text:
Method and apparatus for approximating the average critical area of a layout or layout region, involving summing, over all the object segments of interest, respective critical area contribution values that are dependent upon particular layout parameters of the objects, each of the contribution values being representative of a plurality of defect sizes, and being defined such that for each defect size in the plurality of defect sizes, and for a particular defect type, the contribution values collectively count all critical areas arising due to the object segments of interest only once.
1-44. (canceled)
45. A method according to
46. (canceled)
47. A method according to
and wherein the explicit formula calculates the optimal position for the single object as having approximately a spacing sij* from the second neighboring object given by:
where bij is the mutual visibility length of the single object relative to the second neighboring object, and bik is the mutual visibility length of the single object relative to the third neighboring object.
48. A method according to
49. A method for post-route optimization of the position in a particular dimension, of a first group of at least one object in an integrated circuit layout layer, comprising the steps of:
calculating, using an explicit formula, an optimal position for the first group of objects in the particular dimension, the optimal position being a position in the particular dimension that minimizes the sum of the average critical area on both sides of the first group of objects which are opposite each other in the particular dimension; and
moving the first group of objects in the layer to the calculated position along the particular dimension.
50. A method according to
51. Apparatus according to
52. (canceled)
53. A method according to
54. Apparatus for post-route optimization of the position in a particular dimension, of a first group of at least one object in an integrated circuit layout layer, comprising:
means for calculating, using an explicit formula, an optimal position for the first group of objects in the particular dimension, the optimal position being a position in the particular dimension that minimizes the sum of the average critical area on both sides of the first group of objects which are opposite each other in the particular dimension; and
means for moving the first group of objects in the layer to the calculated position along the particular dimension.
55. Apparatus according to
56. A method according to
57. (canceled)
58. A method according to
59. A method according to
60. A method for post-route optimization of a plurality of objects in an integrated circuit layout layer, comprising the steps of:
selecting a first group of at least one object in the region;
using an explicit formula, moving the first group of objects to an optimal position for the first group of objects in a particular dimension of the layer, the optimal position being a position in the particular dimension that minimizes the sum of the average critical area on both sides of the first group of objects, which sides are opposite each other in the particular dimension; and
repeating the steps of selecting and moving for all other objects in the plurality.
61. A method according to
62. Apparatus according to
63. Apparatus according to
64. A method according to
65. Apparatus for post-route optimization of a plurality of objects in an integrated circuit layout layer, comprising:
means for selecting a first group of at least one object in the region;
means using an explicit formula, for moving the first group of objects to an optimal position for the first group of objects in a particular dimension of the layer, the optimal position being a position in the particular dimension that minimizes the sum of the average critical area on both sides of the first group of objects, which sides are opposite each other in the particular dimension; and
means for repeatedly invoking the means for selecting and moving for all other objects in the plurality.
1. Field of the Invention
The invention relates to integrated circuit fabrication, and more particularly to methods for determining the average critical area of a particular layout.
2. Description of Related Art
As VLSI technology moves to deep submicron, manufacturability and yield related issues become increasingly important. Yield loss can be caused by many factors. One important factor is random defect yield loss, which is related to the yield loss caused by contamination particles. The design related parameter required for modeling random defect yield is sometimes called the critical area.
Critical Area measures a design's sensitivity to the random particle defects. Much work has been done on extracting and calculating the critical area for a given design layout. The main approaches fall into the two main categories: Shape Expansion based methods and Monte Carlo methods. Conventional shape expansion based methods generally attempt to calculate the critical area contributed by each object and for each particular defect size of interest. For each defect size, the method approximates the geographic union of the critical area contributions of all the objects. The result is then averaged over all the defect sizes, weighted by the defect size distribution.
One problem with the conventional shape expansion methods is that calculation of a geographic union can be extremely time consuming. Some methods approximate the geographic union, but only at the expense of accuracy. Other methods do not even attempt to approximate the geographic union, and simply add all the critical area contributions together. The latter variation creates significant inaccuracies because overlapping regions are counted twice or more: once for each object that includes the region in its critical area contribution. Many conventional shape expansion methods also suffer because they require a separate critical area calculation for each defect size of interest. Because each critical area calculation is so expensive, the number of discrete defect sizes for which it is calculated is often reduced, thereby degrading accuracy of the results. If accuracy is to be improved by increasing the number of discrete defect sizes at which the critical area calculation is made, then runtimes can easily become prohibitive. Another problem with conventional shape expansion methods is that there is no explicit formula available for total critical area. Thus it cannot be used to evaluate critical area as part of cost function for layout optimization.
In Monte Carlo based methods, a generator generates random defects with their sizes following the given defect size distribution function. Since the Monte Carlo based methods do not need to limit themselves to any specific defect size, they do not suffer from accuracy degradation due to insufficient numbers of defect sizes tested. But accurate estimation may still require huge runtimes due to the need to test huge numbers of randomly generated defects.
Embodiments of the present invention can avoid the above problems and others by deriving an explicit formula for a weighted average �pseudo-critical area� contributed by each object in the layout region under study. Preferably the weighted average pseudo-critical areas depend only on parameters of the layout, all of which can be extracted during a single sweep through the objects in the region. The weighted average pseudo-critical area preferably already accounts for all defect sizes of interest, so it is not specific to any individual defect size. It is therefore unnecessary to perform the calculation separately for each of many defect sizes. The weighted average pseudo-critical area preferably is defined also such that regions that might, under conventional definitions, be included in the critical area contributed by more than one object, are allocated to such objects in a non-overlapping manner. Calculating the geographic union of the weighted average pseudo-critical areas in such an embodiment therefore can be as simple as summing them. The final result for total weighted average critical area can be another explicit formula, as a function of layout parameters only.
The invention will be described with respect to specific embodiments thereof, and reference will be made to the drawings, in which:
The following description is presented to enable any person skilled in the art to make and use the invention, and is provided in the context of a particular application and its requirements. Various modifications to the disclosed embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other embodiments and applications without departing from the spirit and scope of the present invention. Thus, the present invention is not intended to be limited to the embodiments shown, but is to be accorded the widest scope consistent with the principles and features disclosed herein.
The critical area Ac is defined as the total area of the regions on the layout where the contamination particles must fall to cause functional failures (such as open and short circuit failures). For purposes of the present discussion, contamination particles are approximated as discs, and the location of the centerpoint is considered to be the location of the particle. Other conventions will produce the same or similar results.
where xmin and xmax are the minimal and maximal defect sizes in a range of defect sizes, and f(x) is the defect size distribution function.
As is well know, the arithmetic average over a certain number of values is the summation of these values divided by the total number of the values. Equation (1) is a weighted average value. This means that each participating value's contribution to the sum is weighted with some weighting function. The weighted average value is the weighted sum divided by the total contribution of all the participating values. In equation (1), the weighting function is the defect size distribution function. If the weighting function for all participating values is equal, then the weighted average is the same as the arithmetic average, and this is considered herein to be a special case of the term �weighted average�. One basic property of a probability distribution function is that the sum of all the distribution function values over all the possible defect sizes is equal to one. Mathematically, ∫f(x)dx=1. Therefore the weighted average critical area Acr in (1) is equal to the weighted sum of the critical areas for every defect size Ac(x) with the defect size distribution function as the weighting function. In the following content of this document, for simplicity of discussion, the term �weighted average� is sometimes abbreviated merely as �average�.
Also as is well known, an average over a number or range of values differs from the sum of such values only by a scaling factor. That is, an average over such values is calculated by summing the (optionally weighted) values and dividing the sum by a scaling factor given by either the number of values or their range. The scaling factor may be applied separately to the sum, or may be applied to the values (or their weighting factors) prior to the sum. In many situations, however, the scaling factor is ignored. For example, if the average will be used only in relation to other averages that have the same scaling factor, it is unnecessary to divide any of the sums by the scaling factor; one value will remain smaller or larger than another of the values whether or not they have all been divided by the scaling factor. As another example, if the scaling factor will become subsumed within a calibration factor that is determined empirically, it is unnecessary to apply it explicitly. It is sufficient instead to simply allow the empirical calibration to include the scaling factor's effects. It is common in these situations, therefore, for practitioners to use the terms �average� and �sum� interchangeably, even though mathematically speaking they are not the same in an absolute sense. That is, one may speak of calculating an average value, but the equations given for doing so merely calculate the sum; or vice-versa. Consistently with that practice, the two terms, �average� and �sum�, are used interchangeably herein.
