros has four industrial machines, Mallow said. They also replace billets and have custom halters and saddles.
I think a well-fitting saddle lets the rider and the horse communicate more effectively, said Mallow. The reason we do this well is because we ride. We understand how important it is for the horse to have a healthy back musculature enhanced by something that fits correctly.
For more information, visit dressagesaddlerepair.com.
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FIFTY-FIVE THOUSAND voter registrations "misplaced" in Georgia.
"Republicans are already cheating the elections where ever they hold power. Criminally treasonous politicians of the GOP, some of us know our constitution, and see all of your violations of our rights, and half the country will hang you treasonous pricks if you don't quit lying, and get elected on lies. Two weeks to go, too late to start telling the truth now, I guess you better hope you don't win GOP politicians!" --Rob McDonald
Hell, it's not vote fraud / voter suppression when the Republicans do it, right?
Lawyers' Committee sues Georgia over missing voter applications
Kristina Torres
Atlanta Journal Constitution
The New Georgia Project brought bins holding copies of more than 51,000 unprocessed voter applications to the state Capitol on Wednesday, Sept. 17, 2014. KRISTINA email@example.com Info
The Atlanta Journal-Constitution
The national Lawyers' Committee for Civil Rights sued Secretary of State Brian Kemp and five Georgia counties on Friday, asking a state judge to make sure more than 55,000 people will be able to vote in the Nov. 4 general election.
The lawsuit comes in direct response to the handling of voter registration applications by the state and Fulton, DeKalb, Chatham, Muscogee and Clayton as they were submitted by the New Georgia Project, a Democratic-backed group under investigation by Kemp over accusations of voter registration fraud.
More than 50,000 of the paper forms submitted by the group seem to be lost in the state's voting system, Lawyers' Committee attorney Julie Houk said. They neither appear on voter rolls nor do they show up on lists of "pending" voters who have been asked to provide more information to verify who they are.
An additional 5,000 of the forms do appear on pending lists, but Houk said some of the forms show the information originally submitted to be accurate. In other words, the Lawyers' Committee is questioning why these voters must provide additional proof of identification.
The lawsuit, filed late Friday in Fulton County Superior Court, comes after Kemp declined Thursday to meet with the group about their concerns.


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Steakcraft: The Marrow's Rib Steak and Top Sirloin
I have never seen a chef who seasons steak as often and as fastidiously as Harold Dieterle does. At virtually every step of the cooking process he is sprinkling salt or grinding pepper on to the beef. Yet despite the seemingly constant flurry, the steaks at the Marrow come out perfectly seasoned, highlighting the flavor of the beef itself. Here the chef cooks a common cut—rib steak—and a European one: the culotte. More


