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Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research
E-Print Network (OSTI)
G. R. et al. Scanning transmission X-ray microscopy: A newwith the scanning transmission X-ray microscope at BESSY II.T. et al. Scanning transmission X-ray microscopy imaging of
Moffet, Ryan C.
Refractive Optics for Hard X-ray Transmission Microscopy
Science Conference Proceedings (OSTI)
For hard x-ray transmission microscopy at photon energies higher than 15 keV we design refractive condenser and imaging elements to be used with synchrotron light sources as well as with x-ray tube sources. The condenser lenses are optimized for low x-ray attenuation--resulting in apertures greater than 1 mm--and homogeneous intensity distribution on the detector plane, whereas the imaging enables high-resolution (condenser and imaging lenses are being developed. The imaging lenses (compound refractive lenses, CRLs) are made of SU-8 negative resist by deep x-ray lithography. SU-8 shows high radiation stability. The fabrication technique enables high-quality lens structures regarding surface roughness and arrangement precision with arbitrary 2D geometry. To provide point foci, crossed pairs of lenses are used. Condenser lenses have been made utilizing deep x-ray lithographic patterning of thick SU-8 layers, too, whereas in this case, the aperture is limited due to process restrictions. Thus, in terms of large apertures, condenser lenses made of structured and rolled polyimide film are more attractive. Both condenser types, x-ray mosaic lenses and rolled x-ray prism lenses (RXPLs), are considered to be implemented into a microscope setup. The x-ray optical elements mentioned above are characterized with synchrotron radiation and x-ray laboratory sources, respectively.
Simon, M.; Last, A.; Mohr, J.; Nazmov, V.; Reznikova, E. [Institute for Microstructure Technology, Karlsruhe Institute of Technology Kaiserstrasse 12, 76131 Karlsruhe (Germany); Ahrens, G.; Voigt, A. [Microresist Technology, Koepenikerstrasse 325, 12555 Berlin (Germany)
Full-field Transmission X-ray Microscopy | Stanford Synchrotron Radiation
NLE Websites -- All DOE Office Websites (Extended Search)
BL6-2c / Transmission X-ray Microscopy BL6-2c / Transmission X-ray Microscopy Home Researchers Publications Science Highlights Department of Energy Office of Science Search form Search Search TXM Search Full-field Transmission X-ray Microscopy Capabilities Full-field TXM is an excellent method to examine nanoscale heterogeneties in many materials, including complex hierarchical systems such as catalysts, fuel cells and battery electrodes, and biological and environmental samples, at 30 nm resolution.The transmission X-ray microscope (TXM) on beam line 6-2c at SSRL is capable of 2D imaging and tomography, as well as spectroscopic imaging for 2D and 3D elemental mapping and chemical mapping over tens of microns (up to mm in 2D). The field of view (FOV) is 30 microns, but mosaic images can be collected to
Scanning transmission x-ray microscopy: A new ``looking glass`` into coal chemical structure
SciTech Connect
This paper reports the use of scanning transmission x-ray microscopy to spatially map the chemistry of aromatic and aliphatic carbon functionalities in coal to a resolution of less than 0.1 {mu}m. Localized x-ray absorption spectroscopy recorded at the carbon K absorption edge was also used to facilitate analysis of variations in fundamental chemistry at maceral interfaces and within maceral boundaries.
Botto, R.E.; Cody, G.D.
Scanning transmission x-ray microscopy (STXM) combines x-ray microscopy and near edge x-ray absorption fine structure spectroscopy (NEXAFS). This combination provides spatially resolved bonding and oxidation state information. While there are reviews relevant to STXM/NEXAFS applications in other environmental fields (and magnetic materials) this chapter focuses on atmospheric aerosols. It provides an introduction to this technique in a manner approachable to non-experts. It begins with relevant background information on synchrotron radiation sources and a description of NEXAFS spectroscopy. The bulk of the chapter provides a survey of STXM/NEXAFS aerosol studies and is organized according to the type of aerosol investigated. The purpose is to illustrate the current range and recent growth of scientific investigations employing STXM-NEXAFS to probe atmospheric aerosol morphology, surface coatings, mixing states, and atmospheric processing.
Moffet, Ryan C.; Tivanski, Alexei V.; Gilles, Mary K.
A Comparison of Image Quality Evaluation Techniques for Transmission X-Ray Microscopy
Beamline 6-2c at Stanford Synchrotron Radiation Lightsource (SSRL) is capable of Transmission X-ray Microscopy (TXM) at 30 nm resolution. Raw images from the microscope must undergo extensive image processing before publication. Since typical data sets normally contain thousands of images, it is necessary to automate the image processing workflow as much as possible, particularly for the aligning and averaging of similar images. Currently we align images using the 'phase correlation' algorithm, which calculates the relative offset of two images by multiplying them in the frequency domain. For images containing high frequency noise, this algorithm will align noise with noise, resulting in a blurry average. To remedy this we multiply the images by a Gaussian function in the frequency domain, so that the algorithm ignores the high frequency noise while properly aligning the features of interest (FOI). The shape of the Gaussian is manually tuned by the user until the resulting average image is sharpest. To automatically optimize this process, it is necessary for the computer to evaluate the quality of the average image by quantifying its sharpness. In our research we explored two image sharpness metrics, the variance method and the frequency threshold method. The variance method uses the variance of the image as an indicator of sharpness while the frequency threshold method sums up the power in a specific frequency band. These metrics were tested on a variety of test images, containing both real and artificial noise. To apply these sharpness metrics, we designed and built a MATLAB graphical user interface (GUI) called 'Blur Master.' We found that it is possible for blurry images to have a large variance if they contain high amounts of noise. On the other hand, we found the frequency method to be quite reliable, although it is necessary to manually choose suitable limits for the frequency band. Further research must be performed to design an algorithm which automatically selects these parameters.
Bolgert, Peter J; /Marquette U. /SLAC
Novel Approaches to Soft X-ray Spectroscopy: Scanning TransmissionX-ray Microscopy and Ambient Pressure X-Ray PhotoelectronSpectroscopy
This workshop focused on novel spectroscopies at Beamlines 11.0.2, 5.3.2 and 9.3.2 at the ALS. The workshop brought together users from a wide range of fields to highlight recent experimental and technical developments both in scanning transmission X-ray spectroscopy (STXM) and ambient pressure photoelectron spectroscopy (APPES). The morning session featured talks on experiments involving new developments at the STXM, while the afternoon session was devoted to those using APXPS. In the morning session, Tolek Tyliszczak discussed the improved detector developments at the STXM, such as an avalanche photodiode detector and fluorescence and electron detection, as well as the continued development of in situ cells for heating, gas flow, and electrochemical cells. Of these, only the avalanche photodiode in combination with a novel multichannel photon-counting system is in routine use in time-resolved studies. Bartel Van Waeyenberge (Ghent University) presented results of magnetic imaging with a time resolution of 70-100 ps combined with a lateral resolution of 20-40 nm performed with the STXM (Beamline 11.0.2). As a complement to the time-domain ''pump-and-probe'' measurements, they developed a frequency-domain ''sine-excitation'' technique in order to study specific eigenmodes of these ferromagnetic patterns with high spatial resolution. This new approach was used to study the gyrotropic vortex motions in micron-sized ferromagnetic patterns. Adam Hitchcock (McMaster University) presented the development, in collaboration with Daniel Guay (INRS, Varennes) and Sherry Zhang, of the apparatus and techniques for applying STXM to in-situ studies of electrochemistry, in particular electrochromism in polyaniline. In addition, substantial progress was reported on a joint project to develop substrates and methods for chemically selective lithography of multilayer polymer systems. Selective patterns, such as that displayed in the figure, can now be written efficiently with the bend magnet STXM on Beamline 5.3.2. Yves Acremann (SSRL) discussed time and spatially resolved X-ray magnetic circular dichroism (XMCD) experiments on spin transfer devices at the STXM (Beamline 11.0.2). These elegant experiments explore time resolved measurements of the magnetization dynamics within a 100 x 150 nm sample influenced by a spin-polarized current. This experiment shows that the magnetization in these magnetic nanostructures are not uniform, as they are influenced by the Oersted field of the charge current needed to generate the spin current. The implementation of a novel multichannel photon counting system in combination with an avalanche photon detector decreased the data-acquisition time by a factor of 10, owing to its ability to resolve the structure of multi bunch mode. Gordon E. Brown, Jr. (Stanford University and SSRL) described ''Applications of STXM to Microbial Bioweathering and Biomineralization''. In the interaction of bacteria with ferrihydrite nanoparticles, microenvironments that were very different than the bulk material were observed, showing that bulk thermodynamics may not be useful for predicting micro phases. Gordon also presented work showing that iron nanoparticles are attracted to the negatively charged bacteria and form a coating that reduces iron oxide minerals. The afternoon session started with presentations by Simon Mun and Hendrik Bluhm, who discussed the current status and the future plans for the two APPES end-stations at the ALS, which are located at Beamlines 9.3.2 and 11.0.2, respectively. In both end-stations, samples can be measured in gaseous environments at pressures of up to several Torr, which makes possible the investigation of numerous phenomena, in particular in the fields of atmospheric and environmental science as well as heterogeneous catalysis. Specific examples of the application of APPES were shown in the following presentations. John Hemminger (University of California, Irvine) reported on APPES investigations at Beamlines 9.3.2 and 11.0.2 of the interaction of alkali halide surfaces with water. The m
Bluhm, Hendrik; Gilles, Mary K.; Mun, Simon B.; Tyliszczak, Tolek
A new bend magnet beam line for scanning transmission x-ray microscopy at the Advanced Light Source
The high brightness of the bend magnets at the Advanced Light Source has been exploited to illuminate a Scanning Transmission X-ray Microscope (STXM). This is the first diffraction-limited scanning x-ray microscope to operate with useful count rate on a synchrotron bend magnet source. A simple, dedicated beam line has been built covering the range of photon energy from 250 eV to 600 eV. Ease of use and operational availability are radically improved compared to previous installations using undulator beams. This facility provides radiation for C 1s, N 1s and O 1s near edge x-ray absorption spectro-microscopy with a spectral resolution up to about 1:5000 and with STXM count rates in excess of 1 MHz.
Warwick, Tony; Ade, Harald; Kilcoyne, A.L. David; Kritscher, Michael; Tylisczcak, Tolek; Fakra, Sirine; Hitchcock, Adam P.; Hitchcock, Peter; Padmore, Howard A.
Argonne CNM: X-Ray Microscopy Capabilities
X-Ray Microscopy Facilities X-Ray Microscopy Facilities The Hard X-Ray Nanoprobe (HXN) facility provides scanning fluorescence, scanning diffraction, and full-field transmission and tomographic imaging capabilities with a spatial resolution of 30 nm over a spectral range of 6-12 keV. Modes of Operation Full-Field Transmission Imaging and Nanotomography X-ray transmission imaging uses both the absorption and phase shift of the X-ray beam by the sample as contrast mechanisms. Absorption contrast is used to map the sample density. Elemental constituents can be located by using differential edge contrast in this mode. Phase contrast can be highly sensitive to edges and interfaces even when the X-ray absorption is weak. These contrast mechanisms are exploited to image samples rapidly in full-field transmission mode under various environmental conditions, or combined with nanotomography methods to study the three-dimensional structure of complex and amorphous nanomaterials with the HXN.
X-ray transmissive debris shield
DOE Patents (OSTI)
A composite window structure is described for transmitting x-ray radiation and for shielding radiation generated debris. In particular, separate layers of different x-ray transmissive materials are laminated together to form a high strength, x-ray transmissive debris shield which is particularly suited for use in high energy fluences. In one embodiment, the composite window comprises alternating layers of beryllium and a thermoset polymer.
Spielman, Rick B. (Albuquerque, NM)
Observation of coupled vortex gyrations by 70-ps-time and 20-nm-space- resolved full-field magnetic transmission soft x-ray microscopy
We employed time-and space-resolved full-field magnetic transmission soft x-ray microscopy to observe vortex-core gyrations in a pair of dipolar-coupled vortex-state Permalloy (Ni{sub 80}Fe{sub 20}) disks. The 70 ps temporal and 20 nm spatial resolution of the microscope enabled us to simultaneously measure vortex gyrations in both disks and to resolve the phases and amplitudes of both vortex-core positions. We observed their correlation for a specific vortex-state configuration. This work provides a robust and direct method of studying vortex gyrations in dipolar-coupled vortex oscillators.
Jung, Hyunsung; Yu, Young-Sang; Lee, Ki-Suk; Im, Mi-Young; Fischer, Peter; Bocklage, Lars; Vogel, Andreas; Bolte, Markus; Meier, Guido; Kim, Sang-Koog
Classification of Multiple Types of Organic Carbon Composition in Atmospheric Particles by Scanning Transmission X-Ray Microscopy Analysis
A scanning transmission X-ray microscope at the Lawrence Berkeley National Laboratory is used to measure organic functional group abundance and morphology of atmospheric aerosols. We present a summary of spectra, sizes, and shapes observed in 595 particles that were collected and analyzed between 2000 and 2006. These particles ranged between 0.1 and 12 mm and represent aerosols found in a large range of geographical areas, altitudes, and times. They include samples from seven different field campaigns: PELTI, ACE-ASIA, DYCOMS II, Princeton, MILAGRO (urban), MILAGRO (C-130), and INTEX-B. At least 14 different classes of organic particles show different types of spectroscopic signatures. Different particle types are found within the same region while the same particle types are also found in different geographical domains. Particles chemically resembling black carbon, humic-like aerosols, pine ultisol, and secondary or processed aerosol have been identified from functional group abundance and comparison of spectra with those published in the literature.
Kilcoyne, Arthur L; Takahama, S.; Gilardoni, S.; Russell, L.M.; Kilcoyne, A.L.D.
Electron and X-Ray Microscopy: Structural Characterization of ...
Oct 28, 2009 ... Recent Advances in Structural Characterization of Materials: Electron and X-Ray Microscopy: Structural Characterization of Nanoscale�...
Biological Imaging by Soft X-Ray Diffraction Microscopy
Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in...
Cryotomography x-ray microscopy state
An x-ray microscope stage enables alignment of a sample about a rotation axis to enable three dimensional tomographic imaging of the sample using an x-ray microscope. A heat exchanger assembly provides cooled gas to a sample during x-ray microscopic imaging.
Le Gros, Mark (Berkeley, CA); Larabell, Carolyn A. (Berkeley, CA)
Phase Contrast Microscopy with Soft and Hard X-rays
Calibration Uses up part of dynamic range · Solution: Soft x-rays: Back side Illumination Hard xPhase Contrast Microscopy with Soft and Hard X-rays Using a Segmented Detector Benjamin Hornberger Phase Contrast 101 · A Segmented Detector for Hard X-ray Microprobes Segmented Silicon Chip Charge
Homes, Christopher C.
Low dose hard x-ray contact microscopy assisted by a photoelectric conversion layer
Hard x-ray contact microscopy provides images of dense samples at resolutions of tens of nanometers. However, the required beam intensity can only be delivered by synchrotron sources. We report on the use of a gold photoelectric conversion layer to lower the exposure dose by a factor of 40 to 50, allowing hard x-ray contact microscopy to be performed with a compact x-ray tube. We demonstrate the method in imaging the transmission pattern of a type of hard x-ray grating that cannot be fitted into conventional x-ray microscopes due to its size and shape. Generally the method is easy to implement and can record images of samples in the hard x-ray region over a large area in a single exposure, without some of the geometric constraints associated with x-ray microscopes based on zone-plate or other magnifying optics.
Gomella, Andrew; Martin, Eric W.; Lynch, Susanna K.; Wen, Han [Imaging Physics Laboratory, Biophysics and Biochemistry Center, National Heart, Lung and Blood Institute, National Institutes of Health, Bethesda, MD, 20892 (United States); Morgan, Nicole Y. [Intramural Research Programs, National Institute of Biomedical Imaging and Bioengineering, National Institutes of Health, Bethesda, MD, 20892 (United States)
An X-ray debris shield for use in X-ray lithography that is comprised of an X-ray window having a layer of low density foam exhibits increased longevity without a substantial increase in exposure time. The low density foam layer serves to absorb the debris emitted from the X-ray source and attenuate the shock to the window so as to reduce the chance of breakage. Because the foam is low density, the X-rays are hardly attenuated by the foam and thus the exposure time is not substantially increased.
Spielman, R.B.
X-Ray Diffraction Microscopy of Magnetic Structures
X-Ray Diffraction Microscopy of Magnetic Structures Print X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 184.108.40.206 have demonstrated a new x-ray technique for producing short-exposure nanoscale images of the magnetic structure of materials. The new method combines aspects of coherent x-ray diffraction, which can determine 3-D charge distributions, and resonant magnetic scattering, which is sensitive to magnetic structures. Physicists have used coherent x-ray diffraction to measure the electron density of complicated molecules. The formula used to make these calculations contains terms that relate to the electron spin of magnetic atoms, but these terms are traditionally ignored since coherent x-ray diffraction has not been used to retrieve magnetic information. Using the full formula allows for the determination of not only the electron density, but also the magnetic spin distribution and its orientation.
Biological Imaging by Soft X-Ray Diffraction Microscopy Print Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.
3D View Inside the Skeleton with X-ray Microscopy: Imaging Bone at the
3D View Inside the Skeleton with X-ray Microscopy: Imaging Bone 3D View Inside the Skeleton with X-ray Microscopy: Imaging Bone at the Nanoscale Scientists studying osteoporosis and other skeletal diseases are interested in the 3D structure of bone and its responses to conditions such as weightlessness, radiation (of particular interest to astronauts) and vitamin D deficiency. The current gold standard, micro-computed tomography (micro-CT), provides 3D images of trabeculae, the small interior struts of bone tissue, and electron microscopy can provide nanometer resolution of thin tissue slices. Hard X-ray transmission microscopy has provided the first 3D view of bone structure within individual trabeculae on the nanoscale. figure 1 Figure 1 Micro-CT (left) shows trabecular structure inside of bone. Transmission X-ray microscopy (TXM; center and right) can reveal localized details of osteocyte lacunae and their processes.
Biological Imaging by Soft X-Ray Biological Imaging by Soft X-Ray Diffraction Microscopy Biological Imaging by Soft X-Ray Diffraction Microscopy Print Wednesday, 30 November 2005 00:00 Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.
Sixth International Conference on X-ray Microscopy
More than 180 participants from around the world crowded the Clark Kerr Campus of the University of California, Berkeley, from August 1-6, 1999 for the Sixth International Conference on X-Ray Microscopy (XRM99). Held every three years since 1983, the XRM conferences have become the primary international forum for the presentation and discussion of advances in high-spatial-resolution x-ray imaging and applications (including the use of x-ray spectroscopic and analytical techniques) in biological and medical sciences, environmental and soil sciences, and materials and surface sciences.
Robinson, Arthur L.
Imaging of lateral spin valves with soft x-ray microscopy
We investigated Co/Cu lateral spin valves by means of high-resolution transmission soft x-ray microscopy with magnetic contrast that utilizes x-ray magnetic circular dichroism (XMCD). No magnetic XMCD contrast was observed at the Cu L{sub 3} absorption edge, which should directly image the spin accumulation in Cu. Although electrical transport measurements in a non-local geometry clearly detected the spin accumulation in Cu, which remained unchanged during illumination with circular polarized x-rays at the Co and Cu L{sub 3} absorption edges.
Mosendz, O.; Mihajlovic, G.; Pearson, J. E.; Fischer, P.; Im, M.-Y.; Bader, S. D.; Hoffmann, A.
X-ray Microscopy and Imaging (XSD-XMI)
Imaging (XMI) Imaging (XMI) About XMI Science and Research Beamlines Highlights Software and Tools Intranet Search APS... Argonne Home > Advanced Photon Source > Contacts FAQs Beamlines News Publications APS Email Portal APS Intranet APS Phonebook APS Quick Links for Users APS Safety and Training Welcome to the X-ray Microscopy and Imaging group (XMI)! X-ray Microscopy and Imaging is part of the X-ray Science Division at the Advanced Photon Source. We develop and support a diverse and multidisciplinary user research program at Sectors 2 and 32 of the APS, with the overall goal to image and study materials structures at spatial and temporal resolutions that are most scientifically relevant to the cutting-edge advances in materials, biological, environmental, and biomedical sciences. To achieve this goal, we actively engage in various research activities including
Exploring nanomagnetism with soft x-ray microscopy
Magnetic soft X-ray microscopy images magnetism in nanoscale systems with a spatial resolution down to 15nm provided by state-of-the-art Fresnel zone plate optics. X-ray magnetic circular dichroism (X-MCD) is used as element-specific magnetic contrast mechanism similar to photoemission electron microscopy (PEEM), however, with volume sensitivity and the ability to record the images in varying applied magnetic fields which allows to study magnetization reversal processes at fundamental length scales. Utilizing a stroboscopic pump-probe scheme one can investigate fast spin dynamics with a time resolution down to 70 ps which gives access to precessional and relaxation phenomena as well as spin torque driven domain wall dynamics in nanoscale systems. Current developments in zone plate optics aim for a spatial resolution towards 10nm and at next generation X-ray sources a time resolution in the fsec regime can be envisioned.
Fischer, P.; Kim, D.-H.; Mesler, B.L.; Chao, W.; Sakdinawat,A.E.; Anderson, E.H.
Advanced experimental applications for x-ray transmission gratings spectroscopy using a novel grating fabrication method
A novel fabrication method for soft x-ray transmission grating and other optical elements is presented. The method uses focused-ion-beam technology to fabricate high-quality free standing grating bars on transmission electron microscopy grids. High quality transmission gratings are obtained with superb accuracy and versatility. Using these gratings and back-illuminated CCD camera, absolutely calibrated x-ray spectra can be acquired for soft x-ray source diagnostics in the 100-3000 eV spectral range. Double grating combinations of identical or different parameters are easily fabricated, allowing advanced one-shot application of transmission grating spectroscopy. These applications include spectroscopy with different spectral resolutions, bandwidths, dynamic ranges, and may serve for identification of high-order contribution, and spectral calibrations of various x-ray optical elements.
Hurvitz, G.; Ehrlich, Y.; Shpilman, Z.; Levy, I.; Fraenkel, M. [Plasma Physics Department, Applied Physics Division, Soreq NRC, Yavne (Israel); Strum, G. [Solid State Department, Applied Physics Division, Soreq NRC, Yavne (Israel)
Phase Contrast Microscopy with Soft and Hard X-rays Using a Segmented
Phase Contrast Microscopy with Soft and Hard X-rays Using a Segmented Detector A Dissertation Contrast Microscopy with Soft and Hard X-rays Using a Segmented Detector by Benjamin Hornberger Doctor. In the hard x-ray range (multi-keV), the main focus lies on trace ele- ment mapping by x-ray fluorescence
Demonstration of 12 nm resolution Fresnel zone plate lens based soft x-ray microscopy
To extend soft x-ray microscopy to a resolution of order 10 nm or better, we developed a new nanofabrication process for Fresnel zone plate lenses. The new process, based on the double patterning technique, has enabled us to fabricate high quality gold zone plates with 12 nm outer zones. Testing of the zone plate with the full-field transmission x-ray microscope, XM-1, in Berkeley, showed that the lens clearly resolved 12 nm lines and spaces. This result represents a significant step towards 10 nm resolution and beyond.
Chao, W.; Kim, J.; Rekawa, S.; Fischer, P.; Anderson, E. H.
Transmission Electron Microscopy (TEM)
...Transmission electron microcopy (TEM) has been used since the 1950s to obtain very high resolution images of microstructures. As TEMs were enhanced to include features such as digitally scanned point beams and energy dispersive x-ray detectors
Materials Analysis by Soft x-ray Scanning Transmission X-ray ...
About this Abstract. Meeting, Materials Science & Technology 2013. Symposium, Optical and X-ray Imaging Techniques for Material Characterization.
X-ray Microscopy and Imaging: 2-BM
BM BM Introduction The 2-BM beamline offers measurement capabilities for x-ray microtomography, x-ray topography and x-ray microdiffraction. X-ray microtomography and x-ray diffraction instruments are installed on separate optical tables for independent operation with fast switch over time. Optically-coupled high-resolution CCD system is used for microtomography and topography with up to 1 micron spatial resolution. X-ray microdiffraction setup consists of KB microfocussing mirrors (~3 micron minimum spot), four-circle Huber diffractometer, high-precision translation sample stage, two orthogonally-mounted video cameras for viewing sample, fluorescence detector (Si-drift diode) and diffraction detector (a scintillation detector or a CCD). Three different levels of monochromaticity are available. Conventional monochromatic x-rays from a double-bounced Si (111) crystal monochromator (DCM, D E/E=1E-4), wide band-pass monochromatic x-rays from a double multilayer monochromator (DMM, D E/E=1~4E-2) and pink beam. The available x-ray range is from 5 keV to 30 keV. The lower limit is due to the x-ray windows and the upper limit is due to the critical angle of the x-ray mirror. Two different coatings (Cr and Pt) for the x-ray mirror allow either 20 keV or 30 keV energy cutoff.
Combined use of hard X-ray phase contrast imaging and X-ray fluorescence microscopy for sub-cellular metal quantification
Combined use of hard X-ray phase contrast imaging and X-ray fluorescence microscopy for subSurface Science Laboratory at the European Synchrotron Radiation Facility, Grenoble, France Abstract Hard X of the details of cells are undetectable in hard X-ray microscopy due to the weak absorption contrast between
Paris-Sud XI, Université de
4D Functional Materials Science with X-ray Microscopy
Ultrafast Electron Diffraction Studies of Lattice Dynamics in Thin Bismuth Films � Understanding Fatigue and Corrosion-Fatigue Behavior by In Situ 3D X-ray�...
Development of Coherent X-Ray Diffraction Microscopy and Its ...
About this Abstract. Meeting, 2010 TMS Annual Meeting & Exhibition. Symposium , Neutron and X-Ray Studies of Advanced Materials III. Presentation Title, 2010�...
The Measurement of MTFs in X-ray Microscopy Using Diffractograms
A novel method to characterize the optical performance of a high-resolution transmission x-ray microscope is presented. It makes use of test patterns that consist of random arrays of sub-resolution holes in a thin metal film, and so approximate to white-noise input signals for the microscope. The test patterns have been fabricated by electron-beam lithography at length scales appropriate for the resolution available in x-ray microscopy, so that diffractograms produced from the image data can be directly interpreted in terms of the contrast transfer function of the optical system. Results of this method are shown for both brightfield and differential phase contrast imaging.
Morrison, G. R. [King's College London, Dept. of Physics, Strand, London WC2R 2LS (United Kingdom); Charalambous, P. S. [ZonePlates Ltd, 8 South Way, Claverings Industrial Estate, London N9 0AB (United Kingdom); Gianoncelli, A.; Kaulich, B. [Sincrotrone Trieste S.C.p.A., S.S. 14, km 163.5 in Area Science Park, 34149 Trieste (Italy)
Focused ion beam patterned Fe thin films A study by selective area Stokes polarimetry and soft x-Ray microscopy
We demonstrate the potential to modify the magnetic behavior and structural properties of ferromagnetic thin films using focused ion beam 'direct-write' lithography. Patterns inspired by the split-ring resonators often used as components in meta-materials were defined upon 15 nm Fe films using a 30 keV Ga{sup +} focused ion beam at a dose of 2 x 10{sup 16} ions cm{sup -2}. Structural, chemical and magnetic changes to the Fe were studied using transmission soft X-ray microscopy at the ALS, Berkeley CA. X-ray absorption spectra showed a 23% reduction in the thickness of the film in the Ga irradiated areas, but no chemical change to the Fe was evident. X-ray images of the magnetic reversal process show domain wall pinning around the implanted areas, resulting in an overall increase in the coercivity of the film. Transmission electron microscopy showed significant grain growth in the implanted regions.
Cook, P. J.; Shen, T. H.; Grundy, P. J.; Im, M.-Y.; Fischer, P.; Morton, S. A.; Kilcoyne, A. L. D.
Viewing spin structures with soft x-ray microscopy
The spin of the electron and its associated magnetic moment marks the basic unit for magnetic properties of matter. Magnetism, in particular ferromagnetism and antiferromagnetism is described by a collective order of these spins, where the interaction between individual spins reflects a competition between exchange, anisotropy and dipolar energy terms. As a result the energetically favored ground state of a ferromagnetic system is a rather complex spin configuration, the magnetic domain structure. Magnetism is one of the eldest scientific phenomena, yet it is one of the most powerful and versatile utilized physical effects in modern technologies, such as in magnetic storage and sensor devices. To achieve highest storage density, the relevant length scales, such as the bit size in disk drives is now approaching the nanoscale and as such further developments have to deal with nanoscience phenomena. Advanced characterization tools are required to fully understand the underlying physical principles. Magnetic microscopes using polarized soft X-rays offer a close-up view into magnetism with unique features, these include elemental sensitivity due to X-ray magnetic dichroism effects as contrast mechanism, high spatial resolution provided by state-of-the-art X-ray optics and fast time resolution limited by the inherent time structure of current X-ray sources, which will be overcome with the introduction of ultrafast and high brilliant X-ray sources.
Fischer, Peter
Magnetic soft x-ray microscopy-imaging fast spin dynamics inmagnetic nanostructures
Magnetic soft X-ray microscopy combines 15nm spatial resolution with 70ps time resolution and elemental sensitivity. Fresnel zone plates are used as X-ray optics and X-ray magnetic circular dichroism serves as magnetic contrast mechanism. Thus scientifically interesting and technologically relevant low dimensional nanomagnetic systems can be imaged at fundamental length and ultrafast time scales in a unique way. Studies include magnetization reversal in magnetic multilayers, nanopatterned systems, vortex dynamics in nanoelements and spin current induced phenomena.
Fischer, Peter; Kim, Dong-Hyun; Mesler, Brooke L.; Chao, Weilun; Sakdinawat, Anne E.; Anderson, Erik H.
High Energy X-ray Diffraction Microscopy Microstructure Mapping
P1-04: 3D Microstructural Characterization of Uranium Oxide as a Surrogate Nuclear ... P1-15: Gating System Optimisation Design Study of a Cast Automobile ... P2-27: Characterization of Carbonate Rocks through X-ray Microtomography.
Silicon Fresnel zone plates for high heat load X-ray microscopy
A technique to produce diffractive X-ray lenses optimized for high heat load applications is demonstrated. The lenses are made from single crystal silicon membranes, which have uniform thermal conductivity and homogeneous thermal expansion. Silicon Fresnel ... Keywords: Electron beam lithography, Fresnel zone plate, Reactive ion etching, X-ray microscopy
J. Vila-Comamala; K. Jefimovs; J. Raabe; B. Kaulich; C. David
New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution
New Zone Plate for Soft X-Ray New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution Print Wednesday, 31 August 2005 00:00 Analytical tools that combine spatial resolution with elemental and chemical identification at the nanometer scale along with large penetration depth are indispensable for the life and physical sciences. The XM-1 soft x-ray microscope at the ALS produces images that not only reveal structures but can identify their chemical elements and measure magnetic and other properties as well. Now a new method for creating optical devices with nanoscale accuracy has allowed researchers in Berkeley Lab's Center for X-Ray Optics (CXRO), which built and operates the XM-1, to achieve an extraordinary resolution of better than 15 nm, with the promise of even higher resolution in the near future.
Schmahl, Kirz Receive Compton Award for Contributions to X-ray Microscopy
Schmahl, Kirz Received Compton Award for Contributions to X-ray Microscopy Schmahl, Kirz Received Compton Award for Contributions to X-ray Microscopy Image of Compton Award The Advanced Photon Source (APS) and APS Users Organization (APSUO) are very pleased to announce that the 2005 Arthur H. Compton Award was given to Günter Schmahl and Janos Kirz for pioneering and developing the field of x-ray microscopy using Fresnel zone plates. Because of their leadership over the last 30 years, x-ray microscopy has evolved into a powerful method for the study of nanoscale structures and phenomena in many areas of science. Their achievements have opened up productive research avenues in biology, polymers, electronic nanostructures, magnetic materials, meteoritics, and environmental sciences. " Günter Schmahl and Janos Kirz have created a
Studying Nanoscale Magnetism and its Dynamics with Soft X-ray Microscopy
Magnetic soft X-ray microscopy allows for imaging magnetic structures at a spatial resolution down to 15nm and a time resolution in the sub-100ps regime. Inherent elemental specificity can be used to image the magnetic response of individual components such as layers in multilayered systems. This review highlights current achievements and discusses the future potential of magnetic soft X-ray microscopy at fsec X-ray sources where snapshot images of ultrafast spin dynamics with a spatial resolution below 10nm will become feasible.
Mccall, Monnikue M; Fischer, Peter
New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution Print New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution Print Analytical tools that combine spatial resolution with elemental and chemical identification at the nanometer scale along with large penetration depth are indispensable for the life and physical sciences. The XM-1 soft x-ray microscope at the ALS produces images that not only reveal structures but can identify their chemical elements and measure magnetic and other properties as well. Now a new method for creating optical devices with nanoscale accuracy has allowed researchers in Berkeley Lab's Center for X-Ray Optics (CXRO), which built and operates the XM-1, to achieve an extraordinary resolution of better than 15 nm, with the promise of even higher resolution in the near future.
Stereo soft x-ray microscopy and elemental mapping of hematite and clay suspensions
The spatial arrangements of hematite particles within aqueous soil and clay samples are investigated with soft X-ray microscopy, taking advantage of the elemental contrast at the Fe-L edge around E = 707 eV. In combination with stereo microscopy, information about spatial arrangements are revealed and correlated to electrostatic interactions of the different mixtures. Manipulation of a sample mounted to the microscope is possible and particles added while imaging can be detected.
Gleber, S.-C.; Thieme, J.; Chao, W.; Fischer, P.
Standing-wave excited soft x-ray photoemission microscopy: application to Co microdot magnetic arrays
We demonstrate the addition of depth resolution to the usual two-dimensional images in photoelectron emission microscopy (PEEM), with application to a square array of circular magnetic Co microdots. The method is based on excitation with soft x-ray standing-waves generated by Bragg reflection from a multilayer mirror substrate. Standing wave is moved vertically through sample simply by varying the photon energy around the Bragg condition. Depth-resolved PEEM images were obtained for all of the observed elements. Photoemission intensities as functions of photon energy were compared to x-ray optical calculations in order to quantitatively derive the depth-resolved film structure of the sample.
Gray, Alexander; Kronast, Florian; Papp, Christian; Yang, See-Hun; Cramm, Stefan; Krug, Ingo P.; Salmassi, Farhad; Gullikson, Eric M.; Hilken, Dawn L.; Anderson, Erik H.; Fischer, Peter; Durr, Hermann A.; Schneider, Claus M.; Fadley, Charles S.
Elimination of higher-order diffraction using zigzag transmission grating in soft x-ray region
We present a realization of the sinusoidal transmission function using a series of zigzag-profiled strips where the transmission takes on the binary values 0 and 1 in a two-dimensional distribution. A zigzag transmission grating of 1000 line/mm has been fabricated and demonstrated on the soft x-ray beam of synchrotron radiation. The axial single-order diffraction indicates that the zigzag transmission grating is adequate for spectroscopic application.
Zang, H. P.; Wang, C. K. [Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan 621900 (China); Institute of Atomic and Molecular Physics, Sichuan University, Chengdu 610065 (China); Gao, Y. L.; Zhou, W. M.; Kuang, L. Y.; Wei, L.; Fan, W.; Zhang, W. H.; Zhao, Z. Q.; Cao, L. F.; Gu, Y. Q.; Zhang, B. H. [Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan 621900 (China); Jiang, G. [Institute of Atomic and Molecular Physics, Sichuan University, Chengdu 610065 (China); Zhu, X. L.; Xie, C. Q. [Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029 (China); Zhao, Y. D.; Cui, M. Q. [Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China)
X-ray intravital microscopy for functional imaging in rat hearts using synchrotron radiation coronary microangiography
An X-ray intravital microscopy technique was developed to enable in vivo visualization of the coronary, cerebral, and pulmonary arteries in rats without exposure of organs and with spatial resolution in the micrometer range and temporal resolution in the millisecond range. We have refined the system continually in terms of the spatial resolution and exposure time. X-rays transmitted through an object are detected by an X-ray direct-conversion type detector, which incorporates an X-ray SATICON pickup tube. The spatial resolution has been improved to 6 {mu}m, yielding sharp images of small arteries. The exposure time has been shortened to around 2 ms using a new rotating-disk X-ray shutter, enabling imaging of beating rat hearts. Quantitative evaluations of the X-ray intravital microscopy technique were extracted from measurements of the smallest-detectable vessel size and detection of the vessel function. The smallest-diameter vessel viewed for measurements is determined primarily by the concentration of iodinated contrast material. The iodine concentration depends on the injection technique. We used ex vivo rat hearts under Langendorff perfusion for accurate evaluation. After the contrast agent is injected into the origin of the aorta in an isolated perfused rat heart, the contrast agent is delivered directly into the coronary arteries with minimum dilution. The vascular internal diameter response of coronary arterial circulation is analyzed to evaluate the vessel function. Small blood vessels of more than about 50 {mu}m diameters were visualized clearly at heart rates of around 300 beats/min. Vasodilation compared to the control was observed quantitatively using drug manipulation. Furthermore, the apparent increase in the number of small vessels with diameters of less than about 50 {mu}m was observed after the vasoactive agents increased the diameters of invisible small blood vessels to visible sizes. This technique is expected to offer the potential for direct investigation of mechanisms of vascular dysfunctions.
Umetani, K. [Japan Synchrotron Radiation Research Institute, SPring-8, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); Fukushima, K. [National Cerebral and Cardiovascular Center Hospital, Fujishirodai, Suita-shi, Osaka 565-8565 (Japan)
Study of radiation effects on the cell structure and evaluation of the dose delivered by x-ray and {alpha}-particles microscopy
Hard X-ray fluorescence microscopy and magnified phase contrast imaging are combined to study radiation effects on cells. Experiments were performed on freeze-dried cells at the nano-imaging station ID22NI of the European synchrotron radiation facility. Quantitative phase contrast imaging provides maps of the projected mass and is used to evaluate the structural changes due to irradiation during X-ray fluorescence experiments. Complementary to phase contrast imaging, scanning transmission ion microscopy is performed and doses of all the experiments are compared. We demonstrate the sensitivity of the proposed approach to study radiation-induced damage at the sub-cellular level.
Kosior, Ewelina; Cloetens, Peter [European Synchrotron Radiation Facility, F-38000 Grenoble (France); Deves, Guillaume; Ortega, Richard [Univ. Bordeaux, CENBG, UMR 5797, F-33170 Gradignan (France); CNRS, IN2P3, CENBG, UMR 5797, F-33170 Gradignan (France); Bohic, Sylvain [European Synchrotron Radiation Facility, 38000 Grenoble (France); INSERM U-836 (Team 6: Synchrotron Radiation and Medical Research), Grenoble Institut of Neuroscience, F-38000 Grenoble (France)
Elemental and magnetic sensitive imaging using x-ray excited luminescence microscopy
We demonstrate the potential of x-ray excited luminescence microscopy for full-field elemental and magnetic sensitive imaging using a commercially available optical microscope, mounted on preexisting synchrotron radiation (SR) beamline end stations. The principal components of the instrument will be described. Bench top measurements indicate that a resolution of 1 {mu}m or better is possible; this value was degraded in practice due to vibrations and/or drift in the end station and associated manipulator. X-ray energy dependent measurements performed on model solar cell materials and lithographically patterned magnetic thin film structures reveal clear elemental and magnetic signatures. The merits of the apparatus will be discussed in terms of conventional SR imaging techniques.
