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An electronic testing system can test an electronic device which has more signal pins or pads (i.e., contacts) than the maximum number of tester probes. The testing system connects the contacts to the tester such that groups of contacts share individual tester signal lines. The testing system uses special selector logic on the device to be tested to determine which particular contacts of the groups are "currently output active", or capable of transmitting data. At each step in the testing procedure, the system can vary the sets of contacts which are chosen to be currently output active, thereby resulting in a high percentage of the possible states of the device being tested.
1. An apparatus for testing electronic devices each having a plurality of contacts including a plurality of input/output contacts having an input capability of receiving an input signal and an output capability of transmitting an output signal, said apparatus comprising:
a test unit having a plurality of signal lines for applying signals to and receiving signals from said electronic device;
means for electrically connecting a plurality of groups of said input/output contacts of said electronic device to said signal lines; and
logic means for selectively and temporarily activating the output capability of only a single contact at a time of the set of contacts, whereby the output signal from said contact having an activated output capability is provided via said connecting means to said testing unit.
2. The apparatus for testing electronic devices of claim 1, wherein said connecting means comprises a plurality of probes for electrically connecting a set of said input/output contacts of said electronic device and said signal lines, each said probe comprising a plurality of probe tips and a probe base section electrically connected to said probe tips, each of said probe tips for making electrical contact with a separate one of said input/output contacts, and said probe base section for making electrical contact with said signal line.
3. The apparatus for testing electronic devices of claim 2, wherein said logic means is responsive to a select signal and a test mode signal, wherein said select signal specifies the contact of the set connected to each said probe that is to have an activated output capability, and the test mode signal specifies that the input/output contacts as a group are capable of transmitting an output signal.
4. A method of testing electronic devices comprises the steps of:
A) dividing a set of electrical contacts of an electronic device into groups of electrical contacts, each of said groups to be connected to a corresponding signal line of a testing system,
B) selecting electrical contacts of said groups of electrical contacts to be output activated during each of a plurality of test periods such that each said group has at most a single electrical contact output activated during any said test period;
C) connecting each said group of electrical contacts to a corresponding one of a plurality of signal lines of a testing system by means of an individual one of a plurality of split probes, each said probe having a plurality of probe tips each connected to one of said electrical contacts connected to said probe, and a probe base section connecting between said probe tips and the signal line connected to said probe;
D) conditioning said electrical contacts to receive a plurality of first test signals over said signal lines and said split probes during a first of said test periods by applying a mode signal to said electronic device for enabling said electronic contacts to receive said first test signals during said first test period;
E) impressing a first predetermined pattern of voltages on said electrical contacts during said first test period;
F) conditioning said electrical contacts to transmit first response signals over said split probes to said signal lines during said first test period by applying a first select signal to said electronic device for enabling a selected one of said electronic contacts in each said group to transmit one of said first response signals during said first test period; and
G) measuring and comparing the first response signals with a corresponding first set of expected responses.
5. A method of testing electronic devices of claim 4 further comprising the steps of:
H) reconditioning said electrical contacts to receive a second test signal over said signal lines and said split probes during a second of said test periods by applying a mode signal to said electronic device for enabling said electrical contacts to receive said second test signals during said second test period;
I) impressing a second predetermined pattern of voltages on said electrical contacts during said second test period;
J) conditioning said electrical contacts to transmit a second set of response signals over said split probes to said signal lines during said second test period by applying a select signal to said electronic device for enabling a selected different one of said electronic contacts in each said group to transmit one of said second response signals during said second test period; and
K) measuring and comparing the second response signals with a corresponding second set of expected responses.
This is a divisional of copending application Ser. No. 08/419,865 filed on Apr. 11, 1995.
This invention relates generally to the testing of electronic devices using electronic parameter and function testers, and more particularly to the testing of high pin count electronic devices which possess more signal pins than the maximum number of available tester probes, and even more particularly to packaged electronic devices ready for assembly on Printed Wiring Boards (PWBs).
As is known in the art, electronic devices may be tested for parametric values such as operating voltage and current, for operating speed, and for functional operation by the use of computerized electronic testers. Typically, such testing is done at various times during their manufacture. Testing may be performed on the bare semiconductor die during semiconductor wafer sort to determine which of the die on the wafer are suitable for packaging, and performed again after the die are removed from the wafer if the bare die is to be used in a "Chip on Board" (COB), "Flip Chip" or other multiple chip package or product. Final testing is generally performed on an electronic device after the die has been packaged, and, in many cases, again after the packaged part has been shipped to the PWB assembly plant, or after a `Burn-in` procedure or other reliability testing.
A computerized electronic tester typically includes a test fixture called a probe card which is adapted for making temporary electrical contact of tester probes to component pins or pads (i.e., contacts) of a particular die, i.e., the device-under-test (DUT). The tester typically may be programmed to apply simultaneously a specified pattern of electrical signals, known as a stimulus vector, via the probe card to input contacts of the electronic device and to determine the response of the device to the applied stimulus vector. If the response of the electronic device agrees with expected values, the device is said to pass that vector. A complete test of possible states of an electronic device may require a number of these vectors be applied sequentially one at a time, followed in each case by a comparison of each set of such responses to the expected values.
The computerized electronic tester used to apply the series of stimulus vectors, and to measure the output response, requires a direct electrical connection between the tester probes and the contacts of the electronic device to be tested. Thus, the number of DUT contacts that can be tested is limited by the number of test probes available to make the required connections.
As the required number of pins or pads for an electronic device has increased with the continuing increases in integration density, the number of probes provided by electronic testers has had to increase, with a commensurate increase in the relative cost of the electronic testers. This cost increase is due to the concomitant increase in the tester's complexity with the necessary increases in the number of tester probes, and in the high precision current and voltage sources and measuring systems required for each probe.
The available tester probe limit just discussed is particularly serious in the specific area of Application Specific Integrated Circuits (ASICs). ASICs are electronic devices that are specifically designed to operate in a particular circuit (i.e. are application specific, as the name implies). ASICs may be considered to be the "glue" that makes all of the standard electronic devices in a particular circuit work together. Since ASICs are used only in the specific circuit for which they have been designed, the volume of ASIC devices made with any specific design is typically 10 to 100 times fewer than would be the case for an equivalent standard (i.e. non-ASIC) design device capable of general application. An ASIC device may require a more thorough pre-assembly electronic test than would be required for a standard device, such as a memory or microprocessor, in order to achieve the same level of quality, functionality and reliability. In addition, the cost of a high-pin-count tester needed to test individual ASICs, when calculated on a per-tested-device basis, is typically higher than the cost for high-volume standard devices. Testing costs for high pin count ASIC devices discourages the use of such devices in many applications.
ASICs also tend to have very high-pin-counts as compared to equivalent standard devices. This is due to the desire to reduce the total number of devices on a board, thus reducing total board area requirements, increasing overall system speed, reducing system cost and improving system reliability. Therefore, it is common practice to place as many circuits as possible in a single ASIC device. As the number of circuits being included in the ASIC increases, the number of pins which are required for the ASIC typically increases. As a result, ASIC devices may have very high pin count requirements, and consequently need complex high pin-count electronic testers.
Limiting the number of signal pins on the individual ASIC circuitry to the number of available tester probes has a number of drawbacks for ASIC circuitry design. First, it can increase the ASICs required to implement the circuitry, and therefore increase board area requirements and cost, and probably decrease system speed and reliability. Secondly, partitioning the circuitry to remain under the tester probe limit may result in a circuitry partition or utilization of logic functions that provides less than optimal circuit performance.
Another approach to solving the high pin-count testing problem is multiple pass testing. This approach partitions the logic circuitry, for testing purposes only, into multiple sections, and uses a series of differently designed tester probe cards and vector sets to fully test the device, one circuitry section at a time. This approach results in an increase in total time required for testing due to the need to set up and run sequential multiple testing passes, and is expensive due to the need to design and furnish multiple probe cards.
The invention resides in a system of testing an electronic device which has more signal pins or pads (i.e., contacts) than the maximum number of available tester probes. The system connects the contacts to the tester such that groups of contacts share individual tester signal lines. The system uses special selector logic on the device to be tested to determine which particular contacts of the groups of contacts are "currently output active", or capable of transmitting data. At each step in the testing procedure, the system can vary the sets of contacts which are chosen to be currently output active, thereby resulting in a high percentage of the possible states of the device being tested.
More specifically, a testing apparatus provided by the invention can test electronic devices each including a plurality of input/output contacts having an input capability of receiving an input signal and an output capability of transmitting an output signal. The apparatus has a test unit with a plurality of signal lines for applying signals to and receiving signals from the electronic device, and a probe card for electrically connecting a plurality of groups of the input/output contacts to the signal lines. The testing apparatus also has selector control logic for selectively and temporarily activating the output capability of only a single contact at a time of each group of contacts. Accordingly, the output signal from only the contact having an activated output capability is provided via the probe card to the testing unit.
Preferably, the probe card provides a plurality of probes for electrically connecting a set of the input/output contacts of the electronic device and the signal lines of the tester. Each probe has probe tips and a probe base section electrically connected to the probe tips. Each probe tip can make electrical contact with a separate one of the input/output contacts, and the probe base section can make electrical contact with the signal line. A separate probe line applies select signals from the tester for controlling the selector control logic in accordance with stimulus vectors for particular tests.
With such an arrangement, electronic devices can be tested efficiently even when the device has more output signals than the tester can connect to at a given time. In this way the high cost of high pin count testers can be avoided. Electronic devices that have more signal pins or pads than a typical high-pin-count tester can handle can none-the-less be designed into a product with no fear that required testing and reliability metrics can not be obtained by testing.
The present invention will result in reduced electronic device testing costs for high pin count devices, especially ASICs, by reducing the cost of the test equipment required to assure proper device function and reliability, and additionally will allow higher pin-count device designs to be used, thus resulting in a decrease in the number of components required on a PWB module for any given design. Thus, circuit designers can obtained smaller PWB area for the same circuitry, and greater system speeds. Smaller circuit boards can result, permitting a larger number of finished boards to be cut out of a single standard-sized manufacturing master board, and thus providing more usable, less expensive and faster product for the same manufacturing cost and effort.
The above and further advantages of the invention may be better understood by referring to the following description in conjunction with the accompanying drawings, in which:
FIG. 1 shows a prior art apparatus for testing an electronic device;
FIG. 2 shows an apparatus for testing an electronic device in accordance with an embodiment of the present invention;
FIG. 3 shows an alternative embodiment of the present invention;
FIG. 4 is an embodiment of the output selector control logic implemented on the DUT of FIG. 2;
FIG. 5 is an overview of a typical PWB module to be tested, which contains two logic chips, two memory chips, a central processing unit and a number of buses; and
FIG. 6 is a flow chart showing a testing process in accordance with an illustrative embodiment of the invention.
FIG. 1, shows a Device Under Test (DUT) 10 having electrical contacts C1 through C8, which are connected to an electronic test system 12, called the "tester".
The electronic test system 12 has a testing unit 17 and a probe card 16. The testing unit 17 has a bus 14 which interconnects an Input/Output (I/O) device 18, a logic device 19 and signal lines 100-118. The testing unit 17 is of generally conventional design, except where otherwise noted herein. The probe card 16 is specially designed for each different DUT pattern to provide a plurality of probes P1-P8 adapted and disposed for connecting the proper DUT contact C1-C8 to the proper tester signal line 100-118. Generally the probe card 16 is a PWB from which tips 200-218 of the probes P1-P8 extend in registration with the specific DUT contact locations during testing. As is typical in prior art testing of DUTs, the probe card 16 provides a one to one relationship between the number of tester signal lines 100-118, the number of probe tips 200-218 and the number of DUT contact locations C1-C8.
The test system 12 can apply precision voltage and current signals to the DUT contacts C1-C8, and can measure precision voltage and current responses on those contacts to those applied signals. More specifically, the DUT is `exercised` by the test system 12 by the application of a pattern of `ones` and `zeros`, or high and low voltages, known as a stimulus vector, on a selected set of the tester probes associated with that vector. Then the test system 12 measures the DUTs output pattern of high and lows on a selected set of the DUT contacts associated with that vector, and compares this pattern to a predetermined, i.e. expected, pattern for that vector. In a typical test situation, the electronic test system 12 places the DUT 10 in test mode by furnishing signal triggering information over signal line 118 and probe tip 218. The test mode signal is generated in conventional fashion by the tester logic 19.
This process is repeated with a large number of different vectors, each having it own corresponding sets of tester probes and DUT contacts, until confidence in the overall functionality of the DUT is achieved. By varying the vectors, different parts of the DUT can be exercised and tested for functionality. It is possible in theory to devise a pattern of vectors that exercises every single electrical node within the electronic device, but in practice such a pattern of vectors might be impracticably long. The percentage of all electrical nodes that are actually exercised by a particular test program is called the "fault coverage".