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Screen Junkies Breaking News
Honest Trailers — Mission: Impossible
Good morning Mr. Phelps. Relive the first four movies in the mega-action franchise starring Tom Cruise as international superspy…Tom Cruise! How is this his only franchise?!
Tuesday, July 28 by Jared Jones
'Mad Max: Fury Road' Had More CGI Than You Thought
About 9 hours ago by Wookie Johnson
We live in a world of lies.
Wow, This 'Fantastic Four' Interview Is Awkwaaaaard
About 10 hours ago by Wookie Johnson
These guys could teach a class on how not to do an interview.
Channing Tatum WILL Star In 'Gambit'
About 10 hours ago by Wookie Johnson
Fox found the money.
'Straight Outta Compton' Soundtrack Will Be Dr. Dre's First New Album In 16 Years
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And his last.
'Zoolander 2′ Trailer Asks The Hard Questions
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It's not like he doesn't have a point.
Doug Funnie Serenades Patti Mayonnaise With Fetty Wap's 'Trap Queen'
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Patti should give him a chance.
Chris Farley Does His Own Stunts In 'Mission: Impossible – Rogue Nation' Re-Edit
About 22 hours ago by Wookie Johnson
Move over, Tom Cruise.
Ian McShane Cast As Some Sort Of Person On 'Game Of Thrones'
About 22 hours ago by Wookie Johnson
He'll have little screen time, but his role will be important.
R.I.P. 'Rowdy' Roddy Piper
About 22 hours ago by Wookie Johnson
The wrestling legend dies at 61.
'Game Of Thrones' Will Go At Least Eight Seasons, Says HBO President
Thursday, July 30 by Penn Collins
They have to keep making the show until the fans (unanimously) agree to allow the actors and crew to stop.
CW Giving 'Little Women' The Gritty Adaptation We Didn't Know We Craved
Thursday, July 30 by Penn Collins
Yup, an iteration of the word "dytopia" is in the logline.
'Spotlight' Trailer Highlights Another Reason To Skip Church
Thursday, July 30 by Wookie Johnson
The cast does a great job of looking reporterly.
Wyatt Cenac, Who Kinda Looks Like An Alien, Will Star In A TBS Comedy About Aliens
Thursday, July 30 by Penn Collins
The show will come from 'The Office' showrunner Greg Daniels.
Who's Your Bet To Sing The Next James Bond Theme?
Thursday, July 30 by Penn Collins
It's likely going to be a British artist, if that helps.
Ivan Reitman Insists There's Only The Paul Feig Ghostbusters, And Everything Else Is 'Noise'
Thursday, July 30 by Penn Collins
Someone here is lying.
The 5 Greatest Man Caves In Movies And TV
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Trusted, independent vets based in Taverham, Nr. Norwich in Norfolk
Find out more about our facilities and services
Click here to learn more about us
At Taverham Vets we have a large team of Staff that are dedicated to the care of Animals. From our highly qualified directors and associate vets through to our reception and nursing staff the Taverham Teams' individual skills combine to form a cohesive, productive and caring unit. Every one of our team has a vital role to play in the smooth operation of a busy veterinary practice.
Guidance notes on the Norwich-Night Vet Emergency Service – Guidance notes Download
Opening Hours: Consultations by Appointment Monday to Friday 9am – 6pm/ Wed late appts until 7pm
Cat only clinics Wed 3-4.40pm
Weekend and Evening appointments available at the Taverham Vets surgery on Fir Covert Road.
24hour emergency service run from the Taverham Vets Building
Zoe Hopkins RVN is our full time Veterinary Nurse working at our Longwater branch. Zoe is an experienced fully qualified Veterinary Nurse and she has a great passion for nurse led clinics. These are great opportunities to tackle major health problems in our pets such as obesity and poor socialisation. Zoe has been fundamental in setting up our new Puppy and Kitten Health packages.
FREE ID CHIP with all puppy/kitten vaccination courses!
for all new Longwater clients with a booster or first consultation!
New puppy or kitten? Contact us for details on vaccinations and health packages or click here for more details:
Osteopathy with Joelle Fordham now available at the surgery www.norwichanimalosteopathy.com
Dermatology Patient HistoryFax Back FormReferral Client HandoutThe RCVS Certificate is the level of postgraduate qualification awarded by RCVS one below the Diploma (a Diploma indicates Specialist status), and indicates that the holder is a competent clinician who has proved their experience and expertise by examination in their chosen subject.


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LEATHER ZIP AROUND WALLETGrey Leather PurseKurt Geiger London£80.00
TAMERANude Clutch BagMiss KG£40.00
KOLLUDE LUREX POUCHGold Clutch BagCarvela Kurt Geiger£35.00


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Tolbert Elementary School
Public School | Grades PK-5 | Gordon County
Resaca, GA 30735
(706) 629-4404
About This School
Tolbert Elementary School is located in Resaca, GA and is one of 7 elementary schools in Gordon County School District. It is a public school that serves 683 students in grades PK-5. See Tolbert Elementary School's test results to learn more about school performance.
In 2011, Tolbert Elementary School had 16 students for every full-time equivalent teacher. The Georgia average is 15 students per full-time equivalent teacher.
In 2011, Tolbert Elementary School had 16 students for every full-time equivalent teacher. The Georgia average is 15 students per full-time equivalent teacher.
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Student Ethnicity (2011)
Students (2011)
Students Per Teacher (2011)
Female/Male (2011)
45% 55%
Subsidized Lunch (2011)
District Spending (2010)
$9,468per student
See All Test Scores
Grade 1 Reading Performance
CRCT Results
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Celebrity Buzz
Your daily dose of hot news & gossip.
Posts filtered on Tag
Michael Phelps throws retirement party in Vegas
You would've thought partying was an Olympic sport the way Michael Phelps, 27, took over Las Vegas over the holiday weekend. The most vivacious retiree in the world began his retirement bash by raging at Surrender Nightclub on Sept. 1 and continued his celebration at Encore Beach Club the following day. [Read More]