Rosenberg, R. A.; Zohar, S.; Keavney, D. [Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States); Divan, R.; Rosenmann, D. [Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439 (United States); Mascarenhas, A.; Steiner, M. A. [National Renewable Energy Lab, Golden, Colorado 80401 (United States)
X-ray holographic microscopy using the atomic-force microscope
The present authors have been seeking for some time to improve the resolution of holographic microscopy and have engaged in a continuing series of experiments using the X1A soft x-ray undulator beam line at Brookhaven. The principle strategy for pushing the resolution lower in these experiments has been the use of polymer resists as x-ray detectors and the primary goal has been to develop the technique to become useful for examining wet biological material. In the present paper the authors report on progress in the use of resist for high-spatial-resolution x-ray detection. This is the key step in in-line holography and the one which sets the ultimate limit to the image resolution. The actual recording has always been quite easy, given a high-brightness undulator source, but the difficult step was the readout of the recorded pattern. The authors describe in what follows how they have built a special instrument: an atomic force microscope (AFM) to read holograms recorded in resist. They report the technical reasons for building, rather than buying, such an instrument and they give details of the design and performance of the device. The authors also describe the first attempts to use the system for real holography and the authors show results of both recorded holograms and the corresponding reconstructed images. Finally, the authors try to analyze the effect that these advances are likely to have on the future prospects for success in applications of x-ray holography and the degree to which the other technical systems that are needed for such success are available or within reach.
Howells, M.R. [Lawrence Berkeley Lab., CA (United States); Jacobsen, C.J.; Lindaas, S. [State Univ. of New York, Stony Brook, NY (United States). Physics Dept.
A soft x-ray transmission grating imaging-spectrometer for the National Ignition Facility
A soft x-ray transmission grating spectrometer has been designed for use on high energy-density physics experiments at the National Ignition Facility (NIF); coupled to one of the NIF gated x-ray detectors (GXD) it records sixteen time-gated spectra between 250 and 1000eV with 100ps temporal resolution. The trade-off between spectral and spatial resolution leads to an optimized design for measurement of emission around the peak of a 100-300eV blackbody spectrum. Performance qualification results from the NIF, the Trident Laser Facility and VUV beamline at the National Synchrotron Light Source (NSLS), evidence a <100{micro}m spatial resolution in combination with a source-size limited spectral resolution that is <10eV at photon energies of 300eV.
Moore, A S; Guymer, T M; Kline, J L; Morton, J; Taccetti, M; Lanier, N E; Bentley, C; Workman, J; Peterson, B; Mussack, K; Cowan, J; Prasad, R; Richardson, M; Burns, S; Kalantar, D H; Benedetti, L R; Bell, P; Bradley, D; Hsing, W; Stevenson, M
A soft x-ray transmission grating spectrometer has been designed for use on high energy-density physics experiments at the National Ignition Facility (NIF); coupled to one of the NIF gated x-ray detectors it records 16 time-gated spectra between 250 and 1000 eV with 100 ps temporal resolution. The trade-off between spectral and spatial resolution leads to an optimized design for measurement of emission around the peak of a 100-300 eV blackbody spectrum. Performance qualification results from the NIF, the Trident Laser Facility and vacuum ultraviolet beamline at the National Synchrotron Light Source, evidence a <100 {mu}m spatial resolution in combination with a source-size limited spectral resolution that is <10 eV at photon energies of 300 eV.
Moore, A. S.; Guymer, T. M.; Morton, J.; Bentley, C.; Stevenson, M. [Directorate Science and Technology, AWE Aldermaston, Reading, RG7 4PR (United Kingdom); Kline, J. L.; Taccetti, M.; Lanier, N. E.; Workman, J.; Peterson, B.; Mussack, K.; Cowan, J. [Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States); Prasad, R.; Richardson, M.; Burns, S.; Kalantar, D. H.; Benedetti, L. R.; Bell, P.; Bradley, D.; Hsing, W. [Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, California 94551-0808 (United States)
Refractive optical elements and optical system for high energy x-ray microscopy
In material science, X-ray radiation with photon energies above 25 keV is used because of its penetration into high density materials. Research of the inner structure of novel materials, such as electrodes in high power batteries for engines, require X-ray microscopes operating in the hard X-ray energy range. A flexible X-ray microscope for hard X-rays with photon energies higher than 25 keV will be realized at the synchrotron source ANKA in Karlsruhe, Germany. The device will use refractive X-ray lenses as condenser as well as objective lenses.
Simon, M.; Altapova, V.; Baumbach, T.; Kluge, M.; Last, A.; Marschall, F.; Mohr, J.; Nazmov, V.; Vogt, H. [Karlsruhe Institute of Technology, Institute of Microstructure Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen (Germany); Karlsruhe Institute of Technology, Laboratory for Applications of Synchrotron Radiation, Engesser Strasse 15, 76131 Karlsruhe (Germany); Karlsruhe Institute of Technology, Institute of Microstructure Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen (Germany)
Soft x-ray scanning transmission x-ray microscopy (STXM) of actinide particles
the Np(V,VI) solid. A plutonium elemental map was obtainedspectromicroscopy, plutonium, neptunium *Correspondingwell as for metallic plutonium. [19,20] A useful comparison
Nilsson, Hans J.; Tyliszczak, Tolek; Wilson, Richard E.; Werme, Lars; Shuh, David K.
Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ioni Beam-scanning Electron Microscopy
X-ray nanotomography and focused ion beam scanning electron microscopy (FIB-SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIB-SEM enable elemental mapping within the microstructure. Using these methods, non-destructive 3D x-ray imaging and FIB-SEM serial sectioning have been applied to compare three-dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.
G Nelson; W Harris; J Lombardo; J Izzo Jr.; W Chiu; P Tanasini; M Cantoni; J Van herle; C Comninellis; et al.
Submicrometre-Resolution Polychromatic Three-dimensional X-ray Microscopy
The ability to study the structure, microstructure and evolution of materials with increasing spatial resolution is fundamental to achieving a full understanding of the underlying science of materials. Polychromatic three-dimensional X-ray microscopy (3DXM) is a recently developed nondestructive diffraction technique that enables crystallographic phase identification, determination of local crystal orientations, grain morphologies, grain interface types and orientations, and in favorable cases direct determination of the deviatoric elastic strain tensor with submicrometre spatial resolution in all three dimensions. With the added capability of an energy-scanning incident beam monochromator, the determination of absolute lattice parameters is enabled, allowing specification of the complete elastic strain tensor with three- dimensional spatial resolution. The methods associated with 3DXM are described and key applications of 3DXM are discussed, including studies of deformation in single-crystal and polycrystalline metals and semiconductors, indentation deformation, thermal grain growth in polycrystalline aluminium, the metal insulator transition in nanoplatelet VO 2 , interface strengths in metal matrix composites, high-pressure science, Sn whisker growth, and electromigra- tion processes. Finally, the outlook for future developments associated with this technique is described.
Larson, Ben C [ORNL; Levine, Lyle E. [National Institute of Standards and Technology (NIST)
3D-interconnect: Visualization of extrusion and voids induced in copper-filled through-silicon vias (TSVs) at various temperatures using X-ray microscopy
Visualization of voids and copper extrusion in copper-filled through-silicon vias (TSVs) under different annealing conditions is greatly enhanced using X-ray microscopy. In addition, the dimensions of the TSVs after Cu deposition can also be measured ... Keywords: 3D X-ray tomography, 3D-interconnect, Copper extrusion, Round TSVs, TSV, Void induced, Void inspection, X-ray microscopy
LayWai Kong; Andrew C. Rudack; Peter Krueger; Ehrenfried Zschech; Sitaram Arkalgud; A. C. Diebold
The F-Area Tank Farm (FTF) Performance Assessment (PA) utilizes waste speciation in the waste release model used in the FTF fate and transport modeling. The waste release modeling associated with the residual plutonium in Tank 18 has been identified as a primary contributor to the Tank 18 dose uncertainty. In order to reduce the uncertainty related to plutonium in Tank 18, a better understanding of the plutonium speciation in the Tank 18 waste (including the oxidation state and stoichiometry) is desired. Savannah River National Laboratory (SRNL) utilized Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD) to analyze Tank 18 samples to provide information on the speciation of plutonium in the waste material. XRD analysis of the Tank 18 samples did not identify any plutonium mineral phases in the samples. These indicates the crystalline mineral phases of plutonium are below the detection limits of the XRD method or that the plutonium phase(s) lack long range order and are present as amorphous or microcrystalline solids. SEM analysis of the Tank 18 samples did locate particles containing plutonium. The plutonium was found as small particles, usually <1 {micro}m but ranging up to several micrometers in diameter, associated with particles of an iron matrix and at low concentration in other elemental matrices. This suggests the plutonium has an affinity for the iron matrix. Qualitatively, the particles of plutonium found in the SEM analysis do not appear to account for all of the plutonium in the sample based on concentrations determined from the chemical analysis of the Tank 18 samples. This suggests that plutonium is also distributed throughout the solids in low concentrations.
Hay, M.; O'Rourke, P.; Ajo, H.
High-speed X-ray Full-field Imaging Applications at the APS
Presentation Title, High-speed X-ray Full-field Imaging Applications at the APS ... Advances in Orientation Imaging Microscopy in Transmission Electron�...
Soft x-ray microscopy - a powerful analytical tool to image magnetism down to fundamental length and times scales
The magnetic properties of low dimensional solid state matter is of the utmost interest both scientifically as well as technologically. In addition to the charge of the electron which is the base for current electronics, by taking into account the spin degree of freedom in future spintronics applications open a new avenue. Progress towards a better physical understanding of the mechanism and principles involved as well as potential applications of nanomagnetic devices can only be achieved with advanced analytical tools. Soft X-ray microscopy providing a spatial resolution towards 10nm, a time resolution currently in the sub-ns regime and inherent elemental sensitivity is a very promising technique for that. This article reviews the recent achievements of magnetic soft X-ray microscopy by selected examples of spin torque phenomena, stochastical behavior on the nanoscale and spin dynamics in magnetic nanopatterns. The future potential with regard to addressing fundamental magnetic length and time scales, e.g. imaging fsec spin dynamics at upcoming X-ray sources is pointed out.
Soft X-Ray Microscopy at HZB: Zone Plate Development and Imaging Using the Third Order of Diffraction
The Helmholtz-Zentrum Berlin (HZB) operates a transmission x-ray microscope (TXM) in the soft x-ray photon energy range with an energy resolution up to E/{Delta}E = 10{sup 4}. An approach to achieve ultrahigh spatial resolution with conventional, standard zone plate optics is to employ higher orders of diffraction of the zone plate objective. In this paper, we demonstrate that 11-nm lines and spaces of a multilayer test structure are clearly resolved by the x-ray microscope using the third order of diffraction of a zone plate objective with 20-nm outermost zone width. The disadvantage of high-order imaging is an about one order of magnitude lower diffraction efficiency of the used zone plates employed in the third order compared to the first order of diffraction. In addition, the measured background signal in the TXM images is no longer negligible. Therefore, we worked on the fabrication of zone plates with sub-20-nm outermost zone width to increase the spatial resolution in the first order of diffraction. A new high-resolution 100-keV e-beam lithography system from VISTEC, which was recently installed at the Helmholtz-Zentrum Berlin, makes these developments possible. Initial results on zone plates with an outermost zone width down to 15 nm exposed with the new e-beam system are presented. Furthermore, the contrast transfer function of the transmission x-ray microscope operating in partial coherence mode is measured by using the first and third diffraction order of the zone plate objective.
Rehbein, S.; Guttmann, P.; Werner, S.; Schneider, G. [Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Wilhelm-Conrad-Roentgen-Campus, BESSY II, Albert-Einstein-Str. 15, 12489 Berlin (Germany)
High-reflectivity Cr/Sc multilayer condenser for compact soft x-ray microscopy
The condenser is a critical component in compact water-window x-ray microscopes as it influences the exposure time via its efficiency and the resolution via its numerical aperture. Normal-incidence multilayer mirrors can reach large geometrical collection efficiencies and match the numerical aperture of the zone plate but require advanced processing for high total reflectivity. In the present article we demonstrate large-diameter normal-incidence spherical Cr/Sc multilayer condensers with high and uniform reflectivity. Dc-magnetron sputtering was used to deposit 300 bilayers of Cr/Sc with a predetermined d-spacing matching the {lambda}=3.374 nm operating wavelength on spherical substrates. The mirrors show a uniform reflectivity of {approx}3% over the full 58 mm diameter condenser area. With these mirrors an improvement in exposure time by a factor of 10 was achieved, thereby improving the performance of the compact x-ray microscope significantly.
Stollberg, H.; Yulin, S.; Takman, P. A. C.; Hertz, H. M. [Biomedical and X-Ray Physics, Department of Applied Physics, KTH-AlbaNova, 10691 Stockholm (Sweden); Fraunhofer-Institut fur Angewandte Optik und Feinmechanik, Albert-Einstein-Strasse 7, 07745 Jena (Germany); Biomedical and X-Ray Physics, Department of Applied Physics, KTH-AlbaNova, 10691 Stockholm (Sweden)
High?resolution x?ray microscopy using an undulator source, photoelectron studies with MAXIMUM
We present the first results of high?spatial resolution x?ray imaging studies with an upgraded version of the scanning photoemission multiple application x?ray imaging undulator microscope. The microscope is a multilayercoated Schwarzschild objective that focuses undulator radiation onto the sample. The recent upgrade improved the spatial resolution by a factor six reaching a full width at half maximum value of 0.5 ?m. Highly polished mirrors reduced the diffuse background by almost two orders of magnitude and drastically improved the contrast. The improved microscope was used to perform a series of tests on microgrids and reverse Fresnel zone plates. The microscope capability to detect chemical and topological contrast was verified by using patterned metal overlayers on Si and GaAs substrates. Further improvements to increase the flux and the spatial resolution are underway; this includes the installation of a new undulator beamline.
C. Capasso; A. K. Ray?Chaudhuri; W. Ng; S. Liang; R. K. Cole; J. Wallace; F. Cerrina; G. Margaritondo; J. H. Underwood; J. B. Kortright; R. C. C. Perera
High Resolution Transmission Microscopy Characterization of an ...
High Resolution Transmission Microscopy Characterization of an Oxide ... Line Dislocation Dynamics Simulation of fundamental dislocation properties in�...
Transmission Electron Microscopy Studies on Lithium Battery ...
About this Abstract. Meeting, 2012 TMS Annual Meeting & Exhibition. Symposium , Energy Nanomaterials. Presentation Title, Transmission Electron Microscopy�...
Transmission Electron Microscopy Study of InN Nanorods
Transmission Electron Microscopy Study of InN Nanorods Z.epitaxy and studied by transmission electron microscopy,establish their quality. Transmission electron microscopy (
Liliental-Weber, Z.; Li, X.; Kryliouk, Olga; Park, H.J.; Mangum, J.; Anderson, T.
High-Energy Nanoscale-Resolution X-ray Microscopy Based on Refractive Optics on a Long Beamline
The long length and good coherence properties of ID11 at the ESRF have led to the development of x-ray microscopy based on compound refractive lenses (CRLs). For the highest resolution full-field microscopy, the sample is placed {approx}40 m from the source, which can be micro-focused by a transfocator as a condenser. Due to the long length of the beamline and consequent long sample-detector distance, a CRL objective can be placed up to a meter behind the sample and still allow for magnification of 60x on a detector located at 99 m--enough to achieve easily 100-nm resolution with a typical high-resolution detector.
Snigireva, I.; Vaughan, G. B. M.; Snigirev, A. [European Synchrotron Radiation Facility (ESRF), 38043 Grenoble (France)
Frontiers of In Situ Transmission Electron Microscopy
... significance and versatility of in situ transmission electron microscopy (TEM) has ... applied stimulus is observed as it happens inside the microscope. ...
of current third generation sources where due to themagnet source at a third generation X-ray synchrotron such
Novel Protein Crystal Growth Electrochemical Cell For Applications in X-ray Diffraction and Atomic Force Microscopy
A new crystal growth cell based on transparent indium tin oxide (ITO) glass-electrodes for electrochemically assisted protein crystallization allows for reduced nucleation and crystal quality enhancement. The crystallization behavior of lysozyme and ferritin was monitored as a function of the electric current applied to the growth cell. The X-ray diffraction analysis showed that for specific currents, the crystal quality is substantially improved. No conformational changes were observed in the 3D crystallographic structures determined for crystals grown under different electric current regimes. Finally, the strong crystal adhesion on the surface of ITO electrode because of the electroadhesion allows a sufficiently strong fixing of the protein crystals, to undergo atomic force microscopy investigations in a fluid cell.
G Gil-Alvaradejo; R Ruiz-Arellano; C Owen; A Rodriguez-Romero; E Rudino-Pinera; M Antwi; V Stojanoff; A Moreno
Scanning Transmission Electron Microscopy Investigations of Complex...
Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of...
Humidity-controlled preparation of frozen-hydrated biological samples for cryogenic coherent x-ray diffraction microscopy
Coherent x-ray diffraction microscopy (CXDM) has the potential to visualize the structures of micro- to sub-micrometer-sized biological particles, such as cells and organelles, at high resolution. Toward advancing structural studies on the functional states of such particles, here, we developed a system for the preparation of frozen-hydrated biological samples for cryogenic CXDM experiments. The system, which comprised a moist air generator, microscope, micro-injector mounted on a micromanipulator, custom-made sample preparation chamber, and flash-cooling device, allowed for the manipulation of sample particles in the relative humidity range of 20%-94%rh at 293 K to maintain their hydrated and functional states. Here, we report the details of the system and the operation procedure, including its application to the preparation of a frozen-hydrated chloroplast sample. Sample quality was evaluated through a cryogenic CXDM experiment conducted at BL29XUL of SPring-8. Taking the performance of the system and the quality of the sample, the system was suitable to prepare frozen-hydrated biological samples for cryogenic CXDM experiments.
Takayama, Yuki; Nakasako, Masayoshi [Department of Physics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Kanagawa 223-8522 (Japan); RIKEN Harima Institute/SPring-8, 1-1-1 Kouto, Mikaduki, Sayo, Hyogo 679-5148 (Japan)
Research and Design of a Sample Heater for Beam Line 6-2c Transmission X-ray Microscope
There exists a need for environmental control of samples to be imaged by the Transmission X-Ray Microscope (TXM) at the SSRLs Beam Line 6-2c. In order to observe heat-driven chemical or morphological changes that normally occur in situ, microscopes require an additional component that effectively heats a given sample without heating any of the microscope elements. The confinement of the heat and other concerns about the heaters integrity limit which type of heater is appropriate for the TXM. The bulk of this research project entails researching different heating methods used previously in microscopes, but also in other industrial applications, with the goal of determining the best-fitting method, and finally in designing a preliminary sample heater.
Policht, Veronica; /Loyola U., Chicago /SLAC
Versatile plug flow catalytic cell for in situ transmission/fluorescence x-ray absorption fine structure measurements
A novel flow-through catalytic cell has been developed for in situ x-ray absorption spectroscopy (XAS) experiments on heterogeneous catalysts under working conditions and in the presence of a liquid and a gas phase. The apparatus allows to carry out XAS measurements in both the transmission and fluorescence modes, at moderate temperature (from RT to 50-80 Degree-Sign C) and low-medium gas pressure (up to 7-8 bars). The materials employed are compatible with several chemicals such as those involved in the direct synthesis of hydrogen peroxide (O{sub 2}, H{sub 2}, H{sub 2}O{sub 2}, methanol). The versatile design of the cell allows to fit it to different experimental setups in synchrotron radiation beamlines. It was used successfully for the first time to test nanostructured Pd catalysts during the direct synthesis of hydrogen peroxide (H{sub 2}O{sub 2}) in methanol solution from dihydrogen and dioxygen.
Centomo, P.; Zecca, M. [Dipartimento di Scienze Chimiche, via Marzolo 1, Universita degli Studi di Padova, 35131 Padova (Italy); Meneghini, C. [Dipartimento di Scienze, via della Vasca Navale 84, Universita di Roma TRE, 00146 Roma (Italy)
A new Scanning Transmission X-ray Microscope at the ALS for operation up to 2500eV
We report on the design and construction of a higher energy Scanning Transmission X-ray Microscope on a new bend magnet beam line at the Advanced Light Source. Previously we have operated such an instrument on a bend magnet for C, N and O 1s NEXAFS spectroscopy. The new instrument will have similar performance at higher energies up to and including the S 1s edge at 2472eV. A new microscope configuration is planned. A more open geometry will allow a fluorescence detector to count emitted photons from the front surface of the sample. There will be a capability for zone plate scanning in addition to the more conventional sample scanning mode. This will add the capability for imaging a massive sample at high resolution over a limited field of view, so that heavy reaction cells may be used to study processes in-situ, exploiting the longer photon attenuation length and the longer zone plate working distances available at higher photon energy. The energy range will extend down to include the C1s edge at 300eV, to allow high energy NEXAFS microscopic studies to correlate with the imaging of organics in the same sample region of interest.
Kilcoyne, David; McKean, Pat; Tyliszczak, Tolek; Warwick, Tony [Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley, California (United States); Ade, Harald [Department of Physics, North Carolina State University, Raleigh, North Carolina (United States); Attwood, David [Center for Xray Optics, Lawrence Berkeley Laboratory, Berkeley, California (United States); Hitchcock, Adam [Brockhouse Institute for Materials Research, McMaster University, Hamilton, Ontario (Canada); Mitchell, Gary [DOW Chemical Company, Midland, Michigan (United States); Monteiro, Paulo [Dept. Civil and Environmental Engineering, University of California, Berkeley, California (United States)
Kilcoyne, David; Ade, Harald; Attwood, David; Hitchcock, Adam; McKean, Pat; Mitchell, Gary; Monteiro, Paulo; Tyliszczak, Tolek; Warwick, Tony
The Discovery of Broad P Cygni X-ray Lines from Circinus X-1 with the Chandra High Energy Transmission Grating Spectrometer
We present the first grating-resolution X-ray spectra of the X-ray binary Cir X-1, obtained with the High Energy Transmission Grating Spectrometer on Chandra. These reveal a rich set of lines from H-like and/or He-like Ne, Mg, Si, S and Fe detected with a high signal-to-noise ratio. The lines are broad (+/- 2000 km/s) and show P Cygni profiles. The absorption components of the lines extend to low velocity, and they have about the same widths and strengths as the corresponding emission components. The widths of the X-ray P Cygni lines are comparable to that of the broad component of the strong, asymmetric H-alpha line from Cir X-1, suggesting that the two phenomena may be related. We discuss outflow models and propose that the P Cygni profiles may arise in the moderate temperature (5 x 10^6 K) region of the wind from an X-ray heated accretion disk. This basic picture strengthens the idea that the accretion disk in Cir X-1 is viewed in a relatively edge-on manner, and it suggests that Cir X-1 is the X-ray binary analog of a Broad Absorption Line quasar.
W. N. Brandt; N. S. Schulz
Soft x-ray microanalysis and microscopy: A unique probe of the organic chemistry of heterogeneous solids
STXM and C-NEXAFS (carbon near edge absorption micro-spectroscopy) microanalysis were used to analysis the microchemistry of cokes and highly carbonaceous materials. The issue of molecular orientation is addressed by using the intrinsic polarization of the x-ray beam at X1A beamline at NSLS.
Cody, G.D.; Botto, R.E. [Argonne National Lab., IL (United States); Ade, H. [North Carolina State Univ., Raleigh, NC (United States). Dept. of Physics; Wirick, S. [SUNY at Stony Brook, NY (United States). Dept. of Physics; Davis, A.; Mitchell, G. [Pennsylvania State Univ., University Park, PA (United States). Coal and Organic Petrology Labs.
Quantitative characterization of the protein contents of the exocrine pancreatic acinar cell by soft x-ray microscopy and advanced digital imaging methods
The study of the exocrine pancreatic acinar cell has been central to the development of models of many cellular processes, especially of protein transport and secretion. Traditional methods used to examine this system have provided a wealth of qualitative information from which mechanistic models have been inferred. However they have lacked the ability to make quantitative measurements, particularly of the distribution of protein in the cell, information critical for grounding of models in terms of magnitude and relative significance. This dissertation describes the development and application of new tools that were used to measure the protein content of the major intracellular compartments in the acinar cell, particularly the zymogen granule. Soft x-ray microscopy permits image formation with high resolution and contrast determined by the underlying protein content of tissue rather than staining avidity. A sample preparation method compatible with x-ray microscopy was developed and its properties evaluated. Automatic computerized methods were developed to acquire, calibrate, and analyze large volumes of x-ray microscopic images of exocrine pancreatic tissue sections. Statistics were compiled on the protein density of several organelles, and on the protein density, size, and spatial distribution of tens of thousands of zymogen granules. The results of these measurements, and how they compare to predictions of different models of protein transport, are discussed.
Loo Jr., Billy W.
Growth and structure of water on SiO2 films on Si investigated byKelvin probe microscopy and in situ X-ray Spectroscopies
The growth of water on thin SiO{sub 2} films on Si wafers at vapor pressures between 1.5 and 4 torr and temperatures between -10 and 21 C has been studied in situ using Kelvin Probe Microscopy and X-ray photoemission and absorption spectroscopies. From 0 to 75% relative humidity (RH) water adsorbs forming a uniform film 4-5 layers thick. The surface potential increases in that RH range by about 400 mV and remains constant upon further increase of the RH. Above 75% RH the water film grows rapidly, reaching 6-7 monolayers at around 90% RH and forming a macroscopic drop near 100%. The O K-edge near-edge X-ray absorption spectrum around 75% RH is similar to that of liquid water (imperfect H-bonding coordination) at temperatures above 0 C and ice-like below 0 C.
Verdaguer, A.; Weis, C.; Oncins, G.; Ketteler, G.; Bluhm, H.; Salmeron, M.
X-ray Microscope at the ALS for operation up to 2500eV DavidLight Source [2]. In the new ALS facility the energy rangein the two existing STXMs at ALS and a flexible platform for
Kilcoyne, David
X-ray Imaging Workshop
Imaging and Spectro-microscopy: Imaging and Spectro-microscopy: the Present and the Future Stanford Synchrotron Radiation Laboratory October 8-9, 2002 Organizers: John Miao & Keith Hodgson A workshop on "X-ray Imaging and Spectro-microscopy: the Present and the Future" was held on October 8-9, 2002. This workshop, organized by John Miao (SSRL) and Keith Hodgson (SSRL) provided a forum to discuss the scientific applications of a variety of imaging and spectro-microscopic techniques, including photoemission electron microscopy (PEEM), angle resolved photoemission spectroscopy (ARPES), coherent diffraction imaging, x-ray microscopy, micro-tomography, holographic imaging, and x-ray micro-probe. Twelve invited speakers discussed the important scientific applications of these techniques, and also predicted the future scientific directions with the advance of instrumentation and x-ray sources. The workshop was well attended with over fifty registered attendees.
High resolution scanning tunnelling microscopy and extended x-ray-absorption fine structure study of the (533) silicide structure on Cu(001)
Using low energy electron diffraction (LEED), scanning tunnelling microscopy (STM) and x-ray absorption spectroscopy (XAS) techniques, we have studied the first steps of silicon adsorption onto Cu (001) single crystal substrate. For low coverage (~ 0.5 ML) and after annealing at 100{\\deg}C, STM images and LEED patterns reveal the formation of an ordered quasi commensurate superstructure. From a quantitative analysis of XAS data, we extract the Si-Cu distance and detail the local atomic arrangement of the structure.
B. Lalmi; M. Chorro; R. Belkhou
Computer analysis of four channel x-ray microscopy images to obtain source and spectral emission data on laser fusion
It is possible to analyze the images obtained from the four- channel x- ray microscope to obtain reasonable estimates of source spatial and energy emission. The technique shown here is particularly useful when relative comparisons are desired in which, from shot to shot, few parameters are changed. These data are of use in fuel pellet design and in checking design code predictions. The technique should also apply to pinhole camera data. Largest uncertainties appear to be due to film energy/handling calibration and mirror efficiency measurements. (auth)
Harper, T.L.
et al. studied wood combustion and diesel combustionrange of deposited combustion products: creosote (wood smoke
Nephila clavipes Spider Dragline Silk Microstructure Studied by Scanning Transmission X-ray Microscopy
). For a uniaxial system such as a fiber, the dichroic ratio image can then be used to calculate a map of the order structure or any periodicity along the fiber was observed at this spatial resolution. The surface of fresh by the spinning speed, STXM measurements clearly highlight microstructure differences. The slowpull fiber contains
Hitchcock, Adam P.
Synchrotron Light Source, NSLS, (Brookhaven, USA) during thehave been at the ALS or NSLS. Several new instruments aremicroscopes at the ALS and NSLS are provided elsewhere. 18-
in secondary organic aerosol. Environ. Sci. Technol. 41 ,particles from an urban aerosol. Environ. Sci. Technol. 26 ,carbonaceous atmospheric aerosols. Journal of Aerosol
X-ray microscopy of laser fusion targets in four energy bands from 0.7 to 4.0 keV
A grazing x-ray microscope was shown to be able to photograph the x-ray emission from laser-produced plasmas between 0.8 and 4.0 keV with a spatial resolution of approximately 3 microns. The calibration of the x-ray mirror energy response functions and the x-ray film allow absolute measurements of the spatial and spectral distribution of the x-ray emission from laser fusion targets. (MOW)
Boyle, M.J.; Seward, F.D.; Harper, T.L.; Koppel, L.N.; Pettipiece, K.J.; Ahlstrom, H.G.
Soft x-ray laser microscope
The program consisted of two phases (Phase I and Phase II). The goal of the Phase I (first year program) was to design and construct the Soft X-ray Laser Contact Microscope. Such microscope was constructed and adapted to PPL's 18.2nm soft X-ray Laser (SXL), which in turn was modified and prepared for microscopy experiments. Investigation of the photoresist response to 18.2nm laser radiation and transmissivity of 0.1m thick silicion-nitride (Si[sub 3]N[sub 4]) windows were important initial works. The goal of the first year of Phase II was to construct X-ray contact microscope in combination with existing optical phase microscope, already used by biologists. In the second year of Phase II study of dehydrated Horeseshoe Crab and Hela cancer cells were performed with COXRALM. Also during Phase II, the Imaging X-Ray Laser Microscope (IXRALM) was designed and constructed. This paper describes the development of each of the microscopes and their application for research.
Suckewer, P.I.
Diffraction efficiency of 200-nm-period critical-angle transmission gratings in the soft x-ray and extreme ultraviolet wavelength bands
We report on measurements of the diffraction efficiency of 200-nm-period freestanding blazed transmission gratings for wavelengths in the 0.96 to 19.4 nm range. These critical-angle transmission (CAT) gratings achieve highly efficient blazing over a broad band via total external reflection off the sidewalls of smooth, tens of nanometer thin ultrahigh aspect-ratio silicon grating bars and thus combine the advantages of blazed x-ray reflection gratings with those of more conventional x-ray transmission gratings. Prototype gratings with maximum depths of 3.2 and 6 {mu}m were investigated at two different blaze angles. In these initial CAT gratings the grating bars are monolithically connected to a cross support mesh that only leaves less than half of the grating area unobstructed. Because of our initial fabrication approach, the support mesh bars feature a strongly trapezoidal cross section that leads to varying CAT grating depths and partial absorption of diffracted orders. While theory predicts broadband absolute diffraction efficiencies as high as 60% for ideal CAT gratings without a support mesh, experimental results show efficiencies in the range of {approx}50-100% of theoretical predictions when taking the effects of the support mesh into account. Future minimization of the support mesh therefore promises broadband CAT grating absolute diffraction efficiencies of 50% or higher.
Heilmann, Ralf K.; Ahn, Minseung; Bruccoleri, Alex; Chang, Chih-Hao; Gullikson, Eric M.; Mukherjee, Pran; Schattenburg, Mark L.
Transmission electron microscopy analysis of corroded metal waste forms.
This report documents the results of analyses with transmission electron microscopy (TEM) combined with energy dispersive X-ray spectroscopy (EDS) and selected area electron diffraction (ED) of samples of metallic waste form (MWF) materials that had been subjected to various corrosion tests. The objective of the TEM analyses was to characterize the composition and microstructure of surface alteration products which, when combined with other test results, can be used to determine the matrix corrosion mechanism. The examination of test samples generated over several years has resulted in refinements to the TEM sample preparation methods developed to preserve the orientation of surface alteration layers and the underlying base metal. The preservation of microstructural spatial relationships provides valuable insight for determining the matrix corrosion mechanism and for developing models to calculate radionuclide release in repository performance models. The TEM results presented in this report show that oxide layers are formed over the exposed steel and intermetallic phases of the MWF during corrosion in aqueous solutions and humid air at elevated temperatures. An amorphous non-stoichiometric ZrO{sub 2} layer forms at the exposed surfaces of the intermetallic phases, and several nonstoichiometric Fe-O layers form over the steel phases in the MWF. These oxide layers adhere strongly to the underlying metal, and may be overlain by one or more crystalline Fe-O phases that probably precipitated from solution. The layer compositions are consistent with a corrosion mechanism of oxidative dissolution of the steel and intermetallic phases. The layers formed on the steel and intermetallic phases form a continuous layer over the exposed waste form, although vertical splits in the layer and corrosion in pits and crevices were seen in some samples. Additional tests and analyses are needed to verify that these layers passivate the underlying metals and if passivation can break down as the MWF corrodes. The importance of localized corrosion should also be determined.
Dietz, N. L.
Optical systems for synchrotron radiation: lecture 4. Soft x-ray imaging systems
The history and present techniques of soft x-ray imaging are reviewed briefly. The physics of x-ray imaging is described, including the temporal and spatial coherence of x-ray sources. Particular technologies described are: contact x-ray microscopy, zone plate imaging, scanned image zone plate microscopy, scanned image reflection microscopy, and soft x-ray holography and diffraction. (LEW)
Howells, M.R.
In Situ Transmission Electron Microscopy Studies of Size
Using in situ transmission electron microscopy (TEM) nanocompression testing, we ... Ab Initio DFT Modeling of the Dislocation and Its Mobility in TiN Ceramic.
Atom Probe Tomography and Transmission Electron Microscopy ...
Abstract Scope, Atom probe tomography (APT) and analytical transmission .... of a Leaking Type 316 Socket Weld in a Boron Injection Tank Sampling Line.
Optical and X-ray Imaging Techniques for Material Characterization
Hyperspectral CARS Microscopy in the Fingerprint Region � In Situ X-ray ... Opportunities for Multimodal CARS Microscopy in Materials Science � Photoemission�...
X-ray data booklet. Revision
A compilation of data is presented. Included are properties of the elements, electron binding energies, characteristic x-ray energies, fluorescence yields for K and L shells, Auger energies, energy levels for hydrogen-, helium-, and neonlike ions, scattering factors and mass absorption coefficients, and transmission bands of selected filters. Also included are selected reprints on scattering processes, x-ray sources, optics, x-ray detectors, and synchrotron radiation facilities. (WRF)
Vaughan, D. (ed.)
Instrument Series: Microscopy Environmental Transmission Electron Microscope
Environmental Transmission Environmental Transmission Electron Microscope EMSL's environmental transmission electron microscope (ETEM) provides in situ capabilities that enable atomic-resolution imaging and spectroscopic studies of materials under dynamic operating conditions. In contrast to traditional operation of TEM under high vacuum, EMSL's ETEM uniquely allows imaging within high- temperature and gas environments-with a gas pressure up to 20 Torr. With a spherical aberration corrector for the objective lens, the ETEM captures atomic-level processes as they occur, enabling vital research across a range of scientific fields. Research Applications Chemical science and engineering - providing in situ observation of catalytic processes with atomic-level resolution Materials science and engineering - allowing
Instrument Series: Microscopy Aberration-Corrected Scanning/Transmission
Aberration-Corrected Aberration-Corrected Scanning/Transmission Electron Microscope EMSL's aberration-corrected Titan 80-300(tm) scanning/transmission electron microscope (S/TEM) provides high-resolution imaging with sub-angstrom resolution and spectroscopic capabilities. This state-of-the-art instrument is equipped with a Schottky field-emission electron source, an electron gun monochromator, CEOS hexapole spherical aberration corrector for the probe-forming lens, high-angle annular dark field (HAADF) detector, an X-ray spectrometer (EDS), and a high-resolution Gatan Imaging Filter (GIF). The selection of electron energy between 80 kV and 300 kV enables optimized imaging for a variety of samples, including electron beam sensitive materials. Research Applications
Transmission of broad W/Rh and W/Al (target/filter) x-ray beams operated at 25-49 kVp through common shielding materials
Purpose: To provide transmission data for broad 25-39 kVp (kilovolt peak) W/Rh and 25-49 kVp W/Al (target/filter, W-tungsten, Rh-rhodium, and Al-aluminum) x-ray beams through common shielding materials, such as lead, concrete, gypsum wallboard, wood, steel, and plate glass. Methods: The unfiltered W-target x-ray spectra measured on a Selenia Dimensions system (Hologic Inc., Bedford, MA) set at 20-49 kVp were, respectively, filtered using 50-{mu}m Rh and 700-{mu}m Al, and were subsequently used for Monte Carlo calculations. The transmission of broad x-ray beams through shielding materials was simulated using Geant4 low energy electromagnetic physics package with photon- and electron-processes above 250 eV, including photoelectric effect, Compton scattering, and Rayleigh scattering. The calculated transmission data were fitted using Archer equation with a robust fitting algorithm. Results: The transmission of broad x-ray beams through the above-mentioned shielding materials was calculated down to about 10{sup -5} for 25-39 kVp W/Rh and 25-49 kVp W/Al. The fitted results of {alpha}, {beta}, and {gamma} in Archer equation were provided. The {alpha} values of kVp Greater-Than-Or-Slanted-Equal-To 40 were approximately consistent with those of NCRP Report No. 147. Conclusions: These data provide inputs for the shielding designs of x-ray imaging facilities with W-anode x-ray beams, such as from Selenia Dimensions.
Li Xinhua; Zhang Da; Liu, Bob [Division of Diagnostic Imaging Physics, Department of Radiology, Massachusetts General Hospital, Boston, Massachusetts 02114 (United States)
Quantitative Analysis of Mt. St. Helens Ash by X-Ray Diffraction and X-Ray Fluorescence Spectrometry
A quantitative study by x-ray diffraction, optical polarizing microscopy, and x-ray fluorescence spectrometry of fallout and ambient ash from three Mt. St. Helens eruptions has revealed a consistent picture of the mineralogical and elemental ...
Briant L. Davis; L. Ronald Johnson; Dana T. Griffen; William Revell Phillips; Robert K. Stevens; David Maughan
Analytical Transmission Electron Microscopy in the Third Dimension
Atmospheric pressure scanning transmission electron microscopy
Scanning transmission electron microscope (STEM) images of gold nanoparticles (2.1 nm average diameter) at atmospheric pressure have been recorded through a 0.36 mm thick mixture of CO, O2 and He. This was accomplished using a reaction cell consisting of two electron-transparent silicon nitride membranes mounted on a specially designed specimen rod. Gas flow occurred through plastic tubing from the outside of the microscope to the specimen region and back. Gold nanoparticles of a full width half maximum diameter of 1.0 nm were visible above the background noise and the achieved resolution was 0.5 nm in accordance with calculations of the beam broadening.
