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About Chandigarh
Chandigarh, the dream city of India's first Prime Minister, Sh. Jawahar Lal Nehru, was planned by the famous French architect Le Corbusier. Picturesquely located at the foothills of Shivaliks, it is known as one of the best experiments in urban planning and modern architecture in the twentieth century in India. Chandigarh derives its name from the temple of "Chandi Mandir" located in the vicinity of the site selected for the city. The deity 'Chandi', the goddess of power and a fort of 'garh' laying beyond the temple gave the city its name "Chandigarh-The City Beautiful".The city has a pre-historic past. The gently sloping plains on which modern Chandigarh exists, was in the ancient past, a wide lake ringed by a marsh. The fossil remains found at the site indicate a large variety of aquatic and amphibian life, which was supported by that environment. About 8000 years ago the area was also known to be a home to the Harappans.
Read More About Chandigarh...
Chandigarh Historical Background
'SOMETHING GOOD COMETH OUT OF EVIL'; thus goes the Biblical saying. This legendry proverb aptly describes the birth of the city of Chandigarh, which was conceived immediately after India's Independence in 1947. With the partition in the subcontinent, Lahore, the capital of undivided Punjab fell within Pakistan, leaving East Punjab without a Capital. It was decided to built a new Capital city called Chandigarh about 240 kms. north of New Delhi on a gently sloping terrain with foothills of the Himalayas the Shivalik range of the North and two Seasonal rivulets flowing on its two sides approximately 7-8 kms apart. The geographical location of the city is 30 degree 50' N latitude and 76 degree 48' longitude and it lies at an altitude varying from 304.8 to 365.76 meters above sea level. Pandit Jawaharlal Nehru, Independent India's first Prime Minister, laid down the founding principles of the new city when he said "Let this be a new town, symbolic of freedom of India unfettered by the traditions of the past.. an expressions of the nation's faith in the future". The city is a product of Nehru's vision.
Read More About Chandigarh Historical Background...
Working Places
The Capitol Complex is the focal point if the city, both visually and symbolically whose architectural whose architecture is considering to be the most representative of Le Corbusier's work. This complex of Govt. buildings representing all three essential components of a complete democracy the Legislature, the executive and the judiciary stands against the blue silhouette of lower Shivalik ranges, on the foothills of Himalayas. The Capitol Complex is the embodiment of the spirit of exaltation, power & permanence experienced by Indians on acquiring self government after long, bitter struggle for freedom. The Capitol area was designed as a great pedestrian plaza with motorized traffic confined to sunken trenches. The complex is planned on a cross axis wherein rigid symmetry has been avoided in placement of various buildings. The three major components of the Capitol are the Assembly (Legislation), the Secretariat (Administration) and the High Court (Judiciary).
Read More About Working Places...
After Le Corbusier
The reorganization of the State of Punjab in 1966 resulted in Chandigarh being declared a Union Territory besides serving as Capital of Punjab and the newly created State of Haryana. In the process, Chandigarh became the seat of three governments & gained in size and stature since it already had a central location in the region and a sublime environment complementing its growth. Dr. M. S. Randhawa took over as the first Chief Commissioner of the new Union Territory and was chiefly instrumental in realization of the IInd phase in 1968 when M. N. Sharma was the chief architect. This phase of development comprised of 17 Nos. sectors extending from 31 to 47. The feedback which was gained from the development of Phase-I was wisely invested into the planning of this phase and certain fundamental improvements were envisaged in the Sector layout, housing and commercial environment.
Read More About After Le Corbusier...
Redefining Chandigarh
Chandigarh is unique, because it is the capital of two state governments, Punjab and Haryana. Chandigarh is a planned city, with a high standard of civic amenities. Chandigarh's infrastructure was originally planned for a population of 5 lakh, but the city has expanded rapidly over the last three decades and faces problems common to other growing cities in India, including the proliferation of slums and squatter settlements. Despite these problems, Chandigarh ranks first in India in the Human Development Index, quality of life and e-readiness. Keeping in view the need for the investment of investible surplus, we have taken a number of major initiatives to upgrade the infrastructure in Chandigarh, to boost economic growth in the region. Chandigarh is emerging as a regional hub in the areas of service industry, education, health, information technology, food and vegetable processing etc. Chandigarh's plan priorities clearly focus on the targets and objectives contained in the National Common Minimum Programme.
Read More About Redefining Chandigarh...
Le Corbusier's Master Plan
'The Master plan prepared by Le Corbusier was broadly similar to the one prepared by the team of planners led by Albert Mayer and Mathew Novicki except that the shape of the city plan was modified from one with a curving road network to rectangular shape with a grid iron pattern for the fast traffic roads, besides reducing its area for reason of economy. The city plan was conceived as post war 'Garden City' wherein vertical and high rise buildings were ruled out, keeping in view the socio economic-conditions and living habits of the people. Due to economic constraints, the master plan was to be realized in two phases, catering to a total population of half a million. Phase-I consisting of 30 low density sector spread over an area of 9000 acres (Sector 1 to 30) for 1,50,000 people whereas Phase-II consisting of 17 considerably high density Sectors ( Sectors 31 to 47) spread over an area of 6000 acres for a population of 3,50,000. The primary module of city's design is a Sector, a neighborhood unit of size 800 meters x 1200 meters.
Read More About Le Corbusier's Master Plan...
Living Places
'The functions of living occupies primary place. Keeping in view the habits of he peoples, Le Corbusier planned that every dwelling should have three elements of Sun, Space and greenery. The housing in the city can be sub-divided into two parts- Government housing and Private Housing. The Govt. housing in the city was divided into 13 categories, ranging from the house for the Chief Minister to the two-room house completer with sanitary facilities, a kitchen, a verandah and a courtyard for the lowest paid employee. The socio economic conditions of the city restricted the height of most of the residential buildings to two to three storeyed structures.
In view of the needs of various economic classes, plots of areas ranging from 114sq. mtrs. To 4500 sq. mtrs. were planned. The living habits of the people are of outdoo type because of hot summers and hot and humid rainy seasons comprising most part of the year. Keeping this factor in view, Corbusier conceived a series of Architectural Controls / frame controls/ zoning regulations for each and every category of houses in which it was mandatory to provide open to sky courtyard both at he front and rear side of every house.
Read More About Living Places...
Architechture Control
A suitable conglomeration of natural and built environment is essential for every sustainable habitation. Chandigarh's sustainability stems from its modern urbanism planned in harmony with the elements. Unlike old towns and cities of India, it was planned as a new city unfettered by the traditions of the past, a symbol of India's new found freedom and a step into the future.
The location of the site of the city has contributed immensely to its sustainability. It had a number of natural advantages such as stability (bearing capacity of soil), favourable water supply conditions, natural ground slope, inexhaustible supply of building materials in the vicinity etc. The city has an extreme climate-cold winters warm dry summers and the humid monsoon season. Accordingly, the architectural vocabulary for the city's physical environment includes vernacular shading devices and features such as sunshades (chajjas), fenestrations, parasols, louvers, verandahs, brick jails & courtyards all aimed at natural climate control at micro level.
Read More About Architechture Control...
Edict Of Chandigarh
This edict of Chandigarh was prescribed by Mon Le Corbusier, the planner of Chandigarh for its citizens to follow in future The object of this edict is to enlighten the present and future citizens of Chandigarh about the basic concepts of planning of the city so that they become its guardians and save it from whims of individuals. This edict sets out the following basic ideas underlying the planning of the city. The city of Chandigarh is planned to human scale. It puts in touch with the infinite cosmos and nature. It provides us with places and buildings for all human activities in which the citizens can live a full and harmonious life. Here the radiance of nature and heart are within our reach.
The city is composed of sectors. Each sector is ( 1/2 mile x 3/4 mile) 800 meters x 1200 meters enclosed by roads allocated to fast mechanized transport and sealed to direct access from the houses.The green strip should stay un-interrupted and accommodate schools,sports, walks and recreational facilities for the sector.
Read More About Edict Of Chandigarh...