It is easy to see that, in the illustrated prior art, every electrical connection between the DUT and the tester 12 requires a separate wire. Since each DUT contact C1-C8 may require the tester 12 to both drive a specific voltage and current load, and to measure the contact output voltage and current simultaneously with every other DUT contact, every tester probe requires its own precision voltage and current source (not shown) and its own precision voltage and current measurement system (not shown). This can become a problem when the DUT has a large number of signal contacts that need to be tested, because the tester becomes larger and more expensive. While there has been constant improvement in the maximum-pin-count capability of testers, the demand for higher pin-count devices seems to be always ahead of the tester's capabilities.
FIG. 2 shows an electronic test system 12A in accordance with the present invention for testing the DUT 10A using fewer tester signal lines 100A, 104A, 108A and 112A than in the prior art case illustrated in FIG. 1. The DUT 10A is again shown having DUT electrical contacts C1-C8, connected for testing to Electronic Tester 12A via the probe card 16A.
In accordance with the present invention, tester 12A has a probe card 16A that provides split probes 20A, 22A, 24A and 26A, each having a probe base section B1-B4, and each having a plurality of probe tips 200A-214A connected at connection points or nodes N1-N4 to the probe base section. Each probe base section B1-B4 is connected to a corresponding one of the tester signal lines 100A-112A; each probe tip 200A-214A is connected to a corresponding one of the DUT contacts C1-C8. More specifically, split probe 20A connects DUT contacts C1 and C2 to signal line 100A; contacts C3 and C4 to signal line 104A; contacts C5 and C6 to signal line 106A; and contacts C7 and C8 to signal line 108A. As opposed to the prior art case of FIG. 1, the invention does not utilize a single dedicated tester probe for connecting each individual DUT contact C1-C8 with the testing unit 17A. Typically, the probe connections N1-N4 would be furnished by printed circuit wires on the probe card 16A, but other methods such as mechanical switches or logic switches may also be utilized.
Thus, for example an input signal from the tester 12A to the DUT 10A on signal line 100A would be transmitted via split probe 20A to a group of contacts including both contact C1 and contact C2, as compared to the FIG. 1 prior art wherein an input signal on line 100 would have only driven contact C1. In output mode a signal on either contact C1 or contact C2 would be seen by the tester 12A as an output signal on line 100A.
In accordance with a further aspect of the present invention, the DUT 10A is equipped with a selector control logic device 119 to control which contacts of the groups of contacts are output enabled for supplying their output signals to the respective tester signal lines 100A-112A for the individual groups. Absent the selector control logic 119, there would be an unacceptable ambiguity in the data, since the tester 12A would not be able to determine whether the measured output was, e.g., from contact C1 or contact C2 or both. The output contact selection in this embodiment of the present invention is controlled by the tester 12A via the signal line 116A, and is shown in greater detail in FIG. 4. Thus it is possible to test a device that has more pins than a tester has signal lines.
The embodiment of FIG. 2 can be called a "two for one" tester because there are two alternative DUT contacts for each tester signal line. In this case a single select line 116A would be sufficient to determine which of the two sets of contacts would be output enabled at any given time. However, it is clear that it is possible to have selected three contacts per tester line, or four contacts per tester line, or any other desired number of contacts per tester line. However, the complexity of the test vector design and the increased length of the vector set required to adequately test the device would impose a limit on the maximum number of contacts that could be connected to a single tester line. For example, in the case of three or four contacts per tester line, one selector line would not be sufficient; two selector lines are required to control which contacts were output enabled at any given time.
The present invention solves a number of problems in the prior art. As noted previously the FIG. 1 prior art requires one tester line per DUT contact, thus resulting in expensive testers for high pin-count devices, such as ASICs. Currently, high pin-count devices, such as microprocessors, large ASICs and custom logic chips, have 256 to 512 signal contacts. The demand for even higher pin counts is partly driven by the increase in device bus width from 8 bits to 16 bits to 32 bits, and now up to 128 bits. Any chip or device that needs to communicate on a bus needs at least as many pins as the bus is wide, and generally twice as many bidirectional pins as the bus width are required in order to improve the system speed. For example, a 64 bit microprocessor would have at least 128 bidirectional pins just to communicate efficiently with the system bus.
The demand for higher pin counts is also driven by the fact that putting more of the total electronics of a system on a single high-density device reduces the distance that a signal has to travel and also reduces the power needed for the signal to arrive at its destination. Therefore increased logic on a single device results in lower power consumption and higher system speeds. But increased logic also means increased pin count, and the consequent problems with the lack of high pin count testers to prove device reliability and functionality. Increased logic on a single device also results in simpler design partitioning and quicker design times. This typically results in quicker time to market for the final product.
Yet a further problem with the state of the prior art is that limiting the number of pins on a device results in the need to use a larger number of devices. An increase in the number of devices means that there will be an increase in the amount of space the devices will require on the PWB. Since PWBs are made in groups on standard sized base boards an increase in the size of a PWB can translate into a decrease in the number of PWBs that can be cut out of the manufactured base board, and can result in an increase in PWB cost. Thus the present invention results in simpler, faster, cheaper, cooler and more reliable electronic systems.
Now referring to FIG. 3, an alternative embodiment of the present invention is shown. This embodiment illustrates that any combination of DUT contacts can be paired and connected by the split probes 20B-26B to the individual tester lines 100B-106B. In FIG. 3, contacts C1 and C5 are connected by probe tips 200B and 208B of the split probe 20B on the probe card 16B to tester line 100B. By comparison, in the FIG. 2 embodiment, C1 and C2 were connected via probe tips 200A and 202A of split probe 20A to tester line 100A. It is thus apparent that any desired combination of contacts can be connected via the proper probe card connections to any desired tester line.
FIG. 4, shows the output selection logic 119 of FIG. 2 in greater detail in accordance with an embodiment of the present invention. The output selection logic 119 in this drawing is capable of selecting either of the two contacts C1 or C2 to be in output mode, thus controlling whether a signal on contact C1 or a signal on contact C2 would be seen by the tester 12A as the output signal on line 100A. Contact C1 has a logic output signal line 120 from the internal circuitry of the DUT (not shown) and logic input line 122 from the tester 12A via the split probe 20A and probe tip 200A. Whether the DUT 10A is in the test mode is determined as in the FIG. 1 prior art by signal line 118A which goes to the internal circuitry of the DUT 10A. Likewise contact C2 has logic output line 124 from the DUT circuitry (not shown) and logic input line 126 from the tester 12A via the split probe 20A and probe tip 202A.
Contacts C1 and C2 have output drivers 121, 123 which are responsive to output enable signals applied thereto on lines 132, 134. The output enable signals serve to enable output to probe tip 200A from either output signal line 120 when the enable signal is asserted on line 128, or output signal line 124 when the enable signal is asserted on line 130, respectively.
When the tester 12A is driving the DUT 10A, the input signal line 100A will drive both contacts C1 and C2 through split probe 20A. Thus signal lines 122 and 126 will both be at the imposed vector value. During this input mode both of the output enable signals on lines 132 and 134 are not asserted by the DUT circuitry, and the test mode signal on line 118A is high.
The output enable signals on lines 132 and 134 are used as in conventional arrangements to control contact drivers; however, in the present invention, these signals are provided as inputs to the selector control logic 119, which produces its own output enable signals on lines 128 and 130. In the selector control logic 119, the test mode signal on line 118A and the external output enable signal on line 132 combine to determine when the contact C1 is ready for data output on the data output line 120. Likewise the test mode signal on line 118A and the external output enable signal on line 134 combine to determine when the contact C2 is ready for data output on the data output line 124.
Data output occurs, in the test mode, only when the select signals on line 116A cause the corresponding output enable signals on line 128 or 130 to be asserted. The select signals are generated by logic 119 in association with the corresponding stimulus vectors for the DUT, in a manner that will be apparent in light of the description contained herein. Logic 119 provides the select signals to the signal line 116A via bus 14a.
The select signals are processed and combined with the signals on lines 132, 134 and 118A by the selector control logic 119 (specifically, inverter 136 and ANDs 138 and 140 and NANDs 142 and 144) to provide the output enable signals on lines 128 and 130 to the drivers 121 of contacts C1 and C2, thereby allowing only one of the two contacts to be in the output mode at any given time. Accordingly, the tester 12A can identify the output signal source by knowing the value of signal line 116A and no ambiguity occurs.
When the DUT 10A is not in test mode (i.e. signal 118A is low), NANDs 142 and 144 will not assert the output enable signals 128 and 130, thus disabling the selector logic. Thus in normal operating mode, the signal on line 132 directly controls the contact C1 enable signal on line 128, and the signal on line 134 directly controls the contact C2 enable signal on line 130.
Now referring to FIG. 5, a typical electronic system 298 has a number of components, each of which can be tested by the tester 12A, and constitute the DUT 10A of FIG. 2. The system 298 has a system bus 300 connected to two ASIC chips 302 and 304. The two ASIC chips 302 and 304 are connected to a memory 306, and to a cache memory 308 along with its associated microprocessor 310. Note that the ASIC chips 302 and 304 are also directly connected to each other by a bus 312.
FIG. 5 demonstrates that a typical electronic system can possess many communication buses. These buses are parallel communication lines which may be as many bits wide as the word length of the system, for example 64 bits. In this embodiment it can be seen that device 302 has four bus connections, containing a total of 256 lines. Each of those bit lines require an input/output pin. Thus device 302 may have 256 contacts like C1 and C2 of FIG. 4, just for the bus connections, and typically may have 25% more pins for other overhead and control function, thus device 302 is a high pin count device.
When deciding which of the many contacts of device 302 to connect together with another contact for connection to a single tester signal line for testing purposes (e.g. C1 and C2 being grouped together in FIG. 4), an appropriate method might be to select one or any number of the bus connections to be divided into two or more groups of contacts. For example, high numbered bus data bits and low numbered bits, or even data bits and odd data bits, can provide the bases for groupings. Choosing one of these this method of partitioning the contacts can simplify the design of the test vectors that need to be imposed on the device to adequately test the functionality and quality of the device.
Grouping the contacts together to avoid high pin count testing problems can result in an increase in the number of total test vectors that need to be applied to the device during the testing procedure in order to adequately test the device. Since an increase in the number of vectors slows down the testing time, it is useful to design the groups of connections to minimize test time increases. This is done by only connecting the minimum number of contacts together necessary to reduce the number of signal pins to the maximum allowed by the tester. Grouping contacts that are part of the same bus is another method to reduce the number of additional test vectors required.
FIG. 6 shows the logical flow for grouping contacts together for testing purposes. The process of selecting the semiconductor contacts to group together, step 400, should begin before the design of the integrated circuit is complete since the logical elements of the selector gates described in FIG. 4 should be designed into the silicon, step 410. After design, the semiconductor is built, step 420. Prior to testing the device, a list is made of which output contacts can be selectably turned off relative to each other, step 430, and a probe card is built with appropriate contact connections, step 440. The test vectors are then determined for the designed contact groupings, step 450. During testing, the test vector selects input mode, step 460, applies the test vector, step 470, switches to output mode, step 480, and establishes which set of selectable contacts is enabled, step 490. The output vector is measured and compared to the expected value, step 500. Then a determination is made of whether all sets of contacts have been tested, step 510, and, if not, the test system switches back into input mode, step 460, the new input vector is applied, step 470, the test system switches back to output mode, step 480 and enables another set of selectable contacts, step 490. The output vector is again measured, step 500, and compared to the expected value. This process is repeated until all the sets of selectable outputs are read. Then the next test is preformed, step 520.
While the invention has been particularly shown and described with respect to a preferred embodiment thereof, it will be understood by those skilled in the art that changes in form and details may be made therein without departing from the scope and spirit of the invention.
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I am posting this again so that the forum will notify your email also of a reply.
I have informtion on this family line if anyone is still interested. Frances's and George's father is Rev. William W. Penney and their grandfather is Rev. John Penney. There is too much information to post it all here. Contact me by email. You should be able to see my address when you click on my name.
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Thanks for adding me on the list! :D
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BMGF Mentor Program!
I strongly support DaniHime (Me X Orihime)Originally Posted by Jerry Springer
May I please have Staraptor please?
Staraptor - ChaoZZ BuBBleZ - 23/10/10
Fanclub!~2AS1 stuff~My Best Sprite~Claims
Sprites~More Sprites~Quotes~URPG Stats~ICHC
Rotom (Mow form)-Lawmowergirl-October 23rd 2010
Muk - The Happy Weepinbell - Saturday 23rd October 2010
mah sprite shop
I have recently discovered stat values, and have also recently discovered natures. If you agree copy and paste this into your sig.
Join The Complete Sprite Group Today!
Muk is now claimed.
You should check out this cute little forum, c'mon help it grow. :)
I take Aggron!
... What are we really doing here anyway?
Det ligger tomhylsor i parken
Våra fötter är en meter över marken
Starmie for me? PowerfulStarmie, 10/23/10
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I call Heatran, if it has not already been taken.
My SS FC: 1677-7505-5242
Gochimu - GoldenrodGirl - 24th September 2010
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Yeah, I write dark stuff sometimes. Birdsong, I Can't See The Light and The Courteous Soldier, if you're interested.
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Alternatively, partake of my vlogs, Eurovision reviews and LPs on my second YouTube channel.
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Overall: 3.0 / 5 based on 3 reviews
2 of 3 reviewers would recommend this product to a friend.
First of the season on this fly -
By: jct133 from Pawlet, VT
Top 250 Contributor
After striking out for the last few weeks the temps finally began to rise. I headed out to a local river and tried many different flies. I watched a guy upstream from me pull a nice fish out, I saw him later in the day and ask what he was fishing with. He replied a green march brown. So I tossed one of these on having never fished one. I picked up 2 very nice browns on it. Gotta tie up my own imitation now! I agree with one of the other views about the questionable durability but I haven't fished it enough to truly test it.
Great Attractor -
By: DSUtah from Park City, UT
Great pattern on the lower Provo. Used a dropper off this Brown Nymph and had three hits in the first four casts. Had a little trouble threading the line because of location of eyelet tucked down, but assume this helped it look most natural. Results are great. Worth the extra work to tie it on. Buying more!
Disappointment -
By: Trouthead from North Carolina
Love Orvis and great purchases before this fly-- it is a great fly pattern and trout love it; but you only catch one per fly! It falls apart with one catch. The price I paid I think It should have lasted longer. I bought four and caught three fish about 12 to 14 inchs and lost a fish and was out of these flies. Good pattern bad quality..