In order to calculate the average total critical area, the total critical area at each particular defect size, which is denoted as Ac(x) in equation (1), is needed. It can be seen that at each particular defect size, the conventional shape expansion method typically computes the geometric union of the critical areas for all the wires to obtain the total critical area. Due to the existence of the overlaps between the critical areas of different wires, the total critical area is not a linear sum of each individual wire's critical area. Several algorithms (mostly based on scan-line or quad-tree data-structures) have been proposed for efficiently computing the geometric union. However, none of these methods can handle the geometric union analytically. Therefore there is no way to predict the total critical area at a different defect size. The whole extraction and computation procedure therefore has to be repeated for different defect sizes.
In particular, in step 310, an analytical defect size-independent average pseudo-critical area contribution function is developed for an arbitrary layout object. This function is already representative of all defect sizes of interest. It is based on, but is not the same as, the actual critical area contribution at each defect size. In particular, as set forth in more detail below, the average pseudo-critical area contribution function is defined so that critical area regions arising due to more than one object are allocated among the objects in such a way as to avoid overlaps. The average pseudo-critical area contribution function preferably does depend upon layout parameters of the objects under consideration, such as the spacing between objects, the width of the objects, and the portion of objects that are visible to neighboring objects. Certain prior art methods assume that all objects are spaced equally and have equal widths, a simplification that does not accord with actual practice and which can degrade the accuracy of the results. The average pseudo-critical area contribution function preferably does not depend upon any other parameters that vary as a function of defect size or for different ones of the objects under consideration.
In step 312, with the explicit formulae for short and open critical areas available, an embodiment need only to go through every objects in the layout once to extract the above layout parameters. At the end of extraction, the layout parameters are substituted into the formulae and the average pseudo-critical area contributions of all objects of interest are simply summed. Because of the way the average pseudo-critical area contribution function is defined for purposes of step 310, this simple summation is equivalent to a geographic union. Step 312 results in a critical area value arising from all the objects of interest in the layout, already averaged over all the defect sizes of interest.
The above discussion is for calculating the total average critical area. An embodiment of the invention can be used to calculate the total critical area for a single defect size as well. If that is desired, there is not much difference in computational cost between the methods described herein and some traditional methods. But for situations that require average critical area, the methods described herein can be much more efficient.
After the average critical area Acr over the layout objects of interest is calculated in step 312, it may be used for a number of different purposes. It may be used for yield prediction, for example, or for choosing among two or more implementations for a particular design. It can also be used in the physical verification step to check whether the critical area is within a given constraint, or incremental evaluation of the changes in the average critical area due to layout modifications. The method described herein can also be used in a cost function for global or detail routing. In step 314, as yet another example, the average critical area value determined in step 312 is used in a cost function for post-route yield optimization. Many other uses for the average critical area value are known, or will be apparent to the reader.
In step 412, the average pseudo-critical area contribution function is integrated over all defect sizes of interest with a probability distribution function of the defect sizes. Any distribution function can be used, but the present embodiment uses the well-known function of equation (3):
where x0 is the minimal spacing in the design rules.
The formula for total critical area as a function of defect size will be different for different kinds of yield-affecting conditions. By way of example, formulas for two such conditions, defects creating a risk of short circuit conditions and defects creating a risk of open circuit conditions, will now be derived. For purposes of the following discussion, the term �wire� is used herein to denote a region of electrically conductive material in a layer. The term �net� is used to denote a group of electrically conductive materials that always has same electrical signal in the circuit. In the embodiments described herein, a �wire� is broken into �objects� at corners, and �objects� can be further broken into �segments� at equation applicability condition boundaries, discussed below. However, it will be appreciated that in another embodiment, �segments� can be defined differently and, if necessary, the equations can be adjusted accordingly.
If a pair of parallel wires i and j belonging to different nets have portions visible to each other, as shown in
Equation (4) is an effort to formulate the critical area analytically. There are at least two major problems with this formulation. One is that if total critical area is computed as
where the term �nbr j of i� is read, �neighbor j of object i,� then the same critical area Aij(x) and Aji(x) is going to be double counted. Another major problem is that when the defect size is large, the critical area arising due to wire pair (i,j) might overlap with the critical area arising due to another wire pair (i,k), such as area E shown in
In order to solve this problem, the present embodiment describes the total critical area as a summation of �pseudo-critical� areas between every pair of �visible� object segments. One object segment is considered herein to be �visible� to another in a particular direction if a straight line can be drawn in that direction so as to intersect both segments without crossing another object that affects the critical area of the layout region. The �visibility length� bij of a pair of object segments is defined herein as the length of one object segment which is �visible� to the other; the visibility length is sometimes referred to herein as the �mutual visibility length�, since it should be the same regardless of from which segment the view is taken (so bij=bji).
The pseudo-critical area �ij(x) is defined in such a way that no critical area region on the layout, which arises due to any neighboring pair of objects, is included in the �pseudo-critical� area of more than one object pair. Stated mathematically:
Note that the subscript (i,j) is order sensitive, i.e., �ij(x)≠�ji(x). In order to satisfy equation (7), pseudo-critical areas are defined in the present embodiment such that critical area regions that arise because of a particular pair of objects i and j are assigned either to object pair (i,j), or to object pair (j,i), or are allocated partially to each in a non-overlapping manner. As used herein, the segment pair (i, j) is referred to herein as an �ordered� pair, meaning the pair (i,j) is to be considered a separate pair from the pair (j,i). Accordingly, an iteration over all �ordered� pairs (i,j) would count pair (i,j) separately from pair (j,i).
Note that the sum of the two pseudo-critical areas does equal the actual critical area:
and note further that the condition of eq. (7) holds:
Through analyses such as that above with respect to
where bij is the length of the overlap portion between object segments i and j, sij is the spacing between object segments i and j, wi and wj are the wire-widths for the two wires, and Dmax is the maximum random defect size of interest. The layout parameters taken into account in Eq. (12) are bij, sij, wi and wj.
For segment 612, which has visible neighbors on both sides, the critical area region includes subregions G and H to the right of segment i, defined as set forth above for subregions B and C. To the left of segment i the critical area region includes subregions E and F, which are distinct but in conjunction are defined as set forth above for subregion A. In addition, to the left of segment i, subregion D+E is the critical area between wire i and wire k. Subregion E is an overlap region that arises both because of the proximity between wire i and wire j and the proximity between wire i and wire k.
In the present embodiment, the pseudo-critical area for segments having visible neighbors on both sides has one component �ij(x) accounting for subregions arising because of the proximity of one neighbor j, and another component �ik(x) accounting for subregions arising because of the proximity of the other neighbor k. �ij(x) is defined similarly to its definition for segments having only one visible neighbor j:
where the region F is the region of the critical area Aij(x) that goes away from wire j in the direction opposite wire i, but is not covered by the k-side critical area Aik(x). The region E, which is the overlap region between the critical areas Aij(x) and Aik(x), is included as part of the pseudo-critical area Aik(x):
Similarly, regions included in �ik(x) should not be allowed go to the other side of wire i (farther from wire k than wire i) because that part has been covered by �ij(x). The region H is already totally included as part of pseudo-critical area �ji(x). Following these steps, every region in the shaded area as shown in
It will be appreciated that the above formulas for the pseudo-critical area as a function of defect size derives from certain conventions about how various critical area subregions, which arise due to more than one pair of neighboring objects, are to be allocated in a non-overlapping manner to each pair. Two examples of allocation strategies are included in the above derivation. For subregions of the critical area that are located between the wire pair (i,j), half of the subregion is assigned to the pseudo critical area of wire pair (i,j), the other half is assigned to the pseudo critical area of wire pair (j,i). More generally, a fraction δ of the critical area may be allocated to one of the pairs (i,j), and the remaining fraction (1-δ) allocated to the other pair (j,i), 0<=δ<=1. In the above derivation, δ=�.