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Russell Kerr
|Russell Kerr
|Faculty Member
|Chemistry, Biomedical Sciences
|(902) 566-0565
Russell KerrBiography
Title: Professor, Canada Research Chair
Education: B.Sc., Chemistry, University of Calgary; Ph.D., Organic Chemistry, University of Calgary
Recent Citations
- Description of Pseudobacteriovorax antillogorgiicola gen. nov., sp. nov., a bacterium isolated from the gorgonian octocoral Antillogorgia elisabethae, belonging to a novel bacterial family, Pseudobacteriovoracaceae fam. nov., within the order Bdellovibrionales
- Draft genome aequence of Kitasatospora griseola atrain MF730-N6, a bafilomycin, terpentecin, and satosporin producer
- Cystargolides, 20S proteasome inhibitors Isolated from Kitasatospora cystarginea
- Rapid structural diversification of pseudopterosins: Sulfuric acid promoted dehydro-aromatization yielding 14,15-dihydro-elisabatin B
- Natural products with protein tyrosine phosphatase inhibitory activity
Research Interests
- natural products isolation and characterization
- bioassay-guided purification of natural products / drug discovery
- isolation of natural product producing bacteria and fungi
- development of fermentation methods to optimize natural product production
- description of microbial communities in marine invertebrates
GrantsDiscovery and Production of Marine Bioproducts (ACOA #190601) ORD# 1001620
- Atlantic Innovation Fund
- Atlantic Canada Opportunities Agency
- Business Development Program
- Atlantic Canada Opportunities Agency
- Contract - Research
- PEI Aquaculture Alliance
Other Scholars in Chemistry
- Jason Pearson
- Barry Linkletter
- Brian Wagner
- Michael P. Shaver
- Rabin Bissessur
- Michael Liu
- Nola Etkin
- Robert Haines
- Alaa Abd-El-Aziz
Other Scholars in Biomedical Sciences
- Luis Bate
- Spencer Greenwood
- Monique Saleh
- Andrew Tasker
- Tarek Saleh
- Susan Dawson
- Robert Gilmour
- Okechukwu Igboeli
- Balaji Ramanathan
- Don Stevens
- Susan Dohoo
- Melissa Perry
- Tammy Muirhead
- Barry Connell
- Michael Van Den Heuvel
- Sunny Hartwig
- Cai Song
- John Burka
- Glenda Wright
- William Whelan
- David Sims
- Alastair Cribb
- Collins Kamunde

subset: commoncrawl


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7 Attending
3 Attending
80 Attending
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Mon, 15 Dec 2014
67 comments
As Berghain's 10th birthday wraps up, nd_baumecker, one of the club's residents and bookers, posted a photo from 2003 of the space that was to become Panorama Bar's DJ booth.
Tue, 21 Oct 2014
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Two hours of nd_baumeckers last set at Culture Box, Copenhagen.
Thu, 27 Jun 2013
Longtime Panorama Bar resident nd_baumecker takes the stairs down to entertain the Berghain floor in 2 hour DJ mix.
Thu, 7 Feb 2013
15 comments
The Panorama Bar resident revels in the unique possibilities of the opening set in this four-hour mix, recorded live at the Berlin club on January 26th.
Fri, 10 Aug 2012
With their debut LP Transsektoral due out on Osgut Ton next month, the Berlin-based duo have shared another free outtake, "Deep Down."
Sat, 16 Jun 2012
Andreas Baumecker has uploaded a 17-year-old mix after recently finding it on tape.
Fri, 16 Apr 2010
33 comments
The Berghain pair set up at Berlin's T Room venue for a three-hour exploration of deeper house sounds.
22 hrs 12 mins ago
A range of house and techno selectors are confirmed for slots in the coming weeks.
Fri, 28 Nov 2014
3 comments
Vinyl: The Analogue Record In The Digital Age centers around the Berlin scene and will be available in January.
Fri, 21 Nov 2014
DJ Skull, Ben UFO and a solid cast of residents will spin at the December blowout.
Mon, 14 Jul 2014
11 comments
Live At Robert Johnson will release the Italian producer's next LP, which features collaborations with Telephones, Lee Douglas and nd_baumecker.
Mon, 26 May 2014
Levon Vincent, Seth Troxler and Marcel Dettmann will also turn out for Ibiza's newest party collaboration.
Fri, 1 Nov 2013
23 comments
Ryan Elliott, Marcel Fengler and nd_baumecker will also play the London party before the year is out.
Thu, 30 Aug 2012
4 comments
The collaborative project by Steffi and The Analogue Cops will release its first LP in September.
Wed, 20 Jun 2012
90 comments
The Berlin house aficionado broke the news last night via Facebook.


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Weather Matters
Category: Weather safety
Tale of two Decembers: second half may be cool and wet
- 11:36 am Tuesday, December 2nd, 2014 by John Nelander
December is off to a mild start, as predicted. Enjoy it while you can, because conditions may not be quite as pleasant as we move toward the Christmas and New Year's holidays.
Forecasters at the 2014 lightning deaths by state. (Credit: NOAA/ NWS)
STRIKING STATISTICS: Florida will likely lead the nation again this year in lightning deaths, but the number of fatalities continues to be substantially down from a decade ago.
There were six deaths from lightning in Florida, up from four last year. This year's fatalities were in Pompano beach, Seminole, Plant City, Milton, Sarasota, and Fort Myers Beach from May [More]
86 in Palm Beach matches winter's warmest as South Florida continues to sizzle
- 1:59 pm Tuesday, February 25th, 2014 by John Nelander
Air conditioners are getting an early workout around South Florida in the warm, waning days of February.
The 86-degree high at Palm Beach International Airport Monday was the hottest of the month and tied Jan. 2 as the warmest of the young 2014 year. Those were also the two warmest readings of the 2013-2014 meteorological winter, which has been a raging tiger in the Midwest and Northeast but a purring pussycat in South Florida.
High 80s were the rule around region Monday, except that it was 92 in Kendall just northeast of the The Miami-Dade Zoological Park and Gardens, formerly known as [More]
Safety campaign spares golfers from lightning strikes, study shows
- 3:24 pm Thursday, June 27th, 2013 by John Nelander
A new study says fishing is the most dangerous activity during a thunderstorm. (Credit: NOAA)
Golf course deaths from lightning strikes have been reduced over the last decade by 75 percent, according to a report released by the National Oceanic and Atmospheric Administration published for the annual Lightning Safety Awareness Week.
This is good news for South Florida, which continues to leads the nation in lightning strikes and in deaths related to strikes. There have been 98 people killed by lightning since 1959 in the three-county area that encompasses Palm Beach, Broward and Miami-Dade counties. That's the highest number for any three-county [More]
Weather experts weigh 'impact' forecasts for tornadoes, hurricanes
- 1:37 pm Saturday, April 20th, 2013 by John Nelander
The National Weather Service is trying out an expanded version of last year's Impact Based Warnings during the current severe weather season. Instead of just describing a storm system's strength and hazards, forecasters are using blunt language to drive home the consequences to people's homes, cars and personal safety.
For example, rather than a simple tornado warning, the NWS said this during the smaller experimental warning period in 2012: "Significant house and building damage possible. Mobile homes completely destroyed if hit. Some trees uprooted or snapped. Vehicles will likely be thrown by tornadic winds."
And: "This is a life threatening situation. You could be [More]
NWS highlights Florida weather risks; wild Northeast blizzard reports
- 4:14 pm Saturday, February 9th, 2013 by John Nelander
You know that spring is around the corner when the National Weather Service in Miami issues its annual report on Florida Severe Weather Awareness Week. It begins Monday and runs through Friday, with each day focusing on a different brand of weather threat that plagues the state.
They include lightning, rip currents, tornadoes and thunderstorms, hurricanes and flooding, and temperature extremes and wildfires.
Last year, South Floridians had a taste of all of the above after brushes with tropical storms Debby and Isaac ad Hurricane Sandy. Each storm caused flooding, produced strong winds and triggered tornadoes. Tropical Storm Debby, which impacted virtually the [More]


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Ali - ,. Used to be a , , , SAHM to three , all by , then they grew up.
Now I am a WOHM, college student, single mama. to be , , , , , to a littleagain someday.
Army wife - Mama to Liam (9/07), Laine (5/09), and Eliza (7/11)
Do tell her to be careful about getting her care on base or at the local hospital there. I have not heard good things about them and if she's wanting a natural birth experience, she will most likely not get one there unless she's REALLY willing to fight, which most first time moms aren't going to do, and shouldn't HAVE to do! From my experience talking to miltary moms, the military docs are VERY protocol oriented...not very mom or baby oriented.
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In Flash Catalyst CS5 Essential Training, author Mordy Golding demonstrates how to create and publish fully interactive Flash (SWF) micro sites, widgets, portfolios, and applications from static Photoshop, Illustrator, and Fireworks artwork—all without writing code. The course covers planning a project, importing and organizing assets, creating interactive components, defining repeating data lists, and publishing final projects. Exercise files are included with the course.
When defining some kind of user interface, you might want to create a checkbox. Well, there happens to be a component for that. So I'm going to start by creating a new blank Flash Catalyst project. I'll click OK to take the default settings and in the Wireframe Components panel, I'll drag the Checkbox component out onto the artboard. Remember, this is the no- frills version of a Checkbox. It's a simple box with the word Checkbox that appears next to it, but we always have full control over the appearance of our components. Before we create a custom version of this however, let's see the parts that make up a Checkbox.
I'll double-click on this component and you'll see that unlike a Button which has four different states - one for Up, Over, Down, and Disabled - a Checkbox component actually has 8 different states. There are four states for when the Checkbox is not checked and there are four states - again Up, Over, Down, and Disabled - for when the Checkbox is checked. Now that we know that, I'll double- click on a blank area to exit the editing mode, and I'll go to the File menu, because I want to import some artwork that I created inside of Illustrator. I'll choose Illustrator File and in my Chapter 3 folder, I'll click on this file called olive_box and click Open.
