text: Bookmarks NeuralgiaPrint-Friendly Nerve pain; Painful neuropathy; Neuropathic painPrevious imageEnlargeCloseNext image / NavigatorNeuralgia is a sharp, shocking pain that follows the path of a nerve and is due to irritation or damage to the nerve.Common neuralgias include:Shingles ShinglesShingles (herpes zoster) is a painful, blistering skin rash. It is caused by the varicella-zoster virus. This is the virus that also causes chicken...ImageRead Article Now Book Mark Article Trigeminal neuralgiaTrigeminal neuralgiaTrigeminal neuralgia is a nerve disorder that causes a stabbing or electric-shock-like pain in parts of the face.ImageRead Article Now Book Mark Article I Would Like to Learn About:Expand All Collapse All Causes Causes of neuralgia include:Chemical irritation Chronic renal insufficiency Chronic renal insufficiencyChronic kidney disease is the slow loss of kidney function over time. The main job of the kidneys is to remove wastes and excess water from the body...ImageRead Article Now Book Mark Article Diabetes DiabetesDiabetes is a chronic disease in which the body cannot regulate the amount of sugar in the blood.ImageRead Article Now Book Mark Article Infections, such as herpes zoster ( shingles), HIV, Lyme disease, and syphilis ShinglesShingles (herpes zoster) is a painful, blistering skin rash. It is caused by the varicella-zoster virus. This is the virus that also causes chicken...ImageRead Article Now Book Mark Article Lyme diseaseLyme disease is a bacterial infection that is spread through the bite of one of several types of ticks.ImageRead Article Now Book Mark Article SyphilisSyphilis is bacteria infection that is most often spread through sexual contact.ImageRead Article Now Book Mark Article Medications such as cisplatin, paclitaxel, or vincristine Porphyria PorphyriaPorphyrias are a group of rare disorders passed down through families. An important part of hemoglobin, called heme, is not made properly. Heme is ...ImageRead Article Now Book Mark Article Pressure on nerves by nearby bones, ligaments, blood vessels, or tumors Trauma (including surgery)In many cases, the cause is unknown.Postherpetic neuralgia and trigeminal neuralgia are the two most common forms of neuralgia. A related but less common neuralgia affects the glossopharyngeal nerve, which provides feeling to the throat.Neuralgia is more common in elderly people, but it may occur at any age. Symptoms Increased sensitivity of the skin along the path of the damaged nerve, so that any touch or pressure is felt as pain Numbness along the path of the nerve In the same location each episode Sharp, stabbing May come and go (intermittent), or be constant, burning pain May get worse when the area is moved Weakness or complete paralysis of muscles supplied by the same nerve Exams and Tests Your doctor or nurse will examine you and ask questions about your medical history and symptoms, including:When did the pain start? Did you injure yourself recently? Have you had any health changes?The exam may show:Abnormal sensation in the skin Reflex problems Loss of muscle mass Lack of sweating (sweating is controlled by nerves) Tenderness along a nerve, often in the lower face and jaw and rarely in the temple and forehead Trigger points (areas where even a slight touch triggers pain)You may also need to see a dentist if the pain is in your face or jaw. A dental exam can rule out dental disorders that may cause facial pain (such as a tooth abscess). Facial painFace pain may be dull and throbbing or an intense, stabbing discomfort in the face or forehead. It can occur in one or both sides.Read Article Now Book Mark Article Tooth abscessA tooth abscess is a collection of infected material (pus) in the center of a tooth. It is due to bacterial infection.ImageRead Article Now Book Mark Article Other symptoms (such as redness or swelling) may help rule out conditions such as infections, bone fractures, or rheumatoid arthritis.Rheumatoid arthritisRheumatoid arthritis (RA) is a long-term disease that leads to inflammation of the joints and surrounding tissues. It can also affect other organs....ImageRead Article Now Book Mark Article There are no specific tests for neuralgia, but the following tests may be done to find the cause of the pain:Blood tests to check blood sugar, kidney function, and other possible causes of neuralgia Blood sugarA blood glucose test measures the amount of a sugar called glucose in a sample of your blood. Glucose is a major source of energy for most cells of t...ImageRead Article Now Book Mark Article Magnetic resonance imaging (MRI) MRIAn MRI (magnetic resonance imaging) scan is an imaging test that uses powerful magnets and radio waves to create pictures of the body. It does not u...ImageRead Article Now Book Mark Article Nerve conduction study with electromyography Nerve conduction study with electromyographyNerve conduction velocity (NCV) is a test to see how fast electrical signals move through a nerve.ImageRead Article Now Book Mark Article Ultrasound Spinal tap (lumbar puncture)Lumbar punctureCerebrospinal fluid (CSF) collection is a test to look at the fluid that surrounds the brain and spinal cord. CSF acts as a cushion, protecting the b...ImageRead Article Now Book Mark Article Treatment Your doctor will: Discuss ways to reverse or control the cause of the nerve problem (if found) Recommend pain medicinesTreatment varies depending on many things, including the cause, location, and severity of the pain. Strict control of blood sugar may speed recovery in people with diabetes who develop neuralgia.Medications to control pain may include:Antidepressant medications (amitriptyline, nortriptyline, or duloxetine) Antiseizure medications (carbamazepine, gabapentin, lamotrigine, phenytoin, or pregabalin) Over-the-counter pain medicines (aspirin, acetaminophen, or ibuprofen) Narcotic analgesics (hydrocodone) for short-term relief of severe pain (however, these do not always work well) Lidocaine patch Skin creams containing capsaicinOther treatments may include:Shots with pain-relieving (anesthetic) drugs Nerve blocks Physical therapy (may be needed for some types of neuralgia, especially postherpetic neuralgia) Procedures to reduce feeling in the nerve (such as nerve ablation using radiofrequency, heat, balloon compression, or injection of chemicals) Surgery to take pressure off a nerveUnfortunately, these procedures may not improve symptoms and can cause loss of feeling or abnormal sensations.When other treatment methods fail, doctors may try nerve or spinal cord stimulation, or more rarely a procedure called motor cortex stimulation (MCS). An electrode is placed over part of nerve, spinal cord, or brain and is hooked to a pulse generator under the skin. This changes how your nerves signal and may reduce pain. Outlook (Prognosis) Most neuralgias are not life threatening and are not signs of other life-threatening disorders. However, pain can be severe. For severe pain that does not improve, see a pain specialist so that you can explore all treatment options.Most neuralgias will respond to treatment. Attacks of pain usually come and go. However, attacks may become more frequent in some patients as they get older.Sometimes, the condition may improve on its own or disappear with time, even when the cause is not found. Possible Complications Complications of surgery Disability caused by pain Side effects of medications used to control pain Unnecessary dental procedures before neuralgia is diagnosed When to Contact a Medical Professional Contact your health care provider if:You develop shingles You have symptoms of neuralgia, especially if over-the-counter pain medications do not relieve your pain You have severe pain (see a pain specialist) Prevention Treating related disorders such as diabetes and renal insufficiency may prevent some neuralgias. Strict control of blood sugar may prevent nerve damage in people with diabetes. In the case of shingles, there is some evidence that antiviral drugs and a herpes zoster virus vaccine can prevent neuralgia.Related Information Trigeminal neuralg...Transient tic diso...TumorMultiple sclerosis...Shingles Multiple sclerosis...Open ReferencesReferencesDigre KB. Headaches and other head pain. In: Goldman L, Schafer AI, eds. Cecil Medicine. 24th ed. Philadelphia, Pa: Saunders Elsevier; 2011:chap 405.Katirji B, Koontz D. Disorders of peripheral nerves. In: Daroff RB, Fenichel GM, Jankovic J, Mazziotta JC, eds. Bradley's Neurology in Clinical Practice. 6th ed. Philadelphia, Pa: Saunders Elsevier; 2012:chap 76.Shy ME. Peripheral neuropathies. In: Goldman L, Schafer AI, eds. Cecil Medicine. 24th ed. Philadelphia, Pa: Saunders Elsevier; 2011:chap 428.BACK TO TOP Review Date: 9/14/2012 Reviewed By: Luc Jasmin, MD, PhD, Department of Neurosurgery at Cedars-Sinai Medical Center, Los Angeles, and Department of Anatomy at UCSF, San Francisco, CA. Review provided by VeriMed Healthcare Network.Also reviewed by David C. Dugdale, III, MD, Professor of Medicine, Division of General Medicine, Department of Medicine, University of Washington School of Medicine and David Zieve, MD, MHA, Medical Director, A.D.A.M. Health Solutions, Ebix, Inc. The information provided herein should not be used during any medical emergency or for the diagnosis or treatment of any medical condition. A licensed medical professional should be consulted for diagnosis and treatment of any and all medical conditions. Call 911 for all medical emergencies. Links to other sites are provided for information only -- they do not constitute endorsements of those other sites. © 1997- A.D.A.M. content is best viewed in IE9 or above, Firefox and Google Chrome browser.Content is best viewed in IE9 or above, Firefox and Google Chrome browser.


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A first inspection functionality is provided to obtain information about a first attribute at a conductor location on an electrical circuit. A second inspection functionality is provided to obtain information about a second attribute at the conductor location. A combination of first attribute information and second attribute information is analyzed to determine an inspection attribute of the conductor at the conductor location. Attribute information may relate to one or more of: reflectance, fluorescence or height.
