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Personal Awareness and Wellness SeminarThe PAWS program, developed by Dean of Students Kelly Wood and Director of College Admissions Amanda Murrell, prepares Ashley Hall students for success in school, college and life.
Family Style Dining and Slow FoodAH"s new dining facility, which includes culinary arts classrooms and kitchens, will enable us to engage students directly with the issues surrounding "food culture." And as we seek new sources for more healthful foods and for more locally and regionally grown seasonal products, we can devise healthful menus that also promote economic and environmental awareness.
Physical EducationWe're making creative use of an urban space! We have introduced an adventure-based component to the curriculum, using activities such as rock climbing to enhance social/emotional development via physical education. The traversing wall presents many teachable mo- ments that we use to help students become better problem solvers or more effective communicators.
CounselingThe Counseling Department's program is based on the premise that continuous growth in the areas of physical, intellectual, ethical and social-emotional well-being is necessary for students to reach these goals. The Counseling Department activities reflect our desire to facilitate continuous growth by the Ashley Hall family of students, parents and faculty.


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Men's Basketball: KJ Finalist For Wooden Award
LOS ANGELES — The 15 Finalists for the John R. Wooden Award were announced by The Los Angeles Athletic Club on ESPN.com at 11am EST this morning. The National Ballot, consisting of these top players, will be mailed to Wooden Award voters this week. Selected by the Wooden Award National Advisory Board, the ballot is made up of 15 student-athletes who are the frontrunners for college basketball's most prestigious honor. Voting begins March 12th. The Women's midseason list will be released tomorrow.
All 15 players have proven to their universities that they are making progress toward graduation and are maintaining at least a cumulative 2.0 GPA, an important component of the Award insisted upon by Coach Wooden. The Wooden Award All American Teams will be announced the week of the "Elite Eight" round of the NCAA Tournament, making the Wooden Award unique among college postseason awards. Voters have until Monday, March 19 at Noon PDT to return their ballots, allowing them to take into consideration performance during the first two rounds of the NCAA Tournament.
Ohio State sophomore forward Jared Sullinger is the only player returning from last year's Wooden Award All-American Team. A finalist a year ago, Sullinger averages 16.9 points and 9.3 rebounds, while having recorded 12 double-doubles in 2012. Other players with notable statistics chosen to the ballot include Weber State's Damian Lillard, the nation's No. 2 scorer at 24.5 ppg, and the country's top setup man, Scott Machado of Iona, who averages an NCAA-leading 10.1 assists.
Three freshmen made the list, including No. 1 Kentucky's duo of Michael Kidd-Gilchrist and Anthony Davis. The only other freshman chosen was Duke's Austin Rivers. He joins Marquette's Jae Crowder and Isaiah Canaan of Murray State on the short list of players who did not make the midseason list, but who have played their way onto the Wooden Award ballot the second half of the season.
The Big East had three players chosen, including West Virginia's Kevin Jones, followed by the Big 12, Big 10, ACC, and SEC each with two. The MAAC, Big Sky, Missouri Valley and Ohio Valley conferences had one player chosen to the ballot.
The 36th annual Wooden Award Gala, will take place on Friday, April 6, 2012, and will honor winners, All-Americans and the Legends of Coaching winner Geno Auriemma of Connecticut. The John R. Wooden Award winner will be announced on ESPN the weekend of the Final Four in New Orleans, Louisiana.
Men's Basketball: Bahamas Preview
Womens Soccer: Kadeisha Buchanan Press Conference
Big 12 Media Days: Dana Holgorsen
Women's Soccer: Amanda Hill and Mocha
Big 12 Media Days: Nick Kwiatkoski
Football: Dana Holgorsen on ESPN

subset: commoncrawl


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continued The marathon starts on Main Street in Schroon Lake. The single loop course circumnavigates Schroon Lake over challenging forest roads with lakeside views until it finishes back at the Schroon Lake town beach.
The marathoners have company over the second half of the course as the half marathoners start in Adirondack and race to the finish in Schroon Lake 13.1 miles later.
The Adirondack Marathon Distance Festival is designed to raise money for college scholarships and the Helpers Fund, a Chestertown group that assists people and families in need, Friedman said. It also promotes the region and boosts the local economy.
The addition of the four-person relay will help the event grow, he said.
"Our goal is to raise more money to, in turn, give away more money as well as serve our region and community," Friedman said.
The marathon group now awards four $2,000 scholarships each year to students from the Schroon Lake and North Warren school districts.
Also helping grow the Adirondack Marathon Distance Festival is the participation of charity runners.
In 2012 Team In Training, which has runners collect pledges for The Leukemia & Lymphoma Society, raised nearly $55,000 during the Adirondack Marathon.
Friedman hopes the race can also attract participants from Team Hole in Wall, which raises money for the Double H Ranch in Lake Luzerne that serves children with life-threatening illnesses, and Team MS, which raises money for multiple sclerosis research and support.
Friedman noted volunteers are always welcome to assist with the event. Interested people can Email email@example.com
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Guide to the diagnosis, treatment and prevention of conditions from A to Z.
Topic Index
Birth Statistics
Planning a Pregnancy
Prenatal Medical Care
Common Discomforts of Pregnancy
Common Tests During Pregnancy
Risks to Pregnancy
Warning Signs During Pregnancy
Labor and Delivery
Breastfeeding Your Baby
Millions of babies will be born in the U.S. this year alone. Now more than ever, mothers-to-be have access to current information, advanced technologies, and skilled medical personnel to help them plan for a healthy pregnancy and childbirth.
If you are planning to become pregnant, you can do many things to help reduce risks to both you and your baby, as proper health before deciding to become pregnant is almost as important as maintaining a healthy body during pregnancy.
If you are already expecting, you can do many things to help minimize pregnancy and delivery complications -- while also helping to provide the healthiest environment for the developing fetus, and ultimately to ensure the health of your newborn.
By following a healthy lifestyle, including a well-balanced diet and regular exercise, avoiding certain harmful substances and potentially dangerous activities or situations, and by finding a qualified caregiver to manage your pregnancy, labor, and delivery, you will be taking the appropriate steps toward the delivery of a healthy baby.
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The Eclipse - John Dolmayan's Inspiration — The Mega Power Ride
The Paiste Rude Mega Power Ride cymbal is an extremely loud, cutting ride with an enormous, big, loud, and deep sounding bell. It has a wide sonic range with a clean mix. Playing it yields a heavy response and a very balanced feel. This is the cymbal for a bright, full, warm, deep, somewhat dry, powerful sound. The Paiste Rude Mega Power Ride Cymbal is also known as the Eclipse, and was created in conjunction with System of a Down drummer John Dolmayan.


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As they say, it's hard to define but you know it when you see it: in this case, we talk about confidence. It makes the difference in events like this — whether you see it in someone comfortable being on stage or a company comfortable with the message it's presenting, you can tell when a press conference has confidence and when it doesn't. On this first day of E3, the console war between Microsoft's Microsoft's Xbox One and Sony's Sony's PS4 was front and center. But Microsoft was trying to redefine itself, playing it safe and trying to make it through the day without becoming an object of derision. Sony, on the other hand, was just enjoying being Sony.
One of the chief criticisms of Microsoft's press conference was that the company took gamer feedback to a fault: it focused so heavily on specific games that you could have walked out of the Galen Center without knowing that the company actually made a console. It wasn't bad, so much — some of the games looked great, even if many weren't exclusives — but it was decidedly safe. There wasn't much that felt exciting coming from Microsoft, and you could sense that in the presentation as well. It was timid. That's not the worst thing in the world, but you could feel it in the room. For a company that needs to re-invigorate its console, it doesn't feel great.