I'll use the default Illustrator Import Option settings by clicking OK, and I'll click on the Layers panel here so we can see exactly what I just brought in from Illustrator. To see it better on the artboard, I'll also zoom in by using the keyboard shortcut for the Zoom tool by holding down Control and the Spacebar key. I'm on Windows, but if you're on Mac they will be Command+Spacebar. I can click-and-drag to draw marquee around that object to zoom in to see that piece of artwork better. By the way these are the same keyboard shortcuts that you'd find inside of Illustrator or Photoshop. So I see that I have a Group, which I can turn on and off, and I have a Rectangle.
By the way, I just want to note that right now my Rectangle has a white fill inside of it and this is going to be important. We're obviously going to want a user to click anywhere inside the box to check it. However, if the box doesn't have a fill, there's no area to indicate that someone's clicking on that button. In other words, if the box has a fill of none, then running your mouse cursor over that area doesn't do anything for the component. By filling the box white it means that any time I move my mouse within this general area, I can be activating that Checkbox component. To make it a little bit easier when I create this component, I'm actually going to leave the Group layer turned off for now.
But it's important to note that even though you can't see something inside of Flash Catalyst, you can actually still select it. To demonstrate what I mean, I'm going to click on the artboard here to deselect everything. I'm now going to move my cursor into the Layers panel and I'm going to click over here on the Group layer. Notice now that Layer 1 indicates that something is selected. I can't see it, but I now have selected that Group. I'm also going to hold down the Shift key and click on the Rectangle object. Now I have two elements selected, the Group and the Rectangle, and I want to convert both of those to a Checkbox component.
Looking at the HUD I'll now choose to convert my artwork to a component by clicking on the pop-up here and choosing Checkbox. I'd like to edit the various states of my Checkbox, so I'll double-click on it. Now in the regular Up, Over, Down, and Disabled states, I want the box to appear empty. However, when the Checkbox is selected I'd like to see those olives. So in the Pages/States panel, I'll just move this slider here so I can view all the selected states. I'll go to the Selected Up state and turn on the olive group. I'll do the same for the other states as well.
Now that I've turned the olives on in all these states, I'll double-click to exit the editing mode. Now let's see how this appears on a web browser by going to the File menu and choosing Run Project. This will open up in Firefox and I'll be able now to see that button. This was the generic no-frills checkbox and this is the Checkbox that we just created. When you click on it, you can see the olives appear that means the box is checked. Click on it again and the olives disappear. So while Checkboxes may not sound very exciting, know that in Flash Catalyst you can make a checkbox appear any way you'd like.
Find answers to the most frequently asked questions about Flash Catalyst CS5 Essential Training .
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Fisher-Price® Deluxe Sit-Me-Up Floor Seat offers comfort and fun all in one, with this fun monkey seat! The supportive, upright seat with soft fabric and a wide, sturdy base lets baby see and interact with the world around them. Two linkable toys invite baby to play. Squeaker sounds reward baby for kicking the foot pads. Seat pad is removable and machine washable. Folds for compact storage and use on-the-go.
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text: "The new details revealed today regarding AIG's bailout in 2008 come as no surprise to those of us who believe that the American people deserve full transparency from the Federal Reserve. It also demonstrates why defenders of the Fed are so adamant about 'independence' by which they really mean secrecy. My strong suspicion is that secret arrangements between cronies like this are not an anomaly, but the norm. The status quo has made it entirely too easy and too tempting to behave recklessly with public funds in total secrecy. The system needs radical change, but we should start with honesty, transparency and accountability to the American people about how their money is being handled."


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Senator Patrick Brazeau apologizes for insulting journalist on Twitter
Patrick Brazeau backs down after tweeting the B-word at a reporter who wrote about his poor attendance record in Senate.
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OTTAWA—Conservative Senator Patrick Brazeau has reacted to a news story about his poor attendance record by going on Twitter to insult the reporter who wrote it.
The Canadian Press, a news wire service co-owned by the Toronto Star, published a story on Tuesday that showed Brazeau, 37, has the poorest attendance record of all senators for this session of Parliament.
The Quebec senator, appointed by Prime Minister Stephen Harper in 2008, had been asked by Canadian Press's Jennifer Ditchburn, an Ottawa-based political reporter, to comment on his attendance record. He initially responded with an emailed statement in which he said he was absent for "personal matters."
On Tuesday afternoon, about an hour after Ditchburn first tweeted the online link to her news story, Brazeau then took to Twitter.
"While u smile Jen, others suffer. Change the D to a B in your last name and we're even! Don't mean it but needs saying," Brazeau tweeted at 3:42 p.m.
Ditchburn quickly tweeted back that while many others have previously made the same crude joke, none had been a Canadian senator.
Brazeau, who did not respond to telephone messages Tuesday afternoon, suggested Ditchburn should not have been offended by his suggestion that she is a bitch. Later, however, he apologized for his remarks.
"They were done because of my personal circumstance regarding your story … I'm hardworker and take my position seriously but personal issues always comes 1st. Ppl are sometimes in need. Sorry!" Brazeau wrote in two consecutive tweets around 5:20 p.m.
Ditchburn wrote in an email on Tuesday that she had called Brazeau for comment twice, first on Monday, and was told he was unavailable for an interview but would respond by email.
"Our exchange of emails was very civil and respectful and I quoted him verbatim," Ditchburn told the Star.
Brazeau made headlines about a domestic matter soon after Harper appointed him senator. He was in the spotlight again in March this year when he lost a boxing match to Liberal MP Justin Trudeau.
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text:
Neyra Biel is Miss COED Magazine and also my future ex. (COED)
Irina Shayk gives a peek at her thong on the red carpet. (HuffPo)
Rihanna is like neapolitan ice cream, and I like all three flavors. (FoxNews)
Fergie celebrates her birthday, so let's celebrate her body. (Celebuzz)
Megan Fox wears a bunch of hats for a magazine, unfortunately other clothing too. (GossipCenter)
Brooklyn Decker shows Germany what we already knew, she's a smokeshow. (SocialiteLife)
Kate Upton and Katy Perry wear shoes that can read men's minds. (theFABlife)


text:
The Science of Food Smells
Why do we like some aromas much more than others? And why a specific smell indicates how good the food is? The answers come from science.
Graham Neville: The Search for Flavour
Irish chef Graham Neville says he spends months searching for the right ingredients for his FortyOne restaurant in Dublin.
Turn off the Tap: the War of Prosecco
In 2014 UK sales increased by 75%: prosecco on tap is now a reality in the consumption lifestyles, but Italian producers disagree with this trend. Here's why.
The Rising Trend of Protein Desserts
Low-carb and high-protein baking is the next big fine dining thing: it's the end of "sweet" as we know it, turned into a new gourmet food model.


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Kelly Scientific Publications provides cutting edge market intelligence for pharmaceutical, biotechnology and medical diagnostic industries. We offer high-end comprehensive reports focusing on emerging markets and key niche industries to business professionals, government departments and hi-tech organizations.
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22-17430 - 62 Piece Security Bit and Screwdriver Set
62 piece bit and screwdriver includes bits to handle a wide variety of repairs and maintenance work on electronics, appliances, vehicles and more. Features a unique stay put design to hold bits securely in place.
Mfr Name: Grip Tools
Mfr Number: 62160
See all items in Security Drivers
22-3495 - 105 Piece Security and Standard Screwdriver Bit Set
This complete set includes security bits to remove tamper resistant screws found in many of today's popular electronics as well as standard bits for more common fasteners. This kit also includes a heavy duty ratchet screwdriver with forward, reverse, and conventio...
Mfr Name: Duratool
Mfr Number: 22-3495
22-21805 - Compact "Go Box" 34 Piece Premium Bit Set with Ratchet and 1/4" Holder
After you try a Wiha bit, this won't just be your "go to" set, it will be the only bit set you will use.
Professional pocket-sized and work-ready set includes 32 precision-machined bits, a ClicFix locking magnetic bit holder, and a 72-tooth precision bit-holdi...
Mfr Name: Wiha
Mfr Number: 74996
See all items in Driver Bits
22-15245 - 33 Piece Security Bit Set
Convenient bit set includes a variety of bits that fit the most popular tamper proof fasteners. Bits are 1" in length and a 2 ½" magnetic bit holder extends them to 3 ½".
Mfr Name: Titan
Mfr Number: 16032
22-17400 - 23-In-1 High Performance Screwdriver Set
HIgh performance precision screwdriver set comes with a wide range of high quality bits for use in a wide range of mobile phone, PDA, PC and other applications.
Mfr Name: Pro'skit
Mfr Number: SD-9316
See all items in Mechanic Kits
22-17056 - 50 Piece T-Handle Drill and Bit Set
T-handle allows for high torque to be applied making it useful for drilling and driving into wood, metal and masonry.