1. An electrical circuit inspection apparatus comprising:
a first inspection functionality operative to obtain first attribute information with respect to a first attribute associated with a conductor location on an electrical circuit;
a second inspection functionality operative to obtain second attribute information with respect to a second attribute associated with said conductor location on said electrical circuit, said second attribute being different from said first attribute;
and a conductor attribute analyzer receiving said first attribute information and said second attribute information and providing a defect indication for a conductor location whereat a defect is indicated in said first attribute information and additionally indicated in said second attribute information.
2. The electrical circuit inspection apparatus according to
3. The electrical circuit inspection apparatus according to 2, wherein said second inspection functionality senses luminescence at said conductor location as a basis for said second attribute information.
4. The electrical circuit inspection apparatus according to
5. An electrical circuit inspection method comprising:
obtaining first attribute information for a first attribute associated with a conductor at a plurality of conductor locations on an electrical circuit;
obtaining second attribute information for a second attribute associated with a conductor at said plurality of locations, said second attribute being different than said first attribute; and
determining a conductor defect at one or more of said conductor locations, said determining comprising:
identifying a first conductor structure from said first attribute information;
additionally identifying a second conductor structure from said second attribute information; and
outputting a defect indication for locations whereat said first conductor structure and said second conductor structure are indicative of a defect.
6. The electrical circuit inspection method according to
7. The electrical circuit inspection method to 6, wherein said providing of said second attribute information comprises sensing a luminescence value.
8. The electrical circuit inspection method according to
9. The electrical circuit inspection method according to
10. The electrical circuit inspection method according to
11. The electrical circuit inspection method according
12. The electrical circuit inspection method according to
13. The electrical circuit inspection method according to
approving said electrical circuit;
discarding said electrical circuit; and
repairing said electrical circuit.
14. The electrical circuit inspection method according to
15. The electrical circuit inspection method according to
This application claims the benefit of Provisional Application No. 60/237,803, filed Oct. 4, 2000.
This application is a continuation of U.S. application Ser. No. 10/032,098, now U.S. Pat. No. 6,870,611 filed Dec. 31, 2001, which is a continuation-in-part of U.S. application Ser. No. 09/939,682, filed Aug. 28, 2001 now abandoned.
This application claims the benefit of commonly owned U.S. Provisional Application No. 60/307,606, filed Jul. 26, 2001, which is incorporated by reference, herein, in its entirety.
This application is related to the commonly owned U.S. patent application Ser. No. 10/032,060, now issued as U.S. Pat. No. 6,654,115, entitled "System and Method for Multi-Dimensional Optical Inspection", filed on the same date as this application, and commonly owned by Orbotech Ltd., the disclosure of said application being incorporated by reference, herein, in its entirety, for its useful example of a suitable mode for operation of a height attribute processor.
This description generally relates to the field of electrical circuit inspection. More particularly, the field of interest involves systems and methods for fabricating and inspecting electrical circuit conductors in electrical circuits.
The production of printed circuit boards is an expensive undertaking, and many extraordinary measures are routinely taken to ensure the highest possible production quality. Automated optical inspection (AOI) harnesses the power, speed, and reliability of computer technology to assist with the task of inspection of printed circuit boards for defects. Existing automated optical inspection (AOI) systems, such as the PC-14 Micro.TM. and Blaser.TM. AOI systems, are available from Orbotech of Yavne, Israel.
As used herein, the term "printed circuit board" will be understood to refer in general to any electrical circuit on any substrate, including printed circuit boards, multi-chip modules, ball grid array substrates, integrated circuits and other suitable electrical circuits.
A general aspect of the present invention relates to employing a combination of inspection inputs to obtain attribute information about a conductor or other inspected area, and using the combination to make a determination as to an attribute or defect of the conductor.
In one aspect, the width of a conductor along a top surface and the width of a conductor along a bottom surface thereof are used to make a determination as to the presence of a defect in a conductor and/or in a manufacturing process used to fabricate an electrical circuit.
In another aspect, an initial defect determination of a conductor is made in reliance on a first sensed attribute. The initial defect determination is evaluated for its correctness using a second sensed attribute. The first sensed attribute may be, for example, a reflectance or fluorescence attribute and the second attribute may be, for example, a height attribute.
A more particular aspect of the present invention relates to an automated optical inspection system operative to inspect electrical circuits to determine the width of a top surface of conductors forming the circuit at a multiplicity of locations, the width of a bottom surface of conductors forming the circuit at a multiplicity of locations, and the slope of the side walls of conductors, or other defects in the shape of conductor side walls, forming the circuit at a multiplicity of locations.
Another more particular aspect of the present invention relates to a system and method for optically inspecting electrical circuits and estimating or calculating therefrom impedance values for conductors forming the electrical circuit.
Another more particular aspect of the present invention relates to a method of producing printed circuit boards, whereby production and/or fabrication process control decisions (such as whether a defect exists in a conductor or in a manufacturing process) are based on inspection inputs indicative of the conductor dimension along the top surface and bottom surface respectively, or the slope of the sides of conductors.
Another more particular aspect of the present invention relates to a method of producing printed circuit boards, whereby production decisions (such as whether a defect exists in a conductor) are based on inspection inputs indicative of the conductor dimension along either the top surface or bottom surface respectively, which are verified using inspection inputs indicative of some other, typically at least partially independent, attribute, for example height.
The above and other aspects of the invention are achieved by a system, described in detail below, in which a laser scanner is provided to scan a laser beam across an electrical circuit being inspected. The laser produces a beam which has sufficient energy to cause fluorescence (also referred to herein as luminescence) of the substrate on which conductors are formed. In addition, the beam is reflected by copper conductors which typically have a higher work function than the substrate and do not fluoresce under illumination of the laser beam. The reflected and fluorescent light is collected and the respective intensities of the reflective and fluorescent light are analyzed. Fluorescent light provides an indication of the width of a conductor along its bottom surface, while the reflected light (another attribute) provides an indication of the width of the conductor along its top surface. Comparison of the respective widths of the bottom surfaces and top surfaces of the conductors provides an indication of the slope of the side-walls of a conductor.
The top and bottom dimensions can be used in combination to provide an inspection attribute for a single point or at various sampling points along the length of conductors, and can be used for various analyses of characteristics of the electrical circuit. For example, information about the slope of the side walls of conductors may be used to calculate a cross sectional dimension of an electrical circuit at various sampling points which can used to derive an impedance value for a conductor. Additionally, statistical information about uniformity in the respective widths of conductors along their top and bottom surfaces may be used to indicate various flaws in etching processes.
In another aspect of the invention, an inspection system is provided to output an initial defect indication based on an analysis of light reflected by the surface of the electrical surface, analysis of a fluorescent emission from the surface when exposed to laser light, or analysis of any other suitable response to a physical input. The inspection system senses an additional attribute that preferably is independent of the attribute relied upon to output the initial defect indication. For example, the inspection system additionally senses height data related to a topography of the surface of the electrical circuit.
The additional attribute is employed to verify whether a defect identified in the initial defect indication is indeed an actual defect. The additional attribute may be acquired concurrently with operation of the inspection system when outputting an initial defect indication. Optionally, the additional attribute is acquired and analyzed downstream of an initial inspection step.
The additional attribute may be acquired and analyzed for an entire electrical circuit to be inspected. Optionally, the additional attribute may be acquired only at localized regions, for example regions selected in response to initial defect indications.
The above and other aspects of the invention will be more fully understood and appreciated when read in the light of the detailed description provided below, and the enclosed drawings.
Using the above-identified figures, the invention will now be described with respect to various embodiments of the invention. Although many specificities will be mentioned, it must be emphasized that the scope of the invention is not be taken to be that of only the embodiments described herein, but should be construed in accordance with the claims appended below.
AOI system 10 suitably is a V-300 automated optical inspection system available from Orbotech Ltd., of Yavne Israel. Such a system is described in U.S. Pat. No. 5,216,479 to Dotan et al., which issued on Jun. 1, 1993, the disclosure of which is incorporated by reference in its entirety for its useful information on optical inspection systems.
Operation of certain aspects of system 10 are described in U.S. Pat. No. 5,216,479, and are readily grasped by those familiar with this field. Thus, a highly detailed description of the operation of AOI system 10 is omitted here in favor of a brief overview.
In the embodiment seen in
The beam 14 is scanned across the circuit portion 16, and the collectors 24 and 34 are kept operationally positioned to collect their respective types of light at the point at which the beam 14 impinges on the circuit portion 16. To this end, it is convenient if the collectors 24 and 34 are linear in a main scanning direction of the beam 14, although this is not essential. The collectors 24 and 34 are shown in
It will be appreciated that the collectors, sensors, and processors mentioned above may together be thought of as an inspection functionality.
It is also appreciated that the system described in U.S. Pat. No. 5,216,479, referred to above, is merely an example of a suitable mode for carrying out an embodiment of the invention and that any other suitable configuration of an illumination and image acquisition system may be employed. For example, in place of a rotating polygon 22, such as is used in U.S. Pat. No. 5,216,479 suitable optics may be used to project a laser beam so as to continuously illuminate a linear region on printed circuit board substrate. Moreover, any suitable digital or analog sensors may be employed.
The width of conductor 18 at its top surface 35 may be referred to hereinafter as a top surface width, or top width, or also a surface dimension.
The width of conductor 18 at its bottom surface 17 may be referred to hereinafter as a bottom surface width, or bottom width, or also as a footprint dimension.
When beam 14 impinges on the substrate 20 at a location free of conductor 18, a localized part of the substrate fluoresces, giving off luminescent light collected by luminescence collector 24 and sensed by luminescence sensor 26. At such a location, the reflected light given off by substrate 20 is very low because substrate 20 tends to diffuse the light, and a substantially zero value is output by reflectance sensor 36.