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As coal plants release more carbon emissions, nuclear power is considered as an alternative.
Expansion of Portland roads and public transportation will increase emissions by 50%.
If rules are instated for greenhouse gases, construction companies could face lengthy reviews.
Oregon representatives say the bill is needed to save forests and suffering rural economies.
A committee will write rules for gray-water reuse, a practice that was once against the law.


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Intel says it believes its chip technology can facilitate a new genre of portable devices known as mobile Internet devices, or MIDs, which have the capability to support Web browsing, navigation and Internet chat. "What enables the innovation is the ability to bring over all the existing PC applications," said Anand Chandrasekher, general manager of the company's Ultra Mobility Group.
View Full Article in:NYTimes.com · Wall Street Journal, The
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Would anyone have any information on SARAH CATHERINE BOSTWICK born nov. 16, 1860 Renault, Monroe Co Illinois- seeking to identify her parents- If some one could do a census lookup for Bostwicks, 1870 Renault co,Ilinois- that would be very much appreciated.
thank you- Pauline.
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Defines the plain and unexciting, based on the perceived dullness of an actual cheese sandwich. Often used in a relationship sense - i.e. a male/female who may be underachieving in terms of the attractiveness of their partner. In a more simple form, can be used by self-styled playas to question the excitement factor of committed, long-term relationships in general.
1. "Man, your girlfriend's ass is the size of Montana and her skin is the shade of newly fallen snow. Don't you get sick of eatin' that cheese sandwich?"
2. "I can't commit to her or anyone. I don't wanna be munchin' on a cheese sandwich for the rest of my life."
2. "I can't commit to her or anyone. I don't wanna be munchin' on a cheese sandwich for the rest of my life."
by Lazarus Ciccone September 01, 2005
v. to love, originating from a converstion in the film love and sex, where saying I love you, is compared to being as ordinary and easy to say as cheese sandwich.
I will always cheese sandwich you
by Geordie Nicole June 25, 2005
The phrase cheese sandwich refers to being stuck between two cars when driving on a multi-laned road. The two outer cars attempt to deny the middle drivers ability to pull off the road or to get away.
1) You have just been cheese sandwiched!
2) Cheese sandwhich him so he can't get away!
2) Cheese sandwhich him so he can't get away!
by Doyuppi September 11, 2009
insertion of a lactating nipple into ones spread open butt cheeks.
oh thats cool, ask her for a cheese sandwich
by virtual raine August 07, 2010
The sexual act in which three people engage in multiple 'sandwich' like positions. Lots of touching is involved. Best served with Blue Kool-Aid
"Dude, I had the BEST Cheese Sandwich at Katie's, it was totally raunchy!"
by Misty Mormon November 25, 2008
Dude, I'm gonna go have a cheese sandwich!
Dude, I'm gonna go cheese sandwich!
Dude, I'm gonna go cheese sandwich!
by Argus Mc.Warbonglemaster March 24, 2004
someone that is a complete douche bag.
1.You fucking cheese sandwich ass bitch!
2.Fuck you, you god damn cheese sandwich.
3.Quit being such a fucking cheese sandwich.
by Convrse27allstar May 31, 2006