De Jonge, Niels [ORNL; Veith, Gabriel M [ORNL; Bigelow, Wilbur C [ORNL
Scanning transmission electron microscopy of gate stacks with HfO2 dielectrics and TiN electrodes
Scanning transmission electron microscopy of gate stacksEELS) in scanning transmission electron microscopy were usedWe use scanning transmission electron microscopy (STEM)
Agustin, Melody P.; Fonseca, Leo R. C.; Hooker, Jacob C.; Stemmer, Susanne
X-Ray Topography
Sep 17, 2009 ... Stress Mapping Analysis by Ray Tracing (SMART): A New Technique ... technique of synchrotron X-ray topography, where a grid made out of�...
Overview of the program on soft x-ray lasers and their applications at Princeton
In the last several years, rapid progress in the development of soft x-ray lasers (SXL) has been observed at a number of laboratories worldwide. Although SXLs are very young'' devices they have already been used for microscopy and holography, and new ideas emerging for broader application of SXLs to microscopy, holography and lithography. This paper describes the work at Princeton University on the development of a soft x-ray imaging transmission microscopy using a SXL as a radiation source and work on the development of a novel soft x-ray reflection microscope and its application to biological cell studies and lithography. Progress in the development of a photopumped VUV laser (60 nm), and programs for the development of a small scale SXL and for the application of a powerful subpicosecond KrF laser system are also discussed. 35 refs., 9 figs., 1 tab.
Suckewer, S.; Ilcisin, K. (Princeton Univ., NJ (USA). Plasma Physics Lab. Princeton Univ., NJ (USA). Dept. of Mechanical and Aerospace Engineering)
Scanning Transmission Electron Microscopy Investigations of Complex Oxides
Scanning Transmission Electron Microscopy Investigations of Complex Oxides Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of Chemistry, University of South Carolina High-Angle-Annular-Dark-Field/Scanning Transmission Electron Microscopy (HAADF/STEM) is a technique uniquely suited for detailed studies of the structure and composition of complex oxides. The HAADF detector collects electrons which have interact inelastically with the potentials of the atoms in the specimen and therefore resembles the better known Z2 (Z is atomic number) Rutherford scattering. One class of important catalysts consists of bronzes based on pentagonal {Mo6O21} building units; these include Mo5O14 and Mo17O47. In the last 20 years, new materials doped with
X-ray beamsplitter
An x-ray beamsplitter which splits an x-ray beam into two coherent parts by reflecting and transmitting some fraction of an incident beam has applications for x-ray interferometry, x-ray holography, x-ray beam manipulation, and x-ray laser cavity output couplers. The beamsplitter is formed of a wavelength selective multilayer thin film supported by a very thin x-ray transparent membrane. The beamsplitter resonantly transmits and reflects x-rays through thin film interference effects. A thin film is formed of 5-50 pairs of alternate Mo/Si layers with a period of 20-250 A. The support membrane is 10-200 nm of silicon nitride or boron nitride. The multilayer/support membrane structure is formed across a window in a substrate by first forming the structure on a solid substrate and then forming a window in the substrate to leave a free-standing structure over the window.
Ceglio, Natale M. (Livermore, CA); Stearns, Daniel S. (Mountain View, CA); Hawryluk, Andrew M. (Modesto, CA); Barbee, Jr., Troy W. (Palo Alto, CA)
X-ray generator
Apparatus and method for producing coherent secondary x-rays that are controlled as to direction by illuminating a mixture of high z and low z gases with an intense burst of primary x-rays. The primary x-rays are produced with a laser activated plasma, and these x-rays strip off the electrons of the high z atoms in the lasing medium, while the low z atoms retain their electrons. The neutral atoms transfer electrons to highly excited states of the highly striped high z ions giving an inverted population which produces the desired coherent x-rays. In one embodiment, a laser, light beam provides a laser spark that produces the intense burst of coherent x-rays that illuminates the mixture of high z and low z gases, whereby the high z atoms are stripped while the low z ones are not, giving the desired mixture of highly ionized and neutral atoms. To this end, the laser spark is produced by injecting a laser light beam, or a plurality of beams, into a first gas in a cylindrical container having an adjacent second gas layer co-axial therewith, the laser producing a plasma and the intense primary x-rays in the first gas, and the second gas containing the high and low atomic number elements for receiving the primary x-rays, whereupon the secondary x-rays are produced therein by stripping desired ions in a neutral gas and transfer of electrons to highly excited states of the stripped ions from the unionized atoms. Means for magnetically confining and stabilizing the plasma are disclosed for controlling the direction of the x-rays.
Dawson, John M. (Los Angeles, CA)
Neutron and X-ray Scattering Investigations of Microscopic Energy ...
A Case Study in Future Energy Challenges: Towards In Situ Hard X-ray Microscopy of ... of Crystal Structure and Domain Character in Lead Free Piezoceramics.
Grain Boundary Deformation Analyzed Via X-Ray Diffraction ...
Modeling the Influence of the Second Phase Particle Spatial Distribution on Recrystallization of AA 7050 � Near-Field High Energy X-ray Diffraction Microscopy�...
End station for nanoscale magnetic materials study: Combination of scanning tunneling microscopy and soft X-ray magnetic circular dichroism spectroscopy
We have constructed an end station for nanoscale magnetic materials study at the soft X-ray beamline HiSOR BL-14 at Hiroshima Synchrotron Radiation Center. An ultrahigh-vacuum scanning tunneling microscope (STM) was installed for an in situ characterization of nanoscale magnetic materials in combination with soft X-ray magnetic circular dichroism (XMCD) spectroscopy experiment. The STM was connected to the XMCD experimental station via damper bellows to isolate it from environmental vibrations, thus achieving efficient spatial resolution for observing Si(111) surface at atomic resolution. We performed an in situ experiment with STM and XMCD spectroscopy on Co nanoclusters on an Au(111) surface and explored its practical application to investigate magnetic properties for well-characterized nanoscale magnetic materials.
Ueno, Tetsuro; Sawada, Masahiro; Namatame, Hirofumi [Hiroshima Synchrotron Radiation Center, Hiroshima University, 2-313 Kagamiyama, Higashi-Hiroshima 739-0046 (Japan); Kishimizu, Yusuke; Kimura, Akio [Graduate School of Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan); Taniguchi, Masaki [Hiroshima Synchrotron Radiation Center, Hiroshima University, 2-313 Kagamiyama, Higashi-Hiroshima 739-0046 (Japan); Graduate School of Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan)
Soft x-ray laser microscope. Final report
The program consisted of two phases (Phase I and Phase II). The goal of the Phase I (first year program) was to design and construct the Soft X-ray Laser Contact Microscope. Such microscope was constructed and adapted to PPL`s 18.2nm soft X-ray Laser (SXL), which in turn was modified and prepared for microscopy experiments. Investigation of the photoresist response to 18.2nm laser radiation and transmissivity of 0.1m thick silicion-nitride (Si{sub 3}N{sub 4}) windows were important initial works. The goal of the first year of Phase II was to construct X-ray contact microscope in combination with existing optical phase microscope, already used by biologists. In the second year of Phase II study of dehydrated Horeseshoe Crab and Hela cancer cells were performed with COXRALM. Also during Phase II, the Imaging X-Ray Laser Microscope (IXRALM) was designed and constructed. This paper describes the development of each of the microscopes and their application for research.
al. , 2005), and biomass combustion (Braun, 2005; Tivanskigenerated from biomass (wood) combustion, however, it is
Takahama, S.
Gamma Radiation & X-Rays
Gamma Radiation and X-Rays 1. Gamma radiation and X-rays are electromagnetic radiation like visible light, radio waves, and ultraviolet light. These electromagnetic radiations...
Lensless X-Ray Imaging in Reflection
Lensless X-Ray Imaging in Lensless X-Ray Imaging in Reflection Lensless X-Ray Imaging in Reflection Print Wednesday, 26 October 2011 00:00 The advent of x-ray free-electron laser (XFEL) light sources has led to an outburst of research activities in the field of lensless imaging. XFELs combine the advantages of sychrotron light sources (high brightness and x-ray wavelengths relevant to atomic and molecular phenomena) with the advantages of visible-light lasers (highly coherent beams). All of these characteristics are important for coherent x-ray diffraction imaging-lensless imaging techniques that are proving to be integral to single-shot, high-resolution imaging of both complex materials and biological samples. Existing techniques are typically designed for transmission geometry, however, and use isolated objects, requiring special sample fabrication and restricting the type of samples under investigation. Recently, researchers from the ALS and the University of Oregon have shown at ALS Beamline 12.0.2 that it is possible to form x-ray holograms in reflection geometry by using the light scattered from a sample, opening the door to lensless imaging of a wealth of new material samples.
Hard X-ray Phase Contrast -Techniques and Applications -
Hard X-ray Phase Contrast Microscopy - Techniques and Applications - A Dissertation Presented of the Graduate School ii #12;Abstract of the Dissertation Hard X-ray Phase Contrast Microscopy - Techniques . . . . . . . . . . . . . . . . . . 58 3.2.4 Reconstruction Example for Integration Method . . . . 59 3.2.5 The Imaginary Part
X-ray microtomography
In this tutorial, we describe X-ray microtomography as a technique to nondestructively characterize material microstructure in three dimensions at a micron level spatial resolution. While commercially available laboratory scale instrumentation is available, we focus our attention on synchrotron-based systems, where we can exploit a high flux, monochromatic X-ray beam to produce high fidelity three-dimensional images. A brief description of the physics and the mathematical analysis behind the technique is followed by example applications to specific materials characterization problems, with a particular focus on the utilization of three-dimensional image processing that can be used to extract a wide range of useful information.
Landis, Eric N., E-mail: email@example.com [Department of Civil and Environmental Engineering, University of Maine, 5711 Boardman Hall, Orono, Maine 04469 (United States); Keane, Denis T., E-mail: email@example.com [Department of Materials Science and Engineering, Northwestern University (United States); DND-CAT, Advanced Photon Source, Argonne National Laboratory, Bldg. 432/A002, 9700 S. Cass Ave, Argonne, Illinois 60439 (United States)
Photon Sciences | Beamlines | HXN: Hard X-ray Nanoprobe
HXN: Hard X-ray Nanoprobe HXN: Hard X-ray Nanoprobe Poster | Fact Sheet | Preliminary Design Report Scientific Scope The Hard X-ray Nanoprobe beamline and endstation instruments (HXN) will be designed and constructed to explore new frontiers of hard x-ray microscopy applications with the highest achievable spatial resolution. Currently the available spatial resolution for scientific applications, provided by scanning x-ray microscopes in the hard x-ray regime, is limited to ~50nm, which is still insufficient for probing the nanoscale interfacial structures critical in determining properties and functionalities of material and biological systems. The HXN beamline aims to enable x-ray experiments at spatial resolutions ranging from 10 to 30 nm with an ultimate goal of ~1 nm. Beamline Description
X-Ray Imaging in Reflection Print X-Ray Imaging in Reflection Print The advent of x-ray free-electron laser (XFEL) light sources has led to an outburst of research activities in the field of lensless imaging. XFELs combine the advantages of sychrotron light sources (high brightness and x-ray wavelengths relevant to atomic and molecular phenomena) with the advantages of visible-light lasers (highly coherent beams). All of these characteristics are important for coherent x-ray diffraction imaging-lensless imaging techniques that are proving to be integral to single-shot, high-resolution imaging of both complex materials and biological samples. Existing techniques are typically designed for transmission geometry, however, and use isolated objects, requiring special sample fabrication and restricting the type of samples under investigation. Recently, researchers from the ALS and the University of Oregon have shown at ALS Beamline 12.0.2 that it is possible to form x-ray holograms in reflection geometry by using the light scattered from a sample, opening the door to lensless imaging of a wealth of new material samples.
Lensless X-Ray Imaging in Reflection Print Lensless X-Ray Imaging in Reflection Print The advent of x-ray free-electron laser (XFEL) light sources has led to an outburst of research activities in the field of lensless imaging. XFELs combine the advantages of sychrotron light sources (high brightness and x-ray wavelengths relevant to atomic and molecular phenomena) with the advantages of visible-light lasers (highly coherent beams). All of these characteristics are important for coherent x-ray diffraction imaging-lensless imaging techniques that are proving to be integral to single-shot, high-resolution imaging of both complex materials and biological samples. Existing techniques are typically designed for transmission geometry, however, and use isolated objects, requiring special sample fabrication and restricting the type of samples under investigation. Recently, researchers from the ALS and the University of Oregon have shown at ALS Beamline 12.0.2 that it is possible to form x-ray holograms in reflection geometry by using the light scattered from a sample, opening the door to lensless imaging of a wealth of new material samples.
Fluctuation X-Ray Scattering
The work supported by the grant was aimed at developing novel methods of finding the structures of biomolecules using x-rays from novel sources such as the x-ray free electron laser and modern synchrotrons
Saldin, PI: D. K.; Co-I's: J. C. H. Spence and P. Fromme
X-ray Security Screening
National and International Standards for X-ray Security Screening Applications. Summary: The primary objective of this ...
Tunable X-ray source
A method for the production of X-ray bunches tunable in both time and energy level by generating multiple photon, X-ray, beams through the use of Thomson scattering. The method of the present invention simultaneously produces two X-ray pulses that are tunable in energy and/or time.
Boyce, James R. (Williamsburg, VA)
Automated Chemical Analysis of Internally Mixed Aerosol Particles Using X-ray Spectromicroscopy at the Carbon K-Edge
We have developed an automated data analysis method for atmospheric particles using scanning transmission X-ray microscopy coupled with near edge X-ray fine structure spectroscopy (STXM/NEXAFS). This method is applied to complex internally mixed submicrometer particles containing organic and inorganic material. Several algorithms were developed to exploit NEXAFS spectral features in the energy range from 278 to 320 eV for quantitative mapping of the spatial distribution of elemental carbon, organic carbon, potassium, and noncarbonaceous elements in particles of mixed composition. This energy range encompasses the carbon K-edge and potassium L2 and L3 edges. STXM/NEXAFS maps of different chemical components were complemented with a subsequent analysis using elemental maps obtained by scanning electron microscopy coupled with energy dispersive X-ray analysis (SEM/EDX). We demonstrate the application of the automated mapping algorithms for data analysis and the statistical classification of particles.
Gilles, Mary K; Moffet, R.C.; Henn, T.; Laskin, A.
Radiographic X-Ray Pulse Jitter
The Dual Beam Radiographic Facility consists of two identical radiographic sources. Major components of the machines are: Marx generator, water-filled pulse-forming line (PFL), water-filled coaxial transmission line, three-cell inductive voltage adder, and rod-pinch diode. The diode pulse has the following electrical specifications: 2.25-MV, 60-kA, 60-ns. Each source has the following x-ray parameters: 1-mm-diameter spot size, 4-rad at 1 m, 50-ns full width half max. The x-ray pulse is measured with PIN diode detectors. The sources were developed to produce high resolution images on single-shot, high-value experiments. For this application it is desirable to maintain a high level of reproducibility in source output. X-ray pulse jitter is a key metric for analysis of reproducibility. We will give measurements of x-ray jitter for each machine. It is expected that x-ray pulse jitter is predominantly due to PFL switch jitter, and therefore a correlation of the two will be discussed.
Mitton, C. V., Good, D. E., Henderson, D. J., Hogge, K. W.
Fabrication process for a gradient index x-ray lens
A process for fabricating high efficiency x-ray lenses that operate in the 0.5-4.0 keV region suitable for use in biological imaging, surface science, and x-ray lithography of integrated circuits. The gradient index x-ray optics fabrication process broadly involves co-sputtering multi-layers of film on a wire, followed by slicing and mounting on block, and then ion beam thinning to a thickness determined by periodic testing for efficiency. The process enables the fabrication of transmissive gradient index x-ray optics for the 0.5-4.0 keV energy range. This process allows the fabrication of optical elements for the next generation of imaging and x-ray lithography instruments m the soft x-ray region.
Bionta, Richard M. (Livermore, CA); Makowiecki, Daniel M. (Livermore, CA); Skulina, Kenneth M. (Livermore, CA)
A process is disclosed for fabricating high efficiency x-ray lenses that operate in the 0.5-4.0 keV region suitable for use in biological imaging, surface science, and x-ray lithography of integrated circuits. The gradient index x-ray optics fabrication process broadly involves co-sputtering multi-layers of film on a wire, followed by slicing and mounting on block, and then ion beam thinning to a thickness determined by periodic testing for efficiency. The process enables the fabrication of transmissive gradient index x-ray optics for the 0.5-4.0 keV energy range. This process allows the fabrication of optical elements for the next generation of imaging and x-ray lithography instruments in the soft x-ray region. 13 figures.
Bionta, R.M.; Makowiecki, D.M.; Skulina, K.M.
APS 7-BM Beamline: X-Ray Resources
Useful Websites Useful Websites X-Ray Interactions with Matter from CRXO at LBNL. Intuitive interface for x-ray transmission and reflectivity for a wide range of materials. X-Ray Data Booklet from LBNL. Slightly outdated in places, but many useful tables of edge energies, fluorescence lines, and crystal lattice spacings. NIST XCOM Database. Powerful database of photoelectric absorption, elastic scattering, and Compton scattering cross-sections for a wide range of materials. X-Ray Server. Maintained by Sergey Stepanov at GMCA at the APS, this website has several powerful calculators for simulating x-ray reflection and diffraction. Software X-Ray Oriented Programs (XOP). This program, written by scientists at the ESRF and APS, is widely used in the synchrotron research community.
Scanning x-ray microscope
A scanning x-ray microscope is described including: an x-ray source capable of emitting a beam of x-rays; a collimator positioned to receive the beam of x-rays and to collimate this beam, a focusing cone means to focus the beam of x-rays, directed by the collimator, onto a focal plane, a specimen mount for supporting a specimen in the focal plane to receive the focused beam of x-rays, and x-ray beam scanning means to relatively move the specimen and the focusing cone means and collimator to scan the focused x-ray beam across the specimen. A detector is disposed adjacent the specimen to detect flourescent photons emitted by the specimen upon exposure to the focused beam of x-rays to provide an electrical output representative of this detection. Means are included for displaying and/or recording the information provided by the output from the detector, as are means for providing information to the recording and/or display means representative of the scan rate and position of the focused x-ray beam relative to the specimen whereby the recording and/or display means can correlate the information received to record and/or display quantitive and distributive information as to the quantity and distribution of elements detected in the specimen. Preferably there is provided an x-ray beam modulation means upstream, relative to the direction of emission of the xray beam, of the focusing cone means.
Wang, C.
X-ray lithography source
A high-intensity, inexpensive X-ray source for X-ray lithography for the production of integrated circuits. Foil stacks are bombarded with a high-energy electron beam of 25 to 250 MeV to produce a flux of soft X-rays of 500 eV to 3 keV. Methods of increasing the total X-ray power and making the cross section of the X-ray beam uniform are described. Methods of obtaining the desired X-ray-beam field size, optimum frequency spectrum and elminating the neutron flux are all described. A method of obtaining a plurality of station operation is also described which makes the process more efficient and economical. The satisfying of these issues makes transition radiation an exellent moderate-priced X-ray source for lithography.
Piestrup, Melvin A. (Woodside, CA); Boyers, David G. (Mountain View, CA); Pincus, Cary (Sunnyvale, CA)
A high-intensity, inexpensive X-ray source for X-ray lithography for the production of integrated circuits is disclosed. Foil stacks are bombarded with a high-energy electron beam of 25 to 250 MeV to produce a flux of soft X-rays of 500 eV to 3 keV. Methods of increasing the total X-ray power and making the cross section of the X-ray beam uniform are described. Methods of obtaining the desired X-ray-beam field size, optimum frequency spectrum and eliminating the neutron flux are all described. A method of obtaining a plurality of station operation is also described which makes the process more efficient and economical. The satisfying of these issues makes transition radiation an excellent moderate-priced X-ray source for lithography. 26 figures.
Piestrup, M.A.; Boyers, D.G.; Pincus, C.
Miniature x-ray source
A miniature x-ray source capable of producing broad spectrum x-ray emission over a wide range of x-ray energies. The miniature x-ray source comprises a compact vacuum tube assembly containing a cathode, an anode, a high voltage feedthru for delivering high voltage to the anode, a getter for maintaining high vacuum, a connection for an initial vacuum pump down and crimp-off, and a high voltage connection for attaching a compact high voltage cable to the high voltage feedthru. At least a portion of the vacuum tube wall is highly x-ray transparent and made, for example, from boron nitride. The compact size and potential for remote operation allows the x-ray source, for example, to be placed adjacent to a material sample undergoing analysis or in proximity to the region to be treated for medical applications.
Trebes, James E. (Livermore, CA); Stone, Gary F. (Livermore, CA); Bell, Perry M. (Tracy, CA); Robinson, Ronald B. (Modesto, CA); Chornenky, Victor I. (Minnetonka, MN)
DOE Green Energy (OSTI)
A transmission electron microscopy (TEM) study was conducted to characterize the helium bubble distributions in tritium-charged-and-aged 304L and 21Cr-6Ni-9Mn stainless steel fusion welds containing approximately 150 appm helium-3. TEM foils were prepared from C-shaped fracture toughness test specimens containing {delta} ferrite levels ranging from 4 to 33 volume percent. The weld microstructures in the low ferrite welds consisted mostly of austenite and discontinuous, skeletal {delta} ferrite. In welds with higher levels of {delta} ferrite, the ferrite was more continuous and, in some areas of the 33 volume percent sample, was the matrix/majority phase. The helium bubble microstructures observed were similar in all samples. Bubbles were found in the austenite but not in the {delta} ferrite. In the austenite, bubbles had nucleated homogeneously in the grain interiors and heterogeneously on dislocations. Bubbles were not found on any austenite/austenite grain boundaries or at the austenite/{delta} ferrite interphase interfaces. Bubbles were not observed in the {delta} ferrite because of the combined effects of the low solubility and rapid diffusion of tritium through the {delta} ferrite which limited the amount of helium present to form visible bubbles.
Tosten, M; Michael Morgan, M
Synchrotron X-ray Measurements
... fine structure (EXAFS) spectroscopy; (3) variable kinetic energy X-ray ... advanced materials is critical to the development and optimization of products ...
X-ray Absorption Spectroscopy
This review gives a brief description of the theory and application of X-ray absorption spectroscopy, both X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS), especially, pertaining to photosynthesis. The advantages and limitations of the methods are discussed. Recent advances in extended EXAFS and polarized EXAFS using oriented membranes and single crystals are explained. Developments in theory in understanding the XANES spectra are described. The application of X-ray absorption spectroscopy to the study of the Mn4Ca cluster in Photosystem II is presented.
Yano, Junko; Yachandra, Vittal K.
Epitaxial BaTiO{sub 3}(100) films on Pt(100): A low-energy electron diffraction, scanning tunneling microscopy, and x-ray photoelectron spectroscopy study
The growth of epitaxial ultrathin BaTiO{sub 3} films on a Pt(100) substrate has been studied by scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), and x-ray photoelectron spectroscopy (XPS). The films have been prepared by radio-frequency-assisted magnetron sputter deposition at room temperature and develop a long-range order upon annealing at 900 K in O{sub 2}. By adjusting the Ar and O{sub 2} partial pressures of the sputter gas, the stoichiometry was tuned to match that of a BaTiO{sub 3}(100) single crystal as determined by XPS. STM reveals the growth of continuous BaTiO{sub 3} films with unit cell high islands on top. With LEED already for monolayer thicknesses, the formation of a BaTiO{sub 3}(100)-(1 x 1) structure has been observed. Films of 2-3 unit cell thickness show a brilliant (1 x 1) LEED pattern for which an extended set of LEED I-V data has been acquired. At temperatures above 1050 K the BaTiO{sub 3} thin film starts to decay by formation of vacancy islands. In addition (4 x 4) and (3 x 3) surface reconstructions develop upon prolonged heating.
Foerster, Stefan; Huth, Michael; Schindler, Karl-Michael; Widdra, Wolf [Institute of Physics, Martin-Luther-Universitaet Halle-Wittenberg, Halle (Germany)
3D/4D/5D visualization of material at nano-scale using Transmission...
3D4D5D visualization of material at nano-scale using Transmission X-ray Microscopy Wednesday, May 22, 2013 - 3:00pm SLAC, Redtail Hawk Conference Room 108A Yijin Liu, SSRL The...
Unexpected Angular Dependence of X-Ray Magnetic Linear Dichroism
Unexpected Angular Dependence of Unexpected Angular Dependence of X-Ray Magnetic Linear Dichroism Unexpected Angular Dependence of X-Ray Magnetic Linear Dichroism Print Wednesday, 29 August 2007 00:00 Using spectroscopic information for magnetometry and magnetic microscopy obviously requires detailed theoretical understanding of spectral shape and magnitude of dichroism signals. A research team at ALS Beamline 4.0.2 has now shown unambiguously that, contrary to common belief, spectral shape and magnitude of x-ray magnetic linear dichroism (XMLD) are not only determined by the relative orientation of magnetic moments and x-ray polarization, but their orientation relative to the crystallographic axes must be taken into account for accurate interpretation of XMLD data. Magnetism and X Rays
3D Imaging of Nickel Oxidation States using Full Field X-ray Absorption Near Edge Structure Nanotomography
Reduction-oxidation (redox) cycling of the nickel electrocatalyst phase in the solid oxide fuel cell (SOFC) anode can lead to performance degradation and cell failure. A greater understanding of nickel redox mechanisms at the microstructural level is vital to future SOFC development. Transmission x-ray microscopy (TXM) provides several key techniques for exploring oxidation states within SOFC electrode microstructure. Specifically, x-ray nanotomography and x-ray absorption near edge structure (XANES) spectroscopy have been applied to study samples of varying nickel (Ni) and nickel oxide (NiO) compositions. The imaged samples are treated as mock SOFC anodes containing distinct regions of the materials in question. XANES spectra presented for the individual materials provide a basis for the further processing and analysis of mixed samples. Images of composite samples obtained are segmented, and the distinct nickel and nickel oxide phases are uniquely identified using full field XANES spectroscopy. Applications to SOFC analysis are discussed.
Nelson, George; Harris, William; Izzo, John; Grew, Kyle N. (Connecticut); (USARL)
X-ray Microscopy and Imaging: FAQs
Frequently Asked Questions Frequently Asked Questions How to get beamtime ? 80% and more of our beamtime is awarded to General Users through the General User Proposal system. So, in order to receive beamtime for an experiment you have in mind, you would have to complete a short proposal form (specific instructions as to deadlines, etc), which can be found following this link. We are well oversubscribed, so prospective users may not get beamtime the first time they apply, but as proposals age, the score increases. Often, it is helpful for 'new' users to contact beamline staff first before submitting, so that potential pitfalls in experiments are avoided. For that purpose, you may wish to browse our webpages, and see who does what kind of science and applications, and directly email the person you think is most likely appropriate. When in doubt, you can also always send an email to Qun Shen, who then will make sure it reaches the appropriate people.
X-ray Fluorescence Analysis of a Dirty Discrete White Spot in a ...
3D Orientation Contrast Microscopy Characterization of Thermo-mechanical Fatigue ... Challenges in Data Intensive Science at Synchrotron Based 3D X-ray�...
Resonant Soft X-Ray Scattering of Tri-Block Copolymers
Resonant Soft X-Ray Scattering Resonant Soft X-Ray Scattering of Tri-Block Copolymers Resonant Soft X-Ray Scattering of Tri-Block Copolymers Print Wednesday, 30 May 2012 00:00 In principle, tri-block copolymers (tri-BCPs), consisting of three chemically distinct polymers covalently joined together at the ends of each polymer chain, can serve as scaffolds and templates for fabricating a vast number of nanostructures. While quantitatively understanding the details of the morphology and the manner in which the different blocks interact with surfaces and interfaces is critical to success, previous experiments have been few. Now, an international team from the United States, Korea, and Japan has succeeded in combining resonant soft x-ray scattering (RSoXS) at ALS Beamline 11.0.1 with transmission electron microscopy tomography (TEMT) and other techniques to unambiguously determine morphologies comprising two nested hexagonally packed arrays of nanoscopic, cylindrical microdomains in the bulk and a core-shell nanostructure in a thin film. Not only has this work revealed a new phase of ABC tri-block copolymer with complicated morphology, it has illustrated the importance of RSoXS as a unique, powerful tool for examining complex, multi-component systems that could not be characterized with conventional methods.
In Situ Transmission Electron Microscopy Characterization of Nanomaterials
With the recent development of in situ transmission electron microscopy (TEM) characterization techniques, the real time study of property-structure correlations in nanomaterials becomes possible. This dissertation reports the direct observations of deformation behavior of Al2O3-ZrO2-MgAl2O4 (AZM) bulk ceramic nanocomposites, strengthening mechanism of twins in YBa2Cu3O7-x (YBCO) thin film, work hardening event in nanocrystalline nickel and deformation of 2wt% Al doped ZnO (AZO) thin film with nanorod structures using the in situ TEM nanoindentation tool. The combined in situ movies with quantitative loading-unloading curves reveal the deformation mechanism of the above nanomaterial systems. At room temperature, in situ dynamic deformation studies show that the AZM nanocomposites undergo the deformation mainly through the grain-boundary sliding and rotation of small grains, i.e., ZrO2 grains, and some of the large grains, i.e., MgAl2O4 grains. We observed both plastic and elastic deformations in different sample regions in these multi-phase ceramic nanocomposites at room temperature. Both ex situ (conventional) and in situ nanoindentation were conducted to reveal the deformation of YBCO films from the directions perpendicular and parallel to the twin interfaces. Hardness measured perpendicular to twin interfaces is ~50% and 40% higher than that measured parallel to twin interfaces, by ex situ and in situ, respectively. By using an in situ nanoindentation tool inside TEM, dynamic work hardening event in nanocrystalline nickel was directly observed. During stain hardening stage, abundant Lomer-Cottrell (L-C) locks formed both within nanograins and against twin boundaries. Two major mechanisms were identified during interactions between L-C locks and twin boundaries. Quantitative nanoindentation experiments recorded during in situ experiments show an increase of yield strength from 1.64 to 2.29 GPa during multiple loading-unloading cycles. In situ TEM nanoindentation has been conducted to explore the size dependent deformation behavior of two different types (type I: ~ 0.51 of width/length ratio and type II: ~ 088 ratio) of AZO nanorods. During the indentation on type I nanord structure, annihilation of defects has been observed which is caused by limitation of the defect activities by relatively small size of the width. On the other hand, type II nanorod shows dislocation activities which enhanced the grain rotation under the external force applied on more isotropic direction through type II nanorod.
Lee, Joon Hwan 1977-
A miniature x-ray source utilizing a hot filament cathode. The source has a millimeter scale size and is capable of producing broad spectrum x-ray emission over a wide range of x-ray energies. The miniature source consists of a compact vacuum tube assembly containing the hot filament cathode, an anode, a high voltage feedthru for delivering high voltage to the cathode, a getter for maintaining high vacuum, a connector for initial vacuum pump down and crimp-off, and a high voltage connection for attaching a compact high voltage cable to the high voltage feedthru. At least a portion of the vacuum tube wall is fabricated from highly x-ray transparent materials, such as sapphire, diamond, or boron nitride.
Trebes, James E. (Livermore, CA); Bell, Perry M. (Tracy, CA); Robinson, Ronald B. (Modesto, CA)
Electron Microscopy | Center for Functional Nanomaterials
Electron Microscopy Facility Electron Microscopy Facility Electron Microscopy This facility consists of four top-of-the line transmission electron microscopes, two of which are highly specialized instruments capable of extreme levels of resolution, achieved through spherical aberration correction. The facility is also equipped with extensive sample-preparation capabilities. The scientific interests of the staff focus on understanding the microscopic origin of the physical and chemical behavior of materials, with specific emphasis on in-situ studies of materials in native, functional environments. Capabilities Atomic-resolution imaging of internal materials structure with scanning transmission and transmission electron microscopy Spectroscopic characterization with energy dispersive x-ray
Tokamak x ray diagnostic instrumentation
Three classes of x-ray diagnostic instruments enable measurement of a variety of tokamak physics parameters from different features of the x-ray emission spectrum. (1) The soft x-ray (1 to 50 keV) pulse-height-analysis (PHA) diagnostic measures impurity concentrations from characteristic line intensities and the continuum enhancement, and measures the electron temperature from the continuum slope. (2) The Bragg x-ray crystal spectrometer (XCS) measures the ion temperature and neutral-beam-induced toroidal rotation velocity from the Doppler broadening and wavelength shift, respectively, of spectral lines of medium-Z impurity ions. Impurity charge state distributions, precise wavelengths, and inner-shell excitation and recombination rates can also be studied. X rays are diffracted and focused by a bent crystal onto a position-sensitive detector. The spectral resolving power E/..delta..E is greater than 10/sup 4/ and time resolution is 10 ms. (3) The x-ray imaging system (XIS) measures the spatial structure of rapid fluctuations (0.1 to 100 kHZ) providing information on MHD phenomena, impurity transport rates, toroidal rotation velocity, plasma position, and the electron temperature profile. It uses an array of silicon surface-barrier diodes which view different chords of the plasma through a common slot aperture and operate in current (as opposed to counting) mode. The effectiveness of shields to protect detectors from fusion-neutron radiation effects has been studied both theoretically and experimentally.
Hill, K.W.; Beiersdorfer, P.; Bitter, M.; Fredrickson, E.; Von Goeler, S.; Hsuan, H.; Johnson, L.C.; Liew, S.L.; McGuire, K.; Pare, V.
X-ray Transition Energies Search Form
[skip navigation] X-ray Transition Energies Database Main Page Search for X-ray transition energies by element(s), transition ...
Compact x-ray source and panel
A compact, self-contained x-ray source, and a compact x-ray source panel having a plurality of such x-ray sources arranged in a preferably broad-area pixelized array. Each x-ray source includes an electron source for producing an electron beam, an x-ray conversion target, and a multilayer insulator separating the electron source and the x-ray conversion target from each other. The multi-layer insulator preferably has a cylindrical configuration with a plurality of alternating insulator and conductor layers surrounding an acceleration channel leading from the electron source to the x-ray conversion target. A power source is connected to each x-ray source of the array to produce an accelerating gradient between the electron source and x-ray conversion target in any one or more of the x-ray sources independent of other x-ray sources in the array, so as to accelerate an electron beam towards the x-ray conversion target. The multilayer insulator enables relatively short separation distances between the electron source and the x-ray conversion target so that a thin panel is possible for compactness. This is due to the ability of the plurality of alternating insulator and conductor layers of the multilayer insulators to resist surface flashover when sufficiently high acceleration energies necessary for x-ray generation are supplied by the power source to the x-ray sources.
Sampayon, Stephen E. (Manteca, CA)
Real Time in situ hard X-ray texture evolution during the annealing of rolled CuNi tapes
1 Real Time in situ hard X-ray texture evolution during the annealing of rolled CuNi tapes Antoine monochromators. It uses a white hard X ray beam and works in transmission geometry. The 2D detector allows, used as substrate for high temperature superconductor, is presented. hard X-rays; diffraction; in
Resonant Soft X-Ray Scattering of Tri-Block Copolymers Print Resonant Soft X-Ray Scattering of Tri-Block Copolymers Print In principle, tri-block copolymers (tri-BCPs), consisting of three chemically distinct polymers covalently joined together at the ends of each polymer chain, can serve as scaffolds and templates for fabricating a vast number of nanostructures. While quantitatively understanding the details of the morphology and the manner in which the different blocks interact with surfaces and interfaces is critical to success, previous experiments have been few. Now, an international team from the United States, Korea, and Japan has succeeded in combining resonant soft x-ray scattering (RSoXS) at ALS Beamline 11.0.1 with transmission electron microscopy tomography (TEMT) and other techniques to unambiguously determine morphologies comprising two nested hexagonally packed arrays of nanoscopic, cylindrical microdomains in the bulk and a core-shell nanostructure in a thin film. Not only has this work revealed a new phase of ABC tri-block copolymer with complicated morphology, it has illustrated the importance of RSoXS as a unique, powerful tool for examining complex, multi-component systems that could not be characterized with conventional methods.
Visualizing Macromolecular Complexes with In Situ Liquid Scanning Transmission Electron Microscopy
A central focus of biological research is understanding the structure/function relationship of macromolecular protein complexes. Yet conventional transmission electron microscopy techniques are limited to static observations. Here we present the first direct images of purified macromolecular protein complexes using in situ liquid scanning transmission electron microscopy. Our results establish the capability of this technique for visualizing the interface between biology and nanotechnology with high fidelity while also probing the interactions of biomolecules within solution. This method represents an important advancement towards allowing future high-resolution observations of biological processes and conformational dynamics in real-time.
Evans, James E.; Jungjohann, K. L.; Wong, Peony C. K.; Chiu, Po-Lin; Dutrow, Gavin H.; Arslan, Ilke; Browning, Nigel D.
Microgap x-ray detector
An x-ray detector which provides for the conversion of x-ray photons into photoelectrons and subsequent amplification of these photoelectrons through the generation of electron avalanches in a thin gas-filled region subject to a high electric potential. The detector comprises a cathode (photocathode) and an anode separated by the thin, gas-filled region. The cathode may comprise a substrate, such a beryllium, coated with a layer of high atomic number material, such as gold, while the anode can be a single conducting plane of material, such as gold, or a plane of resistive material, such as chromium/silicon monoxide, or multiple areas of conductive or resistive material, mounted on a substrate composed of glass, plastic or ceramic. The charge collected from each electron avalanche by the anode is passed through processing electronics to a point of use, such as an oscilloscope.
Wuest, Craig R. (Danville, CA); Bionta, Richard M. (Livermore, CA); Ables, Elden (Livermore, CA)
Single atom identification by energy dispersive x-ray spectroscopy
Using aberration-corrected scanning transmission electron microscope and energy dispersive x-ray spectroscopy, single, isolated impurity atoms of silicon and platinum in monolayer and multilayer graphene are identified. Simultaneously acquired electron energy loss spectra confirm the elemental identification. Contamination difficulties are overcome by employing near-UHV sample conditions. Signal intensities agree within a factor of two with standardless estimates.
Lovejoy, T. C.; Dellby, N.; Krivanek, O. L. [Nion, 1102 8th St., Kirkland, Washington 98033 (United States); Ramasse, Q. M. [SuperSTEM Laboratory, STFC Daresbury, Keckwick Lane, Daresbury WA4 4AD (United Kingdom); Falke, M.; Kaeppel, A.; Terborg, R. [Bruker Nano GmbH, Schwarzschildstr. 12, 12489 Berlin (Germany); Zan, R. [School of Physics and Astronomy, University of Manchester, Manchester M13 9PL (United Kingdom)
Microscopy Home Staff Only Microscopy Group Staff InstrumentationCapabilities The Advanced Microscopy Laboratory (AML) Microscopy User Centers: MAUC SHaRE Research Highlights...