Sony, on the other hand, appears to have a solid grasp on the art of the E3 press conference, especially after last year's knockout round. People like Andrew House and Adam Boyes were just strutting across the stage, enjoying the fact that they had made a hit console. They smiled and made jabs at their competition when they felt like it. It allowed Sony to stretch out a little bit, as well — Microsoft may have the reputation of being entertainment-focused, but Sony is the company that talked about their TV and social offerings. As is only appropriate, the company moved past first and third-party games to spend highlight new products and services. The show had the feeling of forward momentum.
This level of display isn't even close to what happened at the conference last year, when Sony announced DRM policies and a low price to deafening applause in the room and on the internet. But today was very much a continuation of the narrative — Sony swaggering forward, Microsoft putting itself together. There's still room for things to change as we move forward to the holiday season, but it's palpably clear where the momentum is.


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Super Long Scale Slinky Bass Sets are round-wound for maximum clarity and serious punch.These are longer to fit 35"+ scale basses. Each bass string is manufactured with the finest and freshest raw materials in the beautiful Coachella Valley of Southern California. The list of endorsers for Ernie Ball Slinky bass strings reads like a who's who of top selling artists. Gauges 45-65-85-105-130
Ernie Ball 5-string Slinky Bass Strings Super Long Scale
Item # 106509482 | Condition: Info | Customer Ratings: ( 5 Based on 1 reviews)
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Protect Your Gear
Accidental damage, normalNormal wear and power surges are no longer an issue with these comprehensive and affordable plans. We even pay to ship your gear for repairs. More details.
Covers much more than the original manufacturer's warranty:
Limit of Liability: The least of the cost of (1) authorized repairs, (2) replacement with a product of similar features, (3) reimbursement for authorized repairs or replacement or (4) the price that you paid for the product.
*Limitations and exclusions apply. See terms and conditions for program details
Ernie Ball 5-string Slinky Bass Strings Super Long Scale
Will replace defective strings.
Get your gear covered!
Now you can get added warranty protection for your new gear. Pro Coverage steps in where the manufacturer's "normal wear and tear" ends. Our PRO COVERAGE program offers you UPGRADED COVERAGE if your product ever fails!
Pro Coverage includes:
- Accidental damage protection (new gear only)
- Expedited Repair
- Free Shipping (for returns or repairs)
- 100% Coverage for Commercial Use
- Extended Return Period
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- Repair Costs Covered for up to 3 years from date of purchase
- Repairs Can Be Authorized Toll-Free by Phone or the via the web
As reviewed by on
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Great for 35" scale.As reviewed by Bruce Boeckel on 4/23/2014
I bought a 35"-scale bass because I wanted maximum snap, especially on the low B string, which is often floppy, giving a muddy tone. The point is to bring the string up to pitch over a stretch that is one inch longer than on a 34"-scale bass. The strings are more taut and have more snap. Heavy gauge strings accomplish the same goal and give more sustain because they provide more mass moving back a forth as the string vibrates. With these genuine 35"-scale, heavy-gauge Ernie Ball round-wounds, I get the full benefit of my 35"-scale bass. These strings run all the way past the nut even when mounted through the body. Another bass player noticed the difference right away. "Your bass has more growl now."1 of 1 people found this review helpful.Was this review helpful?Thank You for rating this review!
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Tags summer, party, workout, pump up
Artists Rihanna, Coldplay, Rita Ora
June 06, 2012
this is so amazing please submit to www.collegemeow.com to get it featured!
RITA ORAAAAA :D the best ever
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After-Rave Letdown by thestarsandme
A mix to help you drift into dreamland after a long night of partying, featuring tracks by Bob Dylan, Coldplay, and Grouplove.
chill, indie, alternative, sleep, afterparty
SUMMER JAMZ by thestarsandme
summer, party, workout, pump up
Stay Young - Getting Ready for a Night Out by thestarsandme
Fourteen tracks to get you pumped up for a night out with friends including tracks from Neon Trees, Kanye West, and Sex Ray Vision.
pump up, getting ready, party, jam, dance
Ten tracks to get you off your ass and to the gym, ready to get fit.
exercise, work out, pump up


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NSO Leadership
Executive Team
Sheilah P. Clay, President and CEO
Sheilah P. Clay has been the President and CEO of Neighborhood Service Organization (NSO) since 2000. This $31 million Detroit-based nonprofit human service organization provides mental health, addiction treatment, crisis intervention/suicide prevention, homelessness, early childhood education, youth leadership and workforce development and violence prevention, supportive housing development, and much more to individuals and families in Wayne and Oakland counties. Sheilah is the visionary leader who led the $52 million restoration of the former historic Michigan Bell Building into permanent supportive housing for the homeless, which is the largest project of its type in the State of Michigan.
Additionally, Sheilah was elected to the Farmington Board of Education in 2006 and now serves as its Board President. She also serves on the Board of Directors of the Federal Reserve Bank of Chicago-Detroit Branch, Opportunity Resource Fund, Michigan Nonprofit Association (immediate past President), Michigan League for Public Policy, Behavioral Health Professionals, Inc., and ConsumerLink Network. Sheilah, a graduate of the 2014 class of Leadership America, was recently elected to their national program's Leadership Women Board of Directors.
She also serves on the Advisory Board of the Community Investment Support Fund, Southeastern Michigan Public Policy Task Force, Wayne State University HIGH Program, Non-Profit Leadership Collaborative of the Michigan Harvard Business School Club, Detroit Economic Club, Community Advisory Group of the Southeast Michigan Partners Against Cancer Center, Farmington African-American Parent Network (Founder), Alpha Kappa Alpha Sorority, Inc., and Word of Faith International Christian Center.
Ms. Clay received her bachelor's degree in psychology/secondary education from Spelman College and her master's degree in Guidance and Counseling from Wayne State University College of Education. She is also a graduate of Leadership Detroit XXIV, a McGregor Fund Eugene Miller Fellow, and has completed Executive Education programs at Harvard Business School as well as Kellogg School of Management, Northwestern University.
Ms. Clay has been the recipient of numerous awards, including the 2014 Shining Light/Eleanor Josaitis Unsung Hero Award, 2014 Paul E. Bridgewater Award from the Detroit Area Agency on Aging, 2014 & 2012 Woman of Excellence from Michigan Chronicle, 2014 Farmington Multi-Cultural/Multi-Racial Community Award, Mariam C. Noland Award for Nonprofit Leadership from the Community Foundation for Southeast Michigan, 2014 Finalist in the Channel 7 Annual Detroit 20/20 Award, 2013 Woman of Vision from Plymouth Church of Christ, 2013 Community Service Award from Ebenezer A.M.E. Church, 2012 Carla Javits Award from Campaign to End Homelessness, 2012 Oakland County NAACP Hall of Fame Award, and several years in Who's Who in Black Detroit.
William E. Weld-Wallis, Chief Operating Officer
William Weld-Wallis has held leadership positions of high responsibility and high visibility throughout his 35 years in non-profit management. His focus early in his career was the re-organizing and rebuilding of organizations which had been in administrative, staffing, and public relations disarray. In more recent years he has focused upon program management. Mr. Weld-Wallis came to Neighborhood Service Organization in 1994 as the Director of Quality Assurance. He then accepted the role of Vice President of Programs before taking on responsibilities as Chief Operating Officer in 2007. He has a BA from Michigan State University and a Master's degree in Public Administration from Wayne State University. Mr. Weld-Wallis has been a Detroit resident for the past 35 years, is married and has three grown children and one grandchild. He has a history of civic involvement, mostly as a coach for various sports, and is a graduate of Leadership Detroit XIV.