When the spot of beam 14 impinges on the substrate 20 at a location where a conductor 18 is present, the conductor does not fluoresce because the work function of the conductor 18 is greater than required to release a photon, due to the quantum effect of illumination by beam 14. Thus, luminescence sensor 26 outputs a substantially zero value. Conductor 18, however, is relatively reflective. Reflectance collector 34 therefore collects reflectance and reflectance sensor 36 outputs a value above zero at such a point.
In operation, the sensor 26 may include analogue to digital circuitry processing luminance signal 30 to produce a digital image or map 31 (
The bottom width processor 28 calculates a footprint dimension of one or more conductors 18 at selected conductor locations therealong. This footprint dimension, as can be seen from
The respective outputs of bottom width processor 28 and top width processor 38 may be thought of as different attributes of the conductor, and are provided to an analyzer 42, which may be operative in several modes of operation. In one mode of operation, analyzer 42 calculates a cross section configuration of conductors based on the respective width dimensions measured for the top surface 35 and bottom surface 32 respectively of conductors 18. Analyzer 42 may also be thought of as an attribute analyzer
In another mode of operation, analyzer 42 derives the slope of side walls of conductors 18, at one or more locations along a conductor, from the respective top surface width and bottom surface widths of conductors 18 at those locations.
In another mode of operation, analyzer 42 analyzes a distribution of top surface widths and of bottom surface widths of conductors disposed along all or part of the surface of substrate 20. Analysis of the distribution of top widths and bottom widths provides information which can be used to control etching processes. In a system configuration enabling this mode of operation, a histogram generator 44 may be included in cross section configuration analyzer 42. Reference is made to
As seen in
Moreover, information relating to the shape of conductors may be employed, for example, to calculate a nominal impedance of conductors. The nominal impedance may be calculated, or at least estimated, in a manner that will be readily grasped, since impedance is a function of the cross sectional dimension of a conductor.
The cross sectional shape of the conductor can be approximated in various ways, once the surface and footprint dimensions have been determined. For example, it could be assumed that the shoulders were constituted by straight lines, and that the cross sectional shape was a trapezoid. Thus, the cross sectional area of the conductor (and hence, impedance) could be computed in a simplified manner.
Another use of information relating to the cross sectional shape of conductors is to control photolithography and/or etching processes in order to obtain conductors having an optimized shape. Ideally, the top surface dimension 35 of conductors 18 should be slightly smaller than the bottom surface dimension 17 in order to maximize the usage of space along the surface of a printed circuit board substrate 20. Thus if the distribution of top surface width dimensions is too small relative to the distribution of bottom surface width dimensions, then impedance problems are likely to occur since statistically some portions of conductors are likely to have an insufficient volume for efficiently carrying charge. Conversely, if the distribution of top surface width dimensions of conductors is too close relative to the distribution of bottom surface width dimensions, then shoulders 19 (
It is thus appreciated that analysis of a width distribution report of top width dimensions and bottom width dimensions, as seen in
It will be appreciated that the report shown in
The report 46 is produced, containing cross-section information, and provided to the controller 1 in step 120. In step 130, the controller determines whether the cross-section information is acceptable. That is to say, the controller determines whether the cross-section information indicates a problem that needs correction, or does not indicate such a problem. If there is a problem that needs correction, processing continues from step 130 to step 140, in which the controller adjusts the assembly activities based on the cross-section information prior to resuming production at step 100. If there is not a problem that needs correction, processing may continue from step 130 to step 100, and production may continue as before.
Another way of saying this, is that the circuit is discarded or repaired in response to a determination based on the cross sectional information.
Other exemplary embodiments will now be described with respect to
A part of a printed circuit board 16 is shown in
As seen in
As seen in
As seen in
a full nick 406, which is an indentation in a conductor 18 where conductive material should be present but its continuity is interrupted such that substrate 20 is uncovered in the vicinity of full nick 406;
a shallow nick 408 which is a portion of a conductor 18 whereat the continuity of conductive material is at least partially interrupted. The height of the conductor is affected, but not so much as to entirely uncover substrate 20 in the vicinity of shallow nick 408; and
Discoloration 410, resulting for example from oxidation of a conductor 18. Typically, discoloration is not a defect. However in some automated optical inspection systems discoloration 410 is falsely determined to be a defect because in a black and white image of reflected intensity its optical attributes may be sufficiently similar to the optical attributes of surface of substrate 20 so that it is not readily possible to distinguish between the two.
Reference is now made to
In the embodiment of
It is appreciated under various conditions, an optical attribute inspector 502 may output a defect report 508 which includes false indications of defects on a printed circuit board 506 undergoing inspection. In fact, in conventional inspection systems relying only on automated optical inspection, often it is preferable to increase the defect detection sensitivity to ensure that all real defects are found. This however may result in a relatively large quantity of false indications of defects in a candidate defect report 508.
It is a feature of the invention that those locations on inspected printed circuit boards 506 which are indicated by optical attribute inspector 502 as being defective are further analyzed in reliance on a different inspection attribute than the attribute, or attributes, used by optical attribute inspector to generate candidate defect report 508. Although false indications of defects of as described above are not uncommon, using inspection methodologies that rely on multiple inspection attributes helps to reduce false indications of defects.
In the embodiment seen
Height sensing defect verifier 504 includes a height sensor 510 operative to sense a height of a surface of a printed circuit board 506 at selected locations and a processing unit 512 including controller and height inspection functionalities. It is appreciated that controller and height inspection functionalities may be provided either in separate units, or in a single processing unit 512 as shown. Height sensor 510 may be any suitable height sensor operative to sense surface height and may include a scanner or staring array type sensing unit. Suitable 3-D sensing units operative to output a surface topography map include suitably adapted stereoscopic imaging systems available from Envision Advanced Medical Systems of Petah Tikva Israel, range profiling cameras available from IVP of Sweden, and conoscopic holographic probes available from OPTIMET Optical Metrology Ltd of Jerusalem, Israel.
Optionally, height sensing defect verifier 504 includes a display 514 displaying a three dimensional image of selected locations on the surface of a printed circuit board 506. It is noted that display 514 may be provided in addition to, or in place of, an automated defect detection functionality based on height analysis in processing unit 512. Accordingly, a suitable display enables a human operator to make defect verification decisions based upon review of a 3 dimensional mapping of candidate defect locations, or other locations of interest, on the surface of printed circuit board 506.
Operation of defect detection system 500 proceeds as follows: Locations of interest for height inspection on a printed circuit board 506 to be inspected are supplied to processing unit 512. The locations of interest include locations indicated to be defective by an optical attribute inspector 502 and reported in a candidate defect report 508. Locations of interest for height inspection may additionally include locations that are particularly identified, for example in pre-inspection learning mode, as requiring height inspection. Examples of the types of locations that may be particularly identified include particularly long conductors, or power lines which are sensitive to impedance and for which a height dimension is critical.
The controller functionality of processor unit 512 provides a control signal 515 operative moves either height sensor 510 and/or a stage 516 supporting a printed circuit board 506 so that a location of interest is placed in the field of view of height sensor 510.
Height sensor 510 acquires 3-D image 518 of the location of interest which is then supplied back to processor 512. In accordance with an embodiment of the invention, processor 512 automatically analyzes 3-D image 518 to ascertain whether at location indicated in a candidate defect report the defect is an actual defect or rather a false indication of defect. Actual defects are reported in an actual defect report.
Optionally, image 518 is displayed on a display 514 thereby enabling a human operator to control, or override, an automatic height inspection functionality. In some embodiments of the invention, the automatic height inspection functionality of processing unit 512 is absent, or is not activated, and defect verification decisions are made exclusively by a human operator in reliance on evaluation of a displayed 3-D image 518. In either configuration, ultimately the final determination of whether a defect reported in a candidate defect report is thus the result of analysis of a combination of inspection inputs, which are at least partially independent of each other.
Reference is now made to
In this example, the inspection functionality includes a sensor 620 that is operative to acquire reflectance and/or fluorescence inspection inputs, and then in addition to acquire a height inspection input. Although sensor 620 may be a single unit, it is appreciated that sensor 620 may optionally include several detection units. In one possible configuration, sensor 620 is a single unit of which a first portion thereof is dedicated to sensing a height detection functionality while a second portion thereof is dedicated to sensing an optical attribute inspection functionality.
In one embodiment of the invention, sensor 620 includes an array of elongated high-speed parallel photosensitive analog detectors, such as photodiodes, configured according to U.S. Provisional Application No. 60/307,606, filed Jul. 26, 2001, which is incorporated by reference, herein, in its entirety, as mentioned above.
In such a configuration, due to the linear arrangement of the photodetector elements in the sensor 620, when the surface being scanned is of substantially uniform height, the image of the beam spot 14 continually impinges on the same photodetector elements (by virtue of optics 640) at such a position that produces a uniform non-zero signal. The other photodetector elements, which are not impinged upon by the image of the spot, output a generally null signal.
When the topology of the surface being mapped is not substantially uniform in height, however, the height of the image of the spot on the sensor changes as a function of the height (or depth) of local non-uniformities (such as in the presence of a conductor) on the surface, in addition to its translation across the sensor. Thus, when the surface is not uniform, the image of the spot impinges on different photodetector elements in the sensor 620, and each of the photodetector elements outputs a modulated non-uniform signal. The instantaneous strength of the signal output by each photodetector elements in the sensor is a function of whether the spot impinges upon the particular photodetector elements and the location of the spot on an element in the cross scan direction.