Similarly, for overlapping subregions that arise because the critical area due to wire pair (i,j) overlaps with the critical are due to a different wire pair (i,k), and these regions are located between the wires i and k, then half of them are assigned to the pseudo critical area of wire pair (i,k), half of them are assigned to the pseudo critical area of wire pair (k,i), and none is assigned to that of the wire pair (i,j). Again, more generally, a fraction δ of the critical area may be allocated to one of the pairs (i,j), and the remaining fraction (1-δ) allocated to the other pair (i,k), 0<=δ<=1. Other variations will be apparent. In general, δ can be a function of the defect size x, but in the present embodiment δ is constant for all defect sizes.
Now that an analytical formula has been derived for the pseudo-critical area contribution function of an arbitrary object i relative to an arbitrary neighbor j or neighbors j and k, as a function of layout parameters and defect size, as previously mentioned, an analytical formula for the average pseudo-critical area contribution, averaged over all defect sizes of interest, can now be derived by integrating this function over all defect sizes of interest with a probability distribution function of the defect sizes. Using the probability distribution function of eq. (3), the following functions are thus derived.
For object segments having only one side visible neighbor, the average short pseudo-critical area can be written as
For object segments having visible neighbors in two opposite directions, the average short pseudo-critical area can be written as follows.
The above functions describe analytically the average pseudo-critical area for each kind of object segment pair that includes a segment of object i. They satisfy the condition set forth in eq. (7) for every defect size x of interest, and therefore can simply be summed over all such object segments and objects in order to calculate the geometric union of the actual short critical area, and thus the total average short critical area of the layout. That is,
where Asij is the short critical area contribution value As1ij, As2ij, As3ij or As4ij, of object segment i as related to object segment j, and is given by equation (24), (25), (26) or (27) as the case may be.
Theoretically, the basic derivation of the open critical area formulae is a dual of the derivation for short critical area. For completeness, we describe the formulation for open critical area in detail as well.
As shown in
where li0 is the length of the segment that has no visible neighbors on either side, and Dmax is the maximum defect size. Integrating equation (29) with the probability distribution function in equation (3) yields
For a segment i that has exactly one side neighbor j, such as segment 1820 in
where bij is the length for the segment that has only one side visible neighbor j. Integrating equation (31) with the probability distribution function of equation (3) yields
For a segment i that has two neighbors j and k on opposite sides, such as segment 1810 in
where bijk is the length of the segment that has visible neighbors on both sides. Integrating equation (33) with the probability distribution function of equation (3) yields
As with equations (24), (25), (26) and (27) for the short defect analysis, equations (30), (32) and (34) describe analytically the average open pseudo-critical area for each kind of object segment in an object i. They satisfy the condition set forth in eq. (7) for every defect size x of interest, and therefore can simply be summed over all such object segments and objects in order to calculate the geometric union of the actual open critical area. That is,
where Aoij is the open critical area contribution value Ao1i, Ao2ij or Ao3ijk, from equations (30), (32) or (34) above, depending on whether the object segment i has visible neighbors on zero, one or two sides respectively.
In the case of the open defect analysis, the average pseudo-critical area equations can be combined and simplified to the single form of equation (36):
�nbr j� refers to a visible neighboring object segment j,
The average open pseudo-critical area contribution arising from a single object p is therefore
�nbr q� refers to a visible neighboring object segment q,
Returning to
Referring to
In step 712, the routine calculates the average short critical area contributed by object p, and adds it to a sum. Similarly, in step 714, the routine calculates the average open critical area contributed by object p, and adds that value to another sum. The routine then loops back to step 710 to evaluate the next object p. When all desired objects have been evaluated, the routine exits (step 716) with two sums: one approximating the average short critical area and one approximating the average open critical area of the layer or region of interest.
In the flowchart of
Because the algorithm as implemented herein treats all four directions alike, conventions will be useful for defining terms like the �width� and �length� of an object. As used herein, a layout layer is considered herein to have two orthogonal dimensions, sometimes referred to herein as the horizontal, or x, dimension and the vertical, or y, dimension.
The algorithm need not take into account the contributions of every wire or every pair of wires in a fabrication layer. For example, whereas the embodiments described herein for approximating the average short critical area takes into account all objects p in the layer regardless of orientation, another embodiment might consider only objects p that are oriented in a preferred direction, horizontal or vertical, of the current layer. A wire extending perpendicular to the preferred direction might be skipped during the iterations of such an embodiment. Such a simplification would reduce the accuracy of the resulting critical area calculation, but nevertheless might be appropriate in certain circumstances. As another example, the calculation may be limited to only a particular region of the layer. On the other hand, other embodiments might yield better accuracy than in the present embodiment, such as by including diagonally neighboring objects q rather than only those that are left, right, up or down relative to the current object p. An embodiment could handle diagonally neighboring objects by enlarging each object slightly in all four directions before using the method as otherwise described herein.
In step 912, object p is segmented at equation applicability boundaries. More particularly, it will be recalled that for the short critical area calculation, each of the equations (24), (25), (26) and (27) apply under different topological conditions: equation (24) applies to segments i having only one visible neighboring segment, equation (25) applies to segments i having two visible neighboring segments j and k in opposite directions and for which 2sij+min(wi,wj)<2sik+min(wi,wk), equation (26) applies to segments i having two visible neighboring segments j and k in opposite directions and for which 2sij+min(wi,wj)>2sik+min(wi,wk), and equation (27) applies to segments i having two visible neighboring segments j and k in opposite directions and for which 2sij+min(wi,wj)=2sik+min(wi,wk). Step 912 therefore segments object p into one or more object segments i, each of which fits the conditions for exactly one of these equations for its entire length. Referring to
In step 914, the routine calculates the short and open critical area contributions for each segment i in object p, using the respective applicable equation (24), (25), (26) or (27) for the short critical area and (36) for the open critical area, and accumulates them into respective short and open critical area sums.
In step 1116, the routine loops through all four directions left, right, up and down. In step 1118, the routine loops through all objects q that are located in the current direction (left, right, up or down) from the current object p. In step 1120, it is determined whether object q is �visible� to object p, as that term is defined elsewhere herein. If not, then control returns to the looping step 1118 to consider the next object q in the current direction.
If object q is visible to object p, then in step 1122, the routine calculates and stores the layout parameters for object p relative to object q. In the present embodiment, such layout parameters include the visibility length bpq, the spacing spq, the width of each object wp, wq, the starting position (x or y, for vertically and horizontally neighboring objects q, respectively) of the portion of object p from which object q is visible, and the ending position (x or y) of the portion of object p from which object q is visible. In step 1124, the layout parameters extracted in step 1122 are added to an array for object p for the current direction.
Control then returns to looping step 1118 to consider the next object q in the current direction from object p. If there are no more objects q in the current direction from object p, then control returns to looping step 1116 to consider the next direction. After all four directions have been considered, then in step 1126 the routine exits. At the end of step 1126 (i.e. at the end of step 910), object p has associated therewith four arrays: one for neighboring objects q in each of the four directions. Each entry in each array identifies for the object pair (p,q) the following layout parameters: bpq, spq, wq, the starting position (x or y) of the portion of object p from which object q is visible, and the ending position (x or y) of the portion of object p from which object q is visible. The width wp is stored only once for each array, and will be the size of object p in the horizontal dimension for the left and right arrays, or the size of object p in the vertical dimension for the up and down arrays.
Returning to
Referring to
As the current object q is traversed, in step 1216, the routine examines the layout parameters in the current array entry, as well as those in the array for the direction opposite the current direction (the array for the rightward direction, during this first direction iteration), in order to determine which short pseudo-critical area equation (24), (25), (26) or (27) applies at the beginning of the current segment i. For purposes of this determination, the current position along the length of the current object p is the start of an object segment i, the current position along the length of the current object q is the start of an object segment j, and the current position along the length of an object (if any) visible in the direction opposite the current direction is the start of an object segment k. The starting position xijstart or yijstart is noted.