Chest x-Rays | Department of Energy
Energy.gov (U.S. Department of Energy (DOE)) Indexed Site
Chest x-Rays Chest x-Rays Chest x-Rays Chest X-ray B-Reading The B-reading is a special reading of a standard chest x-ray film performed by a physician certified by the National Institute for Occupational Safety and Health (NIOSH). The reading looks for changes on the chest x-ray that may indicate exposure and disease caused by agents such as asbestos or silica. The B-reading is considered a special reading because doctors who are certified by NIOSH to perform B-readings use a specific protocol to read and record the findings as developed by the International Labour Organization (ILO). The ILO's protocol provides rules for systematically examining the x-ray in a step-by-step method and recording certain abnormalities or changes on the chest x-ray that can be attributable to
Spectral analysis of X-ray binaries
In this thesis, I present work from three separate research projects associated with observations of X-ray binaries. Two of those revolve around spectral characteristics of neutron star low-mass X-ray binaries (NS-LMXBs), ...
Fridriksson, Joel Karl
Cooled window for X-rays or charged particles
A window is disclosed that provides good structural integrity and a very high capacity for removal of the heat deposited by x-rays, electrons, or ions, with minimum attenuation of the desired beam. The window is cooled by providing microchannels therein through which a coolant is pumped. For example, the window may be made of silicon with etched microchannels therein and covered by a silicon member. A window made of silicon with a total thickness of 520 {micro}m transmits 96% of the x-rays at an energy of 60 keV, and the transmission is higher than 90% for higher energy photons. 1 fig.
Logan, C.M.
A window that provides good structural integrity and a very high capacity for removal of the heat deposited by x-rays, electrons, or ions, with minimum attenuation of the desired beam. The window is cooled by providing microchannels therein through which a coolant is pumped. For example, the window may be made of silicon with etched microchannels therein and covered by a silicon member. A window made of silicon with a total thickness of 520 .mu.m transmits 96% of the x-rays at an energy of 60 keV, and the transmission is higher than 90% for higher energy photons.
Logan, Clinton M. (Pleasanton, CA)
Synthetic CdZnTe or 'CZT' crystals can be used for the room temperature-based detection of {gamma}-radiation. Structural/morphological heterogeneities within CZT, such as twinning, inclusions, and polycrystallinity can affect detector performance. We used a synchrotron-based X-ray technique, specifically extended X-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission IR imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials.
Duff, M
Unexpected Angular Dependence of X-Ray Magnetic Linear Dichroism Print Unexpected Angular Dependence of X-Ray Magnetic Linear Dichroism Print Using spectroscopic information for magnetometry and magnetic microscopy obviously requires detailed theoretical understanding of spectral shape and magnitude of dichroism signals. A research team at ALS Beamline 4.0.2 has now shown unambiguously that, contrary to common belief, spectral shape and magnitude of x-ray magnetic linear dichroism (XMLD) are not only determined by the relative orientation of magnetic moments and x-ray polarization, but their orientation relative to the crystallographic axes must be taken into account for accurate interpretation of XMLD data. Magnetism and X Rays The ancient Greeks and also the Chinese knew about strange and rare stones with the power to attract iron. Moreover, when freely suspended these objects pointed north-south. Throughout the past, we have used this phenomenon-magnetism-for navigation and more recently for power production and digital information storage, all while trying to explore and understand its origins. In 1986 researchers at a facility similar to the ALS observed for the first time that the absorption of x rays depends not only on the composition of a material-that is, if it contains iron, nickel, or other elements-but also on its magnetism. The effect is unique in that it allows us to distinguish which atomic species magnetism originates from and provides information about their local atomic environment-for example, whether a magnetic species is surrounded by 4 or 6 oxygen atoms. A research team at the ALS has now shown that the relationship between magnetic order and absorption of x rays is even more complex and exciting than has been assumed for the past 20 years, leading to a reassessment of previous results.
New Homogeneous Standards by Atomic Layer Deposition for Synchrotron X-ray Fluorescence and Absorption Spectroscopies.
Quantification of synchrotron XRF analyses is typically done through comparisons with measurements on the NIST SRM 1832/1833 thin film standards. Unfortunately, these standards are inhomogeneous on small scales at the tens of percent level. We are synthesizing new homogeneous multilayer standards using the Atomic Layer Deposition technique and characterizing them using multiple analytical methods, including ellipsometry, Rutherford Back Scattering at Evans Analytical, Synchrotron X-ray Fluorescence (SXRF) at Advanced Photon Source (APS) Beamline 13-ID, Synchrotron X-ray Absorption Spectroscopy (XAS) at Advanced Light Source (ALS) Beamlines 11.0.2 and 18.104.22.168 and by electron microscopy techniques. Our motivation for developing much-needed cross-calibration of synchrotron techniques is borne from coordinated analyses of particles captured in the aerogel of the NASA Stardust Interstellar Dust Collector (SIDC). The Stardust Interstellar Dust Preliminary Examination (ISPE) team have characterized three sub-nanogram, {approx}1{micro}m-sized fragments considered as candidates to be the first contemporary interstellar dust ever collected, based on their chemistries and trajectories. The candidates were analyzed in small wedges of aerogel in which they were extracted from the larger collector, using high sensitivity, high spatial resolution >3 keV synchrotron x-ray fluorescence spectroscopy (SXRF) and <2 keV synchrotron x-ray transmission microscopy (STXM) during Stardust ISPE. The ISPE synchrotron techniques have complementary capabilities. Hard X-ray SXRF is sensitive to sub-fg mass of elements Z {ge} 20 (calcium) and has a spatial resolution as low as 90nm. X-ray Diffraction data were collected simultaneously with SXRF data. Soft X-ray STXM at ALS beamline 11.0.2 can detect fg-mass of most elements, including cosmochemically important oxygen, magnesium, aluminum and silicon, which are invisible to SXRF in this application. ALS beamline 11.0.2 has spatial resolution better than 25 nm. Limiting factors for Stardust STXM analyses were self-imposed limits of photon dose due to radiation damage concerns, and significant attenuation of <1500 eV X-rays by {approx}80{micro}m thick, {approx}25 mg/cm{sup 3} density silica aerogel capture medium. In practice, the ISPE team characterized the major, light elements using STXM (O, Mg, Al, Si) and the heavier minor and trace elements using SXRF. The two data sets overlapped only with minor Fe and Ni ({approx}1% mass abundance), providing few quantitative cross-checks. New improved standards for cross calibration are essential for consortium-based analyses of Stardust interstellar and cometary particles, IDPs. Indeed, they have far reaching application across the whole synchrotron-based analytical community. We have synthesized three ALD multilayers simultaneously on silicon nitride membranes and silicon and characterized them using RBS (on Si), XRF (on Si{sub 3}N{sub 4}) and STXM/XAS (holey Si{sub 3}N{sub 4}). The systems we have started to work with are Al-Zn-Fe and Y-Mg-Er. We have found these ALD multi-layers to be uniform at {micro}m- to nm scales, and have found excellent consistency between four analytical techniques so far. The ALD films can also be used as a standard for e-beam instruments, eg., TEM EELS or EDX. After some early issues with the consistency of coatings to the back-side of the membrane windows, we are confident to be able to show multi-analytical agreement to within 10%. As the precision improves, we can use the new standards to verify or improve the tabulated cross-sections.
Butterworth, A.L.; Becker, N.; Gainsforth, Z.; Lanzirotti, A.; Newville, M.; Proslier, T.; Stodolna, J.; Sutton, S.; Tyliszczak, T.; Westphal, A.J.; Zasadzinski, J. (UCB)
Heat transfer simulation and thermal measurements of microfabricated x-ray transparent heater stages
A microfabricated amorphous silicon nitride membrane-based nanocalorimeter is proposed to be suitable for an x-ray transparent sample platform with low power heating and built-in temperature sensing. In this work, thermal characterization in both air and vacuum are analyzed experimentally and via simulation. Infrared microscopy and thermoreflectance microscopy are used for thermal imaging of the sample area in air. While a reasonably large isothermal area is found on the sample area, the temperature homogeneity of the entire sample area is low, limiting use of the device as a heater stage in air or other gases. A simulation model that includes conduction, as well as radiation and convection heat loss, is presented with radiation and convection parameters determined experimentally. Simulated temperature distributions show that the homogeneity can be improved by using a thicker thermal conduction layer or reducing the pressure of the gas in the environment but neither are good solutions for the proposed use. A new simple design that has improved temperature homogeneity and a larger isothermal area while maintaining a thin thermal conduction layer is proposed and fabricated. This new design enables applications in transmission x-ray microscopes and spectroscopy setups at atmospheric pressure.
Baldasseroni, C. [Department of Materials Science and Engineering, University of California Berkeley, Berkeley, California 94720 (United States); Queen, D. R.; Cooke, David W.; Hellman, F. [Department of Physics, University of California Berkeley, Berkeley, California 94720 (United States); Maize, K.; Shakouri, A. [Department of Electrical Engineering, University of California Santa Cruz, Santa Cruz, California 95064 (United States)
Probing the spin polarization of current by soft x-ray imaging of current-induced magnetic vortex dynamics
Time-resolved soft X-ray transmission microscopy is applied to image the current-induced resonant dynamics of the magnetic vortex core realized in a micron-sized Permalloy disk. The high spatial resolution better than 25 nm enables us to observe the resonant motion of the vortex core. The result also provides the spin polarization of the current to be 0.67 {+-} 0.16 for Permalloy by fitting the experimental results with an analytical model in the framework of the spin-transfer torque.
Kasai, Shinya; Fischer, Peter; Im, Mi-Young; Yamada, Keisuke; Nakatani, Yoshinobu; Kobayashi, Kensuke; Kohno, Hiroshi; Ono, Teruo
NIST X-Ray Transition Energies
... with the International System of measurement ... titled "X-ray transition energies: new approach ... and by NIST's Systems Integration for Manufacturing ...
X-ray Line Profile Analysis
... Magnetic Composite Materials � X-Ray Studies of Structural Effects Induced by Pulsed (30 Tesla), High Magnetic Fields at the Advanced Photon Source�...
NIST: X-Ray Mass Attenuation Coefficients
... NIST reserves the right to charge for these data in the ... ?/? and the mass energy-absorption coefficient ... The tables cover energies of the photon (x-ray ...
relevant to atomic and molecular phenomena) with the advantages of visible-light lasers (highly coherent beams). All of these characteristics are important for coherent x-ray...
Hard X-Ray Quad Collimator
Technology Development and Commercialization Division One of the best ways to obtain small?size x?ray beams for structural biology research is to ...
Coated x-ray filters
A radiation filter for filtering radiation beams of wavelengths within a preselected range of wavelengths comprises a radiation transmissive substrate and an attenuating layer deposited on the substrate. The attenuating layer may be deposited by a sputtering process or a vacuum process. Beryllium may be used as the radiation transmissive substrate. In addition, a second radiation filter comprises an attenuating layer interposed between a pair of radiation transmissive layers.
Steinmeyer, Peter A. (Farmington, NM)
A radiation filter for filtering radiation beams of wavelengths within a preselected range of wavelengths comprises a radiation transmissive substrate and an attenuating layer deposited on the substrate. The attenuating layer may be deposited by a sputtering process or a vacuum process. Beryllium may be used as the radiation transmissive substrate. In addition, a second radiation filter comprises an attenuating layer interposed between a pair of radiation transmissive layers. 4 figs.
Steinmeyer, P.A.
X-Ray Multilayer Database from the LBL Center for X-Ray Optics (CXRO)
DOE Data Explorer (OSTI)
An important activity of the Center for X-ray Optics (CXRO) is research on x-ray mirrors and their use in optical devices to focus and deflect x-ray beams. The two kinds of mirrors most widely used are glancing incidence reflectors and multilayer coatings. The X-Ray Multilayer Database is based on the results of surveys taken at the biennial Physics of X-Ray Multilayer Structures conferences. It contains measured x-ray reflectances reported for various multilayers. The database is provided as a service to the x-ray and multilayer research communities and is intended to reflect the state-of-the-art in multilayer x-ray mirrors. (Specialized Interface)
X?ray Fluorescence (XRF) Assay Using Laser Compton Scattered (LCS) X?rays
Laser Compton Scattered (LCS) X?rays are produced as a result of the interaction between accelerated electrons and a laser beam. The yield of LCS X?rays is dependent on the laser power
Syed F. Naeem; Khalid Chouffani; Douglas P. Wells
X-ray spectroscopy of neutron star low-mass X-ray binaries
In this thesis, I present work spanning a variety of topics relating to neutron star lowmass X-ray binaries (LMXBs) and utilize spectral information from X-ray observations to further our understanding of these sources. ...
Krauss, Miriam Ilana
Materials Small-angle X-ray Scattering (SAXS) | Stanford Synchrotron
Materials Small-angle X-ray Scattering (SAXS) Materials Small-angle X-ray Scattering (SAXS) Small Angle X-ray Scattering for Materials Science Small-angle X-ray scattering (SAXS) is a well-established characterization method for microstructure investigations in various materials. It probes electron density differences to give information about structural inhomogeneities from the near atomic scale (1 nm) to the micron scale (1 000 nm). The method involves measuring the scattered X-ray intensity as a function of (typically small) scattering angles and is generally performed in transmission. SAXS is used to characterize the size scale of inhomogeneities (e.g. pores, inclusions, second phase regions) in polymer blends, micro-emulsions, geological materials, bones, cements and ceramics. Instrumentation
Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in crystals. In contrast to common high angle annular dark field imaging, both light and heavy atom columns are visible simultaneously. In contrast to common bright field imaging, the images are directly and robustly interpretable over a large range of thicknesses. We demonstrate this through systematic simulations and present a simple physical model to obtain some insight into the scattering dynamics.
Findlay, S. D. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); Shibata, N. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); PRESTO, Japan Science and Technology Agency, Saitama 332-0012 (Japan); Sawada, H.; Okunishi, E.; Kondo, Y. [JEOL Ltd., Tokyo 196-8558 (Japan); Yamamoto, T. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587 (Japan); Ikuhara, Y. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587 (Japan); WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)
Studying The Kinetics Of Crystalline Silicon Nanoparticle Lithiation With In-Situ Transmission Electron Microscopy
Silicon is an attractive high-capacity anode material for Li-ion batteries, but a comprehensive understanding of the massive ~300% volume change and fracture during lithiation/delithiation is necessary to reliably employ Si anodes. Here, in-situ transmission electron microscopy (TEM) of the lithiation of crystalline Si nanoparticles reveals that the reaction slows down as it progresses into the particle interior. Analysis suggests that this behavior is due to the influence of mechanical stress at the reaction front on the driving force for the reaction. These experiments give insight into the factors controlling the kinetics of this unique reaction.
Mcdowell, Matthew T.; Ryu, Ill; Lee, Seokwoo; Wang, Chong M.; Nix, William D.; Cui, Yi
The Center for X-ray Optics - Now hiring engineers. Apply Today.
Database Nanomagnetism X-Ray Microscopy EUV Lithography EUV Mask Database Nanomagnetism X-Ray Microscopy EUV Lithography EUV Mask Imaging Reflectometry Zoneplate Lenses Coherent Optics Nanofabrication Optical Coatings Engineering Education Careers Publications Contact LBNL-Logo The Center for X-Ray Optics is a multi-disciplined research group within Lawrence Berkeley National Laboratory's (LBNL) Materials Sciences Division (MSD). Notice to users. Precision Engineering Building the tools that make nanoscience possible. A high-precision stage fabricated by CXRO's Instrument Fabrication Facility Zone plates Diffractive lenses for a new generation of x-ray beamlines. SEM image of a zoneplate fabricated by CXRO Interferometry Wavefront control with sub-angstrom sensitivity Null interferogram, in preparation for EUV metrology of the SEMATECH Berkeley Microfield Exposure Tool (MET)
Hard X-ray Phase-Contrast Tomographic Nanoimaging
Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with a 3D isotropic resolution of 144 nm recently installed at the TOMCAT beamline of the Swiss Light Source. Custom optical components, including a beam-shaping condenser and phase-shifting dot arrays, were used to obtain an ideal, aperture-matched sample illumination and very sensitive phase-contrast imaging. The instrument has been successfully used for the nondestructive, volumetric investigation of single, unstained cells.
Stampanoni, M. [Paul Scherrer Institut, 5232 Villigen (Switzerland); Institute for Biomedical Engineering, University and ETH Zuerich, 8092 Zuerich (Switzerland); Marone, F.; Vila-Comamala, J.; Gorelick, S.; David, C.; Mokso, R. [Paul Scherrer Institut, 5232 Villigen (Switzerland); Trtik, P.; Jefimovs, K. [EMPA, Swiss Federal Laboratories for Materials Science and Technology, 8600 Duebendorf (Switzerland)
High-Resolution X-ray Spectroscopy
... In support of these efforts, we also maintain laboratory x-ray sources from 1 keV to 300 keV, energy and intensity calibration facilities, and a vacuum ...
X-ray grid-detector apparatus
A hybrid grid-detector apparatus for x-ray systems wherein a microchannel plate structure has an air-interspaced grid portion and a phosphor/optical fluid-filled grid portion. The grids are defined by multiple adjacent channels separated by lead-glass septa. X-rays entering the air-interspaced grid portion at an angle of impingement upon the septa are attenuated, while non-impinging x-rays pass through to the phosphor/fluid filled portion. X-ray energy is converted to luminescent energy in the phosphor/fluid filled portion and the resultant beams of light are directed out of the phosphor/optical fluid filled portion to an imaging device.
Boone, John M. (Folsom, CA); Lane, Stephen M. (Oakland, CA)
World's First Hard X-ray Laser
LCLS is the world's most powerful X-ray laser. Its highly focused beam, which arrives in staccato bursts a few quadrillionths of a second long, allows researchers to probe complex,...
X-Ray Nanoimaging: Instruments and Methods
X-Ray Nanoimaging: Instruments and Methods To be held as part of SPIE. http:spie.orgOP318 August 28-29, 2013; San Diego, California, USA...
X-ray image intensifier phosphor
Y/sub 1-x/Gd/sub x/.PO$sub 4$:Tb$sup 3+$ is an effective phosphor for use in X-ray intensifier screens and in nuclear radiation detection systems.
D' Silva, A.P.; Fassel, V.A.
Kaonic Atom X?ray Spectra
In kaonic atoms energy displacement and broadening of states result from the strong interaction. The most simple kaonic atoms like kaonic hydrogen and deuterium open the possibility to measure this strong interaction induced shift and width by x?ray spectroscopy. In the SIDDHARTA experiment al LNF (Frascati) the DA?NE electron?positron collider delivers nearly mono?energetic negatively charged kaons from ? meson decay. This unique kaon source is used to form kaonic atoms. New high performance x?ray detectors (silicon drift detectors) arranged in an array allow x?ray spectroscopy with high energy resolution combined with timing capability. High precision x?ray measurements like SIDDHARTA at LNF will open the way to study the low energy regime of the strong force in the antikaon?nucleon interaction. The experiment and its current status is presented in this talk.
J. Marton; on behalf of the SIDDHARTA Collaboration
APS Bending Magnet X-rays and
Irradiation of Nd-Fe-B Permanent Magnets with Irradiation of Nd-Fe-B Permanent Magnets with APS Bending Magnet X-rays and 60 Co γ-rays J. Alderman and P.K. Job APS Operations Division Advanced Photon Source J. Puhl Ionizing Radiation Division National Institute of Standards and Technology June 2000 Table of Contents Introduction Radiation-Induced Demagnetization of Permanent Magnets Resources Required γ-ray Irradiation Results and Analysis of γ-ray Irradiation X-ray Irradiation Results and Analysis of X-ray Irradiation Summary and Conclusions Acknowledgements References Tables and Figures Introduction The Advanced Photon Source (APS), as well as other third-generation synchrotron light sources, uses permanent magnets in the insertion devices to produce x-rays for scientific
X-Ray Scattering Group, Condensed Matter Physics & Materials...
- Brookhaven National Laboratory, Upton, NY Beamline X1A2 - Soft x-ray diffraction and nano-imaging Beamline X17 - X-ray powder diffraction Beamline X22C - Resonant x-ray...
X-Ray Emission from Compact Sources
This paper presents a review of the physical parameters of neutron stars and black holes that have been derived from X-ray observations. I then explain how these physical parameters can be used to learn about the extreme conditions occurring in regions of strong gravity, and present some recent evidence for relativistic effects seen in these systems. A glossary of commonly used terms and a short tutorial on the names of X-ray sources are also included.
Cominsky, L
Compton backscattered collimated x-ray source
A high-intensity, inexpensive and collimated x-ray source for applications such as x-ray lithography is disclosed. An intense pulse from a high power laser, stored in a high-finesse resonator, repetitively collides nearly head-on with and Compton backscatters off a bunched electron beam, having relatively low energy and circulating in a compact storage ring. Both the laser and the electron beams are tightly focused and matched at the interaction region inside the optical resonator. The laser-electron interaction not only gives rise to x-rays at the desired wavelength, but also cools and stabilizes the electrons against intrabeam scattering and Coulomb repulsion with each other in the storage ring. This cooling provides a compact, intense bunch of electrons suitable for many applications. In particular, a sufficient amount of x-rays can be generated by this device to make it an excellent and flexible Compton backscattered x-ray (CBX) source for high throughput x-ray lithography and many other applications.
Ruth, Ronald D. (Woodside, CA); Huang, Zhirong (Stanford, CA)
Compton backscattered collmated X-ray source
Opportunities for Multimodal CARS Microscopy in Materials Science
Symposium, Optical and X-ray Imaging Techniques for Material Characterization. Presentation Title, Opportunities for Multimodal CARS Microscopy in Materials�...
Inelastic X-ray and Nuclear Resonant Scattering
Beamlines Divisions Argonne Home > Advanced Photon Source > Inelastic X-ray and Nuclear Resonant Scattering The Inelastic X-ray and Nuclear Resonant Scattering group...
Sandia National Laboratories X-ray Tube with Magnetic Electron ...
... for the U.S. Department of Energy�s National ... high average power large area X-ray tube provides increased X-ray generation efficiency through ...
Copper Ridges Nearly Double X-ray Sensor Performance
... Physics Letters,* can measure X-ray energies with an ... X-rays and measure the energy based on ... by NASA and the NIST Office of Microelectronics ...
Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device
A high-speed direct electron detection system is introduced to the field of transmission electron microscopy and applied to strain measurements in semiconductor nanostructures. In particular, a focused electron probe with a diameter of 0.5 nm was scanned over a fourfold quantum layer stack with alternating compressive and tensile strain and diffracted discs have been recorded on a scintillator-free direct electron detector with a frame time of 1 ms. We show that the applied algorithms can accurately detect Bragg beam positions despite a significant point spread each 300 kV electron causes during detection on the scintillator-free camera. For millisecond exposures, we find that strain can be measured with a precision of 1.3 Multiplication-Sign 10{sup -3}, enabling, e.g., strain mapping in a 100 Multiplication-Sign 100 nm{sup 2} region with 0.5 nm resolution in 40 s.
Mueller, Knut; Rosenauer, Andreas [Institut fuer Festkoerperphysik, Universitaet Bremen, Otto-Hahn-Allee 1, 28359 Bremen (Germany); Ryll, Henning; Ordavo, Ivan; Ihle, Sebastian; Soltau, Heike [PNSensor GmbH, Roemerstrasse 28, 80803 Muenchen (Germany); Strueder, Lothar [Max-Planck-Institut Halbleiterlabor, Otto-Hahn-Ring 6, 81739 Muenchen (Germany); Volz, Kerstin [Materials Science Center and Faculty of Physics, Philipps Universitaet Marburg, Hans-Meerwein-Strasse, 35032 Marburg (Germany); Zweck, Josef [Institut fuer Experimentelle und Angewandte Physik, Universitaet Regensburg, Universitaetsstrasse 31, 93040 Regensburg (Germany)
In situ transmission electron microscopy observation of silver oxidation in ionized/atomic gas.
The interaction between silver and ionized and atomic gas was observed directly by in situ transmission electron microscopy with an environmental cell for the first time. The electron beam provides dual functions as the source of both gas ionization and imaging. The concentration of ionized gas was tuned via adjusting the current density of the electron beam. Oxidation of the silver is observed in situ, indicating the presence of ionized and/or atomic oxygen. The evolution of microstructure and phase constituents was characterized. Then the oxidation rate was measured, and the relationships among grain size, mass transport rate, and electron flux were characterized. The role of the electron beam is discussed, and the results are rationalized with respect to ex situ results from the literature.
Sun, L.; Noh, K. W.; Wen, J-G.; Dillon, S. J. (Materials Science Division); (Massachusetts Inst. Tech.); (Univ. Illinois - Urbana)
Characterization of polysilicon films by Raman spectroscopy and transmission electron microscopy: A comparative study
Samples of chemically-vapor-deposited micrometer and sub-micrometer-thick films of polysilicon were analyzed by transmission electron microscopy (TEM) in cross-section and by Raman spectroscopy with illumination at their surface. TEM and Raman spectroscopy both find varying amounts of polycrystalline and amorphous silicon in the wafers. Raman spectra obtained using blue, green and red excitation wavelengths to vary the Raman sampling depth are compared with TEM cross-sections of these films. Films showing crystalline columnar structures in their TEM micrographs have Raman spectra with a band near 497 cm{sup {minus}1} in addition to the dominant polycrystalline silicon band (521 cm{sup {minus}1}). The TEM micrographs of these films have numerous faulted regions and fringes indicative of nanometer-scale silicon structures, which are believed to correspond to the 497cm{sup {minus}1} Raman band.
Tallant, D.R.; Headley, T.J.; Medernach, J.W. [Sandia National Labs., Albuquerque, NM (United States); Geyling, F. [SEMATECH, Austin, TX (United States)
Transient x-ray diffraction and its application to materials science and x-ray optics
Time resolved x-ray diffraction and scattering have been applied to the measurement of a wide variety of physical phenomena from chemical reactions to shock wave physics. Interest in this method has heightened in recent years with the advent of versatile, high power, pulsed x-ray sources utilizing laser plasmas, electron beams and other methods. In this article, we will describe some of the fundamentals involved in time resolved x-ray diffraction, review some of the history of its development, and describe some recent progress in the field. In this article we will emphasize the use of laser-plasmas as the x-ray source for transient diffraction.
Hauer, A.A.; Kopp, R.; Cobble, J.; Kyrala, G.; Springer, R. [and others
Atomic-Scale Imaging and Spectroscopy for In Situ Liquid Scanning Transmission Electron Microscopy
Observation of growth, synthesis, dynamics and electrochemical reactions in the liquid state is an important yet largely unstudied aspect of nanotechnology. The only techniques that can potentially provide the insights necessary to advance our understanding of these mechanisms is simultaneous atomic-scale imaging and quantitative chemical analysis (through spectroscopy) under environmental conditions in the transmission electron microscope (TEM). In this study we describe the experimental and technical conditions necessary to obtain electron energy loss (EEL) spectra from a nanoparticle in colloidal suspension using aberration corrected scanning transmission electron microscopy (STEM) combined with the environmental liquid stage. At a fluid path length below 400 nm, atomic resolution images can be obtained and simultaneous compositional analysis can be achieved. We show that EEL spectroscopy can be used to quantify the total fluid path length around the nanoparticle, and demonstrate characteristic core-loss signals from the suspended nanoparticles can be resolved and analyzed to provide information on the local interfacial chemistry with the surrounding environment. The combined approach using aberration corrected STEM and EEL spectra with the in situ fluid stage demonstrates a plenary platform for detailed investigations of solution based catalysis and biological research.
Jungjohann, K. L.; Evans, James E.; Aguiar, Jeff; Arslan, Ilke; Browning, Nigel D.
X-ray tomographic image magnification process, system and apparatus therefor
A computerized three-dimensional x-ray tomographic microscopy system is disclosed, comprising: (a) source means for providing a source of parallel x-ray beams; (b) staging means for staging and sequentially rotating a sample to be positioned in the path of the beams; (c) x-ray image magnifier means positioned in the path of the beams downstream from the sample; (d) detecting means for detecting the beams after being passed through and magnified by the image magnifier means; and (e) computing means for analyzing values received from the detecting means, and converting the values into three-dimensional representations. Also disclosed is a process for magnifying an x-ray image, and apparatus therefor.
Kinney, J.H.; Bonse, U.K.; Johnson, Q.C.; Nichols, M.C.; Saroyan, R.A.; Massey, W.N.; NuBhardt, R.
X-Ray Data from the X-Ray Data Booklet Online
The original X-Ray Data Booklet, published in 1985, became a classic reference source. The online version has been significantly revised and updated to reflect today's science. Hundreds of pages of authoritative data provide the x-ray properties of elements, information on synchrotron radiation, scattering processes, optics and detectors, and other related calculations, formulas, and data tables.
Thompson, Albert C.; Attwood, David T.; Gullikson, Eric M.; Howells, Malcolm R.; Kortright, Jeffrey B.; Robinson, Arthur L.; Underwood, James H.; Kim, Kwang-Je; Kirz, Janos; Lindau, Ingolf; Pianetta, Piero; Winick, Herman; Williams, Gwyn P.; Scofield, James H.
Frontiers in X-Ray Science
The year 2010 marked the fiftieth anniversary of the optical laser and the first anniversary of the world's first hard x-ray free-electron laser, the Linac Coherent Light Source (LCLS) at SLAC. This exciting, new accelerator-based source of x-rays provides peak brilliances roughly a billion times greater than currently available from synchrotron sources such as the Advanced Photon Source at Argonne, and thus explores a qualitatively different parameter space. This talk will describe the first experiments at the LCLS aimed at understanding the nature of high intensity x-ray interactions, related applications in ultrafast imaging on the atomic scale and sketch nascent plans for the extension of both linac and storage-ring based photon sources.
Linda Young
X-ray Science Division: Groups
Division: Groups Division: Groups Atomic, Molecular and Optical Physics (AMO) Primary Contact: Stephen Southworth Work focuses on understanding how strong optical and x-ray fields interact with matter, with an emphasis on photonic control of electronic, atomic and molecular motion. Chemical and Materials Science (CMS) Primary Contact: Randy Winans Research Disciplines: Chemistry, Materials Science Detectors (DET) Primary Contact: Antonino Miceli GMCA Structural Biology Facility (MX) Primary Contact: Robert Fischetti Research Disciplines: Biology, Life Sciences Imaging (IMG) Primary Contact: Francesco DeCarlo Research Disciplines: Materials Science, Biology, Physics, Life Sciences Inelastic X-ray & Nuclear Resonant Scattering (IXN) Primary Contact: Thomas Gog Research Disciplines: Condensed Matter Physics, Geophysics, Materials
Radiobiological studies using gamma and x rays.
There are approximately 500 self-shielded research irradiators used in various facilities throughout the U.S. These facilities use radioactive sources containing either 137Cs or 60Co for a variety of biological investigations. A report from the National Academy of Sciences[1] described the issues with security of particular radiation sources and the desire for their replacement. The participants in this effort prepared two peer-reviewed publications to document the results of radiobiological studies performed using photons from 320-kV x rays and 137Cs on cell cultures and mice. The effectiveness of X rays was shown to vary with cell type.
Potter, Charles Augustus; Longley, Susan W.; Scott, Bobby R. [Lovelace Respiratory Research Institute, Albuquerque, NM; Lin, Yong [Lovelace Respiratory Research Institute, Albuquerque, NM; Wilder, Julie [Lovelace Respiratory Research Institute, Albuquerque, NM; Hutt, Julie A. [Lovelace Respiratory Research Institute, Albuquerque, NM; Padilla, Mabel T. [Lovelace Respiratory Research Institute, Albuquerque, NM; Gott, Katherine M. [Lovelace Respiratory Research Institute, Albuquerque, NM
The Soft-X-Ray Spectral Shape of X-Ray-Weak Seyferts
(I) We observed eight Seyfert~2s and two X--ray--weak Seyfert~1/QSOs with the ROSAT PSPC, and one Seyfert~2 with the ROSAT HRI. These targets were selected from the Extended 12\\um\\ Galaxy Sample. (II) Both Seyfert~1/QSOs vary by factors of 1.5---2. The photon indices steepen in the more luminous state, consistent with the variability being mainly due to the softest X--rays, which are confined to a size of less than a parsec. (III) Both the Seyfert~2s and Seyfert~1/QSOs are best fit with a photon index of $\\Gamma\\sim3$, which is steeper than the canonical value of $\\Gamma\\sim1.7$ measured for X--ray--strong Seyferts by ROSAT and at higher energies. Several physical explanations are suggested for the steeper slopes of X--ray--weak objects. (IV) We observed one Seyfert~2, NGC~5005, with the ROSAT HRI, finding about 13\\% of the soft X--rays to come from an extended component. This and other observations suggest that different components to the soft X--ray spectrum of some, if not all, X--ray--weak Seyferts may come from spatially distinct regions.
Brian Rush; Matthew A. Malkan
High Energy X-Ray Diffraction Microscopy Tracking of Internal ...
Measurements are carried out at the Advanced Photon Source; analysis uses high performance computing to extract micron scale resolution structures spanning�...
Towards In Situ Hard X-ray Microscopy of Photovoltaic
Photovoltaic systems for energy generation are at the core of efforts to ... solar cells and models that represent the evolution of impurities during cell processing.
X-ray Dark Field Microscopy - Programmaster.org
About this Abstract. Meeting, International Conference on 3D Materials Science 2012. Symposium, International Conference on 3D Materials Science 2012.
Modeling broadband X-ray absorption of massive star winds
We present a method for computing the net transmission of X-rays emitted by shock-heated plasma distributed throughout a partially optically thick stellar wind from a massive star. We find the transmission by an exact integration of the formal solution, assuming the emitting plasma and absorbing plasma are mixed at a constant mass ratio above some minimum radius, below which there is assumed to be no emission. This model is more realistic than either the slab absorption associated with a corona at the base of the wind or the exospheric approximation that assumes all observed X-rays are emitted without attenuation from above the radius of optical depth unity. Our model is implemented in XSPEC as a pre-calculated table that can be coupled to a user-defined table of the wavelength dependent wind opacity. We provide a default wind opacity model that is more representative of real wind opacities than the commonly used neutral ISM tabulation. Preliminary modeling of \\textit{Chandra} grating data indicates that the ...
Leutenegger, Maurice A; Zsarg�, Janos; Martell, Erin M; MacArthur, James P; Owocki, Stanley P; Gagn�, Marc; Hillier, D John
High resolution transmission electron microscopy of melamine-formaldehyde aerogels and silica aerogels
The goal of the high resolution transmission electron microscopy (HRTEM) was to image the structure of two tetramethyl orthosilicate (TMOS) and two melamine-formaldehyde (MF) aerogels at the single polymer chain level{sup 1,2}. With this level of structural resolution we hoped to interrelate each aerogel's structure with its physical properties and its method of synthesis. Conventional single-step base catalysed TMOS aerogels show strings of spheroidal particles linked together with minimal necking. The spheroidal particles range from 86--132 {Angstrom} and average 113{plus minus}10 {Angstrom} in diameter{sup 2}. In contrast the TMOS aerogels reported on here were made by a two step method. After extended silica chains are grown in solution under acidic conditions with a substoichiometric amount of water, the reaction is stopped and the methanol hydrolysed from TMOS is removed. Then base catalysis and additional water are added to cause gel formation is a nonalcoholic solvent. The MF aerogels were prepared for HRTEM by fracturing them on a stereo microscope stage with razor knife so that fractured pieces with smooth flat surfaces could be selected for platinum-carbon replication. The two silica (TMOS) aerogels were both transparent and difficult to see. These aerogels were fractured on a stereo microscope stage with tweezers. 6 refs., 4 figs.
Ruben, G.C. (Dartmouth Coll., Hanover, NH (United States). Dept. of Biological Sciences)
Sharper Focusing of Hard X-rays
Sharper Focusing of Hard X-rays FROM: Physics News Update Number 773 #1, April 12, 2006, by Phil Schewe and Ben Stein Note: This text has been slightly modified from the original. Sharper focusing of hard x-rays has been achieved with a device developed at Argonne National Lab. Because of their high energy, x-rays are hard to focus: they can be reflected from a surface but only at a glancing angle (less than a tenth of a degree); they can be refracted but the index of refraction is very close to 1, so that making efficient lenses becomes a problem; and they can be diffracted, but the relatively thick, variable pitch grating required for focusing is tricky to achieve. The Argonne device is of the diffraction type, and it consists of a stack of alternating layers of metal and silicon, made by depositing progressively thicker layers. When the x-rays fall on such a structure, nearly edge-on, what they see is a grating (called a linear zone plate) consisting of a sort of bar-code pattern.
Massively parallel X-ray scattering simulations
Although present X-ray scattering techniques can provide tremendous information on the nano-structural properties of materials that are valuable in the design and fabrication of energy-relevant nano-devices, a primary challenge remains in the analyses ...
Abhinav Sarje; Xiaoye S. Li; Slim Chourou; Elaine R. Chan; Alexander Hexemer
Multiple wavelength x-ray monochromators
An apparatus and method is provided for separating input x-ray radiation containing first and second x-ray wavelengths into spatially separate first and second output radiation which contain the first and second x-ray wavelengths, respectively. The apparatus includes a crystalline diffractor which includes a first set of parallel crystal planes, where each of the planes is spaced a predetermined second distance from one another. The crystalline diffractor also includes a second set of parallel crystal planes inclined at an angle with respect to the first set of crystal planes where each of the planes of the second set of parallel crystal planes is spaced a predetermined second distance from one another. In one embodiment, the crystalline diffractor is comprised of a single crystal. In a second embodiment, the crystalline diffractor is comprised of a stack of two crystals. In a third embodiment, the crystalline diffractor includes a single crystal that is bent for focussing the separate first and second output x-ray radiation wavelengths into separate focal points.
X-Ray and Neutron Diffraction
Oct 20, 2010 ... Advanced X-Ray Scattering Techniques for Multi-Length Scale ... ?-Ti using the 3DXRD station 34-ID-E at the Advanced Photon Source, Argonne National Laboratory. ... Research at APS 34-ID-E, partly funded by BES/DOE.
Small Angle X-Ray Scattering Detector
A detector for time-resolved small-angle x-ray scattering includes a nearly constant diameter, evacuated linear tube having an end plate detector with a first fluorescent screen and concentric rings of first fiber optic bundles for low angle scattering detection and an annular detector having a second fluorescent screen and second fiber optic bundles concentrically disposed about the tube for higher angle scattering detection. With the scattering source, i.e., the specimen under investigation, located outside of the evacuated tube on the tube's longitudinal axis, scattered x-rays are detected by the fiber optic bundles, to each of which is coupled a respective photodetector, to provide a measurement resolution, i.e., dq/q, where q is the momentum transferred from an incident x-ray to an x-ray scattering specimen, of 2% over two (2) orders of magnitude in reciprocal space, i.e., qmax/qmin approx=lO0.
Hessler, Jan P.
X-Ray Interactions with Matter
The primary interactions of low-energy x-rays within condensed matter, viz. photoabsorption and coherent scattering, are described for photon energies outside the absorption threshold regions by using atomic scattering factors. The atomic scattering factors may be accurately determined from the atomic photoabsorption cross sections using modified Kramers-Kronig dispersion relations. From a synthesis of the currently available experimental data and recent theoretical calculations for photoabsorption, the angle-independent, forward-scattering components of the atomic scattering factors have been thus semiempirically determined and tabulated here for 92 elements and for the region 50-30,000 eV. Atomic scattering factors for all angles of coherent scattering and at the higher photon energies are obtained from these tabulated forward-scattering values by adding a simple angle-dependent form-factor correction. The incoherent scattering contributions that become significant for the light elements at the higher photon energies are similarly determined. The basic x-ray interaction relations that are used in applied x-ray physics are presented here in terms of the atomic scattering factors. The bulk optical constants are also related to the atomic scattering factors. These atomic and optical relations are applied to the detailed calculation of the reflectivity characteristics of a series of practical x-ray mirror, multilayer, and crystal monochromators. Comparisons of the results of this semiempirical,"atom-like", description of x-ray interactions for the low-energy region with those of experiment and ab initio theory are presented. (Taken from the abstract in OSTI Record 6131765) (Specialized Interface)
Henke, B.L.; Gullikson, E.M.; Davis, J.C.