By sampling the signals output by each of the photodetector elements of the sensor 620 at a particular instant time, the height (or depth) of the surface at that instant of sampling is ascertained by triangulation by determining which photodetector elements in the array is outputting the largest non-zero current. Also, by summing together all of the non-zero currents of the various photodetectors forming sensor 620, at any given time, the overall reflectance can be determined. Thus, it is appreciated, sensor 620 can simultaneously provide at any given location both an indication of height as well as overall reflectance.
Therefore, as the beam 14 scans across the surface of the printed circuit board 16, the sensor 420 can simultaneously acquire a map of the surface based on an intensity of reflectance along with a topographical profiling 630 of the surface being scanned. A sequence of topographical profiles 630 can be combined to form a topographical mapping of the surface of the printed circuit board substrate under inspection 16. Moreover, additional sensors can be provided to acquire a map of fluorescent response to beam 14 as it scans across the surface of printed circuit board 16.
In accordance with an embodiment of the invention, the data acquired by sensor 620 is provided to an optical attribute processor 650 and to a height attribute processor 660. The optical attribute processor 650 is operative to detect defects based on analysis of an optical response, e.g. reflectance and/or fluorescence as know in the art. The height attribute processor 660 is operative to detect defects based on analysis of a height attribute. Height attribute processor 660 may operate on height information provided for an entire printed circuit board 16 under inspection. Optionally, because of the increased resources typically required to conduct height analysis, height attribute processor may operate only on those locations in a printed that are indicated as having suspected defects, for example based on inputs from illumination attribute processor. One suitable mode for operation of a height attribute processor 660 is described in U.S. Pat. No. 6,654,115, mentioned above in the "Related Applications" section of this disclosure, and entitled "System and Method for Multi-Dimensional Optical Inspection."
The results of processing by the optical attribute processor 650 and height attribute processor 660 may be provided to a multiple attribute analyzer 670 which generates a defect report 680 based on a combination of inputs from the different attribute processors.
The results and advantages of multiple attributer processing, for example as performed on conductor segments 18 shown in
Firstly, it is appreciated that multiple attribute processing may be used to reduce both the quantity of missed defects, namely real defects that are not detected, and to reduce the number of false alarms, namely non-defects that are falsely reported as defects. One way to achieve this result is to increase inspection sensitivity for inspection of a first attribute. This generally results in an increase in the number of reported defects, including falsely reported defects. However, in accordance with an embodiment of the invention, in combination with increasing the sensitivity of analysis of a first attribute, analysis of additional, typically independent, attributes is employed to reduce the number of false alarms.
Moreover, multi-attribute processing provides information otherwise not available when only a single inspection attribute is analyzed.
The full nick defect 406, when exposed to suitable illumination exhibits a reflectance and a fluorescence that are characteristic of the shape of the defect. Analysis of height of full nick defect 406, which is lower than non-defective segments of conductor 18 and is below a minimum required height with reference to substrate 20, namely is generally at the same height as substrate 20, confirms the presence of a defect.
At partial nick defect 408, no defect is detected from the analysis of fluorescence because the footprint of nick defect 408 remains generally unchanged relative to a non-defective conductor portion. When analyzed for reflectance, partial nick 408 may exhibit somewhat of a change in reflectance compared to surrounding non-defective segments of a conductor 18. However, reflectance is dependent on numerous parameters and it may not be possible to repeatedly and accurately detect a partial nick defect solely in reliance on a reflectance response. Nevertheless, by appropriate setting the sensitivity of a reflectance analysis defect detector, the reflected response may be suitable for identifying location of suspected defect that require additional evaluation using a height input. It is noted that partial nick 408 has a height that, at parts, is lower than non-defective segments of conductor 18 but is higher than the height of substrate 20. Such parts may be below a minimum height threshold relative to surrounding substrate 20. Thus height attribute processor may be effective in distinguishing actual partial nick defects from non-defects.
It is appreciated a dished down defect 403 (seen in
It is noted that a defect determination based on height as to whether a partial nick defect 408 or a dished down defect 403 is an actual defect may be made, for example, as a function of the severity of the difference in height relative to a given parameter for a non-defective conductor 18.
At discoloration 410, when analyzed for fluorescence response no defect is identified, which is proper. This is because a mapping of conductor 18 is based on a fluorescent response of substrate 20 surrounding conductors 18, which do not fluoresce when exposed to laser light used in conventional AOI systems. However, when discoloration 410 is analyzed for reflectance response, a suspected defect may be detected because of the reduced reflectance of some discolorations, such as may occur if discoloration due to oxidation. When analyzed for height, because the height of the region of discoloration is generally unchanged relative to a non-defective segment of conductor 18, the presence of a non-defective segment is confirmed. Thus when reflective analysis is combined with height analysis, the presence of a non-defect is confirmed. Moreover, it is noted that by using a combination of multiple inspection inputs, additional information, exceeding the mere sum of each inspection input, may be obtained. Thus, for example, the presence of a region which is not defective, but rather merely discolored, for example by oxidation, may be specifically identified.
It is thus appreciated that evaluation of a combination of inspection attributes may be useful for distinguishing actual defects from non-defects and provides information that is not available when using only a single inspection input. Thus, for example, based solely on reflectance, it may be impossible to determine whether a discoloration 410 is a defect, however in combination with height inspection it becomes clear that discoloration is in actuality a non-defective location on conductor 18. Likewise, an AOI system that primarily an analyzes a fluorescence based attribute may not distinguish a partial nick 408, however in combination with analysis of a height attribute, the presence of a partial nick 408 is readily ascertained and a defect determination can be made based on the severity of the partial nick. Moreover, a system that analyzes only reflectance, or a combination of both reflectance and fluorescence inspection inputs, may be able to determine the presence of a suspected dished down segment 403, however the addition of a height inspection attribute enables localization of the dish-down defect and determination of whether a localized dished-down portion 403 is sufficiently severe to be considered a defect.
Reference is now made to
It will be appreciated that the analysis of the height at a given point involves substantial amount of processing, particularly when compared to the analysis of optical attributes.
According to this example, therefore, to achieve improved inspection throughput, only the amount of illumination reflected from the surface and/or a fluorescent response to laser illumination (i.e., first attribute information) is initially processed and analyzed at step 730. If analysis of illumination (or fluorescence) for a location is as expected, for example based on comparison to a reference, then the determination at step 740 is that the conductor is acceptable. If analysis of illumination (or fluorescence) shows a result different from that expected, however, then there might be a defect such as full nick defect 406, a defect such as a partial nick defect 408 or a dished-down defect 403, or a discoloration 410 at the area, even though it is properly formed.
Therefore, when the amount of illumination at a given point is different from expected, processing proceeds to step 760 where height information (i.e., the second attribute information) is obtained, and analyzed at step 770. At step 780, if the height at the point being inspected is the height expected, then it is determined that there is no defect (i.e., the inspection attribute of whether there is a defect or not is determined to be in the negative). If the height at the point being inspected is not the height expected, then it is determined that there is a defect (i.e., the inspection attribute of whether there is a defect or not is determined to be in the affirmative). It is appreciated that analysis of first attribute information may be acquired generally simultaneously, as described with respect to
Once analysis of a printed circuit board is completed then for each location height information is deemed not acceptable, then at step 790 the possibility of repair is considered. If a location is repairable then it is repaired at step 800. However, if any location on printed circuit board is not repairable, then at step 810 it is discarded.
It is appreciated that in the methodologies described herein above, the final defect determination is not based on just one attribute information, but rather it is based on a combination of optical response attribute information (i.e., first attribute information) and the height attribute information (i.e., second attribute information).
It is further appreciated that when optical response attribute information and height information are generally simultaneously acquired, then the height information used by the height attribute processor 660 may be suitably buffered so that it remains available in the event that the acceptability determination at step 740 results in a negative determination.
It is also appreciated, as noted above, that the analysis of the first attribute information and the second attribute information may be performed in parallel, depending on the processing power available and the speed of the inspection. Thus, instead of making a first acceptability determination at step 740, the inspection attribute could be determined prior to making any such acceptability determination.
It is still further appreciated that the system shown in
Besides using luminance, reflectance, and height information, other types of attribute information will occur to those familiar with this field.
It will be appreciated by persons skilled in the art that the present invention is not limited by what has been particularly shown and described herein above. Rather the scope of the present invention includes both combinations and subcombinations of the features described herein above as well as modifications and variations thereof which would occur to a person of skill in the art upon reading the foregoing description and which are not in the prior art.
Patent Citations
Non-Patent Citations
Referenced by
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muted item in
Malaysian Airline System (MAS; Malay: Sistem Penerbangan Malaysia; branded as Malaysia Airlines; (Malay: Penerbangan Malaysia) MYX: 3786 as Malaysian Airline System Berhad) is a major airline operating flights from Kuala Lumpur International Airport and from secondary hubs in Kota Kinabalu and Kuching to destinations throughout Asia as well as a handful of destinations in Europe and Oceania. Malaysia Airlines is the flag carrier of Malaysia and a member of the Oneworld airline alliance. The company's headquarters are located on the grounds of Sultan Abdul Aziz Shah Airport in Subang, Selangor, Greater Kuala Lumpur. In August 2014, the Malaysian government's sovereign wealth fund Khazanah Nasional—which then owned 69.37% of the airline—announced its intention to purchase remaining ownership from minority shareholders and de-list the airline from Malaysia's stock exchange, thereby renationalising the airline.