In step 1218, the routine again examines the layout parameters to identify the ending position along the object q beyond which the equation determined in step 1216 no longer applies. If the equation applicable to the current segment i is an equation applicable only where there is only one visible neighboring object segment, then the ending position is the x or y position at which the current object p or q ends, or a new object begins in the direction opposite the current direction, whichever is first. If the equation applicable to the current segment i is an equation applicable only where there are visible neighboring object segments on both sides, then the ending position is the x or y position at which the current object p or q ends, or the current object in the direction opposite the current direction ends, whichever is first. In any case, the ending position xijend or yijend is noted.
In step 1220 the parameter bij is now calculated as |xijend-xijstart| or |yijend-yijstart| as the case may be. In step 1222, the parameters sij and if applicable, sik and wk are obtained from the array entries. wi is known from the width wp of the current object p. All the parameters are now available to calculate the average short pseudo-critical area contribution of object segment i in object p relative to segment j in object q using the currently applicable equation. This is done in step 1224, and the contribution is accumulated into the overall average short critical area value being calculated. Control then returns to traversing step 1214 to identify the next object segment on object p relative to neighboring object q, and to calculate and accumulate its short critical area contribution.
If the traversal of step 1214 has reached the end of the current object q, then control returns to looping step 1212 to consider the next entry q in the array for the current direction. If there are no more entries in such array (i.e. after consideration of both objects 1312 and 1314 in the example of
In order to further remove redundancy in visiting all four directions,
For the average open critical area contribution of object p, if equations having distinct applicability conditions were derived in step 310, then a routine similar to that of
In step 1410 of
After all the Aopq's have been summed, then in step 1414, the routine begins a new loop to traverse the length of object p. In step 1416, values for lp0 and lp1 are accumulated during this traversal. The routine then returns to step 1414 to continue the traversal. The value for lp need not be accumulated during this traversal because it is trivially available from the starting and ending positions (x or y) of object p.
In step 1418, after lp, lp0 and lp1 are available, the routine calculates Aop using equation (40) and adds it to Aopq calculated in steps 1410 and 1412. In step 1420, the routine exits with the average open pseudo-critical area contribution due to object p.
As previously mentioned with respect to
The above-described embodiments make certain assumptions and simplifications which may slightly degrade the accuracy of the overall critical area calculation. For example, the above-described embodiments assume that all objects of interest are rectangular, and all contamination particles are discs. The embodiments also assume that a short defect cannot exist between two objects if they do not overlap in either the vertical or horizontal dimension, a simplification that may not be valid where the two objects are offset in one dimension only slightly. Different equations or methods can be derived that do not make such simplifications, and those equations or methods may be more precise where the assumptions of the embodiments described herein are not completely valid. On the other hand, equations can also be derived that make additional simplifications that are not made in the above-described embodiments, and the average critical area calculations from such equations may in that sense be correspondingly less precise. For example, one embodiment might consider only the nearest visible neighbor j, instead of all visible neighbors. Another embodiment might consider only the neighbor(s) with the most significant impact, if that can be determined economically.
In general, the equations used herein need only determine the critical area approximately, to a level of precision that is required for the user's purpose. As one example, the pseudo-critical area regions at each defect size of interest might be assigned to the individual object segments in only �substantially� (to desired level of precision) non-overlapping manner. While exactness would be desirable, it is usually unnecessary and even with the techniques described herein it may require more computation time and effort than appropriate for the user's particular purpose. Nevertheless, the techniques described herein permit much more exact critical area computations with far less computation time and effort than required by conventional methods. As used herein, exactness and precision are included in, and considered special cases of, estimation and approximation. That is, a formula that estimates or approximates a value may actually determine the value exactly, and a formula that determines a value exactly is still considered to �approximate� or �estimate� the value.
As described above with respect to
Having an explicit formulation for average critical area as derived above, permits direct calculation of the optimal location for a group of one or more objects for minimizing the local critical area. This is an improvement over most previous approaches for incremental post-route layout optimization. It is more accurate than the approach that computes the optimal position based on only one defect size, and it can be far less expensive than the repeated move-evaluate approach. The approach described herein avoids these move-evaluate iterations and hence is less computationally expensive.
For simplicity of presenting the post-routing yield optimization algorithm, we use the scheme of moving one object at a time as an illustrative example. For that purpose, we derive an explicit formula for the optimal location of an object that minimizes the local average short critical area. One embodiment can impose a requirement that the movement of objects not alter the predefined routing topology (i.e. that the optimization does not allow movement of an object so that it overlaps or moves beyond any other object of interest), whereas another embodiment has no such requirement.
An object's optimal position depends on its position relative to all its visible neighbors. In the present embodiment, the critical area of that neighborhood is formulated for the target object to be moved, not the pseudo-critical area. The main reason is that pseudo-critical area is formulated for the purpose of calculating the total actual critical area. In order to formulate the total critical area as summation of the pseudo-critical areas, the definition of the pseudo-critical area for one particular object i includes only part of the actual critical area for object pair (i,j); the remaining part is included in the pseudo-critical area for object j. For layout optimization, it is only necessary to formulate the critical area for the objects being moved and their visible neighbors. In the scheme being described here, only one object is moved at a time. Hence, only the evaluation of the critical area contributed by the object pairs between the target object with its visible neighbors is needed. There is no need to evaluate the critical areas contributed by the target object's neighbors with their own neighbors. We also carefully handle the possible overlaps among the critical areas contributed by the different object pairs between the target object with its visible neighbors. The formulae are shown by equations (42) and (43) below.
Purely for the purpose of simplicity in an illustration of how a method according to this technique works, we now apply some simplifying assumptions in order to derive equations (42) and (43): Dmax is assumed to be infinite, and we consider only the short critical area (not the open critical area). Other embodiments may not make these same assumptions. The exact formulation can be derived following the similar idea but requires extra bookkeeping.
The critical area between the target object i and all its left side visible neighbors is formulated in (42). The critical area between the target object i and all its right side visible neighbors is formulated in (43).
In these equations, bij is the total length of object i that is visible to one of its left side visible neighbors. bik is the total length of object i that is visible to one of its right side visible neighbors, and bijk is the total length of the segment of object i that has visible neighbors on both sides.
The optimal location for object i, therefore, given the above simplifications and assumptions, is the value sij* that minimizes the sum of the average critical area on the left and the average critical area on the right of the object. That is:
If equations (42) and (43) are further approximated by replacing the summation with only the one neighbor that contributes the most critical area on that side (or with the nearest visible neighbor on that side), and by assuming the same wire width for all the objects, then we can derive the optimal position for object i explicitly:
Now that an explicit formula has been derived for the optimal position of an object i, the following describes the basic flow of a post-routing optimization algorithm. Reference will be made to the example layout region shown in
The embodiment described herein focuses on a single layer at a time and so vias are not touched. Hence, the only movable objects on a layer are the wires. Typically, in routing, each layer has a preferred direction of routing, either horizontal or vertical. Since the majority of the wires on a layer are in the preferred direction, the direction of movement is chosen to be perpendicular to the preferred direction on that layer. Furthermore, only the wires along the preferred direction are candidates for moving in the present embodiment. For clarity of explanation, the present description assumes that the preferred direction in the current layer under consideration is vertical. The algorithm then is as follows:
First, for each vertical object in the layer, the difference between the critical areas on both sides is computed. This difference is referred to herein as the optimization potential.
Second, the algorithm identifies the object having the largest optimization potential, and shifts it to the optimal location computed using eq. (45).
Third, the optimization potentials of the visible neighbors of the shifted object are recomputed (as their visible neighbors have changed), and the second step is repeated until all the movable objects have been processed once.
Note that once an object is shifted to the optimal location, it is locked and is not re-visited for the remainder of the iteration. Since the optimal location of an object segment as computed in Eq. (45) depends of the positions of the visible neighbors, it may help to run several iterations of the above algorithm to take these modifications into account.
In order to shift the object segment to an optimal position (the second step in the algorithm above) without violating any design rules, the following two steps should be done efficiently:
User interface input devices 1622 may include a keyboard, pointing devices such as a mouse, trackball, touchpad, or graphics tablet, a scanner, a touchscreen incorporated into the display, audio input devices such as voice recognition systems, microphones, and other types of input devices. In general, use of the term �input device� is intended to include all possible types of devices and ways to input information into computer system 1610 or onto computer network 1618.