Allyson S. Farquhar-Boyle, Chief Financial Officer
Allyson Farquhar-Boyle has 20-years of management experience in non-profit organizations. She worked in the corporate offices of Mercy Health Services/Trinity Health in strategic planning and finance and was involved in the development, financing, and construction of four assisted living facilities on health campuses for Trinity's long term care division. Allyson began with NSO in December, 2009 as its Chief Financial Officer after more than six years in finance at the Detroit-Wayne County Community Mental Health Agency where she was responsible for the financial operations of the Agency's managed care provider networks. She has a BA from the University of Georgia and an MBA from the University of Michigan. Allyson has been married for more than 20 years and has two teen-aged sons. She has been involved in the community as a member of the Junior League of Birmingham, has been an active participant at her sons' schools in leadership roles.
LaNeice Jones, Vice President of Programs
LaNeice Jones is the Vice President of Programs for Neighborhood Service Organization responsible for the oversight of program operations in three Units of the organization. This involves providing leadership, support and direction to the Unit Directors and Program Directors, being knowledgeable regarding the program scopes of service and guidelines and compliance expectation. Ms. Jones is a Licensed Master Level Social Worker with over 20 years of experience working in social and human service settings and specializes in crisis intervention, suicide prevention, and information and referral. She also provides critical incident stress management and debriefing. She received both her Bachelor of Sociology and Master of Social Work degrees from the University of Michigan. Ms. Jones is a member of the National Association of Crisis Center Directors Board and the Michigan Alliance of Information and Referral Systems Board. She is a member of Delta Sigma Theta Sorority, Inc. She enjoys reading, spending time with family and friends, and providing public service through a variety of community programs and projects.
Dr. Richard Marcolini, M.D., Medical Director
Dr. Marcolini is a Fellow, board certified psychiatrist. He is also board certified in geriatric psychology. He is a graduate of the Michigan Psychoanalytic Institute, an adjunct faculty member at the Michigan School for Professional Psychology and has been an instructor at Wayne State University School of Medicine and Departments of Psychiatry and Family Medicine. He also conducts a private practice and has hospital privileges at Harper, Sinai-Grace and Detroit Receiving hospitals.
Board Members - Officers
Ray C Johnson, Chair
Ray Johnson founded and assisted in the development of schools across the country. He has been a pioneer in the realm of character education, accelerated learning, multicultural and African-Centered curriculum through his groundbreaking, site-based management. He has elevated parental and community involvement to record-breaking levels. Due to his unique ability to engage the reluctant learner and raise student achievement, he has earned the distinction of being one of the country's top educational consultants.
Armed with the mission of providing world-class education for all children, he has worked with countless school districts, universities, and government agencies reaching to develop and empower thousands through his many seminars in curriculum development, organizational psychology, and student motivation. In an effort to bolster self-esteem and foster values, Johnson formed two organizations: Man-to-Man and S.E.L.F. (Sisters Empowered through Love and Friendship) mentoring programs targeting boys and girls ages four through 21.
Johnson's numerous awards include Eastern Michigan's Meritorious Civil Rights Award, Masons' International "Man of the Year" Award, Detroit Institute of Commerce's Excellence in Community Service Award, National Head Start's Outstanding Contributor's to Education Award, the Ameritech Outstanding Educator's Award, the Detroit City Council's Spirit of Detroit Award and other outstanding acknowledgements.
Richard L. Lichtenstein, Ph.D., First Vice Chair
Richard Lichtenstein, Ph.D., is an Associate Professor of Health Management and Policy at the University of Michigan School of Public Health. He received both his M.P.H. and Ph.D. from the University of Michigan in medical care organization, and a B.S. from Cornell University in industrial and labor relations.
Dr. Lichtenstein's research interests include: Community-Based Participatory Research; Racial and ethnic disparities in health; Barriers to health insurance coverage for low-income children; The effects of discrimination on access to health care; and, efforts to increase diversity in the health workforce.
Dr. Lichtenstein is the director of the University of Michigan Summer Enrichment Program in Health Management, an internship program for undergraduate students interested in eliminating health disparities. He is also the director of the University of Michigan Training Site for the Kellogg Health Scholars Program, Community Track. Dr. Lichtenstein is involved in the governance of two Voluntary Employee Beneficiary Associations (VEBAs), which provide health benefits to groups of retirees. Dr. Lichtenstein formerly was Associate Dean for Academic Affairs at the University of Michigan School of Public Health.
Linda Alexander, Second Vice Chair
Linda Alexander BSN, MBA, RN is currently the Administrative Director for Post-Acute Continuum and Physician Services at the Rehabilitation Institute of Michigan, part of the Detroit Medical Center. She also serves as one of the key drivers preparing the DMC for the new Healthcare Reform era.
Linda has more than 15 years in nursing and hospital administration, with an emphasis on operational efficiency, strategic planning, care management and quality/performance improvement. She is a registered nurse, with a Bachelor's of Science in Nursing from the University of Detroit-Mercy and a Master's of Business Administration-Organizational Development from Wayne State University in Detroit.
Using her clinical background as a critical care nurse and business acumen, Linda has also served as a National Healthcare Consultant, advising acute care hospital executives on solutions that drive operational optimization.
Linda is certified in Lean Performance Improvement and serves on various community boards for non-profit organizations and is a member of the Re-hospitalization Reduction Task Force for MPRO-Michigan's federally designated Quality Improvement Organization for CMS (Center for Medicare & Medicaid Services). She has participated in the Detroit Medical Center: Leadership Academy II, Advisory Board's Nursing Leadership Academy and Detroit Regional Chamber's Leadership Detroit, class XXIX.
She actively participates in various professional organizations, including Sigma Theta Tau Honor Society of Nursing, Delta Sigma Theta, Inc., a public service sorority, Healthcare Financial Management Associates, and American College of Healthcare Executives.
Gregory Terrell, C.P.A., Treasurer
Gregory Terrell is managing director and founder of Gregory Terrell & Company, a certified public accounting firm in Detroit. His firm launched in 1983 and provides professional services in accounting, auditing, tax and consulting to nonprofit organizations, government agencies, small businesses and individual taxpayers. Mr. Terrell's professional experience spans more than 30 years and includes positions as an audit manager with an international CPA firm and manager of accounting policy and research with a Fortune 500 company.
Mr. Terrell currently serves on the Board of Water Commissioners of the Detroit Water and Sewerage Department and is board treasurer of Lula Belle Stewart Center. He also is a member of the American Institute of Certified Public Accountants, Michigan Association of Certified Public Accountants, and National Association of Black Accountants, receiving numerous awards for his contributions to professional and civic organizations.
The Dillard University graduate and Detroit native is married and has two children.
Mark A. Ostach, Secretary
Mark is the Founder & CEO of mymentalspace.com, a company that helps people prevent Internet addiction. A winner of Detroit Crain's Business 20 in their 20's, Mark is interested in studying behavioral trends on the Web and evaluating the role technology plays in everyday life. Mark is focusing on innovate ways to help schools & employers create programs and policies to manage technology use in today's digital classroom. Frequently speaking at social media conferences and schools, Mark aspires to educate people on how technology can impact your emotional well-being.
Since 2007, Mark has also been Chief Operating Officer at Digerati, Inc., a software company that evaluates business processes, human resources, and technology systems. There he is responsible for the development of the company's Project Management Office and staff augmentation.
Within the community, Mark participates in a number of organizations, including being on the board of directors for Digerati, Inc. and Neighborhood Service Organization; a non-profit serving the Detroit mental health community. Additionally, Mark is an alumni and on the board of trustees for Leadership Detroit. Mark earned both a Bachelor of Arts degree in Psychology, with a concentration in Neuroscience, and a Bachelor of Arts degree in Economics & Management from Albion College. He also obtained a Master of Science in Information Systems with a specialization in Project Management from Walsh College. Originally from Farmington Hills, Mich., Mark now resides in Royal Oak.
Board Members - Directors
Harvey "Chip" Amoe, III, Assistant Director, Legislative Network, Henry Ford Health System
Marsha A. Brogdon, Principal Consultant, Robinson Realty Group
Marvin T. Cato
Karen Noelle Clark, Ph.D., Licensed Psychologist, Clark & Associates Psychological Services, P.C.