Malaysia Airlines owns two subsidiary airlines: Firefly and MASwings. Firefly operates scheduled flights from its two home bases Penang International Airport and Subang International Airport. The airline focuses on tertiary cities. MASwings focuses on inter-Borneo flights. Malaysia Airlines has a freighter fleet operated by MASkargo, which manages freighter flights and aircraft cargo-hold capacity for all Malaysia Airlines' passenger flights. Malaysia Airlines also provides aircraft maintenance, repair and overhaul (MRO), and aircraft handling services to other companies.
The airline began as Malayan Airways Limited and flew its first commercial flight in 1947. A few years after Singapore's independence, the airline's assets were divided in 1972 to form Singaporean flag carrier Singapore Airlines and Malaysian flag carrier Malaysian Airline System.
Despite numerous awards from aviation industry, such as the five-star rating from Skytrax (2005-7, 2009, 2012–13; one of just seven airlines in the world with this rating in 2013) and recognition from the World Travel Awards as the leading airline in & to Asia (2010–11, 2013), the airline struggled to cut costs to compete with new, low-cost carriers in the region since the early 2000s. In 2013, the airline initiated a turnaround plan after large losses beginning in 2011 and cut routes to prominent, but unprofitable, long-haul destinations, such as the Americas (Los Angeles & Buenos Aires) and South Africa. Malaysia Airlines also began an internal restructuring and intended to sell units such as engineering and pilot training.
The disappearance and presumed crash of Flight 370 in March 2014 in mysterious circumstances shook consumer confidence in the airline, however, with bookings and stock prices declining. Just four months later, Flight 17 was shot down over eastern Ukraine; despite the route being well-traveled by major airlines, MAS received public criticism for traveling over the conflict zone. The losses totaled 537 passengers and crew and two Boeing 777-200ER aircraft. Prior to 2014, MAS had one of the world's best safety records–just two fatal accidents in 68 years of operation, including a hijacking in 1977 that resulted in 100 deaths.


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Magic Tricks Revealed: Deck Throw
The Magic World Of Herb Gardening
The World's Top Herbs And Growing Secrets. This Powerful Ebook Is Appealing To Thousands Who Want A Healthier Life & Live Longer. Packed Full Of Ancient & Cutting Edge Growing Techniques, Herbal Remedies, Recipes www.herbsandgrowingsecrets.com/affiliate
A spectator chooses a card and when the deck is thrown the selected card magically sticks to the surface of a window, wall, etc. This trick delivers incredible results and will leave the spectator speechless. Stay updated on News, Contests, Giveaways, Videos, and More: facebook.com twitter.com
Watch how this amazing trick is done. Fun for all ages. One just has to have deft fingers. Well, practice will make you great at any trick!! Watch animated nursery rhymes at www.youtube.com To buy Appu Series CDs or Books, please visit www.appuseries.com
Video Rating: 4 / 5
25 Responses to Magic Tricks Revealed: Deck Throw
You have the extra card taped before the trick starts.
hey just wondering how do you know what card will be at the end of the deck after a shuffle?
what i am saying is you will have to know what card is going to be at the end to place the card somewhere. unless you dont shuffle for this trick?
hi i am a beginner i have always liked magic but i have recently got into i am 13 years old and your vids help me alot like the scarf through the neck my friends are always telling me to do that. anyways have you got any tips for me i would apreciate it if you did
isnt that a magician's "rule"
3:04 big fail!
after seeing the "forcing" tutorial, I noticed right away you did that and understood where you were going to great video though!
"A magician never does the same trick twice" = excuse
As a magician, what do you think of people saying to you after you just did a trick "Do that again?" what would you do/say if the trick needed preparation?
That's so awesome to hear! I'm glad a could help a little in making you feel like a king lol
I did this trick today (i cheated though, i had somebody pick the kinf of hearts on purpose) and also that "teleporting match" trick today at my friends barbeque. needless to say people were shocked and i felt like a king xD thanks for the vids man
When did you start doing magic
Thanks a lot! I love hearing from long time subscribers
teaching magic tricks on youtube + playing a lot of poker = getting good a shuffling
Hey man ur great! Just some advice, you don't have to say, "No breaks" because laymen don't know what a break is =)
are you a poker dealer or sumthing? you shuffle really good:) and great tricks ofc.
bro i have been subscribed to u 4evr not on this account but on a couple other ones and with each trick u continue to amaze me good job
It was David Blaine, not Criss Angel. d;
It's just one guy with multiple accounts. Pretty dumb of him if you ask me…
It's just one guy with multiple accounts. Pretty stupid of him if you ask me…
It's obviously one guy with multiple accounts. Pretty stupid of him if you ask me…
It's obviously one guy with multiple accounts. Pretty stupid of him if you ask me…..
Ignore the mean comments
I wish u can give me all your cards


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0 and $#@!ing 4.
0 and $#@!ing 4.
Doesn't look like our bullpen will be overworked this year....
Are they going to acknowledge that the fredi idea isn't $#@!ing working at some point? Loads of talent with sandy vaginas.
fredi has sucked since april of last year. at least if they continue to suck, maybe he'll be out.
but this shouldn't be surprising. they did absolutely nothing to upgrade the roster in the offseason.
They brought in livan $#@!ing Hernandez!!! And that $#@! sucker 3rd baseman!
Y'all chill wrenn and fredi got this..... puke
agree with the sentiment here..never sold on fredi and did not understand the complacency in the offseason..after such a collapse, I would want to make some changes
0-4 Braves, 1-3 Phillies... and the 4-0 F#CK*NG METS... who would have thought??
fortunately, our failure costs half the amount of yours..[/bright side]
welcome back chipper!
Full homo
time for the o'flaherty-venters-kimbrel show
oh, kimbrel is still on the team?
Schafer, who had three hits and stole three bases, chatted once with Jones after reaching third.
"He said, 'Man, right out of the gate barehand?'" Jones said, smiling. "I was like, that's my job, baby. It's my job to take it away from you. I see you didn't come back down there the rest of the night."
no mccann or pastornicky tonight:
bourn - cf
prado - lf
freeman - 1b
chipper - 3b
uggla - 2b
heyward - rf
ross - c
wilson - ss
delgado - p
last night, it was the braves' #1 pitcher against the astros' #5 pitcher. tonight is the opposite (and really, the only reason delgado is the #5 right now is because hudson is on the dl).
really need to win this game. don't want to start the season being swept by the mets and then losing a series to the astros.
Why the $#@! is Pastor sitting? I understand McCann, that happened all last year, but we have a hot rookie that has yet to be ruined in our hitting system.
god, it's good to see heyward getting off to a hot start.
yep re: heyward. nice to see ross still has some punch in his bat.
1st series win this year. Really needed this one.
need to take 2/3 from milwaukee in the hope opening series. jj, minor and beachy are pitching, so the games should be close.
Chipper was in the lineup but has swelling in his knee and has to have the fluid drained, it was said that he could blow it out if he played on it like this. I for one think this is a sign of the true start of the season.
Now that the Braves are out of Texas, I can watch tonight!
Back to $#@!in back off $#@!in horrible pitches. Gd
Ill take a 6 run inning once a week from here on out. Thanks
Just your basic 10-8 W!
Game had me a little nervous towards the end, but Kimbrel shut the door. Braves win 2-1 and they are now 4-4 on the season
Lose four and the win four straight. It is probably going to be a damn rollercoaster.
0-4 without Chipper
4-0 with Chipper
Chipper in '12
Nice sweep! Durbin may be worse than Scott Proctor.
Gotta have at least one Linebrink/Proctor every year...
Mets in town. Lets give them a john rocker welcome and extend the home winning streak to 6-0 come Wednesday.
Nice bats tonight in the 7-8 spots..... eventhough jack got robbed tonight I see him as an auto out. Don't trust e.h. as far as I can throw his big ass.
Not our night. Call in the dogs and piss on the fire. Walk away and say $#@!It.
That was just such an ugly loss..... Our pitchers have gone 1 too many innings the last few nights.
santana vs delgado...... glad they don't play 'em on paper
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It's official: Karlie Kloss has one of the most insane bods we've ever seen. To drive that point home, here's the latest Numero editorial of Kloss doing her thing wearing next to nothing, and showing off much more than just her never-ending legs.
In the October issue, Elizabeth Sulcer styles Kloss in second-skin latex, fierce leather wares, and drool-worthy jewels. The model's body — and we mean, every inch of it — is clearly the focus of the Greg Kadel-lensed spread, not the clothes. In one pic, Kloss wears hotpants, latex thigh-high socks, and a leather jacket sans shirt, and in another, she shows off her bum in what we're going to call a high-fashion up-skirt pose. (Tyra fans may prefer the term "booty tooch".) The last time that Kloss was this naked was for Vogue Italia's December issue, which garnered a heck of a lot of controversy.
In one of the more NFSW pics, Kloss is just in a peplum skirt and drenched in baubles, and proudly showing off her girls. If you've got 'em, flaunt 'em, right?
Check it all out below:
Image title
this is some kind of spaceship or something.


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Frog Umbrella by Chris Marquardt
It's not the camera, it's the photographer. We all know that. Do we live it? Not always. Which is why I did a deliberate "lesser photographer" thing.
Where I would usually have the iPhone in my pocket as an emergency or backup camera, this time I made a deliberate decision to go out and shoot with nothing but the iPhone. No big medium format camera. No DSLR. Just the iPhone 4s.
Our creativity strives under constraints. Some of the greatest photography has been made with cameras that some of today's photographers wouldn't even touch with a ten-foot-pole. So I went an extra step and instead of using the iPhone's built-in camera app, I used one that most people would call crippled. Its name is NoFinder and it is pretty much what the title of the app says: a camera without a viewfinder.