Grand Opening Slated for Electron Microscopy Facility
4 days ago ... The Ohio State University Center for Electron Microscopy and Analysis ... There are also two X-ray diffractometer (XRD) systems, facilities for�...
In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb,,Mg13Nb23...O3 PbTiO3
In situ transmission electron microscopy study of electric-field-induced microcracking in single March 2000; accepted for publication 2 May 2000 In this letter, we report in situ transmission electron microscopy TEM study of effect of a cyclic electric field on microcracking in a single crystal piezoelectric
Chen, Haydn H.
Rise time measurement for ultrafast X-ray pulses
A pump-probe scheme measures the rise time of ultrafast x-ray pulses. Conventional high speed x-ray diagnostics (x-ray streak cameras, PIN diodes, diamond PCD devices) do not provide sufficient time resolution to resolve rise times of x-ray pulses on the order of 50 fs or less as they are being produced by modern fast x-ray sources. Here, we are describing a pump-probe technique that can be employed to measure events where detector resolution is insufficient to resolve the event. The scheme utilizes a diamond plate as an x-ray transducer and a p-polarized probe beam.
Celliers, Peter M. (Berkeley, CA); Weber, Franz A. (Oakland, CA); Moon, Stephen J. (Tracy, CA)
Rise Time Measurement for Ultrafast X-Ray Pulses
Celliers, Peter M.; Weber, Franz A.; Moon, Stephen J.
X-ray flashes and X-ray rich gamma ray bursts. Memorie della Societa� Astronomica Italiana
Abstract. X-ray flashes are detected in the Wide Field Cameras on BeppoSAX in the energy range 2-25 keV as bright X-ray sources lasting of the order of minutes, but remaining undetected in the Gamma Ray Bursts Monitor on BeppoSAX. They have properties very similar to the x-ray counterparts of GRBs and account for some of the Fast X-ray Transient events seen in almost every x-ray satellite. We review their X-ray properties and show that x-ray flashes are in fact very soft, x-ray rich, untriggered gamma ray bursts, in which the peak energy in 2-10 keV x-rays could be up to a factor of 100 larger than the peak energy in the 50-300 keV gamma ray range. The frequency is ? 100 yr ?1. 1 Fast X-ray Transients/High-latitude X-ray Transients Fast X-ray Transients have been observed with many x-ray satellites. In particular they are seen with x-ray instruments that scan the entire sky on a regular basis. Such events are detected in one sky scan and disappeared in the next, typically limiting the duration to be longer than a minute and shorter than a few hours. For this reason they are called Fast Transients. The first transients
John Heise; Jean In �t Z; Peter M. Woods
X-rays Illuminate Ancient Archimedes Text
Related Links: Related Links: May 2005 Headlines TIP Article Press Release Walters Art Museum SSRL Home Page SLAC Home Page Stanford Home Page Tuesday, 31 May 2005 X-rays Illuminate Ancient Archimedes Text (contact: Uwe Bergmann, email@example.com) Archimedes Figure Image provided by Will Noel, The Walters Art Museum An early transcription of Archimedes' mathematical theories has been brought to light through the probing of high-intensity x-rays at SSRL's BL6-2. The text contains part of the Method of Mechanical Theorems, one of Archimedes' most important works, which was probably copied out by a scribe in the tenth century. The parchment on which it was written was later scraped down and reused as pages in a twelfth century prayer book, producing a document known as a palimpsest (which comes from the Greek,
High resolution x-ray microscope
The authors present x-ray images of grid meshes and biological material obtained using a microspot x-ray tube with a multilayer optic and a 92-element parabolic compound refractive lens (CRL) made of a plastic containing only hydrogen and carbon. Images obtained using this apparatus are compared with those using an area source with a spherical lens and a spherical lens with multilayer condenser. The authors found the best image quality using the multilayer condenser with a parabolic lens, compared to images with a spherical lens and without the multilayer optics. The resolution was measured using a 155-element parabolic CRL and a multilayer condenser with the microspot tube. The experiment demonstrates about 1.1 {mu}m resolution.
Gary, C. K.; Park, H.; Lombardo, L. W.; Piestrup, M. A.; Cremer, J. T.; Pantell, R. H.; Dudchik, Y. I. [Adelphi Technology, Inc. 981-B Industrial Road, San Carlos, California 94070 (United States); Department of Electrical Engineering, Stanford University, Stanford, California 94305 (United States); Institute of Applied Physics Problems, Kurchatova 7, Minsk 220064 (Belarus)
BRILLIANCE X-RAY SCATTERING FOR BRILLIANCE X-RAY SCATTERING FOR LIFE SCIENCES (LIX) Group Leader: Lin Yang Proposal Team: O. Bilsel 1 , B. Hsiao 2 , H. Huang 3 , T. Irving 4 , A. Menzel 5 , L. Pollack 6 , C. Riekel 7 , J. Rubert 8 , H. Tsuruta 9 , L. Yang 10 1 University of Massachusetts, 2 Stony Brook University, 3 Rice University, 4 IIT, 5SLS, 6 Cornell University, 7 European Synchrotron Radiation Facility, 8 NEU, 9 Stanford Synchrotron Radiation Lightsource, 10 Brookhaven National Laboratory TECHNIQUES AND CAPABILITIES APPLICATIONS ADDITIONAL INFORMATION * Energy range 2-20keV using undulator source. Simultaneous SAXS/WAXS to cover 0.003-3Å -1 at 12keV with 1 micron spot size * Time-resolved solution scattering with resolution of (1) microseconds to milliseconds using continuous-flow mixing (5µm x 10µm spot size) and (2) milliseconds using stopped-
Sample holder for x-ray diffractometry
A sample holder for use with x-ray diffractometers with the capability to rotate the sample, as well as to adjust the position of the sample in the x, y, and z directions. Adjustment in the x direction is accomplished through loosening set screws, moving a platform, and retightening the set screws. Motion translators are used for adjustment in the y and z directions. An electric motor rotates the sample, and receives power from the diffractometer.
Hesch, V.L.
TENDER ENERGY X-RAY ABSORPTION TENDER ENERGY X-RAY ABSORPTION SPECTROSCOPY (TES) Project Team: S. Bare 1,2 , J. Brandes 3 , T. Buonassisi 4 , J. Chen 5,2 , M. Croft 6 , E. DiMasi 7 , A. Frenkel 8,2 , D. Hesterberg 9 , S. Hulbert 7,2 , S. Khalid 7 , S. Myneni 10 , P. Northrup 7,11 , E.T. Rasbury 11 , B. Ravel 12 , R. Reeder 11 , J. Rodriguez 7,2 , D. Sparks 5,13 , V. Stojanoff 7 , G. Waychunas 14 1 UOP LLC, 2 Synchrotron Catalysis Consortium, 3 Skidaway Inst. of Oceanography, 4 MIT Laboratory for Photovoltaics Research, 5 Univ. of Delaware, 6 Rutgers Univ., 7 Brookhaven National Lab, 8 Yeshiva Univ., 9 North Carolina State Univ., 10 Princeton Univ., 11 Stony Brook Univ., 12 NIST, 13 Delaware Environmental Inst., 14 Lawrence Berkeley National Lab TECHNIQUES: High performance and in-situ X-ray absorption spectroscopy and spatially-resolved XAS of
Hard X-ray Variability of AGN
Aims: Active Galactic Nuclei are known to be variable throughout the electromagnetic spectrum. An energy domain poorly studied in this respect is the hard X-ray range above 20 keV. Methods: The first 9 months of the Swift/BAT all-sky survey are used to study the 14 - 195 keV variability of the 44 brightest AGN. The sources have been selected due to their detection significance of >10 sigma. We tested the variability using a maximum likelihood estimator and by analysing the structure function. Results: Probing different time scales, it appears that the absorbed AGN are more variable than the unabsorbed ones. The same applies for the comparison of Seyfert 2 and Seyfert 1 objects. As expected the blazars show stronger variability. 15% of the non-blazar AGN show variability of >20% compared to the average flux on time scales of 20 days, and 30% show at least 10% flux variation. All the non-blazar AGN which show strong variability are low-luminosity objects with L(14-195 keV) < 1E44 erg/sec. Conclusions: Concerning the variability pattern, there is a tendency of unabsorbed or type 1 galaxies being less variable than the absorbed or type 2 objects at hardest X-rays. A more solid anti-correlation is found between variability and luminosity, which has been previously observed in soft X-rays, in the UV, and in the optical domain.
V. Beckmann; S. D. Barthelmy; T. J. -L. Courvoisier; N. Gehrels; S. Soldi; J. Tueller; G. Wendt
Applications and source development for high-repetition rate x-ray lasers
Many applications in material science, chemistry, and atomic physics require an x-ray source that has a repetition rate of 1 Hz to a few kHz. In these fields, a very wide range of photon energies is of interest. One application is time-resolved surface photoelectron spectroscopy and microscopy where low energy (energies below 100 eV are very good with higher energy capabilities expected in the future. In addition, prospects of table-top size x-ray lasers with kHz repetition rates are presented.
Eder, D.C.; Amendt, P.; Bolton, P.R. [and others
SLAC National Accelerator Laboratory - SLAC X-rays Help Discover...
which pulses 120 times a second. In the instant before the intense X-rays destroy a nanocrystal, detectors record a flash of X-ray diffraction information. Finally, scientists use...
Using Light to Control How X Rays Interact with Matter
Using Light to Control How X Rays Interact with Matter Using Light to Control How X Rays Interact with Matter Print Wednesday, 27 January 2010 00:00 Schemes that use one light...
Microstructural Mapping Using High-Energy X-Ray Scattering
Abstract Scope, Advanced characterization methods at the APS permit unique in- situ ... The combination of an undulator source, brilliance preserving optics and focusing .... Ultra-Small-Angle X-Ray Scattering�X-Ray Photon Correlation�...
Energy Determination of X-Ray Transition Energies Using the ...
... We chose to measure x-ray transition energies from NIST ... This resulted in the production of x-ray emission ... would yield not only an energy scale for ...
SLAC National Accelerator Laboratory - SLAC's X-ray Laser Explores...
X-ray Laser Explores Big Data Frontier By Glenn Roberts Jr. June 12, 2013 It's no surprise that the data systems for SLAC's Linac Coherent Light Source X-ray laser have drawn...
Strengthened lithium for x-ray blast windows
Lithium's high x-ray transparency makes it an attractive material for windows intended to protect soft x-ray diagnostics in high energy density experiments. Pure lithium is soft and weak, but lithium mixed with lithium hydride powder becomes harder and stronger, in principle without any additional x-ray absorption. A comparison with the standard material for x-ray windows, beryllium, suggests that lithium or lithium strengthened by lithium hydride may well be an excellent option for such windows.
Pereira, N. R. [Ecopulse Inc., P.O. Box 528, Springfield, Virginia 22150 (United States); Imam, M. A. [Materials Science and Technology Division, Naval Research Laboratory, Washington, DC 20375 (United States)
Temperature Profile of IR Blocking Windows Used in Cryogenic X-Ray Spectrometers
Cryogenic high-resolution X-ray spectrometers are typically operated with thin IR blocking windows to reduce radiative heating of the detector while allowing good x-ray transmission. We have estimated the temperature profile of these IR blocking windows under typical operating conditions. We show that the temperature in the center of the window is raised due to radiation from the higher temperature stages. This can increase the infrared photon flux onto the detector, thereby increasing the IR noise and decreasing the cryostat hold time. The increased window temperature constrains the maximum window size and the number of windows required. We discuss the consequences for IR blocking window design.
Friedrich, S.; Funk, T.; Drury, O.; Labov, S.E.
Synchrotron X-ray Based Characterization of CdZnTe Crystals
Synthetic CdZnTe (CZT) crystals can be used for the room temperature-based detection of gamma radiation. Structural/morphological heterogeneities within CZT, such as secondary phases (namely, precipitates and inclusions), can negatively affect detector performance. We used a synchrotron-based x-ray technique, specifically extended x-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission infrared (IR) imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials.
Duff,M.; Hunter, D.; Nuessle, P.; Black, D.; Burdette, H.; Woicik, J.; Burger, A.; Groza, M.
Scientists combine X-rays and microscopes for precise experiments | Argonne
This insulator-coated "smart tip" for synchrotron X-ray scanning tunneling microscopy confines the signal detection to a tiny region of a sample. The nanofabricated tips have been developed by an Argonne team led by Argonne nanoscientist Volker Rose to improve the sensitivity of the SXSTM technique. To view a larger version of the image, click on it. This insulator-coated "smart tip" for synchrotron X-ray scanning tunneling microscopy confines the signal detection to a tiny region of a sample. The nanofabricated tips have been developed by an Argonne team led by Argonne nanoscientist Volker Rose to improve the sensitivity of the SXSTM technique. To view a larger version of the image, click on it. This insulator-coated "smart tip" for synchrotron X-ray scanning tunneling microscopy confines the signal detection to a tiny region of a sample. The nanofabricated tips have been developed by an Argonne team led by Argonne nanoscientist Volker Rose to improve the sensitivity of the SXSTM technique. To view a larger version of the image, click on it. Scientists combine X-rays and microscopes for precise experiments
Experimental and Theoretical Comparison of the O K-Edge Nonresonant Inelastic X-ray Scattering and X-ray Absorption Spectra of NaReO[subscript 4
Accurate X-ray absorption spectra (XAS) of first row atoms, e.g., O, are notoriously difficult to obtain due to the extreme sensitivity of the measurement to surface contamination, self-absorption, and saturation affects. Herein, we describe a comprehensive approach for determining reliable O K-edge XAS data for ReO{sub 4}{sup 1-} and provide methodology for obtaining trustworthy and quantitative data on nonconducting molecular systems, even in the presence of surface contamination. This involves comparing spectra measured by nonresonant inelastic X-ray scattering (NRIXS), a bulk-sensitive technique that is not prone to X-ray self-absorption and provides exact peak intensities, with XAS spectra obtained by three different detection modes, namely total electron yield (TEY), fluorescence yield (FY), and scanning transmission X-ray microscopy (STXM). For ReO{sub 4}{sup 1-}, TEY measurements were heavily influenced by surface contamination, while the FY and STXM data agree well with the bulk NRIXS analysis. These spectra all showed two intense pre-edge features indicative of the covalent interaction between the Re 5d and O 2p orbitals. Density functional theory calculations were used to assign these two peaks as O 1s excitations to the e and t{sub 2} molecular orbitals that result from Re 5d and O 2p covalent mixing in T{sub d} symmetry. Electronic structure calculations were used to determine the amount of O 2p character (%) in these molecular orbitals. Time dependent-density functional theory (TD-DFT) was also used to calculate the energies and intensities of the pre-edge transitions. Overall, under these experimental conditions, this analysis suggests that NRIXS, STXM, and FY operate cooperatively, providing a sound basis for validation of bulk-like excitation spectra and, in combination with electronic structure calculations, suggest that NaReO{sub 4} may serve as a well-defined O K-edge energy and intensity standard for future O K-edge XAS studies.
Bradley, Joseph A.; Yang, Ping; Batista, Enrique R.; Boland, Kevin S.; Burns, Carol J.; Clark, David L.; Conradson, Steven D.; Kozimor, Stosh A.; Martin, Richard L.; Seidler, Gerald T.; Scott, Brian L.; Shuh, David K.; Tyliszczak, Tolek; Wilkerson, Marianne P.; Wolfsberg, Laura E. (PNNL); (UWASH); (LBNL); (LANL)
Experimental and Theoretical Comparison of the O K-Edge Non-Resonant Inelastic X-ray Scattering and X-ray Absorption Spectra of NaReO4
Accurate X-ray absorption spectra (XAS) of first row atoms, e.g. O, are notoriously difficult to obtain due to the extreme sensitivity of the measurement to surface contamination, self-absorption, and saturation effects. Herein, we describe a comprehensive approach for determining reliable O K-edge XAS data for ReO41- and provide methodology for obtaining trustworthy and quantitative data on non-conducting molecular systems, even in the presence of surface contamination. This involves comparing spectra measured by non-resonant inelastic X-ray scattering (NRIXS), a bulk-sensitive technique that is not prone to X-ray self-absorption and provides exact peak intensities, with XAS spectra obtained by three different detection modes, namely total electron yield (TEY), fluorescence yield (FY), and scanning transmission X-ray microscopy (STXM). For ReO41-, TEY measurements were heavily influenced by surface contamination, while the FY and STXM data agree well with the bulk NRIXS analysis. These spectra all showed two intense pre-edge features indicative of the covalent interaction between the Re 5d and O 2p orbitals. Time dependent density functional theory calculations were used to assign these two peaks as O 1s excitations to the e and t2 molecular orbitals that result from Re 5d and O 2p covalent mixing in Td symmetry. Electronic structure calculations were used to determine the amount of O 2p character (%) in these molecular orbitals. Time-dependent density functional theory (TD-DFT) was also used to calculate the energies and intensities of the pre-edge transitions. Overall, under these experimental conditions, this analysis suggests that NRIXS, STXM, and FY operate cooperatively, providing a sound basis for validation of bulk-like excitation spectra and, in combination with electronic structure calculations, suggest that NaReO4 may serve as a well-defined O K-edge energy and intensity standard for future O K edge XAS studies.
Bradley, Joseph A.; Yang, Ping; Batista, Enrique R.; Boland, Kevin S.; Burns, Carol J.; Clark, David L.; Conradson, Steven D.; Kozimor, Stosh A.; Martin, Richard L.; Seidler, Gerald T.; Scott, Brian L.; Shuh, David K.; Tyliszczak, T.; Wilkerson, Marianne P.; Wolfsberg, Laura E.
Soft X-Ray Imaging of spin dynamics at high spatial and temporalresolution
Soft X-ray microscopy provides element specific magnetic imaging with a spatial resolution down to 15nm. At XM-1, the full-field soft X-ray microscope at the Advanced Light Source in Berkeley, a stroboscopic pump and probe setup has been developed to study fast magnetization dynamics in ferromagnetic elements with a time resolution of 70ps which is set by the width of the X-ray pulses from the synchrotron. Results obtained with a 2 {micro}m x 4 {micro}m x 45nm rectangular permalloy sample exhibiting a seven domain Landau pattern reveal dynamics up to several nsec after the exciting magnetic field pulse. Domain wall motion, a gyrotropic vortex motion, and a coupling between vortices in the rectangular geometry are observed.
Mesler, Brooke L.; Fischer, Peter; Chao, Weilun; Anderson, Erik H.
Soft x-ray spectromicroscopy development for materials science at the Advanced Light Source
Several third generation synchrotron radiation facilities are now operational and the high brightness of these photon sources offers new opportunities for x-ray microscopy. Well developed synchrotron radiation spectroscopy techniques are being applied in new instruments capable of imaging the surface of a material with a spatial resolution smaller than one micron. There are two aspects to this. One is to further the field of surface science by exploring the effects of spatial variations across a surface on a scale not previously accessible to x-ray measurements. The other is to open up new analytical techniques in materials science using x-rays, on a spatial scale comparable to that of the processes or devices to be studied. The development of the spectromicroscopy program at the Advanced Light Source will employ a variety of instruments, some are already operational. Their development and use will be discussed, and recent results will be presented to illustrate their capabilities.
Warwick, T.; Padmore, H. [Lawrence Berkeley National Lab., CA (United States); Ade, H. [North Carolina State Univ., Raleigh, NC (United States); Hitchcock, A.P. [McMaster Univ., Hamilton, Ontario (Canada); Rightor, E.G. [Dow Texas Polymer Center, Freeport, TX (United States); Tonner, B.P. [Univ. of Wisconsin, Milwaukee, WI (United States)
Active galactic nuclei (AGNs) show excess X-ray emission above 10 keV compared with extrapolation of spectra from lower energies. Risaliti et al. have recently attempted to model the hard X-ray excess in the type 1.8 AGN NGC 1365, concluding that the hard excess most likely arises from Compton-scattered reflection of X-rays from an inner accretion disk close to the black hole. Their analysis disfavored a model in which the hard excess arises from a high column density of circumnuclear gas partially covering a primary X-ray source, despite such components being required in the NGC 1365 data below 10 keV. Using a Monte Carlo radiative transfer approach, we demonstrate that this conclusion is invalidated by (1) use of slab absorption models, which have unrealistic transmission spectra for partial covering gas, (2) neglect of the effect of Compton scattering on transmitted spectra, and (3) inadequate modeling of the spectrum of scattered X-rays. The scattered spectrum is geometry-dependent and, for high global covering factors, may dominate above 10 keV. We further show that, in models of circumnuclear gas, the suppression of the observed hard X-ray flux by reprocessing may be no larger than required by the ''light bending'' model invoked for inner disk reflection, and the expected emission line strengths lie within the observed range. We conclude that the time-invariant ''red wing'' in AGN X-ray spectra is probably caused by continuum transmitted through and scattered from circumnuclear gas, not by highly redshifted line emission, and that measurement of black hole spin is not possible.
Miller, L. [Department of Physics, Oxford University, Denys Wilkinson Building, Keble Road, Oxford OX1 3RH (United Kingdom); Turner, T. J. [Department of Physics, University of Maryland Baltimore County, Baltimore, MD 21250 (United States)
X-Ray diffraction analysis and transmission electron microscopic ...
eral in women with osteoporosis. Calcif Tissue Res 21:452-. 456. 6. Dahllof G, Lindskog S, Theorell K, Ussisoo R (1987) Con- comitant regional odontodysplasia�...
High Resolution Chemical Mapping via Scanning Transmission X-ray
Professor, Department of Physics and Astronomy Adam Durst Chairperson of Defense Assistant Professor
Lensless Imaging of Whole Biological Cells with Soft X-Rays
Lensless Imaging of Whole Biological Cells with Soft X-Rays Print Lensless Imaging of Whole Biological Cells with Soft X-Rays Print A team of scientists has used x-ray diffraction microscopy at ALS Beamline 9.0.1 to make images of whole yeast cells, achieving the highest resolution-11 to 13 nanometers (billionths of a meter)-ever obtained with this method for biological specimens. Their success indicates that full 3-D tomography of whole cells at equivalent resolution should soon be possible. The National Center for X-Ray Tomography at ALS Beamline 2.1 images whole, frozen hydrated cells in 3-D (see highlight "Imaging Antifungal Drug Molecules in Action using Soft X-Ray Tomography"). Large numbers of cells can currently be processed in a short time at resolutions of 40 to 60 nanometers, but the ability to increase resolution to the 10-nanometer range would enhance research capabilities in both biology and materials sciences.
Lensless Imaging of Whole Lensless Imaging of Whole Biological Cells with Soft X-Rays Lensless Imaging of Whole Biological Cells with Soft X-Rays Print Wednesday, 26 May 2010 00:00 A team of scientists has used x-ray diffraction microscopy at ALS Beamline 9.0.1 to make images of whole yeast cells, achieving the highest resolution-11 to 13 nanometers (billionths of a meter)-ever obtained with this method for biological specimens. Their success indicates that full 3-D tomography of whole cells at equivalent resolution should soon be possible. The National Center for X-Ray Tomography at ALS Beamline 2.1 images whole, frozen hydrated cells in 3-D (see highlight "Imaging Antifungal Drug Molecules in Action using Soft X-Ray Tomography"). Large numbers of cells can currently be processed in a short time at resolutions of 40 to 60 nanometers, but the ability to increase resolution to the 10-nanometer range would enhance research capabilities in both biology and materials sciences.
Real-time Studies of Shocked Polycrystalline Materials with Single-Pulse X-ray Diffraction
Characteristic K-? x-rays used for single-pulse XRD are conventionally produced by a 37-stage high-voltage Marx pulse generator coupled to a vacuum needle-and-washer x-ray diode via coaxial transmission line. A large field-of-view x-ray image plate detection system typically enables observation of several Debye-Scherrer rings. Recently, we have developed a fiber-optic reducer, coupled to a CCD camera, to obtain low-noise, large field-of-view images. The direct beam spot is produced by bremsstrahlung radiation attenuated by a twomillimeter tungsten beam stop. Determination of the direct beam position is necessary to perform the ring integration.
Dane V. Morgan
X-Ray Imaging Crystal Spectrometer for Extended X-Ray Sources
Spherically or toroidally curved, double focusing crystals are used in a spectrometer for X-ray diagnostics of an extended X-ray source such as a hot plasma produced in a tokamak fusion experiment to provide spatially and temporally resolved data on plasma parameters such as ion temperature, toroidal and poloidal rotation, electron temperature, impurity ion charge-state distributions, and impurity transport. The imaging properties of these spherically or toroidally curved crystals provide both spectrally and spatially resolved X-ray data from the plasma using only one small spherically or toroidally curved crystal, thus eliminating the requirement for a large array of crystal spectrometers and the need to cross-calibrate the various crystals.
Bitter, Manfred L.; Fraekel, Benjamin; Gorman, James L.; Hill, Kenneth W.; Roquemore, Lane A.; Stodiek, Wolfgang; Goeler, Schweickhard von
Calibrating X-ray Imaging Devices for Accurate Intensity Measurement
The purpose of the project presented is to develop methods to accurately calibrate X-ray imaging devices. The approach was to develop X-ray source systems suitable for this endeavor and to develop methods to calibrate solid state detectors to measure source intensity. NSTec X-ray sources used for the absolute calibration of cameras are described, as well as the method of calibrating the source by calibrating the detectors. The work resulted in calibration measurements for several types of X-ray cameras. X-ray camera calibration measured efficiency and efficiency variation over the CCD. Camera types calibrated include: CCD, CID, back thinned (back illuminated), front illuminated.
Haugh, M. J.
X-Ray Absorption Spectroscopy of Transition Metal-Magnesium Hydride Thin
X-Ray Absorption Spectroscopy of Transition Metal-Magnesium Hydride Thin X-Ray Absorption Spectroscopy of Transition Metal-Magnesium Hydride Thin Films Title X-Ray Absorption Spectroscopy of Transition Metal-Magnesium Hydride Thin Films Publication Type Journal Article LBNL Report Number LBNL-50574 Year of Publication 2002 Authors Richardson, Thomas J., Baker Farangis, Jonathan L. Slack, Ponnusamy Nachimuthu, Rupert C. C. Perera, Nobumichi Tamura, and Michael D. Rubin Journal Journal of Alloys and Compounds Volume 356-357 Start Page 204 Pagination 204-207 Date Published 08/2003 Keywords A. hydrogen storage materials, NEXAFS, thin film s; C. EXAFS, x-ray diffraction Abstract Mixed metal thin films containing magnesium and a first-row transition element exhibit very large changes in both reflectance and transmittance on exposure to hydrogen gas. Changes in electronic structure and coordination of the magnesium and transition metal atoms during hydrogen absorption were studied using dynamic in situ transmission mode X-ray absorption spectroscopy. Mg K-edge and Ni, Co, and Ti L-edge spectra reflect both reversible and irreversible changes in the metal environments. A significant shift in the nickel L absorption edge shows it to be an active participant in hydride formation. The effect on cobalt and titanium is much less dramatic, suggesting that these metals act primarily as catalysts for formation of magnesium hydride.
Apparatus for monitoring x-ray beam alignment
A self-contained, hand-held apparatus is provided for monitoring alignment of an x-ray beam in an instrument employing an x-ray source. The apparatus includes a transducer assembly containing a photoresistor for providing a range of electrical signals responsive to a range of x-ray beam intensities from the x-ray beam being aligned. A circuit, powered by a 7.5 VDC power supply and containing an audio frequency pulse generator whose frequency varies with the resistance of the photoresistor, is provided for generating a range of audible sounds. A portion of the audible range corresponds to low x-ray beam intensity. Another portion of the audible range corresponds to high x-ray beam intensity. The transducer assembly may include an a photoresistor, a thin layer of x-ray fluorescent material, and a filter layer transparent to x-rays but opaque to visible light. X-rays from the beam undergoing alignment penetrate the filter layer and excite the layer of fluorescent material. The light emitted from the fluorescent material alters the resistance of the photoresistor which is in the electrical circuit including the audio pulse generator and a speaker. In employing the apparatus, the x-ray beam is aligned to a complete alignment by adjusting the x-ray beam to produce an audible sound of the maximum frequency.
Introduction to Neutron and X-Ray Scattering
Scattering Studies of Thin Scattering Studies of Thin Polymer Films Introduction to Neutron and X-Ray Scattering Sunil K. Sinha UCSD/LANL Acknowledgements: Prof. R.Pynn( Indiana U.) Prof. M.Tolan (U. Dortmund) Wilhelm Conrad Röntgen 1845-1923 1895: Discovery of X-Rays 1901 W. C. Röntgen in Physics for the discovery of x-rays. 1914 M. von Laue in Physics for x-ray diffraction from crystals. 1915 W. H. Bragg and W. L. Bragg in Physics for crystal structure determination. 1917 C. G. Barkla in Physics for characteristic radiation of elements. 1924 K. M. G. Siegbahn in Physics for x-ray spectroscopy. 1927 A. H. Compton in Physics for scattering of x-rays by electrons. 1936 P. Debye in Chemistry for diffraction of x-rays and electrons in gases.
Direct detection of x-rays for protein crystallography
An apparatus and method for directly determining the crystalline structure of a protein crystal. The crystal is irradiated by a finely collimated x-ray beam. The interaction o f the x-ray beam with the crystal produces scattered x-rays. These scattered x-rays are detected by means of a large area, thick CCD which is capable of measuring a significant number of scattered x-rays which impact its surface. The CCD is capable of detecting the position of impact of the scattered x-ray on the surface of the CCD and the quantity of scattered x-rays which impact the same cell or pixel. This data is then processed in real-time and the processed data is outputted to produce an image of the structure of the crystal. If this crystal is a protein the molecular structure of the protein can be determined from the data received.
Atac, Muzaffer; McKay, Timothy
X-ray chemistry in envelopes around young stellar objects
We present chemical models of the envelope of a young stellar object (YSO) exposed to a central X-ray source. The models are applied to the massive star-forming region AFGL 2591 for different X-ray fluxes. The total X-ray ionization rate is dominated by the `secondary' ionization rate of H2 resulting from fast electrons. The carbon, sulphur and nitrogen chemistries are discussed. It is found that He+ and H3+ are enhanced and trigger a peculiar chemistry. Several molecular X-ray tracers are found and compared to tracers of the far ultraviolet (FUV) field. Like ultraviolet radiation fields, X-rays enhance simple hydrides, ions and radicals. In contrast to ultraviolet photons, X-rays can penetrate deep into the envelope and affect the chemistry even at large distances from the source. Whereas the FUV enhanced species cover a region of 200-300 AU, the region enhanced by X-rays is >1000 AU. Best-fit models for AFGL 2591 predict an X-ray luminosity LX > 1e+31 ergs/s with a hard X-ray spectrum TX > 3e+07 K. Furthermore, we find LX/Lbol ~ 1e-6. The chemistry of the bulk of the envelope mass is dominated by cosmic-ray induced reactions rather than by X-ray induced ionization for X-ray luminosities LX < 1e+33 ergs/s. The calculated line intensities of HCO+ and HCS+ show that high-J lines are more affected than lower J lines by the presence of X-rays due to their higher critical densities, and that such differences are detectable even with large aperture single-dish telescopes. Future instruments such as Herschel-HIFI or SOFIA will be able to observe X-ray enhanced hydrides whereas the sensitivity and spatial resolution of ALMA is well-suited to measure the size and geometry of the region affected by X-rays.
P. Staeuber; S. D. Doty; E. F. van Dishoeck; A. O. Benz
X-Ray Diffraction on NIF
The National Ignition Facility (NIF) is currently a 192 beam, 1.6 MJ laser. NIF Ramp-Compression Experiments have already made the relevant exo-planet pressure range from 1 to 50 Mbar accessible. We Proposed to Study Carbon Phases by X-Ray Diffraction on NIF. Just a few years ago, ultra-high pressure phase diagrams for materials were very 'simple'. New experiments and theories point out surprising and decidedly complex behavior at the highest pressures considered. High pressures phases of aluminum are also predicted to be complex. Recent metadynamics survey of carbon proposed a dynamic pathway among multiple phases. We need to develop diagnostics and techniques to explore this new regime of highly compressed matter science. X-Ray Diffraction - Understand the phase diagram/EOS/strength/texture of materials to 10's of Mbar. Strategy and physics goals: (1) Powder diffraction; (2) Begin with diamond; (3) Continue with metals etc.; (4) Explore phase diagrams; (5) Develop liquid diffraction; and (6) Reduce background/improve resolution.
Eggert, J H; Wark, J
Los Alamos: MST-MTM: EML: Electron Microscopy Laboratory
Electron Microscopy Laboratory, MST-6 Electron Microscopy Laboratory, MST-6 MST-6 Home Home In the MSL FEI Tecnai F30 Analytical TEM/STEM JEOL 6300FXV High Resolution SEM JEOL 3000F High Resolution Transmission Electron Microscope Philips XL30 F Scanning Electron Microscope & Orientation Imaging System Phillips CM30 Transmission Electron Microscope In the Sigma Building JEOL 840 EPMA with Wavelength Dispersive Spectroscopy FEI Strata DB235 FIB/SEM FEI XL30 Environmental Scanning Electron Microscope & Orientation Imaging System CONTACTS Bob Field 665.3938 Pat Dickerson 665.3036 Rob Dickerson 667.6337 Rod McCabe 606.1649 The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory (EML) is part of MST-6, the Materials Technology - Metallurgy Group within the Materials Science and Technology Division at Los Alamos National Laboratory. It is a facility dedicated to the characterization of materials primarily through imaging, chemical, and crystallographic analyses of material microstructures with several electron and ion beam instruments. Accessory characterization techniques and equipment include energy dispersive x-ray analysis (EDS), wavelength dispersive x-ray analysis (WDS), electron backscatter diffraction (EBSD) and orientation imaging microscopy (OIM), and electron energy loss spectroscopy (EELS).
Proton induced quasi-monochromatic x-ray beams for soft x-ray spectroscopy studies and selective x-ray fluorescence analysis
We present the analytical features and performance of an x-ray spectroscopy end station of moderate energy resolution operating with proton-induced quasi-monochromatic x-ray beams. The apparatus was designed, installed and operated at the 5.5 MV Tandem VdG Accelerator Laboratory of the Institute of Nuclear Physics, N.C.S.R. 'Demokritos,' Athens. The setup includes a two-level ultrahigh vacuum chamber that hosts in the lower level up to six primary targets in a rotatable holder; there, the irradiation of pure element materials-used as primary targets-with few-MeV high current ({approx}{mu}A) proton beams produces intense quasi-monochromatic x-ray beams of selectable energy. In the chamber's upper level, a six-position rotatable sample holder hosts the targets considered for x-ray spectroscopy studies. The proton-induced x-ray beam, after proper collimation, is guided to the sample position whereas various filters can be also inserted along the beam's path to eliminate the backscattered protons or/and to absorb selectively components of the x-ray beam. The apparatus incorporates an ultrathin window Si(Li) spectrometer (FWHM 136 eV at 5.89 keV) coupled with low-noise electronics capable of efficiently detecting photons down to carbon K{alpha}. Exemplary soft x-ray spectroscopy studies and results of selective x-ray fluorescence analysis are presented.
Sokaras, D. [Institute of Nuclear Physics, N.C.S.R. Demokritos, Aghia Paraskevi, 15310 Athens (Greece); Zarkadas, Ch. [PANalytical B.V., 7600 AA Almelo (Netherlands); Fliegauf, R.; Beckhoff, B. [Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, 10587 Berlin (Germany); Karydas, A. G. [Institute of Nuclear Physics, N.C.S.R. Demokritos, Aghia Paraskevi, 15310 Athens (Greece); Nuclear Spectrometry and Applications Laboratory, IAEA Laboratories, A-2444 Seibersdorf (Austria)
High efficiency multilayer blazed gratings for EUV and soft X-rays: Recent developments
Multilayer coated blazed gratings with high groove density are the best candidates for use in high resolution EUV and soft x-ray spectroscopy. Theoretical analysis shows that such a grating can be potentially optimized for high dispersion and spectral resolution in a desired high diffraction order without significant loss of diffraction efficiency. In order to realize this potential, the grating fabrication process should provide a perfect triangular groove profile and an extremely smooth surface of the blazed facets. Here we report on recent progress achieved at the Advanced Light Source (ALS) in fabrication of high quality multilayer coated blazed gratings. The blazed gratings were fabricated using scanning beam interference lithography followed by wet anisotropic etching of silicon. A 200 nm period grating coated with a Mo/Si multilayer composed with 30 bi-layers demonstrated an absolute efficiency of 37.6percent in the 3rd diffraction order at 13.6 nm wavelength. The groove profile of the grating was thoroughly characterized with atomic force microscopy before and after the multilayer deposition. The obtained metrology data were used for simulation of the grating efficiency with the vector electromagnetic PCGrate-6.1 code. The simulations showed that smoothing of the grating profile during the multilayer deposition is the main reason for efficiency losses compared to the theoretical maximum. Investigation of the grating with cross-sectional transmission electron microscopy revealed a complex evolution of the groove profile in the course of the multilayer deposition. Impact of the shadowing and smoothing processes on growth of the multilayer on the surface of the sawtooth substrate is discussed.
Voronov, Dmitriy; Ahn, Minseung; Anderson, Erik; Cambie, Rossana; Chang, Chih-Hao; Goray, Leonid; Gullikson, Eric; Heilmann, Ralf; Salmassi, Farhad; Schattenburg, Mark; Warwick, Tony; Yashchuk, Valeriy; Padmore, Howard
Studying Fischer-Tropsch catalysts using transmission electron microscopy and model systems of nanoparticles on planar supports.
Nanoparticle model systems on planar supports form a versatile platform for studying morphological and compositional changes of catalysts due to exposure to realistic reaction conditions. We review examples from our work on iron and cobalt catalysts, which can undergo significant rearrangement in the reactive environment of the Fischer-Tropsch synthesis. The use of specially designed, silicon based supports with thin film SiO{sub 2} enables the application of transmission electron microscopy, which has furnished important insight into e.g. the mechanisms of catalyst regeneration.