Robin M. Cole, President & CEO, Professional Medical Center
Lois T. Collins, Esq., Owner, collinslegal©
George P. Gaerig, Operations Manager, Capuchin Soup Kitchen
Thomas S. Goddeeris, Executive Director, Grandmont/Rosedale Development Corporation
Rev. Georgia A. Hill, D.Min., Associated Minister, Plymouth United Church of Christ
Barbara Jean Johnson, Ph.D., Cheif Operating Officer, Tireman Banquet & Conference Center
Robert P. Jones, Director of External Affairs, AT&T
Alger P. LaHood, Owner and Founder, LaHood Realty
Mildred C. Matlock, Ph.D., Retired
Doneen McDowell, Executive Director, Global/GMNA Manufacturing Engineering - Vehical Systems
Reginald K. Pelzer, C.P.A., Director, Accounting Operations, DTE Energy Company
David Rudolph, Founder and Senior Partner, E. Ericson & Associates Public Relations
Charles Russell Simmons
Diane Slon, Vice President of Corporate Informatics, United Physicians, Inc.
Herbert C. Smitherman, Jr., M.D., M.P.H., F.A.C.P., President & CEO, Health Centers Detroit
Thomas P. Tuskey, Capital Program Manager, Detroit Regional Convention Facility Authority
Boyd White, III, Esq., Associate, Dykema


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2012 Junior PGA Championship Monday
(28 images)
A gallery of images from the 37th Junior PGA Championship, played July 31-Aug. 3 at Sycamore Hills Golf Club in Fort Wayne, Ind.
View as:
2012 Junior PGA Championship
The male Junior PGA Championship competitors poses with Davis Love III during the welcome reception.
Credit: The PGA of America/Montana Pritchard
Date: Jul 31, 2012
©2003-2013 PGA/Turner Sports Interactive. All rights reserved.
PGA.COM is part of Bleacher Report - Turner Sports Network, part of the Turner Sports and Entertainment Network.


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Alaska State Troopers report that a Juneau man attempted to shoot a bear that was endangering several children, but he failed to notify authorities that he took the bear or that a wounded bear may still be on the loose in a residential neighborhood.
Roger R. Sheakley, 63, tried to shoot the black bear with a bow and arrow from his residence on Kanat'a Deyi Street in the Mendenhall Valley on or before July 10th, according to Troopers. As the bear was reported to be in his family's yard, Sheakley's action were considered to be in defense of life or property. Sheakley was uncertain if he had actually taken the bear, but Troopers say that he did not report that a possibly wounded bear was still in the area.
Alaska Department of Fish and Game biologists later heard about the bear from concerned neighbors. A search by biologists and Troopers turned up bear sign and garbage, but not the bear itself.


text:
The LP LP480 Cabasa uses a tough nylon fiber to create a rugged version of what used to be an easily breakable percussion instrument. Unlike traditional coconut cabasas the LP nylon cabasa is durable enough for years of use.
The LP cabasa's flexible net and bright shell yield a much livelier sound and greater dynamic range than the original cabasa, but retain authentic playing feel.
LP LP480 Traditional Cabasa
Item # 440548 | Condition: Info
- Store
- Availability
Usually arrives in 3-5 Days
3 on hand
Protect Your Gear
Accidental damage, normalNormal wear and power surges are no longer an issue with these comprehensive and affordable plans. We even pay to ship your gear for repairs. More details.
Covers much more than the original manufacturer's warranty:
Limit of Liability: The least of the cost of (1) authorized repairs, (2) replacement with a product of similar features, (3) reimbursement for authorized repairs or replacement or (4) the price that you paid for the product.
*Limitations and exclusions apply. See terms and conditions for program details
The LP LP480 Cabasa uses a tough nylon fiber to create a rugged version of what used to be an easily breakable percussion instrument. Unlike traditional coconut cabasas the LP nylon cabasa is durable enough for years of use.
LP LP480 Traditional Cabasa
Heads - no warranty or guarantee.
Natural wood products - no warranty.
Bags and cases - 90 day warranty.
RhythMix - one year warranty, with the exception of heads.
LP wood or fiberglass shells, timbale shells, stands and hardware, hardware (rims, etc.) - 3 year warranty.
All other products - one year warranty.
Warranty terms vary. Check with manufacturer for specific product warranty.
Get your gear covered!
Now you can get added warranty protection for your new gear. Pro Coverage steps in where the manufacturer's "normal wear and tear" ends. Our PRO COVERAGE program offers you UPGRADED COVERAGE if your product ever fails!
Pro Coverage includes:
- Accidental damage protection (new gear only)
- Expedited Repair
- Free Shipping (for returns or repairs)
- 100% Coverage for Commercial Use
- Extended Return Period
- Extended Price Protection
- No Lemon Guarantee
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How To Read A Prospectus - Distributions, Fees And Management
Distribution Policy
The distributions a fund pays its investors come from realized capital gains, dividends, interest or other income stemming from the securities and investing activities of the fund. The distribution policy tells you how these payments are made. Some funds distribute returns directly to unitholders, while others reinvest the distributions back into the fund, buying more units for fundholders.
Whether these distributions are paid in cash or reinvested, unitholders have to pay taxes on them. If you are concerned about taxes, there are tax-managed funds that limit income and capital gain distributions. These tax-managed funds allow you to ensure that you maximize the use of your tax-sheltered options, such as your 401(k) or IRA.
Fees and Expenses
This section is extremely important to consider, because fees and expenses will eat into your total investment return from the fund. Here you will find information on any back or front-end loads, 12B-1 fees and the management expense ratio. Because these compromise your return regardless of the fund's performance, it is rarely optimal to invest in funds with loads.
Fund Management
Here you can discover how long your fund manager has been managing your fund. Watch out for the fund that has been in operation significantly longer than the fund manager has been managing it. The performance of such a fund can be credited not to the present manager, but to the previous ones. If the current manager has been managing the fund for only a short period of time, look into his or her past performance with other funds with similar investment goals and strategies. You can then get a better gauge of his or her talent and investment style.
After reading the sections of the prospectus outlined above, you will have a good idea of how the fund functions and what risks it may pose. Most importantly, you'll be able to determine whether it is right for you. If you need more information beyond what the prospectus provides, you can consult the fund's annual report, which is available directly from the fund company or through a financial professional.


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|Unified network performance management improves end-to-end mobile service QoE by reducing service outages and degradations
Traditionally, mobile carriers have tried to manage the evolution of mobile network domains by extending or upgrading their existing network performance management toolsets — a strategy that has struggled to remain sustainable due to increasing data volumes and the complex technological ecosystem of today's dynamic mobile networks.
3G, LTE Voice over LTE (VoLTE), small cells, Mobile Core, IP/MPLS, Carrier Ethernet, VAS and other existing technologies demands a robust network performance management platform equipped with solutions that provide engineers and operations teams with the intelligence and topology awareness they need to collectively manage quality of service (QoS) and quality of experience (QoE) expectations.
With comprehensive insights into the Radio Access Network (RAN), the backhaul network and the core network (including all IP and Ethernet elements) pertinent voice core elements, mobile network operators can troubleshoot problems more proactively, efficiently plan for future traffic needs and deliver highly reliable services in shorter time frames.