Now adding that kind of a restriction might initially sound silly, but it has turned out to be surprisingly good for the creative side of things. Not being able to look through a viewfinder helped me concentrate on the actual scene a lot more than if I had looked through a viewfinder. Pointing the camera without a display also left a certain margin of error, but in the end for many shots that lead to interesting and unusual framing choices that I wouldn't have made with a viewfinder.
Most of those accidental choices of frame weren't that exciting, but then there were a few that I found really interesting. And again: I wouldn't have arrived at them any other way.
The last two constraints that I placed myself under turned out to be pretty much the most beneficial ones: my decision to set the app to only take square pictures and to work in black-and-white only.
The lack of a viewfinder initially made it harder for me to judge the angle of view, but after a few shots it became pretty clear how much would be in the picture. As an added benefit I now have a pretty good idea of the field of view that I can get from the iPhone. I didn't really have that angle visualized before.
And in the end that's how Frog Umbrella came into existence. Being able to see the entire scene with my two eyes, I could watch the umbrella kid walking away from the building and while it was doing so, I fired three shots while trying to anticipate the framing.
And the third shot was the charm. That's my kind of picture - everything fits nicely, the frog's eyes are doubled in the building, every element in the photo feels like it belongs exactly where I put it. I'll be happy when I bring home one single picture like this every time I go out shooting. I'm still working on that.
» Frog Umbrella on Flickr (leave a comment)
I did the sys admin thing where I'd call myself and ask what to do, and I found a partial solution to my DTS issue. I'm far from having this process completed, but I'm a few steps closer of getting my collection of 6-channel DTS 5.1 CDs ripped onto my Mac and into a somewhat useable format.
It's still a fairly manual process, but here's what I've done so far:
Step 1: rip the DTS 5.1 CD to iTunes using the WAV encoder as the input format (no MP3, AAC or similar). This process seems to get the track names right. Not sure if it takes them from Gracenote or if it reads the CD text, but the titles end up in iTunes.
At this point, the ripped files are recognized as 2-channel WAV files, and their content is DTS-encoded 5.1-channel audio. iTunes doesn't give me that information though, and it doesn't seem to be aware of this, so playing these over a normal system will result in noise. In order to play them properly, they have to be played over a DTS decoder, or they have to be decoded on the system.
Step 2: convert the ripped WAV files to 6-channel WAV files using VLC. This partially works, VLC can even be kind of coerced into converting them in a batch, using the Streaming/Transcoding Wizard, but for whatever reason VLC refuses to convert the last track.
My process: open the imported WAV files in VLC, File - Streaming/Transcoding Wizard, Transcode/Save to file, select items from playlist, only check "Transcode audio", set codec to Uncompressed, integer, 192 kb/s, select WAV, select output directory, go. Again, this process will not convert the last file in the list for whatever reason. My workaround is to add the last file twice.
The file names get messed up a bit in the process, spaces end up being replaced by 20, probably due to URL encoding.
At this point I have 6-channel WAV files that work. That's a pretty good start, because from here I should be able to convert the files to anything else I need in the future, using Compressor.
It's easy to visualize with Final Cut Pro X at this point, all 6 channels work and they seem to be even in the right order (something that surround audio fans know isn't always a given..)
Hattler Surround Cuts (also available as a DVD)
Step 3: fix the broken file names using an Automator action. Replacing 20 with a space in the filenames is easy this way, I do all other URL encoded characters manually for now. If this were a process that I'd need to do several hundred times, I would try to fully automate that. As it's now, I am okay with doing a bit of manual work here.
What's next?
Next steps: find a way to make this process simpler and more automated. It's not that I have hundreds of DTS 5.1 CDs, but I'd still like to find an easier and less error-prone way to do this. I'm also going to need to find a good way to play or re-encode those files into something that I can easily play. But the 6-channel WAV gives me at least a great uncompressed starting point to continue using them down the chain.
And then: find a way to play all this back over my existing infrastructure. Fun times!


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Posted at: 12/05/2012 7:43 AM
BEMIDJI, Minn. (AP) - A longtime business partner says the pilot killed in a plane crash in Illinois was the president of Bemidji Aviation Services in Minnesota.
Mark Shough says 74-year-old Larry Diffley was flying solo in a twin-engine Beech Baron and was inspecting an oil pipeline near Chicago when the plane went down shortly before 3 p.m. Tuesday.
Shough says Diffley was in radio contact during the flight with the oil company that contracted with him to inspect the pipeline. Shough is vice president of Bemidji Aviation.
Shough tells the Bemidji Pioneer he and Diffley bought the aviation company in 1970 after the two met in the National Guard. Shough remembers Diffley as a "superb pilot" who was fair, generous and conscientious.
Bemidji Aviation employees issued a statement expressing sympathy to the Diffley family.
Information from: Pioneer, http://www.bemidjipioneer.com
(Copyright 2012 The Associated Press. All rights reserved. This material may not be published, broadcast, rewritten or redistributed.)


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As of Tuesday, January 24, 2012
© Copyright 2015 Newton Citizen
Bernard Thompson and his Florida Gulf Coast teammates wrapped up a three-game road trip 2-1 and moved over .500 in conference play recently.
Thompson, a freshman guard from Rockdale, scored 10 points on 5 of 7 field goal attempts and handed out three assists, helping the Eagles knock off Stetson 92-85 and move to 5-4 in Atlantic Sun play. In 19 games (16 starts), Thompson leads Gulf Coast in scoring and steals, averaging 11.9 and 1.9, respectively.
The Eagles begin a three-game home stand tonight when they host Longwood in a non-conference battle.
GPC baseball season begins a week from today
Georgia Perimeter's junior college baseball team is set to open its 2012 season. The Jaguars, coming off the Region 17 championship, will host West Georgia Technical College in a doubleheader Jan. 31 at the school's Newton campus.
The brief home stand to start the season continues when Chattanooga State Community College travels to Covington for a doubleheader Feb. 4.
RYSA spring season approaching
Walk-in registration for the spring season at the Rockdale Youth Baseball Association continues this week through Feb. 4. Players can register from 6 to 8 p.m. today and Thursday and from 10 a.m. to 2 p.m. on Saturday, then again from 6 to 8 p.m. Jan. 31 and Feb. 2 and from 10 a.m. to 2 p.m. Saturday, Feb. 4.
Tryouts will be held from 11 a.m. to 1 p.m. Feb. 11 and the draft is scheduled for the following day from 1:30 until 5 p.m.
The spring season begins March 19.
More like this story
- Thompson, FGCU win A-Sun title ( March 9, 2013 )
- Thompson receives A-Sun preseason honors ( October 10, 2014 )
- Farmer looks to stay unbeaten in Blacksburg ( March 7, 2013 )
- Rockdale alum Thompson posts career game ( November 20, 2012 )
- Thompson hits career high in Eagles' win ( November 20, 2014 )


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Notts athletes shine at English Schools' Championships
Posted: July 14, 2010|
NOTTS athletes shone at the Aviva English Schools' Track and Field Championships in Birmingham.
At the Alexandra Stadium, pupils from across the county turned in top-notch displays, winning two individual gold medals at the two-day event.
Both came on the opening day with Farnborough School pupil Montel Nevers the first to win gold, recording 13.14m in the triple jump, a personal best.
A second gold medal came courtesy of Ashley Gilder (Holgate School), he won the intermediate boys hammer with a throw of 64.89m.
On day one, Notts athletes started brightly.
Charlotte Gair (Joseph Whittaker) won bronze in the senior girls' discus with a throw of 42.99m.
Thomas Peters (All Saints School) took silver in the junior boys' javelin with a new personal best of 60.07m.
And then Joseph Whitaker pupil Chris Clarke secured bronze in the intermediate boys' shot with a putt of 14.20m.
Joseph Whitaker School had six athletes in the team – a record for any Notts School.
On day two, David Largerburg (Joseph Whitaker) won bronze in the 400m with a new personal best, 48.27s and Anna Davies (Bluecoat School) came third in the 80m hurdles in 11.79s.
Over the two days, other notable performances came from Bethany Mitchell (Ashfield School) in the senior girls hammer, throwing 46.73m to take fourth, while Tesni Ward (Worksop College) was fourth in the senior girls' javelin. Elijah Skervin (Emmanuel School) was fourth in the senior 100m – a mere 1/100th of a second off a medal.
Stuart Street (Joseph Whitaker), took fifth in the junior boys' long jump, while Doug Musson (Bramcote Hills) was sixth in the inter boys' steeplechase with a personal best time of 4.33.92.
Greg Millar (Minster School) was ninth in the senior boys' javelin and Chloe Elphick (Brunts School) was eighth with a personal best in the inter girls' triple jump.
Chloe Bradley (Elizabethan School, Retford) set a personal best in the 400m of 57.51.
Others who gained personal bests were Michael Constante (Nottingham High School), seventh in his heat in the junior boys' 800m with 2.07.04; Jack Phillips (Fernwood) seventh in his heat of the junior boys' 800m in 2.06.79 and Hannah Stevenson who finished sixth in the senior girls' 200m final, gaining a personal best of 25.58 in the earlier rounds.
The Notts team won the intermediate boys' group and was fourth in the junior boys.
The senior girls' group was fourth, improving on the sixth place from last year.