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Somerset v Nottinghamshire: Match preview – Newell looks for improvement
Posted: May 03, 2014|
Mick Newell says every Nottinghamshire player must raise their game at Somerset – not least those who suffered England disappointment this week.
Defeat to Warwickshire, in a game they could arguably have won, made it two losses from three, leaving Notts seventh in Division One of the County Championship on 28 points.
Director of cricket Newell has challenged his players, regardless of form, to step it up when they get under way at Taunton tomorrow.
He said: "We've played well against Lancashire. We were OK at Lord's against Middlesex and we let ourselves down against Warwickshire.
Related content
Harry Gurney hoping now is his time after call-up to England squad
Batsmen must 'get on with it' says Mick Newell after Trent Bridge pitch is cleared
Chance missed says Nottinghamshire skipper Chris Read
Notts v Warwickshire: Match reaction and analysis
RELIVE: Somerset v Nottinghamshire day one
Nottinghamshire loan Alex Hales to Worcestershire
RELIVE: Somerset v Nottinghamshire day two
"I'm looking for improvement from the whole XI at Somerset."
Left-arm seamer Harry Gurney is out of the reckoning after his call up to the England squad for their game against Scotland in Aberdeen on Friday.
Jake Ball will be hoping for a recall after impressing in the win against Lancashire, while Ajmal Shahzad is looking for his first start of the season following a groin injury.
Newell revealed Gary Keedy is also in the reckoning in case Notts look to supplement the spin of Samit Patel when they replace Gurney.
Veteran all-rounder Andre Adams will not be considered due to a calf injury, although Newell hopes to have him available for the game against Northamptonshire from May 11 at Trent Bridge.
England bowler Stuart Broad is also unavailable for the next two to three weeks.
The batting line-up looks set to be unchanged with Michael Lumb, Alex Hales, James Taylor and Patel all missing out on an England call-up.
Of the group, Lumb could feel the most aggrieved having made a century against the West Indies on his ODI debut. Hales scored a brilliant century in the World T20 to give England victory over Sri Lanka, but he has only played once for Notts this season.
He looks set to miss out again in this game as well.
Newell says those who were not in the England squad and play at Taunton have the chance to prove the selection panel, which now includes Newell, wrong.
"The challenge is very much there for Michael, Alex Hales and anyone else who wants to be in the squad into go out and prove it for their counties," he said.
"Michael's already had a good few 30s and 40s but he'll be looking for that big score.
"James Taylor is another who has shown good form without getting big runs and that is what a batsman is judged on."
Hales had been the subject of interest from Northamptonshire and Worcestershire over a possible loan move, but Newell was unsure it would have been in Notts' best interest.
"We spoke to Worcester as well as Northants, but when you are talking about potentially a one game loan, you've got to think is that best for your county," he said.
Despite the defeat to Warwickshire, Newell was pleased with a trio of bowlers – Andy Carter, Peter Siddle and Gurney – as well as batsman Phil Jaques, who top scored with 64 in the second innings.
"Carter's bowling was a positive, as was Gurney's. In the second innings Harry bowled terrifically to get Ian Bell and Ateeq Javid," said Newell.
"Siddle bowled well. Jaquesy played well. He's the best opening batsman we've got so we are going to put faith in him."
Newell clearly holds Jaques in high regard, but he says there is no chance of extending the 34-year-old Australian's deal beyond June – having originally come in as cover for Hales in anticipation of him going to play in the Indian Premier League.
"I don't think there's any chance of extending it. He's got a coaching job in Australia he wants to start," said Newell.
"He came here specifically as cover for two months for the IPL. As it happened Alex didn't go."
Jaques' came as close to any Notts batsman in the game to making a century and they are still yet to have anyone reach three figures this season.
That is not of any concern to Newell at this early stage of the campaign though, especially with big scores tough to come by at Trent Bridge so far.
"I've always said you are going to get positive results in April," he added. "Hundreds and lots of batting points are good, but you've got to come out on the right side of low scoring games, otherwise you won't get a lot out of them.
"You won't get many hundreds at Trent Bridge at this time."