Thune, P. C.; Weststrate, C. J.; Moodley, P.; Saib, A. M.; van de Loosdrecht, J.; Miller, J. T.; Niemantsverdriet, J. W. (Chemical Sciences and Engineering Division); (Eindhoven Univ. of Technology); (Sasol Technology)
Absolute x-ray energy calibration over a wide energy range using a diffraction-based iterative method
In this paper, we report a method of precise and fast absolute x-ray energy calibration over a wide energy range using an iterative x-ray diffraction based method. Although accurate x-ray energy calibration is indispensable for x-ray energy-sensitive scattering and diffraction experiments, there is still a lack of effective methods to precisely calibrate energy over a wide range, especially when normal transmission monitoring is not an option and complicated micro-focusing optics are fixed in place. It is found that by using an iterative algorithm the x-ray energy is only tied to the relative offset of sample-to-detector distance, which can be readily varied with high precision of the order of 10{sup -5}-10{sup -6} spatial resolution using gauge blocks. Even starting with arbitrary initial values of 0.1 A, 0.3 A, and 0.4 A, the iteration process converges to a value within 3.5 eV for 31.122 keV x-rays after three iterations. Different common diffraction standards CeO{sub 2}, Au, and Si show an energy deviation of 14 eV. As an application, the proposed method has been applied to determine the energy-sensitive first sharp diffraction peak of network forming GeO{sub 2} glass at high pressure, exhibiting a distinct behavior in the pressure range of 2-4 GPa. Another application presented is pair distribution function measurement using calibrated high-energy x-rays at 82.273 keV. Unlike the traditional x-ray absorption-based calibration method, the proposed approach does not rely on any edges of specific elements, and is applicable to the hard x-ray region where no appropriate absorption edge is available.
Hong Xinguo; Chen Zhiqiang [Mineral Physics Institute, Stony Brook University, Stony Brook, New York 11794 (United States); Duffy, Thomas S. [Department of Geosciences, Princeton University, Princeton, New Jersey 08544 (United States)
Gray scale x-ray mask
The present invention describes a method for fabricating an embossing tool or an x-ray mask tool, providing microstructures that smoothly vary in height from point-to-point in etched substrates, i.e., structure which can vary in all three dimensions. The process uses a lithographic technique to transfer an image pattern in the surface of a silicon wafer by exposing and developing the resist and then etching the silicon substrate. Importantly, the photoresist is variably exposed so that when developed some of the resist layer remains. The remaining undeveloped resist acts as an etchant barrier to the reactive plasma used to etch the silicon substrate and therefore provides the ability etch structures of variable depths.
Morales, Alfredo M. (Livermore, CA); Gonzales, Marcela (Seattle, WA)
Photon Sciences | Beamlines | IXS: Inelastic X-ray Scattering
IXS: Inelastic X-ray Scattering IXS: Inelastic X-ray Scattering Poster | Fact Sheet | Preliminary Design Report Scientific Scope Many hot topics related to the high frequency dynamics of condensed matter require both a narrower and steeper resolution function and access to a broader dynamic range than what are currently available. This represents a sort of "no man's land" that falls right in the dynamic gap lying between the high frequency spectroscopies, such as inelastic x-ray scattering (IXS), and the low frequency ones. New IXS spectrometers with improved energy and momentum resolutions would be required to fill this gap. To achieve this goal, a new x-ray optics concept for both the monochromatization and energy analysis of x-rays will be implemented at the NSLS-II Inelastic X-ray Scattering beamline. This solution exploits the
X-Ray Fluorescence (XRF) | Open Energy Information
Open Energy Info (EERE)
X-Ray Fluorescence (XRF) X-Ray Fluorescence (XRF) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Technique: X-Ray Fluorescence (XRF) Details Activities (0) Areas (0) Regions (0) NEPA(0) Exploration Technique Information Exploration Group: Lab Analysis Techniques Exploration Sub Group: Rock Lab Analysis Parent Exploration Technique: Rock Lab Analysis Information Provided by Technique Lithology: Bulk and trace element analysis of rocks, minerals, and sediments. Stratigraphic/Structural: Hydrological: Thermal: Dictionary.png X-Ray Fluorescence (XRF): X-Ray Fluorescence is a lab-based technique used for bulk chemical analysis of rock, mineral, sediment, and fluid samples. The technique depends on the fundamental principles of x-ray interactions with solid materials, similar
Definition: X-Ray Diffraction (XRD) | Open Energy Information
X-Ray Diffraction (XRD) X-Ray Diffraction (XRD) Jump to: navigation, search Dictionary.png X-Ray Diffraction (XRD) X-Ray Diffraction (XRD) is a laboratory-based technique commonly used for identification of crystalline materials and analysis of unit cell dimensions. One of two primary types of XRD analysis (X-ray powder diffraction and single-crystal XRD) is commonly applied to samples to obtain specific information about the crystalline material under investigation. X-ray powder diffraction is widely used in geology, environmental science, material science, and engineering to rapidly identify unknown crystalline substances (typically in less than 20 minutes). A pure, finely ground, and homogenized sample is required for determination of the bulk composition. Additional uses include detailed
X-Ray Diffraction (XRD) | Open Energy Information
X-Ray Diffraction (XRD) X-Ray Diffraction (XRD) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Technique: X-Ray Diffraction (XRD) Details Activities (0) Areas (0) Regions (0) NEPA(0) Exploration Technique Information Exploration Group: Lab Analysis Techniques Exploration Sub Group: Rock Lab Analysis Parent Exploration Technique: Rock Lab Analysis Information Provided by Technique Lithology: Rapid and unambiguous identification of unknown minerals.[1] Stratigraphic/Structural: Hydrological: Thermal: Dictionary.png X-Ray Diffraction (XRD): X-Ray Diffraction (XRD) is a laboratory-based technique commonly used for identification of crystalline materials and analysis of unit cell dimensions. One of two primary types of XRD analysis (X-ray powder diffraction and single-crystal XRD) is commonly applied to samples to
Portable X-Ray Diffraction (XRD) | Open Energy Information
Portable X-Ray Diffraction (XRD) Portable X-Ray Diffraction (XRD) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Technique: Portable X-Ray Diffraction (XRD) Details Activities (0) Areas (0) Regions (0) NEPA(0) Exploration Technique Information Exploration Group: Field Techniques Exploration Sub Group: Data Collection and Mapping Parent Exploration Technique: Data Collection and Mapping Information Provided by Technique Lithology: Rapid and unambiguous identification of unknown minerals.[1] Stratigraphic/Structural: Hydrological: Thermal: Dictionary.png Portable X-Ray Diffraction (XRD): Portable X-Ray Diffraction (XRD) is a field-based technique that can be used for identification of crystalline materials and analysis of unit cell dimensions. Portable XRD analysis is similar to X-ray powder diffraction,
Density gradient free electron collisionally excited x-ray laser
An operational x-ray laser is provided that amplifies 3p-3s transition x-ray radiation along an approximately linear path. The x-ray laser is driven by a high power optical laser. The driving line focused optical laser beam illuminates a free-standing thin foil that may be associated with a substrate for improved structural integrity. This illumination produces a generally cylindrically shaped plasma having an essentially uniform electron density and temperature, that exists over a long period of time, and provides the x-ray laser gain medium. The x-ray laser may be driven by more than one optical laser beam. The x-ray laser has been successfully demonstrated to function in a series of experimental tests.
Campbell, E.M.; Rosen, M.D.
Multilayers for next generation x-ray sources
Multilayers are artificially layered structures that can be used to create optics and optical elements for a broad range of x-ray wavelengths, or can be optimized for other applications. The development of next generation x-ray sources (synchrotrons and x-ray free electron lasers) requires advances in x-ray optics. Newly developed multilayer-based mirrors and optical elements enabled efficient band-pass filtering, focusing and time resolved measurements in recent FLASH (Free Electron LASer in Hamburg) experiments. These experiments are providing invaluable feedback on the response of the multilayer structures to high intensity, short pulsed x-ray sources. This information is crucial to design optics for future x-ray free electron lasers and to benchmark computer codes that simulate damage processes.
Bajt, S; Chapman, H N; Spiller, E; Hau-Riege, S; Alameda, J; Nelson, A J; Walton, C C; Kjornrattanawanich, B; Aquila, A; Dollar, F; Gullikson, E; Tarrio, C
Ultra-short wavelength x-ray system
A method and apparatus to generate a beam of coherent light including x-rays or XUV by colliding a high-intensity laser pulse with an electron beam that is accelerated by a synchronized laser pulse. Applications include x-ray and EUV lithography, protein structural analysis, plasma diagnostics, x-ray diffraction, crack analysis, non-destructive testing, surface science and ultrafast science.
Umstadter, Donald (Ann Arbor, MI); He, Fei (Ann Arbor, MI); Lau, Yue-Ying (Potomac, MD)
NIST X-Ray Mass Attenuation Coefficients - Version History
... year, month day with database access date.) Hubbell, JH and Seltzer, SM (2004), Tables of X-Ray Mass Attenuation Coefficients and Mass Energy- ...
Optical and X-ray Imaging Techniques for Material Characterization ...
Ultrafast X-ray and 2-dimensional UV Spectroscopy of TiO2 Nanoparticles: Majed Chergui1; 1Ecole Polytechnique F�d�rale de Lausanne Mesoporous titanium�...
X-Ray and Neutron Diffraction - Programmaster.org
Oct 20, 2010 ... Strain Determination in Nanoscale Microelectronic Materials Using X-Ray Diffraction: Conal Murray1; 1IBM T.J. Watson Research Center
X-ray Tube with Magnetic Electron Steering - Energy ...
The high average power large area X-ray tube provides ... Solar Photovoltaic; Solar ... Description This invention consists of a cathode and anode ...
X-ray compass for determining device orientation
An apparatus and method for determining the orientation of a device with respect to an x-ray source are disclosed. In one embodiment, the present invention is coupled to a medical device in order to determine the rotational orientation of the medical device with respect to the x-ray source. In such an embodiment, the present invention is comprised of a scintillator portion which is adapted to emit photons upon the absorption of x-rays emitted from the x-ray source. An x-ray blocking portion is coupled to the scintillator portion. The x-ray blocking portion is disposed so as to vary the quantity of x-rays which penetrate the scintillator portion based upon the particular rotational orientation of the medical device with respect to the x-ray source. A photon transport mechanism is also coupled to the scintillator portion. The photon transport mechanism is adapted to pass the photons emitted from the scintillator portion to an electronics portion. By analyzing the quantity of the photons, the electronics portion determines the rotational orientation of the medical device with respect to the x-ray source. 25 figs.
Da Silva, L.B.; Matthews, D.L.; Fitch, J.P.; Everett, M.J.; Colston, B.W.; Stone, G.F.
Synchrotron X-ray Studies of Supercritical Carbon Dioxide/ Reservoir...
Edit with form History Facebook icon Twitter icon Synchrotron X-ray Studies of Supercritical Carbon Dioxide Reservoir Rock Interfaces Geothermal Lab Call Project Jump to:...
Phase Sensitive X-ray Imager for More Accurate Digital ...
Livermore Lab Report. News Archive. News ... use of higher energy X-rays which would result in a lower amount of absorbed radiation to the ... testing ...
Proceedings of the 12th International Clay Conference, Bahia Blanca, Argentina, July 22-28, 2001. Gibbs, D. X-ray magnetic scattering. Synchrotron Radiation News...
APS X-ray Optics Fabrication and Characterization Facility
The APS is in the process of assembling an X-ray Optics Fabrication and characterization Facility. This report will describe its current (as of February 1993) design.
Davey, S.
Bibliography of NRL Works on X-Ray Fluorescence Authored ...
... LS Birks, and EJ Brooks, "Grain-Boundary Diffusion of Zinc in Copper ... 111 J. Gilfrich, "X-Ray Diffraction Studies on the Titanium-Nickel System," in ...
Particle Accelerator & X-Ray Optics | Argonne National Laboratory
Hard X-Ray Quad Collimator Facilitates Microcrystallography Experiments Isotopic Abundance in Atom Trap Trace Analysis Nanomaterials Analysis using a Scanning Electron Microscope...
Sandia National Laboratories has created an improved efficiency compact X-ray source to address a wide range ... escape the anode and cause electron h ...
Temporal multiplexing radiography for dynamic x-ray imaging
All current x-ray imaging devices acquire images sequentially, one at a time. Using a spatially distributed multibeam x-ray source we recently demonstrated the feasibility for multiplexing x-ray imaging, which can significantly increase the data collection speed. Here we present a general methodology for dynamic x-ray imaging of an object in cyclic motion with temporal multiplexing. Compared to the conventional sequential imaging technique, where 2N-1 phase images are required and N exposures are needed for a single phase image, a temporal multiplexing of dimension 2N-1 can reduce the imaging time by a factor of N while maintaining the temporal resolution.
Cao Guohua [Department of Physics and Astronomy, University of North Carolina, Chapel Hill, North Carolina 27599 (United States); Zhang Jian [Department of Radiation Oncology and Department of Physics and Astronomy, University of North Carolina, Chapel Hill, North Carolina 27599 (United States); Zhou, Otto; Lu Jianping [Department of Physics and Astronomy and Curriculum in Applied Sciences and Engineering, University of North Carolina, Chapel Hill, North Carolina, 27599 (United States)
High Temperature X-ray Diffraction Characterization of Thermal ...
Application of Conical Beam X-Ray Tomography to Multi-Phase Materials ... Digital Construction and Characterization of Reticulated Porous Microstructures�...
dosimetry of x-rays, gamma rays and electrons
... NIST and BIPM Standards for Air Kerma in Medium-Energy X-rays ... of the codes are available from the Government Printing Office, Washington, DC ...
In situ X-ray Characterization of Energy Storage Materials |...
to accurately characterize the dynamic electrochemical processes at the nanometer and atomic level, we have employed a set of complementary, in situ X-ray characterization...
For Prospective Users: Learn about x-ray research
research in the fields of materials science; biological science; physics; chemistry; environmental, geophysical, and planetary science; and innovative x-ray instrumentation....
Staff at sector 30, inelastic x-ray scattering
Status and Schedule Safety and Training Divisions APS Engineering Support Division AES Groups Accelerator Systems Division ASD Groups X-ray Science Division XSD Groups...
SLAC National Accelerator Laboratory - X-ray Science
energy technologies. SLAC's unique X-ray facilities - the Linac Coherent Light Source (LCLS) and the Stanford Synchrotron Radiation Lightsource (SSRL) - attract thousands of...
New Directions in X-ray Scattering - SSRL
associated with chemically and radioactively contaminated ground-water. Ability to probe weak scattering from single crystals as function of energy (resonance) and x-ray...
Improved Treatment of X-ray Resistant & Inoperable Cancers ...
If the electron beam can be transported to the internal cancer without exposure to tissue, ... This figure shows a comparison of X-ray radiation ...
Spatially-Resolved X-Ray Microdiffraction Studies Inside Individual ...
This talk will describe recent advances including increased scanning speed, and will describe the use of this x-ray microscope to study mesoscale structural�...
Background X-ray Spectrum of Radioactive Samples
An energy-dispersive X-ray spectrometer (EDS) is commonly used with a scanning electron microscope (SEM) to analyze the elemental compositions and microstructures of a variety of samples. For example, the microstructures of nuclear fuels are commonly investigated with this technique. However, the radioactivity of some materials introduces additional X-rays that contribute to the EDS background spectrum. These X-rays are generally not accounted for in spectral analysis software, and can cause misleading results. X-rays from internal conversion [1], Bremsstrahlung [2] radiation associated with alpha ionizations and beta particle interactions [3], and gamma rays from radioactive decay can all elevate the background of radioactive materials.
Shannon Yee; Dawn E. Janney
Applications of High Resolution X-ray Computed Tomography in ...
... data, including concentration profiles from x-ray absorption measurements during ... Dynamic Evolution of Liquid-liquid Phase Separation While Cooling in a
Determining the Uncertainty of X-Ray Absorption ...
... The apparatus uses a tungsten filament and a tungsten target to generate x rays and the detector contains a CZT crystal. ...
X-ray Detection with Large Area Avalanche Photodiodes for ...
... The primary photon detector was a 12-element ... The overall energy range for the experiment was ... to directly detect X-rays with energies between 0.3 ...
Spectrometry of X-Ray Beams Used for Calibrations
... and used to calibrate a wavelength-dispersive crystal x-ray spectrograph used by Lawrence Livermore National Laboratory (LLNL) to diagnose ...
Neutron and X-Ray Studies of Advanced Materials IV
We propose to organize a seven-session Symposium on Neutron and X-Ray ... the advent of new powerful neutron sources such as the Spallation Neutron�...
Available Technologies: High Temperature Strain Cell for X-ray ...
High Temperature Strain Cell for X-ray ... Six hexapole infrared lamps focus inside the sample chamber onto a ceramic material sample with a spherical ...
An apparatus and method for determining the orientation of a device with respect to an x-ray source. In one embodiment, the present invention is coupled to a medical device in order to determine the rotational orientation of the medical device with respect to the x-ray source. In such an embodiment, the present invention is comprised of a scintillator portion which is adapted to emit photons upon the absorption of x-rays emitted from the x-ray source. An x-ray blocking portion is coupled to the scintillator portion. The x-ray blocking portion is disposed so as to vary the quantity of x-rays which penetrate the scintillator portion based upon the particular rotational orientation of the medical device with respect to the x-ray source. A photon transport mechanism is also coupled to the scintillator portion. The photon transport mechanism is adapted to pass the photons emitted from the scintillator portion to an electronics portion. By analyzing the quantity of the photons, the electronics portion determines the rotational orientation of the medical device with respect to the x-ray source.
Da Silva, Luiz B. (Danville, CA); Matthews, Dennis L. (Moss Beach, CA); Fitch, Joseph P. (Livermore, CA); Everett, Matthew J. (Pleasanton, CA); Colston, Billy W. (Livermore, CA); Stone, Gary F. (Livermore, CA)
Inelastic X-ray Scattering Reveals Microscopic Transport Properties...
Inelastic X-ray Scattering Reveals Microscopic Transport Properties of Molten Aluminum Oxide The transport properties of high-temperature oxide melts are of considerable interest...
SLAC National Accelerator Laboratory - X-ray Laser Pulses in...
SLAC researchers have demonstrated for the first time how to produce pairs of X-ray laser pulses in slightly different wavelengths, or colors, with finely adjustable intervals...
NIST X-Ray Transition Energies Version History
... Jr., P. Indelicato, L. de Billy, E. Lindroth, and J. Anton, "X-ray transition energies: new approach to a ... [Type of medium] Available: URL [Access date]. ...
Angular Correlations of the X-Ray Background and Clustering of Extragalactic X-Ray Sources
The information content of the autocorrelation function (ACF) of intensity fluctuations of the X-ray background (XRB) is analyzed. The tight upper limits set by ROSAT deep survey data on the ACF at arcmin scales imply strong constraints on clustering properties of X-ray sources at cosmological distances and on their contribution to the soft XRB. If quasars have a clustering radius r_0=12-20 Mpc (H_0=50), and their two point correlation function, is constant in comoving coordinates as indicated by optical data, they cannot make up more 40-50% of the soft XRB (the maximum contribution may reach 80% in the case of stable clustering, epsilon=0). Active Star-forming (ASF) galaxies clustered like normal galaxies, with r_0=10-12 Mpc can yield up to 20% or up to 40% of the soft XRB for epsilon=-1.2 or epsilon=0, respectively. The ACF on degree scales essentially reflects the clustering properties of local sources and is proportional to their volume emissivity. The upper limits on scales of a few degrees imply that hard X-ray selected AGNs have r_06 deg, if real, may be due to AGNs with r_0=20 Mpc; the contribution from clusters of galaxies with r_0~50 Mpc is a factor 2 lower.
L. Danese; L. Toffolatti; A. Franceschini; J. M. Martin-Mirones; G. De Zotti
X-ray Methods in High-Intensity Discharges and Metal-Halide Lamps: X-ray Induced Fluorescence
We describe the use of x-ray induced fluorescence to study metal-halide high-intensity discharge lamps and to measure equilibrium vapor pressures of metal-halide salts. The physical principles of metal-halide lamps, relevant aspects of x-ray-atom interactions, the experimental method using synchrotron radiation, and x-ray induced fluorescence measurements relevant to metal-halide lamps are covered.
Curry, John J.; Lapatovich, Walter P.; Henins, Albert (NIST)
Progress in Cell Marking for Synchrotron X-ray Computed Tomography
Recently there has been an increase in research activity into finding ways of marking cells in live animals for pre-clinical trials. Development of certain drugs and other therapies crucially depend on tracking particular cells or cell types in living systems. Therefore cell marking techniques are required which will enable longitudinal studies, where individuals can be examined several times over the course of a therapy or study. The benefits of being able to study both disease and therapy progression in individuals, rather than cohorts are clear. The need for high contrast 3-D imaging, without harming or altering the biological system requires a non-invasive yet penetrating imaging technique. The technique will also have to provide an appropriate spatial and contrast resolution. X-ray computed tomography offers rapid acquisition of 3-D images and is set to become one of the principal imaging techniques in this area. Work by our group over the last few years has shown that marking cells with gold nano-particles (GNP) is an effective means of visualising marked cells in-vivo using x-ray CT. Here we report the latest results from these studies. Synchrotron X-ray CT images of brain lesions in rats taken using the SYRMEP facility at the Elettra synchrotron in 2009 have been compared with histological examination of the tissues. Some deductions are drawn about the visibility of the gold loaded cells in both light microscopy and x-ray imaging.
Hall, Christopher [Monash Centre for Synchrotron Science, Monash University, Imaging and Medical Beam Line, Australian Synchrotron (Australia); Sturm, Erica [Department of Medical Imaging and Radiation Sciences, Monash University (Australia); Schultke, Elisabeth [Dept of Stereotactic Neurosurgery, Albert Ludwigs University of Freiburg (Germany); Arfelli, Fulvia; Astolfo, Alberto [Department of Physics, University of Trieste, Trieste (Italy); Menk, Ralf-Hendrik [Sincrotrone Trieste SCpA, Trieste (Italy); Juurlink, Bernhard H. J. [College of Medicine, Alfaisal University, Riyadh (Saudi Arabia)
X-Ray Imaging of the Dynamic Magnetic Vortex Core Deformation
X-Ray Imaging of the Dynamic X-Ray Imaging of the Dynamic Magnetic Vortex Core Deformation X-Ray Imaging of the Dynamic Magnetic Vortex Core Deformation Print Wednesday, 25 November 2009 00:00 Magnetic thin-film nanostructures can exhibit a magnetic vortex state in which the magnetization vectors lie in the film plane and curl around in a closed loop. At the very center of the vortex, a small, stable core exists where the magnetization points either up or down out of the plane. Three years ago, the discovery of an easy core reversal mechanism at the ALS not only made the possibility of using such systems as magnetic memories much more realistic, it also initiated investigation of the core switching mechanism itself. Now, a Belgian-German-ALS collaboration has used high-resolution, time-resolved, magnetic x-ray microscopy to experimentally reveal the first step of the reversal process: the dynamic deformation of the vortex core. The group also measured a critical vortex velocity above which reversal occurs. Both these observations provide the first experimental support for the postulated reversal mechanism.
Real-Space x-ray tomographic reconstruction of randomly oriented objects with sparse data frames
Schemes for X-ray imaging single protein molecules using new x-ray sources, like x-ray free electron lasers (XFELs), require processing many frames of data that are obtained by taking temporally short snapshots of identical molecules, each with a random and unknown orientation. Due to the small size of the molecules and short exposure times, average signal levels of much less than 1 photon/pixel/frame are expected, much too low to be processed using standard methods. One approach to process the data is to use statistical methods developed in the EMC algorithm (Loh & Elser, Phys. Rev. E, 2009) which processes the data set as a whole. In this paper we apply this method to a real-space tomographic reconstruction using sparse frames of data (below $10^{-2}$ photons/pixel/frame) obtained by performing x-ray transmission measurements of a low-contrast, randomly-oriented object. This extends the work by Philipp et al. (Optics Express, 2012) to three dimensions and is one step closer to the single molecule recons...
Ayyer, Kartik; Tate, Mark W; Elser, Veit; Gruner, Sol M
Dynamic Processes in Biology, Chemistry, and Materials Science: Opportunities for UltraFast Transmission Electron Microscopy - Workshop Summary Report
This report summarizes a 2011 workshop that addressed the potential role of rapid, time-resolved electron microscopy measurements in accelerating the solution of important scientific and technical problems. A series of U.S. Department of Energy (DOE) and National Academy of Science workshops have highlighted the critical role advanced research tools play in addressing scientific challenges relevant to biology, sustainable energy, and technologies that will fuel economic development without degrading our environment. Among the specific capability needs for advancing science and technology are tools that extract more detailed information in realistic environments (in situ or operando) at extreme conditions (pressure and temperature) and as a function of time (dynamic and time-dependent). One of the DOE workshops, Future Science Needs and Opportunities for Electron Scattering: Next Generation Instrumentation and Beyond, specifically addressed the importance of electron-based characterization methods for a wide range of energy-relevant Grand Scientific Challenges. Boosted by the electron optical advancement in the last decade, a diversity of in situ capabilities already is available in many laboratories. The obvious remaining major capability gap in electron microscopy is in the ability to make these direct in situ observations over a broad spectrum of fast (�s) to ultrafast (picosecond [ps] and faster) temporal regimes. In an effort to address current capability gaps, EMSL, the Environmental Molecular Sciences Laboratory, organized an Ultrafast Electron Microscopy Workshop, held June 14-15, 2011, with the primary goal to identify the scientific needs that could be met by creating a facility capable of a strongly improved time resolution with integrated in situ capabilities. The workshop brought together more than 40 leading scientists involved in applying and/or advancing electron microscopy to address important scientific problems of relevance to DOE�s research mission. This workshop built on previous workshops and included three breakout sessions identifying scientific challenges in biology, biogeochemistry, catalysis, and materials science frontier areas of fundamental science that underpin energy and environmental science that would significantly benefit from ultrafast transmission electron microscopy (UTEM). In addition, the current status of time-resolved electron microscopy was examined, and the technologies that will enable future advances in spatio-temporal resolution were identified in a fourth breakout session.
Kabius, Bernd C.; Browning, Nigel D.; Thevuthasan, Suntharampillai; Diehl, Barbara L.; Stach, Eric A.
In situ synchrotron x-ray studies of LiMn{sub 2}O{sub 4} cathodes
LiCoO{sub 2} cathodes are now used in most commercial lithium ion batteries. LiMn{sub 2}O{sub 4} is an attractive low cost alternative. However, it is difficult to make reproducibly. At Brookhaven National Laboratory two in situ synchrotron x-ray techniques, that are available at the National Synchrotron Light Source (NSLS), have been used to investigate LiMn{sub 2}O{sub 4}. The techniques are x-ray absorption and high resolution x-ray diffraction. With x-ray absorption it is possible to follow the changes in the Mn oxidation state and the changes in the Mn-O and Mn-Mn bond lengths on cycling. Also it is possible to detect amorphous phases. The high energy x-rays at the diffraction Beam Lines at the NSLS (up to 24 KeV) permit in situ x-ray diffraction, in the transmission mode, in thin lithium and lithium ion cells. The evolution of the structural chances that occur on cycling can be followed. These in situ measurements were done on Li/LiMn{sub 2}O{sub 4} cells with a liquid electrolyte (1 M LiPF{sub 6} in a 1:1:3 PC:EC:DMC solvent).
McBreen, J.; Mukerjee, S.; Yang, X.Q. [and others
X-ray spectral states of microquasars
We discuss the origin of the dramatically different X-ray spectral shapes observed in the Low Hard State (LHS: dominated by thermal comptonisation) and the High Soft State (HSS: dominated by the accretion disc thermal emission and non-thermal comptonisation in the corona). We present numerical simulations using a new code accounting for the so-called synchrotron boiler effect. These numerical simulations when compared to the data allow us to constrain the magnetic field and temperature of the hot protons in the corona. For the hard state of Cygnus X-1 we find a magnetic field below equipartition with radiation, suggesting that the corona is not powered through magnetic field dissipation (as assumed in most accretion disc corona models). On the other hand, our results also point toward proton temperatures that are substantially lower than typical temperatures of the ADAF models. Finally, we show that in both spectral states Comptonising plasma could be powered essentially through power-law acceleration of non-thermal electrons, which are then partly thermalised by the synchrotron and Coulomb boiler. This suggests that, contrary to current beliefs, the corona of the HSS and that of the LHS could be of very similar nature. The differences between the LHS and HSS coronal spectra would then be predominantly caused by the strong disc soft cooling emission which is present in the HSS and absent in the LHS.
Julien Malzac; Renaud Belmont
X-ray attenuation properties of stainless steel (u)
Stainless steel vessels are used to enclose solid materials for studying x-ray radiolysis that involves gas release from the materials. Commercially available stainless steel components are easily adapted to form a static or a dynamic condition to monitor the gas evolved from the solid materials during and after the x-ray irradiation. Experimental data published on the x-ray attenuation properties of stainless steel, however, are very scarce, especially over a wide range of x-ray energies. The objective of this work was to obtain experimental data that will be used to determine how a poly-energetic x-ray beam is attenuated by the stainless steel container wall. The data will also be used in conjunction with MCNP (Monte Carlos Nuclear Particle) modeling to develop an accurate method for determining energy absorbed in known solid samples contained in stainless steel vessels. In this study, experiments to measure the attenuation properties of stainless steel were performed for a range of bremsstrahlung x-ray beams with a maximum energy ranging from 150 keV to 10 MeV. Bremsstrahlung x-ray beams of these energies are commonly used in radiography of engineering and weapon components. The weapon surveillance community has a great interest in understanding how the x-rays in radiography affect short-term and long-term properties of weapon materials.
Wang, Lily L [Los Alamos National Laboratory; Berry, Phillip C [Los Alamos National Laboratory
High-energy x-ray production with pyroelectric crystals
The invention of pyroelectric x-ray generator technology has enabled researchers to develop ultraportable, low-power x-ray sources for use in imaging, materials analysis, and other applications. For many applications, the usefulness of an x-ray source is determined by its yield and endpoint energy. In x-ray fluorescence, for example, high-energy sources enable the excitation of the K-shell x-ray peaks for high-Z materials as well as the lower-energy L-shell peaks, allowing more positive sample identification. This report shows how a paired-crystal pyroelectric source can be used to approximately double the endpoint x-ray energy, in addition to doubling the x-ray yield, versus a single-crystal source. As an example of the advantage of a paired-crystal system, we present a spectrum showing the fluorescence of the K shell of thorium using a pyroelectric source, as well as a spectrum showing the fluorescence of the K shell of lead. Also shown is an x-ray spectrum with an endpoint energy of 215 keV.
Geuther, Jeffrey A.; Danon, Yaron [Department of Mechanical, Aerospace, and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180 (United States)
96 ESRF HIGHLIGHTS 2005 X-RAY ABSORPTION AND MAGNETIC SCATTERING References [1] C. Antoniak, J to original phenomena. These effects are observed in charge-density wave (CDW) materials. Upon cooling of the screw like dislocation shown in Figure 121b. #12;97 HIGHLIGHTS 2005 ESRF X-RAY ABSORPTION AND MAGNETIC
Paris-Sud 11, Université de
Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters
Atomic-resolution imaging in the scanning transmission electron microscope (STEM) constitutes a powerful tool for nanostructure characterization. Here, we demonstrate the quantitative interpretation of atomic-resolution high-angle annular dark-field (ADF) STEM images using an approach that does not rely on adjustable parameters. We measure independently the instrumental parameters that affect sub-0.1 nm-resolution ADF images, quantify their individual and collective contributions to the image intensity, and show that knowledge of these parameters enables a quantitative interpretation of the absolute intensity and contrast across all accessible spatial frequencies. The analysis also provides a method for the in-situ measurement of the STEM's effective source distribution.
Dwyer, C. [Monash Centre for Electron Microscopy, Monash University, Victoria 3800 (Australia); Department of Materials Engineering, Monash University, Victoria 3800 (Australia); ARC Centre of Excellence for Design in Light Metals, Monash University, Victoria 3800 (Australia); Maunders, C. [Department of Materials Engineering, Monash University, Victoria 3800 (Australia); Zheng, C. L. [Monash Centre for Electron Microscopy, Monash University, Victoria 3800 (Australia); Weyland, M.; Etheridge, J. [Monash Centre for Electron Microscopy, Monash University, Victoria 3800 (Australia); Department of Materials Engineering, Monash University, Victoria 3800 (Australia); Tiemeijer, P. C. [FEI Electron Optics, P.O. Box 80066, 5600 KA Eindhoven (Netherlands)
Probing Spatial, Electronic Structures with X-ray Scattering, Spectroscopic
Probing Spatial, Electronic Structures with X-ray Scattering, Spectroscopic Probing Spatial, Electronic Structures with X-ray Scattering, Spectroscopic Techniques Wednesday, September 5, 2012 - 10:45am SLAC, Bldg. 137, Room 226 Gang Chen Seminar: Structures at atomic scales are traditionally determined through X-ray crystallography that amplifies scattering intensities by introducing spatial periodicity. For amorphous materials and many macromolecules, such as viruses, proteins and biofilms, it is hard to determine structures due to their incapability to crystallize or change of configuration during crystallization. In this talk, I will present the application of X-ray reflectivity and a newly developed fluctuation X-ray scattering technique to study the structures of lipid membranes and randomly oriented nanoparticles. Three different types of domain registrations occurring with
Resonant Soft X-Ray Scattering - Combining Structural with Spectroscopic
Resonant Soft X-Ray Scattering - Combining Structural with Spectroscopic Resonant Soft X-Ray Scattering - Combining Structural with Spectroscopic Refinement Friday, September 28, 2012 - 10:00am SLAC, Bldg. 137, Room 322 SSRL Presents Kevin Stone X-ray absorption spectroscopy has become an important tool in understanding the electronic structure of materials. Resonant absorption edges in the soft x-ray regime are especially interesting as they allow the study of the lighter elements, such as in organic or organo-metallic substances, as well as important L-edges of the 3d transition metals important in magnetic and oxide systems. Measurements of soft x-ray absorption spectra are inherently surface sensitive, and are plagued by issues such as extinction (in electron yield measurements) or self absorption (in fluorescence yield
Broadband high resolution X-ray spectral analyzer
A broad bandwidth high resolution x-ray fluorescence spectrometer has a performance that is superior in many ways to those currently available. It consists of an array of 4 large area microcalorimeters with 95% quantum efficiency at 6 keV and it produces x-ray spectra between 0.2 keV and 7 keV with an energy resolution of 7 to 10 eV. The resolution is obtained at input count rates per array element of 10 to 50 Hz in real-time, with analog pulse processing and thermal pile-up rejection. This performance cannot be matched by currently available x-ray spectrometers. The detectors are incorporated into a compact and portable cryogenic refrigerator system that is ready for use in many analytical spectroscopy applications as a tool for x-ray microanalysis or in research applications such as laboratory and astrophysical x-ray and particle spectroscopy.
Silver, Eric H. (Berkeley, CA); Legros, Mark (Berkeley, CA); Madden, Norm W. (Livermore, CA); Goulding, Fred (Lafayette, CA); Landis, Don (Pinole, CA)
X-Ray Observations of Gamma-Ray Burst Afterglows
The discovery by the BeppoSAX satellite of X-ray afterglow emission from the gamma-ray burst which occurred on 28 February 1997 produced a revolution in our knowledge of the gamma-ray burst phenomenon. Along with the discovery of X-ray afterglows, the optical afterglows of gamma-ray bursts were discovered and the distance issue was settled, at least for long $\\gamma$-ray bursts. The 30 year mystery of the gamma-ray burst phenomenon is now on the way to solution. Here I rewiew the observational status of the X-ray afterglow emission, its mean properties (detection rate, continuum spectra, line features, and light curves), and the X-ray constraints on theoretical models of gamma-ray bursters and their progenitors. I also discuss the early onset afterglow emission, the remaining questions, and the role of future X-ray afterglow observations.
Filippo Frontera
A broad bandwidth high resolution X-ray fluorescence spectrometer has a performance that is superior in many ways to those currently available. It consists of an array of 4 large area microcalorimeters with 95% quantum efficiency at 6 keV and it produces X-ray spectra between 0.2 keV and 7 keV with an energy resolution of 7 to 10 eV. The resolution is obtained at input count rates per array element of 10 to 50 Hz in real-time, with analog pulse processing and thermal pile-up rejection. This performance cannot be matched by currently available X-ray spectrometers. The detectors are incorporated into a compact and portable cryogenic refrigerator system that is ready for use in many analytical spectroscopy applications as a tool for X-ray microanalysis or in research applications such as laboratory and astrophysical X-ray and particle spectroscopy. 6 figs.
Silver, E.H.; Legros, M.; Madden, N.W.; Goulding, F.; Landis, D.
Thermodynamic Prediction of Compositional Phases Confirmed by Transmission Electron Microscopy on Tantalum-Based Alloy Weldments
Tantalum alloys have been used by the U.S. Department of Energy as structural alloys for radioisotope based thermal to electrical power systems since the 1960s. Tantalum alloys are attractive for high temperature structural applications due to their high melting point, excellent formability, good thermal conductivity, good ductility (even at low temperatures), corrosion resistance, and weldability. Tantalum alloys have demonstrated sufficient high-temperature toughness to survive prolonged exposure to the radioisotope power-system working environment. Typically, the fabrication of power systems requires the welding of various components including the structural members made of tantalum alloys. Issues such as thermodynamics, lattice structure, weld pool dynamics, material purity and contamination, and welding atmosphere purity all potentially confound the understanding of the differences between the weldment properties of the different tantalum-based alloys. The objective of this paper is to outline the thermodynamically favorable material phases in tantalum alloys, with and without small amounts of hafnium, during and following solidification, based on the results derived from the FactSage(c) Integrated Thermodynamic Databank. In addition, Transition Electron Microscopy (TEM) data will show for the first time, the changes occurring in the HfC before and after welding, and the data will elucidate the role HfC plays in pinning grain boundaries.
Moddeman, William E.; Birkbeck, Janine C. [BWXT Pantex, Amarillo, Texas 79120-0020 (United States); Barklay, Chadwick D.; Kramer, Daniel P. [University of Dayton Research Institute, Dayton OH 45469-0102 (United States); Miller, Roger G.; Allard, Lawrence F. [Oak Ridge National Laboratory, Oak Ridge, TN 37831-6064 (United States)
Transmission electron microscopy characterization of electrically stressed AlGaN/GaN high electron mobility transistor devices
A set of AlGaN/GaN high electron mobility transistor devices has been investigated using step-stress testing, and representative samples of undegraded, source-side-degraded, and drain-side-degraded devices were examined using electron microscopy and microanalysis. An unstressed reference sample was also examined. All tested devices and their corresponding transmission electron microscopy samples originated from the same wafer and thus received nominally identical processing. Step-stressing was performed on each device and the corresponding current voltage characteristics were generated. Degradation in electrical performance, specifically greatly increased gate leakage current, was shown to be correlated with the presence of crystal defects near the gate edges. However, the drain-side-degraded device showed a surface pit on the source side, and another region of the same device showed no evidence of damage. Moreover, significant metal diffusion into the barrier layer from the gate contacts was also observed, as well as thin amorphous oxide layers below the gate metal contacts, even in the unstressed sample. Overall, these observations emphasize that gate-edge defects provide only a partial explanation for device failure.