Mfr Name: Performance Tool
Mfr Number: W125
See all items in Bit Sets
22-11075 - 29 PC Video Game Driver Set
Kit used to open most video game systems Kit includes: Ratchet screwdriver handle, ¼" extender and 27 specialty bits Ratchet handle features forward, reverse and locking function
Mfr Number: SD-9313
See all items in Variety Sets
22-18555 - X-Selector 31 Piece Combo Bit Set
X-Selector bit sets include 30 through hardened industrial quality bits designed for durability. Bits are always visible with box open or closed. Set includes a molded storage box and standard magnetic bit holder.
Mfr Number: 79495
See all items in Screwdrivers
22-1875 - 32 Piece Security Bit Set
Handy pocket size set contains many of the bits commonly used to remove tamper resistant screws found in many of today's electronic products. Items like IBM PS/2 monitors, cable boxes, telephone equipment and much more, commonly use these type of screws. Kit conta...
Mfr Number: 22-1875
22-7320 - 60 Piece All-in-One Tool Kit
This compact kit contains the most popular bits and 1/4" sockets with a comfortable, cushioned, reversible ratchet screwdriver. The versatile driver can be adjusted and locked at 45¡ and 90¡ angles to ensure ease of use in confined spaces. The 1/4" hex driver shaf...
Mfr Number: 1PK-943
See all items in Technician Kits
22-16330 - 33 Piece Security Bit Set
Handy pocket size set contains many of the bits commonly used to remove tamper resistant screws found in many of today's electronic products. Items like IBM PS/2 monitors, cable boxes, telephone equipment and much more, commonly use these type of screws.
Mfr Number: GSD-113
22-17370 - 27 Piece 1/4" Drive Socket and Screwdriver Set
27 piece set includes a convenient 2-in1 tool with a 72 teeth 2-way 1/4" ratchet at one end and a screwdriver end at the other. Includes bits and sockets to handle a variety of applications.
Mfr Number: SD-2318M
22-18365 - 32 Piece Tip Bit Set
Handy bit set is housed in a durable PVC block for easy storage and transport of standard bits. Through hole in block slides over most screwdriver shafts for easy access and storage when not in use. Bits are made of industrial strength, heat treated steel for du...
Mfr Name: Klein Tools
Mfr Number: 32526
22-15280 - 204 Piece Master Drill Bit Set
This set includes nearly every bit and driver needed for wood, metal, plastic and masonry applications. Four panel case folds out for easy access and folds up for easy transport and storage.
Mfr Number: 16204
See all items in Fastener Sets
22-17048 - 13 Piece Impact Driver Bit Set
Impact driver bit set uses a quick change bit holder for efficient work. Includes color coded bits for easy identification.
Mfr Number: W9179
See all items in Impact Bits
Shipped several days before estimated ship date of out of stock item. Very happy!


text:
Around The Barn with Heads Up Santa Clarita Horse Therapy
Date: September 14, 2013
Host: Nancy Pitchford Zhe, Co-Hosts Bobbi Jean Bell, Julie Fox Pomilia with Andrew on the Board
It's All About The Poetry and Songwriting of SUSIE KNIGHT
Right Click Here To Download!
Around The Barn – September 14, 2013
Airing Saturday at 9:00 a.m., Around the Barn with Heads Up is brought to you by Heads Up Santa Clarita Horse Therapy on Horseback, OutWest Boutique and Cultural Center in Old Town Newhall and Fox Feed.
Listen to all of Around The Barn's Podcast's here!
Members of the Around The Barn Team are involved in these upcoming events:
9/15 Western Music Association California Chapter Jam at the Autry, 12-3pm
9/19 SENSES – "Down The Rabbit Hole" on Main St, Old Town Newhall, 7-11pm
9/26 SCVTV Presents The OutWest Concert Series: An Evening With Terry Brown
Terry is our guest on 9/21
9/26-9/29 Visit the Traveling Vietnam War Memorial at the Westfield Town Center Mall
9/28-9/29 20th Annual Hart of The West Powwow at Hart Park
It's All About Award Winning SUSIE KNIGHT
Western Music Association 2013 Nominee for Female Poet of The Year
2012 Poetry Album of The Year winner for "Western Wordsmith"
Susie Knight – rancher, cowgirl, poet, singer, songwriter, entertainer, professional clown, and….and…and…is a Western gal who does it all! Susie calls in from her home in Colorado and shares her life story including where and who inspires her, and what she's passionate about. Throughout our time together we focus on the music and poetry of her most recent CD, "Leather Wings."
Tune in for an hour of sparkling conversation with Susie, Nancy, Julie, and Bobbi Jean to hear more about:
*Susie's childhood and her early love for music and horses
*What does Susie and Julie have in common?
*How she got started in Cowboy Music and Poetry
*How she felt when "Western Wordsmith" was announced at the Western Music Association Awards night as 2012 Cowboy Poetry Album of The Year"
*What surprised Julie so much that she immediately went online to www.susieknight.com to see photos?
*What are the stories or inspiration behind each of the tracks we play from Leather Wings
*What was it like to work with Duke Davis?
All from CD "Leather Wings" by Susie Knight
*Spirit of Buffalo Bill
*Rodeo Chasin' Girl
*Mountain Soliloquy
*Wait Here
*Fallen in Love
*Here to Remember
*Sayin' Goodbye
Follow us on Facebook – Around The Barn Radio Show!
Listen to the podcast for the entire conversation and great music!
Follow Us on Facebook https://www.facebook.com/AroundTheBarnRadioShow
The Western Music Association nominated "Around The Barn" for 2013 DJ/Radio Program of The Year! One of five finalists, the award will be presented at the annual Western Music Association conference in November. We are thrilled and honored to be nominated again this year for this prestigious award! We send out sincere thanks to all those who wrote us in on the initial ballot and look forward to seeing you at the conference!
Don't miss a thing. Get breaking Santa Clarita news alerts delivered right to your inbox.
Click the link above to hear the whole show. Tune in every week for Around The Barn, right here on your Hometown Station, AM 1220 KHTS.
Around the Barn with Heads Up was nominated by the Western Music Association in 2011, 2012, and again in 2013 for DJ/Radio Program of The Year. Brought to you by Heads Up Santa Clarita Horse Therapy, OutWest Boutique and Cultural Center and Fox Feed.
Get all the information you need on Around the Barn here!
Full list of the KHTS Podcasts!
Source: Santa Clarita Podcasts


text:
36 comments found
Hot damn! Very nice work… been waiting for this one ever since I spied the PSD .
Thanks Theme!
Great final result! Nice to see it online this quick!
Thanks Philo – you did a rockin' job on the core HTML /CSS (as always) – I ended up swapping FancyBox for PrettyPhoto 3.0 btw – I'll probably update Nivo to 1.8 as well so both the slider and the lightbox have a thumbnailed navigation
Thanks Brandon!
Appreciate it! Thanks for adding my name in the item description btw!
hi, when the wp theme will be ready !?
1-2 weeks; I can't give an exact date as coding, documentation, and other factors make releasing a theme more of an art than a science, but it's definitely the next thing on my to-do list gauging from the response for this one. Just make sure you follow me from my profile page to get updated as soon as it's ready!
looks greate BUT
live preview does not work for me in IE7 , the slider is not working
This is actually just the encryption running on the demo – I'll look into an IE7 safe way to run encryption though Thanks for the note Al!
Ok patched it – it was actually just a single space issue on the encryption that's running on top of the demo – so the demo should be 100% stable in IE7 now – thanks again for catching the demo issue The actual download file is stable too of course, but that was never in question.
Cheers! Brandon
Man Brandon your stuff just keeps getting better and better. Keep up the great work. Anxious for the WP version on this end.
Best- AW www.adamwalker.biz
Thanks AK! Honestly, it means a ton to me to get comments like this from repeat buyers
Looks great, Brandon.
One thing I noticed on the demo… When you hover over the social network icons, it seems like the first one is meant to be "Tumblr" based on the icon. But both that one and the second one say "Twitter" when you hover. Maybe a typo or something you overlooked?
I'll be picking up the WP version of this for sure!
All the best, Heather
Yep – just a typo in the content, you can actually make that text anything you want and link it up with anything you want
Thanks for the note though! I'll patch it up.
Great job Brandon. Looks great!
Love the bright orange, red and yellow bg graphic for the item preview!
Awesome work.
Thanks Flash Cart!
Nice Brandon, any chance of seeing a video example? I couldn't find one in the demo.
Any solution coming for IE 7 and the drop down menu lost behind the home page slider? Need this to be fixed to purchase…
Client needs IE 7 compatibility and has lot's of video
Thanks Brandon
Hi Raveon,
1. Check out the third project in the portfolio section – it should launch a YouTube video – you can also launch Vimeo, Quicktime, Flash, and more – http://www.no-margin-for-errors.com/projects/prettyphoto-jquery-lightbox-clone/
2. The site should be fully compliant in IE7 now… is there something that's specifically not working? I just double checked and everything seems to be fine.
Cheers! Brandon
I wanted to confirm you used prettyPhoto 3.0 as the lightbox feature in this cause it looks so good. Is the prettyPhoto 3.0 available as a wordpress plugin?