InfoVista's E2E network performance management platform and solutions ensure the performance and quality of mobile services across the multi-generation 2G/3G and 4G RAN, data core, voice core and IP/Ethernet mobile backhaul by providing:
Use Cases:
Cross-domain, holistic mobile network performance visibility across the IP/Ethernet transport infrastructure and adjacent data core, voice core and radio access networks
Physical and logical network performance visibility provides engineering teams with the ability to monitor, verify and drill down from device to interface to logical services delivered across RAN, Ethernet mobile backhaul and IP core networks
Common network performance repository and self-service reporting for network operations
Superior NOC troubleshooting with expedited access to cross-domain technology and vendor performance indicators from a common database through Web 2.0 self-service reporting dashboards
Actual and forecasted mobile and IP traffic analytics to accurately measure and visualize current and forecasted traffic and network utilization across all domains and all vendors


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An adapter for holding a silicon wafer in an inverted position of a probe station to allow backside emission testing is described. The wafer is positioned in a carrier having an opening therethrough for backside emission testing while the wafer is energized and probed beneath the carrier. A special probe card holder is provided with a self-leveling feature by means of a leveling frame on the probe card holder cooperating with the wafer carrier.
1. Apparatus for inspecting an inverted silicon wafer for backside emissions in an emission imaging probe station of the type having a platform defining a first reference surface, a movable stage having a chuck support with control means to change its position with respect to the platform, and emission imaging devices disposed above the platform, said silica wafer having devices thereon and having a front side whereon said devices may be probed and a back side opposite the front side, the apparatus comprising:
a backside emission adapter including a frame arranged to be supported on the chuck support, a leveling member supported in said frame by first adjustment means, and a wafer carrier disposed in said leveling member, said wafer carrier having a second reference surface and adapted to hold a silicon wafer in an inverted position with the front side facing downwardly and back side facing upwardly, said wafer carrier defining at least one opening exposing the backside of the wafer to said emission imaging devices,
probe means disposed on said platform first reference surface, and adapted to probe and energize at least one of said devices from beneath on the front side of the silicon wafer, and
a video camera having a viewing tube extending therefrom to a point beneath the silicon wafer to a location proximal to said energized device on the front side of the silicon wafer, the viewing tube having means to illuminate the energized device and optics for directing reflected illumination to the video camera.
2. Apparatus according to claim 1, wherein the probe means comprises a probe card holder, including a base structure arranged to be supported on the platform first reference surface, a leveling frame supported on the base structure, said leveling frame having a third reference surface and having second adjustment means for adjusting the position of the third reference surface of the leveling frame with respect to the base structure, and a clamping mechanism for holding a probe card in a planar relationship with respect to the third reference surface.
3. Apparatus according to claim 2, including fine adjustment means for adjusting the third reference surface with respect to the second reference surface, so as to compensate for probe card irregularities.
4. The apparatus according to claim 2, wherein the probe card holder base structure comprises a pair of platform bases each adapted for vacuum attachment to the probe-station platform reference surface, each of said pair of platform bases arranged to hold the leveling frame in an adjustable spring biased mounting.
5. The apparatus according to claim 2, wherein the leveling frame includes a pair of side rails spaced to receive a probe card, the side rails having means defining said third reference surface thereon.
6. The apparatus according to claim 2, wherein said clamping mechanism includes a manually actuatable clamp on a said side rail for clamping an edge of a probe card to the side rail adjacent the third reference surface.
7. Apparatus according to claim 1, including means for locking the leveling frame with respect to the base structure when the second and third reference surfaces are in contact, so as to provide self-leveling of the probe card holder with respect to the wafer carrier.
8. Apparatus according to claim 1, wherein the probe means comprises at least one probe manipulator and having a probe and probe holder arranged to probe the underside of said inverted silicon wafer.
9. The apparatus according to claim 1, wherein said first leveling member is a leveling ring adapted to receive the wafer carrier and wherein the first adjustment means comprises three circumferentially spaced screws adapted to adjust the position of the leveling ring in said adapter frame.
10. The apparatus according to claim 1, including a safety ring having a circumferential lip adapted to extend over the outer edge of a silicon wafer and adapted to fit over the wafer carrier, so as to retain the wafer on the carrier.
11. The apparatus according to claim 1, wherein said opening is located and dimensioned so as to permit selection of any device under test to be positioned under the opening by rotation of the wafer with respect to the wafer carrier, while the wafer is substantially fully supported on the wafer carrier.
This invention relates generally to inspection of integrated circuit devices on a silicon wafer in a probe station, and more particularly to an adapter and probe card holder for energizing and probing a silicon wafer in an inverted position for analysis of backside emissions.
Probe stations are well known as a means for wafer probing and failure analysis investigations of a device under test (DUT) on a silicon wafer. A probe station generally involves a platform for mounting probing apparatus such as a probe card or probe holders, a moveable chuck for holding the wafer with x, y, z and theta stages for positioning the chuck, and an optic system with video imaging and integrated system software to monitor the progress of the probing and failure analysis on a computer screen. Normally, probing of the device is done from above on the top side of the wafer which faces upwardly, while its opposite (or backside) faces downwardly.
One type of analysis involves energizing the DUT in order to observe infrared emissions from a defect, consisting of overlaying an illuminated device image showing device details with another image of infrared emissions from the energized device. The images are superimposed to determine the location of the defect. Difficulties are encountered with this type of analysis after several layers have been added to the silicon substrate. This problem has led to a similar analysis known as backside emission inspection. Under this procedure, the silicon wafer is inspected from the backside of the wafer, usually in an inverted position. The back of the wafer is first treated to reduce its thickness at the location to be inspected and the backside is illuminated at special frequencies and using special sensors to observe emissions from the backside of the energized device. The precise equipment necessary to illuminate and detect backside emissions is not the subject of the present invention.
The present invention involves the use of a conventional probe station in order to adapt it for backside emission inspection, and probing from the underside of a silicon wafer held in an inverted position, together with various features necessary for backside emission inspection.
Existing apparatus for backside emission testing has required unacceptably long set-up times to adapt and calibrate the probe station to enable probing from the underside of the silicon wafer and to energize the DUT. The probed surface must be planar with respect to the plane of motion of the probing apparatus, (or with respect to the probe card). It would be desirable to have an adapter which is readily and quickly set up for backside emission inspection, and which also can be utilized in a standard probe station, rather than requiring a special probe station.
Accordingly, one object of the present invention is to provide an improved apparatus for inspecting an inverted silicon wafer for backside emissions in a probe station.
Another object of the invention is to provide an improved adapter for holding a silicon wafer in an inverted position in a standard probe station for backside emission testing, together with probing means to energize the wafer from the underside thereof.
Another object of the invention is to provide an adapter for backside emission testing of a silicon wafer with means to establish planarity of the inverted silicon wafer surface with respect to a probe card, by self-leveling of the probe card holder.
Briefly stated, the invention comprises apparatus for inspecting an inverted silicon wafer having devices thereon for backside emissions using an emission imaging system and a probe station of the type having a platform defining a first reference surface, a movable stage having a chuck support with control means to change its position with respect to the platform, and emission imaging devices disposed above the platform. The apparatus of the invention comprises a backside emission adapter including a frame arranged to be supported on the chuck (or chuck support), a leveling ring supported in the frame by first adjustment means, and a wafer carrier disposed in said leveling ring. The wafer carrier has a downwardly facing, second reference surface and is adapted to hold a silicon wafer against the second reference surface in an inverted position. The wafer carrier has at least one opening exposing the backside of the wafer to the emission imaging devices. Probe means are held on the platform reference surface, and adapted to probe and energize at least one of said devices from beneath the silicon wafer. A video camera is also supported on the platform reference surface, having a viewing tube extending to a point beneath the silicon wafer to a location proximal to said energized device, the viewing tube having means to illuminate the energized device and optics for directing reflected illumination to the video camera.
Preferably the probe means comprises a probe card holder, including a base structure arranged to be supported on the platform reference surface, a leveling frame supported on the base structure, the leveling frame having an upwardly facing third reference surface and having second adjustment means for adjusting the position of the third reference surface of the leveling frame with respect to the base structure, and a clamping mechanism for holding a probe card in a planar relationship with respect to the third reference surface.
Various other features include a safety ring for the silicon wafer, clamps for holding the wafer carrier in the leveling ring, three-screw spring loaded support for the first adjustment means, a spring loaded clamp for the second adjustment means, and a simplified clamping mechanism for holding the probe card.