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Thursday, February 23, 2012
Oscar Sabotage!
2 comments:
- Michelle said...
Fingers crossed for Don Cherry!
- February 23, 2012 at 1:53 PM
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- September 30, 2014 at 2:56 AM


text:
Dell Founder and CEO Michael talked about his company releasing several Windows 8 devices in the near future. He was talking at the Dell World 2011 event at Texas, USA and had this to say to the journalists present at a Q&A session:
"We are very aligned with Microsoft around Windows 8. You'll hear more about Windows 8 from us and see a wide range of products released,"
He did not mention the device type, market segment or anything. But it is quite obvious to the industry people that Dell will be looking release Windows 8 tablet devices.
If the excitement around the Windows 8 Developer Preview is any indication, companies are really excited to see the potential of the OS on consumer oriented tablet. Everything from the fresh UI to the workflow design has been built from the ground up to be touch oriented. Even the app development principle states "touch first" for Windows 8. Hence, it is certainly going to a strong player in the segment.
In addition to that, Windows 8 will be pan-hardware platform OS that will run on traditional PC's, Smartphones and tablets. From a device manufacturer point of view, this translates to easy communications between its various products. Having this level of integration between your main computer, your companion device (tablet) and your mobile device is something that would definitely interest Dell. The company makes all of these items with varying degrees of success and they will have a large audience to play with.
Windows 8 will be taking over from Windows 7 and will be the future version of the world's most common operating system. The long term market share and market penetration potential of this OS is extremely favorable. And compared to the Android OS, it is likely to have a presence that is larger by several orders of magnitude.
The Android comparison comes in because of Dell's last few attempts at cracking the tablet market. Although Steve Felice, president of Dell's consumer, small and medium business division, said that their earlier (mobile) products were only released to gauge market reaction and was produced in small quantities — the truth is something else altogether. Dell was very bullish on Android for creating a tablet that would compete realistically with iPad. The end result was very disappointing and the device hardly sold.
So with Windows 8, Dell sees a superior platform in terms of expanded usability. In addition to that, the third-party interest in Windows 8 is bound be higher than Android because of large third-party ecosystem that Microsoft already has for its products. This in turn will mean a faster growth curve for the Windows 8 third-party ecosystem and that might translate to improved user experience if MSFT takes proper care while curating the app store.
Dell has made it clear that it is looking to capture the client section of the market that constitutes 95% of the market. That is where the money is and Windows 8 seems primed to become big in that section.


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Driver dies in motorcycle accident
Submitted by admin on Mon, 06/30/2014 - 10:21
A motorcycle driver died at the scene of an accident Sunday in Fitchburg.
Police responded to a motorcycle crash at the intersection of McKee and Omundsen roards, according to a news release from the Fitchburg Police Department.
The Dane County medical examiner identified the decased late Monday as Michael Janke, 21, of Beloit.
Janke was prounounced dead at the scene, and it appeared no other vehicles were involved, the release said.
Anyone who witnessed the crash is asked to call the police department at 270-4300.
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text:
Jenn Corbin, a lovely, slim, brown-eyed blonde, appeared to have it all: two dear little boys, a posh home in one of the upscale suburbs of Atlanta, expensive cars, a plush houseboat, and a husband -- Dr. Bart Corbin, a successful dentist -- who was tall, handsome, and brilliant.
But gradually their seemingly idyllic life together began to crumble. There was talk of seeing a marriage counselor. Bart was distraught; Jenn seemed disenchanted. She needed to reach out… (more)
Publisher: Gallery Books (June 05, 2007)
Format: EPUB
Page count: 480 pages
File size: 23.1 MB
Protection: DRM
Language: English