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Virginia Orzel is a New York southern tier native with a 15-year professional career in film and video production. She has been teaching college for the last ten years, and her resume includes work on 20 documentary films. Orzel has won seven New York State Broadcasters Awards, and was a nominnee for both an Emmy and an Iris Award. Most recently, Ginny received two Bronze Telly Awards for her works, "One Breath: A Personal Journey with Asthma," in 2010 and "The Morgan Manning House Legacy" in 2011. A major DVD/Web distributor, Films Media Group, also picked up "One Breath" in December 2010.
"One Breath" had a review written by The Lancet, the medical journal in London, published in September 2010. The film also screened at the SUNY Wide Film Festival Faculty Show in 2010 and at the Phoenix International Christian Film Festival in August 2010.
Ginny is an Apple Certified Instructor in Final Cut Pro, teaches graphics, DVD Authoring, and all facets of video and audio production.
Her technique includes Documentary, Live Action, Animation and Experimental filmmaking. She is a producer, director, videographer, editor, technical editor, animator, compositor, and DVD maker. Ginny is not limited by one genre and enjoys all types of filmmaking as well as learning new aspects of the craft.


text: http://crunchbang.org – OK. Big problem. Upgraded to Waldorf, just awesome. However, my USB wireless dongle does not have drivers for this new of a Linux Kernel. It is the only method of acquiring internet I have for this old laptop. Here's what I have found out and tried, hopefully you guys can help. USB Dongle - http://www.rosewill.com/products/1595/P … erview.htmThe newest driver version listed on their site only supports up to 2.6.37. However, I found this: http://www.wikidevi.com/wiki/Rosewill_RNX-N150UBE It lists the actual chip inside as Realtek RTL8188SU. The official Linux driver for that chip is r871 (HowTos)


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Rio Drake Farm
Experience pure nature at a small ecofarm/hotel in a very natural place in Drake Bay of the Osa Peninsula, Costa Rica. Enjoy the pura vida feeling in one of our hammocks under a traditional palm leaf roof looking at the lagoon, beach, sea and caño island or observing animals as hummingbirds, kingfishers, river turtles, otters and many more.
We organize for you any tour you wish to do, as hiking in the corcovado national park, snorkeling at caño islands biological reserve, horseback riding at the beach, bird watching, poisonous dart frog watching, crocodile tour and more. Or enjoy the 4km lonely beach in front, go hiking to a mangrove river or try your fishing luck!
We are situated next to the Drake Bay Airport, so it is really easy to get here by plane from San José (Sansa).
This new introduction needs approval
Free pick-up service from the Drake Bay airport, the boat or bus station.
There is no bank or ATM in Drake Bay. We recommend to take cash with you. We accept credit cards with 3dimensional numbers (10% commission).
Pets are not allowed; animal services (dogs) are accepted.
Kitchen use is $2 p.p.n and night or $5 per group and night. There are a few pots and dishes available.
For tours please advice 1 day in advance, before 6p.m. For Corcovado overnight tour please advice 1 month in advance.
Availability & RatesTo view availability and prices please select dates and click 'Update Dates'
B&B Facilities & Policies
- Age Restriction
- Credit Cards Not Accepted
- Free Parking
- Kitchen
- Luggage Storage
- Meals Available
- Outdoor Terrace
- Parking
- Restaurant
- Taxes not included
- Towels Included
Cancellation PolicyThis property has a 1 day cancellation policy. Failure to cancel within this time will result in a cancellation charge equal to the first night of your stay.
Must-Read Guesthouse InfoThis property has specific Terms & Conditions.
Free pick-up service from Drake Bay airport, boat station or bus station
if you let us know about your arrival in advance.
Free welcome coconut juice
Free canoe use
There is no ATM or bank in Drake Bay. We do not accept credit cards.
Pets are not allowed, animal services (dogs) are accepted.
There is no electricity at Rio Drake Farm, except a solar panel for a
light and to charge electric equipment in emergencies.
25% discount on the accommodation prices for children from 6 to 12 years
(no children 0-6 years).
DirectionsShow MapHide Map
By plane: The easiest and fastest way to Drake Bay is by plane (Sansa and Nature Air). We recommend Sansa that flies from the International Airport Juan Santamaria directly to Drake Bay. Please let us know about your arrival and you get a free pick up service from the airport.
By bus and boat: Go by bus at 5 a.m. from San José (TRACOPA, about 6 hours) at or 7 a.m. from Neily (if you come from Panama) to Palmar Norte. There, take a collective taxi to Sierpe and then a boat at 11:30 to Drake Bay. There is another boat at 3:30 p.m., but we recommend to take the earlier whenever possible, it is cheaper and you arrive by day. Please let us know about your arrival and you get a free pick up service from the boat station.
By bus (Monday to Saturday): Take a bus from San José (TRACOPA) to the south of Costa Rica and change at Chacarita to the bus to Jiménez (3 p.m.). If you come from Panama, take the bus at 2 p.m. from Neily to Puerto Jimenez. Get out in Rincon (before the bridge) and change to the bus to Drake Bay (4:45 p.m.). Ask the driver to let you out at the entrance of the airport. Please let us know about your arrival and you will get a free pick up service from the bus station.
By car: Follow the Interamericana to the south of Costa Rica until the gasoline station in Chacarita. There turn right and follow the street until you pass Rincon where you turn right again (before the bridge). After about one hour driving along a gravel road through farmland and forest you arrive in El Progreso. There follow our sign to the right until the airport where you pass through the gait and follow the airstrip at the left where you will find us at the end. We strongly recommend 4×4.
Located Near
Rio Drake Farm is situated in the South of Costa Rica, in the Pennsula de Osa, with front to the beach.
We are at 2km from the village El Progreso and at 5km from the village Agujitas. In El Progreso you can find two little stores, a bar and pre-Columbian stone balls. Our Farm is located between forest, the lagoon of the Rio Drake and the air strip of Drake Bay. The lonely beach of Drake is very close (at 200m) and from our dining platform you can see the Cao Island and beautiful sunsets.


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|English 346a
|L. McGrane
|M 7:30-10p.m.
The English Civil War wrought massive changes in the scope, format, and distribution of printed matter in London. This course explores a century of polemic and performance as new(s) media from the mid-17th through the 18th centuries produced a wave of critical response and creative media innovation. We will read newspapers, novels, essays, poetry, and plays—works that embody and comment on fraught networks of writers, printers, and politicians. In particular we will focus on shifting representations of materiality and circulation; ownership, authority and license; citation, plagiarism and piracy. What structures might control systems of knowledge production and dissemination? What forms of readership were imagined in this anxious and ambitious marketplace?
As we immerse ourselves in this historical dialogue of cultural production, we will put these centuries in conversation with current theoretical work on digital media, interface, and embodiment. How might students situate themselves as critical producers and readers of new media today? As scholars grounded in historicized discourses of media change, students will embark on original projects in new media formats in the final third of the course—while talking with contemporary artists and current librarians engaged in multi-media production. These projects will encourage interdisciplinary approaches to the materials and thoughtful use of historical digital archives and Special Collections.
Course Requirements and Proceedings: Students will submit weekly thought experiments (20%), a midterm paper of 8 pages (20%), and a digital project + an essay of 6-8 pages (40%) on a topic of their choosing. Students will also participate in seminar discussions/presentations and complete small projects using Special Collections and online historical collections (20%). To this end we will explore the construction of the ECCO (Eighteenth-Century Collections Online) and Burney Early English newspaper digital databases, both of which offer access to eclectic materials from the period. Students will be asked to share thought experiments and participate avidly in discussions and workshops with both the Sarah Stout exhibit in Special Collections and the Brian Dettmer Elemental exhibition in the Cantor Fitzgerald Gallery.
Pre-requisites: Two 200-level courses or consent of instructor.
Course enrollment limited to 15
Primary Texts:
Daniel Defoe, "An Essay on the Regulation of the Press"; A Vindication of the Press"
John Dunton, The Life and Errors of John Dunton
Henry Fielding, The Author's Farce
William Hogarth, Industry and Idleness
Delariviere Manley, The New Atalantis
John Milton, "Areopagitica"
Alexander Pope, The Dunciad
Jonathan Swift, "Tale of a Tub"; "The Battle of the Books"
Laurence Sterne, The Life and Opinions of Tristram Shandy, Gentleman
Newspapers & Periodicals (select readings):
Kingdomes Intelligencer (1660-1663 run)
London Gazette (1666-1792)
City Mercury (1675-1694)
Post Boy (1695-1728)
Flying Post (1695-1731)
The Athenian Mercury/Athenian Oracle
Theoretical Texts:
Roger Chartier, Forms and Meanings
Alexander Galloway, The Interface Effect
Julie Cohen, Configuring the Networked Self: Law, Code and the Play of the Everyday
Jürgan Habermas, The Structural Transformation of the Public Sphere
N. Katherine Hayles, How We Think: Digital Media and Contemporary Technogenesis
Adrian Johns, Piracy: The Intellectual Property Wars from Gutenberg to Gates
Alan Liu, "Friending the Past: The Sense of History and Social Computing"
Jerome McGann, "Database, Interface and Archival Fever"
Brian Dettmer, Elemental (Cantor Fitzgerald Gallery Oct.-Dec. 2013
Jen Rajchel, "Who Killed Sarah Stout?" (Quaker Collections and Digital Media)


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This week on the Behind the Headlines Radio Roundtable, Unified School Board members Dr. Kenneth T. Whalum, Jr., and and Kevin Woods, join host Eric Barnes, publisher of the Memphis Daily News, and reporter Bill Dries to discuss the challenges that they face in the coming year.