User interface output devices 1620 may include a display subsystem, a printer, a fax machine, or non-visual displays such as audio output devices. The display subsystem may include a cathode ray tube (CRT), a flat-panel device such as a liquid crystal display (LCD), a projection device, or some other mechanism for creating a visible image. The display subsystem may also provide non-visual display such as via audio output devices. In general, use of the term �output device� is intended to include all possible types of devices and ways to output information from computer system 1610 to the user or to another machine or computer system.
Storage subsystem 1624 stores the basic programming and data constructs that provide the functionality of certain embodiments of the present invention. For example, the various modules implementing the functionality of certain embodiments of the invention may be stored in storage subsystem 1624. These software modules are generally executed by processor 1614.
Memory subsystem 1626 typically includes a number of memories including a main random access memory (RAM) 1630 for storage of instructions and data during program execution and a read only memory (ROM) 1632 in which fixed instructions are stored. File storage subsystem 1628 provides persistent storage for program and data files, and may include a hard disk drive, a floppy disk drive along with associated removable media, a CD-ROM drive, an optical drive, or removable media cartridges. The databases and modules implementing the functionality of certain embodiments of the invention may be stored by file storage subsystem 1628.
Bus subsystem 1612 provides a mechanism for letting the various components and subsystems of computer system 1610 communicate with each other as intended. Although bus subsystem 1612 is shown schematically as a single bus, alternative embodiments of the bus subsystem may use multiple busses.
Computer system 1610 itself can be of varying types including a personal computer, a portable computer, a workstation, a computer terminal, a network computer, a television, a mainframe, or any other data processing system or user device. Due to the ever-changing nature of computers and networks, the description of computer system 1610 depicted in
As used herein, a given value is �responsive� to a predecessor value if the predecessor value influenced the given value. If there is an intervening processing step, the given value can still be �responsive� to the predecessor value. If the intervening processing step combines more than one value, the output of the processing step is considered �responsive� to each of the value inputs. If the given value is the same as the predecessor value, this is merely a degenerate case in which the given value is still considered to be �responsive� to the predecessor value. �Dependency� of a given value upon another value is defined similarly. Also, a second value is considered herein to be �independent� of a first value if the first value is not referenced in the calculation of the second value.
As used herein, the �identification� of an item of information does not necessarily require the direct specification of that item of information. Information can be �identified� in a field by simply referring to the actual information through one or more layers of indirection, or by identifying one or more items of different information which are together sufficient to determine the actual item of information. In addition, the term �indicate� is used herein to mean the same as �identify�.
The foregoing description of preferred embodiments of the present invention has been provided for the purposes of illustration and description. It is not intended to be exhaustive or to limit the invention to the precise forms disclosed. Obviously, many modifications and variations will be apparent to practitioners skilled in this art. In particular, and without limitation, any and all variations described, suggested or incorporated by reference in the Background section of this patent application are specifically incorporated by reference into the description herein of embodiments of the invention. The embodiments described herein were chosen and described in order to best explain the principles of the invention and its practical application, thereby enabling others skilled in the art to understand the invention for various embodiments and with various modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the following claims and their equivalents.
Referenced by
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text:
Posted| Updated
Palmer United Party senator Jacqui Lambie says she is still seeking advice about whether to become an independent.
Topics: clive-palmer, minor-parties, parliament, federal-parliament, canberra-2600, tas
Posted| Updated
Crossbench senator Jacqui Lambie is returning to Tasmania to seek advice on whether to break away from the Palmer United Party (PUP).
Topics: minor-parties, government-and-politics, political-parties, clive-palmer, australia, qld, tas
Posted| Updated
Palmer United Party head Clive Palmer says Jacqui Lambie has been demoted and suspended from party room meetings until "she gives an undertaking not to attack individual party members".
Topics: minor-parties, political-parties, government-and-politics, clive-palmer, australia, qld, tas
Posted| Updated
Senator Jacqui Lambie's chief of staff is expelled from the Palmer United Party, as Clive Palmer warns the Tasmanian senator to challenge him if she is unhappy with the leadership.
Topics: minor-parties, government-and-politics, political-parties, clive-palmer, australia, tas
Posted| Updated
Palmer United Party leader Clive Palmer says his party can secure the balance of power in Victoria's Upper House in the upcoming election.
Topics: state-parliament, government-and-politics, federal---state-issues, parliament, clive-palmer, minor-parties, political-parties, vic
PUP leader Clive Palmer rejects a claim his party falsely boosted its membership numbers in Queensland to avoid being deregistered.
Topics: minor-parties, elections, clive-palmer, brisbane-4000
Posted| Updated
Clive Palmer launches his party's election campaign for Victoria, saying he is aiming to seize the balance of power in the Upper House.
Topics: elections, state-parliament, minor-parties, vic, melbourne-3000
Posted| Updated
Federal MP Clive Palmer's wife, Anna, will not be the Palmer United Party candidate for the Gold Coast seat of Gaven after being overlooked for preselection.
Topics: minor-parties, elections, clive-palmer, southport-4215
Posted| Updated
The Palmer United Party (PUP) will not run a single candidate in the next Queensland election, independent state MP Dr Alex Douglas says.
Topics: state-parliament, alp, liberal-national-party-queensland, minor-parties, elections, gaven-4211, southport-4215, brisbane-4000
Posted| Updated
Australian agriculture is "closing down" and farmers - "the toughest people this nation has ever produced" - are folding, federal MP Bob Katter says.
As a result a farmer is "committing suicide every four days in this country", Mr Katter told the ABC's Q&A program.
Can that statistic be right? ABC Fact Check examines the latest research on suicide in farming communities.
Topics: suicide, rural, regional, mental-health, federal-government, government-and-politics, minor-parties, bob-katter, australia
Posted| Updated
Independent and minor party MPs in Queensland hope to use the balance of power next year to prevent the lease of assets.
Topics: state-parliament, government-and-politics, activism-and-lobbying, minor-parties, liberal-national-party-queensland, qld
Posted| Updated
Palmer United Party (PUP) defectors Alex Douglas and Carl Judge are teaming up to form an independent alliance in Queensland Parliament.
Topics: minor-parties, state-parliament, elections, yeerongpilly-4105, brisbane-4000, kawana-4701, maroochydore-4558, southport-4215
Posted| Updated
Palmer United Party senator Jacqui Lambie has struggled to define sharia law despite her strong opposition to it and says she knew the background of the Afghan policewoman featured in a recent Facebook post.
Topics: social-media, islam, religion-and-beliefs, minor-parties, australia, tas
Posted| Updated
The photographer who took the picture of an Afghan policewoman, which has been used in an online campaign to ban the burka, says Senator Jacqui Lambie has desecrated her image.
Malalai Kakar was Afghanistan's first female policewoman who the Taliban gunned down in 2008. She was well known for her stance on women's rights.
Lana Slezic says she is shocked and appalled the photo she took of Lt Col Kakar in Afghanistan has been used out of context and without permission.
PUP senator Jacqui Lambie shared the image on her Facebook page of Lt Col Kakar in a blue burka pointing a pistol overlaid with the words: "For security reasons it's now time to ban the burqa".
Topics: social-media, islam, religion-and-beliefs, minor-parties, australia, tas
Posted| Updated
Palmer United Party leader Clive Palmer has defended his support for a freeze in compulsory employer contributions to superannuation by arguing it is better to put the money in workers' pockets now.
"We know as a statistical fact that over 50 per cent of Australians will be dead by the time they get access to their super," he said.
ABC Fact Check investigates.
Topics: clive-palmer, business-economics-and-finance, superannuation, federal-parliament, federal-government, minor-parties, australia
Posted| Updated
Joe Hockey has hailed the agreement to axe the mining tax - which will cost the budget $6.5 billion - as a "damn good deal" for the Australian people.
The Senate voted to repeal the mining tax yesterday after the Federal Government and the Palmer United Party (PUP) struck a deal to keep the schoolkids bonus until after the next election.
But the agreement also further delays superannuation increases for Australian workers, putting them on hold until 2021.