It's not available as a WP plugin yet as I know of, but I'll be building it directly into the WP version of this template when it comes out And yes, this is PrettyPhoto 3.0


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The Searchers, an American Legend
Friday, July 05, 2013
Glenn Frankel tells the story behind "The Searchers." In 1836 in East Texas, nine-year-old Cynthia Ann Parker was kidnapped by Comanches, raised by the tribe, and eventually became the wife of a warrior. Twenty-four years later she was reclaimed by the U.S. cavalry and Texas Rangers and reunited with her white family. It's become a foundational American tale and has inspired operas plays, and a novel by Alan LeMay, which was adapted into one of Hollywood's most legendary films, "The Searchers," directed by John Ford and starring John Wayne. In The Searchers: The Making of an American Legend, Frankel examines how the story has been shaped over time.
Guests:Glenn Frankel
Comments [1]
Extremely strange interview. It's like the 60s never occurred, no mention of Native American reactions to this film or how consciousness of Native American cultures have reshaped our attitudes to the Western genre, especially after films like Soldier Blue etc. This guy sounded like a 13 year old boy, talking about one of his favourite toys, rather than the mature criticism that one would expect with someone of his credentials. And to say this poor woman was the "ultimate victim of these wars" is just extraordinary given the nature of the genocide, and is like saying Meryl Streep's character in Sophie's Choice is the ultimate victim of the holocaust. And an almost creepy excitement crept into his voice when he spoke of the "honour" killing of women, with not the slightest hint of irony. Really, a very strange, rather absurd, totally uninsightful perspective. Ford, like Griffiths, was not a complicated man, neither were his films, which he was the first to admit. The romance surrounding these figures speaks to the adolescent mentality that surrounds so much cinema criticism of the past 20 years and the state of entropy in the industry it illustrates.
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I just got factions this weekend, along with the Ranger Fur Quest, it appears the Monk Second skill is borked as well. You're supposed to meet master Pe Wan (*snicker*) in the Kinya province. He's not there at all. I've had two other people try the quest and have had the same problem. Remaking didnt help at either. :(
Or am I just 'tarded?


text:
A method of electrically testing pixel functionality is provided comprising releasably disposing a wafer in a socket. The wafer has at least one baseplate comprised of cathode emitters arranged in pixels. The socket has pads. The socket pads are contacted with test pins, and each of the pixels is addressed individually, thereby causing the cathode emitters to emit electrons in a current. The current is collected from each of the pixels on an anode screen. Alternatively, the anode card may have pins, and these pins contact pads on the baseplate. The baseplate, or substrate with baseplates, does not require a socket with pins.
1. An assembly useful for testing electron emissive cathodes comprising:
a collector;
a wafer support device for releasably supporting a wafer opposite said collector, a high vacuum exists between said collector and said wafer support device; and
contact pins for contacting said wafer located above said wafer support device, and for testing a number of electron emissive cathodes located on said wafer.
2. The assembly useful for testing electron emissive cathodes, according to
3. The assembly useful for testing electron emissive cathodes, according to
4. The assembly useful for testing electron emissive cathodes, according to
5. The assembly useful for testing electron emissive cathodes, according to
6. The assembly useful for testing electron emissive cathodes, according to
7. The assembly useful for testing electron emissive cathodes, according to
8. A testing apparatus useful for measuring emitted electron current comprising:
a socket in which to dispose a substrate having cathodes;
an anode disposed opposite said socket for collecting electron emissions from said cathodes, a high vacuum existing between said socket and said anode; and
contact pins disposed in said socket, said contact pins for making contact with said substrate.
9. The testing apparatus useful for measuring electron emitted current, according to
10. The testing apparatus useful for measuring emitted electron current, according to
11. The testing apparatus useful for measuring emitted electron current, according to
12. The testing apparatus useful for measuring emitted electron current, according to
13. The testing apparatus useful for measuring emitted electron current, according to
14. The testing apparatus useful for measuring emitted electron current, according to
15. The testing apparatus useful for measuring emitted electron current, according to
16. A wafer probe station useful for testing wafers under vacuum, comprising:
a probe chamber comprising:
a probe card having pins and an anode plate, said anode plate having a luminescent film disposed thereon; and
a testing stage disposed opposite said probe card, said testing stage comprising a socket for releasably supporting said wafers.
17. The wafer probe station according to
18. The wafer probe station according to
19. The wafer probe station according to
a clean chamber coupled to said probe chamber, said clean chamber containing a plasma.
20. The wafer probe station according to
a loadlock system comprising a wafer cassette and a transfer trolley for transferring said wafers from said clean chamber to said probe chamber under vacuum.
21. The wafer probe station according to
22. The wafer probe station according to
23. The wafer probe station according to
This application is a division of U.S. patent application Ser. No. 08/921,772, filed Aug. 15, 1997 (now U.S. Pat. No. 5,751,262), which is a continuation of U.S. patent application Ser. No. 08/383,269, filed Feb. 3, 1995 (now abandoned), which is a continuation-in-part of U.S. patent application Ser. No. 08/377,320, filed Jan. 24, 1995 (now abandoned).
This invention was made with Government support under Contract No. DABT63-93-C-0025 awarded by the Advanced Research Projects Agency (ARPA). The Government has certain rights in the invention.
This invention relates to matrix addressable display devices, and more particularly to a method and apparatus for testing the emission of the display.
Quality assurance requires the testing of manufactured products to determine if they will function over a given set of parameters. Testing is performed on a random sampling of products from the production lines, or in some industries, on every product which is manufactured.
Optical measurements are currently performed on display devices at the final stages of display testing. Optical measurement is accomplished by turning on all the cathode emitters in a pixel, and visually observing them. This method is extremely subjective, as it relies on the judgement of the individual peering at the screen.
Photon Dynamics of Milipitas, Calif. employs a method in which photons from a full display (i.e., substantially all of the pixels are turned "on" at the same time) are measured. A completed display device is optically tested by measuring the light emitted from the display.
There are several drawbacks to the above described optical method. For example, the process is very expensive, as it requires sophisticated optics and processing algorithms in order to determine the relative number of functional pixels.
Additionally, the optical systems require closely spaced anodes with respect to the cathode in order for the inspection optics to obtain accurate measurements. Therefore, the optical systems are not practical for testing display baseplates prior to their assembly in a field emission device.
Other methods used to measure current emitted by field emitter devices employ a positively biased electrode. However, these methods also measure the total current emitted by substantially all of the pixels in the completed unit. Therefore, these methods are also limited to measuring the operation of the device as a whole.
There still exists a need for a method to measure the current emitted by individual pixels in the display in order to determine their functionality, as well as the total number of functioning pixels (also known as the "yield"). Additionally, manufacturing realities require that the functionality of the individual pixels is measured in a rapid fashion.
According to one embodiment of the present invention, an assembly useful for testing emissive cathodes includes a collector, a wafer support device for releasably supporting a wafer opposite the collector, and contact pins for contacting the wafer located above the wafer support device and for testing a number of emissive cathodes located on the wafer. A high vacuum exists between the collector and the wafer support device.
According to another embodiment of the present invention, a testing apparatus useful for measuring emitted current includes a socket in which to dispose a substrate having cathodes, an anode disposed opposite the socket for collecting emissions from the cathodes, and contact pins disposed in the socket for making contact with the substrate. A high vacuum exists between the socket and the anode.
According to another embodiment of the present invention, a wafer probe station useful for testing wafers under vacuum includes a probe chamber including a probe card and a testing stage. The probe card has pins and an anode plate having a luminescent film. The testing stage, disposed opposite the probe card, includes a socket for releasably supporting the wafers.
The present invention will be better understood from reading the following description of nonlimitative embodiments, with reference to the attached drawings, wherein below:
FIG. 1 is a schematic cross-section of a pixel of an illustrative field emission display having emitter tips;
FIGS. 2A-C are schematic top-views of the field emission display illustrating the relative location of the pixels of FIG. 1, illustrating a testing sequence, according to the present invention;
FIG. 3 is a schematic cross-section of the pixels of FIG. 2, illustrating an electrical method used to test the current of the pixels, according to the present invention;
FIG. 4 is a schematic cross-section of the pixels of FIG. 2, illustrating an optical method used to test the photons emitted by the pixels, according to the present invention; and
FIG. 5 is a flow chart illustrating the process of pixel testing according to the process of the present invention;
FIGS. 6A-B are schematic views of an anode card, with the pins on the anode according to the present invention; and
FIGS. 7A-B are schematic views of the anode card with the pins on the socket, according to the present invention.
The functionality of individual pixels in an addressable emissive cathode is determined by measuring the emitted current from a single pixel or from a small group of pixels. The current is measured on an anode screen disposed above the cathode emitters, thereby enabling the anode to collect electrons emitted from the cathodes. The collected current is compared to known parameters in order to determine whether the individual pixel site is functional.
A method disclosed herein in accordance with one embodiment allows for the testing of cathode emitters in a vacuum chamber through the use of probe cards or sockets, and an anode. This format allows for the testing of approximately 100,000 pixels in less than 30 seconds, thereby expanding testing capabilities. Not only does this method permit faster testing, but also a less expensive alternative to the functionality tests used for individual pixels.