This week on the Behind the Headlines Radio Roundtable, the superintendents of the Memphis City and Shelby County Schools, Drs. Kriner Cash and John Aitken, discuss the final year before the merger of the two school systems.
The Unified School Board has decided to not renew the contract of Memphis City School Superintendent Kriner Cash, whose contract runs out in August of 2013, about the time when the school merger will actually start.
Superintendent of Memphis City Schools Kriner Cash's contract expires in 2013. The Memphis and Shelby County school board voted not to renew that contract last night. The vote was 14-8. A similar motion not to renew the contract of Shelby County Schools Superintendent John Aitken, which expires in 2015, did not pass. That vote was 8-14.


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Chef Bailey Goes National Next Week!
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Errollyn Wallen: The Girl in my Alphabet
1 CD / Avie Records / 2009-04-01Works: Errollyn Wallen: Dervish; Are You Worried About the Rising Cost of Funerals?; Louis' Loops; Horseplay; In Our Lifetime; The Girl in my Alphabet
Performers: Aspin, David; Finch, Douglas; Harlan, Dominic; Henry, Mike [Baritone]; Page, David le; Rozario, Patricia; Sharp, Matt; Spooner, Joseph; Staines, Kirsty; Tan, Margaret Leng; Wallen, Errollyn
Conductors: Headlem, Philip
Ensemble: Continuum Ensemble; Ensemble X
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Tchaikovsky: Ballet Music Highlights / Petrenko, et al
1 CD / Avie Records / 2009-04-01Works: Pyotr Il'yich Tchaikovsky: Swan Lake; Sleeping Beauty Suite, Op. 66a; Nutcracker Suite, Op. 71a
Conductors: Petrenko, Vasily
Ensemble: Royal Liverpool Philharmonic Orchestra
Vasily Petrenko, the 31-year old Russian maestro who took over a year ago as principal conductor of the Royal Liverpool Philharmonic Orchestra in a surprise...continue...
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When Vivian adopted Blue from the Humane Society of Southern Arizona (HSSA), she knew nothing of the horrors the nine-month-old pup had endured at the hands of dog fighters. One of 77 dogs rescued in a multi-state dog fighting raid in March 2013, Blue was chained to a stake in the ground, exposed and shivering in blizzard-like conditions, when the ASPCA rescued him. For today's special video Happy Tail, we traveled to Tucson to catch up with Vivian and Blue.
Vivian W. grew up in New York with all kinds of pets: cats, birds, even rodents. But she never had a dog. When she moved to Arizona last year, she decided that pit bull adoption was at the top of her priority list. On her second day in Tucson, she adopted Blue.
"It was love at first sight," says Vivian, recalling the moment she met Blue. After spotting his picture online, she was drawn to his striking blue eye (for which he is named), but knew nothing of his past. As she later came to learn, Blue was rescued by the ASPCA in a massive dog fighting raid. He was emaciated and weighed just 30 pounds when he first arrived at the shelter.
After his adoption, Blue settled in with Vivian quickly. He now devotes his time to the finer things in life: "He loves people, as well as car rides and his rope toy—that's his favorite," says Vivian. He is never far from her side, especially when she's sleeping or cooking, and has even taken a liking to olives, which grow on the many trees that dot their property.
"He seems to have forgotten about everything that happened, which is more than we can really ask for," she adds.
Blue's happiness is a testament to his resilient spirit. In many ways, he represents the thousands of dogs who have been rescued from abuse and who refuse to be defined by their traumatic past. Blue never gave up, just as we will never give up our commitment to ending dog fighting. In fact, April 8 marked our first annual National Dog Fighting Awareness Day, a day created to spread knowledge and understanding of dog fighting and to encourage animal lovers to take action against this barbaric practice.
We believe that there will come a time when dog fighting is seen for what it really is: the shameful pastime of cowards. But until that day comes, we will continue to fight for the victims—for dogs like Blue—so that they never have to fight again.
Last August, the ASPCA played a major role in the second-largest dog fighting raid in U.S. history. The raid, which spanned Alabama, Mississippi and Georgia, led to the rescue of hundreds of dogs ranging in age from several days to 10-12 years. At the time, we knew that these dogs would have long journeys ahead of them—many suffered physically and emotionally at the hands of their abusers. But they were survivors, and today, just in time for National Dog Fighting Awareness Day, six more of the sweet pups from that raid are ready for adoption.
The six dogs, all between the ages of 8 months and 1.5 years, spent the last seven months in a temporary shelter experiencing love and happiness for the very first time. Through daily enrichment, outdoor exercise, play sessions and behavioral training, they have been rehabilitated and are ready to find permanent, loving homes.
We are so thrilled for these pups—Evie, Charlie, Uno, Willie, Zayla and Rohan—but their story is a real reminder of why National Dog Fighting Awareness Day is necessary. We created NDFAD to increase understanding and awareness about dog fighting, and to encourage animal lovers across the country to take action against this brutal form of animal cruelty.
To learn more about dog fighting and how you can help the ASPCA end this cruel practice, watch our Google Hangout.
If you are interested in adopting one of these six brave dogs, please visit the Pinellas County Humane Society in Clearwater, Florida.
Pictured: Rep. Jim Moran (D-VA) and Rep. Lois Capps (D-CA)
Capitol Hill was once again the site of some serious human-animal bonding when the ASPCA hosted our annual "Paws for Love" gathering on April 4 along with the Congressional Animal Protection Caucus. At least 20 Members of Congress and nearly 1,200 congressional staff members happily interrupted their hectic workdays to cuddle with adorable dogs and cats from local animal shelters and rescues. Attendees learned about the vital work that these compassionate people do for animals every day—both in the nation's capital and throughout the country.
"The ASPCA and the Congressional Animal Protection Caucus have come together to show our bipartisan 'love' for shelter animals," said Nancy Perry, Senior Vice President of ASPCA Government Relations. "We are celebrating the life-saving work of community animal shelters and rescues nationwide and honoring the millions of lovable homeless dogs and cats currently waiting to be adopted."
Sincere thanks to the wonderful animal rescue organizations that participated in the 2014 Paws for Love:
Animal Welfare League of Arlington
Homeward Trails
Last Chance Animal Rescue
Lost Dog & Cat Rescue Foundation
Prince George's County Animal Shelter
Washington Animal Rescue League
Washington Humane Society
Robbie is a super friendly and playful cat. This young guy loves to run around, and if you offer him a toy with strings, he'll be your best friend forever.
Robbie is known around our Adoption Center for his outgoing personality and the adorable chirping noise he often makes—we're pretty sure he's an aspiring singer! He is interested in meeting furry friends of the canine persuasion, and with the proper introductions, we think he'd get along well with a polite resident dog. Robbie is looking for an experienced adopter in a household with kids 12-and-up. Adopt Robbie today!
Robbie is available for adoption at the ASPCA Adoption Center. If you are interested in adopting please call our Adoptions department in New York City at (212) 876-7700 ext. 4120. To learn more about Robbie, please visit his page.
Want to stay updated on the latest ASPCA Pet of the Week?
Sign up to receive our weekly newsletter, ASPCA News Alert - you'll receive important updates on what's going on and how you can make an impact to save animals' lives!
Bella is a friendly dog who loves every person she meets. This sweet pup came to spend the day at the ASPCA offices earlier this week, and the staff fell in love with her instantly!
Bella enjoys a good mix of activities—she'd be happy to lounge on the couch and watch TV with you, and she also loves to get plenty of exercise and playtime. She's looking for an adopter who will spend plenty of time running around with Bella, as she has lots of energy to burn. She also enjoys playing with other dogs. Bella would get along great with kids 10-and-up. Adopt Bella today!
Bella is available for adoption at the ASPCA Adoption Center. If you are interested in adopting please call our Adoptions department in New York City at (212) 876-7700 ext. 4120. To learn more about Bella, please visit her page.
Want to stay up-to-date on the latest ASPCA Pet of the Week available for adoption?
Sign up to receive our weekly newsletter, ASPCA News Alert - you'll receive important updates on what's going on and how you can make an impact to save animals' lives!


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Inspired by the simpler (and in a way, better) pen dispenser in the Guide to Field Soldering instructable.
Step 1: Parts and Tools
-a tooth pick
-small length of wood, 4mm x 4mm x 1" long is sufficient
-hot glue gun
-drill with a 3/8" bit
Step 2: Preparing the Mechanism
Step 3: Drill Hole in Pen Tube
Step 4: Load Solder
(please note, I do not have any solder at the moment so I am using a reasonably similar wire to demonstrate)
Step 5: Stop the Clip from Spinning
*Thinking about this again, I thought of a way a leadscrew pencil might be good for this:
1. Detach the knob from the leadscrew and attach it to a rod that runs down the center of the pencil (where the lead was).
2. Coil the solder around the rod.
3. Connect the solder to the rod so that it can slide along, but not turn around the rod. (A slot in the rod might work.)
4. Turn the knob.
It might be a bit less convenient to turn the knob than to press the button on top of a clicky pen/mechanical pencil.
i know this is an oldish instructable so you've probably found your own solutions but i just found it and thought i'd share.
This Instructable is embarrassing compared to my recent projects
Anyways, your comment itself deserves to be its own Instructable!
i'll post it up at some point though.
Here, man, you see, I'm not from US or anything, so I do not know how do you call these, but it's fairly simple to use it, you just have to load if with solder, and in each click you'll have a bit of solder, as long the solder are the right size. I just lost mine so I can't give you a photo of that in the battlefield, but as long I buy one I'll send a pic for you to see...
Kepp the good work coming!