Topics: government-and-politics, mining-industry, business-economics-and-finance, tax, minor-parties, political-parties, australia
Posted| Updated
Palmer United Party Tasmanian Senator Jacqui Lambie says Australia isn't spending enough on defence.
"Australia's defence spending as a ratio of our GDP (1.5 per cent) is the lowest it's ever been since pre-World War II when aggressive, anti-democratic, totalitarian governments in Germany and Japan caught us napping," she said.
ABC Fact Check investigates.
Topics: government-and-politics, defence-and-national-security, minor-parties, political-parties, australia, hobart-7000, tas
Posted| Updated
The Chinese embassy in Australia has labelled Clive Palmer's stinging verbal attack on the country as "absurd" and "irresponsible".
On the ABC's Q&A program, Mr Palmer called the Chinese government "bastards" and "mongrels" and claimed they "shoot their own people".
A spokesperson for the Chinese embassy told the ABC the comments "were full of ignorance and prejudice".
"We believe that a sound China-Australian relationship serves the fundamental interests of both countries. It is and will always be supported by the two peoples," the spokesman added.
Topics: federal-parliament, parliament, clive-palmer, political-parties, minor-parties, foreign-affairs, government-and-politics, australia, china
Posted| Updated
Queensland Labor is winning back their most ardent critics, but will not gain enough ground to win next year's election, senior lecturer at University of Queensland Dr Rae Wear says.
Topics: state-parliament, liberal-national-party-queensland, alp, minor-parties, polls, qld
Posted| Updated
Palmer United Party MP Alex Douglas has resigned as the Queensland parliamentary leader and intends to quit the party.
Dr Douglas said he could not support a "jobs for the boys" culture in the fledging party.
It is the second time the MP has quit a party since regaining the Gold Coast seat of Gaven in the 2012 election.
Topics: state-parliament, clive-palmer, minor-parties, liberal-national-party-queensland, gaven-4211, qld
Posted| Updated
Queensland will not introduce a register for convicted sex offenders after a private member's bill was voted down in State Parliament.
Katter's Australian Party MP Shane Knuth introduced the bill on Wednesday night, which mirrors legislation in Western Australia.
It would have allowed the Police Commissioner publish information on the state's most dangerous and high-risk sex offenders.
Topics: sexual-offences, state-parliament, minor-parties, activism-and-lobbying, laws, brisbane-4000
Posted| Updated
The Australian Motoring Enthusiast Party Senator, Ricky Muir, has sacked his chief of staff, Glenn Druery, amid reports of infighting within the party.
Topics: government-and-politics, minor-parties, melbourne-3000, canberra-2600
Posted| Updated
Hotels say their survival hinges on poker machine operations in South Australia, as opponents keep up their fight against issues such as problem gambling.
Topics: gambling, community-and-society, hospitality, industry, business-economics-and-finance, government-and-politics, activism-and-lobbying, federal-parliament, minor-parties, states-and-territories, law-crime-and-justice, adelaide-5000, sa, australia
Posted| Updated
Labor has won the by-election in the Queensland seat of Stafford, with a huge swing of 18.6 per cent.
Topics: elections, government-and-politics, minor-parties, liberal-national-party-queensland, alp, stafford-4053, qld
Posted| Updated
The Federal Government says Clive Palmer's Palmer United Party (PUP) will have to explain itself to voters if it does not help scrap the carbon tax this week.
The Government was hoping to repeal the tax on Thursday, but it was voted down after a last-minute move by the PUP senators.
Mr Palmer claimed the Government had not honoured an agreement to include his amendments to the legislation and directed his senators to vote against it.
Mr Hunt has warned that voters would be "deeply disappointed, and, ... in many cases angered" if Mr Palmer stands in the way of the repeal this week.
Topics: government-and-politics, tax, climate-change, emissions-trading, parliament, federal-parliament, political-parties, minor-parties, liberals, alp, australia

subset: commoncrawl


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The Bloomsbury Hotel London
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Historical Traveler Reviews The Bloomsbury Hotel London
Good value
We got this hotel at a pretty good rate on the internet (�99 per room per night - weekend rate). The Lutyens building is beautiful and the lobby gave a good first impression. The twin room was a decent size (for London) with quite a generous bathroom (with bath). Good facilities included hairdryer, iron + ironing board, safe and a TV with a good selection of channels, including Sky Movies Premier (which surprised me).
The negatives would include the table service at breakfast. We had to queue for a table despite there being loads free. When we got one, there was no milk or butter, although it came when asked for. The toast was barely toasted. Besides that, the full English breakfast was quite nice. I feel I'm being a bit picky here, but it does claim to be a 4-star hotel!
Overall, a very pleasant hotel which I would have no hesitation recommending at this price.
Regular visitor to London and I usually stay here
I am often in London on both business (paid for) and on pleasure (I pay) and have stayed in probaly 10 to 15 hotels, generally 4 and 5 star, but rarely if ever paying full rack rates (i.e �300+)
I find that I seem to retun to Jurys Gt Russel St (on both business and pleasure) and when I compare what other hotels offer and at the price, this hotel is a very tough act to beat.
Location, fittings, staff and service make this hotel my default choice.
I usually book oline using their website (jurysdoyle) and get a good rate. I also joined their FF stayer programme (Priority Guest) that came free for one year with my Airline FF programme ($100 p.a, but they have never billed me for subsequent years)) and this entitles me to a 1 category room upgrade. These business rooms are easily on a par with 5* hotels in London.
Only slight drawback is not having a Gym
Will be returning to London in Jan and have already booked Jurys Gt Russel St. I initially gave this hotel 4 out of five as I have had some wonderful stays at some five start hotels throughout the world (e.g Mandarin in San Fran) but considering the price/quality ratio of Jurys, I now give them 5 too (despite no Gym).
Solid 4 star hotel in good location
Close to Tottenham Court tube stop and walking distance to a lot of night life, the location was very good. And for the price we paid, we found the room to be a solid 4-star selection, and a great deal for London. Clean, decent service, adequate in terms of quiet and size. Shop around though, because we saw prices for this hotel vary greatly on the major travel sites (Expedia, Travelocity, Hotels.com)... we ended up booking on www.london-discount-hotel.com as a featured special and got a really outstanding rate.
Good location, Servicable room
I stayed here from 31 Aug - 5 Sep. The location is close to both Oxford Street shopping and Tottenham Court Road Tube station, which are both about a 3 minute walk from the hotel. The Old Dominion theatre is a 2 minute walk, as are a few restaurants, such as Subway and Garfunkels.
My single room was almost palatial by London room standards ... a very comfy twin bed, large wardrobe with ironing board in it, huge bathroom, and a small writing desk/dressing table area. The room was next to the elevator, but laid out in such a manner that I heard minimal noise from the guests using the lift. My only challenge was the poorly placed dresser -- it was in the entrance hallway across from the bathroom door, and used up much needed space for both walking into the room and maneuvering luggage about. It was about 2 feet off the floor, so it made a better luggage holder than storage space for clothes.
The concierge was awesome! After a full day of sightseeing, I decided at 17:30 that I wanted to see "Tonight's the Night," the Rod Stewart musical at the Victoria Palace theatre. I called the concierge, and by 17:45 I had tickets for that night. My seats were in the 7th row from the stage, about 6 seats to the right of center stage. He made sure my cab to the theatre was at the door by 18:45 and greeted me when I returned to make sure everything had been up to my expectations.
The desk staff could have been friendlier, but they were at least pleasant. The Lutyens Restaurant breakfast was nice, as you could have whatever was on the buffet bar plus order an entree from the menu. The service could have been a bit better, but the food was always good.
This was my first experience at this property and I can honestly say that I would consider staying there again when I'm in London.
Great London Gem!
My husband and I stayed at the Jurys Great Russell Street during our honeymoon. I knew hotel rooms in London were small, but our room was delightful larger than expected. Certainly not large in comparison to American hotel rooms but large by London standards.
The location is wonderful! Around the corner from the tube, two blocks from the British Museum.
It was clean, bright and quiet. The staff was most helpful from the doormen to the conciege.
We would certainly stay there again!