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Engineering Economic DestructionSubmitted by dailypauler on Sat, 12/04/2010 - 14:35
Or, what else do you call it when somebody forces somebody else to live and buy above they're economical means, and thus, driving them into poverty?
Va. judge dismisses challenge to Obama health care
RICHMOND, Va. – A federal judge on Tuesday dismissed Liberty University's lawsuit challenging the Obama administration's new federal health care law, declaring that a provision requiring most individuals to obtain insurance is CONSTITUTIONAL.
(CAPS mine)
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Put it to the Jury. They Decide Verdicts. Judges must be orderly
- Jury of your peers decide verdicts based on all evidence.
- Judges must keep "order n the court."
Your peers are fools that are respected in your village to resolve contentious matters. No less so. They may have knowledge. They may have a clue. Hopefully they do. They may have seen the crime. They may know everyone in their village, good or bad. Hopefully they can resolve contentious matters.
If we allow the demise of "jury of our peers" to the land of artichokes, we have little resolution.
Responsible Judges keep order in the court & hand out sentences based on evidence presented to the Jury of your peers. Farming artichokes may be their side job, but not their court procedure.
Judges are challenged by such grammar. Few even know farming anymore.
Disclaimer: Mark Twain (1835-1910-To be continued) is unlicensed. His river pilot's license went delinquent in 1862. Caution advised. Daily Paul ☑
Re: Put it to the Jury.
Well said MT. Are you listening VA?
Because: Some animals are more equal than other animals. -Animal Farm-
What the? > http://www.youtube.com/watch?v=6MTIwY3_-ks
I read more than I listen.
Not hard of hearing.
Hard of understanding.
I listen to any interesting tale. Like mostly biographies.
Prefer tales up close & personal, told in first person. Fresh.
I surmise the "VA" was RICHMOND, VA. What do you suggest?
Disclaimer: Mark Twain (1835-1910-To be continued) is unlicensed. His river pilot's license went delinquent in 1862. Caution advised. Daily Paul ☑