One advantage of this method is that it enables rapid determination of individual pixel functionality of the cathode emitters used in field emission type displays, or other similarly addressed matrix displays. For example, this method is suitable for displays that are actively or passively addressed.
This method permits testing of the cathode emitters as a baseplate. Additionally, the use of an anode which luminesces under electron bombardment permits the measurement of emitted photons to determine pixel functionality.
This method is employed to sequence through all of the pixels, one or more at a time. Additionally, there is no required spacing for the anode in order to achieve accurate measurement. Further, this method can be used with current optical methods to enhance the value of these methods.
In one embodiment, a method of electrically testing pixel functionality includes releasably disposing a wafer in a socket. The wafer has at least one baseplate comprised of cathode emitters arranged in pixels. The socket has pads. The socket pads are contacted with test pins, and each of the pixels is addressed individually, thereby causing the cathode emitters to emit electrons in a current. The current is collected from each of the pixels on an anode plate.
In another embodiment, an anode card useful for measuring emitted current includes: a socket in which to dispose a substrate having cathodes; an anode disposed opposite the socket for collecting emissions from the cathodes, a high vacuum existing between the socket and the anode; and contact pins disposed on the anode for making contact with the substrate.
In another embodiment, an apparatus useful for testing emissive cathodes includes: a transparent collector having phosphors disposed thereon; and a wafer support device for releasably supporting a wafer opposite the collector. The socket has contact pins for contacting the wafer. A high vacuum exists between the collector and the wafer support device.
Referring to FIG. 1, a representative field emission display employing a display segment 22 is depicted. Each display segment 22 is capable of displaying a pixel of information, or a portion of a pixel, as, for example, one green dot of a red/green/blue full-color triad pixel.
Preferably, a single crystal silicon layer serves as a substrate 11. Alternatively, amorphous silicon deposited on an underlying substrate comprised largely of glass or other combination may be used as long as a material capable of conducting electrical current is present on the surface of a substrate so that it can be patterned and etched to form micro-cathodes 13.
At a field emission site, a micro-cathode 13 has been constructed on top of the substrate 11. The micro-cathode 13 is a protuberance which may have a variety of shapes, such as pyramidal, conical, or other geometry which has a fine micro-point for the emission of electrons. Surrounding the micro-cathode 13, is a grid structure 15. When a voltage differential, through source 20, is applied between the micro-cathode 13 and the grid 15, a stream of electrons 17 is emitted toward a phosphor coated screen 16. Screen 16 is an anode.
The micro-cathode 13 has a tip which is integral with substrate 11, and serves as a cathode. Gate 15 serves as a grid structure for applying an electrical field potential to its respective micro-cathode 13.
A dielectric insulating layer 14 is deposited on the conductive micro-cathode 13, which micro-cathode 13 can be formed from the substrate or from one or more deposited conductive films, such as a chromium amorphous silicon bilayer. The insulator 14 also has an opening at the field emission site location.
Disposed between said screen 16 and said baseplate 21 are located spacer support structures 18 which function to support the atmospheric pressure which exists on the electrode faceplate 16 as a result of the vacuum which is created between the baseplate 21 and faceplate 16 for the proper functioning of the emitter tips of micro-cathode 13.
The baseplate 21 of the invention comprises a matrix addressable array of cold cathode emission structures of micro-cathode 13, the substrate 11 on which the emission structures 13 are created, the insulating layer 14, and the anode grid 15.
The present invention provides a method and apparatus useful for testing cathodes emitters, which cathode emitters are frequently used in field emitter display devices. The testing procedure of the present invention is discussed in terms of field emission displays. However, one having ordinary skill in the art, upon being apprised of the present invention will realize its applicability to other matrix addressable displays or devices having emissive cathodes.
The field emitter displays have cathode emission structures 13 which emit electrons into a vacuum environment. For purposes of display devices, the electrons are collected on an anode 16 which is coated with phosphors 19. The phosphors 19 luminesce under electron 17 bombardment, thereby creating the colored light which forms the displayed image.
During the operation of the display, individual pixels 22 are turned on, so that the pixels 22 emit a controlled amount of current. Each pixel contains one or more cathode emitter structures of micro-cathode 13. FIGS. 2A-C illustrate that the control of the pixels 22 is accomplished by a matrix addressable system of rows R1 . . . Rm and columns C1 . . . Cn. Pixel sites 22, 24, and 26 are disposed at the intersection of the rows and columns, and are thereby addressable by their location. In this manner, individual pixels 22 are addressable one or more at a time.
A knowledge of the yield of pixels on the baseplate 21 is essential to the production of field emission displays and other devices. Statistically relevant information can only be obtained by measuring the functionality of every pixel at the earliest opportunity. This information is needed to provide feedback for process modification, trouble shooting, and yield enhancement.
The inability to test baseplates 21 means that yield analysis and process problems remain unknown until the assembly and testing of the completed display. This is a costly approach as defective baseplates are processed into a complete display before the problem is identified. The feedback to the fabrication process is limited by the additional process steps, and by increasing the time until the defects are discovered.
The test method of the present invention is performed by turning on all of the pixels of the cathode 12 for "burn in," and to establish an equilibrium. "Burn in" refers to stressing the devices through electrical cycling, thereby causing any defective parts to fail.
The drive cycle is started in which individual pixels are turned on one at a time or in small groups. This application will refer to the pattern of addressing the pixels 22 as "sequencing," and it is to be understood that the pixels 22 are addressable in a variety of patterns or in a row or column. Sequencing through the pixels 22 enables all of the pixels 22 to be addressed and tested for functionality.
The drive cycle is illustrated in FIGS. 2A-C. A column (C1) is turned on, as well as a row (R1), thereby causing the pixel 22 located at their intersection to emit electrons 17. The emitted electrons create a current which is collected on an anode plate 16 disposed above the micro-cathode emitters 13. The anode 16 has a positive bias with respect to the micro-cathodes 13, thereby enabling the anode 16 to collect the electrons 17.
The collected current is measured and compared with known data for good pulse current. See, for example, FIG. 3. The current magnitude is measured to determine whether the current is above or below the known value. Alternatively, the shape of the pulse (rise time, fall time, etc.) is measured to determine whether the pixel 22 responds properly in a given time frame.
The measurement techniques include coupling the current through a capacitor; measuring the voltage across a resistor; or directly measuring the current through a power source. The method chosen varies with the amount of anode voltage used, the size of the current pulse, and the speed with which the measurement is taken.
After the current from the first pixel is measured, a second pixel in the same or another column is addressed. The current from the second pixel is measured, and the process is repeated until all of the pixels have been measured.
A delay time between each measurement is incorporated to allow for data processing, and for decay of the pulse when the time response of the system is slow. For example, pixel (P1) is turned on for 100 μsec. After which no pixel is turned on for 100 μsec. Then pixel (P2) is turned on for 100 μsec, and so on. Using this 200 μsec. total time (i.e., pulse plus delay time), the system is capable of measuring approximately 100,000 pixels in about 20 seconds. This is especially useful in displays having more than 10,000 pixels.
Of course, depending on the size of the baseplate 21 and the number of pixels thereon, the timing of the individual pixel test may vary. The preferable range for pulse plus delay is approximately 10 μsec to 10 msec.
This is quite a significant advancement over the visual inspection methods currently used, as the present method enables the electrical testing of substantially every pixel 22 individually, and in a rapid fashion.
Non-functional pixels appear as black spots in the display. It only takes a small number of non-functional pixels to cause a display to be non-marketable. Hence, it is worthwhile to know whether the baseplate 21 has defective pixels before completing the assembly of the display device.
The amount of time required for the test varies with the amount of time needed to measure the pulse, the time needed for the pulse to reach equilibrium and decay, and the time needed to process the data. However, the test method of the present invention is independent of address method (e.g., passive or active circuitry) or current regulation schemes.
In an alternative embodiment, multiple pixels are turned on at the same time. For example, one desires to test a group of five pixels. In such a case, four of the pixels are turned on at the same time (e.g., P1, P2, P3, P4), and one pixel (P5) remains off, and the current emitted is measured. Then, a different subset of the same five pixels is turned on (e.g., P1, P2, P3, P5) , and a different one of the pixels remains off (P4), and the current is measured. Preferably, the number of pixels 22 tested at one time is less than 10.
The current emitted from the first subset is then compared with that of the second subset, or with the current from a subset known to contain working pixels. Then as different combinations of pixel groups are turned on, the functionality of those pixels is determined from the expected value.
This approach is especially useful in those situations where the current emitted from one pixel 22 is so small that accurate measurement is difficult due to background noise in the system. In this embodiment, the total current measured is larger because several pixels are tested at once.
Additionally, using the above-described approach, it is possible to measure the total current emitted from a group of pixels. So, a bulk value is obtained for a specified number of pixels. The total value is compared to a known or expected value. The measurement determines whether a particular group of pixels is non-functional. This is useful when the there is a low current emitted per pixel 22, but it does not involve the sorting of the combination measurement as in the above described approach.