For a quiet night's sleep, try Jurys Gt Russell Street
Here's why I liked staying here and would go back:
Convenient location. Quiet!!! Large bright tile bathroom and lots of hot water. Clean and very safe. I had a real small room, but I was by myself and paying only for a single, and I expected a small room, so that wasn't a problem. On my previous stay the street noise, even five floors up was bad - Jury's was quiet.
Decent but uninspiring
Good location, near to Oxford Street and Tottenham Court Road. This is a pleasant hotel - a relatively new conversion in an impressive building.
They'd made a mistake with my reservation, so sorted it by upgrading me to an Executive Room; to be honest, if that's an Executive upgrade, I was glad not to be in a standard room. It was pleasant enough, but nothing special (although it did have a very, very nice bathroom).
Best Location, Friendly Staff
I've stayed at the jurys on Gt Russel st. 2 times on buisiness during the last few years.Both times I was very pleased both with the location which is perfect and with the rooms and amenities. The rooms vary in size but are very comfortable and the hotel staff is very friendly.very nice breakfast, I will surely return there next year.
The travel agent informed us that this was a four-star hotel. Since this was our first visit to Europe we went with his advice. What a disappointment! The room was in the back of the building overlooking the air conditioner. It was so small we had to keep our luggage in the hallway by our bathroom. The service during breakfast was horrible. We had to get our own coffee and toast. By the third day it improved somewhat. Also the room was not completely cleaned - half full coffee cups, soda cans, full garbage. About the only bright spot was the loungeman who went out of his way to make me iced tea. The location is excellent, but we are going to London next year but not to this hotel.
My Opinion
I'm on this site looking for some recommended accommodation for Manchester but thought I'd offer my opinion on a Hotel I've stayed in.
I've stayed in Jurys Great Russell Street on two occasions now. Once with the girl friend and once with a couple of mates of mine, on both occasions I wasn't let down.
The rooms are perfectly adequate and above the standards I've experienced within most hotels. The staff were more than pleasant when called upon and as for the location just of Tottenham Court road you couldn't get a better location. Right slap bang in the middle of everything but without the city centre noise.
Mostly everything about this hotel oozes quality. If you can afford the price of a room in this Hotel I'd heartily recommend it.
TripAdvisor Reviews The Bloomsbury Hotel London
Travel Blogs from London
There ain't no party like a crayfish party!
so London so far......
pootle around Angel shopping, coffee and cake with the gorgeous Sam
Crayfish party in the park, amazing Swedish food by the lovely Sara, yum yum, and the sun came out :)
Babysitting wee Rosie for an evening, (we were the first ones!)
photos are on their way, once I prise the camera away from Paul
next wee blog will be from Cyprus and the wonderfulness that shall be Amanda and Leigh's ...
Jersey Boys
... AMAZING! The music and singing was sensational and the story was well written but kind of sad at the same time!
Seriously can't believe how many hits they had- Sherry, Walk like a Man, Big Girls Don't Cry, Dawn - Go Away, Rag Doll, Bye Bye Baby, Working my way back to you and Can't take my eyes off of you... that's to just name a few!
Great, great night!
The Foxes of London
... the exhibit, excited boys and men of all ages drooled over the cars, while their accompanying mothers, girlfriends or friends sighed, shook their heads and checked their watches repeatedly.
Liam and I enjoyed the exhibit quite a bit, but we had things to do and places to see so we soon moved on. Exploring Covent Gardens, we had some tasty gelato at a really swanky chocolate shop before hitting the tube once again to go see Hyde Park. Our goal was to go to Speakers ...
Huxley papers!
... in the famous Man's Place Neandertal illustration, where Huxley says "...the details from the cast and from Dr. Fuhlrott's photographs." But paleoanthropologists were not sure where those photographs were or if they even survived. The professor from Bonn who has done re-excavating of the Neandertal site and found more pieces of this individual asked me to look for them. He will be very happy ...
Week 15 was a whirlwind of emotion and fun.
... to find you. The choice is yours my friend. You might be afraid that you are alone. You aren't alone, you are never truly alone, travelers stick together. Come join the family. We woke late and decided that we would not achieve anything today. We were not in a "let's achieve something today" mood, it was more like "Why?! Why did we have to leave England! Nooooo I want to go back! I'm not going to do anything." It's crazy even though you technically do nothing, time is unrelenting ...


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|Written by Brian Bergner
|Friday, 24 June 2011 00:00
The 2011 Camp Verde Little League All-Stars rosters were officially released June 15, making nearly 60 youngsters happy as can be, at least for the next few weeks.
June 15 is the first official day Little League presidents can make rosters official, according to current Camp Verde Little League President Coco Minner.
The Camp Verde Minors All-Stars baseball and softball teams [ages 9 to 10] along with the Camp Verde Majors All-Stars softball team [ages 11 to 12] are scheduled to begin their respective tournaments Friday, June 24.
Camp Verde also has a team for ages 10 to 11, which begins its tournament Monday, June 27, with the remaining age levels beginning after Monday, July 4.
The Camp Verde Junior All-Stars baseball team [ages 13 to 14] tournament begins Tuesday, July 5, at Camp Verde High School, while the Camp Verde Junior softball team begins Tuesday at Riverfront Park in Cottonwood.
According to Minner, the Juniors baseball team has yet to release a roster.
The Camp Verde Majors All-Stars [ages 11 to 12] start Tuesday as well, but in Prescott Valley at Mountain Valley Park.
Speaking of the Majors, longtime Head Coach Craig Reddell was excited to get All-Stars season under way.
"I think we have the strongest team we've had in years," Reddell said Sunday, June 19. "It's going to be a tough bracket, as always, but I think we'll be just fine.
Reddell has plenty of talent to choose from, including players such as 12-year-olds Beau Bullard,Carson Zale,Wyatt Howe and Easton Braden.
At the Minors level, Camp Verde has just as much talent. For baseball, 10-year-olds Cody Jackson, Noah Church and Chase Decker look to lead the way while 9-year-olds Kolby Hedges, Mason Hood and Brady McClaskey are top up-and-coming prospects.
As for softball, the Minors are led by 10-year-olds Elizabeth Johnson, Kaycee Williams, Trina Honwytewa and Hannah Arwine while 9-year-olds Bridgett Bullard, Destiny Dowdle and Tyra Smith made the team as well.
For the Majors softball team, Camp Verde is coached by Henry Smith, who will look to take his team far come this weekend.
Players selected for the Majors softball team include 12-year-olds Marisol Barreda, Kylee Chavez, Dusty Dowdle and Paige Lacy while two 11-year-olds made the team, Kayla Hackett and Nieja Garner.
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True 800402 Condenser / Evaporator Motor with Silencer, Nut, and Screws - 9W
- Includes silencer, nut, and screws
- Clockwise rotation
True Refrigeration
Customer questions about this product
- Is this part something I can install myself?
- This part should be installed by a qualified service technician.
The True 800402 9 watt condenser / evaporator motor replaces the damaged or worn-out component on select True models.
Due to manufacturer production variations, read the Compatibility Notes document to ensure this part is suitable for your application.
Because this item is not stocked in our warehouse, processing and transit times will vary. If you need your items by a certain date,
please note this in the comment section while checking out! Please feel free to log on to our Live Chat should you have any questions
before placing your order. After your order is placed, we will update you via email to let you know how this will be shipping to you.
We recommend entering your unit's serial number into the box provided during the checkout process. That way, we can check to make sure the part you are ordering is the correct one. If you choose to omit the serial number, you are accepting responsibility for the part's compatibility with your unit.
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Warranty Info
RESIDENTIAL USERS: True Refrigeration assumes no liability for parts or labor coverage for component failure or other damages resulting from installation in non-commercial or residential applications.
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Customer Reviews
Overall User Rating: True 800402 Condenser / Evaporator Motor with Silencer, Nut, and Screws - 9W ( 5.0 stars from 1 review )
I purchased this motor for the True GDM12. The price was reasonable, and the item was shipped fast. My cooler was noisy every time the refrigeration kicked on. Replacing this motor resolved the problem. It was nice to be able to get a new OEM repair part to restore normal operation.