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New Seachem PhosBond and PhosNet set to tackle your phosphate and silicate issues
Seachem released two new products, Seachem PhosBond and Seachem PhosNet, to help rid your system of phosphates and silicates. The trusty go-to granular ferric oxide (GFO) gets a boost in both of these products with PhosBond combining GFO with aluminum oxide and PhosNet taking regular GFO up a notch with high porosity, high surface area Read More
Giant amphipods and a ghostly snailfish from the deepest parts of the ocean
In our aquariums we often like to culture a diverse culture of 'Pods' including amphipods, copepods and ostracods but our tanks would look wildly different if we were aiming for an authentically deep sea refugium. Take for example these giant amphipods which were collected more than four miles deep off the coast of New Zealand. Read More
LRS Frozen Food Strainer is now available for your defrosting needs
For all but those living under a rock, you would have probably heard through the preverbal grapevine of a new frozen food taking the hobby by storm. LRS Reef Frenzy is currently leading in the frozen food department, and what better time to launch a new product while at the peak of all the hype. LRS Read More
Liopropoma fasciatum makes a year end debut at Sea Dwelling Creatures
In traditional festivities, the rarest of the rare and coolest fish stories are always lurking around the year end corner waiting to make their debut. Vying for the top spot in our 2014 recap post ahead is this incredible Liopropoma fasciatum at Sea Dwelling Creatures. This is the first time we've ever seen this species making Read More
Top 10 most popular stories of 2014
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Reeftoys adjustable sump baffles allow you to DIY on the fly
ReefToys' new adjustable baffles are a novel concept in marine aquarium husbandry which allows even the least experienced reefer to piece together a sump from a tank. You might be thinking that it's relatively easy enough to silicone glass or acrylic sections into an aquarium to create a sump but placing the baffles is not Read More
Are Banggai cardinalfish endangered species or invasive species?
Earlier this week, the results of a 12-month finding by the National Marine Fisheries Service has concluded to propose the beloved Banggai cardinalfish as an endangered species. Together with three species of little-known stony corals, the Banggai cardinalfish, which is a staple of marine aquariums around the world, is slated to be a restricted, protected Read More
Really get to know Scleractinia with the free Coral Finder Toolkit movies
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Prognathodes: more than meets the Aya
The following is a guest contribution from Joe Oliver, a resident Marine Biologist for the Curacao Sea Aquarium and Substation Curacao. The Banks Butterflyfish (Prognathodes aya) and its relative the French or Three-Banded Butterflyfish (Prognathodes guyanensis), are both striking deepwater butterflyfish that are rarely seen in the aquarium trade. Even with quite large distribution ranges from the eastern Read More
ORA's Hector's Goby – A Breeding First That Isn't, But Is
Tuesday, ORA announced their latest in-house accomplishment, the successful spawning and rearing of the Hector's Goby, Koumansetta hectori. Ask yourself, when was the last time you've seen a captive-bred Hector's Goby? You haven't. But is this a species first? ORA believes it is, and they don't make that claim lightly. Publicly, ORA's blog notes that "C-Quest Read More


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The only place for vegan pintxosPosted on 11 / 12 / 2014
A cool bar in the old town, with good beer and decent selection of vegan fast food. We really liked it there and came back two evenings in the row. I was surprised to see so many people complaining about the service here: hey, it's an alternative, a bit punky bar so perhaps you need to adjust your expectations:)
Also, if you want to try vegan pintxos (the Basque equivalent of tapas), you basically have no other choice but to go to Muga.


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Afghanistan War: 3 Afghan Police Officers Killed By Roadside Bomb
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KANDAHAR, Afghanistan -- Afghan officials say three police officers have been killed in a roadside bombing in southern Afghanistan.
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Empyre Special Ops Black & White Zip Up Hooded Vest Jacket
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For the second year in a row, the NFL will be streaming Sunday's Super Bowl live on the web and mobile devices. If you aren't going to be in front of a TV tomorrow night at 6:30pm ET, here are your options for catching the game:
Tag Archive for Verizon
Verizon is getting the iPhone..what does this mean for Google, AT&T?
by Craig Smith • 1 Comment
By now, the entire universe knows that the iPhone is coming to Verizon. While all the details of the new Apple/Verizon relationship won't be announced until later today (11am EST), there is some very interesting analysis and speculation out there…


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Stormy to Clear
Spent last night in Eucha, Oklahoma with Linda and Earl. Linda and I were stationed on Okinawa together. It was great to catch up.
I was not sure I would be able to leave as severe thunderstorms were predicted. Fortunately it was just low dark clouds. As I traveled north the skies began to lighten and clear.
I should make it to Charlie and Nancy's tomorrow.
Day 4: Eisenhower Presidential Library and Museum
Sorry, I have been in wifi free zones on thursday and friday of this week.
I traveled from West Branch, Iowa to Abilene Kansas through some seriously plain geography. I passed two national historic places. The first was near Topeka Kansas, that being the Brown vs. Board of Education museum. The second was a some sort of General Custer Park, and as I passed through all of the rolling hills, I began to picture Custer's last stand which ...
Pit stop
... flat lands like the western half.
Also, did you know that there really is a 'Dorothy's House,' complete with a yellow brick road and all of the characters??? There is! It's in Liberal, Kansas, in the south western corner, just above Oklahoma. (Junctions 83 and 54 if you are interested) We didn't take that route, but you can!
Key West 2014 Day 27, Branson, MO > Salina, KS
This is the view outside my door this morning, the mo'tel is built on this crazy hill, and it is raining for real. I check the weather channel and Missouri Doppler on the web and find there are bands of thunderstorms moving towards the south east out of the Gulf. There seems to be a break in them though so I suit up, including rain gear and sit in front of the AC waiting for the rain to stop.
I couldn't update my blog last night as ...
Great Breakfast and Paying It Forward
Day 5 back on the road
Yesterday we had the best breakfast yet with Paula's cousin, Michael DeGarie and his wife Sandra. The last time we'd seen them, Paula and I were camping in a park on Lake Dillon and we'd visited. That was 1992. Back then Michael was a chiropractor. As an avocation he and Sandra had taken up country dancing. Now Michael is wrangler for Copper Mountain, handling the big Belgian and ...