These and many other objects of the invention will become apparent by reference to the following description, taken in connection with the accompanying drawings, in which:
FIG. 1 is a front elevation view of a standard probe station equipped with conventional DUT viewing optics together with a probe card holder and adapter according to the present invention,
FIG. 2 is a top plan view of the probe station of FIG. 1,
FIG. 3 is a side elevation view of the probe station of FIG. 1, showing a part of backside emission optics,
FIG. 4 is a front elevation view of the same probe station, illustrating the adapter with a single probe manipulator instead of a probe card holder and also illustrating the video camera apparatus,
FIG. 5 is an exploded perspective view of the adapter and wafer carrier illustrating the wafer in inverted position, rotated 90° from FIG. 1,
FIG. 6 is a top plan view of the wafer carrier before it is inverted and placed in the leveling ring,
FIG. 7 is a top plan view of a probe card holder according to the present invention, showing a probe card in place,
FIG. 8 is a side elevational view of the probe card holder of FIG. 7, without probe card,
FIG. 9 is an end elevational view of the probe card holder of FIG. 7, without probe card,
FIG. 10 is a view in cross section of the spring loaded, self-leveling adjustment of the probe card holder, taken along lines X--X of FIG. 7,
FIG. 11 is an elevation view in cross section taken along lines XI--XI of FIG. 7,
FIG. 12 is a top plan view of the video camera illuminating and optics configuration on the end of the camera viewing tube seen in FIG. 4,
FIG. 13 is a side elevational view of the FIG. 12 illuminator and optics illustrating the method of operation, and
FIG. 14 is a simplified diagrammatic view illustrating the self-leveling method of establishing planarity of the probe card holder with respect to the wafer carrier.
Referring now to FIG. 1 of the drawing, a standard probe station is illustrated in front elevation view, with accompanying plan view in FIG. 2 and side elevational view in FIG. 3. The probe station is illustrated generally at 10 and may, for example, comprise a model MP-2000 semi-automatic analytical probe station designed for semi-automatic wafer probing and failure analysis applications involving sub-micron geometries as manufactured and sold by Wentworth Laboratories, the assignee of the present invention. A manual probe station may also be used. The probe station comprises a stationary base 12 supporting a platform 14 on pedestals, one of which is seen at 16. Platform 14 is arranged to provide a motorized vertical (z) travel of 11/2 inches. An x-y positioning stage 18 serves to mount a chuck support 20 and to provide an additional minimum z travel of 0.2 inches. Chuck support 20 is positionable in the x-y direction with a resolution of 0.1 microns. The platform 14 is provided with a top planar first reference surface 14a and the top of the chuck support 20 is provided with a support surface 20a factory calibrated to maintain planarity during x-y movement in planes parallel to the first reference surface 14a.
The probe station is equipped with conventional DUT viewing optics 22, a vacuum holding system, vibration isolation and requires a computer to control stage movement and to operate live on-screen video of the probing operation.
While the details of the emission imaging system are not material to the present invention, a brief description follows of the emission imaging system, a partial view of which is shown generally by reference numeral 23 in FIG. 3, to be disposed above the platform. The emission imaging devices include an illuminating system at a wave length of approximately 1070 nanometers at which silicon is semi-transparent. This system produces an illuminated image of the backside semi-conductor metalization on the wafer. In addition, the emission imaging devices include one or more IR sensors designed to detect "hot spots" when the DUT is energized by suitable probes and associated electronics. The emission image showing the defect is superimposed with the illuminated (reflected) image. Suitable equipment for backside illumination and emission inspection is commercially available from Hypervision, Inc. and other manufacturers.
In accordance with the present invention, probe station 10 is equipped with a backside emission adapter shown generally at 24, arranged to be supported on the reference surface 20a of chuck support 20. The adapter could also be supported directly on the chuck or could be incorporated into and/or fixedly attached to the chuck support. The backside emission adapter (referred to hereinafter as BEA or "adapter") serves to support the wafer carrier and wafer in an inverted position, following the movements of chuck support 20. The term "inverted position" is opposed to the conventional probing arrangement wherein the silicon wafer is held on top of a wafer carrier with the probes above the DUT. Reference to the exploded perspective view of FIG. 5 and FIG. 6, the BEA 24 will be explained in detail.
Referring to FIG. 5, BEA 24 includes a frame shown generally at 26 having a circular base 30 adapted to fit on the chuck support 20, a pedestal 31 (see FIG. 14) supporting a bridge member 32 and a ring support 34, with extending portions 36. Ring support 34 is held spaced from bridge 32 by means of legs 38 beneath the extensions 36.
Disposed within the opening of ring support 34 is a leveling ring 40 which, in turn, has a depending circumferential lip 42. Support lip 42 serves to support a wafer carrier shown generally at 46. The underside of wafer carrier 46 (see FIG. 6) defines a downwardly facing, circular surface 48 (second reference surface) for supporting a silicon wafer 50 of the same diameter. A safety ring 52 slips over the circumferential edge of wafer 50 and edge of wafer carrier 46 so that both fit within the leveling ring 40. Leveling ring 40 further includes rotatable bars 54, which lock the wafer carrier 46 in the ring 40.
In accordance with one aspect of the present invention, the wafer carrier 46 defines carefully positioned openings 56, 58 which are arranged so that the backside of any device on wafer 50 may be exposed through one of the openings 56, 58 by rotatably positioning the wafer. Wafer 50 may be prepared by thinning at the location of the DUT with a milling machine as shown by area 60. The thinned wafer is extremely fragile at this location and is fully supported by wafer carrier 46 around the openings 56, 58. A vacuum hose 62 is connected to wafer carrier 46 to retain the wafer to the surface 48, and may be conveniently turned off and on at this point by a control knob 63.
While the wafer carrier 46 with openings 56, 58 is a preferred carrier because of the full support of the fragile wafer, it is possible to use an adapter as described with a wafer carrier which is completely open and only supports the wafer at the circumferential edge. This is less desirable because it is more likely to result in inadvertent and irretrievable damage of an expensive wafer.
Referring to FIG. 6 of the drawing, the underside or working surface 48 of carrier 46 is shown to include conventional grooves 64 providing uniform vacuum passages to securely hold the silicon wafer to surface 48.
Referring again to FIG. 5, the leveling ring includes means to adjust the position of wafer carrier 46, specifically its surface 48, with respect to the chuck support plane of motion. Three adjustment screws 66, 68, 70 with adjacent locking set screws 67, 69, 71 are provided to adjust the plane of the leveling ring and with it the wafer carrier 46 and wafer support surface 48 in a known manner by adjusting the screws until an indicator probe mounted on the platform 14 indicates that surface 48 is moving in a plane parallel to the platform reference plane.
Lastly, the leveling ring also includes four internally threaded holes, one of which is indicated at 72. Holes 72 are located at the vertices of a rectangle for a purpose to be explained in conjunction with the probe card holder.
As seen in FIGS. 1-3, the backside emission adapter (BEA) 24 may be used in conjunction with a probe card holder (PCH) 25. PCH 25 will now be described in detail by reference to FIGS. 7-11 of the drawing. PCH 25 comprises three parts, a leveling frame 74 and a pair of platform bases 76, 78, which support the leveling frame. Leveling frame 74, in turn, includes a pair of side rails 80, 82 attached to cross members 84, 86. Base 70 includes a flat plate 88 with its underside adapted for vacuum attachment to the platform surface 14a, using hose connection and control knob shown at 79. Base 76 is similarly adapted for vacuum attachment with hose fitting and control knob 77. Other equivalent means of attachment to platform surface 14a include magnetic means or attachments.