Craig L. Posted on 03/21/2014
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5-Ingredient Recipes: 21 Easy Dinner Ideas with 5 Ingredients or Less
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Barbecue Lima Bean Casserole
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A sweet and spicy combo that's easy and inexpensive to make. Barbecue Lima Bean Casserole is a delicious way to keep your budget family meal plan interesting.
- 3 cans (15 oz) lima beans or butter beans
- 3/4 pound pork sausage
- 1 medium onion, chopped
- 1 clove garlic, crushed
- 2 16 oz cans tomato sauce
- 1 teaspoon prepared mustard
- 3 tablespoons brown sugar
- Preheat oven to 350 degrees F.
- Brown the sausage, onion and garlic.
- Add tomato sauce, mustard and brown sugar. Cook for a few minutes.
- Add lima beans, cover and bake in oven for 45 minutes at 350 degrees F.
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Peychaud's Bitters: A New Orleans Take on Aromatic Bitters
The 9-Bottle Bar
A couple of weeks back, when in the course of our monthlong study of aromatic bitters we covered some brands to fit your budget, one well-known bottle was perhaps noticeably absent from the mix: the storied New Orleans original, Peychaud's Bitters.
How Do I Make Gravy Last Longer?
Good Questions
Saveur's New Cookbook Will Forever Change Your Definition of "Classic"
New Cookbook First Look
The book: The New Classics Cookbook from The Editors of Saveur
The angle: Iconic, everyday foods from all over the world.
Recipes for right now: Deviled Eggs with Smoked Trout, Burmese Ginger Salad, Iranian Chicken and Walnut Stew, Coq au Vin, Savory Noodle Kugel, Cheddar Cheese Biscuits, Lebanese-Style Green Beans with Chickpeas
Who would enjoy this book? Saveur magazine devotees as well as busy home cooks who can never have too many dinner ideas.
The Best Way to Store Leftover Turkey
Tips from The Kitchn
Yes, that leftover Thanksgiving turkey, carcass and all, is going to be staring you in the face on Thursday night. Do you know the best way to take it apart and store it? Or do you just loosely drape some plastic wrap or foil on top, shove it into the fridge, and plan to deal with it another time?
Let's walk through the best ways to take apart and store your leftover turkey!
Long & Low Holiday Centerpieces
Apartment Therapy
From Apartment Therapy → Style Secrets: 4 Ways to Create Long & Low Thanksgiving Centerpieces
Long, low centerpieces add color and drama but don't impede conversation at the dinner table. Here are five tutorials to help you put one together!
How To Cook a Turkey: The Simplest, Easiest Method
Cooking Lessons from The Kitchn
Are you roasting a whole turkey for the first time this year? Or perhaps you've done this many times before, but you want a quick refresher to brush up on the basics? We'll help you make your mama proud with these step-by-step instructions for roasting a whole turkey.
Here is our super basic, super simple, super easy recipe for roasting a super beautiful turkey this Thanksgiving.
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9 Ways to Take a Better Instagram Photo of Your Thanksgiving Dinner
Tips from The Kitchn
Did you know that there are more photos uploaded to Instagram on Thanksgiving than any other day of the year? It makes sense. You've got plates of beautiful food in front of you, and don't you want to send your mom a proud photo of your first-ever Thanksgiving turkey?
In order to take the very best photos possible, I've asked a few of my favorite food Instagrammers –including Joy the Baker and Leela Cyd – what tips they have for taking better Instagram photos on Thanksgiving. Let's brush up on our Instagram game.


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Dr. Craig J. Campbell Jr, MD
Podiatric Medicine, Craig J Campbell DPM PC
- 5255 S 4015 W Ste 140
Salt Lake City, UT 84129
- 1 Office Location
- (801) 969-1434
Dr. Craig J. Campbell Jr is a practicing physician. Dr. Campbell Jr practices medicine in Salt Lake City, UT and specializes in Podiatric Medicine. Dr. Campbell Jr is affiliated with Pioneer Valley Hospital, Intermountain Medical Center and Jordan Valley Medical Center. Dr. Campbell Jr speaks English and Spanish.
Gender: Not Available
Years in Practice: Not Available
Languages Spoken: English, Spanish
Medical School: Not Available
Graduation Date: Not Available
Hospital Affiliations: Pioneer Valley Hospital, Intermountain Medical Center, Jordan Valley Medical Center
Specialties: Podiatric Medicine


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text: Barnes & Noble Reports 2007 ResultsThursday March 20, 8:30 am ET Increases Quarterly Cash Dividend Issues First Quarter 2008 Guidance NEW YORK--(BUSINESS WIRE)--Barnes & Noble, Inc. (NYSE: BKS - News), the world's largest bookseller, today reported sales and earnings for the fourth quarter and the full year ended February 2, 2008. In addition, the company announced that its Board of Directors has authorized an increase to its quarterly cash dividend from $0.15 to $0.25 per share, commencing with the dividend to be paid in June 2008. 2007 RESULTSAs previously reported, Barnes & Noble store sales were $1,511 million for the quarter and $4,648 million for the full year. Excluding the impact of the extra week during fiscal 2006, Barnes & Noble store sales increased 2.8% for the quarter and 4.3% for the full year as compared to the same periods in fiscal 2006. Comparable store sales decreased 0.5% for the quarter and increased 1.8% for the year.Barnes & Noble.com sales were $177 million for the quarter and $477 million for the full year. Excluding the impact of the extra week during fiscal 2006, Barnes & Noble.com comparable sales increased 13.1% for the quarter and 13.4% for the full year as compared to the same periods in fiscal 2006.Consolidated sales were $1,846 million for the quarter and $5,411 million for the full year.As previously announced, the company received two non-operating benefits in January 2008, comprised of property insurance and litigation settlements that totaled $6.3 million on an after tax basis ($0.10 per share for the fourth quarter and $0.09 per share for the full year).Net earnings were $115.0 million, or $1.79 per share for the fourth quarter, and $135.8 million, or $2.03 per share, for the full year, in-line with guidance updated on March 3, 2008.As previously announced, the company repurchased 6.9 million shares in 2007 for $248.3 million under its share repurchase plan. In the first quarter of 2008, the company purchased an additional 1.9 million shares for $52.7 million. Approximately $150 million remains under the existing share repurchase authorization.2008 GUIDANCEThe company expects first quarter comparable store sales at Barnes & Noble stores to be slightly negative, and as previously announced, full-year comparable store sales are expected to be slightly positive.Barnes & Noble, Inc.'s first quarter earnings is expected to range from $0.05 to $0.10 per share. As previously announced, Barnes & Noble, Inc.'s full-year earnings per share are expected to range from $1.70 to $1.90, approximately flat with 2007 on an operating basis. Non-operating items in 2007 results include the two settlements, previously noted, as well as the $8 million tax benefit recorded in the company's second quarter.The share count used in the computation of earnings per share is based on a diluted weighted average share count of 63.4 million shares for the first quarter, and a diluted weighted average share count of 64.2 million shares for the full year.As of February 2, 2008, the company operated 713 Barnes & Noble stores and 85 B. Dalton stores. During the fourth quarter, nine Barnes & Noble stores were opened and five were closed. Seven B. Dalton stores were closed during the quarter.A conference call with Barnes & Noble, Inc.'s senior management will be webcast beginning at 10:00 A.M. ET on Thursday, March 20, 2008, and ishttp://biz.yahoo.com/bw/080320/20080320005421.html?.v=1


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TVOTR: Young Liars / Blues from Down Here / Dancing Choose / Second Song / Golden Age / Will Do / New Cannonball Blues / Forgotten / Staring at the Sun / Repetition / Wolf Like Me
Encore: Satellite
Arctic Monkeys: She's Thunderstorms / Brianstorm / This House Is a Circus / Still Take You Home / Don't Sit Down 'Cause I've Moved Your Chair / Pretty Visitors / Teddy Picker / Crying Lightning / Brick by Brick / The Hellcat Spangled Shalalala / The View from the Afternoon / I Bet You Look Good on the Dancefloor / All My Own Stunts / Suck It and See / Do Me a Favour / Fluorescent Adolescent / When the Sun Goes Down
Photo by Armando Brown, for The Orange County Register.
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