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Gotta love the support some people show for the 2A. I give a big kudos!http://www.whas11.com/home/Photo-of-man-carrying-gun-in-department-store-goes-viral-187495801.html
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More common in some cultures.
i think i would put up with whatever hassle i recieved if it was legal . i would carry mine every where. lol
I can't believe how many members on here are from Louisville and the surrounding
****ing so awesome!!!! I love the idf photo
God bless that man!
I remember they made a big fuss about the guy in arizona who carried his AR openly at an Obama speech, and same thing with the guy in New Hampshire who O.C at an Obama speech
Arbitrary enforcement of the law is the mark of tyranny. Citizens will always fight against it.
They seem to like carrying their ARs empty in Israel, thats sort of odd, if I were gonna carry it I'd at least have a mag inserted.
Vote Scott Walker for Governor June 5th 2012


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The University of Georgia could begin offering graduate degrees in engineering as soon as this fall, depending on a vote this week by the state Board of Regents.
The regents are scheduled to vote Tuesday on a request by UGA administrators to begin offering master's and Ph.D. degrees in engineering, a little more than a year after the regents approved a controversial UGA request to expand undergraduate engineering programs.
UGA already offers a handful of engineering master's degrees, in agricultural, environmental, biochemical and biological engineering.
Even after cutting the school week to four days to save money, Elbert County's cash-strapped school board may close two of the county's five elementary schools.
The school system has cut millions from its operating budget over the past three years, eliminating unfilled positions and even laying off teachers and other workers. The board eliminated local pay supplements from the budget and got rid of music and art programs.
"We're just bare bones," said Schools Superintendent Rick Higginbotham.
Like many Athens couples, Bill and Dorothy Paul owned a few pieces of nice pottery a few years ago, but not nearly enough to qualify as a serious collection.
They've made up for lost time in the past few years.
Over the past decade, the couple has built a collection of about 1,500 pieces, most dating from the 1920s and 1930s. And Bill Paul, a retired University of Georgia art professor, knows where almost every one of them was made and by which studio or potter.
Oglethorpe Avenue Elementary School learned black history from people who have made a little history of their own in a Black History Month program Friday.
The students also got some advice from Jack Lumpkin, Athens-Clarke County's first black police chief, and Ira Edwards, Clarke County's first black sheriff.
Lumpkin told people nearly 40 years ago he was going to be the first black police chief of Athens, he said.
"People said, 'You are crazy,' " Lumpkin said.
Clarke County high school students will be able to take college courses taught by instructors from Athens Technical College next year at the Clarke County School District's Athens Community Career Academy.
Students will also be able to enter Athens Tech's career programs through the career academy under a new program of study adopted by the Clarke County Board of Education.
Thomas Willey and Theron Camp faced off for seven increasingly tense rounds Thursday before one emerged as champion of the Clarke County School District's 2012 Spelling Bee.
The two boys were the last ones standing in Clarke Central High School's Mell Auditorium after third-place speller Graham Dodson of Alps Road Elementary went down with "braggert," which is correctly spelled "braggart."
Six University of Georgia students will help the school boost recycling, remove invasive plants, gauge the effectiveness of a pollutant-filtering rain garden and otherwise improve the university's environmental practices.
The six students will share a total of $20,000 in grants for their programs. Their initiatives were chosen from among 21 proposals that students submitted to UGA's Office of Sustainability, said UGA Sustainability Coordinator Kevin Kirsche.
A committee of UGA students, faculty and staff picked the six projects. The winners are:
A University of Georgia cheerleader is scheduled to appear on ABC's "Good Morning America" show this morning with her story of turning down a lucrative modeling contract because she would have had to take steroids.
Fayetteville junior Anna Watson is tentatively scheduled to appear between 8 a.m. and 8:30 a.m. on the show, though the time slot could change, according to the UGA Athletic Association.
Baldwin Street restaurant will become the heart of the Bulldog Nation, or something close to it, this morning.
University of Georgia football fans from as far away as Atlanta and Macon will begin showing up at the Blind Pig Tavern as early as 7:15 and in a couple of hours, the place will be packed. By mid-afternoon, everything will be back to normal.
This will be the only day of the year the restaurant serves breakfast, but that's not why the customers are there. The customers — almost exclusively men — come to observe the annual ritual of football Signing Day.
The skies were clear and calm above Athens on Monday, but that didn't stop about two dozen University of Georgia students from learning a bit about tracking hurricanes and tornadoes.
Students in a weather processes class taught by UGA geography professor Marshall Shepherd gathered Monday afternoon around a huge truck rig idled in a UGA Intramural Fields parking lot.
On a platform behind the rig, a radar dish steadily rotated, beaming and receiving radar waves, scanning the skies above Athens for wind and rain.
Athens, GA • Athens Banner-Herald ©2014. All Rights Reserved.


text: The 56-inch OLED TV Sony trotted out at CES may not be headed to the consumer market, but it is becoming a reality, at least in the professional sector. The company showcased a pair of 4K OLED prototypes at NAB 2013, outing a 4,096 x 2,160 30-inch model as well as a 3,840 x 2160 56-inch display. B