The details of the spring loaded support and adjustment are discussed in connection with base 78. An upright cross piece 90 is attached by screws to plate 88, and a spring loaded support cross piece 92 attached to cross piece 90 supports the cross member 86 of the leveling frame. Base 78 is similarly constructed.
In order to see the details of the spring loaded adjustment and support for one end of the leveling frame, see FIG. 10 which is a cross section taken along lines X--X of FIG. 7. As shown in FIG. 10, a screw 94 extends through an open ended slot 96 in the end of cross member 86, and through a hole in cross member 92. Member 92 is sidably mounted by screw 100 against a compression spring 98. Member 92 may be clamped against member 90 by means of a screw 100. This arrangement allows for removal of the leveling frame 74 from platform base 78 by loosening screw 94 and utilizing slot 96. Secondly, the member 92 is vertically adjustable with respect to plate 88 by means of spring 98 and the clamping screw 100 when the proper position is achieved.
The tops of rails 80, 82 are provided with raised leveling surfaces 102, 104 with carefully machined upper surfaces (or third reference surfaces) to be used in conjunction with the self-leveling feature for calibration and adjustment of planarity of the probe card holder 25. A typical probe card 106 is shown with opposite edges positioned along and beneath the edges of surfaces 102, 104. As is well known in the art, probe card 106 includes probing needles 108 electrically connected to corresponding leads 110 on the probe card surface. Although normal probing is done with the tips of the needles pointed downwardly toward the DUT, in the case of backside emission inspection, the probing needles are directed upwardly toward the device on the inverted silicon wafer.
Probe card 106 is held by special clamping devices 112, 114 mounted on the respective rails 80, 82. Reference to the detail view of FIG. 11 illustrates the construction of clamp 112. An angled clamping member 116 is pivotably mounted on a pin 118. A threaded member 120 with a conical section 122 may be screwed into the rail 80 by manually rotating the knob 124. The conical section acts as a wedge and causes clamp 116 to pivot about pin 118, so as to clamp the probe card 106 against the lower side of the leveling surface plate 102. In this manner, the upper surface of probe card 106 is substantially parallel to the upper surface of plate 102.
Although the invention is especially useful when used in conjunction with the probe card holder 25, reference to FIG. 4 of the drawing shows the probe station 10 as previously described but omitting the details of the DUT viewing optics 22 and the backside emission imaging device 23, it being understood that these will be the same as in FIGS. 1-3. The identical elements of probe station 10 shown in FIGS. 1-3 are indicated by the same reference numerals in FIG. 4. Also the BEA 24 is illustrated and constructed in the same manner as previously described above.
Instead of the probe card holder 25, shown in FIG. 1, a conventional probe manipulator 126 is shown incorporating a probe holder 128 positioned to probe upwardly against the inverted silicon wafer held in the BEA wafer carrier previously described. Several such manipulators 126 may be employed in order to probe and energize the wafer for backside emission inspection. A suitable manipulator is the HOP 2000 manipulator manufactured by Wentworth Laboratories. Also illustrated in FIG. 4 is a video camera 130 with extension viewing tube 132. Viewing tube 132 is equipped at its terminating end with illumination, prism and optics in a manner which will be described in detail later but not shown in FIG. 4. Also, the same video camera 130 and extension viewing tube 132 will be employed in the system shown in FIGS. 1-3, but is not shown in those figures in order to avoid complicating the drawing. However, it will be understood that camera 130 and viewing tube 132 are normally employed as an integral part of the backside emission inspection system.
The camera system includes a conventional video camera 130 with viewing tube 132 disposed on a mounting 134 permitting its rotation about an axis. Mounting 134 is supported on a base plate 136, which is adapted for vacuum attachment to platform surface 14a, and having a vacuum control knob as before.
Details of the terminating end of viewing tube 132 are seen in plan view of FIG. 12 and elevation view of FIG. 13. An optical element (lens) 138 and prism 140 direct a viewed image on the underside of wafer 50 toward video camera 130. The wafer inspection point is illuminated by angled LED's 142, 144, 146 disposed about the prism exit point and directed toward the wafer. The image thus illuminated and viewed is rotated and adjusted by the appropriate software in the computer to compensate for the fact that probing is taking place in the reverse direction from that conventionally done.
As shown in FIGS. 1, 2 and 3, the probe card holder 25 is used in conjunction with the backside emission adapter 24. The backside emission adapter 24 supports the wafer carrier 46 (FIG. 5) from the chuck support surface as best seen in FIG. 1. The side rails 80, 82 of the leveling frame of PCH 25 pass through the space between bridge 32 and ring support 34 of BEA 24.
A clearer view of the calibrating operation is illustrated in the simplified cross sectional view of FIG. 14. There, the platform 14 with reference surface 14a and the chuck support 20 with support surface 20a are shown in phantom lines. BEA 24 rests on the chuck and carrier ring 46 (without the silicon wafer or safety ring) is shown after it has been leveled with the first adjustment means of the leveling ring. The adjustment places the second reference surface 48 on the wafer carrier to move in a plane parallel with the plane of the platform reference surface.
The probe card holder 25 comprises the mounting base member 76, 78 vacuum clamped to the reference surface 14a of platform 14 and supporting the leveling frame 74. The clamping screws 100 are loosened so that frame 74 is movable with respect to mounting plate 76, 78 on the biasing springs. Chuck support 20 is lowered until the upwardly facing leveling surfaces 102, 104 (third reference surface) contact the downwardly facing wafer carrier reference surface 48 (second reference surface). Then screws 100 are tightened to clamp the leveling frame 74. In this manner, the plane containing leveling surfaces 102, 104 is co-planar with the silicon support surface 48. This is the self-leveling feature of the invention and is easily and quickly accomplished.
Calibration in the aforesaid manner of the probe card holder with the backside emission adapter takes place as described above. Next, the clamps 54 are rotated to allow removal of the wafer carrier ring 46, which is turned over as shown in FIG. 6, the wafer 50 and safety ring 52 applied, vacuum is applied and then the carrier is turned back over and placed in the leveling ring and clamped in place. The wafer is located so that the DUT is below one of the windows 56, 58 in the carrier, while the rest of the wafer is supported around the windows. The DUT is energized and probed, either using the probe card 106 in probe card holder 25 or probe manipulators 126 as desired. Backside emission inspections are carried out, while probing is monitored and controlled by chuck movements with the assistance of the video camera imaging system previously described.
As mentioned in connection with FIG. 2, threaded holes 72 are provided laid out in a rectangular pattern. These correspond to the spacing of rails 80, 82. In the case of irregular probe cards, further fine adjustment is possible by employing holes 72, together with leveling screws two of which are seen at 148, 150. These are employed after a probe card is in place and a silicon wafer is supported in the wafer carrier 46. Screws 100 clamping the leveling frame may be loosened, and screws 148, 150 manipulated while observing imaging during actual probing to fine tune the planarity of the actual probe needle points with the silicon rather than depending upon planarity of the probe card and silicon supporting surfaces. Then screws 100 are re-tightened and probing commenced for backside emission inspection.
While there has been described what is considered to be the preferred embodiment of the invention, other modifications will occur to those skilled in the art. It is desired to secure in the appended claims all such modifications as fall within the true spirit and scope of the invention.
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text: Navy edging is hand applied to each sheet, sized 5.75" x 7.75". You select white or ivory stock and typestyle. Set of 25 sheets & envelopes. Your imprint is featured in the raised ink color of your choice. Two line return address on envelopes available. Typestyles are upper-lowercase and sized only as shown. Positioning only as shown.


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Archaeological dig begins at Head of Tide Park in Topsham
TOPSHAM — An archaeology team began digging into the earth around Head of Tide Park on Monday to see what mysteries of human civilization they can unravel at the historic site on the Cathance River.
Eric Lahti, a licensed Maine guide archaeologist, is working on the project with students from the Cathance River Education Alliance's Environmental Youth Leadership Initiative.