The measurement techniques of the present invention include testing either baseplates 21 which are disposed in a vacuum environment with a separate anode or an integrated anode 16.
The testing scheme of the present invention is repeatable with optical, as opposed to electrical measurements. The anode 16 is coated with a material, preferably a phosphor 19, that luminesces under electron bombardment 17. An optical detector, such as a photodiode, is disposed over the anode 16. When the electrons from a pixel 22 or group of pixels cause the anode 16 to luminesce, the photons 23 are measured by the detector, and the information is recorded, as illustrated in FIG. 4.
As with the electrical measurements previously described, the magnitude, shape, rise time, and duration of the pulse are parameters which can be compared to those of a known good pulse, thereby allowing the pixel functionality to be determined. As with the other methods, this embodiment is useful in assembled displays, or with cathode emitters disposed in a vacuum. However, a difference in the timing sequence is present, as it would depend on the decay time of the luminescing material, as well as the frequency response time of the detector used.
FIG. 5 is a flow-chart which depicts the flow of a wafer or substrate through the test apparatus of the present invention. Although testing is possible on individual baseplates, a more efficient and cost-effective approach is to test the device while it is still in wafer form. This allows higher throughput and reduces the cost by eliminating the processing of defective baseplates 21.
Any practical evaluation of a field emission device, must be done under vacuum. The quality of the vacuum affects the performance and the lifetime of field emitters 13. A pressure of 1�10−8 Torr is desired for testing procedures. In addition, some form of cleaning or baking is also desired.
Because emitter tips of micro-cathode 13 are often used in field emission devices, oxidation of the silicon affects the emission characteristics. The oxide layer increases the work function, and thus, increases the required operating voltage. The current at a given voltage increases dramatically after burn-in. This is the result of the removal of the oxide from the tip. Therefore, some processing of the wafer, such as a hydrogen plasma clean, is preferred prior to testing.
A vacuum bake has been found to improve performance in other emitter types. This is due to the removal of adsorbates which increase the work function. Removal of the adsorbates also reduces the likelihood that the emitters 13 will fail.
Die or baseplates 21 are pre-tested for shorts or other defects. The pre-testing is performed at a station at atmospheric pressure. The die is loaded into a high tolerance fixture which is vacuum, plasma, and high temperature compatible.
The fixtured die is loaded into a processing station which includes chambers for pump down, plasma scrub, vacuum bake, and/or other suitable preparation processes, after which the die is transferred to a testing chamber.
One embodiment of the present invention comprises a probe assembly, referred to as an "anode card," comprises electrical connections corresponding to emission control pads. An integrated anode plate or phosphor screen is aligned to the fixture containing the device or die under test (DUT). Electrical connections are releasably made to the die under test, and each emitter or group of emitters is tested for emission characteristics. Springs are preferably used to hold the die in position during test. The fixtured die are removed form the test chamber, and the die having satisfactory characteristics are packaged into a display device, for example.
The ability to remove the die from the socket after the testing process is a significant improvement over the known methods. This enables the die to be tested before it is assembled into a completed display. Prior to the development of the present invention, baseplates were hard-wired or otherwise processed to in order for testing to be undertaken. The hard-wiring implies that the display has to be completely assembled.
Another embodiment of the present invention comprises an automated ultra-high vacuum wafer probe station. The probe station comprises a load-lock which handles a cassette of wafers. A single wafer is loaded into the ultra-high vacuum transfer chamber on a transfer trolley. The wafer is then loaded into a clean chamber where a combination of plasma clean and/or vacuum bake is performed. The wafer is then moved through the transfer chamber to a probe chamber where the wafer is clamped and staged for testing. The wafer staging system has an x, y, and z axis and rotational movement.
The wafer is aligned to a probe card having pins; the number of pins varies with type and size of display. For example, if the baseplate has built-in driver circuitry 5-30 pins may be required. If it has no circuitry, thousands of pins are required. The wafer is raised until the pins make a electrical connection to bond pads. The bond pads have a size substantially in the range of 100�100 μm. The preferred movement resolution is +/−20 μm. The probe card of the present invention, hereinafter referred to as an "anode card," also comprises an anode plate which is preferably glass coated with film and a phosphor. The phosphor film is preferably transparent, such as indium oxide, tin oxide, and indium tin oxide. However, other coatings such as chromium nickel and aluminum can also be used.
The phosphor is used to provide visual verification of emitter operation and emitter burn-in. The anode is preferably transparent to allow visual alignment of the card. Alternatively, other conductors known in the art may be used as anodes. Some of these conductors will be opaque. The anode is preferably disposed approximately 1000 μm above the wafer, and preferably biased at 2000-3000V, but may be biased from 500V to 30,000V.
In the case of a separate anode, the position of the anode must be close enough that the electrons bombard only the anode, in order to prevent static noise or charging and breakdown of the insulators. Once the card is aligned to a reference die on the wafer, the automated testing system tests the baseplate of the first die, and then moves onto the next die on the wafer.
FIGS. 6 and 7 illustrate the anode assemblies of the present invention. The anode card comprises a phosphor coated anode, and contact pins all under high vacuum.
If more than 5 bad pixels are found in a baseplate, or if there are a few closely spaced defective pixels, the die will be considered defective, and testing of that die will cease. A re-check may alternatively be performed.
The analysis is performed by measuring the current pulse on the anode and comparing that with the pulse of a known good pixel. The testing procedure of the present invention provides-a high speed approach to pixel yield analysis, which was previously unavailable. The testing procedure of the present invention greatly increases the viability of field emission displays by improving yield analysis, and providing feedback for process development.
To further speed up the process, the anode is divided into segments, so that more than one pixel is tested at a time. Alternatively, multiple probe card assemblies are used to test more than one die at a time.
The wafer is removed from the socket, and processing of the display or other device proceeds.
All of the U.S. Patents cited herein are hereby incorporated by reference herein as if set forth in their entirety.
While the particular process as herein shown and disclosed in detail is fully capable of obtaining the objects and advantages herein before stated, it is to be understood that it is merely illustrative of the presently preferred embodiments of the invention and that no limitations are intended to the details of construction or design herein shown other than as described in the appended claims.
For example, one having ordinary skill in the art will realize that the testing hardware and procedures described herein are useful, with modifications, to test both individual and groups of baseplates and other devices.
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In accordance with the recent guidance released on August 26, 2011 by the Internal Revenue Service (IRS) extending the due date of the 2011 Offshore Voluntary Disclosure Initiative (OVDI) to September 9, 2011(http://www.akerman.com/documents/res.asp?id=1131), the IRS has modified the 2011 Offshore Voluntary Disclosure Initiative Frequently Asked Questions and Answers (FAQ).
Specifically the IRS provided clarification on August 29, 2011 allowing for the September 9, 2011 extension to apply to taxpayers filing delinquent Foreign Bank Account Reports (FBARs) in accordance with FAQs 17 and 18. This extension applies not only to FBARs but also all other information reports, such as the Form 5471, Information Return of U.S. Persons with Respect to Certain Foreign Corporations, and Form 3520, Annual Return to Report Transactions with Foreign Trusts and Receipt of Certain Foreign Gifts....
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Wayne Shorter
Montreal International Jazz Festival: Lucinda Williams, Erykah Badu, many more in complete indoor programAs usual, you don't have to love jazz in order to love the festival's rich roster of ticketed shows.
Jazz festival: Five notable shows Saturday, June 28, 2014Best bets include Beth Hart, Ben Harper and Charlie Musselwhite, Stacey Kent, Random Recipe, Danilo Perez with Brian Blade and John Patitucci
Montreal International Jazz Festival 2013: Barry Harris, Wayne Shorter and Larry Goldings at various venues; , June 29, 2013Photo of Larry Goldings, Peter Bernstein and Bill Stewart (below) by Denis Alix/ Courtesy of the Montreal International Jazz Festival. It was a Saturday to celebrate at the jazzfest, and not just because
Montreal International Jazz Festival 2013: Sold-out showsIt's the Montreal International Jazz Festival's (almost) opening day (a few shows tonight, i.e. June 27, and the official kickoff tomorrow), so it's getting a bit late in the game to be thinking about buying tickets to the indoor concerts.
Montreal International Jazz Festival 2013: Aretha, Wayne and WyntonJust in time for Christmas shopping (or avoidance thereof), organizers of the Montreal International Jazz Festival have announced three concerts planned for next summer's 34th edition.


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LSBU is based at the Elephant & Castle in south London. It's an area that is always described as up and coming, and it might actually fulfil its promise soon, as it undergoes major regeneration. LSBU is doing its bit with a major investment programme. Latest developments include a £7.42m student centre, which was completed in 2012, and, in 2013, a new enterprise centre to provide startup units for students who have created their own businesses, opened as part of a £13.5m renovation project
The area has its own rough'n'tumble charm and buckets of history, and it's hard to beat the location, within easy reach of London Bridge, Southwark, the South Bank, Waterloo and Westminster. Health students can also study on a satellite campus in Havering, Essex. The student body of more than 23,500 is diverse and culturally rich, with half of students from ethnic minorities. Two-thirds of students are from the Greater London area, with the rest drawn from across the UK and internationally. Sixty-one per cent of students are aged 25 and over. Courses are built with future careers in mind – a tactic that's paying off, since graduate salaries are very good.