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Abstract available in
Claims available in
Description (OCR text may contain errors)
Aug. 17, 1965 A. LIEB 3,2L633 ELECTROLUMINES CENT GAPACII'IOB- Fig. 7
3 5 4 3 .l l j I I] INVENTOR.
A L BER 7' IEB ATTORNEY United States Patent Oiitice 3,2%,533 Patented Aug. 17, ll
` 3,2tll,633
ELECTRGLUMNESCENT CAPACI'ER Albert Lieb, Stuttgart-Bad Cmnstatt, Germany, assigner to International Standard Electric Corporation, New York, NX., a corporation of Delaware Filed Nov. 29, 1962, Ser. No. 246,895 Claims priority, application Germany, Dec. 2, 196i, St 18,634 13 Ciaims. (Cl. 313-l08) This invention relates to an electroluminescent capacitor for indicating symbols, such as letters or numbers.
in a familiar luminescent capacitor of this type, the electroluminescent material is applied in the form of a symbol to only that part of the capacitor that is to radiate light. The drawback of such capacitors is that substantially greater power is required for illuminating the desired symbols. This is a particularly diliicult problem when the power for producing the electroluminescence is supplied by battery.
In another present embodiment of such capacitors, one of the conductive electrodes, usually the opaque electrode facing away from the observer, is designed in the shape of the symbols to be represented. In order to indicate the individual symbols, however, electrical contacts must be set up for each symbol design. This procedure is complicated and time consuming and the manufacturing cost is thereby substantially increased.
Another known luminescent capacitor is one in which additional insulating material is applied between the conductive layers in the areas where emission is to be suppressed, so that the conductive layers are spaced more closely together at the iiuorescent surfaces than at the non-fluorescent areas. A problem with these capacitors is that it is very diiiicult to produce a sharp definition between the fluorescent and non-iiuorescent sections. In order to make the differences between these portions sufticiently large, the spacing between electrodes must Vary considerably. This leads to a blurring of the luminescent definition at the crossover points or junctions. Furthermore, it is ditlicult to vary the spacing between the conductive electrodes to any great degree in the case of small luminous designs. Another difficulty lies in providing the surfaces with a conductive layer parallel to the direction of observation.
It is therefore the primary object of the present invention to provide an improved electroluminescent capacitor having greater eciency, simplicity, and sharpness of definition. This is achieved by a novel structure having a solid dielectric containing an electroluminescent fluorescent material between two equidistantly spaced conductive layers, with the parts ol' the electrolurninescent capacitor that indicate the symbols having a dielectric material of a substantially ditierent dielectric constant than that of the other parts of the capacitor.
T he invention will now be described and other objects and advantages will become apparent with the aid of the embodiments shown in the accompanying drawings, wherein:
FlG. l shows the cross-section of a luminescent capacitor according to the invention;
FIG. 2 shows a variation using a thinner high dielectric layer;
FIG. 3 is another variation having an added dielectric layer; and
FIG. 4 shows a further form of the invention.
A transparent electrically conductive layer 2, such as a vaporized tungsten or a tin-oxide is shown coated on a transparent support 1, Which may be a glass or mica plate. Dielectric layers 3 and 4 with different dielectric constants are placed between layer 2 and another conductive layer 5, such as an evaporated aluminum layer or a metal foil or sheet. Layer 3 includes a suitable luminescent material and is shaped to match the form of the symbols to be indicated. In the embodiment, the surface area of layer 3 is smaller and the dielectric constant is considerably higher than that of layer 4. In a special embodiment, layer 4- can be made light-absorbent, by using admixtures of dark varnish for example. This increases the contrast between luminescent and non-luminescent portions.
Layer 3 may consist of a material of high dielectric constant, such as an epoxy resin or polyester, in which the luminescent material is embedded. In order to make the dielectric constant stiil higher, Substances ofl very high dielectric constants can be mixed with layer 3 and cornbined with a suitable binding agent into a single layer. For example, the epoxy resin of layer 3 may include barium titanate or strontium titanate embedded as additional substances. Layer 4 has a low dielectric constant which may be formed of polyester, oppanol, or high molecular polyethylenes. Gases, such as air or a vacuum, can also be used for layer 4. When the luminescent capacitor is operating, electroluminescence occurs only at those areas where the high dielectric constant layer 3 is located between electrodes 1 and 5. The power drain also occurs substantially only at the surface area of layer 3 indicating the symbols. l
FIG. 2 shows another embodiment wherein the reference numbers of FIG. l also apply. In contrast to the embodiment in FIG. l, high dielectric constant layer 3 is thinner than layer 4. This may be produced by pressing or spraying substances of high dielectric constant, such as barium titantate or strontium titanate together with a suitable high dielectric binding agent, epoxy resin, for example, onto electrode 5, which may be in the form of a sheetmetal plate matching the design to be represented. The luminescent substance, embedded in a low dielectric thermoplastoic material 4, such as polystyrol, or in a plastic material such as oppanol, is applied to support 1, which is provided with conductive layer 2. It can be applied by spreading or spraying on the above substances dissolved in a suitable agent. Electrode 5 with the design of substance 3 on it is then pressed into layer '4. When a thermoplastic substance is used, heat is applied at the same time. Electroluminescence and power drain occur only at those areas of the electroluminescent capacitor between the electrodes which include high dielectric constantlayer 3.
FIG. 3 shows another embodiment using the same reference numerals. An additional dielectric layer o is inserted between combined layers 3 and 4 and transparent conductive layer 2 located on support I. Provision is made for embedding the luminescent substance in this added layer. Layer l differs from the other layers in that it has plastic or thermoplastic properties, whereas layers 6 and 3 do not. In manufacturing the capacitor, the elements consisting of parts 3, e, 5, and l, 2, 6 are separately produced in the manner described in the example of FIG. 2 and the two halves are pressed together under pressure, and, in the case of a thermoplastic substance, includes simultaneous application of heat. The spacing between electrodes of such an electroluminescent capacitor is determined by the thickness of the plastic layers 3 and 6. Here it is particularly simple to achieve uniform electrode spacing and illumination of the design. The invention also provides for the introduction of additional layers with ditferent properties between layers 3, 4 and layer 6. For example, such an additional layer may be optically opaque and consist of a thin layer of varnish. By applying such a layer, the design can become invisible when the electroluminescent power is switched olf.
FIG. 4, using the same reference numerals as the previous embodiments, shows an embodiment of the invention in which enamel or glass is used as the dielectric.
An enamel or glass layer 7 is placed on a support such y layers.
of vaporized aluminum. Layer `2a can also :be optically transparent and 'layer 7 will .then have a high optical reflection. Layer 2a may consist, for example, of velectrically conductive transparent tin oxide and layer 7 may be of Whiteenamel. Layer 4. consists lofi-a substance of low dielectric constantwhich maybe a suitable selected enamel. The material of layer 3 has a substantially Y higher dielectric constant, such as an enamel containing or embedded with barium titanate. The surfacearea of layer 3 is smaller than thatcf layer 4.( On layer 4'there is an electrically conductive ,transparent layer 2b, tin oxide, for example, and,`if. necessary, another electric-ally insulating enamel or glass layer 8, which is suiiiciently transparent for optical rays and serves as an electrical *and mechanical protective layer. l Parts lof layer 4 may j consist entirely "or partially of fair, or, a vacuum'. YFor example, layer 4 maybe porous', or just those parts of this layer immediately Iiaci-nglayer 2b may be lformed of @enamel or glass, While the; remainder consists .of air or r Magnum. While several embodiments have been illustrated, it is apparent that the inventionV is not limited to the exact l,form orruses shown'a'ndtha't many Vother variations vmay be inade in the particular design and coniiguration withv`vout departing from Athe scope of lthe invention as set j forth in theappended claims. Y Y Y What is claimed is: f
1. An electroluminescent capacitor to indicate symbols i comprising a pair of `equidistantelectrically conductive y layers, one oi said 'conductive llayers being transparent,
. iirst :and second dielectric layers arranged between said conductivelayers, said second dielectriclayerbeing in the f form ofrsaid symbols and having a dielectric constant higher thanthat of said-,iirst dielectric layer,A and electroluminescentginaterial included in one of said dielectric j 2. An electroluminescent capacitor accord-ing to claim 1, wherein thev portion of the surface. of the lcapacitor adjacent one conductive,layeroccupied by sia-id higher dielectric constant layer is .smaller than that of theiirst l dielectric layer.
3.*An electroluminescent capacitor according to claim 2 wherein said iirst dielectric layer extends fully, across the space between said conductive layers and `said second dielectric `layer extends .for a portion of the space therebetween, said iirst dielectric layer occupying the entire surface adjacent the other conductive layer.
4. An electroluminescent capacitor accor-ding to claim `2, wherein oneV of the dielectric layers is a plastic material.
5. An electroluminescent capacitor according to claim 2, including an additional layer between one of said conductive layers and said ldie'lectriclayers, the luminescent material being embedded in the additional laye-r.
6. An electroluminescent .capacitor according to claim 2, wherein said higher dielectric constantlayer includesV barium titanate. j o
7. An Iele'ctrolurninescent capacitor according to cl-aim 2, wherein saidhigher dielectric const-ant layer includes strontium titana-te. o.
8. An electroluminescent'capacitor .according to .claim 2 including :an opaque layer between one of said conductive layers and said dielectric layers.Y
9. An electroluminescent capacitor according to claim 2, wherein one of Vsaid dielectric layers'comprises enamel. 10. An electroluminescent capacitor according to cla-im 2wherein one of said dielectriclayers .comprises glass. j
Y .11.` An electroluminescent capacitor according t claim 12 including a layerfof yglass on the Vouter lsurface of said transparent conductive layer. I y. Y 12. lAn electroluminescent capacitor according to claim 4, wherein one of the dielectric layers is a thermoplastic material. Y
13. An electroluminescent'capacitor according to cliam Y, 1=1 including ay .further vglass layer on the outer surface o Vfthe other conductive layer and .a metallic base layer thereover.V Y j References Citedrbylthe Examiner f Y Y UNITEDSTATES PATENTS 2,919,366 -1'2/59 Mash. v `2,922,912 1/6Ql Mil'ler. l
FonErGNrATEN'rs A v 1,155,597 5/58 .France Y .Y 'j
GEORGE NQ WESTBY, Primary Examiner.
Patent Citations
Referenced by
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Hugh Grant - Hugh Grant Was Long Down The List For Four Weddings And A Funeral
Picture: Hugh Grant - London premiere of 'Alan Partridge: Alpha Papa' held at Leicester Square - London, United Kingdom - Wednesday 24th July 2013
Hugh Grant was lucky to land his big break in hit British film Four Weddings And A Funeral - a staggering 71 actors had tried out for the role before him.
Grant shot to stardom playing bashful Charles in the 1994 romantic comedy but he could easily have missed out on the part as he was so far down the list.
Richard Curtis, who wrote the script for the film, tells the Radio Times, "Hugh Grant was, I think, the 72nd person we auditioned for the lead in Four Weddings, and was the first one to make it funny at all... When we'd shot it, and watched the edit of the film, it didn't work at all.
"So for four months, we played a bizarre game of edit-chess until at last we ended up with something that worked better."
Grant, who went on to score huge box office hits with Notting Hill and Love Actually, has previously said if he did not succeed in the audition for Four Weddings he would have quit his fledgling acting career.