"We're working on what appears to be the footprint of a house, or some kind of a structure," Lahti said, adding that the team had so far found a lot of 19th century glazed ceramics, many bricks and some iron.
Lahti said he hoped to find artifacts dating back to the beginning of European American history on the site, which goes back three centuries, and also evidence of a prior American Indian presence.
"I'm sure, based on my experience, that a location like this, with the falls at the head of tide, that there would have been Native American activity here," said Lahti, who does survey work part time for the Maine Historic Preservation Commission. "But it's been industrialized, bulldozed, rebuilt, rescraped. I think there's very little natural surface left here. If we find it it's going to be in very little small pockets or in soil that's been redeposited."
The project, which includes about 15 students from Morse, Brunswick and Mt. Ararat high schools, is scheduled to conclude next week.
The dig is a service learning initiative being funded through part of a $52,000 State Farm grant. The approximately $5,000 being spent covers the hiring of Lahti and a small stipend for the students, some of whom are also volunteering their time, according to Rick Wilson, executive director of the education alliance.
"It's great," Wilson said. "It's been a really cool experience. The kids are into it."
Aside from finding nothing but a thumbtack – with her thumb – in the first two holes she dug, Brunswick High student Audrey Cross said that she and Haley Postin of Mt. Ararat High were now finding a lot of brick and pottery, as well as iron materials and window glass.
Wilson said the project "brings a larger story of the Head of Tide Park, and tells that story. That's the most powerful thing to me, is here you have this park, that's going to be a park of the public's enjoyment, and it's nice to be able to add to that story ... you can almost shut your eyes and imagine the things that went down at the falls, given that water travel was your primary source of transportation."
The site in previous years was home to a feldspar mill, and before that a lumber mill.
Once the diggings have concluded, the materials will be analyzed and stored, Lahti said. Ideally, he added, the artifacts could become part of an exhibit at the park or at the education alliance's science center.
Alex Lear can be reached at 373-9060 ext. 113 or firstname.lastname@example.com.


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By Kathy Bevan
The Competition Bureau's decision to take CREA before the Competition Tribunal to determine the future of MLS access may not have been welcomed by CREA's leadership team, but a vocal segment of the association's membership fully supports the idea of having CREA getting its day in court before the quasi-judicial body.
A number of comments posted on REM's online Forum leading up to the Competition Bureau's announcement on February 8 that it was ceasing negotiations and seeking a formal tribunal hearing are highly critical of any negotiations regarding access to CREA's trademarked MLS system.
"I cannot believe anybody or any organization would agree to entertain negotiations over the MLS system, which as so many of the Realtors have expressed, we support (and) pay for…This is our MLS system and it is not for sale!" one Realtor posted. Another wrote, "My main concern with negotiating with the bureau is that it appears that we are admitting to doing something wrong…If we in the industry (have) done harm to the public or individuals, then we should be accountable to them in a court of law…Take me to court any day." A third comment: "The simple answer is to take back our website. We pay for it, we own it, let's stop giving the public access. Information equals money, why are we giving away our money?"
CREA had been in negotiations with the Competition Bureau since last October, when the bureau announced, based on the findings of its three-year investigation into CREA's access rules regarding its trademarked MLS system, that it wanted key sections of those access rules removed.
The crux of the bureau's contentions against CREA are essentially the same as it expressed last October – that through CREA's control of the MLS system and the limits it places on MLS information that is shared with consumers via CREA's public Realtor.ca website, CREA is restricting competition in the residential real estate market and limiting consumer choice.
In the Notice of Application filed with the Competition Tribunal, Melanie Aitken – the Commissioner of Competition – alleges that the restrictions CREA places on MLS access "impose minimum service requirements" on brokers and salespeople "which lessen or prevent competition substantially." As a consequence, Aitken claims that consumer choice is being restricted as well, "…leaving consumers with only one option if they want to sell their home using the MLS system – they must hire a real estate broker (salesperson) who will and must, because of the MLS restrictions, provide a bundle of services that includes services the consumer may not want to receive or pay for." While Aitken acknowledges other options exist for marketing homes for sale, she says "they are not adequate substitutes for an MLS listing."
In its tribunal filing, the bureau singles out four key conditions contained in CREA's existing MLS rules: CREA's "Agency" rule and MLS Interpretations 1, 3 and 6. CREA, in its defence, says it had already notified the bureau that it was in the process of redrafting its MLS rules for presentation to its March AGM, to try to address the bureau's concerns.
Those drafted changes include a significant revision to the "Agency" provision, as well as complete deletions of two of the three Interpretations that the bureau has cited in its filing with the tribunal. In a dispatch to CREA members issued the same day as the bureau filed notice with the tribunal, CREA president Dale Ripplinger laid out a draft of the proposed revisions to the Interpretations, which will be introduced at CREA's March AGM.
Key among CREA's MLS access revisions: the removal of Interpretation 1 – "The listing Realtor shall receive and present all offers and counter offers to the seller" – and Interpretation 3 – "The 'mere posting' of property information in an MLS system is contrary to CREA's Rules. A 'mere posting' occurs when the listing agreement relieves the listing member of any obligations under the Rules, including the obligation that the listing Realtor remain the agent of the seller throughout the term of the listing contract."
If CREA's draft proposals are approved at the March AGM, only one of the three Interpretations specifically targeted by the bureau will remain in effect. That one – Interpretation 6 – is where CREA appears to be digging in, although its draft revisions do include rewording for clarification. In essence, Interpretation 6 states that only the listing Realtor's name and contact information may appear on CREA's public website, Realtor.ca; contact information about the seller cannot be included.
Interpretation 6 is the same provision that CREA said last October it was still unclear about in terms of potential impacts from the changes being proposed by the Competition Bureau. "Removing Interpretation 6 would mean that buyers' agents would be able to get sellers' contact information directly from an MLS listing(s) instead of having to contact the listing agent," Ripplinger wrote to members at that time, adding, "We are still exploring the full effect of deleting this Interpretation."
Up until the bureau ceased negotiations, Ripplinger was hopeful that CREA and the bureau would be able to reach an agreement. Just the week before the bureau announced it was taking its case to the tribunal, Ripplinger told REM that "both sides have worked incredibly hard to reach a solution" and "fortunately, we are not all that far from an agreement", although he did mention that "there are still a couple of issues of significance." He also added a cautionary note: "To use an analogy that Realtors will understand, we've all seen a house sale fall apart over appliances."
Much like a failed real estate transaction, there is no guarantee that the ultimate resolution of this dispute will completely satisfy either side. No date has yet been set for the Competition Tribunal hearing, when both CREA and the bureau will get to formally present their arguments.
To view the Notice of Application in PDF format, click here.
Posted: 2010-02-15 08:59:44
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It's long been known that Hip-Hop is a man's game. Even though that's proven to be true, plenty of females have been able to crack the code, and make a name for them selves in this testosterone-filled industry. Read More
This one right here gets an A for creativity. Be on the lookout for Dirty Gold later this year. Read More
XXL releases the third of their Freshmen Cyphers, this time featuring Dizzy Wright, Logic and Angel Haze over Jahlil Beats production. Overall, this is surprisingly probably the strongest of them all.
Here are some dope visuals off angel's Reservation tape. It's safe to say that angel goes IN on this one.
Quickly becoming a female to be reckoned with, here's Ms. Haze doing what she does best at New York's famed S.o.B.'s venue, while also talking about her career and more. Read More
Angel Haze, who recently signed with Universal, stopped by Statik Selektah's Showoff Radio to drop a freestyle.
On Thursday, July 19, rapper Angel Haze had the release party for her EP "Reservations" at Santos Party House. The event was hosted by Meka and Low Key and featured a performance from Carrie Wilds. Guests included Mr. MFN eXquire, Chaz Van Queen, and Miss Ls. All photos by Lucas Alvarado/Far Fetched Future.