£9,000 for full-time undergraduate degrees taught on campus in 2014-15.
For undergraduate full-time or part-time study, students do not have to pay anything upfront.
For undergraduate students joining in the 2014-15 academic year, the University has created the London South Bank University (LSBU) National Scholarship Programme (NSP). Through the NSP, the university is offering up to 500 £2,000 cash bursaries for part-payment of fees or to spend on other university services. Eligibility depends on a student's personal income and whether they meet our eligibility criteria. Priority is given to students who are care leavers, in receipt of Special Support Grant, from one of the University's 'tier 1' partner colleges or schools, and students from lower-income families and have declared a residual household income of no more than £15,000.
The university will also offer support for care leavers of up to £1,750 for each year of study, plus a number of merit-based scholarships such as the sport scholarships, and scholarships are also available to international students
LSBU offers a range of self-catering halls and flats within 10 minutes' walk of the Southwark campus, which houses 1,400 students. The weekly rent for 2013-14 was between £109 and £134. Low-cost private accommodation is also available nearby.
Good on-site sports facilities, including a 45-station fitness suite, free-weights room, exercise class programmes, personal training, dance and exercise studio, treatment room for therapy services, a sports injury clinic, an acupuncture clinic, and access to libraries and computing resources.
Easy access to the tube, plentiful bus routes and overland rail services.
Tel: Free phone 0800 923 8888
Email: firstname.lastname@example.com
Website: lsbu.ac.uk
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Gophers Rank No. 25 to Open 2014 Season
Aug. 27, 2014
USTFCCCA National Poll | USTFCCCA Regional Rankings
NEW ORLEANS – The U.S. Track & Field and Cross Country Coaches Association (USTFCCCA) has released its 2014 USTFCCCA Division I Women's Cross County Preseason National Poll and Preseason Regional Team Rankings. Minnesota is tied for No. 25 in the nation and ranks third in the Midwest region to kick off the 2014 season.
No. 1 Michigan (342 points), No. 2 Oregon (330), No. 3 Florida State (316), No. 4 Stanford (314) and No. 5 Georgetown (311) make up the national top five while defending national champion Providence lands 18th. The No. 25 Gophers finished 20th at the 2013 NCAA national championship.
Five Big Ten Conference teams are nationally ranked to start the season as No. 6 Michigan State, No. 16 Wisconsin, No. 25 Minnesota and No. 29 Penn State join top-ranked Michigan in the preseason top 30.
The Gophers are ranked third in the Midwest region behind reigning regional champion Iowa State and second-ranked Oklahoma State. Minnesota was the runner-up at the 2013 Midwest Regional and returns 2013 all-region honoree Becca Dyson. The Gophers also return two-time all-region honoree Ashlie Decker, who redshirted the 2013 season.
Defending regional champions who start the season ranked No. 1 in their regions include Michigan (Great Lakes), Colorado (Mountain), Arkansas (South Central), Virginia (Southeast), Iowa State (Midwest), and Florida State (South).
USTFCCCA regional cross country rankings are determined subjectively by a single member coach in each respective region. The regional representative is tasked with weighing returning team strength with current-season results in determining predicted team finishes at the NCAA regional championships.
Minnesota opens the 2014 cross country season with its annual Intrasquad Meet at Les Bolstad Golf Course at 7:30 p.m. this Friday; the season officially begins with the Oz Memorial at Les Bolstad Course on Friday, Sept. 5.
2014 USTFCCCA Midwest Regional Rankings
2014 USTFCCCA Preseason National Poll
Other teams receiving votes: Boise State 22, Baylor 17, Cornell 16, Utah 15, Duke 11, Princeton 9, Texas A&M 8, Toledo 7, Alabama 5, Harvard 1, Northern Arizona 1.
More Headlines
4/27/2015Rethwisch Receives Fulbright Award
4/14/2015Gophers Honored at Golden Goldys
01/23/2015Gophers Present 2014 Team Awards
01/21/2015Five Minutes with Andie Zeman
01/14/2015Five Minutes with Kaila Urick
12/10/2014B1G Honors 18 Gophers for Academics
11/22/2014Berkholtz Leads Gophers at NCAA Meet
11/20/2014Gophers Out to Prove Themselves at NCAAs


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El Calafate, Argentina
My Rating
Great day out, good explanations, very pleasant guide and driver. The glacier is awesome.
Vilnius, Lithuania
My Rating
Beautiful area and very pleasant and informative guides!
Muscat, Oman
My Rating
Very nice tour, we made quite a number of photo stops and saw the forts at Nizwa, Bahla and Jabreen. It was a clear day and from Jabreen Fort we could see the peak of Jebel Shams, highest mountain in Oman. Guide and driver were very good, although lunchtime was a little long, 1 hour, and then toilet stops as well, so I think a bit of time was wasted. But I enjoyed it very much and thought it was good value for money.
Muscat, Oman
My Rating
Excellent tour and the guide was very informative. The vehicle was very comfortable and clean. We saw all the sights of Muscat: The mosque, corniche, fish market, Sultans Palace, and many more! Great trip.
Lisbon, Portugal
My Rating
I enjoyed these two tours very much. The trips departed on time with a small group. The guides were very informative and safe drivers. The two trips were excellent value for money. However, I do not recommend that anyone travels to Lisbon with TAP. This airline is scum. On my outward flight from Munich, we were delayed by six hours, then I was told my homeward flight was cancelled due to a pilots strike. So I rebooked with Lufthansa, cutting short my LIsbon trip, then the strike never happened. DO NOT FLY TAP.
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Hotels close to Inquisition Palace - hotels.com offers the best selection of hotels near Inquisition Palace at low competitive prices. Compare the best hotel rates for room bookings close to Inquisition Palace and enjoy last minute deals. Book your ideal hotel room today with hotels.com secure online reservation tool and look forward to comfort & quality.
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Intercontinental Cartagena De Indias
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Brandt Snedeker: Friendly, but fierce
MEDINAH, Ill. Brandt Snedeker is a rookie on the United States Ryder Cup team and Phil Mickelson has played in nine of them.
So when the needling and joking started in the American team room when this week began for the 39th Ryder Cup, you'd think that the red-headed, freckled-faced, good-natured kid from Tennessee would be in way over his head against a veteran with a psychology degree.
Not even close.
"I think that's kind of my role with Phil," Snedeker was saying on Wednesday afternoon in his first-ever Ryder Cup press conference. "As a veteran, I don't want him to walk all over me, and I want to let him know that I'm not afraid to give it back to him. … I'm keeping him in line, making sure he's ready to go by Friday, and he's doing the same for me."
Snedeker, 31, hasn't become one of the top U.S. players without having a backbone, and the recent FedEx Cup champion can easily give as good as he gets. As San Diego golf fans know, he can be as fierce as he needs to be on the golf course.
In January, Snedeker came back from seven shots down to forge a tie with Kyle Stanley on the Sunday of the Farmers Insurance Open at Torrey Pines, and then prevailed in a playoff. It set the stage for what has easily been his greatest year on the PGA Tour.
Between the ropes, Richie Cunningham he is not.
"I definitely have an edge," Snedeker said. "Anybody who knows me knows that I'm not afraid to tell people what I really think and tell people how I really feel.
"I'm a very, very competitive person. People don't get that because I'm polite. But I tee it up on Friday here … tee it up against anybody, I'm going to try to beat their brains in as bad as I can."
Now that's probably an attitude you want to have on your squad, which is why it seemed like a no-brainer for U.S. captain Davis Love III to choose Snedeker as a wild-card pick, even before Snedeker captured the Tour Championship and FedEx Cup on Sunday.
As Love tells it, every American player who already had made the team said they wanted Snedeker to be included. That's a high honor for a peer who had only two career wins entering this season. But Snedeker is popular for his friendly personality, competitive nature and his putting prowess.
This breakout season began with the victory at Torrey Pines with Snedeker coming off hip surgery in the offseason. Snedeker then played only a couple of times in a three-month span because of a rib injury. He tied for third in the British Open, but really got hot in the FedEx Cup playoffs, going second, sixth, 37th and first to overcome both Rory McIlroy and Tiger Woods to win the $10 million bonus.
"The better you play, your expectations change and your goals change," Snedeker said. "If you told me at the beginning of the year that I was going to be the FedEx Cup champion I probably would have told you I didn't see that coming. I don't see how I can be there.


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USB DVD or BD Rom with AV connectivity that will play CD DVD
by Joeworcs - 5/25/13 6:27 AM
I am looking to add a slim USB DVD or BD player behind my ES7000. Does anyone know of one that will play CD or DVD?
I have the SE-208DB and it wont play CD or DVD in AV Connectivity mode.