Johnson, Michael [Arizona State University; Cullen, David A [ORNL; Liu, Lu [University of Florida; Kang, Tsung Sheng [University of Florida, Gainesville; Ren, F. [University of Florida; Chang, C. Y. [University of Florida; Pearton, S. J. [University of Florida; Jang, Soohwan [University of Florida, Gainesville; Johnson, Wayne J. [Kopin Corporation, Taunton, MA; Smith, David J [Arizona State University
We measure the metal abundance ratios in the X-ray photoionized gas located near the narrow line region of a sample of Seyfert 2 AGN. The high-resolution X-ray spectra observed with the Chandra high- and low-energy transmission grating spectrometers are compared with models of the resonant scattering and recombination emission from a plasma in thermal balance, and with multiple temperature zones. The abundance ratios in the sample are close to the Solar values, with slight over-abundances of N in NGC 1068, and of Ne in NGC 4151. Our X-ray spectral models use fewer degrees of freedom than previous works. Motivation. Our goal is to use X-ray abundance measurements to cross-calibrate with the optical spectra of quasars. These optical spectra are used to measure the star formation history of the early Universe. 1 To Determine the Abundance Ratios, we fit the Seyfert 2 spectra with models of photoionized plasmas, and then search for deviations in the data from Solar abundances, as shown in Fig. 1. The fluxes of radiative recombination continuum (RRC) features and the radiative recombination (RR) forbidden lines depend little on radiation transfer effects, so they are the most reliable abundance indicators. At low continuum optical depths, the recombination emission flux scales linearly with abundances. Our model allows us to fit the RRC and RR fluxes by accounting for the broad ionization distribution in the plasma. X-ray Emission Line Model. We model a photoionized plasma in ionization equilibrium and thermal balance with a grid of zones, each with ionization parameter log ? = 1.0, 1.5,...4.5 (in c.g.s. units). The XSTAR plasma code yields the charge state distribution of each zone. 2 In order to calculate the recombination emission, we use the photoelectric cross sections
Mario A. Jimenez-garate; Toan Khu
Femtosecond Time-Delay X-ray Holography
Time-Delay X-ray Holography Time-Delay X-ray Holography X-ray free-electron lasers (XFELs) will produce photon pulses with a unique and desirable combination of properties. Their short X-ray wavelengths allow penetration into materials and the ability to probe structure at and below the nanometer scale. Their ultra-short duration gives information about this structure at the fundamental time-scales of atoms and molecules. The extreme intensity of the pulses will allow this information to be acquired in a single shot, so that these studies can be carried out on non-repeatable processes or on weakly-scattering objects that will be modified by the pulse. A fourth property of XFEL pulses is their high transverse coherence, which brings the promise of decades of innovation in visible optics to the X-ray regime, such as holography, interferometry, and laser-based imaging. Making an effective use of XFEL pulses, however, will benefit from innovations that are new to both X-ray science and coherent optics. One such innovation is the new method of time-delay X-ray holography [i], recently demonstrated at the FLASH FEL at DESY in Hamburg, to measure the evolution of objects irradiated by intense pulses.
Resonant Auger Effect at High X-Ray Intensity
The resonant Auger effect of atomic neon exposed to high-intensity x-ray radiation in resonance with the 1s {yields} 3p transition is discussed. High intensity here means that the x-ray peak intensity is sufficient ({approx} 10{sup 18} W/cm{sup 2}) to induce Rabi oscillations between the neon ground state and the 1s{sup -1}3p ({sup 1}P) state within the relaxation lifetime of the inner-shell vacancy. For the numerical analysis presented, an effective two-level model, including a description of the resonant Auger decay process, is employed. Both coherent and chaotic x-ray pulses are treated. The latter are used to simulate radiation from x-ray free-electron lasers based on the principle of self-amplified spontaneous emission. Observing x-ray-driven atomic population dynamics in the time domain is challenging for chaotic pulse ensembles. A more practical option for experiments using x-ray free-electron lasers is to measure the line profiles in the kinetic energy distribution of the resonant Auger electron. This provides information on both atomic population dynamics and x-ray pulse properties.
Rohringer, N; Santra, R
X-ray emission from laser-produced plasmas
The intensity and spectral characteristics of x-ray emitted from laser-produced plasmas have been investigated computatinoally and experimentally. a two-dimensional implosi code was used successfully to calculate laser-plasma radiation characteristics and to aid in the design of laser targets for high-yield x-ray production. Other computer codes, in use or under development predict lime strengths and energies for laser-plasma x-ray emission. An experimental effort is aimed at reliable measurements of x-ray yields and spectra. a wide variety of x-ray detection methods have been evaluated, and x-ray yields have been measured from plasmas produced with two dissimilar laser systems. The high energy x-ray spectrum, from about 10 to 140 keV, has been studied using high-gain scintillatino detectors and thick K-edge filters. Various supplementary measurements have provided information concerning characteristics of the target-reflected laser light, the ion energies, and the laser intensity patterns.
Violet, C.E. [ed.
Direct three-dimensional coherently scattered x-ray microtomography
Purpose: It has been shown that coherently scattered x rays can be used to discriminate and identify specific components in a mixture of low atomic weight materials. The authors demonstrated a new method of doing coherently scattered x-ray tomography with a thin sheet of x ray. Methods: A collimated x-ray fan-beam, a parallel polycapillary collimator, and a phantom consisting of several biocompatible materials of low attenuation-based contrast were used to investigate the feasibility of the method. Because of the particular experimental setup, only the phantom translation perpendicular to the x-ray beam is needed and, thus, there is no need of Radon-type tomographic reconstruction, except for the correction of the attenuation to the primary and scattered x rays, which was performed by using a conventional attenuation-based tomographic image data set. The coherent scatter image contrast changes with momentum transfer among component materials in the specimen were investigated with multiple x-ray sources with narrow bandwidth spectra generated with anode and filter combinations of Cu/Ni (8 keV), Mo/Zr (18 keV), and Ag/Pd (22 keV) and at multiple scatter angles by orienting the detector and polycapillary collimator at different angles to the illuminating x ray. Results: The contrast among different materials changes with the x-ray source energy and the angle at which the image was measured. The coherent scatter profiles obtained from the coherent scatter images are consistent with the published results. Conclusions: This method can be used to directly generate the three-dimensional coherent scatter images of small animal, biopsies, or other small objects with low atomic weight biological or similar synthetic materials with low attenuation contrast. With equipment optimized, submillimeter spatial resolution may be achieved.
Cui Congwu; Jorgensen, Steven M.; Eaker, Diane R.; Ritman, Erik L. [Department of Medical Physics, CancerCare Manitoba, 675 McDermot Avenue, Winnipeg, Manitoba R3E 0V9 (Canada); Department of Physiology and Biomedical Engineering, Mayo Clinic, 200 First Street Southwest, Alfred Building 2-409, Rochester, Minnesota 55905 (United States)
X-ray afterglows from gamma-ray bursts
We consider possible interpretations of the recently detected X- ray afterglow from the gamma-ray burst source GRB 970228. Cosmological and Galactic models of gamma-ray bursts predict different flux and spectral evolution of X-ray afterglows. We show that models based on adiabatic expansion of relativistic forward shocks require very efficient particle energization or post-burst re-acceleration during the expansion. Cooling neutron star models predict a very distinctive spectral and flux evolution that can be tested in current X-ray data.
M. Tavani
Ten years of Vela x-ray observations
The Vela spacecraft, particularly Vela 5B, produced all-sky X-ray data of unprecedented length and completeness. The data led to the discovery of X-ray bursts and numerous transient outbursts. Recent re-analysis has put the data in the form of 10-day skymaps covering a 7-year period, which have led to the discovery or confirmation of a number of long-term periodicities, and have made possible a time-lapse movie of the X-ray sky.
Terrell, J.; Priedhorsky, W.C.
Chandra X-ray Observatory Detection of Extended X-ray Emission from the Planetary Nebula BD+303639
We report the detection of well resolved, extended X-ray emission from the young planetary nebula BD+303639 using the Advanced CCD Imaging Spectrometer (ACIS) aboard the Chandra X-ray Observatory. The X-ray emission from BD+303639 appears to lie within, but is concentrated to one side of, the interior of the shell of ionized gas seen in high-resolution optical and IR images. The relatively low X-ray temperature (Tx ~ 3x10^6 K) and asymmetric morphology of the X-ray emission suggests that conduction fronts are present and/or mixing of shock-heated and photoionized gas has occurred and, furthermore, hints at the presence of magnetic fields. The ACIS spectrum suggests that the X-ray emitting region is enriched in the products of helium burning. Our detection of extended X-ray emission from BD+303639 demonstrates the power and utility of Chandra imaging as applied to the study of planetary nebulae.
K�stner, J H; Vrtilek, S D; Dgani, R; Kastner, Joel H.; Soker, Noam; Vrtilek, Saeqa; Dgani, Ruth
Joel H. Kastner; Noam Soker; Saeqa Vrtilek; Ruth Dgani
Definition: Portable X-Ray Diffraction (XRD) | Open Energy Information
Definition Definition Edit with form History Facebook icon Twitter icon » Definition: Portable X-Ray Diffraction (XRD) Jump to: navigation, search Dictionary.png Portable X-Ray Diffraction (XRD) Portable X-Ray Diffraction (XRD) is a field-based technique that can be used for identification of crystalline materials and analysis of unit cell dimensions. Portable XRD analysis is similar to X-ray powder diffraction, which has traditionally been used in geology, environmental science, material science, and engineering to rapidly identify unknown crystalline substances. Portable XRD analysis allows for simpler sample preparation, faster analytical times than traditional methods (less than 2 minutes), and can be performed at the sampling site in the field. A pure, finely ground
Photon Sciences | Beamlines | SRX: Submicron Resolution X-ray Spectroscopy
SRX: Submicron Resolution X-ray Spectroscopy SRX: Submicron Resolution X-ray Spectroscopy Poster | Fact Sheet | Preliminary Design Report Scientific Scope Scientific communities such as environmental sciences, life sciences, and material sciences have identified the need to develop analytical resources to advance the understanding of complex natural and engineered systems that are heterogeneous on the micron to nanometer scale. These needs for high intensity x-ray nanoprobes resulted in the commitment of the NSLS-II Project to build the Submicron Resolution X-ray (SRX) Spectroscopy beamline showing a unique combination of high spectral resolution over a very broad energy range and very high beam intensity in a sub-micrometer spot. NSLS-II will provide one of the best sources in the world for such an instrument.
Active pixel sensors for X-ray astronomy
An active pixel sensor array, APS-1, has been fabricated for the purpose of scientific x-ray detection. This thesis presents the results of testing the device. Alternate design architectures are explored. Recommendations ...
Cohen, Matthew (Matthew L.)
Radiological Safety Training for Radiation-Producing (X-Ray)...
for General Radiation Safety Installations Using Non-Medical X-Ray and Sealed Gamma-Ray Sources, Energies up to 10 MEV, ANSI Standard N43.3, American National Standards...
Low Dose Radiation Research Program: Comparison of Soft X Rays...
Comparison of Soft X-Rays and Ions Irradiation in a Model of V79 Mammalian Cell Authors: B. Ginovska, J.H. Miller, D. J. Lynch and W. E. Wilson Institutions: School of Electrical...
The Ulysses Catalog of Solar Hard X-Ray Flares
rupted full-Sun coverage of major solar X-ray ?are activity.of Ulysses from the Sun in AU, and its solar longitude andof the solar disk shows the view of the Sun from Earth,
Tranquille, C.; Hurley, K.; Hudson, H. S.
Linda Young Named to Head X-ray Science Division
to the APS Hard X-ray Nanoprobe Earns an R&D 100 Award Winans of XSD Elected to ACS Fellowship Gluskin of Photon Sciences named Argonne Distinguished Fellow UChicago...
Material Characterization with X-ray and Optical Techniques I
In Situ X-ray Nanocharacterization of Defects in Solar Cells: Mariana Bertoni1; ... a strong modeling tool for predicting and optimizing solar cell efficiency. ... levels (11 steps up to 55%) in order to understand the sequential damage process.
D.F. Inelastic x-ray scattering investigations of lattice dynamics in SmFeAsO1-xFy superconductors. Proceedings of The 9th International Conference on Spectroscopies in Novel...
SLAC National Accelerator Laboratory - X-rays Capture Electron...
X-rays Capture Electron 'Dance' By Glenn Roberts Jr. January 30, 2013 The way electrons move within and between molecules, transferring energy as they go, plays an important role...
SLAC National Accelerator Laboratory - Fifth X-ray Instrument...
and more.) The technique has been used for years to probe materials with visible-light lasers, and more recently with X-ray light from synchrotrons. But the LCLS is the first...
SLAC National Accelerator Laboratory - X-ray Vision Exposes Aerosol...
up exciting possibilities in the study of aerosol dynamics using highly focused X-ray lasers, such as SLAC's Linac Coherent Light Source (LCLS). "Our study shows that LCLS can...
Magnetism studies using resonant, coherent, x-ray scattering...
10:00am SLAC, Bldg. 137, Room 226 Keoki Seu Seminar: With the advent of free electron lasers there has been interest in using coherent x-rays to probe condensed matter systems....
Lensless Imaging of Magnetic Nanostructures by X-ray Spectro...
F. Schlotter and J. Sthr (SSRL) The unprecedented properties of X-ray free electron lasers (X-FELs) under development world wide will open the door for entirely new classes of...
Ocko, B.M., Wen, K., Maoz, R., Cohen, H., and Sagiv, J. Non-destructive chemical modification of a preassembled silane multilayer: structural study by combined FTIR, x-ray...
High performance x-ray anti-scatter grid
Disclosed are an x-ray anti-scatter grid for x-ray imaging, particularly for screening mammography, and method for fabricating same, x-rays incident along a direct path pass through a grid composed of a plurality of parallel or crossed openings, microchannels, grooves, or slots etched in a substrate, such as silicon, having the walls of the microchannels or slots coated with a high opacity material, such as gold, while x-rays incident at angels with respect to the slots of the grid, arising from scatter, are blocked. The thickness of the substrate is dependent on the specific application of the grid, whereby a substrate of the grid for mammography would be thinner than one for chest radiology. Instead of coating the walls of the slots, such could be filed with an appropriate liquid, such as mercury. 4 Figs.
An x-ray anti-scatter grid for x-ray imaging, particularly for screening mammography, and method for fabricating same, x-rays incident along a direct path pass through a grid composed of a plurality of parallel or crossed openings, microchannels, grooves, or slots etched in a substrate, such as silicon, having the walls of the microchannels or slots coated with a high opacity material, such as gold, while x-rays incident at angels with respect to the slots of the grid, arising from scatter, are blocked. The thickness of the substrate is dependent on the specific application of the grid, whereby a substrate of the grid for mammography would be thinner than one for chest radiology. Instead of coating the walls of the slots, such could be filed with an appropriate liquid, such as mercury.
its Solar X-ray/Cosmic Gamma-Ray Burst Experiment (GRB) hasInstrument The Ulysses Gamma-Ray Burst (GRB) instrument, hasrate due to a cosmic gamma-ray burst or a solar ?are, but we
Towards hard x-ray imaging at GHz frame rate
Gigahertz (GHz) imaging using hard x-rays ( Greater-Than-Or-Equivalent-To 10 keV) can be useful to high-temperature plasma experiments, as well as research and applications using coherent photons from synchrotron radiation and x-ray free electron lasers. GHz framing rate can be achieved by using multiple cameras through multiplexing. The advantages and trade-offs of single-photon detection mode, when no more than one x-ray photon is detected per pixel, are given. Two possible paths towards x-ray imaging at GHz frame rates using a single camera are: (a) avalanche photodiode arrays of high-Z materials and (b) microchannel plate photomultipliers in conjunction with materials with large indices of refraction.
Wang Zhehui; Morris, C. L.; Kapustinsky, J. S.; Kwiatkowski, K.; Luo, S.-N. [Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
Towards hard X-ray imaging at GHz frame rate
Gigahertz (GHz) imaging using hard X-rays ({approx}> 10 keV) can be useful to high-temperature plasma experiments, as well as research using coherent photons from synchrotron radiation and X-ray free electron lasers. GHz framing rate can be achieved by using multiple cameras through multiplexing. The advantages and trade-offs of single-photon detection mode, when no more than one X-ray photon is detected per pixel, are given. Two possible paths towards X-ray imaging at GHz frame rates using a single camera are (a) Avalanche photodiode arrays of high-Z materials and (b) Microchannel plate photomultipliers in conjunction with materials with large indices of refraction.
Wang, Zhehui [Los Alamos National Laboratory; Morris, Christopher [Los Alamos National Laboratory; Luo, Shengnian [Los Alamos National Laboratory; Kwiatkowski, Kris K. [Los Alamos National Laboratory; Kapustinsky, Jon S. [Los Alamos National Laboratory
Science Challenges & Opportunities for an Advanced X-ray Free...
Science Challenges & Opportunities for an Advanced X-ray Free-electron Laser Wednesday, October 2, 2013 - 3:00pm SLAC, Kavli 3rd Floor Conference Room Robert Schoenlein, Lawrence...
SLAC National Accelerator Laboratory - X-ray Laser Research Ranks...
selected science "Breakthrough of the Year": the discovery of what appears to be the Higgs boson. Scientists aimed the Linac Coherent Light Source X-ray laser at thousands of tiny...
SLAC National Accelerator Laboratory - X-rays Reveal How Soil...
2012 Menlo Park, Calif. - Researchers working at the U.S. Department of Energy's (DOE) SLAC National Accelerator Laboratory have used powerful X-rays to help decipher how certain...
Using Light to Control How X Rays Interact with Matter Print Schemes that use one light pulse to manipulate interactions of another with matter are well developed in the...
Heat conduction in X-ray clusters: Spitzer over 3
Effective heat conduction in a random variable magnetic field should be equal to one third of the Spitzer's value. Recent observations indicate that this heat conduction is sufficient to account for the bremsstrahlung in cooling X-ray clusters.
Andrei Gruzinov
Calibration of High-Resolution X-Ray Tomography With ...
... The x-ray attenuation of the sample at this energy was close to the ... J. Coal Geol. ... G. Xu, DE Eastman, I. McNulty, SP Frigo, Y. Wang, CC Retsch, IC ...
Argonne TDC: Large Area CCD X-Ray Detector
Large-Area CCD X-Ray Detector Opening Up New Horizons in the Study of Cellular and Metabolic Processes, Genetics, and Drug Development 2000 R&D 100 Award Winner!
Vitreous carbon mask substrate for X-ray lithography
The present invention is directed to the use of vitreous carbon as a substrate material for providing masks for X-ray lithography. The new substrate also enables a small thickness of the mask absorber used to pattern the resist, and this enables improved mask accuracy. An alternative embodiment comprised the use of vitreous carbon as a LIGA substrate wherein the VC wafer blank is etched in a reactive ion plasma after which an X-ray resist is bonded. This surface treatment provides a surface enabling good adhesion of the X-ray photoresist and subsequent nucleation and adhesion of the electrodeposited metal for LIGA mold-making while the VC substrate practically eliminates secondary radiation effects that lead to delamination of the X-ray resist form the substrate, the loss of isolated resist features, and the formation of a resist layer adjacent to the substrate that is insoluble in the developer.
Aigeldinger, Georg (Livermore, CA); Skala, Dawn M. (Fremont, CA); Griffiths, Stewart K. (Livermore, CA); Talin, Albert Alec (Livermore, CA); Losey, Matthew W. (Livermore, CA); Yang, Chu-Yeu Peter (Dublin, CA)
SLAC National Accelerator Laboratory - X-ray Laser Takes Aim...
Laser Takes Aim at Cosmic Mystery December 12, 2012 Menlo Park, Calif. - Scientists have used powerful X-rays from the Linac Coherent Light Source (LCLS) at the U.S. Department of...
SLAC National Accelerator Laboratory - X-ray Laser Sees Photosynthesis...
new window on the way plants generate the oxygen we breathe, researchers used an X-ray laser at the Department of Energy's (DOE) SLAC National Accelerator Laboratory to...
SLAC National Accelerator Laboratory - X-ray Laser Brings Cellular...
a March experiment indicates it has, for the first time, used an X-ray free-electron laser - SLAC's Linac Coherent Light Source - to reconstitute the structure of a G...
Argonne CNM Highlight: World?s Most Precise ?Hard X-Ray?
World's Most Precise "Hard X-Ray" Nanoprobe Activated X-rays from an APS undulator exiting the front end window of the nanoprobe beamline. X-rays from an APS undulator exiting the...
X-ray Science Division: Mission and Goals | Advanced Photon Source
X-ray Science Division: Mission and Goals The mission of the X-ray Science Division (XSD) is to enable and perform world class research using x-rays. This mission is accomplished...
Apparatus for obtaining an X-ray image
A computed tomography apparatus in which a fan-shaped X-ray beam is caused to pass through a section of an object, enabling absorption detection on the opposite side of the object by a detector comprising a plurality of discrete detector elements. An electron beam generating the X-ray beam by impacting upon a target is caused to rotate over the target.
Watanabe, Eiji (Tokyo, JP)
X-ray streak and framing camera techniques
This paper reviews recent developments and applications of ultrafast diagnostic techniques for x-ray measurements. These techniques, based on applications of image converter devices, are already capable of significantly important resolution capabilities. Techniques capable of time resolution in the sub-nanosecond regime are being considered. Mechanical cameras are excluded from considerations as are devices using phosphors or fluors as x-ray converters.
Coleman, L.W.; Attwood, D.T.
The complex soft X-ray spectrum of NGC 4151
We present a detailed analysis of the complex soft X-ray spectrum of NGC 4151 measured by the RGS instruments aboard XMM-Newton. The XMM-Newton RGS spectra demonstrate that the soft X-ray emission is extremely rich in X-ray emission lines and radiative recombination continua (RRC), with no clear evidence for any underlying continuum emission. Line emission, and the associated RRC, are clearly detected from hydrogen-like and helium-like ionization states of neon, oxygen, nitrogen and carbon. The measured lines are blueshifted with a velocity of between ~100-1000 km/s, with respect to the systemic velocity of NGC 4151, approximately consistent with the outflow velocities of the absorption lines observed in the UV, suggestive of an origin for the UV and soft X-ray emission in the same material. Plasma diagnostics imply a range of electron temperatures of ~1-5x10^4 K and electron densities of between 10^8-10^10 cm^-3. The soft X-ray spectrum of NGC 4151 is extremely similar to that of NGC 1068, suggesting that the soft X-ray excesses observed in many Seyfert galaxies may be composed of similar emission features. Modelling the RGS spectra in terms of emission from photoionized and photoexcited gas in an ionization cone reproduces all of the hydrogen-like and helium-like emission features observed in the soft X-ray spectrum of NGC 4151 in detail and confirms the correspondence between the soft X-ray emission in NGC 4151 and NGC 1068.
N. J. Schurch; R. S. Warwick; R. E. Griffiths; S. M. Kahn
Kinoform optics applied to X-ray photon correlation specroscopy
Moderate-demagnification higher-order silicon kinoform focusing lenses have been fabricated to facilitate small-angle X-ray photon correlation spectroscopy (XPCS) experiments. The geometric properties of such lenses, their focusing performance and their applicability for XPCS measurements are described. It is concluded that one-dimensional vertical X-ray focusing via silicon kinoform lenses significantly increases the usable coherent flux from third-generation storage-ring light sources for small-angle XPCS experiments.
Sandy, A.R.; Evans-Lutterodt, K.; Narayanan, S.; Sprung, M.; Su, J.D; Isakovic, A.F.; Stein, A.
Using Light to Control How X Using Light to Control How X Rays Interact with Matter Using Light to Control How X Rays Interact with Matter Print Wednesday, 27 January 2010 00:00 Schemes that use one light pulse to manipulate interactions of another with matter are well developed in the visible-light regime where an optical control pulse influences how an optical probe pulse interacts with a medium. This approach has opened new research directions in fields like quantum computing and nonlinear optics, while also spawning entirely new research areas, such as electromagnetically induced transparency and slow light. However, it has been unclear whether similar optical control schemes could be used to modify how x rays interact with matter. In a dramatic breakthrough demonstration at the ALS, a Berkeley Lab-Argonne National Laboratory group has now used powerful visible-light lasers to render a nominally opaque material transparent to x rays. While x-ray transparency will have immediate applications at x-ray light sources, the important result is that the findings lay a foundation for a broader spectrum of applications.
Using Light to Control How X Rays Interact with Matter Print Using Light to Control How X Rays Interact with Matter Print Schemes that use one light pulse to manipulate interactions of another with matter are well developed in the visible-light regime where an optical control pulse influences how an optical probe pulse interacts with a medium. This approach has opened new research directions in fields like quantum computing and nonlinear optics, while also spawning entirely new research areas, such as electromagnetically induced transparency and slow light. However, it has been unclear whether similar optical control schemes could be used to modify how x rays interact with matter. In a dramatic breakthrough demonstration at the ALS, a Berkeley Lab-Argonne National Laboratory group has now used powerful visible-light lasers to render a nominally opaque material transparent to x rays. While x-ray transparency will have immediate applications at x-ray light sources, the important result is that the findings lay a foundation for a broader spectrum of applications.
X-ray emission from colliding laser plasmas
Colliding Au, CD and Ti-Cr plasmas have been generated by illuminating two opposing foils each with a {approximately} 100J, 0.5 nsec, 2{omega} Nd-glass laser beam from the Trident laser facility at Los Alamos. The plasmas are being used to study plasma interactions which span the parameter regime from interpenetrating to collisional stagnation. X-ray emission during the laser target interaction and the subsequent collision is used to diagnose the initial plasma conditions and the colliding plasma properties. X-ray instrumentation consists of a 100 ps gated x-ray pinhole imager, a time-integratcd bremsstrahlung x-ray spectrograph and a gated x-ray spectrograph used to record isoelectronic spectra from the Ti-Cr plasmas. The imager has obtained multi-frame images of the collision and therefore, a measure of the stagnation length which is a function of the ion charge state and density and a strong function of the electron temperature. Other instrumentation includes a Thomson scattering spectrometer with probe beam, neutron detectors used to monitor the CD coated foil collisions and an ion spectrometer. We will describe the current status of the experiments and current results with emphasis on the x-ray emission diagnostics. We will also briefly describe the modeling using Lasnex and ISIS, a particle-in-cell code with massless fluid electrons and inter particle (classical) collisions.
Wilke, M.; Obst, A.W.; Winske, D. [and others
Quiet Sun X-rays as Signature for New Particles
We have studied published data from the Yohkoh solar X-ray mission, with the purpose of searching for signals from radiative decays of new, as yet undiscovered massive neutral particles. This search is based on the prediction that solar axions of the Kaluza-Klein type should result in the emission of X-rays from the Sun direction beyond the limb with a characteristic radial distribution. These X-rays should be observed more easily during periods of quiet Sun. An additional signature is the observed emission of hard X-rays by SMM, NEAR and RHESSI. The recent observation made by RHESSI of a continuous emission from the non-flaring Sun of X-rays in the 3 to ~15 keV range fits the generic axion scenario. This work also suggests new analyses of existing data, in order to exclude instrumental effects; it provides the rationale for targeted observations with present and upcoming (solar) X-ray telescopes, which can provide the final answer on the nature of the signals considered here. Such measurements become more promising during the forthcoming solar cycle minimum with an increased number of quiet Sun periods.
K. Zioutas; K. Dennerl; L. DiLella; D. H. H. Hoffmann; J. Jacoby; Th. Papaevangelou
Monte Carlo simulation of photon buildup factors for shielding materials in diagnostic x-ray facilities
Purpose: A simulation of buildup factors for ordinary concrete, steel, lead, plate glass, lead glass, and gypsum wallboard in broad beam geometry for photons energies from 10 keV to 150 keV at 5 keV intervals is presented. Methods: Monte Carlo N-particle radiation transport computer code has been used to determine the buildup factors for the studied shielding materials. Results: An example concretizing the use of the obtained buildup factors data in computing the broad beam transmission for tube potentials at 70, 100, 120, and 140 kVp is given. The half value layer, the tenth value layer, and the equilibrium tenth value layer are calculated from the broad beam transmission for these tube potentials. Conclusions: The obtained values compared with those calculated from the published data show the ability of these data to predict shielding transmission curves. Therefore, the buildup factors data can be combined with primary, scatter, and leakage x-ray spectra to provide a computationally based solution to broad beam transmission for barriers in shielding x-ray facilities.
Kharrati, Hedi; Agrebi, Amel; Karoui, Mohamed Karim [Ecole Superieure des Sciences et Techniques de la Sante de Monastir, Avenue Avicenne, 5000 Monastir (Tunisia); Faculte des Sciences de Monastir, 5000 Monastir (Tunisia)
Dilation x-ray imager a new/faster gated x-ray imager for the NIF
As the yield on implosion shots increases it is expected that the peak x-ray emission reduces to a duration with a FWHM as short as 20 ps for {approx}7 Multiplication-Sign 10{sup 18} neutron yield. However, the temporal resolution of currently used gated x-ray imagers on the NIF is 40-100 ps. We discuss the benefits of the higher temporal resolution for the NIF and present performance measurements for dilation x-ray imager, which utilizes pulse-dilation technology [T. J. Hilsabeck et al., Rev. Sci. Instrum. 81, 10E317 (2010)] to achieve x-ray imaging with temporal gate times below 10 ps. The measurements were conducted using the COMET laser, which is part of the Jupiter Laser Facility at the Lawrence Livermore National Laboratory.
Nagel, S. R.; Bell, P. M.; Bradley, D. K.; Ayers, M. J.; Barrios, M. A.; Felker, B.; Smith, R. F.; Collins, G. W.; Jones, O. S.; Piston, K.; Raman, K. S. [Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550 (United States); Hilsabeck, T. J.; Kilkenny, J. D.; Chung, T.; Sammuli, B. [General Atomics, P.O. Box 85608, San Diego, California 92186-5608 (United States); Hares, J. D.; Dymoke-Bradshaw, A. K. L. [Kentech Instruments Ltd., Wallingford, Oxfordshire OX10 (United Kingdom)
Transmission Transmission ,... ,...vc- "' ""'\ S I r;. Dr. Jerry Pell, CCM Principal NEP A Document Manager Permitting, Siting, and Analysis (OE-20) Office of Electricity Delivery and Energy Reliability U.S. Department of Energy 1 000 Independence A venue SW Washington, D.C. 20585-0001 Subject: Champlain Hudson Power Express Project Submittal of Amendment Application Dear Dr. Pell: February 28, 2012 On January 25, 2010, Transmission Developers, Inc. ("TDI") submitted on behalf of Champlain Hudson Power Express, Inc. ("CHPEI") an application to the U.S. Department of Energy ("DOE") for a Presidential Permit ("Application) in connection with the Champlain Hudson Power Express project ("Project"). The Application proposed to connect clean sources
In-situ Transmission Electron Microscopy and Spectroscopy Studies of Interfaces in Li-ion Batteries: Challenges and Opportunities
The critical challenge facing the lithium ion battery development is the basic understanding of the structural evolution during the cyclic operation of the battery and the consequence of the structural evolution on the properties of the battery. Although transmission electron microscopy (TEM) and spectroscopy have been evolved to a stage such that it can be routinely used to probe into both the structural and chemical composition of the materials with a spatial resolution of a single atomic column, a direct in-situ TEM observation of structural evolution of the materials in lithium ion battery during the dynamic operation of the battery has never been reported. This is related to three factors: high vacuum operation of a TEM; electron transparency requirement of the region to be observed, and the difficulties dealing with the liquid electrolyte of lithium ion battery. In this paper, we report the results of exploring the in-situ TEM techniques for observation of the interface in lithium ion battery during the operation of the battery. A miniature battery was fabricated using a nanowire and an ionic liquid electrolyte. The structure and chemical composition of the interface across the anode and the electrolyte was studied using TEM imaging, electron diffraction, and electron energy loss spectroscopy. In addition, we also explored the possibilities of carrying out in-situ TEM studies of lithium ion batteries with a solid state electrolyte.
Wang, Chong M.; Xu, Wu; Liu, Jun; Choi, Daiwon; Arey, Bruce W.; Saraf, Laxmikant V.; Zhang, Jiguang; Yang, Zhenguo; Thevuthasan, Suntharampillai; Baer, Donald R.; Salmon, Norman
Atomic-resolution study of polarity reversal in GaSb grown on Si by scanning transmission electron microscopy
The atomic-resolved reversal of the polarity across an antiphase boundary (APB) was observed in GaSb films grown on Si by high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). The investigation of the interface structure at the origin of the APB reveals that coalescence of two domains with Ga-prelayer and Sb-prelayer causes the sublattice reversal. The local strain and lattice rotation distributions of the APB, attributed to the discordant bonding length at the APB with the surrounding GaSb lattice, were further studied using the geometric phase analysis technique. The crystallographic characteristics of the APBs and their interaction with other planar defects were observed with HAADF-STEM. The quantitative agreement between experimental and simulated images confirms the observed polarities in the acquired HAADF-STEM data. The self-annihilation mechanism of the APBs is addressed based on the rotation induced by anti-site bonds and APBs' faceting.
Hosseini Vajargah, S.; Woo, S. Y.; Botton, G. A. [Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Brockhouse Institute for Material Research, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Ghanad-Tavakoli, S. [Centre for Emerging Device Technologies, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Kleiman, R. N.; Preston, J. S. [Brockhouse Institute for Material Research, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Centre for Emerging Device Technologies, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Department of Engineering Physics, McMaster University, Hamilton, Ontario L8S 4L7 (Canada)
Understanding Water Uptake and Transport in Nafion Using X-ray...
Understanding Water Uptake and Transport in Nafion Using X-ray Microtomography Title Understanding Water Uptake and Transport in Nafion Using X-ray Microtomography Publication Type...
X-Ray Imaging of the Dynamic Magnetic Vortex Core Deformation Print X-Ray Imaging of the Dynamic Magnetic Vortex Core Deformation Print Magnetic thin-film nanostructures can exhibit a magnetic vortex state in which the magnetization vectors lie in the film plane and curl around in a closed loop. At the very center of the vortex, a small, stable core exists where the magnetization points either up or down out of the plane. Three years ago, the discovery of an easy core reversal mechanism at the ALS not only made the possibility of using such systems as magnetic memories much more realistic, it also initiated investigation of the core switching mechanism itself. Now, a Belgian-German-ALS collaboration has used high-resolution, time-resolved, magnetic x-ray microscopy to experimentally reveal the first step of the reversal process: the dynamic deformation of the vortex core. The group also measured a critical vortex velocity above which reversal occurs. Both these observations provide the first experimental support for the postulated reversal mechanism.
HSQ double patterning process for 12 nm resolution x-ray zone plates
Soft x-ray zone plate microscopy is a powerful nano-analytic technique used for a wide variety of scientific and technological studies. Pushing its spatial resolution to 10 nm and below is highly desired and feasible due to the short wavelength of soft x-rays. Instruments using Fresnel zone plate lenses achieve a spatial resolution approximately equal to the smallest, outer most zone width. We developed a double patterning zone plate fabrication process based on a high-resolution resist, hydrogen silsesquioxane (HSQ), to bypass the limitations of conventional single exposure fabrication to pattern density, such as finite beam size, scattering in resist and modest intrinsic resist contrast. To fabricate HSQ structures with zone widths in the order of 10 nm on gold plating base, a surface conditioning process with (3-mercaptopropyl) trimethoxysilane, 3-MPT, is used, which forms a homogeneous hydroxylation surface on gold surface and provides good anchoring for the desired HSQ structures. Using the new HSQ double patterning process, coupled with an internally developed, sub-pixel alignment algorithm, we have successfully fabricated in-house gold zone plates of 12 nm outer zones. Promising results for 10 nm zone plates have also been obtained. With the 12 nm zone plates, we have achieved a resolution of 12 nm using the full-field soft x-ray microscope, XM-1.
Chao, Weilun; Kim, Jihoon; Rekawa, Senajith; Fischer, Peter; Anderson, Erik H.
Tokamak physics studies using x-ray diagnostic methods
X-ray diagnostic measurements have been used in a number of experiments to improve our understanding of important tokamak physics issues. The impurity content in TFTR plasmas, its sources and control have been clarified through soft x-ray pulse-height analysis (PHA) measurements. The dependence of intrinsic impurity concentrations and Z/sub eff/ on electron density, plasma current, limiter material and conditioning, and neutral-beam power have shown that the limiter is an important source of metal impurities. Neoclassical-like impurity peaking following hydrogen pellet injection into Alcator C and a strong effect of impurities on sawtooth behavior were demonstrated by x-ray imaging (XIS) measurements. Rapid inward motion of impurities and continuation of m = 1 activity following an internal disruption were demonstrated with XIS measurements on PLT using injected aluminum to enhance the signals. Ion temperatures up to 12 keV and a toroidal plasma rotation velocity up to 6 x 10/sup 5/ m/s have been measured by an x-ray crystal spectrometer (XCS) with up to 13 MW of 85-keV neutral-beam injection in TFTR. Precise wavelengths and relative intensities of x-ray lines in several helium-like ions and neon-like ions of silver have been measured in TFTR and PLT by the XCS. The data help to identify the important excitation processes predicted in atomic physics. Wavelengths of n = 3 to 2 silver lines of interest for x-ray lasers were measured, and precise instrument calibration techniques were developed. Electron thermal conductivity and sawtooth dynamics have been studied through XIS measurements on TFTR of heat-pulse propagation and compound sawteeth. A non-Maxwellian electron distribution function has been measured, and evidence of the Parail-Pogutse instability identified by hard x-ray PHA measurements on PLT during lower-hybrid current-drive experiments.
Hill, K.W.; Bitter, M.; von Goeler, S.; Beiersdorfer, P.; Fredrickson, E.; Hsuan, H.; McGuire, K.; Sauthoff, N.R.; Sesnic, S.; Stevens, J.E.
Water destruction by X-rays in young stellar objects
We study the H2O chemistry in star-forming environments under the influence of a central X-ray source and a central far ultraviolet (FUV) radiation field. The gas-phase water chemistry is modeled as a function of time, hydrogen density and X-ray flux. To cover a wide range of physical environments, densities between n_H = 10^4-10^9 cm^-3 and temperatures between T = 10-1000 K are studied. Three different regimes are found: For T water abundance is of order 10^-7-10^-6 and can be somewhat enhanced or reduced due to X-rays, depending on time and density. For 100 K 10^-3 ergs s-1 cm^-2 (t = 10^4 yrs) and for F_X > 10^-4 ergs s^-1 cm^-2 (t = 10^5 yrs). At higher temperatures (T > 250 K) and hydrogen densities, water can persist with x(H2O) ~ 10^-4 even for high X-ray fluxes. The X-ray and FUV models are applied to envelopes around low-mass Class 0 and I young stellar objects (YSOs). Water is destroyed in both Class 0 and I envelopes on relatively short timescales (t ~ 5000 yrs) for realistic X-ray fluxes, although the effect is less prominent in Class 0 envelopes due to the higher X-ray absorbing densities there. FUV photons from the central source are not effective in destroying water. The average water abundance in Class I sources for L_X > 10^27 ergs s^-1 is predicted to be x(H2O) < 10^-6.
P. Stauber; J. K. Jorgensen; E. F. van Dishoeck; S. D. Doty; A. O. Benz
Advanced Photon Source | Combining Scanning Probe Microscopy...
Publications | SXSPM Related Book Chapters V. Rose, J.W. Freeland, S.K. Streiffer, "New Capabilities at the Interface of X-rays and Scanning Tunneling Microscopy", in Scanning...