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"Dr. Cooke is not my doctor and never has been I work at a facility that his patient comes to, and I just wanted to let everybody know ..."
"Dr. Geffrey Klein has been my OBGYN since 2005. He is an amazing doctor!! He is very knowledgeable, dedicated to his work, professional and caring. Having Dr. Klein ..."


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The holidays are over, and so are all the lists and guides and recommendations on what wines go with what occasions. I, for one, will drink to that. So, as we start fresh for 2009, I went hunting the other day for some new wines to consider for the new year. My requirements were that they be from regions I hadn't covered for a while and that they represent good value, which is a priority these days.
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When I say good value I'm talking about wines that will not only make you take notice of their individuality, but that will also make you think you got a great bottle for the price. And who isn't looking for that?
Well, one of my new wines, a $14 red from Austria, makes the point superbly. It's the 2006 Blauer Zweigelt from Anita and Hans Nittnaus in the Burgenland region. The Blauer Zweigelt variety, also known simply as Zweigelt, is a cross between two well-known Austrian red grapes, Blaufränkisch and St. Laurent.
In the Nittnaus interpretation it produces an enticingly fruity, soft and immediately accessible wine that is hard to put down. With its satin texture, this is a wine for those who want a refreshing break from big and tannic reds. Medium-weight with a modest 12.5 percent alcohol, the Nittnauses make it using biodynamic vineyard practices (a method of organic farming) in Burgenland's Neusiedlersee area, named after a shallow lake that tempers the hot climate.
And here's the deal clincher: For all its approachability, the wine still offers considerable complexity, with tastes of spicy cherry accented by sage, mint and touches of black licorice and vanilla on the finish. I enjoyed it with steak and it will also match well with other red meats, pork and herbed chicken.
"Easily drinkable and intriguing at the same time," I wrote in my notes. Add the modest price and you've got a great bottle of red for these modest times. Austria, of course, is best known in this country for the white Gruner Veltliner variety, which produces some first-class food wines in a range of prices. With wines like the Nittnaus Zweigelt, the reds deserve a more prominent place at the table.
The Nittnaus wine is part of the Austrian portfolio of Monika Caha Selections and is distributed in the New York area by Frederick Wildman and Sons. I bought it at Chambers Street Wines.
Edward Deitch is the recipient of the 2007 James Beard Foundation Journalism Award for Best Multimedia Writing. He welcomes comments from readers. Write to him at firstname.lastname@example.com
© 2013 NBCNews.com Reprints


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Prom dresses available for those in need
Every Spring for the past ten years, Ennis High School teacher Vicki Chmelar gets to play Fairy Godmother for a few EHS students in need.
Every Spring for the past ten years, Ennis High School teacher Vicki Chmelar gets to play Fairy Godmother for a few EHS students in need.
The Ennis High School Lionettes' last show of the year is Saturday.
Parents of incoming Ennis High School freshman met with counselors Thursday night about the new graduation requirements mandated by the passage of Texas House Bill 5.
Ennis High School students have until Friday to apply for two college scholarships offered by Ennis State Bank.
Ennis ISD administrators will review the district's policy on substitute teacher pay over the summer.
The Ennis community, led by a group of 24 Ennis High School students, united to raise awareness and money to help fund research for childhood cancers.
Ennis ISD Superintendent John Chapman said he plans to evaluate every district administrator over the course of a year before any contract extensions are decided on.
Ennis Junior High School eighth grader Joseph Valek represented the school at the Houston Livestock Show on Saturday and took second place in the agricultural mechanics show.
Ennis ISD Superintendent John Chapman outlined a number of initiatives he and his administrators are considering at the Tuesday meeting of the Ennis Rotary Club.
New school lunch regulations loom on the horizon as Ennis ISD prepares to renew its contract with food service company Sodexo.
Students entering Ennis High School will have an important choice to make this year, but school officials say they'll have plenty of help making up their mind.
Ennis High School's One Act Play team will perform for the public one time only at 7 p.m. Saturday at the EHS Auditorium.
The Ennis Independent School District Board of Trustees appointed outgoing member Miles Strunc to head up a committee aimed at overseeing a large bequest from an anonymous donor to fund scholarships.
Bowie Elementary Principal Chad Corbett is willing to go out of his way to get students enthusiastic about this Saturday's Spaghetti Supper fundraiser. As far out of his way as on top of the school building itself.
Palmer ISD Superintendent Kevin Noack said Tuesday the district is moving forward with plans to replace the aging Palmer Elementary School as well as install security upgrades at the middle and high schools.
Students from both Ennis ISD intermediate schools visited Ennis High School on Friday to learn more about how agriculture touches their daily lives.
The Ennis ISD Education Foundation is off to a running start thanks to funds raised by Feb. 28's Beast Feast at Grasshopper Ranch.
The Ennis Lions Club provided free eye exams and glasses prescriptions Wednesday at Tabernacle Baptist Church, as they have for the past six years.
While roads throughout Ennis continue to clear, further freezing weather threatens to bring on another deep freeze tonight. Interim City Manager John Hatchel said while some residential streets remain icy, most of the city's main thoroughfares are clear enough for traffic. "Right now, the major streets are pretty dry," Hatchel said. However, he said freezing […]
Assistant Superintendent James Sanders issued a follow-up statement Sunday saying Ennis ISD will join nearby districts Palmer, Ferris and Avalon in closing Monday because of adverse weather conditions. The Ennis Daily News will continue to publish new information as it is released.


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Mizuno 2014 IronsThe latest technology from Mizuno. Tackle any challenge with the largest sweet spot in golf.