Design and Operation of a High Pressure Reaction Cell for in situ X-ray Absorption Spectroscopy
X-ray absorption spectroscopy measurements of catalytic reactions have been instrumental in advancing the understanding of catalytic processes. These measurements require an in situ catalysis reaction cell with unique properties. Here we describe the design and initial operation of an in situ/operando catalysis reaction cell for transmission X-ray absorption spectroscopy measurements. The cell is designed: to be an ideal catalytic reactor with no mass transfer effects; to give the same conversion and selectivity under similar space velocities as standard laboratory micro-reactors; to be operational temperatures up to 600 {sup o}C and pressures up to 14 bar; to be X-ray transparent allowing XAS measurement to be collected in transmission for all elements with Z {>=} 23 (vanadium K-edge at 5.5 keV); to measure the actual catalyst bed temperature; to not use o-ring seals, or water cooling; to be robust, compact, easy to assemble, and use, and relatively low cost to produce. The heart of the cell is fabricated from an X-ray transparent beryllium tube that forms a plug flow reactor. XAFS data recorded during the reduction of a Re/{gamma}-A{sub 2}O{sub 3} catalyst as a function of hydrogen pressure from 0.05 to 8 bar, and from a Pt-Sn/{gamma}-A{sub 2}O{sub 3} catalyst during n-heptane reforming are given as initial examples of the versatility of the reactor.
Bare,S.; Yang, N.; Kelly, S.; Mickelson, G.; Modica, F.
Neutron and X-Ray Scattering - Argonne National Laboratories, Materials
Home Home Neutron and X-Ray Scattering Neutron and X-ray Scattering Science Recent advances in neutron and x-ray scattering instrumentation at major DOE facilities such as the Spallation Neutron Source and Advanced Photon Source provide unprecedented insights into complex phenomena in bulk and interfacial materials. The vision of our group is to harness the complementarity of neutrons and x-rays to study how materials respond on a range of length and time scales to phase competition, so that we can learn to control emergent behavior and generate functional properties in energy-related materials. We use neutrons and x-rays to investigate the structure and dynamics of bulk and interfacial materials with properties that are useful for energy applications, such as superconductivity, magnetism and thermoelectricity. Phase competition can generate or enhance such properties, but it is extremely challenging to characterize fluctuations in the competing order, whether in bulk disordered materials, or artificial heterostructures. Our goal is to utilize efficient techniques that we have been developing for measuring nanoscale phase fluctuations, both static and dynamic, to enable the rational design of new materials for energy within MSD.
Formation and destruction of jets in X-ray binaries
Neutron-star and black-hole X-ray binaries (XRBs) exhibit radio jets, whose properties depend on the X-ray spectral state and history of the source. In particular, black-hole XRBs emit compact, steady radio jets when they are in the so-called hard state, the jets become eruptive as the sources move toward the soft state, disappear in the soft state, and re-appear when the sources return to the hard state. On the other hand, jets from neutron-star X-ray binaries are typically weaker radio emitters than the black-hole ones at the same X-ray luminosity and in some cases radio emission is detected in the soft state. Significant phenomenology has been accumulated so far regarding the spectral states of neutron-star and black-hole XRBs, and there is general agreement about the type of the accretion disk around the compact object in the various spectral states. Our aim is to investigate whether the phenomenology regarding the X-ray emission on one hand and the jet appearance and disappearance on the other can be put...
Kylafis, N D; Kazanas, D; Christodoulou, D M
Method and apparatus for micromachining using hard X-rays
An X-ray source such as a synchrotron which provides a significant spectral content of hard X-rays is used to expose relatively thick photoresist such that the portions of the photoresist at an exit surface receive at least a threshold dose sufficient to render the photoresist susceptible to a developer, while the entrance surface of the photoresist receives an exposure which does not exceed a power limit at which destructive disruption of the photoresist would occur. The X-ray beam is spectrally shaped to substantially eliminate lower energy photons while allowing a substantial flux of higher energy photons to pass through to the photoresist target. Filters and the substrate of the X-ray mask may be used to spectrally shape the X-ray beam. Machining of photoresists such as polymethylmethacrylate to micron tolerances may be obtained to depths of several centimeters, and multiple targets may be exposed simultaneously. The photoresist target may be rotated and/or translated in the beam to form solids of rotation and other complex three-dimensional structures.
Siddons, David Peter (Shoreham, NY); Johnson, Erik D. (Ridge, NY); Guckel, Henry (Madison, WI); Klein, Jonathan L. (Madison, WI)
An X-ray source such as a synchrotron which provides a significant spectral content of hard X-rays is used to expose relatively thick photoresist such that the portions of the photoresist at an exit surface receive at least a threshold dose sufficient to render the photoresist susceptible to a developer, while the entrance surface of the photoresist receives an exposure which does not exceed a power limit at which destructive disruption of the photoresist would occur. The X-ray beam is spectrally shaped to substantially eliminate lower energy photons while allowing a substantial flux of higher energy photons to pass through to the photoresist target. Filters and the substrate of the X-ray mask may be used to spectrally shape the X-ray beam. Machining of photoresists such as polymethylmethacrylate to micron tolerances may be obtained to depths of several centimeters, and multiple targets may be exposed simultaneously. The photoresist target may be rotated and/or translated in the beam to form solids of rotation and other complex three-dimensional structures. 21 figs.
Siddons, D.P.; Johnson, E.D.; Guckel, H.; Klein, J.L.
YOHKOH remnants: partially occulted flares in hard X-rays
Flares being partially occulted by the solar limb, are the best reservoir of our knowledge about hard X-ray loop-top sources. Recently, the survey of partially occulted flares observed by the RHESSI has been published (Krucker & Lin 2008). The extensive YOHKOH database still awaits such activities. This work is an attempt to fill this gap. Among from 1286 flares in the YOHKOH Hard X-ray Telescope Flare Catalogue, for which the hard X-ray images had been enclosed, we identified 98 events that occurred behind the solar limb. We investigated their hard X-ray spectra and spatial structure. We found that in most cases the hard X-ray spectrum of partially occulted flares consists of two components, non-thermal and thermal, which are co-spatial. The photon energy spectra of the partially occulted flares are systematically steeper than spectra of the non-occulted flares. Such a difference we explain as a consequence of intrinsically dissimilar conditions ruling in coronal parts of flares, in comparison with the f...
Tomczak, M
A multi-crystal wavelength dispersive x-ray spectrometer
A multi-crystal wavelength dispersive hard x-ray spectrometer with high-energy resolution and large solid angle collection is described. The instrument is specifically designed for time-resolved applications of x-ray emission spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron Lasers (XFEL) and synchrotron radiation facilities. It also simplifies resonant inelastic x-ray scattering (RIXS) studies of the whole 2d RIXS plane. The spectrometer is based on the Von Hamos geometry. This dispersive setup enables an XES or XRS spectrum to be measured in a single-shot mode, overcoming the scanning needs of the Rowland circle spectrometers. In conjunction with the XFEL temporal profile and high-flux, it is a powerful tool for studying the dynamics of time-dependent systems. Photo-induced processes and fast catalytic reaction kinetics, ranging from femtoseconds to milliseconds, will be resolvable in a wide array of systems circumventing radiation damage.
Alonso-Mori, Roberto; Montanez, Paul; Delor, James; Bergmann, Uwe [LCLS, SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States); Kern, Jan [LCLS, SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States); Physical Biosciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720-8099 (United States); Sokaras, Dimosthenis; Weng, Tsu-Chien; Nordlund, Dennis [SSRL, SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States); Tran, Rosalie; Yachandra, Vittal K.; Yano, Junko [Physical Biosciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720-8099 (United States)
The History of X-ray Free-Electron Lasers
The successful lasing at the SLAC National Accelerator Laboratory of the Linear Coherent Light Source (LCLS), the first X-ray free-electron laser (X-ray FEL), in the wavelength range 1.5 to 15 {angstrom}, pulse duration of 60 to few femtoseconds, number of coherent photons per pulse from 10{sup 13} to 10{sup 11}, is a landmark event in the development of coherent electromagnetic radiation sources. Until now electrons traversing an undulator magnet in a synchrotron radiation storage ring provided the best X-ray sources. The LCLS has set a new standard, with a peak X-ray brightness higher by ten orders of magnitudes and pulse duration shorter by three orders of magnitudes. LCLS opens a new window in the exploration of matter at the atomic and molecular scales of length and time. Taking a motion picture of chemical processes in a few femtoseconds or less, unraveling the structure and dynamics of complex molecular systems, like proteins, are some of the exciting experiments made possible by LCLS and the other X-ray FELs now being built in Europe and Asia. In this paper, we describe the history of the many theoretical, experimental and technological discoveries and innovations, starting from the 1960s and 1970s, leading to the development of LCLS.
Pellegrini, C.; /UCLA /SLAC
Ultrafast x-ray diagnostics for laser fusion experiments
Temporally, spectrally, and spatially resolved x-ray emission diagnostics are important tools in the study of the heating and compression of laser fusion targets by sub-nanosecond laser pulses. The use of the Livermore 15 psec resolution x-ray streak camera to make such measurements is reviewed. Temporal histories of spectrally resolved x-ray emission in the 1 to 10 keV range have been obtained. These data have served to further define the x-ray streak camera as a quantative diagnostic tool and have also provided data relating to the absorption and compression phases of laser heating. The x-ray streak camera has been used in conjunction with a specially designed pinhole imaging system to temporally record images of laser compressed targets with a spatial resolution of approximately 6 ..mu..m. Implosion characteristics are presented for experiments with glass microshell targets. The concept, development, and testing of an ultrafast framing camera for full two-dimensional time resolved imaging is discussed. A prototype camera, based on the image dissection-restoration concept, has achieved an approximately 200 psec frame period with a resolution of 50 ..mu..m.
Coleman, L.W.
We present a detailed analysis of the complex soft X-ray spectrum of NGC 4151 measured by the RGS instruments aboard XMM-Newton. The XMM-Newton RGS spectra demonstrate that the soft X-ray emission is extremely rich in X-ray emission lines and radiative recombination continua (RRC), with no clear evidence for any underlying continuum emission. Line emission, and the associated RRC, are clearly detected from hydrogen-like and helium-like ionization states of neon, oxygen, nitrogen and carbon. The measured lines are blueshifted with a velocity of between ?100-1000 km s ?1, with respect to the systemic velocity of NGC 4151, approximately consistent with the outflow velocities of the absorption lines observed in the UV spectrum of NGC 4151 (Kriss et al. 1995), suggestive of an origin for the UV and soft X-ray emission in the same material. Plasma diagnostics from the observed helium-like triplets, imply a range of electron temperatures of ?1-5�10 4 K and electron densities of between 10 8-10 10 cm ?3. The soft X-ray spectrum of NGC 4151 is extremely similar to that of NGC 1068, both in terms of the atomic species present and in terms of the relative strengths
We present a detailed analysis of the complex soft X-ray spectrum of NGC 4151 measured by the RGS instruments aboard XMM-Newton. The XMM-Newton RGS spectra demonstrate that the soft X-ray emission is extremely rich in X-ray emission lines and radiative recombination continua (RRC), with no clear evidence for any underlying continuum emission. Line emission, and the associated RRC, are clearly detected from hydrogen-like and helium-like ionization states of neon, oxygen, nitrogen and carbon. The measured lines are blueshifted with a velocity of between ~100-1000 km/s, with respect to the systemic velocity of NGC 4151, approximately consistent with the outflow velocities of the absorption lines observed in the UV, suggestive of an origin for the UV and soft X-ray emission in the same material. Plasma diagnostics imply a range of electron temperatures of ~1-5x10^4 K and electron densities of between 10^8-10^10 cm^-3. The soft X-ray spectrum of NGC 4151 is extremely similar to that of NGC 1068, suggesting that th...
Schurch, N J; Griffiths, R E; Kahn, S M
Flat Field Anomalies in an X-ray CCD Camera Measured Using a Manson X-ray Source
The Static X-ray Imager (SXI) is a diagnostic used at the National Ignition Facility (NIF) to measure the position of the X-rays produced by lasers hitting a gold foil target. The intensity distribution taken by the SXI camera during a NIF shot is used to determine how accurately NIF can aim laser beams. This is critical to proper NIF operation. Imagers are located at the top and the bottom of the NIF target chamber. The CCD chip is an X-ray sensitive silicon sensor, with a large format array (2k x 2k), 24 ?m square pixels, and 15 ?m thick. A multi-anode Manson X-ray source, operating up to 10kV and 10W, was used to characterize and calibrate the imagers. The output beam is heavily filtered to narrow the spectral beam width, giving a typical resolution E/?E?10. The X-ray beam intensity was measured using an absolute photodiode that has accuracy better than 1% up to the Si K edge and better than 5% at higher energies. The X-ray beam provides full CCD illumination and is flat, within �1% maximum to minimum. The spectral efficiency was measured at 10 energy bands ranging from 930 eV to 8470 eV. We observed an energy dependent pixel sensitivity variation that showed continuous change over a large portion of the CCD. The maximum sensitivity variation occurred at 8470 eV. The geometric pattern did not change at lower energies, but the maximum contrast decreased and was not observable below 4 keV. We were also able to observe debris, damage, and surface defects on the CCD chip. The Manson source is a powerful tool for characterizing the imaging errors of an X-ray CCD imager. These errors are quite different from those found in a visible CCD imager.
M. J. Haugh and M. B. Schneider
We show that the X-ray outburst light curves of four transient anomalous X-ray pulsars (AXPs) and soft gamma-ray repeaters (SGRs), namely, XTE J1810-197, SGR 0501+4516, SGR 1627-41, and CXOU J164710.2-455216, can be produced by the fallback disk model that was also applied to the outburst light curves of persistent AXPs and SGRs in our earlier work. The model solves the diffusion equation for the relaxation of a disk that has been pushed back by a soft gamma-ray burst. The sets of main disk parameters used for these transient sources are very similar to each other and to those employed in our earlier models of persistent AXPs and SGRs. There is a characteristic difference between the X-ray outburst light curves of transient and persistent sources. This can be explained by the differences in the disk surface density profiles of the transient and persistent sources in quiescence indicated by their quiescent X-ray luminosities. Our results imply that a viscous disk instability operating at a critical temperature in the range of {approx}1300-2800 K is a common property of all fallback disks around AXPs and SGRs. The effect of the instability is more pronounced and starts earlier for the sources with lower quiescent luminosities, which leads to the observable differences in the X-ray enhancement light curves of transient and persistent sources. A single active disk model with the same basic disk parameters can account for the enhancement phases of both transient and persistent AXPs and SGRs. We also present a detailed parameter study to show the effects of disk parameters on the evolution of the X-ray luminosity of AXPs and SGRs in the X-ray enhancement phases.
Cal Latin-Small-Letter-Dotless-I skan, Sirin; Ertan, Uenal [Sabanc Latin-Small-Letter-Dotless-I University, Orhanl Latin-Small-Letter-Dotless-I -Tuzla, Istanbul, 34956 (Turkey)
X-ray movies reveal insect flight, muscle motion
BioCAT BioCAT X-ray movies reveal insect flight, muscle motion Photo credit: Michael Dickinson Watching flies fly may not seem like high-tech science, but for researchers using the Western Hemisphere's most brilliant X-rays, from the Advanced Photon Source located at the U.S. Department of Energy's Argonne National Laboratory, it not only helps explain how insects fly but also may someday aid in understanding human heart function. The researchers, from the Illinois Institute of Technology (IIT), Caltech and the University of Vermont, merged two distinct technologies, intense X-ray beams and electronic flight simulators, to study how insect muscles can generate such extraordinary levels of power. The results are published in the the January 20,. 2005, issue of the journal Nature.
RAY FLUORESCENCE MICROPROBE (XFM) RAY FLUORESCENCE MICROPROBE (XFM) TECHNIQUES AND CAPABILITIES APPLICATIONS WORLD-LEADING MICROFOCUSED EXAFS SPECTROSCOPY * XFM is an optimized three-pole wiggler beamline for the characterization of materials in an "as-is" state that are chemically heterogeneous at the micrometer scale via synchrotron induced X-ray fluorescence. * XFM includes instrumentation for microbeam X-ray fluorescence (µXRF), diffraction (µXRD) and fluorescence computed microtomography (FCMT) . However, it is optimized to provide users state-of-the-art microfocused Extended X-ray Absorption Fine Structure (µEXAFS) spectroscopy between 4 to 20 keV. * XFM will trade-off beam size and flux for sample configuration flexibility. This includes more readily achievable stability
Experiment Hazard Class 8.3 - X-Ray Generators
3 - X-Ray Generators 3 - X-Ray Generators Applicability This hazard classification applies to all experiments involving the use of X-Ray Generators (other than the APS storage ring). As specified in LMS-PROC-109 a Radiation Generating Device (RGD) must be registered with the Argonne RGD Safety Officer using the ANL-847 form. The RGD will be assigned an inventory number, hazard class, RWP requirement, and inspection and survey frequencies. Experiment Category Experiments the Experiment Hazard Class are always categorized as High Risk. Experiment Hazard Control Verification Statements Engineered Controls - As determined in LMS-PROC-109. Samples chambers and all beam paths are fully enclosed by barriers. Class 2 and higher RGDs require an interlock to fail-safe beam shutter/beam stop or radiation
An X-ray photometry system I: Chandra ACIS
We present a system of X-ray photometry for the Chandra satellite. X-ray photometry can be a powerful tool to obtain flux estimates, hardness ratios, and colors unbiased by assumptions about spectral shape and independent of temporal and spatial changes in instrument characteristics. The system we have developed relies on our knowledge of effective area and the energy-to-channel conversion to construct filters similar to photometric filters in the optical bandpass. We show that the filters are well behaved functions of energy and that this X-ray photometric system is able to reconstruct fluxes to within about 20%, without color corrections, for non-pathological spectra. Even in the worst cases it is better than 50%. Our method also treats errors in a consistent manner, both statistical as well as systematic.
Grimm, H -J; Fabbiano, G; Elvis, M
Bonded multilayer Laue Lens for focusing hard x-rays.
We have fabricated partial Multilayer Laue Lens (MLL) linear zone plate structures with thousands of alternating WSi{sub 2} and Si layers and various outermost zone widths according to the Fresnel zone plate formula. Using partial MLL structures, we were able to focus hard X-rays to line foci with a width of 30 nm and below. Here, we describe challenges and approaches used to bond these multilayers to achieve line and point focusing. Bonding was done by coating two multilayers with AuSn and heating in a vacuum oven at 280-300 C. X-ray reflectivity measurements confirmed that there was no change in the multilayers after heating to 350 C. A bonded MLL was polished to a 5-25 {micro}m wedge without cracking. SEM image analyses found well-positioned multilayers after bonding. These results demonstrate the feasibility of a bonded full MLL for focusing hard X-rays.
Liu, C.; Conley, R.; Qian, J.; Kewish, C.M.; Macrander, A.T.; Maser, J.; Kang, H.C.; Yan, H.; Stephenson, G.B.; Advanced Photonics Research Institute; Gwangju Institute of Science and Technology
X-ray and Optical Filaments in M87
We compare a very deep X-ray image of M87, at the center of the Virgo Cluster, to high-quality optical images of the low excitation emission-line gas in the same region. There are striking coincidences of detail between the two. We explore the possiblity that this represents a thermal interaction between hot gas at 10^7 K and warm gas at 10^4 K. We find two temperatures are present in the X-ray gas, with the lower more prevelant in the vicinity of the optical filaments. Electron conduction from the hot phase to the cooler one provides a quantitatively acceptable energy source for the optical filaments, and we show additionally that it can do so for the brightest X-ray cluster, Perseus. If operative, conduction in the presence of gas-rich galaxy mergers, may explain the presence of "cool cores" in clusters of galaxies.
William B. Sparks; Megan Donahue; Andres Jordan; Laura Ferrarese; Patrick Cote
Composite structure development decisions using X-ray CT measurements
X-ray computed tomography (CT) provides measurement data useful for making composite manufacturing development decisions. X-ray CT measurements of material characteristics are quantitative in terms of the dimensions, density, and composition. The CT data on internal conditions, such as consolidation, gaps, delaminations, cracks, porosity and detail placement can be applied to the refinement of production techniques for composite manufacture. The key item of interest is the effect of variations in pressure loading, temperature, mold shape, material surface preparation, and bond layer thickness on the resulting consolidation or bondline quality in new composite manufacturing processes. X-ray CT measurements of densification and defect presence as a function of technique parameters are of critical importance to processes such as resin transfer molding, injection molding, composite welding, composite layup and advanced bonding methods.
Bossi, R.H.; Georgeson, G.E. [Boeing Defense and Space Group, Seattle, WA (United States)
The Use of X-Ray Microbeams in Materials Science
Most materials are heterogeneous on mesoscopic length scales (tenths-to-tens of microns), and materials properties depend critically on mesoscopic structures such as grain sizes, texture, and impurities. The recent availability of intense, focused x-ray microbeams at synchrotron facilities has enabled new techniques for mesoscale materials characterization. We describe instrumentation and experiments on the MHATT-CAT and UNICAT undulator beamlines at the Advanced Photon Source which use micron and submicron-size x-ray beams to investigate the grain orientation, local strain and defect content in a variety of materials of technological interest. Results from a combinatorial study on epitaxial growth of oxide films on textured metal substrates will be described to illustrate x-ray microbeam capabilities.
Budai, J.D.; Chung, J.-S.; Ice, G.E.; Larson, B.C.; Lowe, W.P.; Norton, D.P.; Tamura, N.; Tischler, J.Z.; Williams, E.L.; Yoon, M.; Zschack, P.
Imaging X-ray Thomson Scattering Spectrometer Design and Demonstration
In many laboratory astrophysics experiments, intense laser irradiation creates novel material conditions with large, one-dimensional gradients in the temperature, density, and ionization state. X-ray Thomson scattering is a powerful technique for measuring these plasma parameters. However, the scattered signal has previously been measured with little or no spatial resolution, which limits the ability to diagnose inhomogeneous plasmas. We report on the development of a new imaging x-ray Thomson spectrometer (IXTS) for the Omega laser facility. The diffraction of x-rays from a toroidally-curved crystal creates high-resolution images that are spatially resolved along a one-dimensional profile while spectrally dispersing the radiation. This focusing geometry allows for high brightness while localizing noise sources and improving the linearity of the dispersion. Preliminary results are presented from a scattering experiment that used the IXTS to measure the temperature profile of a shocked carbon foam.
Gamboa, E.J. [University of Michigan; Huntington, C.M. [University of Michigan; Trantham, M.R. [University of Michigan; Keiter, P.A [University of Michigan; Drake, R.P. [University of Michigan; Montgomery, David [Los Alamos National Laboratory; Benage, John F. [Los Alamos National Laboratory; Letzring, Samuel A. [Los Alamos National Laboratory
Laser assisted Compton scattering of X-ray photons
The Compton scattering of X-ray photons, assisted by a short intense optical laser pulse is discussed. The differential scattering cross section reveals the interesting feature that the main Klein-Nishina line is accompanied by a series of side-lines forming a broad plateau where up to ${\\cal O} (10^3)$ laser photons participate simultaneously in a single scattering event. Due to the non-linear mixing of X-ray and laser photons a frequency dependent rotation of the polarization of the final state photons relative to the scattering plane emerges. A consistent description of the scattering process with short laser pulses requires to work with X-ray pulses. An experimental investigation can be accomplished, e.g., at LCLS or the European XFEL in the near future.
D. Seipt; B. Kampfer
Explosive hydrogen burning during type I X-ray bursts
Explosive hydrogen burning in type I X-ray bursts (XRBs) comprise charged particle reactions creating isotopes with masses up to A~100. Since charged particle reactions in a stellar environment are very temperature sensitive, we use a realistic time-dependent general relativistic and self-consistent model of type I x-ray bursts to provide accurate values of the burst temperatures and densities. This allows a detailed and accurate time-dependent identification of the reaction flow from the surface layers through the convective region and the ignition region to the neutron star ocean. Using this, we determine the relative importance of specific nuclear reactions in the X-ray burst.
Jacob Lund Fisker; Hendrik Schatz; Friedrich-Karl Thielemann
On burning regimes and long duration X-ray bursts
Hydrogen and helium accreted onto a neutron star undergo thermonuclear burning. Explosive burning is observed as a type I X-ray burst. We describe the different burning regimes and focus on some of the current inconsistencies between theory and observations. Of special interest are the rare kinds of X-ray bursts such as carbon-fueled superbursts and helium-fueled intermediately long X-ray bursts. These bursts are thought to originate deeper in the neutron star envelope, such that they are probes of the thermal properties of the crust. We investigate the possibility of observing superbursts with the wide-field instruments INTEGRAL-ISGRI and Swift-BAT. We find that only the brightest bursts are detectable.
L. Keek; J. J. M. in 't Zand
Fast microtomography using bright monochromatic x-rays
A fast microtomography system for high-resolution high-speed imaging has been developed using bright monochromatic x-rays at the BL29XU beamline of SPring-8. The shortest scan time for microtomography we attained was 0.25 s in 1.25 {mu}m effective pixel size by combining the bright monochromatic x-rays, a fast rotating sample stage, and a high performance x-ray imaging detector. The feasibility of the tomography system was successfully demonstrated by visualization of rising bubbles in a viscous liquid, an interesting issue in multiphase flow physics. This system also provides a high spatial (a measurable feature size of 300 nm) or a very high temporal (9.8 {mu}s) resolution in radiographs.
Jung, J. W.; Lee, J. S.; Park, S. J.; Chang, S.; Pyo, J. [X-ray Imaging Center, Pohang University of Science and Technology, San 31, Hyoja-dong, Pohang 790-784 (Korea, Republic of); Department of Materials Science and Engineering, Pohang University of Science and Technology, San 31, Hyoja-dong, Pohang 790-784 (Korea, Republic of); Kwon, N.; Kim, J. [X-ray Imaging Center, Pohang University of Science and Technology, San 31, Hyoja-dong, Pohang 790-784 (Korea, Republic of); School of Interdisciplinary Bioscience and Bioengineering, Pohang University of Science and Technology, Pohang 790-784 (Korea, Republic of); Kohmura, Y.; Nishino, Y.; Yamamoto, M.; Ishikawa, T. [RIKEN/SPring-8, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5148 (Japan); Je, J. H. [X-ray Imaging Center, Pohang University of Science and Technology, San 31, Hyoja-dong, Pohang 790-784 (Korea, Republic of); Department of Materials Science and Engineering, Pohang University of Science and Technology, San 31, Hyoja-dong, Pohang 790-784 (Korea, Republic of); School of Interdisciplinary Bioscience and Bioengineering, Pohang University of Science and Technology, Pohang 790-784 (Korea, Republic of); RIKEN/SPring-8, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5148 (Japan)
X-ray Detection of a Rotating Radio Transient
Abstract �Rotating RAdio Transients � (RRATs) are a newly discovered astronomical phenomenon, characterised by occasional brief radio bursts, with average intervals between bursts ranging from minutes to hours. The burst spacings allow identification of periodicities, which fall in the range 0.4 to 7 seconds. The RRATs thus seem to be rotating neutron stars, albeit with properties very different from the rest of the population. We here present the serendipitous detection with the Chandra X-ray Observatory of a bright point-like X-ray source coincident with one of the RRATs. We discuss the temporal and spectral properties of this X-ray emission, consider counterparts in other wavebands, and interpret these results in the context of possible explanations for the RRAT population.
Bryan M. Gaensler; Maura Mclaughlin; Stephen Reynolds Kazik; Borkowski N; Burgay Fern; Andrew Lyne; Ingrid Stairs; B. M. Gaensler; S. Chatterjee; M. Mclaughlin; S. Reynolds; K. Borkowski; N. Rea; A. Possenti; M. Burgay; Osservatorio Astronomico Di Roma; F. Camilo; M. Kramer; A. Lyne
Photon Sciences | Beamlines | XPD: X-ray Powder Diffraction
XPD: X-ray Powder Diffraction XPD: X-ray Powder Diffraction Poster | Fact Sheet | Preliminary Design Report Scientific Scope XPD is a tunable facility with the ability to collect diffraction data at high x-ray energies (40keV-80keV), offering rapid acquisition (millisecond) and high angular resolution capabilities on the same instrument. XPD addresses future scientific challenges in, for example, hydrogen storage, CO2 sequestration, advanced structural ceramics, catalysis, and materials processing. Such materials of high technological value often are complex, nanostructured and heterogeneous. The scientific grand challenge is to obtain robust and quantitative (micro)structural information, not only in the ground state at ambient conditions, but also in situ or in operando with varying temperature, pressure, magnetic/electric/stress
Workshop on Time Domain Science Using X-ray Techniques
Time-Resolved Beamlines Time-Resolved Beamlines Advisory Committee Workshop Home Workshop Chairs: Lin Chen (Argonne National Laboratory) Steve Milton (Advanced Photon Source) David Reis (University of Michigan) Linda Young (Argonne National Laboratory) Workshop on Time Domain Science Using X-ray Techniques August 29 September 1, 2004, The Abbey, Fontana, Lake Geneva Area, Wisconsin A workshop on "Time Domain Science Using X-ray Techniques" was held from August 29 September 1, 2004 , welcoming both experts and beginners in the field. This is one of the concurrently held workshops in the series on "Future Scientific Directions for the Advanced Photon Source." The goal of the workshop was to identify future directions in scientific research using time resolved x-ray techniques and to address possiblities to produce ps
X-Ray Diffraction Project Final Report, Fiscal Year 2006
An x-ray diffraction diagnostic system was developed for determining real-time shock-driven lattice parameter shifts in single crystals at the gas gun at TA-IV at Sandia National Laboratories (SNL). The signal-to-noise ratio and resolution of the system were measured using imaging plates as the detector and by varying the slit width. This report includes tests of the x-ray diffraction system using a phosphor coupled to a charge-coupled device (CCD) camera by a coherent fiber-optic bundle. The system timing delay was measured with a newly installed transistor-transistor logic (TTL) bypass designed to reduce the x-ray delay time. The axial misalignment of the Bragg planes was determined with respect to the optical axis for a set of eight LiF [lithium fluoride] crystals provided by SNL to determine their suitability for gas gun experiments.
HARD X-RAY AND MICROWAVE OBSERVATIONS OF MICROFLARES Jiong Qiu,1, 2
HARD X-RAY AND MICROWAVE OBSERVATIONS OF MICROFLARES Jiong Qiu,1, 2 Chang Liu,2 Dale E. Gary,2 Gelu, we study solar microflares using the coordinated hard X-ray and microwave observations obtained the time derivative of soft X-rays and 1420 keV hard X-rays, i.e., the Neupert effect, in about one
MML Microscopy Facility
The MML Electron Microscopy Facility consists of three transmission electron microscopes (TEM), three scanning electron microscopes (SEM), a ...
X-ray Diagnostics of Broad Absorption Line Quasar Geometry
A new generation of sensitive X-ray measurements are indicating that the existence of X-ray attenuation column densities, $N_{H}>10^{24}\\mathrm{cm}^{-2}$ is quite common amongst broad absorption line quasars (BALQSOs). This is significant to the geometry of the broad absorption line (BAL) outflow. In particular, such an X-ray shield also shields equatorial accretion disk winds from the UV, thereby preventing high velocity equatorial outflows from being launched. By contrast, bipolar winds initiated by continuum radiation pressure from the funnel of a slim accretion disk flare outward (like a trumpet) and offer vastly different absorbing columns to the X-ray and UV emission which are emitted from distinct regions of the disk, $\\sim 6M$ and $\\sim 10M-40M$, respectively (where $M$ is the radius of the black hole). Recent numerical work indicates that it is also possible to launch bipolar outflows from the inner regions of a thin disk. The recent discovery with VLBI that the Galactic analog of a BALQSO, the X-ray binary Circinus X-1 (with high velocity P Cygni X-ray absorption lines) is viewed virtually along the radio jet axis (and therefore along the spin axis of the black hole and the normal to the accretion disk) has rekindled interest in the bipolar models of BALQSOs. We explore this possibility by studying the nearest BAL QSO, MRK 231. High resolution 2-D optical spectroscopy and VLBI mappings of the radio jet axis indicates that the BAL outflow is parallel to the parsec scale radio jet.
Brian Punsly; Sebastian Lipari
Concave Accretion Discs and X-ray Reprocessing
Spectra of Seyfert Is are commonly modelled as emission from an X-ray illuminated flat accretion disc orbiting a central black hole. This provides both a reprocessed and direct component of the X-ray emission as required by observations of individual objects and possibly a fraction of the cosmological X-ray background. There is some observational motivation to at least consider the role that an effectively concave disc surface might play: (1) a reprocessed fraction $\\gsim 1/2$ in some Seyferts and possibly in the X-ray background, and (2) the commonality of a sharp iron line peak for Seyferts at 6.4KeV despite a dependence of peak location on inclination angle for flat disc models. Here it is shown that a concave disc may not only provide a larger total fraction of reprocessed photons, but can also reprocess a much larger fraction of photons in its outer regions when compared to a flat disc. This reduces the sensitivity of the 6.4KeV peak location to the inner disc inclination angle because the outer regions are less affected by Doppler and gravitational effects. If the X-ray source is isotropic, the reprocessed fraction is directly determined by the concavity. If the X-ray source is anisotropic, the location of iron line peak can still be determined by concavity but the total reflected fraction need not be as large as for the isotropic emitter case. The geometric calculations herein are applicable to general accretion disc systems illuminated from the center.
Eric G. Blackman
Electronic Structure of Dense Plasmas by X-Ray Scattering
We present an improved analytical expression for the x-ray dynamic structure factor from a dense plasma which includes the effects of weakly bound electrons. This result can be applied to describe scattering from low to moderate Z plasmas, and it covers the entire range of plasma conditions that can be found in inertial confinement fusion experiments, from ideal to degenerate up to moderately coupled systems. We use our theory to interpret x-ray scattering experiments from solid density carbon plasma and to extract accurate measurements of electron temperature, electron density and charge state. We use our experimental results to validate various equation-of-state models for carbon plasmas.
Gregori, G; Glenzer, S H; Rogers, F J; Pollaine, S M; Froula, D H; Blancard, C; Faussurier, G; Renaudin, P; Kuhlbrodt, S; Redmer, R; Landen, O L
X-ray Time Lags in TeV Blazars
We use Monte Carlo/Fokker-Planck simulations to study the X-ray time lags. Our results show that soft lags will be observed as long as the decay of the flare is dominated by radiative cooling, even when acceleration and cooling timescales are similar. Hard lags can be produced in presence of a competitive achromatic particle energy loss mechanism if the acceleration process operates on a timescale such that particles are slowly moved towards higher energy while the flare evolves. In this type of scenario, the {\\gamma} -ray/X-ray quadratic relation is also reproduced.
Chen, Xuhui; Liang, Edison; B�ttcher, Markus
Bragg x-ray survey spectrometer for ITER
Several potential impurity ions in the ITER plasmas will lead to loss of confined energy through line and continuum emission. For real time monitoring of impurities, a seven channel Bragg x-ray spectrometer (XRCS survey) is considered. This paper presents design and analysis of the spectrometer, including x-ray tracing by the Shadow-XOP code, sensitivity calculations for reference H-mode plasma and neutronics assessment. The XRCS survey performance analysis shows that the ITER measurement requirements of impurity monitoring in 10 ms integration time at the minimum levels for low-Z to high-Z impurity ions can largely be met.
Varshney, S. K.; Jakhar, S. [ITER-India, Institute for Plasma Research, Bhat, Gandhinagar, Gujarat 382428 (India); Barnsley, R. [ITER Organization, Route de Vinon sur Verdon, 13115 Saint Paul Lez Durance (France); O'Mullane, M. G. [Department of Physics, University of Strathclyde, Glasgow G4 0NG (United Kingdom)
The First Angstrom X-Ray Free-Electron Laser
The Linac Coherent Light Source produced its first x-ray laser beam on 10 April 2009. Today it is routinely producing x-ray pulses with energy >2 mJ across the operating range from 820-8,200 eV. The facility has begun operating for atomic/molecular/optical science experiments. Performance of the facility in its first user run (1 October - 21 December) and current machine development activities will be presented. Early results from the preparations for the start of the second user run is also reported.
Galayda, John; /SLAC
Opportunities for X-ray Science in Future Computing Architectures
The world of computing continues to evolve rapidly. In just the past 10 years, we have seen the emergence of petascale supercomputing, cloud computing that provides on-demand computing and storage with considerable economies of scale, software-as-a-service methods that permit outsourcing of complex processes, and grid computing that enables federation of resources across institutional boundaries. These trends show no sign of slowing down. The next 10 years will surely see exascale, new cloud offerings, and other terabit networks. This talk reviews various of these developments and discusses their potential implications for x-ray science and x-ray facilities.
Foster, Ian [Argonne National Laboratory
Einstein x-ray observations of cataclysmic variables
Observations with the imaging x-ray detectors on the Einstein Observatory have led to a large increase in the number of low luminosity x-ray sources known to be associated with cataclysmic variable stars (CVs). The high sensitivity of the Einstein instrumentation has permitted study of their short timescale variability and spectra. The data are adding significantly to our knowledge of the accretion process in cataclysmic variables and forcing some revision in our ideas concerning the origin of the optical variability in these stars.
Mason, K.O.; Cordova, F.A.
Developing small vacuum spark as an x-ray source for calibration of an x-ray focusing crystal spectrometer
A new technique of x-ray focusing crystal spectrometers' calibration is the desired result. For this purpose the spectrometer is designed to register radiated copper K{alpha} and K{beta} lines by using a flat {alpha}-quartz crystal. This experiment uses pre-breakdown x-ray emissions in low vacuum of about 2.5-3 mbar. At this pressure the pinch will not form so the plasma will not radiate. The anode material is copper and the capacity of the capacitor bank is 22.6 nF. This experiment designed and mounted a repetitive triggering system to save the operator time making hundreds of shots. This emission amount is good for calibration and geometrical adjustment of an optical crystal x-ray focusing spectrometer.
Ghomeishi, Mostafa; Adikan, Faisal Rafiq Mahamd [Photonic Research Group, Department of Electrical Engineering, Faculty of Engineering, University of Malaya, 50603 Kuala Lumpur (Malaysia); Karami, Mohammad [Department of Mechanical Engineering, Faculty of Engineering, University of Malaya, 50603 Kuala Lumpur (Malaysia)
Restoration of X-ray fluorescence images of hidden paintings
This paper describes our methods for repairing and restoring images of hidden paintings (paintings that have been painted over and are now covered by a new surface painting) that have been obtained via noninvasive X-ray fluorescence imaging of their ... Keywords: Art restoration, Artifact correction, Image restoration, Underdetermined source separation
Anila Anitha; Andrei Brasoveanu; Marco Duarte; Shannon Hughes; Ingrid Daubechies; Joris Dik; Koen Janssens; Matthias Alfeld
Vanadium-pumped titanium x-ray laser
A resonantly photo-pumped x-ray laser (10) is formed of a vanadium (12) and titanium (14) foil combination (16) that is driven by two beams (18, 20) of intense line focused (22, 24) optical laser radiation. Ground state neon-like titanium ions (34) are resonantly photo-pumped by line emission from fluorine-like vanadium ions (32).
Nilsen, Joseph (Livermore, CA)
Compact X-ray Light Source Workshop Report
This report, produced jointly by EMSL and FCSD, is the result of a workshop held in September 2011 that examined the utility of a compact x-ray light source (CXLS) in addressing many scientific challenges critical to advancing energy science and technology.
Thevuthasan, Suntharampillai; Evans, James E.; Terminello, Louis J.; Koppenaal, David W.; Manke, Kristin L.; Plata, Charity
X-ray divergent-beam (Kossel) technique: A review
The development of the X-ray divergent-beam (Kossel) technique over the last 50 years is traced. The fundamentals of this technique and ways to implement it experimentally are considered, and its potential for studying the real structure of crystals is analyzed in detail.
Lider, V. V., E-mail: firstname.lastname@example.com [Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)